300 kHz to 6 GHz
New test sets for the Agilent 8753 network
analyzer family
Solid-state test port switches are standard for the
Agilent 85046A/B and 85047A S-Parameter Test
Sets. These new test sets improve the speed, accuracy and ease of RF component measurements
with the 8753.
With the 8753 Network Analyzer, these test sets
comprise a complete system for measuring the magnitude, phase and group delay response of RF components in the 300 kHz to 6 GHz frequency range.
There are three S-Parameter test sets in the 8753
family. The 85046A is a 50-ohm model that operates from 300 kHz to 3 GHz. The 85046B is a 75-ohm
version that covers the frequency range of 300 kHz
to 2 GHz. The 85047A is a 50-ohm test set that
extends the frequency range to 6 GHz.
Faster, more accurate S-parameter
measurements
Improve the speed and accuracy of your S-Parameter
measurements with a solid-state switching test set.
These new test sets provide faster, more accurate
measurements by continuously updating all four
S-Parameters when a full two-port error correction
is used. Measurement speed is improved by 160
milliseconds each time the trace is updated for
sweeps with 101 points or more.
Measure forward and reverse parameters
simultaneously
Solid-state switching allows the selection of any
two S-Parameters, both continuously updated, on
the display. For example, when adjusting the bias
of an amplifier, it is often required to simultaneously monitor the forward gain and output match.
Mechanical versions of the 85046A/B and 85047A
test sets will update either forward or reverse parameters continuously but not a combination of both.
Simplify tuning procedures
Solid-state switching is ideal for use in tuning
applications where all four S-Parameters are
changing. It is no longer necessary to press MEASURE RESTART when using a full two-port error
correction. All four S-Parameters are being continuously measured.
Improved reliability for automatic
measurement systems
Solid-state switches have no mechanical parts, and
therefore will not wear out in a continuously measuring automatic test system. Mechanical test set
switches (Option 009) typically have a lifetime in
excess of three million cycles. The solid-state switches
will typically extend the lifetime indefinitely.
Agilent 85046A/B and 85047A
Solid-State Switching
S-Parameter Test Sets
Data Sheet
2
Achieve the highest system accuracy
with faster measurement speeds
The specifications listed in the table and the typical measurement uncertainties shown below apply
to all Agilent 8753C systems using either solidstate switching (standard) or mechanical (Option
009) versions of the test sets.
Test set specifications
Specifications describe the instrument’s warranted
performance over the temperature range 0 to +55˚C
(except where noted).
8753C System measurement uncertainty
2
The graphs below show the typical measurement uncertainty for the 8753C using full 2-port
error correction with the Agilent 85031B 7-mm
Calibration Kit.
Transmission measurements
3
Reflection measurements
4
Parameter 85046A (50 Ω) 85046B (75 Ω) 85047A (50 Ω)
Frequency Range: 300 kHz to 3 GHz 300 kHz to 2 GHz 300 kHz to 3 GHz/3 MHz to 6 GHz
Directivity
1
≥35 dB: 300 kHz to 1.3 GHz ≥35 dB: 300 kHz to 1.3 GHz ≥35 dB: 300 kHz to 1.3 GHz
Port 1, 2: ≥30 dB: 1.3 GHz to 3 GHz ≥30 dB: 1.3 GHz to 2 GHz ≥30 dB: 1.3 GHz to 3 GHz
≥25 dB: 3 GHz to 6 GHz
Effective Source ≥14 dB: 300 kHz to 2 MHz ≥14 dB: 300 kHz to 2 MHz ≥20 dB: 300 kHz to 1.3 GHz
Match1: ≥20 dB: 2 MHz to 1.3 GHz ≥17 dB: 2 MHz to 1.3 GHz ≥16 dB: 1.3 GHz to 3 GHz
≥16 dB: 1.3 GHz to 3 GHz ≥16 dB: 1.3 GHz to 2 GHz ≥14 dB: 3 GHz to 6 GHz
Switch Repeatability: ±0.03 dB
1. Can be greatly improved by accuracy enhancement techniques.
2. These measurement uncertainty curves utilize an RSS model for the contributions of random errors, and a worst-case model for the contributions of dynamic
accuracy and residual systematic errors.
