The JDSU FST-2310 TestPad is an all-in-one testing solution that performs
SONET, SDH, T-carrier, data, and circuit-switched testing to meet the varied
testing requirements of mobile technicians. Its modular architecture protects
long-term investment by providing the flexibility, scalability, and upgradeability
to support evolving test needs.
Most tests performed using the FST-2310 can be done in only a few button
pushes, without the need to sift through hidden setup menus. Additionally,
because technicians need only minimal training to use the FST-2310, testing
objectives are addressed quickly and the cost of ownership is significantly
reduced.
• SONET/T-carrier transmission testing from DS1 to
OC-48 rates
• SDH transmission testing at STM-16, STM-4 and STM-1 rates
• Circuit-switched testing capabilities including GR-303, ISDN,
signaling, voice frequency (VF), and digital data service (DDS)
• ATM testing capabilities including CBR/VBR traffic
generation, QoS measurements, O.191 test cell generation,
and support for OAM alarm and loopback cells
• Engineered for mobile technicians with rugged construction,
lightweight design, and battery-powered operation
• Process oriented testing features such as test scripting and
remote control operation
WEBSITE: www.jdsu.com
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FST-2310 TESTPAD
Key features of the FST-2310 include:
Application-driven icons
Test application buttons are labeled with icons that clearly depict the way the test
is performed on the circuit; for example, select the “MON/THRU” icon when
performing circuit-monitoring tests – select the “TERM” icon when performing
circuit-terminating tests. The icons and quick setup buttons enable technicians to
use the module effectively with very little training (figure 1).
Simultaneous results analysis for different signal rates
Identify the source of problems quickly by using the FST-2310’s dual results
window to analyze results from different signal rates simultaneously.
Simultaneous results analysis can also be performed on different signal results (for
example, level and bit errors) allowing for easy results correlation and quick
problem identification.
Application-driven icons
Autoconfiguration
Support for autoconfiguration is provided for all key applications.
Autoconfiguration is capable of setting different test parameters, such as framing
and pattern, as well as detecting the signal’s multiplexed composition. This
enables users to reduce the time required for test setup.Additionally, the FST-2310
has the ability to save and store up to 10 test set configurations that can be recalled
for future use.
Remote control
Remotely configure tests and analyze results in detail using the remote control
GUI option. This allows technicians to conveniently operate the module from a
remote location using the FST-2310’s graphical user interface (GUI) on a remote
PC. The remote control GUI feature enables technicians to connect to the FST2310 through the PCMCIA serial or modem card to perform tests and collect test
results.
Dual simultaneous results window
figure 1 Application-driven icons and simultaneous results
3
FST-2310 TESTPAD
Scripting and automation
Reduce setup time and increase efficiency of tests by running preprogrammed
scripts from a PCMCIA card. The DS1/DS3/SONET script libraries supported on
the FST-2310 enable technicians to perform tests quickly and verify test results
against specific criteria for a simple pass/fail result. Scripts can also be customized
to meet the methods and procedures of any service provider (figure 2).
VT100 emulation
Perform VT100 terminal emulation to connect to network elements to configure
NE parameters and monitor available statistics (figure 3).
Timed prints and error logs
Print results every few hours, at the end of a test, or at the occurrence of an error
using the FST-2310’s print features.
Through mode for all rates
Gain access to test circuits (DS1 through OC-48) even when no test access point
is provided. The FST-2310’s through-mode capability monitors test circuits by
unobtrusively channeling network traffic through the test instrument.
Physical, active port, and laser active LEDs
A bright array of physical LEDs on the front panel summarizes results and clearly
identifies errors detected during a test. Active port LEDs on the top panel indicate
the interface(s) to use for specific tests – thus eliminating user error when
connecting the FST-2310 to the network. Laser-active LEDs indicate when the
transmit laser is active and when laser pulses are received.Applications
figure 2 Use automation scripts to verify network performance
with the touch of a single button
figure 3 Perform VT100 emulation to configure network
elements and monitor statistics
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FST-2310
FST-2310
FST-2310
OC-192/STM-64
OC-192/STM-64
OC-3/12/STM1/4
DS1/DS3
MUX
OC-48/STM-16
OC-48/STM-16
NE
NE
NE
NE
FST-2310 TESTPAD
Applications
SONET analysis
The FST-2310 can be used to verify end-to-end network performance via BER
testing at SONET rates up to OC-48 as well as to analyze SONET network
performance under abnormal conditions by simulating pointer justifications and
inserting error and alarm conditions. Users can also manipulate and analyze all
applicable SONET overhead bytes to verify network element performance (for
example, pointer adjustments, alarms, DCC bytes, SONET sync messages, and
K1/K2 bytes) (figure 4).
