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Today’s high volume manufacturing requires optimization
of test system throughput, to
maximize production volume
without increasing floorspace.
The N3300A Series electronic
loads can help you in a number
of ways to achieve this goal.
Reduced command processing time:
Commands are processed more
than 10 times faster than previous electronic loads.
Automatically execute stored
command sequences: “Lists”
of downloaded command
sequences can execute independent of the computer, greatly
reducing the electronic load
command processing time
and computer interaction
time during product testing.
Programmable delay allows for
either simultaneous or sequential
load changes: This is the most
efficient way to conduct testing
of multiple output dc power
supplies, simulating real-life
loading patterns, with a
minimum of programming
commands.
Buffer measurement data: Voltage,
current, and power measurements can be buffered for later
readback to the computer,
reducing computer interaction.
Control measurement speed vs.
accuracy: Decrease the number
of measurement samples to
achieve greater measurement
speed, or increase the number
of samples to achieve higher
measurement accuracy. You
can optimize your measurements for each test.
Control rising and falling slew
rates separately: Reduce rate of
loading change when necessary
for DUT stability or to simulate
real life conditions, but otherwise change load values at
maximum rate.
Increase System
Flexibility…for both
present and future
requirements
Most power supply and battery
charger test systems designed
today need to test a variety of
products and/or assemblies. In
the future, additional products
or assemblies may be needed.
A flexible family of electronic
loads makes present system
design and future growth
much easier.
Test low voltage power supplies:
The N3300A series electronic
loads operate with full stability
down to zero volts. Many other
electronic loads available today
have been found to become
unstable in the operating region
below one volt. When designing
power supply test platforms,
the trend towards lower voltage
requirements should be taken
into account. Refer to the
specification and supplemental
characteristic tables for details
of lower voltage operating
characteristics.
Choose dc load connection method:
Automatic test systems need
consistency and reliability.
Option UJ1 8 mm screw
connectors provide a simple
screw onto which your wires,
terminated with insulated ring
terminals, may be securely
mounted. This optional connector is specifically designed for
test systems. Wires may exit the
plastic cover in any direction,
and multiple wires may be
placed on each screw terminal
for easy parallel load connections. Up to AWG 4 wire may
be used.
Applications which require
repeated connections/disconections are better suited to the
standard connector. The standard connector accepts an
unterminated wire, and may be
hand-tightened. This connector
is specifically designed for
bench applications and shortterm automated tests.
Design a system to test a variety of
products: This series consists of
2 mainframes and 6 modules.
The N3300A mainframe is
full rack width. It has 6 slots.
The N3301A mainframe is half
rack width. It has 2 slots. Any
assortment of the 6 different
modules can be configured
into these mainframes, up to
the slot capacity. The N3302A
(150 watts), N3303A (250 watts),
N3307A (250 Watts) and
N3304A (300 watts) each
Standard dc Option UJ1 8 mm
connectors screw connectors
Increase Test Throughput