Analog Devices AD7938 6 Datasheet

V
8-Channel, 625 kSPS, 12-Bit

FEATURES

Fast throughput rate: 625 kSPS Specified for V Low power
3.6 mW max at 625 kSPS with 3 V supplies
7.5 mW max at 625 kSPS with 5 V supplies 8 analog input channels with a sequencer Software configurable analog inputs
8-channel single-ended inputs 4-channel fully differential inputs 4-channel pseudo-differential inputs
7-channel pseudo-differential inputs Accurate on-chip 2.5 V reference ±0.2% max @ 25°C, 25 ppm/°C max 70 dB SINAD at 50 kHz input frequency No pipeline delays High speed parallel interface—word/byte modes Full shutdown mode: 2 µA max 32-lead LFCSP and TQFP package

GENERAL DESCRIPTION

The AD7938-6 is a 12-bit high speed, low power, successive approximation (SAR) ADC. The part operates from a single
2.7 V to 5.25 V power supply and features throughput rates up to 625 kSPS. The part contains a low noise, wide bandwidth, differential track-and-hold amplifier that can handle input frequencies up to 50 MHz.
The AD7938-6 features eight analog input channels with a channel sequencer that allows a preprogrammed selection of channels to be converted sequentially. The part can operate with either single-ended, fully differential, or pseudo­differential analog inputs.
The conversion process and data acquisition are controlled using standard control inputs that allow easy interfacing with microprocessors and DSPs. The input signal is sampled on the falling edge of
this point.
The AD7938-6 has an accurate on-chip 2.5 V reference that can be used as the reference source for the analog-to-digital conversion. Alternatively, this pin can be overdriven to provide an external reference.
of 2.7 V to 5.25 V
DD
CONVST
and the conversion is also initiated at
Parallel ADCs with a Sequencer
AD7938-6

FUNCTIONAL BLOCK DIAGRAM

V
AGND
DD
V
REFIN/
REFOUT
VIN0
VIN7
SEQUENCER
PARALLEL INTERFACE/CONTROL REGISTER
DB0 DB11
I/P
MUX
2.5V
VREF
T/H
CS DGNDRD WR W/B
Figure 1.
The AD7938-6 uses advanced design techniques to achieve very low power dissipation at high throughput rates. The part also features flexible power management options. An on-chip control register allows the user to set up different operating conditions, including analog input range and configuration, output coding, power management, and channel sequencing.

PRODUCT HIGHLIGHTS

1. High throughput with low power consumption.
2. Eight analog inputs with a channel sequencer.
3. Accurate on-chip 2.5 V reference.
4. Software configurable analog inputs. Single-ended, pseudo-
differential, or fully differential analog inputs that are software selectable.
5. Single-supply operation with V
function allows the parallel interface to connect directly to 3 V, or 5 V processor systems independent of V
6. No pipeline delay.
7. Accurate control of the sampling instant via a
input and once off conversion control.
AD7938-6
12-BIT
SAR ADC
AND
CONTROL
function. The V
DRIVE
CLKIN CONVST BUSY
V
DRIVE
DRIVE
.
DD
CONVST
04751-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 Fax: 781.326.8703 © 2004 Analog Devices, Inc. All rights reserved.
www.analog.com
AD7938-6

TABLE OF CONTENTS

AD7938-6—Specifications .............................................................. 3
Analog Input Structure.............................................................. 16
Timing Specifications....................................................................... 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Function Description................................................................ 7
Terminology ...................................................................................... 9
Typical Performance Characteristics ...........................................11
On-Chip Registers.......................................................................... 13
Control Register.......................................................................... 13
Sequencer Operation ................................................................. 14
Shadow Register.......................................................................... 14
Circuit Information........................................................................ 15
Converter Operation.................................................................. 15
ADC Transfer Function............................................................. 15
Typical Connection Diagram ................................................... 16
Analog Inputs.............................................................................. 17
Analog Input Selection.............................................................. 19
Reference Section ....................................................................... 20
Parallel Interface ......................................................................... 22
Power Modes of Operation ....................................................... 25
Power vs. Throughput Rate....................................................... 26
Microprocessor Interfacing....................................................... 26
Application Hints ........................................................................... 28
Grounding and Layout .............................................................. 28
PCB Design Guidelines for Chip Scale Package .................... 28
Evaluating the AD7938-6 Performance................................... 28
Outline Dimensions....................................................................... 29
Ordering Guide .......................................................................... 30
REVISION HISTORY
10/04—Revision 0: Initial Version
Rev. 0 | Page 2 of 32
AD7938-6

