Analog Devices AD7575 Datasheet

LC2MOS
TRACK
AND
HOLD
CLOCK
OSCILLATOR
DAC
SAR
COMP
CONTROL
LOGIC
LATCH AND
THREE STATE
OUTPUT DRIVERS
AD7575
V
DD
AIN
AGND
V
REF
CLK
CS RD
TP
BUSY
DGND
DB7
DB0
a
FEATURES Fast Conversion Time: 5 ␮s On-Chip Track/Hold Low Total Unadjusted Error: 1 LSB Full Power Signal Bandwidth: 50 kHz Single +5 V Supply 100 ns Data Access Time Low Power (15 mW typ) Low Cost Standard 18-Lead DlPs or 20-Terminal
Surface Mount Packages
GENERAL DESCRIPTION
The AD7575 is a high speed 8-bit ADC with a built-in track/ hold function. The successive approximation conversion tech-
nique is used to achieve a fast conversion time of 5 µs, while the built-in track/hold allows full-scale signals up to 50 kHz (386 mV/µs
slew rate) to be digitized. The AD7575 requires only a single +5 V supply and a low cost, 1.23 V bandgap reference in order to convert an input signal range of 0 to 2 V
The AD7575 is designed for easy interfacing to all popular 8-bit microprocessors using standard microprocessor control signals (
CS and RD) to control starting of the conversion and reading of the data. The interface logic allows the AD7575 to be easily configured as a memory mapped device, and the part can be interfaced as SLOW-MEMORY or ROM. All data outputs of the AD7575 are latched and three-state buffered to allow direct connection to a microprocessor data bus or I/O port.
The AD7575 is fabricated in an advanced, all ion-implanted high speed Linear Compatible CMOS (LC available in a small, 0.3" wide, 18-lead DIP, 18-lead SOIC or in other 20-terminal surface mount packages.
REF
.
2
MOS) process and is
5 s 8-Bit ADC with Track/Hold
AD7575
FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. Fast Conversion Time/Low Power
The fast, 5 µs, conversion time of the AD7575 makes it
suitable for digitizing wideband signals at audio and ultra­sonic frequencies while retaining the advantage of low CMOS power consumption.
2. On-Chip Track/Hold The on-chip track/hold function is completely self-contained and requires no external hold capacitor. Signals with slew
rates up to 386 mV/µs (e.g., 2.46 V peak-to-peak 50 kHz sine
waves) can be digitized with full accuracy.
3. Low Total Unadjusted Error The zero, full-scale and linearity errors of the AD7575 are so low that the total unadjusted error at any point on the trans­fer function is less than 1 LSB, and offset and gain adjust­ments are not required.
4. Single Supply Operation Operation from a single +5 V supply with a low cost +1.23 V bandgap reference allows the AD7575 to be used in 5 V microprocessor systems without any additional power supplies.
5. Fast Digital Interface Fast interface timing allows the AD7575 to interface easily to the fast versions of most popular microprocessors such as the Z80H, 8085A-2, 6502B, 68B09 and the DSP processor, the TMS32010.
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1998
AD7575–SPECIFICATIONS
(VDD = +5 V, V all specifications T
= +1.23 V, AGND = DGND = 0 V; f
REF
to T
MIN
unless otherwise noted)
MAX
= 4 MHz external;
CLK
Parameter J, A Versions1K, B Versions S Version T Version Units Conditions/Comments
ACCURACY
Resolution 8 8 8 8 Bits
Total Unadjusted Error ±2 ±1 ±2 ±1 LSB max Relative Accuracy ±1 ±1/2 ±1 ±1/2 LSB max
Minimum Resolution for Which
No Missing Codes Is Guaranteed 8 8 8 8 Bits max
Full-Scale Error
