Atec Agilent-E4980A, Agilent-E4980AL User Manual

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E4980A Precision LCR Meter

20 Hz to 2 MHz

E4980AL Precision LCR Meter

20 Hz to 300 kHz/500 kHz/1 MHz

Data Sheet

Fully compliant to LXI Class C specification

Definitions

All specifications apply to the conditions of a 0 to 55 °C temperature range, unless otherwise stated, and 30 minutes after the instrument has been turned on.

Specifications (spec.): Warranted performance. Specifications include guardbands to account for the expected statistical performance distribution, measurement uncertainties, and changes in performance due to environmental conditions.

Supplemental information is provided as information that is useful in operating the instrument, but is not covered by the product warranty. This information is classified as either typical or nominal.

Typical (typ.): Expected performance of an average unit without taking guardbands into account.

Nominal (nom.): A general descriptive term that does not imply a level of performance.

How to Use Tables

E4980A/E4980AL

When measurement conditions fall under multiple categories in a table, apply the best value.

For example, basic accuracy Ab is 0.10% under the following conditions; Measurement time mode SHORT

Test frequency 125 Hz Test signal voltage 0.3 Vrms

The E4980A is the model number of the 20 Hz to 2 MHz frequency range LCR meter. The E4980AL is the model number of the low frequency options (20 Hz to 300 kHz/ 500 kHz/1 MHz) of the E4980A. This is a distributor preferred product and the model number E4980AL is used only for ordering and shipment purpose. The actual unit of the E4980AL is labeled as the E4980A (not E4980AL). See the E4980A/E4980AL Configuration Guide (5989-8321EN) for more details.

Frequency range Model number and

option for ordering

20 Hz to 2 MHz E4980A E4980A 20 Hz to 1 MHz E4980AL-100 E4980A-100 20 Hz to 500 kHz E4980AL-050 E4980A-050 20 Hz to 300 kHz E4980AL-030 E4980A-030

Model number and option of products

Basic Specifications

Measurement functions

Measurement parameters

• Cp-D, Cp-Q, Cp-G, Cp-Rp

• Cs-D, Cs-Q, Cs-Rs

• Lp-D, Lp-Q, Lp-G, Lp-Rp, Lp-Rdc

• Ls-D, Ls-Q, Ls-Rs, Ls-Rdc

• R-X

• Z-θd, Z-θr

• G-B

• Y-θd, Y-θr

• Vdc-Idc

Definitions

Cp Capacitance value measured with parallel-equivalent circuit model Cs Capacitance value measured with series-equivalent circuit model Lp Inductance value measured with parallel-equivalent circuit model Ls Inductance value measured with series-equivalent circuit model D Dissipation factor Q Quality factor (inverse of D) G Equivalent parallel conductance measured with parallel-equivalent circuit model Rp Equivalent parallel resistance measured with parallel-equivalent circuit model Rs Equivalent series resistance measured with series-equivalent circuit model Rdc Direct-current resistance R Resistance X Reactance Z Impedance Y Admittance

θd Phase angle of impedance/admittance (degree) θr Phase angle of impedance/admittance (radian)

B Susceptance Vdc Direct-current voltage Idc Direct-current electricity

1. Option 001, 030, 050, 100 or 200 is required.

2. Option 001 is required.

Deviation measurement function: Deviation from reference value and percentage of deviation from reference value can be output as the result.

Equivalent circuits for measurement: Parallel, Series Impedance range selection: Auto (auto range mode), manual (hold range mode) Trigger mode: Internal trigger (INT), manual trigger (MAN), external trigger (EXT), GPIB

trigger (BUS)

Table 1. Trigger delay time

Range 0 s - 999 s Resolution 100 µs (0 s - 100 s)

1 ms (100 s - 999 s)

Table 2. Step delay time

Range 0 s - 999 s Resolution 100 µs (0 s - 100 s)

1 ms (100 s - 999 s)

Measurement terminal: Four-terminal pair Test cable length: 0 m, 1 m, 2 m, 4 m Measurement time modes: Short mode, medium mode, long mode.

Table 3. Averaging

Range 1 - 256 measurements Resolution 1

Test signal

Table 4. Test frequencies

Test frequencies 20 Hz - 2 MHz

20 Hz - 1 MHz (Option 100) 20 Hz - 500 kHz (Option 050) 20 Hz - 300 kHz (Option 030)

Resolution 0.01 Hz (20 Hz - 99.99 Hz)

0.1 Hz (100 Hz - 999.9 Hz) 1 Hz (1 kHz - 9.999 kHz) 10 Hz (10 kHz - 99.99 kHz) 100 Hz (100 kHz - 999.9 kHz) 1 kHz (1 MHz - 2 MHz)

Measurement accuracy ± 0.01%

Table 5. Test signal modes

Normal Program selected voltage or current at the measurement

terminals when they are opened or short-circuited, respectively. Constant Maintains selected voltage or current at the device under test

(DUT) independently of changes in impedance of DUT.

Signal level

Table 6. Test signal voltage

Range 0 Vrms - 2.0 Vrms Resolution 100 µVrms (0 Vrms - 0.2 Vrms)

200 µVrms (0.2 Vrms - 0.5 Vrms) 500 µVrms (0.5 Vrms - 1 Vrms) 1 mVrms (1 Vrms - 2 Vrms) Accuracy Normal ±(10% + 1 mVrms) Test frequency ≤ 1 MHz: spec. Test frequency > 1 MHz: typ. Constant Test frequency > 1 MHz: typ.

±(6% + 1 mVrms) Test frequency ≤ 1 MHz: spec.

Table 7. Test signal current

Range 0 Arms - 20 mArms Resolution 1 µArms (0 Arms - 2 mArms)

2 µArms (2 mArms - 5 mArms) 5 µArms (5 mArms - 10 mArms) 10 µArms (10 mArms - 20 mArms) Accuracy Normal ±(10% + 10 µArms) Test frequency ≤ 1 MHz: spec. Test frequency > 1 MHz: typ. Constant1 ±(6% + 10 µArms) Test frequency < = 1 MHz: spec. Test frequency > 1 MHz: typ.

Output impedance: 100 Ω (nominal)

Test signal level monitor function

• Test signal voltage and test signal current can be monitored.

• Level monitor accuracy:

Table 8. Test signal voltage monitor accuracy (Vac)

Test signal voltage2 Test frequency Specification 5 mVrms - 2 Vrms ≤ 1 MHz ± (3% of reading value + 0.5 mVrms)

> 1 MHz ± (6% of reading value + 1 mVrms)

Table 9. Test signal current monitor accuracy (lac)

Test signal current2 Test frequency Specification 50 µArms - 20 mArms ≤ 1 MHz ± (3% of reading value + 5 µArms)

> 1 MHz ± (6% of reading value + 10 µArms)

1. When auto level control function is on.

2. This is not an output value but rather a displayed test signal level.

Measurement display ranges

Table 10 shows the range of measured value that can be displayed on the screen. For the effective measurement ranges, refer to Figure 1. impedance measurement accuracy example .