SPECIFICATIONS

VDD = V T
MAX
Table 1.
Parameter B Version1 Unit Test Conditions/Comments
DYNAMIC PERFORMANCE FIN = 50 kHz sine wave
Signal-to-Noise + Distortion (SINAD)2 70 dB min Differential mode
68 dB min Single-ended mode
Signal-to-Noise Ratio (SNR)2 71 dB min Differential mode
69 dB min Single-ended mode
Total Harmonic Distortion (THD)2 −73 dB max −85 dB typ, differential mode
−70 dB max −80 dB typ, single-ended mode
Peak Harmonic or Spurious Noise (SFDR)2 −73 dB max −82 dB typ
Intermodulation Distortion (IMD)2 fa = 30 kHz, fb = 50 kHz
Channel-to-Channel Isolation −85 dB typ FIN = 50 kHz, F
Aperture Delay2 5 ns typ
Aperture Jitter2 72 ps typ
Full Power Bandwidth2 50 MHz typ @ 3 dB 10 MHz typ @ 0.1 dB DC ACCURACY
Resolution 12 Bits
Integral Nonlinearity2 ±1 LSB max Differential mode
±1.5 LSB max Single-ended mode
Differential Nonlinearity2
Single-Ended and Pseudo-Differential Input Straight binary output coding
Fully Differential Input Twos complement output coding
ANALOG INPUT
Single-Ended Input Range 0 to V
Pseudo-Differential Input Range: V
Fully Differential Input Range: V
DC Leakage Current4 ±1 µA max
Input Capacitance 45 pF typ When in track
10 pF typ When in hold
= 2.7 V to 5.25 V, internal/external V
DRIVE
= 2.5 V, unless otherwise noted, F
REF
= 10 MHz, F
CLKIN
= 625 kSPS; TA = T
SAMPLE
, unless otherwise noted.
Second-Order Terms −86 dB typ Third-Order Terms −90 dB typ
= 300 kHz
NOISE
Differential Mode ±0.95 LSB max Guaranteed no missed codes to 12 bits Single-Ended Mode −0.95/+1.5 LSB max Guaranteed no missed codes to 12 bits
Offset Error2 ±6 LSB max Offset Error Match2 ±1 LSB max Gain Error2 ±3 LSB max Gain Error Match2 ±1 LSB max
Positive Gain Error2 ±3 LSB max Positive Gain Error Match2 ±1 LSB max Zero-Code Error2 ±6 LSB max Zero-Code Error Match2 ±1 LSB max Negative Gain Error2 ±3 LSB max Negative Gain Error Match2 ±1 LSB max
or 0 to 2 × V
REF
0 to V
IN+
V
−0.3 to +0.7 V typ VDD = 3 V
IN−
or 2 × V
REF
V RANGE bit = 0, or RANGE bit = 1, respectively
REF
V RANGE bit = 0, or RANGE bit = 1, respectively
REF
−0.3 to +1.8 V typ VDD = 3 V
V
IN+
IN+
and V
and V
VCM ± V
IN−
VCM ± V
IN−
/2 V VCM = common-mode voltage3 = V
REF
V VCM = V
REF
REF
, V
IN+
or V
must remain within GND/VDD
IN−
REF
/2
MIN
to
Rev. 0 | Page 3 of 32
AD7938-6
Parameter B Version1 Unit Test Conditions/Comments
REFERENCE INPUT/OUTPUT
V
Input Voltage5 2.5 V ±1% for specified performance
REF
DC Leakage Current ±1 µA max V
Output Voltage 2.5 V ±0.2% max @ 25°C
REFOUT
V
Temperature Coefficient 25 ppm/°C max 5 ppm/°C typ
REFOUT
V
Noise 10 µV typ 0.1 Hz to 10 Hz bandwidth
REF
130 µV typ 0.1 Hz to 1 MHz bandwidth V
Output Impedance 10 Ω typ
REF
V
Input Capacitance 15 pF typ When in track
REF
25 pF typ When in hold
LOGIC INPUTS
Input High Voltage, V Input Low Voltage, V Input Current, IIN ±5 µA max Typically 10 nA, VIN = 0 V or V Input Capacitance, C
LOGIC OUTPUTS
Output High Voltage, VOH 2.4 V min I Output Low Voltage, VOL 0.4 V max I Floating-State Leakage Current ±3 µA max Floating-State Output Capacitance4 10 pF max Output Coding CODING bit = 0
CONVERSION RATE
Conversion Time t2 + 13 t Track-and-Hold Acquisition Time 125 ns max Full-scale step input Throughput Rate 625 kSPS max
POWER REQUIREMENTS
