Atec Agilent-81150A, Agilent-81160A User Manual
Which
Product
Meets
Your
Agilent 81150A and 81160A
Pulse Function Arbitrary Noise Generators
Data Sheet, Version 1.1
Needs?
High precision pulse generators enhanced with versatile signal
generation, modulation and distortion capabilities for:
• Accurate signals to test your device and not your signal source
• Versatile waveform and noise generation to be ready for today‘s
and tomorrow‘s stress test challenges
• Optional pattern generator to test in addition to analog, digital
and mixed signal devices
• Integrated into one instrument to minimize cabling, space and
test time
The 81150A Pulse Function
Arbitrary Noise Generator
at a Glance
811
50
A
• 1 µHz – 120 MHz pulse generation with variable rise/fall time
• 1 µHz – 240 MHz sine waveform output
• 14-bit, 2 GSa/s arbitrary waveforms
• 512k samples deep arbitrary waveform memory per channel
• Pulse, sine, square, ramp, noise and arbitrary waveforms
• Noise, with selectable crest factor, and signal repetition time of 26 days
• FM, AM, PM, PWM, FSK modulation capabilities
• 1 or 2 channel, coupled and uncoupled
• Differential outputs
• Two selectable output amplifi ers:
◦ High bandwidth amplifier
Amplitude: 50 mV
100 mVpp to 10 V
Voltage window: ± 5 V; 50 Ω into 50 Ω
± 10 V; 50 Ω into open
± 9 V; 5 Ω into 50 Ω
◦ High voltage amplifier
Amplitude: 100 mV
200 mV
to 20 VPP; 5 Ω into 50 Ω, or 50 Ω into open
PP
to 5 VPP; 50 Ω into 50 Ω
PP
; 50 Ω into open
PP
to 10 VPP; 50 Ω into 50 Ω,
PP
Voltage window: ± 10 V; 50 Ω into 50 Ω
± 20 V; 5 Ω into 50 Ω or 50 Ω into open
• Glitch free change of timing parameters
(delay, frequency, transition time, width, duty cycle)
• Programming language compatible with Agilent 81101A, 81104A, 81105A,
81110A, 81130A and 81160A
• ISO 17025 and Z540.3 calibration
• LXI class C (rev. 1.1) compliant
• Optional pattern generator:
◦ Ideal and arbitrary bit shaped pattern up to 120 Mbit/s
◦ Two, three or four level signals
◦ PRBS up to 2
◦ 16 Mbit pattern memory
◦ Pass through pattern for combined and physical and protocol test up to 10 Mbit/s
31
2
The 81160A Pulse Function
Arbitrary Noise Generator
at a Glance
811
60
A
• 1 µHz – 330 MHz pulse generation with variable rise/fall time
• 1 µHz – 500 MHz sine waveform output
• 14-bit, 2.5 GSa/s arbitrary waveforms
• Up to 256k samples deep arbitrary waveform memory per channel
• Pulse, sine, square, ramp, noise and arbitrary waveforms
• Noise, with selectable crest factor, and signal repetition time of 20 days
• FM, AM, PM, PWM, FSK modulation capabilities
• 1 or 2 channel, coupled and uncoupled
• Differential outputs
◦ Amplitude:
50 Ω into 50 Ω 50 mV
50 Ω into open 100 mVPP to 10 V
◦ Voltage window:
50 Ω into 50 Ω ± 5 V
50 Ω into open ± 10 V
• Glitch free change of timing parameters
(delay, frequency, transition time, width, duty cycle)
• Programming language compatible with Agilent 81101A, 81104A, 81105A , 81110A,
81130A and 81150A
• ISO 17025 and Z540.3 calibration
• LXI class C (rev 1.1) compliant
• Optional pattern generator:
◦ Ideal and arbitrary bit shaped pattern up to 330 Mbit/s (Option 330) or 660 Mbit/s
(Option 660)
◦ Two, three or four level signals
◦ PRBS up to 2
◦ 4 Mbit pattern memory for the 1-channel instrument and 2 Mbit per channel for the
2-channel instrument
◦ Pass through pattern for combined and physical and protocol test up to 10 Mbit/s
31
to 5 V
PP
PP
PP
3
811
50
A
Waveform type
USB 2.0A
Couple/uncouple channels
External In
Trigger mode
Channel 2:
Trigger Out
Strobe Out
Differential output
Advanced mode
Channel 1:
Trigger Out
Strobe Out
Differential output
USB 2.0A
USB 2.0 B
LAN
10 MHz Ref In
Modulation In 1, 2
10 MHz Ref Out
GPIB
4
811
60
A
Waveform type
USB 2.0A
Couple/uncouple channels
External In
Channel 2:
Differential output
Trigger mode
Sync out A and B:
The logical trigger signal 1
or logical trigger signal 2
or logical strobe signal 1
or logical strobe signal 2
can be routed by a fully
fl exible internal switch
matrix to Sync Out A or
Sync Out B.