Table 10. Allowable display ranges for measured values

Parameter Measurement display range

Cs, Cp ± 1.000000 aF to 999.9999 EF

Ls, Lp ± 1.000000 aH to 999.9999 EH

D ± 0.000001 to 9.999999

Q ± 0.01 to 99999.99

R, Rs, Rp, ± 1.000000 aΩ to 999.9999 EΩ X, Z, Rdc

G, B, Y ± 1.000000 aS to 999.9999 ES

Vdc ± 1.000000 aV to 999.9999 EV

Idc ± 1.000000 aA to 999.9999 EA

θr ± 1.000000 arad to 3.141593 rad

θd ± 0.0001 deg to 180.0000 deg

∆% ± 0.0001 % to 999.9999 %

a: 1 x 10

, E: 1 x 10

Absolute measurement accuracy

The following equations are used to calculate absolute accuracy.

Absolute accuracy Aa of |Z|, |Y|, L, C, R, X, G, B (L, C, X, and B accuracies apply when Dx ≤ 0.1, R and G accuracies apply when Qx ≤ 0.1 )

Equation 1. Aa = Ae + Acal

Aa Absolute accuracy (% of reading value) Ae Relative accuracy (% of reading value) Acal Calibration accuracy (%)

where G accuracy is applied only to G-B measurements.

D accuracy (when Dx ≤ 0.1)

Equation 2. De + θcal

Dx Measured D value De Relative accuracy of D

θcal Calibration accuracy of θ (radian)

Q accuracy (When Qx × Da < 1)

Equation 3. ± (1 Qx × Da)

Qx Measured Q value Da Absolute accuracy of D

θ accuracy

Equation 4. θe + θcal

θe Relative accuracy of θ (degree) θcal Calibration accuracy of θ (degree)

(Qx

× Da)

G accuracy (when Dx ≤ 0.1)

Equation 5. Bx + Da (S) Bx = 2πfCx =

2πfLx

Dx Measured D value Bx Measured B value (S) Da Absolute accuracy of D f Test frequency (Hz) Cx Measured C value (F) Lx Measured L value (H)

where the accuracy of G is applied to Cp-G measurements.

Absolute accuracy of Rp (when Dx ≤ 0.1)

Equation 6. Dx Da

Rpx Measured Rp value (Ω) Dx Measured D value Da Absolute accuracy of D

Absolute accuracy of Rs (when Dx ≤ 0.1)

Equation 7. Xx × Da (Ω)

Xx = 1 = 2πfLx

Rpx × Da

2πfCx

(Ω)

Dx Measured D value Xx Measured X value (Ω) Da Absolute accuracy of D f Test frequency (Hz) Cx Measured C value (F) Lx Measured L value (H)

Relative accuracy

Relative accuracy includes stability, temperature coefficient, linearity, repeatability, and calibration interpolation error. Relative accuracy is specified when all of the following conditions are satisfied:

• Warm-up time: 30 minutes

• Test cable length: 0 m, 1 m, 2 m, or 4 m (Agilent 16047A/B/D/E)

• A “Signal Source Overload” warning does not appear. When the test signal current exceeds a value in table 11 below, a “Signal Source Overload” warning appears.

Table 11.

Test signal voltage Test frequency Condition

≤ 2 Vrms – – > 2 Vrms ≤ 1 MHz the smaller value of either 110 mA or

130 mA - 0.0015 × Vac × (Fm / 1 MHz) × (L_cable + 0.5) > 1 MHz 70 mA - 0.0015 × Vac × (Fm / 1 MHz) × (L_cable + 0.5)

Vac [V] Test signal voltage Fm [Hz] Test frequency L_cable [m] Cable length

• OPEN and SHORT corrections have been performed.

• Bias current isolation: Off

• The DC bias current does not exceed a set value within each range of the DC bias current

• The optimum impedance range is selected by matching the impedance of DUT to the effective measuring range.

• Under an AC magnetic field, the following equation is applied to the measurement accuracy. A x ( 1 + B x ( 2 + 0.5 / Vs)) Where A: Absolute accuracy B: Magnetic flux density [Gauss] Vs: Test signal voltage level [Volts]

1. When the calculation result is a negative value, 0 A is applied.

|Z|, |Y|, L, C, R, X, G, and B accuracy (L, C, X, and B accuracies apply when Dx ≤ 0.1, R and G accuracies apply Qx ≤ 0.1)

Relative accuracy Ae is given as: Equation 8. Ae = [Ab + Zs /|Zm| × 100 + Yo × |Zm| × 100 ] × Kt

Zm Impedance of DUT Ab Basic accuracy Zs Short offset Yo Open offset Kt Temperature coefficient

D accuracy

D accuracy De is given as

• when Dx ≤ 0.1

Equation 9. De = ±Ae/100

Dx Measured D value Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B

• when Dx > 0.1, multiply De by (1 + Dx)

Q accuracy (when Q x De < 1)

Q accuracy Qe is given as:

× De)

Equation 10. Qe = ± (1 Qx × De)

(Qx

Qx Measured Q value De Relative D accuracy

θ accuracy θ accuracy θe is given as:

Equation 11. θe = π × 100

180 × Ae

(deg)

Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B

G accuracy (when Dx ≤ 0.1)

G accuracy Ge is given as:

Equation 12. Ge = Bx × De (S)

Bx = 2πfCx = 2πfLx

Ge Relative G accuracy Dx Measured D value Bx Measured B value De Relative D accuracy f Test frequency Cx Measured C value (F) Lx Measured L value (H)

Rp accuracy (when Dx ≤ 0.1)

Rp accuracy Rpe is given as:

Rpx × De Equation 13. Rpe = ± Dx De

(Ω)

Rpe Relative Rp accuracy Rpx Measured Rp value (Ω) Dx Measured D value De Relative D accuracy

Rs accuracy (when Dx ≤ 0.1)

Rs accuracy Rse is given as:

Equation 14. Rse = Xx × De (Ω)

Xx = 1 = 2πfLx 2πfCx

Rse Relative Rs accuracy Dx Measured D value Xx Measured X value (Ω) De Relative D accuracy f Test frequency (Hz) Cx Measured C value (F) Lx Measured L value (H)

Example of C-D accuracy calculation

Measurement conditions

Test Frequency: 1 kHz Measured C value: 100 nF Test signal voltage: 1 Vrms Measurement time mode: Medium Measurement temperature: 23 °C

Ab = 0.05% |Zm| = 1 / (2π × 1 × 10

× 100 × 10-9) = 1590 Ω Zs = 0.6 mΩ × (1 + 0.400/1) × (1 + √(1000/1000) = 1.68 mΩ Yo = 0.5 nS × (1 + 0.100/1) × (1 + √(100/1000) = 0.72 nS C accuracy: Ae = [0.05 + 1.68 m/1590 × 100 + 0.72 n × 1590 × 100] × 1 = 0.05% D accuracy: De = 0.05/100 = 0.0005

Basic accuracy

Basic accuracy Ab is given below.