VDD 2.7/5.25 V min/max V
2.7/5.25 V min/max
DRIVE
6
I
Digital I/PS = 0 V or V
DD
Normal Mode (Static) 0.8 mA typ VDD = 2.7 V to 5.25 V, SCLK on or off Normal Mode (Operational) 1.5 mA max VDD = 4.75 V to 5.25 V
1.2 mA max VDD = 2.7 V to 3.6 V Autostandby Mode 0.3 mA typ F 160 µA typ (Static) Full/Autoshutdown Mode (Static) 2 µA max SCLK on or off
Power Dissipation
Normal Mode (Operational) 7.5 mW max VDD = 5 V
3.6 mW max VDD = 3 V Autostandby Mode (Static) 800 µW typ VDD = 5 V 480 µW typ VDD = 3 V Full/Autoshutdown Mode (Static) 10/6 µW max VDD = 5 V/3 V
1
Temperature ranges as follows: B Versions: −40°C to +85°C.
2
See the Terminology section.
3
For full common-mode range, see Fi and . gure 25 Figure 26
4
Sample tested during initial release to ensure compliance.
5
This device is operational with an external reference in the range 0.1 V to VDD. See the R for more information. eference Section
6
Measured with a midscale dc analog input.
2.4 V min
INH
0.8 V max
INL
4
10 pF max
IN
= 200 µA
SOURCE
= 200 µA
SINK
Straight (Natural) Binary
Twos Complement
ns
CLK
CODING bit = 1
= 100 kSPS, VDD = 5 V
SAMPLE
DRIVE
DRIVE
Rev. 0 | Page 4 of 32
AD7938-6
TIMING SPECIFICATIONS1
VDD = V T
MAX
Table 2.
Limit at T Parameter AD7938-6 Unit Description
f
50 kHz min
CLKIN
10 MHz max t
QUIET
t1 10 ns min t2 15 ns min t3 50 ns min CLKIN Falling Edge to BUSY Rising Edge.
t4 0 ns min t5 0 ns min t6 10 ns min t7 10 ns min t8 10 ns min t9 10 ns min New Data Valid before Falling Edge of BUSY. t10 0 ns min t11 0 ns min t12 30 ns min
2
t
30 ns max
13
3
t
3 ns min
14
50 ns max t15 0 ns min t16 0 ns min t17 10 ns min Minimum Time between Reads/Writes.
t18 0 ns min t19 10 ns min t20 40 ns max CLKIN Falling Edge to BUSY Falling Edge.
t21 15.7 ns min CLKIN Low Pulse Width. t22 7.8 ns min CLKIN High Pulse Width.
1
Sample tested during initial release to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V. All timing specifications given above are with a 25 pF load capacitance (see , , , and ).
2
The time required for the output to cross 0.4 V or 2.4 V.
3
t14 is derived from the measured time taken by the data outputs to change 0.5 V. The measured number is then extrapolated back to remove the effects of charging or
discharging the 25 pF capacitor. This means that the time, t14, quoted in the timing characteristics is the true bus relinquish time of the part and is independent of the bus loading.
= 2.7 V to 5.25 V, internal/external V
DRIVE
, unless otherwise noted.
, T
MIN
MAX
30 ns min
= 2.5 V, unless otherwise noted; F
REF
= 10MHz, F
CLKIN
= 625 kSPS; TA = T
SAMPLE
Minimum time between end of read and start of next conversion, i.e., time from when the data bus goes into three-state until the next falling edge of
CONVST. CONVST Pulse Width. CONVST Falling Edge to CLKIN Falling Edge Setup Time.
CS to WR Setup Time. CS to WR Hold Time. WR Pulse Width. Data Setup Time before Data Hold after
WR.
WR.
CS to RD Setup Time. CS to RD Hold Time. RD Pulse Width. Data Access Time after Bus Relinquish Time after Bus Relinquish Time after HBEN to HBEN to
HBEN to HBEN to
RD Setup Time. RD Hold Time.
WR Setup Time. WR Hold Time.
RD.
RD. RD.
Figure 35 Figure 36 Figure 37 Figure 38
MIN
to
Rev. 0 | Page 5 of 32
AD7938-6