+25°C ±1 ±1 ±1 ±1 LSB max Full-Scale TC Is Typically 5 ppm/°C
T
to T
MIN
Offset Error
MAX
2
±1 ±1 ±1 ±1 LSB max
+25°C ±1/2 ±1/2 ±1/2 ±1/2 LSB max Offset TC Is Typically 5 ppm/°C
T
MIN
to T
MAX
±1/2 ±1/2 ±1/2 ±1/2 LSB max
ANALOG INPUT
Voltage Range 0 to 2 V
REF
0 to 2 V
REF
0 to 2 V
REF
0 to 2 V
Volts 1 LSB = 2 V
REF
/256; See Figure 16
REF
DC Input Impedance 10 10 10 10 M min Slew Rate, Tracking 0.386 0.386 0.386 0.386 V/µs max
3
SNR
45 45 45 45 dB min VIN = 2.46 V p-p @ 10 kHz; See Figure 11
REFERENCE INPUT
V
(For Specified Performance) 1.23 1.23 1.23 1.23 Volts ±5%
REF
I
REF
500 500 500 500 µA max
LOGIC INPUTS
CS, RD
V
, Input Low Voltage 0.8 0.8 0.8 0.8 V max
INL
V
, Input High Voltage 2.4 2.4 2.4 2.4 V min
INH
IIN, Input Current
+25°C ±1 ±1 ±1 ±1 µA max V
T
to T
MIN
MAX
CIN, Input Capacitance
3
±10 ±10 ±10 ±10 µA max V
10 10 10 10 pF max
= 0 or V
IN
= 0 or V
IN
DD
DD
CLK
V
, Input Low Voltage 0.8 0.8 0.8 0.8 V max
lNL
V
, Input High Voltage 2.4 2.4 2.4 2.4 V min
INH
I
, Input Low Current 700 700 800 800 µA max V
INL
I
, Input High Current 700 700 800 800 µA max V
INH
INL
INH
= 0 V
= V
DD
LOGIC OUTPUTS
BUSY, DB0 to DB7
VOL, Output Low Voltage 0.4 0.4 0.4 0.4 V max I VOH, Output High Voltage 4.0 4.0 4.0 4.0 V min I
= 1.6 mA
SINK
SOURCE
= 40 µA
DB0 to DB7
Floating State Leakage Current ±1 ±1 ±10 ±10 µA max V
OUT
= 0 to V
DD
Floating State Output Capacitance310 10 10 10 pF max
CONVERSION TIME
With External Clock 5 5 5 5 µsf
With Internal Clock, T
4
= 4 MHz
= +25°C5 5 5 5 µs min Using Recommended Clock
A
CLK
15 15 15 15 µs max Components Shown in Figure 15
POWER REQUIREMENTS
V
DD
I
DD
5
+5 +5 +5 +5 Volts ±5% for Specified Performance
6 6 7 7 mA max Typically 3 mA with VDD = +5 V
Power Dissipation 15 15 15 15 mW typ
Power Supply Rejection ±1/4 ±1/4 ±1/4 ±1/4 LSB max 4.75 V ≤ VDD 5.25 V
NOTES
1
Temperature ranges are as follows:
J, K Versions; 0°C to +70°C A, B Versions; –25°C to +85°C S, T Versions; –55°C to +125°C
2
Offset error is measured with respect to an ideal first code transition that occurs at 1/2 LSB.
3
Sample tested at +25°C to ensure compliance.
4
Accuracy may degrade at conversion times other than those specified.
5
Power supply current is measured when AD7575 is inactive i.e., when CS = RD = BUSY = logic HIGH.
Specifications subject to change without notice.
–2–
REV. B
AD7575
WARNING!
ESD SENSITIVE DEVICE
DGND
3kV 10pF
DBN
TIMING SPECIFICATIONS
Limit at +25C Limit at T
1
(VDD = +5 V, V
MIN
= +1.23 V, AGND = DGND = 0 V)
REF
, T
MAX
Limit at T
MIN
, T
MAX
Parameter (All Versions) (J, K, A, B Versions) (S, T Versions) Units Conditions/Comments
t
1
t
2
2
t
3
t
4
t
5
2
t
6
3
t
7
0 0 0 ns min CS to RD Setup Time 100 100 120 ns max RD to BUSY Propagation Delay 100 100 120 ns max Data Access Time after RD 100 100 120 ns min RD Pulse Width 0 0 0 ns min CS to RD Hold Time 80 80 100 ns max Data Access Time after BUSY 10 10 10 ns min Data Hold Time 80 80 100 ns max
t
8
NOTES
1
Timing specifications are sample tested at +25°C to ensure compliance. All input control signals are specified with tr = tf = 20 ns (10% to 90% of +5 V) and timed from a voltage level of 1.6 V.
2
t3 and t6 are measured with the load circuits of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
3
t7 is defined as the time required for the data lines to change 0.5 V when loaded with the circuits of Figure 2.
Specifications subject to change without notice.