Table 12. Measurement time mode = SHORT

Test signal voltage

Test 5 mVrms - 50 mVrms - 0.3 Vrms - 1 Vrms - 10 Vrms frequency [Hz] 50 mVrms 0.3 Vrms 1 Vrms 10 Vrms 20 Vrms

20 - 125 (0.6%) × 0.60% 0.30% 0.30% 0.30% (50 mVrms/Vs)

125 - 1 M (0.2%) × 0.20% 0.10% 0.15% 0.15% (50 mVrms/Vs)

1 M - 2 M (0.4%) × 0.40% 0.20% 0.30% 0.30%

(50 mVrms/Vs)

Table 13. Measurement time mode = MED, LONG

Test signal voltage

Test 5 mVrms - 50 mVrms - 0.3 Vrms - 1 Vrms - 10 Vrms frequency [Hz] 50 mVrms 0.3 Vrms 1 Vrms 10 Vrms 20 Vrms

20 - 100 (0.25%) × 0.25% 0.10% 0.15% 0.15% (30 mVrms/Vs) 100 - 1 M (0.1%) × 0.10% 0.05% 0.10% 0.15% (30 mVrms/Vs) 1 M - 2 M (0.2%) × 0.20% 0.10% 0.20% 0.30% (30 mVrms/Vs)

Vs [Vrms] Test signal voltage

Effect by impedance of DUT

Table 14. For impedance of DUT below 30 Ω, the following value is added.

Test Impedance of DUT frequency [Hz] 1.08 Ω ≤ |Zx| < 30 Ω |Zx| < 1.08 Ω

20 - 1 M 0.05% 0.10% 1 M - 2 M 0.10% 0.20%

Table 15. For impedance of DUT over 9.2 k Ω, the following value is added.

Test Impedance of DUT frequency [Hz] 9.2 kΩ < |Zx| ≤ 92 kΩ 92 kΩ < |Zx|

10 k - 100 k 0% 0.05% 100 k - 1 M 0.05% 0.05% 1 M - 2 M 0.10% 0.10%

Effect of cable extension

When the cable is extended, the following element is added per one meter.

0.015 % × (Fm/1 MHz)

× (L_cable)

Fm [Hz] Test Frequency L_cable [m] Cable length

Short offset Zs

Table 16. Impedance of DUT > 1.08 Ω

Test Measurement time mode frequency [Hz] SHORT MED, LONG

20 - 2 M 2.5 mΩ × (1 + 0.400/Vs) × 0.6 mΩ × (1 + 0.400/Vs) × (1 + √(1000/Fm)) (1 + √(1000/Fm))

Table 17. Impedance of DUT ≤ 1.08 Ω

Test Measurement time mode frequency [Hz] SHORT MED, LONG

20 - 2 M 1 mΩ × (1 + 1/Vs) × 0.2 mΩ × (1 + 1/Vs) × (1 + √(1000/Fm)) (1 + √(1000/Fm))

Vs [Vrms] Test signal voltage Fm [Hz] Test frequency

Effect of cable extension (Short offset)

Table 18. When the cable is extended, the following value is added to Zs (independent of the measurement time mode).

Test Cable length frequency [Hz] 0 m 1 m 2 m 4 m

20 - 1 M 0 0.25 mΩ 0.5 mΩ 1 mΩ 1 M - 2 M 0 1 mΩ 2 mΩ 4 mΩ

Note

The Open Offset may become three times greater in the ranges of 40 to 70 kHz and 80 to 100 kHz due to residual response.

Open offset Yo

Table 19. Test signal voltage ≤ 2.0 Vrms

Test Measurement time mode frequency [Hz] SHORT MED, LONG

20 - 100 k 2 nS × (1 + 0.100/Vs) × 0.5 nS × (1 + 0.100/Vs) × (1 + √(100/Fm)) (1 + √(100/Fm)) 100 k - 1 M 20 nS × (1 + 0.100/Vs) 5 nS × (1 + 0.100/Vs) 1 M - 2 M 40 nS × (1 + 0.100/Vs) 10 nS × (1 + 0.100/Vs)

Table 20. Test signal voltage > 2.0 Vrms

Test Measurement time mode frequency [Hz] SHORT MED, LONG

20 - 100 k 2 nS × (1 + 2/Vs) × 0.5 nS × (1 + 2/Vs) × (1 + √(100/Fm)) (1 + √(100/Fm)) 100 k - 1 M 20 nS × (1 + 2/Vs) 5 nS × (1 + 2/Vs) 1 M - 2 M 40 nS × (1 + 2/Vs) 10 nS × (1 + 2/Vs)

Vs [Vrms] Test signal voltage Fm [Hz] Test frequency

Effect of cable length

Table 21. When the cable is extended, multiply Yo by the following factor.

Test Cable length frequency [Hz] 0 m 1 m 2 m 4 m

100 - 100 k 1 1 + 5 × Fm/1 MHz 1 + 10 × Fm/1 MHz 1 + 20 × Fm/1 MHz 100 k - 1 M 1 1 + 0.5 × Fm/1 MHz 1 + 1 × Fm/1 MHz 1 + 2 × Fm/1 MHz 1 M - 2 M 1 1 + 1 × Fm/1 MHz 1 + 2 × Fm/1 MHz 1 + 4 × Fm/1 MHz

Fm [Hz] Test frequency

Temperature factor Kt

Table 22. The temperature factor Kt is given below.

Temperature [°C] Kt

0 - 18 4 18 - 28 1 28 - 55 4

Calibration accuracy Acal

Calibration accuracy Acal is given below. For impedance of DUT on the boundary line, apply the smaller value.