Qualify the performance of SONET networks quickly and easily with the FST2310’s intuitive GUI. By supporting various payload mappings, the FST-2310
enables testing and verification of individual payloads inside an OC-n signal
(DS1, DS3, multiplexed DS3, VT1.5, OC-n subrates).
Additional functionality includes the ability to drop and insert all mappings (OC12/3/DS3/DS1) from an OC-48 signal. Monitor individual DS1, DS3, or OC-n
subrate payloads within SONET signals for analysis, and verify signal power and
signal frequency of a received signal. Technicians can also name and identify trace
messages and payloads by using the FST-2310’s user-configurable path trace
messages.
SDH analysis
The SDH functionality on the FST-2310 enables performance verification of SDH
networks at the STM-16, STM-4 and STM-1 rates. The FST-2310 supports
performance testing of individual payloads inside an STM-n signal (STM-16c,
STM-4c, STM-1c). Ensure proper network operation with error/alarm analysis as
well as the manipulation/analysis of all applicable SDH overhead bytes. Correct
network timing can be monitored through pointer adjustment measurements.
figure 4 Verify network performance at various points of a SONET/SDH network
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FST-2310
FST-2310
DSX-1
MON
Rx
Tx
Voice
Switch
DSX-3
MON
Rx
Tx
MUX
Higher
rates
MUX
Channel
bank
DCS
CSU/DSU
DCS
FST-2310 TESTPAD
DS3 analysis
Ensure DS3 network performance by performing end-to-end BER testing and
measuring frequency and signal levels on the circuit under test. Technicians can
qualify networks for accurate multiplexed operation by performing BER testing
on one or all DS1 channels transmitted by a DS3 multiplexer. Access to the DS3
signal is provided from the DS3 interface or a DS3 signal embedded in an STS-1,
OC-3, OC-12, or OC-48 circuit.Reduce total testing time on DS3 circuits by using
the dual DS3 receivers to perform bidirectional monitoring, allowing for quick
isolation of problems (figure 5).
DS1 analysis
Verify T1 network performance with the FST-2310’s integrated BER, signal,
alarm, and timing tests. A wide range of stress test patterns, combined with
bidirectional monitoring, enables technicians to identify and sectionalize circuit
problems and quickly qualify circuits for service acceptance. Users can perform
VF analysis of voice trunks with the FST-2310’s support of VF levels and tones
measurements. The drop-and-insert test feature qualifies a DS0 channel while the
T1 circuit remains in service. The FST-2310 isolates sources of timing errors by
using an external bits clock input to identify network synchronization problems.
Access to the DS1 signal is provided from the T1 interface or from the DS1 signal
embedded in a DS3, STS-1, OC-3, OC-12, or OC-48 circuit (figure 5).
figure 5 Perform bidirectional monitoring and BER testing on DS1 and DS3 circuits
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figure 6 Search for ATM traffic on DS1, DS3,OC-3, or
OC-12 circuits
FST-2310 TESTPAD
DS1/DS3 Jitter analysis
Verify possible timing problems encountered during installation, maintenance and
troubleshooting of SONET networks by jitter testing at DS1 or DS3 tributary interfaces.
Clock differences between two networks are compensated by pointer movements.
Timing problems cause excessive pointer movements at SONET interfaces. However,
lack of access at the high-speed SONET interfaces make it often impossible to verify
timing problems at synchronous levels. Pointer movements cause jitter at
plesiochronous tributary levels. The FST-2310 tests high-band and wide-band jitter at
DS1 and DS3 interface. In addition, the jitter results are simultaneously available with
DS1/3 bit-error-rate testing, eliminating the need for specialized test configurations
and without increasing test time.