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
VDD to AGND/DGND −0.3 V to +7 V V
to AGND/DGND −0.3 V to VDD +0.3 V
DRIVE
Analog Input Voltage to AGND −0.3 V to VDD + 0.3 V Digital Input Voltage to DGND −0.3 V to +7 V V
to VDD −0.3 V to VDD + 0.3 V
DRIVE
Digital Output Voltage to DGND −0.3 V to V V
to AGND −0.3 V to VDD + 0.3 V
REFIN
DRIVE
+ 0.3 V
AGND to DGND −0.3 V to + 0.3 V Input Current to Any
Pin Except Supplies
1
±10 mA
Operating Temperature Range
Commercial (B Version) −40°C to +85°C Storage Temperature Range −65°C to +150°C Junction Temperature 150°C θJA Thermal Impedance 108.2°C/W (LFCSP) 121°C/W (TQFP) θJC Thermal Impedance 32.71°C/W (LFCSP) 45°C/W (TQFP) Lead Temperature, Soldering
Reflow Temperature
255°C
(10 sec to 30 sec)
ESD 1.5 kV
1
Transient currents of up to 100 mA do not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. 0 | Page 6 of 32
AD7938-6

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

7
6
5
4
3
2
IN
IN
IN
V
V
V
27
26
25
VIN1
24
VIN0
23
V
22
REFIN/VREFOUT
21
AGND
20
CS
19
RD WR
18
17
CONVST
14
15
16
BUSY
CLKIN
04751-006
CS, RD, and WR. The logic high/low
input.
DRIVE
CS, RD, and WR.
input.
DRIVE
th
rising edge of SCLK, see Figure 35.
CONVST is used to
RD read while CS is low.
Table 4. Pin Function Description
Pin No Mnemonic Function
1 to 8 DB0 to DB7
Data Bits 0 to 7. Three-state parallel digital I/O pins that provide the conversion result and also allow the control and shadow registers to be programmed. These pins are controlled by voltage levels for these pins are determined by the V
9 V
DRIVE
Logic Power Supply Input. The voltage supplied at this pin determines at what voltage the parallel interface of the AD7938-6 operates. This pin should be decoupled to DGND. The voltage at this pin may be different to that
but should never exceed VDD by more than 0.3 V.
at V
DD
10 DGND
Digital Ground. This is the ground reference point for all digital circuitry on the AD7938-6. This pin should connect to the DGND plane of a system. The DGND and AGND voltages should ideally be at the same potential and must not be more than 0.3 V apart, even on a transient basis.
11 DB8/HBEN
Data Bit 8/High Byte Enable. When W/
CS, RD, and WR. When W/B is low, this pin acts as the high byte enable pin. When HBEN is low, the low byte
by of data being written to or read from the AD7938-6 is on DB0 to DB7. When HBEN is high, the top four bits of the data being written to or read from the AD7938-6 are on DB0 to DB3. When reading from the device, DB4 to DB6 of the high byte contains the ID of the channel to which the conversion result corresponds (see the channel address bits in Table 8). When writing to the device, DB4 to DB7 of the high byte must be all 0s.
12 to 14 DB9 to DB11
Data Bits 9 to 11. Three-state parallel digital I/O pins that provide the conversion result and also allow the control and shadow registers to be programmed in word mode. These pins are controlled by The logic high/low voltage levels for these pins are determined by the V
15 BUSY
Busy Output. Logic output indicating the status of the conversion. The BUSY output goes high following the falling edge of the result is available in the output register, the BUSY output goes low. The track-and-hold returns to track mode just prior to the falling edge of BUSY on the 13
16 CLKIN
Master Clock Input. The clock source for the conversion process is applied to this pin. Conversion time for the AD7938-6 takes 13 clock cycles + t conversion time and achievable throughput rate. The CLKIN signal may be a continuous or burst clock.
17
