All specifications apply to the conditions of a 0 to 55 °C temperature range, unless
otherwise stated, and 30 minutes after the instrument has been turned on.
Specifications (spec.): Warranted performance. Specifications include guardbands to
account for the expected statistical performance distribution, measurement uncertainties,
and changes in performance due to environmental conditions.
Supplemental information is provided as information that is useful in operating the
instrument, but is not covered by the product warranty. This information is classified as
either typical or nominal.
Typical (typ.): Expected performance of an average unit without taking guardbands
into account.
Nominal (nom.): A general descriptive term that does not imply a level of performance.
How to Use Tables
E4980A/E4980AL
When measurement conditions fall under multiple categories in a table, apply the best
value.
For example, basic accuracy Ab is 0.10% under the following conditions;
Measurement time mode SHORT
Test frequency 125 Hz
Test signal voltage 0.3 Vrms
The E4980A is the model number of the 20 Hz to 2 MHz frequency range LCR meter.
The E4980AL is the model number of the low frequency options (20 Hz to 300 kHz/
500 kHz/1 MHz) of the E4980A. This is a distributor preferred product and the model
number E4980AL is used only for ordering and shipment purpose. The actual unit of the
E4980AL is labeled as the E4980A (not E4980AL). See the E4980A/E4980AL
Configuration Guide (5989-8321EN) for more details.
Frequency rangeModel number and
option for ordering
20 Hz to 2 MHzE4980AE4980A
20 Hz to 1 MHzE4980AL-100E4980A-100
20 Hz to 500 kHzE4980AL-050E4980A-050
20 Hz to 300 kHzE4980AL-030E4980A-030
Model number and
option of products
2
Basic Specifications
Measurement functions
Measurement parameters
• Cp-D, Cp-Q, Cp-G, Cp-Rp
• Cs-D, Cs-Q, Cs-Rs
• Lp-D, Lp-Q, Lp-G, Lp-Rp, Lp-Rdc
• Ls-D, Ls-Q, Ls-Rs, Ls-Rdc
• R-X
• Z-θd, Z-θr
• G-B
• Y-θd, Y-θr
• Vdc-Idc
2
Definitions
Cp Capacitance value measured with parallel-equivalent circuit model
Cs Capacitance value measured with series-equivalent circuit model
Lp Inductance value measured with parallel-equivalent circuit model
Ls Inductance value measured with series-equivalent circuit model
D Dissipation factor
Q Quality factor (inverse of D)
G Equivalent parallel conductance measured with parallel-equivalent circuit model
Rp Equivalent parallel resistance measured with parallel-equivalent circuit model
Rs Equivalent series resistance measured with series-equivalent circuit model
Rdc Direct-current resistance
R Resistance
X Reactance
Z Impedance
Y Admittance
θdPhase angle of impedance/admittance (degree)
θrPhase angle of impedance/admittance (radian)
B Susceptance
Vdc Direct-current voltage
Idc Direct-current electricity
1
1
1. Option 001, 030, 050, 100 or 200 is required.
2. Option 001 is required.
Deviation measurement function: Deviation from reference value and percentage of
deviation from reference value can be output as the result.
Equivalent circuits for measurement: Parallel, Series
Impedance range selection: Auto (auto range mode), manual (hold range mode)
Trigger mode: Internal trigger (INT), manual trigger (MAN), external trigger (EXT), GPIB
trigger (BUS)
3
Table 1. Trigger delay time
Range 0 s - 999 s
Resolution 100 µs (0 s - 100 s)
1 ms (100 s - 999 s)
Table 2. Step delay time
Range 0 s - 999 s
Resolution 100 µs (0 s - 100 s)
1 ms (100 s - 999 s)
Measurement terminal: Four-terminal pair
Test cable length: 0 m, 1 m, 2 m, 4 m
Measurement time modes: Short mode, medium mode, long mode.
2 µArms (2 mArms - 5 mArms)
5 µArms (5 mArms - 10 mArms)
10 µArms (10 mArms - 20 mArms)
AccuracyNormal ±(10% + 10 µArms) Test frequency ≤ 1 MHz: spec. Test frequency > 1 MHz: typ.
Constant1 ±(6% + 10 µArms) Test frequency < = 1 MHz: spec.
Test frequency > 1 MHz: typ.
Output impedance: 100 Ω (nominal)
Test signal level monitor function
• Test signal voltage and test signal current can be monitored.
• Level monitor accuracy:
Table 8. Test signal voltage monitor accuracy (Vac)
Test signal voltage2 Test frequency Specification
5 mVrms - 2 Vrms ≤ 1 MHz ± (3% of reading value + 0.5 mVrms)
> 1 MHz ± (6% of reading value + 1 mVrms)
Table 9. Test signal current monitor accuracy (lac)
Test signal current2 Test frequency Specification
50 µArms - 20 mArms ≤ 1 MHz ± (3% of reading value + 5 µArms)
> 1 MHz ± (6% of reading value + 10 µArms)
1. When auto level control function is on.
2. This is not an output value but rather a displayed
test signal level.
5
Measurement display ranges
Table 10 shows the range of measured value that can be displayed on the screen.
For the effective measurement ranges, refer to Figure 1. impedance measurement
accuracy example .
Table 10. Allowable display ranges for measured values
Parameter Measurement display range
Cs, Cp ± 1.000000 aF to 999.9999 EF
Ls, Lp ± 1.000000 aH to 999.9999 EH
D ± 0.000001 to 9.999999
Q ± 0.01 to 99999.99
R, Rs, Rp, ± 1.000000 aΩ to 999.9999 EΩ
X, Z, Rdc
G, B, Y ± 1.000000 aS to 999.9999 ES
Vdc ± 1.000000 aV to 999.9999 EV
Idc ± 1.000000 aA to 999.9999 EA
θr ± 1.000000 arad to 3.141593 rad
θd ± 0.0001 deg to 180.0000 deg
∆% ± 0.0001 % to 999.9999 %
-
a: 1 x 10
18
, E: 1 x 10
18
6
Absolute measurement accuracy
The following equations are used to calculate absolute accuracy.
