Analog Devices AD7946 prd Datasheet

14-Bit, 500 kSPS PulSAR™
Preliminary Technical Data
FEATURES
14-bit resolution with no missing codes Throughput: 500 kSPS INL: ±0.4 LSB typ, ±1 LSB max (±0.0061 % of FSR) S/(N + D): 85 dB @ 20 kHz THD: −100 dB @ 20 kHz Pseudo-differential analog input range
0 V to V
with V
REF
No pipeline delay Single-supply 5V operation with
1.8 V/2.5 V/3 V/5 V logic interface Serial interface SPI®/QSPI™/µWire/DSP compatible Daisy chain multiple ADCs and BUSY indicator Power dissipation
3.3 mW @ 5 V/100 kSPS,
3.3 µW @ 5 V/100 SPS Stand-by current: 1 nA 10-lead package: MSOP (MSOP-8 size) and
QFN (LFCSP), 3 mm × 3 mm same space as SOT-23
Pin-for-pin compatible with the 16-Bit AD7686
APPLICATIONS
Battery-powered equipment Data acquisition Instrumentation Medical instruments Process control
Table 1. MSOP, QFN (LFCSP)/SOT-23 14 and16-Bit ADC
Type 100 kSPS 250 kSPS 500 kSPS
16-Bit True Differential
16-Bit Pseudo Differential/Unipolar
16-Bit Unipolar AD7680 14-Bit Pseudo
Differential/Unipolar 14-Bit Unipolar AD7940
up to VDD
REF
AD7684 AD7687 AD7688
AD7683
AD7685 AD7694
AD7942
AD7686
AD7946
ADC in MSOP/QFN
AD7946
APPLICATION DIAGRAM
0.5 TO 5V 5V
0 TO VREF
IN+ IN–
REF
AD7946
GND
VDD
Figure 1.
VIO
SDI SCK SDO CNV
GENERAL DESCRIPTION
The AD7946 is a 14-bit, charge redistribution successive approximation, analog-to-digital converter (ADC) that operates from a single 5V power supply, VDD. It contains a low power, high speed, 14-bit sampling ADC with no missing codes, an internal conversion clock, and a versatile serial interface port. The part also contains a low noise, wide bandwidth, short aperture delay track-and-hold circuit. On the CNV rising edge, it samples an analog input IN+ between 0 V to REF with respect to a ground sense IN−. The reference voltage, REF, is applied externally and can be set up to the supply voltage.
Its power scales linearly with throughput.
The SPI compatible serial interface also features the ability, using the SDI input, to daisy chain several ADCs on a single 3­wire bus and provides an optional BUSY indicator. It is compatible with 1.8 V, 2.5 V, 3 V, or 5 V logic using the separate supply VIO.
The AD7946 is housed in a 10-lead MSOP or a 10-lead QFN (LFCSP) with operation specified from −40°C to +85°C.
1.8 TO VDD
3- OR 4-WIRE INTERFACE (SPI, DAISY CHAIN, CS)
Rev Pr D
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Anal og Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2004 Analog Devices, Inc. All rights reserved.
AD7946 Preliminary Technical Data
TABLE OF CONTENTS
Specifications..................................................................................... 3
Converter Operation.................................................................. 12
Timing Specifications....................................................................... 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Terminology ...................................................................................... 8
Typical Performance Characteristics ............................................. 9
Circuit Information.................................................................... 12
REVISION HISTORY
5/04—Revision D: Preliminary
Typical Connection Diagram ................................................... 13
Digital Interface.......................................................................... 17
Application Hints ........................................................................... 24
Layout .......................................................................................... 24
Evaluating the AD7946’s Performance.................................... 24
Outline Dimensions....................................................................... 25
Ordering Guide .......................................................................... 26
Rev Pr D | Page 2 of 27
Preliminary Technical Data AD7946
SPECIFICATIONS
VDD = 4.5 V to 5.5 V, VIO = 2.3 V to VDD, V
Table 2.
