85 nV @ 16.7 Hz
Current: 400 μA typical
Power-down: 1 μA maximum
Low noise programmable gain instrumentation amp
Band gap reference with 4 ppm/°C drift typical
Update rate: 4.17 Hz to 470 Hz
3 differential inputs
Internal clock oscillator
Simultaneous 50 Hz/60 Hz rejection
Programmable current sources
On-chip bias voltage generator
Burnout currents
Power supply: 2.7 V to 5.25 V
–40°C to +105°C temperature range
Independent interface power supply
16-lead TSSOP package
Interface
3-wire serial
SPI®, QSPI™, MICROWIRE™, and DSP compatible
Schmitt trigger on SCLK
APPLICATIONS
Thermocouple measurements
RTD measurements
Thermistor measurements
Gas analysis
FUNCTIONAL BLOCK DIAGRAM
GND
DD
ADC with On-Chip In-Amp and Reference
AD7785
Industrial process control
Instrumentation
Portable instrumentation
Blood analysis
Smart transmitters
Liquid/gas chromatography
6-digit DVM
GENERAL DESCRIPTION
The AD7785 is a low power, low noise, complete analog front
end for high precision measurement applications. The AD7785
contains a low noise 20-bit ∑-Δ ADC with three differential
analog inputs. The on-chip, low noise instrumentation amplifier
means that signals of small amplitude can be interfaced directly
to the ADC. With a gain setting of 64, the rms noise is 40 nV
when the update rate equals 4.17 Hz.
The device contains a precision low noise, low drift internal
band gap reference and can accept an external differential
reference. Other on-chip features include programmable
excitation current sources, burnout currents, and a bias voltage
generator. The bias voltage generator sets the common-mode
voltage of a channel to AV
The AD7785 can be operated with either the internal clock
or an external clock. The output data rate from the device is
software-programmable and can be varied from 4.17 Hz to 470
Hz. The device operates with a power supply from 2.7 V to
5.25 V. It consumes a current of 400 μA typical and is housed in
a 16-lead TSSOP package.
REFIN( +)/AI N3(+)
REFIN(–)/ AIN3(–)
DD
/2.
V
BIAS
AV
DD
AIN1(+)
AIN1(–)
AIN2(+)
AIN2(–)
IOUT1
IOUT2
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
AVDD = 2.7 V to 5.25 V; DVDD = 2.7 V to 5.25 V; GND = 0 V; all specifications T
Table 1.
Parameter AD7785B1 Unit Test Conditions/Comments
ADC CHANNEL
Output Update Rate 4.17 to 470 Hz nom
No Missing Codes
2
20 Bits min
Resolution See Output Noise and Resolution Specifications
Output Noise and Update Rates See Output Noise and Resolution Specifications
Integral Nonlinearity ±15 ppm of FSR max
Offset Error
Offset Error Drift vs. Temperature
Full-Scale Error
Gain Drift vs. Temperature
3
4
3, 5
4
±1 μV typ
±10 nV/°C typ
±10 μV typ
±1 ppm/°C typ Gain = 1 to 16, external reference
±3 ppm/°C typ Gain = 32 to 128, external reference
Power Supply Rejection 100 dB min AIN = 1 V/gain, gain ≥ 4, external reference
ANALOG INPUTS
Differential Input Voltage Ranges ±V
Absolute AIN Voltage Limits
2
/Gain V nom
REF