CONVST Conversion Start Input. A falling edge on CONVST is used to initiate a conversion. The track-and-hold goes from
track to hold mode on the falling edge of power-down, when operating in autoshutdown or autostandby modes, a rising edge on power-up the device.
18 19
WR Write Input. Active low logic input used in conjunction with CS to write data to the internal registers. RD Read Input. Active low logic input used in conjunction with CS to access the conversion result. The conversion
result is placed on the data bus following the falling edge of
20
CS Chip Select. Active low logic input used in conjunction with RD and WR to read conversion data or to write data
to the internal registers.
DD
IN
IN
IN
V
V
V
30
29
28
AD7938-6
TOP VIEW
(Not to Scale)
11
12
DB9
DB1013DB11
DB8/HBEN
DB0 DB1 DB2 DB3 DB4 DB5 DB6 DB7
W/B32V
31
PIN 1
1
IDENTIFIER
2
3
4
5
6
7
8
9
10
DRIVE
DGND
V
Figure 2. Pin Configuration
B is high, this pin acts as Data Bit 8, a three-state I/O pin that is controlled
CONVST and stays high for the duration of the conversion. Once the conversion is complete and
. The frequency of the master clock input therefore determines the
2
CONVST and the conversion process is initiated at this point. Following
Rev. 0 | Page 7 of 32
AD7938-6
Pin No Mnemonic Function
21 AGND
22 V
REFIN/VREFOUT
23 to 30 VIN0 to VIN7
31 VDD
32
B Word/Byte Input. When this input is logic high, data is transferred to and from the AD7938-6 in 12-bit words on
W/
Analog Ground. This is the ground reference point for all analog circuitry on the AD7938-6. All analog input signals and any external reference signal should be referred to this AGND voltage. The AGND and DGND voltages should ideally be at the same potential and must not be more than 0.3 V apart, even on a transient basis.
Reference Input/Output. This pin is connected to the internal reference and is the reference source for the ADC. The nominal internal reference voltage is 2.5 V and this appears at this pin. This pin can be overdriven by an external reference. The input voltage range for the external reference is 0.1 V to V taken to ensure that the analog input range does not exceed V
Analog Input 0 to Analog Input 7. Eight analog input channels that are multiplexed into the on-chip track-and­hold. The analog inputs can be programmed to be eight single-ended inputs, four fully differential pairs, four pseudo-differential pairs, or seven pseudo-differential inputs by setting the MODE bits in the control register appropriately (see Table 8). The analog input channel to be converted can either be selected by writing to the address bits (ADD2 to ADD0) in the control register prior to the conversion or the on-chip sequencer can be used. The SEQ and SHDW bits in conjunction with the address bits in the control register allow the shadow register to be programmed. The input range for all input channels can either be 0 V to V the coding can be binary or twos complement, depending on the states of the RANGE and CODING bits in the control register. Any unused input channels should be connected to AGND to avoid noise pickup.
Power Supply Input. The V AGND with a 0.1 µF capacitor and a 10 µF tantalum capacitor.
Pins DB0 to DB11. When this pin is logic low, byte transfer mode is enabled. Data and the channel ID are transferred on Pins DB0 to DB7, and Pin DB8/HBEN assumes its HBEN functionality. Unused data lines when operating in byte transfer mode should be tied off to DGND.
; however, care must be
+ 0.3 V. See the Reference Section.
DD
range for the AD7938-6 is 2.7 V to 5.25 V. The supply should be decoupled to
DD
DD
or 0 V to 2 × V
REF
REF
, and
Rev. 0 | Page 8 of 32
AD7938-6

