High vibration rejection over wide frequency
Ultrafast startup: 3 ms
Measurement range extendable to ±50,000°/sec
10,000 g powered shock survivability
Ratiometric to referenced supply
5 V single-supply operation
Z-axis (yaw rate) response
−40°C to +105°C operation
Self-test on digital command
Ultrasmall and light (<0.15 cc, <0.5 gram)
Temperature sensor output
RoHS compliant
APPLICATIONS
Sports equipment
Industrial applications
Platform stabilization
High speed tachometry
Vibration Rejecting Rate Gyro
ADXRS649
GENERAL DESCRIPTION
The ADXRS649 is a complete angular rate sensor (gyroscope)
that uses the Analog Devices, Inc., patented high volume BiMOS
surface-micromachining process to make a complete gyro on
one chip. An advanced, differential, quad sensor design rejects
the influence of linear acceleration, enabling the ADXRS649
to offer rate sensing in harsh environments where shock and
vibration are present.
The output signal, RATEOUT (B1, A2), is a voltage proportional
to the angular rate about the axis normal to the top surface of
the package. The output is ratiometric with respect to a provided
reference supply. An external capacitor is used to set the bandwidth. The measurement range is extendable to ±50,000°/sec
by adding an external resistor.
Low power consumption (3.5 mA) enables very low power
consumption, and ultrafast startup (3 ms) allows for quick
power cycling of the gyro. At 10 samples per second, a pair of
CR2032 coin cells can power the ADXRS649 for three months.
A temperature output is provided for compensation techniques.
Two digital self-test inputs electromechanically excite the sensor
to test proper operation of both the sensor and the signal conditioning circuits. The ADXRS649 is available in a 7 mm × 7 mm ×
3 mm CBGA chip scale package.
FUNCTIONAL BLOCK DIAGRAM
5V
AV
CC
100nF
AGND
5V
V
DD
100n
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
T
= −40°C to +105°C, VS = AVCC = VDD = V
A
unless otherwise noted.
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
SENSITIVITY1 Clockwise rotation is positive output
Measurement Range2 Full-scale range over specifications range ±20,000 °/sec
Initial and over Temperature
−40°C to +105°C 0.08 0.1 0.12 mV/°/sec
Temperature Drift3 ±2 %
Nonlinearity Best fit straight line 0.1 % of FS
NULL BIAS1
Null Bias −40°C to +105°C 2.4 2.5 2.6 V
Calibrated Null Bias4 −40°C to +105°C ±5 °/sec
Linear Acceleration Effect Any axis 0.1 °/sec/g
Vibration Rectification 40 g rms, 50 Hz to 27 kHz 0.0006 °/sec/g2
NOISE PERFORMANCE
Rate Noise Density TA = 25°C 0.25 °/sec/√Hz
T
A
Resolution Floor TA = 25°C, 1 minute to 1 hour in-run 200 °/hr
FREQUENCY RESPONSE
Bandwidth
5
±3 dB user adjustable up to specification 2000 Hz
Sensor Resonant Frequency 16 18 20 kHz
SELF-TEST1
ST1 RATEOUT Response
ST1 pin from Logic 0 to Logic 1 −1300 °/sec
ST2 RATEOUT Response ST2 pin from Logic 0 to Logic 1 1300 °/sec
ST1 to ST2 Mismatch6
Logic 1 Input Voltage 3.3 V
Logic 0 Input Voltage 1.7 V
Input Impedance To common 40 50 100 kΩ
TEMPERATURE SENSOR1
V
at 25°C Load = 10 MΩ 2.3 2.4 2.5 V
OUT
Scale Factor7 T
Load to V
S
A
25 kΩ
Load to Common 25 kΩ
TURN-ON TIME4 Power on to ±90% of final output, CP5 = 2.2 nF 3 ms
OUTPUT DRIVE CAPABILITY
Current Drive For rated specifications 200 μA
Capacitive Load Drive 1000 pF
POWER SUPPLY
Operating Voltage (VS) 4.75 5.00 5.25 V
Quiescent Supply Current 3.5 mA
TEMPERATURE RANGE
Specified Performance −40 +105 °C
1
Parameter is linearly ratiometric with V
2
Measurement range is the maximum range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V supplies.
3
From +25°C to −40°C or +25°C to +105°C.
4
Based on characterization.
5
Adjusted by external capacitor, C
6
Self-test mismatch is described as (ST2 + ST1)/((ST2 − ST1)/2).
7
Scale factor for a change in temperature from 25°C to 26°C. V
.
RATIO
. Reducing bandwidth below 0.01 Hz does not result in further noise improvement.
. See the section for more information. Temperature Output and Calibration
RATIO
±2
%
Rev. A | Page 3 of 12
ADXRS649
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Acceleration (Any Axis, 0.5 ms)
Unpowered 10,000 g
Powered 10,000 g
VDD, AV
CC
V
AVCC
RATIO
−0.3 V to +6.0 V
ST1, ST2 AVCC
Output Short-Circuit Duration
Indefinite
(Any Pin to Common)
Operating Temperature Range −55°C to +125°C
Storage Temperature Range −65°C to +150°C
Stresses above those listed under the Absolute Maximum
Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Drops onto hard surfaces can cause shocks of greater than
10,000 g and can exceed the absolute maximum rating of the
device. Care should be exercised in handling to avoid damage.
RATE SENSITIVE AXIS
The ADXRS649 is a z-axis rate-sensing device (also called a yaw
rate-sensing device). It produces a positive going output voltage
for clockwise rotation about the axis normal to the package top,
that is, clockwise when looking down at the package lid.
RATE
AXIS
LONGIT UDINAL
AXIS
ABCDG
A1
LATERAL AXIS
Figure 2. RATEOUT Signal Increases with Clockwise Rotation
EF
+
1
A
VCC=5V
7
V
GND
RATIO
RATEOUT
/2
4.75V
RATE IN
0.25V
09573-002
ESD CAUTION
Rev. A | Page 4 of 12
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