Unbuffered Mode GND – 30 mV V min Gain = 1 or 2
AVDD + 30 mV V max
Buffered Mode GND + 100 mV V min Gain = 1 or 2
AVDD – 100 mV V max
In-Amp Active GND + 300 mV V min Gain = 4 to 128
AVDD – 1.1 V max
Common-Mode Voltage, VCM 0.5 V min
Analog Input Current
Buffered Mode or In-Amp Active
Average Input Current
2
±1 nA max Gain = 1 or 2, update rate < 100 Hz
±250 pA max Gain = 4 to 128, update rate < 100 Hz
Average Input Current Drift ±2 pA/°C typ
Unbuffered Mode Gain = 1 or 2
Average Input Current ±400 nA/V typ Input current varies with input voltage
Average Input Current Drift ±50 pA/V/°C typ
Normal Mode Rejection
2
Internal Clock
@ 50 Hz, 60 Hz 65 dB min 80 dB typ, 50 ± 1 Hz, 60 ± 1 Hz, FS[3:0] = 1010
@ 50 Hz 80 dB min 90 dB typ, 50 ± 1 Hz, FS[3:0] = 1001
@ 60 Hz 90 dB min 100 dB typ, 60 ± 1 Hz, FS[3:0] = 1000
External Clock
@ 50 Hz, 60 Hz 80 dB min 90 dB typ, 50 ± 1 Hz, 60 ± 1 Hz, FS[3:0] = 1010
@ 50 Hz 94 dB min 100 dB typ, 50 ± 1 Hz, FS[3:0] = 1001
@ 60 Hz 90 dB min 100 dB typ, 60 ± 1 Hz, FS[3:0] = 1000
Common-Mode Rejection
@ DC 100 dB min AIN = 1 V/gain, gain ≥ 4
@ 50 Hz, 60 Hz
@ 50 Hz, 60 Hz
2
2
100 dB min 50 ± 1 Hz, 60 ± 1 Hz, FS[3:0] = 1010
100 dB min
MIN
to T
, unless otherwise noted.
MAX
= REFIN(+) − REFIN(−) or internal reference,
V
REF
gain = 1 to 128
VCM = (AIN(+) + AIN(−))/2, gain = 4 to 128
6
50 ± 1 Hz (FS[3:0] = 1001)
(FS[3:0] = 1000)
6
, 60 ± 1 Hz
6
6
6
6
6
6
6
Rev. 0 | Page 3 of 32
AD7785
Parameter AD7785B1 Unit Test Conditions/Comments
REFERENCE
Internal Reference
Internal Reference Initial Accuracy 1.17 ± 0.01% V min/max AVDD = 4 V, TA = 25°C
Internal Reference Drift
15 ppm/°C max
Power Supply Rejection 85 dB typ
External Reference
External REFIN Voltage 2.5 V nom
Reference Voltage Range
AVDD V max
Absolute REFIN Voltage Limits
AV
Average Reference Input Current 400 nA/V typ
Average Reference Input Current
Drift
Normal Mode Rejection Same as for analog inputs
Common-Mode Rejection 100 dB typ
EXCITATION CURRENT SOURCES
(IEXC1 and IEXC2)
Output Current 10/210/1000 μA nom
Initial Tolerance at 25°C ±5 % typ
Drift 200 ppm/°C typ
Current Matching ±0.5 % typ Matching between IEXC1 and IEXC2; V
Drift Matching 50 ppm/°C typ
Line Regulation (VDD) 2 %/V typ AVDD = 5 V ± 5%
Load Regulation 0.2 %/V typ
Output Compliance
TEMPERATURE SENSOR
Accuracy
Sensitivity
BIAS VOLTAGE GENERATOR
V
AVDD/2 V nom
BIAS
V
Generator Start-Up Time See Figure 10ms/nF typ Dependent on the capacitance on the AIN pin
BIAS
INTERNAL/EXTERNAL CLOCK
Internal Clock
Frequenc y
2
Duty Cycle 50:50 % typ
External Clock
Frequency 64 kHz nom
Duty Cycle 45:55 to 55:45 % typ
LOGIC INPUTS
2
CS
V
, Input Low Voltage 0.8 V max DVDD = 5 V
INL
, Input High Voltage
V
INH
2
4 ppm/°C typ
REFIN = REFIN(+) − REFIN(−)
2
2
0.1 V min
GND − 30 mV
+ 30 mV V max
DD
V min
When V
= AVDD, the differential input must be
REF
limited to 0.9 × V
/gain if the in-amp is active
REF
±0.03 nA/V/°C typ
AVDD − 0.65
AVDD − 1.1
GND − 30 mV
±2
