Agilent 8921A User Manual

HP 8921A Cell Site Test Set

User’s Guide

Firmware Version A.15.00 and above

POWE

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MAX POWER

SCREEN CONT ROL

CONFIHELPMSSG HOLD PRINT
DUPLETXRX PREV TESTS

USER

DATA FUNCTIONS

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INCR

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MAX POWER 200

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k1

k2’
k2
k3’
k3

k4

k5

MIC/

HP Part No. 08921-90022

Printed in U. S. A.

December 1997

Rev. F

INSTRUMENT STATE

ADRS

SAVE

LOCAL

RECAL

DATA

789
456

123

+

0

YES

NO

ON/OFF

AUDIO SQUELCVOL-

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AUDIO IN

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1

Copyright © Hewlett-Packard Company 1995

Notice Information containe d in this document is subject to change without notice.

All Rights Reserved. Repr oduction, adaptation, or translation without prior written
permission is prohibi ted, except as allowed under the copyright laws.

This material may be reproduced by or for the U.S. Governme nt pursuant to the
Copyright License under the clause at DFARS 52.227-7013 (APR 1988).

Hewl ett-Pack ar d Co mpany
Learning Products Depa rtment
24001 E. Mission
Liberty Lake, WA 99019-9599
U.S.A.

2

Manufacturer’s Declaration

This statement is provided to comply with the require ments of the German Sound
Emission Directive, from 18 January 1991.

This product has a sound pressure emission (at the operator position) < 70 dB(A).

• Sound Pressure Lp < 70 dB(A).

• At Operator Position.

• Normal Operation.

• According to ISO 7779:1988/EN 27779:1991 (Type Test).

Herstellerbescheinigung

Diese Information steht im Zusammenhang mit den Anforderungen der

Maschinenlärminf ormat ionsverordnung vom 18 Januar 1991.

• Schalldruckpegel Lp < 70 dB(A).

• Am Arbeitsplatz.

• Normaler Bet r ieb.

• Nach ISO 7779:1988/EN 27779:1991 (Typprüfung).

3

Safety
Considerations

GENERAL
This product and related documentation must be reviewed for familiarization with

safety markings and instr uct ions before operation.
This product has been designed and tested in accordance with IEC Publication

1010, "Safety Requirements for Electronic Measuring Apparatus," and has been
supplied in a safe condition. This instruction documentation cont ains information
and warnings which must be followed by the user to ensure safe ope ration and to
maintain the product in a safe condition.

SAFETY EARTH GROUND
A uninterruptible safety earth ground must be provided from the main power

source to the product input wiring te r minals, power cord, or supplied power cord
set.

CHASSIS GROUND TERMINAL
To prevent a potential shock hazard, always connect the rear-panel chassis ground

terminal to earth ground when operating this instrument from a dc power source.
SAFETY SYMBOLS
Indicates i nstrument damage can occur if indicated operating limits are exceeded.

!

Refer to the instructi ons in this guide.
Indicates hazardous voltages.
Indicates earth (ground) terminal

WARNING

A WARNING note denotes a hazard. It calls attention to a procedure,
practice, or the like, which, if not correctly performed or adhered to, could
result in personal injury. Do not proceed beyond a WARNING sign until the
indicated conditions are fully understood and met.

CAUTION

A CAUTION note denotes a hazard. It calls attention to an operation procedure,
practice, or the like, which, if not correctly performed or adhered to, could result
in damage to or destruction of part or all of the product. Do not proceed beyond
an CAUTION note until the indicated conditi ons are fully underst ood and met.

4

Safety Considerations for this Ins tr ument

WARNING This product is a Safety Class I instrument (provided with a protective

earthing ground incorporated in the power cord). The mains plug shall only
be ins erte d in a so ck et ou tlet pr ovid ed w ith a pro tec tive ear th cont act. An y
interruption of the protective conductor i nside or outside of the product is
likely to make the product dangerous. Intentional interruption is
prohibited..

Whenever it is likely that the protection has been impaired, the instrument
must be made inoperative and be secured against any unintended operation.