Absolute accuracy Aa of |Z|, |Y|, L, C, R, X, G, B (L, C, X, and B accuracies apply
when Dx ≤ 0.1, R and G accuracies apply when Qx ≤ 0.1 )
Equation 1. Aa = Ae + Acal
Aa Absolute accuracy (% of reading value)
Ae Relative accuracy (% of reading value)
Acal Calibration accuracy (%)
where G accuracy is applied only to G-B measurements.
D accuracy (when Dx ≤ 0.1)
Equation 2. De + θcal
Dx Measured D value
De Relative accuracy of D
θcal Calibration accuracy of θ (radian)
Q accuracy (When Qx × Da < 1)
Equation 3. ±
(1 Qx × Da)
Qx Measured Q value
Da Absolute accuracy of D
θ accuracy
Equation 4. θe + θcal
θe Relative accuracy of θ (degree)
θcal Calibration accuracy of θ (degree)
(Qx
±
2
× Da)
7
G accuracy (when Dx ≤ 0.1)
Equation 5. Bx + Da (S)
Bx = 2πfCx =
2πfLx
Dx Measured D value
Bx Measured B value (S)
Da Absolute accuracy of D
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)
where the accuracy of G is applied to Cp-G measurements.
Absolute accuracy of Rp (when Dx ≤ 0.1)
Equation 6.
Dx Da
Rpx Measured Rp value (Ω)
Dx Measured D value
Da Absolute accuracy of D
Absolute accuracy of Rs (when Dx ≤ 0.1)
Equation 7. Xx × Da (Ω)
Xx = 1 = 2πfLx
Rpx × Da
±
±
2πfCx
1
(Ω)
Dx Measured D value
Xx Measured X value (Ω)
Da Absolute accuracy of D
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)
8
Relative accuracy
Relative accuracy includes stability, temperature coefficient, linearity, repeatability, and
calibration interpolation error. Relative accuracy is specified when all of the following
conditions are satisfied:
• Warm-up time: 30 minutes
• Test cable length: 0 m, 1 m, 2 m, or 4 m (Agilent 16047A/B/D/E)
• A “Signal Source Overload” warning does not appear.
When the test signal current exceeds a value in table 11 below, a “Signal
Source Overload” warning appears.
Table 11.
Test signal voltage Test frequency Condition
≤ 2 Vrms – –
> 2 Vrms ≤ 1 MHz the smaller value of either 110 mA or
Vac [V] Test signal voltage
Fm [Hz] Test frequency
L_cable [m] Cable length
• OPEN and SHORT corrections have been performed.
• Bias current isolation: Off
• The DC bias current does not exceed a set value within each range of the DC
bias current
• The optimum impedance range is selected by matching the impedance of DUT to the
effective measuring range.
• Under an AC magnetic field, the following equation is applied to the measurement
accuracy.
A x ( 1 + B x ( 2 + 0.5 / Vs))
Where
A: Absolute accuracy
B: Magnetic flux density [Gauss]
Vs: Test signal voltage level [Volts]
1
1. When the calculation result is a negative value,
0 A is applied.
|Z|, |Y|, L, C, R, X, G, and B accuracy (L, C, X, and B accuracies apply when
Dx ≤ 0.1, R and G accuracies apply Qx ≤ 0.1)
Relative accuracy Ae is given as:
Equation 8. Ae = [Ab + Zs /|Zm| × 100 + Yo × |Zm| × 100 ] × Kt
Zm Impedance of DUT
Ab Basic accuracy
Zs Short offset
Yo Open offset
Kt Temperature coefficient
D accuracy
D accuracy De is given as
• when Dx ≤ 0.1
Equation 9. De = ±Ae/100
Dx Measured D value
Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B
• when Dx > 0.1, multiply De by (1 + Dx)
9
Q accuracy (when Q x De < 1)
Q accuracy Qe is given as:
2
× De)
Equation 10. Qe = ±
(1 Qx × De)
(Qx
±
Qx Measured Q value
De Relative D accuracy
θ accuracy
θ accuracy θe is given as:
Equation 11. θe =
π × 100
180 × Ae
(deg)
Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B
G accuracy (when Dx ≤ 0.1)
G accuracy Ge is given as:
Equation 12. Ge = Bx × De (S)
Bx = 2πfCx =
2πfLx
1
Ge Relative G accuracy
Dx Measured D value
Bx Measured B value
De Relative D accuracy
f Test frequency
Cx Measured C value (F)
Lx Measured L value (H)
Rp accuracy (when Dx ≤ 0.1)
Rp accuracy Rpe is given as:
Rpx × De
Equation 13. Rpe = ±
Dx De
±
(Ω)
Rpe Relative Rp accuracy
Rpx Measured Rp value (Ω)
Dx Measured D value
De Relative D accuracy
Rs accuracy (when Dx ≤ 0.1)
Rs accuracy Rse is given as:
Equation 14. Rse = Xx × De (Ω)
Xx = 1 = 2πfLx
2πfCx
Rse Relative Rs accuracy
Dx Measured D value
Xx Measured X value (Ω)
De Relative D accuracy
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)
10
Example of C-D accuracy calculation
Measurement conditions
Test Frequency: 1 kHz
Measured C value: 100 nF
Test signal voltage: 1 Vrms
Measurement time mode: Medium
Measurement temperature: 23 °C