0.81
V max 10 μA or 210 μA currents selected
V max 1 mA currents selected
V min
°C typ
mV/°C typ
Applies if user calibrates the temperature sensor
Applies if user calibrates the temperature sensor
64 ± 3% kHz min/max
A 128 kHz external clock can be used if the
divide-by-2 function is used
(Bit CLK1 = CLK0 = 1)
Applies for external 64 kHz clock; a 128 kHz
clock can have a less stringent duty cycle
0.4
2.0
V max
V min
DV
= 3 V
DD
= 3 V or 5 V
DV
DD
OUT
= 0 V
Rev. 0 | Page 4 of 32
AD7785
Parameter AD7785B1 Unit Test Conditions/Comments
SCLK, CLK, and DIN (Schmitt-
Triggered Input)
2
VT(+) 1.4/2 V min/V max DVDD = 5 V
VT(–) 0.8/1.7 V min/V max DVDD = 5 V
VT(+) − VT(−)
VT(+) 0.9/2 V min/V max DVDD = 3 V
VT(–) 0.4/1.35 V min/V max DVDD = 3 V
VT(+) − VT(−)
Input Currents
Input Capacitance
LOGIC OUTPUTS (INCLUDING CLK)
VOH, Output High Voltage
VOL, Output Low Voltage
VOH, Output High Voltage
VOL, Output Low Voltage
2
2
2
2
Floating-State Leakage Current ±10 μA max
Floating-State Output Capacitance 10 pF typ
Data Output Coding Offset binary
SYSTEM CALIBRATION
2
Full-Scale Calibration Limit +1.05 × FS V max
Zero-Scale Calibration Limit
Input Span 0.8 × FS V min
2.1 × FS V max
POWER REQUIREMENTS
7
Power Supply Voltage
AVDD to GND
DVDD to GND
Power Supply Currents
IDD Current 140 μA max
185 μA max
400 μA max
500 μA max
IDD (Power-Down Mode) 1 μA max
1
Temperature range is –40°C to +105°C.
2
Specification is not production tested, but is supported by characterization data at initial product release.
3
Following a calibration, this error is in the order of the noise for the programmed gain and update rate selected.
4
Recalibration at any temperature removes these errors.
5
Full-scale error applies to both positive and negative full-scale and applies at the factory calibration conditions (AVDD = 4 V, gain = 1, TA = 25°C).
6
FS[3:0] are the four bits used in the mode register to select the output word rate.
7
Digital inputs equal to DVDD or GND with excitation currents and bias voltage generator disabled.
0.1/0.17 V min/V max DVDD = 5 V
0.06/0.13 V min/V max DVDD = 3 V
±10
10
DVDD − 0.6
0.4 V max DVDD = 3 V, I
4 V min DVDD = 5 V, I
0.4 V max
μA max
pF typ
VIN = DVDD or GND
All digital inputs
V min DVDD = 3 V, I
= 5 V, I
DV
DD
= 100 μA
SOURCE
= 100 μA
SINK
= 200 μA
SOURCE
= 1.6 mA (DOUT/RDY)/
SINK
800 μA (CLK)
−1.05 × FS
V min
2.7/5.25 V min/max
2.7/5.25 V min/max
110 μA typ @ AV
= 3 V, 125 μA typ @ AVDD = 5 V,
DD
unbuffered mode, external reference
130 μA typ @ AV
= 3 V, 165 μA typ @ AVDD = 5 V,
DD
buffered mode, gain = 1 or 2, external reference
300 μA typ @ AV
= 3 V, 350 μA typ @ AVDD = 5 V,
DD
gain = 4 to 128, external reference
400 μA typ @ AV
= 3 V, 450 μA typ @ AVDD = 5 V,
DD
gain = 4 to 128, internal reference
Rev. 0 | Page 5 of 32
AD7785
TIMING CHARACTERISTICS
AVDD = 2.7 V to 5.25 V, DVDD = 2.7 V to 5.25 V, GND = 0 V, Input Logic 0 = 0 V, Input Logic 1 = DVDD, unless otherwise noted.