Table 23. Impedance range = 0.1, 1, 10 Ω

Test frequency [Hz] 20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.05 0.05 0.05 + 0.05 + 0.1 + 5 × 10

θ [radian] 1 × 10-4 2 × 10-4 3 × 10-4 3 × 10-4 + 3 × 10-4 + 6 × 10-4 + 2 × 10

Table 24. Impedance range = 100 Ω

Test frequency [Hz] 20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.05 0.05 0.05 + 0.05 + 0.1 + 5 × 10

θ [radian] 1 × 10

-4

2 × 10-4 3 × 10-4 3 × 10-4 3 × 10-4 6 × 10

Table 25. Impedance range = 300, 1 kΩ

Test frequency [Hz] 20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.03 0.05 0.05 0.05 0.1 θ [radian] 1 × 10-4 1 × 10-4 3 × 10-4 3 × 10-4 3 × 10-4 6 × 10

-5

Fm 5 × 10

-7

Fm 2 × 10

-5

Fm 5 × 10

-5

Fm 1 × 10

-7

Fm 4 × 10

-5

Fm 1 × 10

-4

-7

-4

Table 26. Impedance range = 3 k, 10 kΩ

Test frequency [Hz] 20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 + 0.03 + 0.03 + 0.03 + 0.03 + 0.06 + 1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 2 × 10

-4

θ [radian] (100 + (100 + (100 + (100 + (100 + (200 +

2.5 Fm) × 10-6 2.5 Fm) × 10-6 2.5 Fm) × 10-6 2.5 Fm) × 10-6 2.5 Fm) × 10-6 5 Fm) × 10

Table 27. Impedance range = 30 k, 100 kΩ

Test frequency [Hz] 20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 + 0.03 + 0.03 + 0.03 + 0.03 + 0.06 + 1 × 10

θ [radian] (100 + (100 + (100 + (100 + (100 + (200 +

20 Fm) × 10

Fm[kHz] Test frequency

-3

Fm 1 × 10

-6

-3

Fm 1 × 10

20 Fm) × 10

-6

20 Fm) × 10

-3

Fm 1 × 10

-6

-3

Fm 1 × 10

20 Fm) × 10

-6

2.5 Fm) × 10

-4

Fm 2 × 10

-6

-4

5 Fm) × 10

-6

Measurement accuracy

The impedance measurement calculation example below is the result of absolute measurement accuracy.

[ S ]

10n

100n

10μ

100μ

10m

1kH

100aF

100H

10H

10pF

100pF

100M

1nF

10M

1pF

100fF

1MH

100kH

10.0%

1.0%

10fF

10kH

1fF

0.3%

10nF

1μ

[Ω]

100k

10k

100

100nF

1μF

10μF

100μF

0.1%

100mH

10mH

1mH

100μH

10μH

100m

100

1mF

10mF

0.3%

100mF

100m

10m

1.0%

10.0%

20 100 1k 10k 100k 1M 2M

Frequency [ Hz ]

Figure 1. Impedance measurement accuracy (Test signal voltage = 1 Vrms, cable length=0 m, measurement time mode = MED)

1μH

100nH

10nH

1nH

100pH

Compensation function

Table 28. The E4980A provides three types of compensation functions: OPEN compensation, SHORT compensation, and LOAD compensation.

Type of compensation Description

OPEN compensation Compensates errors caused by the stray admittance (C, G) of the test fixture. SHORT compensation Compensates errors caused by the residual impedance (L, R) of the test fixture. LOAD compensation Compensates errors between the actual measured value and a known standard value under the measurement conditions desired by the user.

List sweep

Points: There is a maximum of 201 points.

Note

A parameter selected for one of the two parameters cannot be selected for the other parameter. It is not possible to set up a combination of test signal voltage and test signal current or one of test signal voltage of DC bias signal and test signal current of DC bias.

The secondary parameter can be set only with SCPI commands.

First sweep parameter (primary parameter): Test frequency, test signal voltage, test signal current, test signal voltage of DC bias signal, test signal current of DC bias signal, DC source voltage.

Second sweep parameter (secondary parameter): None, impedance range, test frequency, test signal voltage, test signal current, test signal voltage of DC bias signal, test signal current of DC bias signal, DC source voltage

Trigger mode

Sequential mode: When the E4980A is triggered once, the device is measured at all

sweep points. /EOM/INDEX is output only once.

Step mode: The sweep point is incremented each time the E4980A is triggered. /EOM/INDEX is output at each point, but the result of the comparator function of the list sweep is available only after the last /EOM is output.

Comparator function of list sweep: The comparator function enables setting one pair of lower and upper limits for each measurement point.

You can select from: Judge with the first sweep parameter/Judge with the second parameter/Not used for each pair of limits.

Time stamp function: In the sequential mode, it is possible to record the measurement starting time at each measurement point by defining the time when FW detects a trigger as 0 and obtain it later with the SCPI command.

Comparator function

Bin sort: The primary parameter can be sorted into 9 BINs, OUT_OF_BINS, AUX_BIN,

and LOW_C_REJECT. The secondary parameter can be sorted into HIGH, IN, and LOW. The sequential mode and tolerance mode can be selected as the sorting mode.

Limit setup: Absolute value, deviation value, and % deviation value can be used for setup.

BIN count: Countable from 0 to 999999.

DC bias signal

Table 29. Test signal voltage

Range 0 V to +2 V Resolution 0 V / 1.5 V / 2 V only Accuracy 0.1% + 2 mV (23 °C ± 5 °C)

(0.1% + 2 mV) × 4 (0 to 18 °C or 28 to 55 °C)

Note

The following USB memory can be used. Complies with USB 1.1; mass storage class, FAT16/FAT32 format; maximum consumption current is below 500 mA.

Recommended USB memory: 4 GB USB Flash memory (Agilent PN 1819-0637).

Use the recommended USB memory device exclusively for the E4980A, otherwise, previously saved data may be cleared. If you use a USB memory other than the recommended device, data may not be saved or recalled normally.

Agilent Technologies will NOT be responsible for data loss in the USB memory caused by using the E4980A.

Output impedance: 100 Ω (nominal)

Measurement assistance functions

Data buffer function: Up to 201 measurement results can be read out in a batch.

Save/Recall function:

• Up to 10 setup conditions can be written to/read from the built-in non-volatile memory.

• Up to 10 setup conditions can be written to/read from the USB memory.

• Auto recall function can be performed when the setting conditions are written to Register 10 of the USB memory.

Key lock function: The front panel keys can be locked. GPIB: 24-pin D-Sub (Type D-24), female; complies with IEEE488.1, 2 and SCPI. USB host port: Universal serial bus jack, type-A (4 contact positions, contact 1 is on

your left), female (for connection to USB memory only). USB interface port: Universal serial bus jack, type mini-B (4 contact positions); complies

with USBTMC-USB488 and USB 2.0; female; for connection to the external controller.