If this instrument is to be energized via an autotransformer (for voltage
reduction), make sure the common terminal is connected to the earth
termin a l o f the power source.

If this product is not used as specified, the protection provided by the
equipment could be impaired. This product must be used in a normal
condition (in which all means for protection are intact) only.

No operator serviceable parts in this product. Refer servicing to qualified
personnel. To prevent electrical shock, do not remove covers.

Servicing instructions are for use by qualified personnel only. To avoid
electrical shock, do not perform any servicing unless you are qu alified to do
so.

The opening of covers or removal of parts is likely to expose dangerous
voltages. Disconnect the product from all voltage sources while it is being
opened.

Adjustments described in the manual are performed with power supplied to
the instrument while protective covers are removed. Energy available at
many points may, if contacted, result in personal injury.

The power cord is con nected to internal capacitors that my remain l iv e for
5 seconds after disconnecting the plug from its power supply.

For Continued protection against fire hazard, replace the line fuse(s) only
with 250 V fuse(s) or the same current rating and type (for example, normal
blow or time delay). Do not use repaired fuses or short circuited
fuseholders.

5

CAUTION: Always use the three-prong ac power cord supplied with this product. Failure to ensure

adequate earth grounding by not using this cord may cause product damage.

This product is designed for use in Installation Category II and Pollution Degree
2 per IEC 1010 and IEC 664 respectively. For indoor use only.

This product has autoranging line voltage input, be sure the supply voltage is
within the specified range.

Ventilation Requirements: When installing the product in a cabinet, the
convection into and out of the product must not be restricted. The ambient
temperature (outside the cabinet) must be less than the maximum operating

temperature of the product by 4° C for every 100 watts dissipated in the cabinet.
If the tot al po we r d iss ipa te d in the cab ine t i s gr eate r th a n 80 0 w att s, the n fo rce d
convection must be used.

Product Markings CE - the CE mark is a registered trademark of the European Community. A CE

mark accompanied by a year indicated the year the design was proven.
CSA - the CSA mark is a registered trademark of the Canadian Standards Associ-

ation.

6

CERTIFICATION Hewlett-Packard Company certifies that this produc t met its published specifica -

tions at the time of shipment from the factory. Hewlett-Packard further certifies
that its calibration mea surements are traceable to the United State s National In-

stitute of Standards and Tech nology, to the extent allowed by the Institute’s cali­bration facility, and to the calibration facilities of other International Standards
Organization members

WARRANTY This Hewlett-Packar d instrument product is warra nted against defects in material

and workmanship for a period of one year from date of shipment. Duri ng the war­ranty period, Hewlett-Packard Company will at its option, either repair or replace
products which prove to be defective.

For warranty service or repa ir , this product must be returned to a service facility
designated by HP. Buyer shall prepay shipping charges to HP and HP shall pay
shipping charge s, duti es, a nd taxes for p roduct s retur ned to HP f rom anot her coun­try.

HP warrants that its software and firmware designated by HP for use with an in­strument will execute its pro gramming instructions when properly insta lled on that
instrument. HP does not warrant that the operation of the instrument, or software,
or firmware will be uninterrupted or error free.

LIMITATIO N O F
WARRANTY

EXCLUSIVE
REMEDIES

The foregoing warran ty shall not apply to defec ts re sulting from improper or inad­equate maintenance by Buyer, Buyer-supplied software or interfacing, unautho­rized modific ation or misuse, ope ration outside o f the environmental specifications
for the product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLI ED. HP SPECIFICALLY
DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND
FITNESS FOR A PARTICULAR PURPOSE.

THE REMEDIES PROVIDED HEREIN ARE BUYER’S SOLE AND EXCLU­SIVE REMEDIES. HP SHALL NOT BE LIABLE FOR ANY DIRECT, INDI­RECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES,
WHETHER BASE ON CONTRACT, TORT, OR ANY OTHER LEGAL T HEO­RY.

ASSISTANCE Product maintenance agreements and other customer assistance agreements are

available for Hewl ett-Packard produc ts. For any as sistance, con tact your nearest
Hewlett-Packard Sales and Se rvice Office.