Table 2.
Parameter
1, 2
Limit at T
MIN
, T
(B Version) Unit Conditions/Comments
MAX
t3 100 ns min SCLK high pulse width
t4 100 ns min SCLK low pulse width
Read Operation
t1 0 ns min
CS falling edge to DOUT/RDY active time
60 ns max DVDD = 4.75 V to 5.25 V
80 ns max DVDD = 2.7 V to 3.6 V
3
t
2
0 ns min SCLK active edge to data valid delay
4
60 ns max DVDD = 4.75 V to 5.25 V
80 ns max DVDD = 2.7 V to 3.6 V
5, 6
t
5
10 ns min
Bus relinquish time after
CS inactive edge
80 ns max
t6 0 ns min
t7 10 ns min
SCLK inactive edge to
SCLK inactive edge to DOUT/
CS inactive edge
RDY high
Write Operation
t8 0 ns min
CS falling edge to SCLK active edge setup time
4
t9 30 ns min Data valid to SCLK edge setup time
t10 25 ns min Data valid to SCLK edge hold time
t11 0 ns min
1
Sample tested during initial release to ensure compliance. All input signals are specified with tR = tF = 5 ns (10% to 90% of DVDD) and timed from a voltage level of 1.6 V.
2
See Figure 3 and Figure 4.
3
These numbers are measured with the load circuit shown in Figure 2 and defined as the time required for the output to cross the VOL or VOH limits.
4
SCLK active edge is the falling edge of SCLK.
5
These numbers are derived from the measured time taken by the data output to change 0.5 V when loaded with the circuit shown in Figure 2. The measured number
is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the
true bus relinquish times of the part and, as such, are independent of external bus loading capacitances.
6
RDY
returns high after a read of the ADC. In single conversion mode and continuous conversion mode, the same data can be read again, if required, while
although care should be taken to ensure that subsequent reads do not occur close to the next output update. In continuous read mode, the digital word can be read
only once.
CS rising edge to SCLK edge hold time
RDY
is high,
I
(1.6mA WITH DVDD = 5V,
SINK
100µA WIT H DV
DD
= 3V)
TO
OUTPUT
PIN
50pF
I
SOURCE
100µA WIT H DV
1.6V
(200µA WIT H DVDD = 5V,
= 3V)
DD
6721-002
Figure 2. Load Circuit for Timing Characterization
Rev. 0 | Page 6 of 32
AD7785
S
TIMING DIAGRAMS
CS (I)
t
t
1
DOUT/RDY (O)
SCLK (I)
t
2
NOTES
1. I = INPUT, O = OUTPUT
MSBLSB
t
3
t
4
Figure 3. Read Cycle Timing Diagram
CS (I)
6
t
5
t
7
06721-003
t
11
06721-004
CLK (I)
DIN (I)
NOTES
1. I = INPUT, O = OUTPUT
t
8
t
9
t
10
MSBLSB
Figure 4. Write Cycle Timing Diagram
Rev. 0 | Page 7 of 32
AD7785
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND
DVDD to GND
Analog Input Voltage to GND
Reference Input Voltage to GND
Digital Input Voltage to GND
Digital Output Voltage to GND
AIN/Digital Input Current 10 mA
Operating Temperature Range
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. 0 | Page 8 of 32
AD7785
A
A
A
A
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
SCLK
2
CLK
3
CS
4
IOUT1
5
IN1(+)
IN1(–)
IN2(+)
IN2(–)REFIN(+)/AIN3(+)
(Not to Scale)
6
7
8
Figure 5. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 SCLK
Serial Clock Input. This serial clock input is for data transfers to and from the ADC. The SCLK has a Schmitttriggered input, making the interface suitable for opto-isolated applications. The serial clock can be
continuous with all data transmitted in a continuous train of pulses. Alternatively, it can be a noncontinuous
clock with the information being transmitted to or from the ADC in smaller batches of data.