TERMINOLOGY

Integral Nonlinearity
This is the maximum deviation from a straight line passing through the endpoints of the ADC transfer function. The endpoints of the transfer function are zero scale, a point 1 LSB below the first code transition, and full scale, a point 1 LSB above the last code transition.
Differential Nonlinearity
This is the difference between the measured and the ideal 1 LSB change between any two adjacent codes in the ADC.
Offset Error
This is the deviation of the first code transition (00 . . .000) to (00 . . . 001) f rom the ideal, i.e., AGND + 1 LSB.
Offset Error Match
This is the difference in offset error between any two channels.
Gain Error
This is the deviation of the last code transition (111 . . .110) to (111 . . . 111) from the ideal (i.e., V error has been adjusted out.
Gain Error Match
This is the difference in gain error between any two channels.
Zero-Code Error
This applies when using the twos complement output coding option, in particular to the 2 × V
biased about the V
+V
REF
REFIN
mid scale transition (all 0s to all 1s) from the ideal V
REF
.
i.e., V
Zero-Code Error Match
This is the difference in zero-code error between any two channels.
Positive Gain Error
This applies when using the twos complement output coding option, in particular to the 2 × V
biased about the V
+V
REF
REFIN
code transition (011. . .110) to (011 .. . 111) from the ideal (i.e.,
− 1 LSB) after the zero-code error has been adjusted out.
+V
REF
Positive Gain Error Match
This is the difference in positive gain error between any two channels.
– 1 LSB) after the offset
REF
input range with −V
REF
REF
to
point. It is the deviation of the
voltage,
IN
input range with −V
REF
REF
to
point. It is the deviation of the last
Negative Gain Error
This applies when using the twos complement output coding option, in particular to the 2 × V
biased about the V
+V
REF
point. It is the deviation of the first
REF
input range with −V
REF
REF
to
code transition (100 . . . 000) to (100 . . . 001) from the ideal (i.e., −V
+ 1 LSB) after the zero-code error has been
REFIN
adjusted out.
Negative Gain Error Match
This is the difference in negative gain error between any two channels.
Channel-to-Channel Isolation
Channel-to-channel isolation is a measure of the level of crosstalk between channels. It is measured by applying a full­scale sine wave signal to all seven nonselected input channels and applying a 50 kHz signal to the selected channel. The channel-to-channel isolation is defined as the ratio of the power of the 50 kHz signal on the selected channel to the power of the noise signal on the unselected channels that appears in the FFT of this channel. The noise frequency on the unselected channels varies from 40 kHz to 740 kHz. The noise amplitude is at 2 ×
, while the signal amplitude is at 1 × V
V
REF
REF
.
Power Supply Rejection Ratio (PSRR)
PSRR is defined as the ratio of the power in the ADC output at full-scale frequency, f, to the power of a 100 mV p-p sine wave applied to the ADC V
supply of frequency fS. The frequenc y
DD
of the noise varies from 1 kHz to 1 MHz.
PSRR (dB) = 10log(Pf/Pf
Pf is the power at frequency f in the ADC output; Pf
power at frequency f
in the ADC output.
S
)
S
is the
S
Common-Mode Rejection Ratio (CMRR)
CMRR is defined as the ratio of the power in the ADC output at full-scale frequency, f, to the power of a 100 mV p-p sine wave applied to the common-mode voltage of V frequency f
as
S
CMRR (dB) = 10log (Pf/Pf
)
S
IN+
and V
Pf is the power at frequency f in the ADC output; Pf power at frequency f
in the ADC output.
S
of
IN−
is the
S
Track-and-Hold Acquisition Time
The track-and-hold amplifier returns to track mode at the end of conversion. The track-and-hold acquisition time is the time required for the output of the track-and-hold amplifier to reach its final value, within ±1/2 LSB, after the end of conversion.
Rev. 0 | Page 9 of 32
AD7938-6
Signal-to-(Noise + Distortion) Ratio (SINAD)
This is the measured ratio of signal-to-(noise + distortion) at the output of the A/D converter. The signal is the rms amplitude of the fundamental. Noise is the sum of all nonfundamental signals up to half the sampling frequency (f The ratio is dependent on the number of quantization levels in the digitization process; the more levels, the smaller the quantization noise. The theoretical signal-to-(noise + distortion) ratio for an ideal N-bit converter with a sine wave input is given by
Signal-to-(Noise + Distortion) = (6.02 N + 1.76) dB
Thus, for a 12-bit converter, this is 74 dB.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of harmonics to the fundamental. For the AD7938-6, it is defined as
()
THD
where V V
is the rms amplitude of the fundamental and V2, V3,
1
, V5, and V6 are the rms amplitudes of the second through the
4
20logdB
=
sixth harmonics.
/2), excluding dc.
S
V
1
22222
VVVVV
++++
65432
Peak Harmonic or Spurious Noise
Peak harmonic or spurious noise is defined as the ratio of the rms value of the next largest component in the ADC output spectrum (up to f
/2 and excluding dc) to the rms value of the
S
fundamental. Normally, the value of this specification is determined by the largest harmonic in the spectrum, but for ADCs where the harmonics are buried in the noise floor, it is a noise peak.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and fb, any active device with nonlinearities creates distortion products at sum and difference frequencies of mfa ± nfb where m, n = 0, 1, 2, 3, etc. Intermodulation distortion terms are those for which neither m nor n are equal to 0. For example, the second-order terms include (fa + fb) and (fa − fb), while the third-order terms include (2fa + fb), (2fa − fb), (fa + 2fb) and (fa − 2fb).
The AD7938-6 is tested using the CCIF standard where two input frequencies near the top end of the input bandwidth are used. In this case, the second-order terms are usually distanced in frequency from the original sine waves while the third-order terms are usually at a frequency close to the input frequencies. As a result, the second- and third-order terms are specified separately. The calculation of the intermodulation distortion is as per the THD specification where it is the ratio of the rms sum of the individual distortion products to the rms amplitude of the sum of the fundamentals expressed in dBs.
Rev. 0 | Page 10 of 32
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