7

DECLARATION OF CONFORMITY

according to ISO/IEC Guide 22 and EN 45014

Manufacturer’s Name:

Hewlett-Packard Co.

Manuf acturer’s Address:

Spokane Division
24001 E. Mission Avenue
Liberty Lake, Washington 99019-95 99
USA

declares that the product

Product Name:
Model Number:
Product Options:

RF Communications Test Set / Cell Site Test Set
HP 8920A, HP 8920B, and HP 8921A
This declaration covers all options of the above

product.

conforms to the following Product specifications:

Safety: IEC 348:1978 / HD 401S1:1981

1)

EMC: CISPR 11:1990 / EN 55011:1991 Group 1, Class A

EN 50082-1 : 1992
IEC 801-2:1991 - 4 kV CD, 8 kV AD
IEC 801-3:1984 - 3V/m
IEC 801-4:1988 - 0.5 kV Sig. Lines, 1 kV Power Lines

Supplementary Information:

This product herewith complies with the requirements of the Low Voltage Directive
73/23/EEC and the EMC Directive 89/336/EEC and carries the CD-marking accordingly

1) The product was introduced prior to 12/1993
Spokane, Washington USA Date

European Contact: Your local Hewlett-Packard Sales and Service Office or Hewlett-Packard GmbH
Department ZQ/Standards Europe, Herrenberger Strasse 130, D-71034 Böblinger, Germany (FAX[phone])

8

October 17, 1996 Vince Roland/Quality Manager

.

HP 8924C Support
Contacts

The documentation supplied with your test set is an excellent source of reference,
applications, and service information. Please use these manuals if you are experi­encing technical proble ms:

• Applications inform ation is incl uded in the HP 8924C CDMA Mobil e Station Tes t Set
Application Guide (HP P/N 08924-90021)

• Calibration and repa ir informa tion are in the HP 8924C CDMA Mobile Station T est Set
Assembly Level Repair Manual - this ma nual (HP P/N 08924-90001).

If you have used the manuals and still have applica tion questions, contact your lo­cal HP Sales Re pr esen tat i ve.

Repair assistance is available for the HP 8924C CDMA Mobile Test Set from the factory
by phone and e-mail. Internal Hewlett-Packard users can contact the factory through
HPDesk or cc:Mail© (Lotus Corpora tion). Parts information is also available from
Hewlett-Packard.

When calling or writing for repair assistance, please have the following information
ready:

• Instrument model numbe r (HP 8924C)

• Instrument Serial Number (tag located on the rear panel).

• Installed opt ions - if any (tag located on the re ar panel).

• Instrument f irmware revision (displayed at the top of the scr een when the Test Set is
powered up, and is also dis played on the CONFIGURE screen).

Support Telephone

Numbers:

1 800 827 3848 (Spokane Division Service Assistanc e, U.S. only)
1 509 921 3848 (Spokane Division Service Assistanc e, International)
1 800 227 8164 (HP Direct Parts Ordering, U.S. only)
1 916 783 0804 (HP Service Part s Identification , U.S. & Intl.)

Electronic mail (Internet): Spoka [e-mail]
HP Desk: Spokane Service / HP1000/21
cc:Mail: SERVICE, SPOKANE /HP-Spokane,desk1

9

Table 1 Regional Sales and Service Offices

United States of America
U.S. Instrument Support Center
For Test & Measurement Equipm ent
Repair & Calibration.
Hewlett-Packard Company
Englewood, Colorado 80112

Telephone: [phone]
Fax: [phone]

South Eastern Europe
Sales and Service
Hewlett-Packard Ges. m.b.h.
Liebigasse 1
P.O. Box 72
A-1222 Vienna, Austria

Telephone: [phone]
Telex: 13 4425

Asia
Sales and Service
Hewlett-Packard Asia Ltd.
22-30/F Peregrine Tower
Lippo Center
89 Queensway, Central
Hong Kong
G.P.O. Box 863 Hong Kong