Advanced mode
Channel 1:
Differential
output
10 MHz Ref Out
10 MHz Ref In
Modulation
In 1, 2
USB 2.0A
GPIB
USB 2.0B
LAN
5
Today‘s Challenges Require
a New Generation of Test
Instruments
You are under pressure to get products to market faster and faster, with shrinking design
schedules and increasing quality goals. The pressure is never ending. Because differentiation means survival in the marketplace, you often have to test unique functionality. Being
confi dent in your results takes highly adaptable and effi cient testing.
Such challenges require a new generation of test instruments, which are:
• Accurate, to test your device and not your source
• Versatile, to be ready for today’s and tomorrows test challenges
• Plug and play solutions, with minimal cabling, low space overhead and
have many functions built-in
Whichever way you look at it, this starts with accurate, versatile and uncompromising
signal sources.
Just test – with the signal you need.
Quad versatility – optimum signal fi delity
Agilent’s offering
The Agilent 81150A and 81160A Pulse Function Arbitrary Noise Generators set the
standard for the next generation of lab: for fast, accurate insight into your design or device
under test. Both of them offer:
• Pulse generators with precise signals for performance verification and characterization
• A function arbitrary generator
◦ For versatile signal generation to optimize testing
◦ For modulation to shape the signal the DUT needs
• A noise generator to distort signals to build up worst case scenarios
• An optional pattern generator to test in addition to analog, digital and mixed signal
devices with ideal and real-world conditions
The Agilent 81150A and the new Agilent 81160A Pulse Function Arbitrary Noise
Generators are indispensable contributors to accelerate ideal and real-world testing.
Pulse
generator
Pattern
generator
Function arbitrary
generator
Figure 1. Agilent 81150A and 81160A Pulse Function Arbitrary Noise Generator
6
Noise
generator
Pulse Generator – Test
Your Device and Not Your
Source
Channel 1 pulse setup
Superior precision pulses with unbeatable timing stability guarantee reproducible tests.
The signal quality and trigger functionality provide everything you need for trigger or
system clock applications.
You can change the timing parameters (delay, frequency, transition time, width, duty
cycle) without dropouts or glitches. This patented, industry-leading feature means
continuous operation without having to reboot or reset your device under test, for
example when you are characterizing a device by sweeping the clock frequency. Apart
from full control of the timing parameters, you can also adjust levels and edges as needed.
Set up complex measurements
Measurement using strobe and trigger
Both, the Agilent 81150A and the Agilent 81160A Pulse Function Arbitrary Noise Generator, are available in a 1 or 2 channel version. On the two channel version, the channels
can be uncoupled, to work independently, or coupled, for example, with a defi ned delay
between them.
Each channel provides Trigger Out, Strobe Out and differential outputs: the basis for many
complex test setups.
Gated Burst of 4
External In
Trigger Out
Strobe Out
Out
7
Function Arbitrary Generator
– Stress Your Device to its Limit
Amplitude modulation
Frequency shift keying modulation
If you need further signal conditioning, the Agilent 81150A and the Agilent 81160A Pulse
Function Arbitrary Noise Generators provide versatile waveforms and modulation capabilities to adapt your signal to your device’s requirements. AM, FM, FSK, PM and PWM are
available at modulation frequencies up to 10 MHz and to 50 MHz.
The Agilent 81150A and the Agilent 81160A Pulse Function Arbitrary Noise Generators
can use internal or external modulation sources. Internal modulation can be generated
from the 2nd channel or the internal modulation source of the modulated channel.
Pulse width modulation
Frequency sweep
Strobe Out
Out 1
Sweep Time
8
Setting up a measurement using
trigger, strobe, modulation and carrier
Contin uous PM
Phase Deviat ion 180 deg.
Carr i er Sin ew ave 0.04 MHz
Modulat ed by Si newave 0.02 MHz
Modulat ion
Si gn a l
T r i gger Out
St r obe Out
Out
Noise generator – repeatable and
stochastic noise
Gaussian curve and distribution
Jitter and noise cause misalignment of edges and levels, resulting in data errors. Noise is
by its nature unpredictable because it can have many different causes, from signal interference caused by sudden voltage changes, to distortions introduced during transmission.
It is important to be able to simulate noise-based malfunctions, for example, to identify
the additive noise produced by receiving systems—it is cheaper to lower the noise fi gure
than to increase the transmitter power! The Agilent 81150A and the Agilent 81160A Pulse
Function Arbitrary Noise Generators let you control the quality of the noise, to test different cases, and according to various specifi cations.