0 0 0 ns min BUSY to CS Delay
Test Circuits
+5V
3kV
DBN
10pF
DGND
DBN
3kV 100pF
DGND
+5V
3kV
DBN
100pF
DGND
a. High-Z to V
OH
b High-Z to V
OL
a. VOH to High-Z b. VOL to High-Z
Figure 1. Load Circuits for Data Access Time Test Figure 2. Load Circuits for Data Hold Time Test
ABSOLUTE MAXIMUM RATINGS*
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V
V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V
DD
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
DD
Digital Input Voltage to DGND . . . . . . . –0.3 V, VDD + 0.3 V
Digital Output Voltage to DGND . . . . . . –0.3 V, V
CLK Input Voltage to DGND . . . . . . . . . –0.3 V, V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
V
REF
AIN to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
+ 0.3 V
DD
+ 0.3 V
DD
DD
DD
Operating Temperature Range
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . . 6 mW/°C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Commercial (J, K Versions) . . . . . . . . . . . . . . 0°C to +70°C
Industrial (A, B Versions) . . . . . . . . . . . . . –25°C to +85°C
Extended (S, T Versions) . . . . . . . . . . . . . –55°C to +125°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7575 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
REV. B
–3–
AD7575
PIN CONFIGURATIONS
LCCC
CS
RD
BUSY
CLK
DB7 (MSB)
DB6 DB5
DGND
TP
1
2
3
4
AD7575
5
TOP VIEW
(Not to Scale)
6
7
8
9
18
V
17
V
16
AIN
15
AGND
14
DB0 (LSB)
13
DB1
12
DB2
11
DB3
10
DB4
DD
REF
BUSY
CLK
DB7 (MSB)
DB6 DB5
NC = NO CONNECT
3
4 5 6
(Not to Scale)
7 8
9 10111213
TPRDCS
2
AD7575
TOP VIEW
DGND
ORDERING GUIDE
Relative Temperature Accuracy Package Range (LSB) Options
2
Model
1
AD7575JR 0°C to +70°C ±1 max R-18 AD7575JN 0°C to +70°C ±1 max N-18 AD7575KN 0°C to +70°C ±1/2 max N-18 AD7575JP 0°C to +70°C ±1 max P-20A AD7575KP 0°C to +70°C ±1/2 max P-20A AD7575AQ –25°C to +85°C ±1 max Q-18 AD7575BQ –25°C to +85°C ±1/2 max Q-18 AD7575SQ –55°C to +125°C ±1 max Q-18 AD7575TQ –55°C to +125°C ±1/2 max Q-18 AD7575SE –55°C to +125°C ±1 max E-20A AD7575TE –55°C to +125°C ±1/2 max E-20A
NOTES
1
To order MIL-STD-883, Class B process parts, add /883B to part number. Contact local sales office for military data sheet. For U.S. Standard Military Drawing (SMD), see DESC drawing #5962-87762.
2
E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip, R = SOIC.
PLCCDIP/SOIC
NC
NC
20 191
VDDV
DB4
REF
DB3
18
AIN AGND
17 16
DB0 (LSB)
15
DB1
14
DB2
4
TP
5
BUSY
6
CLK
DB6
7 8
DB7 (MSB)
NC = NO CONNECT
RDCSNC
3 2 1 20 19
AD7575
TOP VIEW
(Not to Scale)
9 10 11 12 13
DB5
DGND
VDDV
PIN 1 IDENTIFIER
NC
DB4
REF
DB3
18
AIN
17
AGND
16
DB0 (LSB)
15
DB1
14
DB2
TERMINOLOGY LEAST SIGNIFICANT BIT (LSB)
An ADC with 8-bits resolution can resolve 1 part in 28 (i.e.,
256) of full scale. For the AD7575 with +2.46 V full-scale one LSB is 9.61 mV.
TOTAL UNADJUSTED ERROR
This is a comprehensive specification that includes full-scale error, relative accuracy and offset error.
RELATIVE ACCURACY
Relative Accuracy is the deviation of the ADC’s actual code transition points from a straight line drawn between the devices measured first LSB transition point and the measured full-scale transition point.
SNR
Signal-to-Noise Ratio (SNR) is the ratio of the desired signal to the noise produced in the sampled and digitized analog signal. SNR is dependent on the number of quantization levels used in the digitization process; the more levels, the smaller the quantiza­tion noise. The theoretical SNR for a sine wave input is given by
SNR = (6.02 N + 1.76) dB
where N is the number of bits in the ADC.
FULL-SCALE ERROR (GAIN ERROR)
The gain of a unipolar ADC is defined as the difference between the analog input levels required to produce the first and the last digital output code transitions. Gain error is a measure of the deviation of the actual span from the ideal span of FS – 2 LSBs.
ANALOG INPUT RANGE
With V
= +1.23 V, the maximum analog input voltage range
REF
is 0 V to +2.46 V. The output data in LSBs is related to the analog input voltage by the integer value of the following expression:
Data (LSBs) =
256 AIN 2 V
REF
+ 0.5
SLEW RATE
Slew Rate is the maximum allowable rate of change of input signal such that the digital sample values are not in error. Slew Rate limitations may restrict the analog signal bandwidth for full-scale analog signals below the bandwidth allowed from sampling theorem considerations.
–4–
REV. B
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