United States of America
Customer Information Center
For Assistance On All HP Prod­ucts.
Hewl ett-Pack ar d Co mpany
Tel: [phone]

6:00 am to 5:00 pm Pacific Time
Parts Direct: 1-800-227-8164

European Multicountry Region
Sales and Service
Hewl et t- P a ck ar d S.A .
P.O. Box 95
150, Route dv Nant_dl_AVRIL
CH-1217 Meyrin 2
Geneva, Switzerland

Telephone: [phone]
Fax: [phone]

Japan
Sales and Service
Yokogawa-Hewlett-Packard Ltd.
3-29-21, Takaido- Higashi
Suginami-Ku, Tokyo 168

Telephone: [phone]
Fax: [phone]

United Kingdom
Sales and Service
Hewl et t- Packard Lt d .
Cain Road
Amen Co r n er
Bracknell, Berkshire
RG12 1HN
United Kingdom

Telephone: [phone]
Fax: [phone]

Northern Europe
Sales and Service
Hewlett-Packard Nederland B.V.
Startbaan 16
1187 XR
Amstelveen, Th e Netherlands
P.O. Box 667

Telephone: [phone] X 6631
Fax: [phone]NL

International Sales Branch Head­quarters
Sales and Service
Hewl ett-Pack a r d S .A .
39 Rue Veyrot
P.O. Box 365
1217 Meyrin 1
Geneva, Switzerland

Telephone: [phone]
Fax: [phone]

Australia, New Zealand
Sales and Service
Hewlett-Packard Ltd.
P.O. Box 221
31-41 Joseph Street
Blackburn, Victoria 3130

Telephone: [phone]
Fax: [phone]

Canada
Sales and Service
Hewl et t- Packard (Canada) Lt d.
5150 Spectrum Way
Mississau ga, On tario L4 W 5G1
Canada

Telephone: [phone]
Fax: [phone]

Telephone: [phone]
Fax: [phone]

Canada
Service Center
Hewl et t- P a ck a r d C ompany
17500 Transcanada Highway
S. Se rv Road
Kirkland, Quebec H9J 2X8
Canada

Telephone: [phone]

10

Table 1 Regional Sales and Service Offices (Continued)

Canada
Service Center
Hewlett-Packard Ltd.
11120 178 Street
Edmonton, Alberta T5S 1P2
Canada

Telephone: [phone]
Fax: [phone]

Latin America
Hewl ett-Pack ar d Co mpany
LAHQ Mexico City
Col. Lomas de Virreyes
11000 Mexico D.F.
Mexico

Telephone: [phone]
Fax: [phone]

United Kingdom
Sales and Service
Hewl et t- Packard Lt d .
Cain Road
Amen Co r n er
Bracknell, Berkshire
RG12 1HN
United Kingdom

Telephone: [phone]
Fax: [phone]

11

In this Book The HP 8921A is referred to in this document as "Test Set."

Chapter 1, Get Started

This chapter descri bes the basic operation of the Test Set. It also provides a quick
check th at verif i es that the Test Set is o p erating properly.

Chapter 2, Configuring Your Test Set

This chapter descri bes v arious in strum ent co nfigurat ion setting s tha t affect t he general
operation of the instrument.

Chapter 3, Operating Over view

This chapter contain s detaile d operat ing in structi ons and e xamples for using sever al
instrument features.

Chapters 4 through 23, Screen and Field Descriptions

These chapters contains reference information for each screen and it s fields. Many of

the descriptions cont ain signa l flow diagra ms that rel ate the scree n’s fields to the func­tions they perf orm. The sc reens are arra nged in a lphabe tica l order by t itle at the top of
the screen; Signaling Encoder and Signaling Decoder are alphabetized by the names
Encoder and Decoder.

Chapter 24, Connector, Key, an d Knob Descri p t ion s

This chapter describes the purpose and use of each connector and control.

Chapter 25, Modifications, Accessories, Manuals, Support

This chapter describes retrofit kits, accessories, manuals, and customer support avail­able for your Test Set.