USBTMC: Abbreviation for USB Test & Measurement Class LAN: 10/100 BaseT Ethernet, 8 pins (two speed options) LXI Compliance: Class C (only applies to units with firmware revision A.02.00 or later)

Options

Note

Option xxx is described as E4980A-xxx in the order information

The following options are available for the E4980A LCR Meter.

Frequency options

None of below 20 Hz to 2 MHz Option 030 20 Hz to 300 kHz Option 050 20 Hz to 500 kHz Option 100 20 Hz to 1 MHz

Table 30. Installable options

Options 2 MHz 300 kHz/500 kHz/1 MHz

Power and DC bias enhancement (001) installable not installable Bias Current Interface (002) installable not installable Entry model (005) installable not installable Standard model (007) installable not installable DCR measurement (200) installable Handler interface (201) installable installable Scanner interface (301) installable installable

not installable

Interface options

Option 002 (Bias current interface)

Adds a digital interface to allow the E4980A to control the 42841A’s bias current source.

Note

Option 007 can be installed only in the E4980A with option 005.

Note

Option 200, 001, 030, 050, and 100 supports DCR measurement function.

Option 201 (Handler interface)

Adds handler interface.

Option 301 (Scanner interface)

Adds scanner interface.

Option 710 (No interface)

An option with no interface. Up to 2 interface options can be installed in the interface connector on the rear panel.

When no interface is installed, two of the option 710 are installed. When one interface is installed, the option number of its interface and one option 710 are installed.

Other options

Option 001 (Power and DC Bias enhancement)

Increases test signal voltage and adds the variable DC bias voltage and DCR measurement funciton.

Option 005 (Entry model)

Low-priced option that requires a longer measurement time. The level of measurement accuracy is the same as the standard.

Option 007 (Standard model)

Upgrades the entry model to the standard.

Option 200 (DCR measurement)

Adds DCR measurement

1. Mandatory option

2. DCR measurement function is equipped by default.

Power and DC Bias enhancement specification

Increases test signal voltage and adds the variable DC bias voltage function. This function is available when the option 001 is installed.

Measurement parameters

The following parameters can be used.

• Lp-Rdc

• Ls-Rdc

• Vdc-Idc

where

Rdc Direct-current resistance (DCR) Vdc Direct-current voltage Idc Direct-current electricity

Test signal

Signal level

Table 31. Test signal voltage

Range 0 Vrms to 20 Vrms (test frequency ≤ 1 MHz)

0 Vrms to 15 Vrms (test frequency > 1 MHz) Resolution 100 µVrms (0 Vrms - 0.2 Vrms) 200 µVrms (0.2 Vrms - 0.5 Vrms) 500 µVrms (0.5 Vrms - 1 Vrms) 1 mVrms (1 Vrms - 2 Vrms) 2 mVrms (2 Vrms - 5 Vrms) 5 mVrms (5 Vrms - 10 Vrms) 10 mVrms (10 Vrms - 20 Vrms)

Setup accuracy normal ±(10% + 1 mVrms) (test signal voltage ≤ 2 Vrms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.) ±(10% + 10 mVrms) (Test frequency ≤ 300 kHz, test signal voltage > 2 Vrms) (spec.) ±(15% + 20 mVrms) (test frequency > 300 kHz, test signal voltage > 2 Vrms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)

Constant1 ±(6% + 1 mVrms) (test signal voltage ≤ 2 Vrms) (test frequency ≤ 1 MHz : spec. , test frequency > 1 MHz : typ.) ±(6% + 10 mVrms) (test frequency ≤ 300 kHz, test signal voltage > 2 Vrms) (spec.) ±(12% + 20 mVrms) (test frequency > 300 kHz, test signal voltage > 2 Vrms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)

1. When auto level control function is on.

Table 32. Test signal current

Range 0 Arms - 100 mArms Resolution 1 µArms (0 Arms - 2 mArms)

2 µArms (2 mArms - 5 mArms) 5 µArms (5 mArms - 10 mArms) 10 µArms (10 mArms - 20 mArms) 20 µArms (20 mArms - 50 mArms) 50 µArms (50 mArms - 100 mArms)

Setup accuracy normal ±(10% + 10 µArms) (test signal voltage ≤ 20 mArms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.) ±(10% + 100 µArms) (test frequency ≤ 300 kHz, test signal current > 20 mArms) (spec.) ±(15% + 200 µArms) (test frequency > 300 kHz, test signal voltage > 20 mArms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)

Constant (test frequency ≤ 1 MHz : spec. , test frequency > 1 MHz : typ.) ±(6% + 100 µArms) (test frequency ≤ 300 kHz, test signal voltage > 20 mArms) (spec.) ±(12% + 200 µArms) (test frequency > 300 kHz, test signal voltage > 20 mArms) (test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)

±(6% + 10 µArms) (test signal voltage ≤ 20 mArms)

Test signal level monitor function

• Test signal voltage and test signal current can be monitored.

• Level monitor accuracy:

Table 33. Test signal voltage monitor accuracy (Vac)

Test signal voltage2 Test frequency Specification

5 mVrms to 2 Vrms ≤ 1 MHz ±(3% of reading value + 0.5 mVrms) > 1MHz ±(6% of reading value + 1 mVrms)

> 2 Vrms ≤ 300 kHz ±(3% of reading value + 5 mVrms) > 300 kHz ±(6% of reading value + 10 mVrms)

Table 34. Test signal current monitor accuracy (Iac)

Test signal current2 Test frequency Specification

50 µArms to 20 mArms ≤ 1 MHz ±(3% of reading value + 5 µArms) > 1MHz ±(6% of reading value + 10 µArms)

> 20 mArms ≤ 300 kHz ±(3% of reading value + 50 µArms) > 300 kHz ±(6% of reading value + 100 µArms)

1. When auto level control function is on.

2. This is not an output value but a displayed test signal level

3. Typ. when test frequency is > 1 MHz with test signal voltage > 10 Vrms.

DC bias signal

Table 35. Test signal voltage

Range –40 V to +40 V Resolution Setup resolution: 100 µV, effective

resolution: 330 µV ±(0 V - 5 V) 1 mV ±(5 V - 10 V) 2 mV ±(10 V - 20 V) 5 mV ±(20 V - 40 V) Accuracy test signal voltage ≤ 2 Vrms 0.1% + 2 mV (23 (0.1% + 2 mV) x 4 (0 to 18 °C or 28 to 55 °C) test signal voltage > 2 Vrms 0.1 % + 4 mV (23 °C ± 5 °C) (0.1% + 4 mV) x 4 (0 to 18 °C or 28 to 55 °C)

°C ± 5 °C)

Table 36. Test signal current

Range –100 mA - 100 mA Resolution Setup resolution: 1 µA, effective

resolution: 3.3 µA ±(0 A - 50 mA) 10 µA ±(50 mA - 100 mA)

DC bias voltage level monitor Vdc

(0.5% of reading value + 60 mV) × Kt When using Vdc-Idc measurement: (spec.) When using level monitor: (typ.) Kt Temperature coefficient

DC bias current level monitor Idc

(A [%] of the measurement value + B [A]) × Kt When using Vdc-Idc measurement: (spec.) When using level monitor: (typ.) A [%] When the measurement time mode is SHORT: 2%

When the measurement time mode is MED or LONG: 1% B [A] given below Kt Temperature coefficient When the measurement mode is SHORT, double the following value.