2 CLK
Clock In/Clock Out. The internal clock can be made available at this pin. Alternatively, the internal clock can
be disabled, and the ADC can be driven by an external clock. This allows several ADCs to be driven from a
common clock, allowing simultaneous conversions to be performed.
3
CSChip Select Input. This is an active low logic input used to select the ADC. CS can be used to select the ADC
in systems with more than one device on the serial bus or as a frame synchronization signal in communicating
with the device. CS can be hardwired low, allowing the ADC to operate in 3-wire mode with SCLK, DIN, and
DOUT used to interface with the device.
4 IOUT1
Output of Internal Excitation Current Source. The internal excitation current source can be made available at
this pin. The excitation current source is programmable so that the current can be 10 μA, 210 μA, or 1 mA.
Either IEXC1 or IEXC2 can be switched to this output.
5 AIN1(+)
6
AIN1(−) Analog Input. AIN1(−) is the negative terminal of the differential analog input pair AIN1(+)/AIN1(−).
7 AIN2(+)
8
AIN2(−) Analog Input. AIN2(−) is the negative terminal of the differential analog input pair AIN2(+)/AIN2(−).
9 REFIN(+)/AIN3(+)
Analog Input. AIN1(+) is the positive terminal of the differential analog input pair AIN1(+)/AIN1(−).
Analog Input. AIN2(+) is the positive terminal of the differential analog input pair AIN2(+)/AIN2(−).
Positive Reference Input/Analog Input. An external reference can be applied between REFIN(+) and
REFIN(−). REFIN(+) can lie anywhere between AV
REFIN(+) − REFIN(−) is 2.5 V, but the part functions with a reference from 0.1 V to AV
pin can function as AIN3(+) where AIN3(+) is the positive terminal of the differential analog input pair
AIN3(+)/AIN3(−).
10
REFIN(−)/AIN3(−)
Negative Reference Input/Analog Input. REFIN(−) is the negative reference input for REFIN. This reference
input can lie anywhere between GND and AV
negative terminal of the differential analog input pair AIN3(+)/AIN3(−).
11 IOUT2
Output of Internal Excitation Current Source. The internal excitation current source can be made available at
this pin. The excitation current source is programmable so that the current can be 10 μA, 210 μA, or 1 mA.
Either IEXC1 or IEXC2 can be switched to this output.
12 GND Ground Reference Point.
13 AVDD Supply Voltage, 2.7 V to 5.25 V.
14 DVDD
Digital Interface Supply Voltage. The logic levels for the serial interface pins are related to this supply, which
is between 2.7 V and 5.25 V. The DV
equal 5 V with DV
at 3 V or vice versa.
DD
16
DIN
15
DOUT/RDY
14
DV
DD
13
AD7785
TOP VIEW
DD
AV
DD
12
GND
11
IOUT2
10
REFIN(–)/ AIN3(–)
9
06721-005
and GND + 0.1 V. The nominal reference voltage
DD
. Alternatively, this
DD
− 0.1 V. This pin also functions as AIN3(−), which is the
DD
voltage is independent of the voltage on AVDD; therefore, AVDD can
Rev. 0 | Page 9 of 32
AD7785
Pin No. Mnemonic Description
15
16 DIN
RDYSerial Data Output/Data Ready Output. DOUT/RDY serves a dual purpose. It functions as a serial data output
DOUT/
pin to access the output shift register of the ADC. The output shift register can contain data from any of the
on-chip data or control registers. In addition, DOUT/
the completion of a conversion. If the data is not read after the conversion, the pin goes high before the
next update occurs.
The DOUT/
With an external serial clock, the data can be read using the DOUT/RDY pin. With CS low, the data/control
word information is placed on the DOUT/
rising edge.
Serial Data Input. This serial data input is to the input shift register on the ADC. Data in this shift register is
transferred to the control registers within the ADC; the register selection bits of the communications
register identify the appropriate register.
RDY operates as a data ready pin, going low to indicate
RDY falling edge can be used as an interrupt to a processor, indicating that valid data is available.
RDY pin on the SCLK falling edge and is valid on the SCLK
Rev. 0 | Page 10 of 32
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