Error Messages

This section discusses error and operating me s sages.

12

Contents

1 Get Started

Before Connecting a Radio 40

Accessing the Test Set’s Screens 41

Changing A Field’s Setting 43

How do I Verify that the Test Set is Operating Properly? 46

Instrument Functional Diagram 47

13

Contents

2 Configuring Yo ur Te s t Set

General Operating Infor mation 50

14

Contents

3 Operating Overview

Interaction Between Screens 54

Displaying Measurement s 57

Entering and Changing Numbers 63

Printing A Screen 66

Using Measurement Limit Indic ato rs 67

Averaging Measurements 69

Setting A Measurement Reference 70

Saving and Recalling Instrument Setups 71

Using USER Keys 75

Setting an RF Generator/Analyzer Offset 79

Using Remote Control 80

15

Contents

4 Adjacent Channel Power Screen

How the Test Set Measures Adjacent Channel Power (ACP) 86

Field Descriptions 87

16

Contents

5 AF Analyzer Screen

Block Diagram 96

17

Contents

6 Call Processing Subsyste m

Description of the Call Processing Subsystem 110

Using the Call Processing Subsystem 114

The CALL CONTROL Screen 118

Using the CALL CONTROL Screen to Test Call Processing
Functions 129

CALL DATA Screen 139

CALL DATA Screen Message Field Descriptions 144

Using the CALL DATA Screen 153

CALL BIT Screen 161

CALL BIT Screen Message Field Descriptions 167

Using the CA LL BI T Scree n 187

ANALOG MEAS Screen 192

Using the ANALOG MEAS Screen 195

CALL CONFIGURE Screen 19 8

18

Contents

7 Configure Screen

Field Descriptions 202

19

Contents

8 Signaling Decoder Screen

Field Descriptions f or Decod er Modes 216

AMPS-TACS, NAMPS-NTACS Decoder 217

Using the AMPS/TACS, NAMPS/NTACS Decoder 222

Continuous Digital Controlled Squelch System Decoder 226

Using the CDCSS Decoder 230

Digital Paging Decoder 231

Dual-Tone Multi-Freq uency (DTMF) Decoder 235

Using the DTMF Decoder 240

EDACS Decoder 241

Using the EDACS Decoder 244

Function Generator Decode r 247

Using the Function Generator Decoder 250

LTR Decoder 251

Using the LTR Decoder 255

MPT 1327 Decoder 257

NMT Decoder 262

Using the NMT Decoder/Encoder 267

Creating NMT Tests 272

Tone Sequence Decoder 281

20

Contents

9 Duplex Test Sc ree n

Block Diagram 286

Field Descriptions 287

21

Contents

10 Signaling Encoder (AF Generator 2)

Field Descriptions f or Encoder Modes 300

AMPS-TACS NAMPS-NTACS Encoder 301

Using the AMPS-TACS, NAMPS-NTACS Encoder 313

CDCSS Encoder 314

Using the CDCSS Encoder 318

Digital Paging Encoder 319

DTMF Sequence Encoder 324

EDACS Encoder 328

Using the EDACS Encoder 334

Function Generator Encod er 339

LTR Encoder 342

Using the LTR Encoder 346

MPT 1327 Encoder 350

Using the MPT 1327 Encoder 363

Nordic Mobile Telephone (NMT) Encoder 366

Tone Sequence Encoder 378

22

Contents

11 Help Screen

Field Descriptions 382

23

Contents

12 I/O Configure Screen

Field Descriptions 384

24

Contents

13 Message Screen

Field Descriptions 390

25

Contents

14 Oscilloscope Screen

Field Descriptions 392

Using the Oscilloscope 398

26

Contents

15 Print Configure Screen

Field Descriptions 400

27

Contents

16 Radio Interface Screen

Radio Interface Functional Description 404

Field Descriptions 406

Using the Rad io Int erfa ce (Manual Ope ration) 409

Using The Radio Interface (Remot e Operation) 415

28

Contents

17 RF Analyzer Screen

Block Diagram 418

Field Descriptions 419

29

Contents

18 RF Generator Screen

Block Diagram 430

Field Descriptions 431

30

Contents

19 RX Test Screen

Block Diagram 440

Field Descriptions 441

31

Contents

20 Service Screen

Field Descriptions 448