Table 37. Test signal voltage ≤ 0.2 Vrms (measurement time mode = MED, LONG)

DC bias Impedance range [Ω] current range < 100 100 300, 1 k 3 k, 10 k 30k, 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 45 nA 200 µA 150 µA 30 µA 3 µA 300 nA 300 nA 2 mA 150 µA 30 µA 3 µA 3 µA 3 µA 20 mA 150 µA 30 µA 30 µA 30 µA 30 µA 100 mA 150 µA 150 µA 150 µA 150 µA 150 µA

Table 38. 0.2 Vrms < test signal voltage ≤ 2 Vrms (measurement time mode = MED, LONG)

DC bias Impedance range [Ω] current range < 100 100, 300 1k, 3 k 10k, 30 k 100 k

Table 39. Test signal voltage > 2 Vrms (measurement time mode = MED, LONG)

DC bias Impedance range [Ω] current range ≤ 300 1 k, 3 k 10k, 30 k 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 200 µA 150 µA 30 µA 3 µA 300 nA 2 mA 150 µA 30 µA 3 µA 3 µA 20 mA 150 µA 30 µA 30 µA 30 µA 100 mA 150 µA 150 µA 150 µA 150 µA

Table 40. Input impedance (nominal)

Input impedance Conditions

0 Ω Other than conditions below. 20 Ω Test signal voltage ≤ 0.2 Vrms, Impedance range ≥ 3 k Ω, DC bias current range ≤ 200 µA Test signal voltage ≤ 2 Vrms, Impedance range ≥ 10 kΩ, DC bias current range ≤ 200 µA Test signal voltage > 2 Vrms, Impedance range = 100 kΩ, DC bias current range ≤ 200 µA

DC source signal

Table 41. Test signal voltage

Range –10 V to 10 V Resolution 1 mV Accuracy 0.1% + 3 mV (23

(0.1% + 3 mV) x 4 (0 to 18 °C or 28 to 55 °C)

°C ± 5 °C)

Table 42. Test signal current

Range –45 mA to 45 mA (nominal)

Output impedance

100 Ω (nominal)

DCR measurement specification

DC resistance (Rdc) measurement function is available when either option 001, 030, 050, 100, or 200 is installed.

DC resistance (Rdc) accuracy

Absolute measurement accuracy Aa

Absolute measurement accuracy Aa is given as

Equation 15. Aa = Ae + Acal

Aa Absolute accuracy (% of reading value) Ae Relative accuracy (% of reading value) Acal Calibration accuracy

Relative measurement accuracy Ae

Relative measurement accuracy Ae is given as Equation 16. Ae = [Ab + (Rs /|Rm|+ Go × |Rm|) × 100 ] × Kt

Rm Measurement value Ab Basic accuracy Rs Short offset [Ω] Go Open offset [S] Kt Temperature coefficient

Calibration accuracy Acal

Calibration accuracy Acal is 0.03%.

Basic accuracy Ab

Table 43. Basic accuracy Ab is given below.

Measurement Test signal voltage time mode ≤ 2 Vrms > 2 Vrms

SHORT 1.00% 2.00% MED 0.30% 0.60%

Open offset Go

Table 44. Open offset Go is given below.

Measurement Test signal voltage time mode ≤ 2 Vrms > 2 Vrms

SHORT 50 nS 500 nS MED 10 nS 100 nS

Short offset Rs

Table 45. Short offset Rs is given below.

Measurement Test signal voltage time mode ≤ 2 Vrms > 2 Vrms

SHORT 25 mΩ 250 mΩ MED 5 mΩ 50 mΩ

Effect of cable length (Short offset)

Table 46. The following value is added to Rs when the cable is extended.

Cable length 1 m 2 m 4 m

0.25 mΩ 0.5 mΩ 1 mΩ

Temperature coefficient Kt

Table 47. Temperature coefficient Kt is given below.

Temperature [°C] Kt

0 - 18 4 18 - 28 1 28 - 55 4

General specifications

Table 48. Power source

Voltage 90 VAC - 264 VAC Frequency 47 Hz - 63 Hz Power consumption Max. 150 VA

Table 49. Operating environment

Temperature 0 - 55 °C Humidity 15% - 85% RH

(≤ 40 °C, no condensation) Altitude 0 m - 2000 m

Table 50. Storage environment

Temperature –20 - 70 °C Humidity 0% - 90% RH

( ≤ 60 °C, no condensation) Altitude 0 m - 4572 m

Outer dimensions: 375 (width) x 105 (height) × 390 (depth) mm (nominal)

367.4

14.4

338.6

14.4

41.8

20 Hz - 2 MHz

Recall A Recall B

E4980A

Precision LCR Meter

789

456

123

Meas Setup

DC Source (Option 001)

10VDC Max

Display Format

Save/ Recall

Return

Local/

System

Lock

55.2

Source

Discharge test device before connecting 42V Peak Max Output CAT I

CURLPOT

103.8

55.0

Preset

Trigger

DC Bias

Source

Figure 2. Dimensions (front view, with handle and bumper, in millimeters, nominal)

319.1

E4980A

20 Hz - 2 MHz

Recall A Recall B

Precision LCR Meter

Save/ Recall

789

456

123

Meas Setup

DC Source (Option 001)

10VDC Max

Display Format

Return

Local/

System

Lock

Source

Discharge test device before connecting 42V Peak Max Output CAT I

CURLPOT

2755.2

88.3

Preset

Trigger

DC Bias

Source

Bias

UNKNOWN

Bias

UNKNOWN

USB

POT

USB

POT

222222 30.3

28.0

CUR

27.3

40.1

32.0

21.8

CUR

18.0

Figure 3. Dimensions (front view, without handle and bumper, in millimeters, nominal)

17.6

118.1

367.4

332.2

23.241.6 34.7

17.6

23.9

E4980A

Option 710: No Interface

101.6

115V

-230V 50/60Hz 150VA MAX

T3A , 250V

Serial Label

Option 710: No Interface

Fuse

GPIB

55.0 28.0

113.9 72.3 72.3 31.1

17.1

72.3

49.3

36.2

0.4

Option 301: Scanner Interface Option 201: Handler InterfaceOption 002: DC Current Control Interface