ATM analysis
Analyze ATM circuits at OC-12c, OC-3c, DS3, and DS1 rates. Generate multiple cell
streams to perform key quality of service measurements (cell delay variation, cell error
ratio, cell loss ratio, round-trip delay), cell statistics and bandwidth utilization. The
FST-2310 supports OAM alarm (VP/VC AIS/RDI) and loopback cells as well as
modification of the VPI/VCI, PTI, CLP, and GFC fields of the cell header. Also
supported are the 0.191 ITU standard test cell and the ability to save up to four transmit
profiles (figure 6).
GR-303 protocol link analysis
Perform basic GR-303 protocol link analysis in Monitor/Through mode at the 64-K
data rate on a call processing (TMC/CSC) or operations channel (EOC).
Analysis is conducted unobtrusively to decode messages on the system’s protocol links.
Technicians can monitor call statistics, filter call control messages based on cause code,
or monitor layer-2 packet statistics to qualify proper functioning of the GR-303
interface. The GR-303 option also provides support for tracing calls based on filter
criteria (for example call reference value – CRV) established through the test setup.
Once the call is traced, clicking on the appropriate call provides decodes of the protocol
message that were exchanged to establish the call.
ISDN PRI testing
Emulate an ISDN TE device, such as a PBX, to place and receive voice and data
calls on an ISDN PRI circuit. The FST-2310 TestPad enables users to monitor and
capture signaling messages exchanged on the D-channel. Caller ID/Caller ID
blocking, 21-digit dialing and DTMF digits are all supported. Call status results
and progress reports provide an additional level of detail to ensure calls are
successfully established (figure 7).
The FST-2310’s ISDN functionality supports AT&T specific call control (5ESS, DMS100, National ISDN-II). The FST-2310 can be used for backup D-channel testing to
switch between standby and in-service D-channels, bidirectional monitoring with full
text decodes for protocol messages exchanged on the D-channel, as well as testing of
multiple DS1 lines with NFAS testing.
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DSX-1
ISDN network
FST-2310
NIU/
Smart
Jack
ISDN
Switch
FST-2310
figure 7 Perform ISDN terminal emulation as well as
monitor ISDN links from DS1, DS3 and STS-1 circuits
figure 8 Send loop codes to a T1 NIU/CSU
FST-2310 TESTPAD
Signaling analysis
Emulate the PBX/switch for placing and receiving calls and monitor signaling
digits for detailed analysis. The FST-2310 signaling features include E&M, loop
start, and ground start support for placing and receiving calls. The FST-2310
provides support for DP, DTMF, and MF digit recognition. It can also perform
interevent and interdigit delay measurements as well as event and digit duration
measurements.
The signaling (ABCD) bits for all DS0s can be displayed in one simple result
window. A speaker, microphone, and handset are provided for verifying voice
integrity.
Loopback applications
Sectionalize T1/T3 circuits with the FST-2310 and its support for NIU/CSU
loopback and user-programmable loop codes. The FST-2310 can sectionalize the
network and verify the functionality of intelligent line-equipment and repeaters
with its ability to loopback T1/T3 network elements (figure 8) .
Online help
The easy-to-use online help screens provide information on product descriptions,
common applications, product specifications, cabling diagrams, and contact
information (figure 9).
Software support
All JDSU products are continually being updated through software
enhancements. The FST-2310 TestPad, in particular, keeps pace with advancing
technologies through enhanced software revisions to add value to its users and
customers. Software upgrades are done in the field in minutes through the
PCMCIA card interface.