White Gaussian noise is a good approximation to many real-world situations, and creates
mathematically traceable models, with statistical independent values. The Agilent 81150A
and the Agilent 81160A Pulse Function Arbitrary Noise Generators provide deterministic
white Gaussian noise, with a signal repetition of 20 days or 26 days respectively. You can
decide on any arbitrary distribution, and trigger the noise to start when you need it.
Gaussian distribution
Gaussian distribution
Gen eral :
# events=n x sigma
N # events BER
---- ------ --- ------ ------1 67% 0.33
2 97% 0.03
3 99.7% 0.003
6
10
9 10-9
12
10
-6
-12
5 10
6 10
7 10
Normali zed
Event s
mean val ue
sigma sigma sigma
sigma
N= 1
N= 2
vol tage
9
Voltage level crest factor
You can also select the crest factor out of 4 values – an indicator of signal quality –
using V
P/VRMS
or VPP/V
scales, depending on the standard to which you are testing.
RMS
The 81150A and the 81160A use the defi nition: crest factor = V
Voltage level crest factor
Voltage Level Crest Factor
V
pp
V
V
RM S
P/VRMS
P
Voltage
vo l t ag e
Pattern Generator – Test in
Addition to Analog, Digital
and Mixed Signal Devices
The result is noise that combines two extremes:
• Random and repeatable noise, for stress tests on one side
• While still being sufficiently random
Engineers working with serial buses or designers of analog, digital and mixed signal
devices require stressing their design with pattern. The optional Agilent 81150A and
81160A arbitrary bit shaped pattern generator allows sending ideal and real-world pattern.
The Agilent 81150A with arbitrary bit shaped pattern (Option PAT) allows emulating overshoot, asymmetric delay and duty cycle distortion up to 120 Mbit/s, the Agilent 81160A
up to 330 Mbit/s (Option 330) or even up to 660 Mbit/s (Option 660). Patterns can be
easily set up and distorted at your fingertips.
10
Stress your device to its limits – defi ne your own bit shape
MOD
Emulate effects like...
• Capacitive load of the channel
• Asymmetric delay
• Crossing point deviations
• Duty cycle distortions
• Arbitrary transition times
• Level noise
• Delays from/to electrical idle
...By defi ning the transitions so that the
previous bit infl uences the current bit
PRBS
Sequencer
2-, 3- and 4-level signals
NRZ NRZ mode with minimum
transition times
NRZ mode with transition
Max voltage level
Min voltage level
time = 1/3 period
Mode
Data pattern: 01001101
Transition
Period
time
Arbitrary
Bit shape
Mode
NRZ mode with minimum
transition times
Bit shape waveforms
(user defined)
Output waveform
0→0
0→1
1→0
1→1
Max voltage level
Min voltage level
Max voltage level
Min voltage level
The 81150A and the 81160A pattern generators let you defi ne the transitions from one bit
to the other so that the previous bit infl uences the current bit. The user can set up own
defi ned arbitrary bit shapes.
In addition to user-defi ned patterns, standard patterns like PRBS up to 2
31
are available.
The sequencer allows setting up a pre-amble sequence so that the device under test
moves into test mode.
Additionally to 2-level signals, it is also possible to create 3- and even 4-level signals. With
the 3-level signals, it is no longer necessary to add different signals for electrical idle.
3-level signals are important e.g. for use in Ethernet environment and 4-level signals e.g.
for PAM4 applications.
Bit and block trigger mode
Pass through pattern for combined
physical and protocol test
up to 10 Mbit/s
Besides, standard trigger modes like continuous bit and block trigger modes allow adoptions to application needs. In the bit mode you see that on every trigger, the sequence
is advanced by one bit. An application example is a bit clock, which can be fed into an
external clock and then into the trigger input.
In the block mode the entire data block is generated once per trigger event. This is
interesting for example in applications with protocol data.
The 81150A and the 81160A pattern generators pass the data through to the device
under test and adopts it to any kind of stress test (shape and timing change).
Bridge the gap between protocol and physical layer test – in real time up to 10 Mbit/s
Increase your test efficiency by combining physical layer test with protocol test
81150A/81160A
Protocol
exerciser
Sends out protocol
data; e.g. VPT 1000
for FlexRay
IN
pass through
pattern
Real-time data pass
through with flexible
modulation and
re-stress test
Protocol handshake
DUT
Pass/fail test
The pass-through pattern functionality takes the protocol data via “mod in” and adopts it
to any kind of stress test (shape and timing changes).
11
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