36.2

72.3

Figure 4. Dimensions (rear view, with handle and bumper, in millimeters, nominal)

317.8

110.9

19.6

Serial Label

E4980A

Option 710: No Interface

84.4

36.5 23.7

GPIB

115V

-230V 50/60Hz 150VA MAX

Fuse

T3A , 250V

25.7

LAN

36.2

72.3

21.3

Option 710: No Interface

Trigger

23.241.6 27.5

LAN

Trigger

26.63725.5

20.9

22.23712.7

106.7

72.3 72.3 24.0

0.4

Option 301: Scanner Interface Option 201: Handler InterfaceOption 002: DC Current Control Interface

Figure 5. Dimensions (front view, without handle and bumper, in millimeters, nominal)

66.6

388.7

103.8

55.0

141.4

Figure 6. Dimensions (side view, with handle and bumper, in millimeters, nominal)

374.0

15.7

21.921.9

88.3

45.7

19.7

50.9

101.6

10.5347.9

84.4

Note

Effective pixels are more than 99.99%. There may be 0.01% (approx. 7 pixels) or smaller missing pixels or constantly lit pixels, but this is not a malfunction.

Figure 7. Dimensions (side view, without handle and bumper, in millimeters, nominal)

Weight: 5.3 kg (nominal) Display: LCD, 320 × 240 (pixels), RGB color The following items can be displayed:

• measurement value

• measurement conditions

• limit value and judgment result of comparator

• list sweep table

• self-test message

Description Supplemental Information

EMC

European Council Directive 2004/108/EC IEC 61326-1:2005 EN 61326-1:2006 CISPR 11:2003 +A1:2004 EN 55011:1998 +A1:1999 +A2:2002 Group 1, Class A IEC 61000-4-2:1995 +A1:1998 +A2:2000 EN 61000-4-2:1995 +A1:1998 +A2:2001 4 kV CD/8 kV AD IEC 61000-4-3:2002 EN 61000-4-3:2002 3 V/m, 80-1000 MHz, 80% AM IEC 61000-4-4:2004 EN 61000-4-4:2004 1 kV power /0.5 kV Signal IEC 61000-4-5:1995 +A1:2000 EN 61000-4-5:1995 +A1:2001 0.5 kV Normal/1 kV Common IEC 61000-4-6:1996 +A1:2000 EN 61000-4-6:1996 +A1:2001 3 V, 0.15-80 MHz, 80% AM IEC 61000-4-11:2004 EN 61000-4-11:2004 100% 1 cycle

ICES/NMB-001

Cet appareil ISM est conforme a la norme NMB-001 du Canada.

AS/NZS CISPR11:2004 Group 1, Class A

This ISM device complies with Canadian ICES-001:2006.

Safety

European Council Directive 2006/95/EC IEC 61010-1:2001/EN 61010-1:2001 Measurement Category I, Pollution Degree 2, Indoor Use IEC60825-1:1994 Class 1 LED

CAN/CSA C22.2 61010-1-04 Measurement Category I, Pollution Degree 2, Indoor Use

Environment

This product complies with the WEEE Directive (2002/96/EC) marking requirements. The affixed label indicates that you must not discard this electrical/electronic product in domestic house hold waste. Product Category: With reference to the equipment types in the WEEE Directive Annex I, this product is classed as a “Monitoring and Control instrumentation” product.

Supplemental Information

Note

Discharge capacitors before connecting them to the UNKNOWN terminal or a test fixture to avoid damages to the instrument.

Settling time

Table 51. Test frequency setting time

Test frequency setting time Test frequency (Fm)

5 ms Fm ≥ 1 kHz 12 ms 1 kHz > Fm ≥ 250 Hz 22 ms 250 Hz > Fm ≥ 60 Hz 42 ms 60 Hz > Fm

Table 52. Test signal voltage setting time

Test signal voltage setting time Test frequency (Fm)

11 ms Fm ≥ 1 kHz 18 ms 1 kHz > Fm ≥ 250 Hz 26 ms 250 Hz > Fm ≥ 60 Hz 48 ms 60 Hz > Fm

Switching of the impedance range is as follows: ≤ 5 ms/ range switching

Measurement circuit protection

The maximum discharge withstand voltage, where the internal circuit remains protected if a charged capacitor is connected to the UNKNOWN terminal, is given below.

Table 53. Maximum discharge withstand voltage

Maximum discharge withstand voltage Range of capacitance value C of DUT

1000 V C < 2 µF √

2 µF ≤ C

2/C V

1200

1000

800

600

400

Voltage [V]

200

1.E–15 1.E–13 1.E–11 1.E–09 1.E–07 1.E–05 1.E–03

Capacitance [F]

Figure 8. Maximum discharge withstand voltage

Measurement time

Definition

This is the time between the trigger and the end of measurement (EOM) output on the handler interface.

Conditions

Table 54 shows the measurement time when the following conditions are satisfied:

• Normal impedance measurement other than Ls-Rdc, Lp-Rdc, Vdc-Idc

• Impedance range mode: hold range mode

• DC bias voltage level monitor: OFF

• DC bias current level monitor: OFF

• Trigger delay: 0 s

• Step delay: 0 s

• Calibration data: OFF

• Display mode: blank

Table 54. Measurement time [ms](DC bias:OFF)

Measurement time mode Test frequency

1 LONG 480 300 240 230 220 220 220 2 MED 380 180 110 92 89 88 88 3 SHORT 330 100 20 7.7 5.7 5.6 5.6

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

0.1

Measurement time [sec]

0.01

0.001 20 100 1k 10k 100k 1M 2M

Test frequency [Hz]

Figure 9. Measurement time (DC bias: OFF)

1. LONG

2. MED

3. SHORT

Table 55. Measurement time when option 030/050/100 is installed [ms]

[

]

Measurement time mode Test frequency

1 LONG 729 423 363 353 343 343 2 MED 650 250 140 122 119 118 3 SHORT 579 149 26 14 12 12

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz

sec me

0.1

easurement t

0.01

0.001 20 100 1k 10k 100k 1M 2M

Test frequency [Hz]

Figure 10. Measurement time (Option 030/050/100)

1. LONG

2. MED

3. SHORT

Table 56. Measurement time when option 005 is installed [ms] (DC bias: OFF)

Measurement time mode Test frequency

1 LONG 1190 650 590 580 570 570 570 2 MED 1150 380 200 180 180 180 180 3 SHORT 1040 240 37 25 23 23 23

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

0.1

Measurement time [sec]

0.01

0.001 20 100 1k 10k 100k 1M 2M

Test frequency [Hz]