3. The graphs shown for transmission measurements assume a well-matched
device (S11=S22=0).
4. The graphs for reflection measurement uncertainty apply to either a one-port
device or a two-port device with more than 6 dB of insertion loss.
3
Supplemental characteristics
Supplemental characteristics are intended to
provide information useful in applying the instrument by giving typical but non-warranted performance parameters. These are denoted as “typical”,
“nominal”, or “approximate”.
Key performance parameters for these test sets
are listed in the table. Standard (solid-state) and
Option 009 (mechanical) test sets have identical
performance except where noted below. Further,
these performance differences only affect the
measurement uncertainties of an “uncorrected”
8753C network analyzer system.
Parameter 85046A 85046B 85047A
Transmission Tracking1:
Magnitude5:
Standard: ±1.5 dB ±1.5 dB ±2 dB
Option 009: ±1.5 dB ±1.5 dB ±1.5 dB
Phase6: ±20 deg: 300 kHz to 2 MHz ±20 deg: 300 kHz to 2 MHz ±10 deg: 300 kHz to 3 GHz
±10 deg: 2 MHz to 3 GHz ±10 deg: 2 MHz to 2 GHz ±20 deg: 3 GHz to 6 GHz
Reflection Tracking1:
Magnitude5:
Standard: ±1.5 dB ±1.5 dB ±2 dB
Option 009: ±1.5 dB ±1.5 dB ±1.5 dB
Phase6: ±25 deg: 300 kHz to 2 MHz ±25 deg: 300 kHz to 2 MHz ±10 deg: 300 kHz to 3 GHz
±10 deg: 2 MHz to 3 GHz ±10 deg: 2 MHz to 2 GHz ±20 deg: 3 GHz to 6 GHz
Nominal Insertion Loss:
RF IN to Port 1, 2:
Standard: 14 dB +0.5 dB/GHz 19.5 dB +1 dB/GHz 4 dB +0.8 dB/GHz: 300 kHz to 3 GHz
17.5 dB +0.8 dB/GHz: 3 GHz to 6 GHz
Option 009: 12.5 dB +0.5 dB/GHz 18 dB +1 dB/GHz 2.5 dB +0.5 dB/GHz: 300 kHz to 3 GHz
16 dB +0.5 dB/GHz: 3 GHz to 6 GHz
RF IN to R: 18 dB +1.5 dB/GHz 18 dB +1.5 dB/GHz 19 dB +0.5 dB/GHz: 300 kHz to 3 GHz
34 dB +0.5 dB/GHz: 3 GHz to 6 GHz
Typical Isolation 100 dB 100 dB 100 dB: 300 kHz to 3 GHz
between Port 1 and 2: 90 dB: 3 GHz to 6 GHz
Nominal Impedance:
Port 1, 2: 50 Ω Nominal 75 Ω Nominal 50 Ω Nominal
RF IN, R, A, B: 50 Ω Nominal 50 Ω Nominal 50 Ω Nominal
DC bias input range: +30 VDC, ±200 mA with some degradation in +30 VDC, ±200 mA with no degradation
RF specifications (±500 mA maximum) in RF specifications (±1 A maximum)
Connectors:
Port 1, 2: 7 mm 75 Ω Type-N(f) 7 mm
RF IN, R, A, B: 50 Ω Type-N(f) 50 Ω Type-N(f) 50 Ω Type-N(f)
DC bias input: BNC(f) BNC(f) BNC(f)
5. Deviation from mean value.
6. Deviation from linear phase.
Agilent 85047A schematic
Agilent 85046A/B schematic
Ordering summary
85046A 50-ohm S-parameter
test set
Option 009 Substitute mechanical
test port switch
85046B 75-ohm S-parameter
test set
Option 009 Substitute mechanical
test port switch
85047A 50-ohm S-parameter
test set (6 GHz)
Option 009 Substitute mechanical
test port switch
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Printed in U.S.A. May 8, 2001
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