Parameter Conditions Min Typ Max Unit
RESOLUTION 14 Bits ANALOG INPUT
Voltage Range IN+ − IN− 0 V Absolute Input Voltage IN+ −0.1 VDD + 0.1 V IN− −0.1 0.1 V Analog Input CMRR fIN = 250 kHz 65 dB Leakage Current at 25°C Acquisition Phase 1 nA Input Impedance
ACCURACY
No Missing Codes 14 Bits Differential Linearity Error −0.7 ±0.25 +0.7 LSB1 Integral Linearity Error −1 ±0.4 +1 LSB Transition Noise REF = VDD = 5 V 0.33 LSB Gain Error2, T
MIN
to T
±TBD ±TBD LSB
MAX
Gain Error Temperature Drift ±TBD ppm/°C Offset Error2, T
MIN
to T
±TBD ±TBD mV
MAX
Offset Temperature Drift ±TBD ppm/°C Power Supply Sensitivity
VDD = 5V ± 5%
THROUGHPUT
Conversion Rate 0 500 kSPS Transient Response Full-Scale Step 400 ns
AC ACCURACY
Signal-to-Noise fIN = 20 kHz, V Spurious-Free Dynamic Range fIN = 20 kHz −100 dB Total Harmonic Distortion fIN = 20 kHz −100 dB Signal-to-(Noise + Distortion) fIN = 20 kHz, V
f
IN
Input
Intermodulation Distortion4 TBD dB
= VDD, TA = –40°C to +85°C, unless otherwise noted.
REF
±TBD LSB
= 5 V 83 85 dB3
REF
= 5 V 83 85 dB
REF
= 20 kHz, V
= 5 V, −60 dB
REF
25 dB
V
REF
1
LSB means least significant bit. With the 5 V input range, one LSB is 305.2 µV.
2
See Terminology section. These specifications do include full temperature range variation but do not include the error contribution from the external reference.
3
All specifications in dB are referred to a full-scale input FS. Tested with an input signal at 0.5 dB below full-scale, unless otherwise specified.
4
f
= 21.4 kHz, f
IN1
= 18.9 kHz, each tone at −7 dB below full-scale.
IN2
Rev Pr D | Page 3 of 27
AD7946 Preliminary Technical Data
VDD = 4.5 V to 5.5 V, VIO = 2.3 V to VDD, V
Table 3.
Parameter Conditions Min Typ Max Unit
REFERENCE
Voltage Range 0.5 VDD + 0.3 V
Load Current 500 kSPS, REF = 5 V TBD µA SAMPLING DYNAMICS
−3 dB Input Bandwidth 9 MHz
Aperture Delay VDD = 5 V 2.5 ns DIGITAL INPUTS
Logic Levels
VIL –0.3 0.3 × VIO V VIH 0.7 × VIO VIO + 0.3 V IIL −1 +1 µA IIH −1 +1 µA
DIGITAL OUTPUTS
Data Format Serial 14 Bits Straight Binary
Pipeline Delay
VOL I VOH I
= +500 µA 0.4 V
SINK
= −500 µA VIO − 0.3 V
SOURCE
POWER SUPPLIES
VDD Specified Performance 4.5 5.5 V
VIO Specified Performance 2.3 VDD + 0.3 V
VIO Range 1.8 VDD + 0.3 V
Standby Current
1, 2
VDD and VIO = 5 V, 25°C 1 50 nA
Power Dissipation VDD = 5 V, 100 SPS Throughput 3.3 µW VDD = 5 V, 100 kSPS Throughput 3.3 5 mW VDD = 5 V, 500 kSPS Throughput 25 mW TEMPERATURE RANGE3
Specified Performance T
MIN
to T
= VDD, TA = –40°C to +85°C, unless otherwise noted.
REF
Conversion Results Available Immediately after Completed Conversion
−40 +85 °C
MAX
1
With all digital inputs forced to VIO or GND as required.
2
During acquisition phase.
3
Contact Analog Devices for extended temperature range.
Rev Pr D | Page 4 of 27
Preliminary Technical Data AD7946
TIMING SPECIFICATIONS
−40°C to +85°C, VDD = 4.5 V to 5.5 V, VIO = 2.3 V to 5.5 V or VDD + 0.3 V, whichever is the lowest, unless otherwise stated.
Table 4.