Figure 11. Measurement time (DC bias: OFF, Option 005)

1. LONG

2. MED

3. SHORT

When DC bias is ON, the following time is added:

Table 57. Additional time when DC bias is ON [ms]

Test frequency 20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

30 30 10 13 2 0.5 0.5

When the number of averaging increases, the measurement time is given as

Equation 17. MeasTime + (Ave – 1) × AveTime

MeasTime Measurement time calculated based on Table 53 and Table 54 Ave Number of averaging AveTime Refer to Table 56

Table 58. Additional time per averaging [ms]

Measurement time mode Test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 51 11 2.4 2.3 2.3 2.2 2.2 MED 110 81 88 87 85 84 84 LONG 210 210 220 220 220 210 210

Table 59. Measurement time when Vdc-Idc is selected [ms]

Measurement time mode 20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 210 46 14 14 14 14 14 MED 210 170 170 170 170 170 170 LONG 410 410 410 410 410 410 410

Test frequency

Add the same measurement time per 1 additional average

Additional Measurement time when the Vdc and Idc monitor function is ON. Add SHORT mode of Table 59. When using only Vdc or Idc, add a half of SHORT mode of Table 59.

Table 60. Measurement time when Ls-Rdc or Lp-Rdc is selected [ms]

Test frequency

Measurement time mode 20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 910 230 43 24 22 22 22 MED 1100 450 300 280 270 270 270 LONG 1400 820 700 670 660 650 650

Add the three times of measurement time per 1 additional average number

Display time

Except for the case of the DISPLAY BLANK page, the time required to update the display on each page (display time) is as follows. When a screen is changed, drawing time and switching time are added. The measurement display is updated about every 100 ms.

Table 61. Display time

When Vdc, Idc When Vdc, Idc Item monitor is OFF monitor is ON

MEAS DISPLAY page drawing time 10 ms 13 ms MEAS DISPLAY page (large) drawing time 10 ms 13 ms BIN No. DISPLAY page drawing time 10 ms 13 ms BIN COUNT DISPLAY page drawing time 10 ms 13 ms LIST SWEEP DISPLAY page drawing time 40 ms — Measurement display switching time 35 ms —

Measurement data transfer time

This table shows the measurement data transfer time under the following conditions. The measurement data transfer time varies depending on measurement conditions and computers.

Table 62. Measurement transfer time under the following conditions:

Host computer: DELL OPTIPLEX GX260 Pentium 4 2.6 GHz Display: ON Impedance range mode: AUTO (The overload has not been generated.) OPEN/SHORT/LOAD compensation: OFF Test signal voltage monitor: OFF

Table 63. Measurement data transfer time [ms]

using :FETC? command using data buffer memory Data (one point measurement) (list sweep measurement) transfer Comparator Comparator 10 51 128 201

Interface format ON OFF points points points points

ASCII 2 2 4 13 28 43 GPIB ASCII Long 2 2 5 15 34 53 Binary 2 2 4 10 21 32

ASCII 2 2 3 8 16 23 USB ASCII Long 2 2 4 9 19 28 Binary 2 2 3 5 9 13

ASCII 3 4 5 12 24 36 LAN ASCII Long 3 3 5 13 29 44 Binary 3 3 5 9 18 26

DC bias test signal current (1.5 V/2.0 V): Output current: Max. 20 mA

Option 001 (Power and DC Bias enhance):

DC bias voltage: DC bias voltage applied to DUT is given as:

Equation 18. Vdut = Vb – 100 × Ib

Vdut [V] DC bias voltage Vb [V] DC bias setting voltage Ib [A] DC bias current

DC bias current: DC bias current applied to DUT is given as:

Equation 19. Idut = Vb/(100 + Rdc)

Idut [A] DC bias current Vb [V] DC bias setting current Rdc [Ω] DUT’s DC resistance

Maximum DC bias current

Table 64. Maximum DC bias current when the normal measurement can be performed.

Bias current isolation

Impedance OFF range [Ω]

0.1 20 mA 100 mA 1 20 mA 100 mA 10 20 mA 100 mA 100 20 mA 100 mA 300 2 mA 100 mA 1 k 2 mA 20 mA 3 k 200 µA 20 mA 10 k 200 µA 2 mA 30 k 20 µA 2 mA 100 k 20 µA 200 µA

Auto range mode: 100 mA

Hold range mode: its values for the range.

Test signal voltage ≤ 2 Vrms Test signal voltage > 2 Vrms

When DC bias is applied to DUT

When DC bias is applied to the DUT, add the following value to the absolute accuracy Ab.

Table 65. Only when Fm < 10 kHz and |Vdc| > 5 V

SHORT MED, LONG

0.05% × (100 mV/Vs) × (1 + √(100/Fm)) 0.01% × (100 mV/Vs) × (1 + √(100/Fm)) Fm [Hz] Test frequency

Vs [V] Test signal voltage

Relative measurement accuracy with bias current isolation

When DC bias Isolation is set to ON, add the following value to the open offset Yo.

Equation 20. Yo_DCI1 × (1 + 1/(Vs)) × (1 + √(500/Fm)) + Yo_DCI2

Zm [Ω] Impedance of DUT Fm [Hz] Test frequency Vs [V] Test signal voltage Yo_DCI1,2 [S] Calculate this by using Table 61 and 62 Idc [A] DC bias isolation current

Table 66. Yo_DCI1 value

DC bias current range Measurement time mode SHORT MED, LONG

20 µA 0 S 0 S 200 µA 0.25 nS 0.05 nS 2 mA 2.5 nS 0.5 nS 20 mA 25 nS 5 nS 100 mA 250 nS 50 nS

Table 67. Yo_DCI2 value

DC bias Measurement time mode current range ≤ 100 Ω 300 Ω, 1 k Ω 3 k Ω, 10 k Ω 30 k Ω, 100 k Ω

20 µA 0 S 0 S 0 S 0 S 200 µA 0 S 0 S 0 S 0 S 2 mA 0 S 0 S 0 S 3 nS 20 mA 0 S 0 S 30 nS 30 nS 100 mA 0 S 300 nS 300 nS 300 nS

DC bias settling time

When DC bias is set to ON, add the following value to the settling time:

Table 68. DC bias settling time

Bias Settling time

1 Standard Capacitance of DUT × 100 × loge (2/1.8 m) + 3 m 2 Option 001 Capacitance of DUT × 100 × loge (40/1.8 m) + 3 m

100 sec

10 sec

1 sec

100 msec

Settling time

10 msec

Figure 12. DC bias settling time

1 µF 10 µF 100 µF 1 mF 10 mF 100 mF

DUT capacitance

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