figure 9 Online help provides quick cards and cabling diagrams
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FST-2310 TESTPAD
Dual-PCMCIA card slot
Power LED
Microphone
Printer connector
Speaker
Charge LED
Low battery LED
Active port LEDs
Dual DS1 Tx/Rx
DS3/STS-1
RX, single
TX
Optical connectors for OC-3/12/48
Rx pulse and TX laser LEDs
Battery door
figure 10 Physical characteristics of the FST-2310
Touch-sensitive LCD
LED display panel
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FST-2310 TESTPAD
Technical specifications
Physical characteristics
Overall dimensions7.5 x 11.5 x 2.25 in
(19 x 29.2 x 5.7 cm)
Weight5 lb (2.27 kg), with battery
Environment
Temperature range
Operating32°F to 113°F (0°C to 45°C)
Storage–4°F to 158°F (–20°C to 70°C)
Shock and vibrationMeets IEEE-743
Electrical
Battery type10.8 V Nickel-Metal-Hydride (NiMH)
Operating timeUp to 1.5 hours for performing
DS3/DS1 tests
Recharging periodMaximum 1.5 hours with unit off
AC adapter19 VDC,2.6 amps
90-240 VAC,45-65 Hz
Optical specifications for OC-48
Optical connectors
1 OC-48 Receive – FC, SC,or ST
1 OC-48 1310 nm High-Power Transmit – FC, SC, or ST
1 OC-48 1550 nm High-Power Transmit – FC, SC, or ST (dual
wavelength configurations only)
Transmitter
Single/multimode fiber compatible
Wavelength1310 nm/1550 nm
Clock frequency accuracy ±3 ppm
High-power TX output+3 dBm to –2 dBm
1 OC-3/12 Receive – FC, SC,or ST
1 OC-3/12 Transmit – FC, SC,or ST
Transmit signal
Single/multimode fiber compatible
Average output power–8 dBm to –15 dBm
(+3 dBm to –2 dBm on OC-48-equipped units)
Eye diagramPer Bell Core GR-253-C-1995
Clock frequency accuracy
±3 ppm ±1 ppm per year
Receive signal
Single/multimode fiber compatible
Average input power receive level
–8 dBm to –28 dBm
Frequency range±500 ppm
Clock frequency accuracy
±3 ppm ±1 ppm per year
Jitter tolerancePer Bell Core GR-253-CORE-1995
Level measurement
Range–5 to –45 dBm
Accuracy±2 dB
Resolution±0.1 dB
Input specifications for DS3 AND STS-1
Connector typeWECO 560A jack
Input level
HighAccepts nominal 1.2 Vp,
0 ft of cable from high source
DSXAccepts nominal 0.6 Vp,
450 ft of cable from high source
LowAccepts nominal 0.3 Vp,
900 ft of cable from high source
Maximum signal level without errors with 1.7 Vp
Minimum signal level without errors with 0.025 Vp
Maximum input signal level with 2.5 Vp
Input impedance75 ohms nominal,
BRIDGE+6 to –35.0 dBdsx
TERM+6 to –35.0 dBdsx
DSX-MON–10 to –26.0 dBdsx of resistive loss
Jitter tolerancePer Bell Pub 62411-1990
Accuracy
Receive level measurement
From 6 dBdsx to –15 dBdsx,accuracy of ±1 dB
From –16 dBdsx to –30 dBdsx,accuracy of ±2 dB
From –31 dBdsx to –40 dBdsx,accuracy of ±3 dB
Simplex current measurement
±2% or ±2 mA to 60 mA
±3% or ±3 mA from 61 mA to 175 mA
Frequency measurement accuracy
±3 ppm ±1 ppm/year
Output specifications for DS1
Connector typeBantam jack
LBO level
Line build-out of 0, –7.5,–15.0, and –22.5 dB of cable loss at
772 Hz
LBO tolerance
±2 dB for –22.5 at 772 kHz
±1 dB for 0, –7.5,and–15 at 772 kHz
Internal timing±3 ppm ±1 ppm per year
Line codesAMI or B8ZS
Error insert typeLogic,BPV,or Frame
Pulse shapePer applicable specifications
*Specify type of optical connector: FC, SC, or ST Analyzer
Options
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FST-2310 TESTPAD
Analyzer Options
2310-PDH-JIT2310 PDH Jitter Test
Advanced stress patternsTB2310-ASP
ATM analysis for OC12cTB2310-ATM-OC12
ATM analysis for OC3cTB2310-ATM-OC3
ATM analysis for DS3TB2310-ATM-DS3
ATM analysis for DS3 and DS1TB2310-ATM-DSN
Digital data services (DDS) analysisTB2310-DDS
Secondary receiver for DS3 and STS-1 interfaces
TB2310-DUALRX
Remote control GUITB2310-REM
SDH testing at STM-16,STM-4, and STM-1