Symbol Min Typ Max Unit
Conversion Time: CNV Rising Edge to Data Available t Acquisition Time t Time between Conversions t
CNV Pulse Width ( CS Mode ) SCK Period ( CS Mode )
SCK Period ( Chain Mode ) t
SCK Low Time t SCK High Time t SCK Falling Edge to Data Remains Valid t SCK Falling Edge to Data Valid Delay t
CNV or SDI Low to SDO D15 MSB Valid (CS Mode)
CNV or SDI High or Last SCK Falling Edge to SDO High Impedance (CS Mode) SDI Valid Setup Time from CNV Rising Edge (CS Mode) SDI Valid Hold Time from CNV Rising Edge (CS Mode)
SCK Valid Setup Time from CNV Rising Edge (Chain Mode) t SCK Valid Hold Time from CNV Rising Edge (Chain Mode) t SDI Valid Setup Time from SCK Falling Edge (Chain Mode) t SDI Valid Hold Time from SCK Falling Edge (Chain Mode) t SDI High to SDO High (Chain Mode with BUSY indicator) t VIO above 4.5 V 15 ns VIO above 2.3 V 26 ns
1
0.5 1.6 µs
CONV
400 ns
ACQ
2 µs
CYC
10 ns
t
CNVH
t
15 ns
SCK
SCK
VIO above 4.5 V 19 ns VIO above 3 V 20 ns VIO above 2.7 V 21 ns VIO above 2.3 V 22 ns
7 ns
SCKL
7 ns
SCKH
5 ns
HSDO
DSDO
VIO above 4.5 V 14 ns VIO above 3 V 15 ns VIO above 2.7 V 16 ns VIO above 2.3 V 17 ns
tEN
VIO above 4.5 V 15 ns VIO above 2.7 V 18 ns VIO above 2.3 V 22 ns
t
25 ns
DIS
t
15 ns
SSDICNV
t
0 ns
HSDICNV
5 ns
SSCKCNV
5 ns
HSCKCNV
5 ns
SSDISCK
4 ns
HSDISCK
DSDOSDI
1
See Figure 2 and Figure 3 for load conditions.
Rev Pr D | Page 5 of 27
AD7946 Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter Rating
Analog Inputs IN+1, IN−1, REF
GND − 0.3 V to VDD + 0.3 V
or ±130 mA Supply Voltages VDD, VIO to GND −0.3 V to +7 V VDD to VIO ±7 V Digital Inputs to GND −0.3 V to VIO + 0.3 V Digital Outputs to GND −0.3 V to VIO + 0.3 V Storage Temperature Range −65°C to +150°C Junction Temperature 150°C θJA Thermal Impedance 200°C/W (MSOP-10) θJC Thermal Impedance 44°C/W (MSOP-10) Lead Temperature Range
Vapor Phase (60 sec) 215°C Infrared (15 sec) 220°C
1
See the Analog Input section.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
500µAI
TO SDO
Figure 2. Load Circuit for Digital Interface Timing
50pF
C
L
500µAI
30% VIO
t
DELAY
2V OR VIO – 0.5V
0.8V OR 0.5V
NOTES
1. 2V IF VIO ABOVE 2.5V, VIO– 0.5V IF VIO BELOW 2.5V.
2. 0.8V IF VIO ABOVE 2.5V, 0.5V IF VIO BELOW 2.5V.
Figure 3. Voltage Reference Levels for Timing
OL
1.4V
OH
70% VIO
1
2
02968-PrH-002
t
DELAY
2V OR VIO – 0.5V
0.8V OR 0.5V
1
2
02968-PrH-003
Rev Pr D | Page 6 of 27
Preliminary Technical Data AD7946
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
REF
2
VDD
3
IN+
AD7946
4
IN–
5
GND
Figure 4.10-Lead MSOP and QFN (LFCSP) Pin Configuration
10
VIO
9
SDI
8
SCK
7
SDO
6
CNV
Table 6. Pin Function Descriptions
Pin No. Mnemonic Type1 Function
1 REF AI
Reference Input Voltage. The REF range is from 0.5 V to VDD. It is referred to the GND pin. This pin should
be decoupled closely to the pin with a 10 µF capacitor. 2 VDD P Power Supply. 3 IN+ AI
Analog Input. It is referred to in IN−. The voltage range, i.e., the difference between IN+ and IN−, is 0 V to
.
V
REF
4 IN− AI Analog Input Ground Sense. To be connected to the analog ground plane or to a remote sense ground. 5 GND P Power Supply Ground. 6 CNV DI
Convert Input. This input has multiple functions. On its leading edge, it initiates the conversions and
CS
selects the interface mode of the part, chain or
mode. In CS mode, it enables the SDO pin when low. In
chain mode, the data should be read when CNV is high. 7 SDO DO Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK. 8 SCK DI Serial Data Clock Input. When the part is selected, the conversion result is shifted out by this clock. 9 SDI DI Serial Data Input. This input provides multiple features. It selects the interface mode of the ADC as follows:
Chain mode is selected if SDI is low during the CNV rising edge. In this mode, SDI is used as a data input to
daisy chain the conversion results of two or more ADCs onto a single SDO line. The digital data level on
SDI is output on SDO with a delay of 14 SCK cycles.
CS
mode is selected if SDI is high during the CNV rising edge. In this mode, either SDI or CNV can enable the serial output signals when low, and if SDI or CNV is low when the conversion is complete, the BUSY indicator feature is enabled.
10 VIO P
Input/Output Interface Digital Power. Nominally at the same supply as the host interface (1.8 V, 2.5 V, 3 V, or 5 V).
1
AI = Analog Input, DI = Digital Input, DO = Digital Output, and P = Power
Rev Pr D | Page 7 of 27
AD7946 Preliminary Technical Data
[
(
)
−+=
TERMINOLOGY
Integral Nonlinearity Error (INL)
Linearity error refers to the deviation of each individual code from a line drawn from negative full scale through positive full scale. The point used as negative full scale occurs 1/2 LSB before the first code transition. Positive full scale is defined as a level 1 1/2 LSB beyond the last code transition. The deviation is measured from the middle of each code to the true straight line (Figure 21).
Differential Nonlinearity Error (DNL)
In an ideal ADC, code transitions are 1 LSB apart. DNL is the maximum deviation from this ideal value. It is often specified in terms of resolution for which no missing codes are guaranteed.
Offset Error
The first transition should occur at a level 1/2 LSB above analog ground (152.6 µV for the 0 V to 5 V range). The offset error is the deviation of the actual transition from that point.
Gain Error
The last transition (from 111 . . . 10 to 111 . . . 11) should occur for an analog voltage 1 1/2 LSB below the nominal full scale (4.999542 V for the 0 V to 5 V range). The gain error is the deviation of the actual level of the last transition from the ideal level after the offset has been adjusted out.
Spurious-Free Dynamic Range (SFDR)
The difference, in decibels (dB), between the rms amplitude of the input signal and the peak spurious signal.
Effective Number of Bits (ENOB)
ENOB is a measurement of the resolution with a sine wave input. It is related to S/(N+D) by the following formula
]
DNSENOB
dB
and is expressed in bits.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of the first five harmonic components to the rms value of a full-scale input signal and is expressed in dB.
Signal-to-Noise Ratio (SNR)
SNR is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the Nyquist frequency, excluding harmonics and dc. The value for SNR is expressed in dB.
Signal-to-(Noise + Distortion) Ratio (S/[N+D])
S/(N+D) is the ratio of the rms value of the actual input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/(N+D) is expressed in dB.
Aperture Delay
Aperture delay is a measure of the acquisition performance and is the time between the rising edge of the CNV input and when the input signal is held for a conversion.
Transi e nt Resp o n s e
The time required for the ADC to accurately acquire its input after a full-scale step function was applied.
)02.6/76.1/
Rev Pr D | Page 8 of 27
Preliminary Technical Data AD7946
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 5. Integral Nonlinearity vs. Code
Figure 6. Histogram of a DC Input at the Code Center
Figure 8. Differential Nonlinearity vs. Code
Figure 9. Histogram of a DC Input at the Code Center
Figure 7. FFT Plot
Rev Pr D | Page 9 of 27
Figure 10. S/[N + D] vs. Freq uency
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