32

Contents

21 Spectrum Analyzer Screen

Field Descriptions 452

Using the Spectrum Analyzer 464

33

Contents

22 Tests Screen

Description of the Tests Subsystem 466

TESTS (Main Menu) 468

TESTS (Channel Information) 471

TESTS (Test Parameters) 473

TESTS (Order of Tests) 474

TESTS (Pass/Fail Limits) 476

TESTS (Save/Delete Procedur e) 478

TESTS (Execution Condition s) 481

TESTS (External Devices) 484

TESTS (Printer Setup) 487

TESTS (IBASIC Controller) 490

ROM Programs 492

34

Contents

23 TX Test Screen

Block Diagram 496

Field Descriptions 497

35

Contents

24 Connector, Key, and Knob Descriptions

Connector Descriptions 508

Key Descriptions 526

Knob Descriptions 530

36

Contents

25 Modifications, Accessories, Manuals, Support

Modifications 532

Accessories 535

HP Support for Your Instrument 546

37

Contents

38

1

Get Starte d

39

Chapter 1, Get Started

Before Connecting a Radio

Before Connecting a Radio

The RF IN/OUT port should be used for al l transmitter tes ts when the radio is connected
directly to the Te st Set. (All UUT transmitter power meas urements are made through this
port). Off-the-air measurements can be made using the ANT IN port.

CAUTION: Overpower Damage — Refer to the Test Set’s front panel for maximum input power level.

Exceeding this level can cause permanent instrument damage.

Radio Under Test

Figure 1 Connecting a Radio to the Test Set

40

Speaker or Audio OutMic Audio InMic KeyAntenna

Accessing the Test Set’s Scre ens

List of Screens

The following table list s all the screens that could be provided by the Test Set.

Table 2

Chapter 1, Get Started

Accessing the Test Set’s Screens

Analog Measurement Screens

Adjacent Channel Power Configure
AF Analyzer I/O Configure
Decoder Print Configure
Duplex
Encoder Help
Oscilloscope Message
Radio Interface
RF Analyzer Service
RF Generator
RX Test Call Control
Spectr u m A n alyzer Call Data
TX Test Ca l l Bit

Software Control Screen s

Instrument Configuration

User Assistance Screens

Service Assistance Screen

Call Processing Screens

Call Configure

Screens

Tests Analog Measure
Tests (IBASIC Controller)

41

Chapter 1, Get Started

Accessing the Test Set’s Screens

Accessing Screens

Test Set’s screens can be accessed through

• Front-panel keys

• The front-panel Curso r Control knob (using the To Screen menu, see item 5 in fig-

• HP-IB, using the DISPlay s ubsystem.

ure 3 on page 43)

Knob

Access to

Additional

Screens

Knob Access to

Screens

Front-Panel Key

Access to Screens

Figure 2 Accessing the Screens

42

Changing A Field’s Setting

There are seve ral types of CRT display fie lds in the Test Set. This section
describes some of the different types of fields.

Chapter 1, Get Started

Changing A Field’s Setting

3

Figure 3 Different Types of Fields

1

rxscrn.wmf

intro4.wmf

542

43

Chapter 1, Get Started

Changing A Field’s Setting

Unit-of-Measure Field

Unit-of-measure can be changed to display measurements in different valu es or
magnitudes. See item 1 in figure 3 to see an example of a units-of-measure field.

To change a unit-of-measure

1. Position the cursor at the unit field on the display.

2. Pres s a key labeled with a different unit-of-measure (such as W).

If the new units are valid, the measurement value is displayed in the unit.

Underlined Immediate-Act ion Field

Underlined immediate action field s prov ide a choice of two se ttings. S ee item 2 in

figure 3 to see an example of an underlined immediate-action field.

To change an underl ined entry

1. P osition the curs or at the field.

2. Push the CURSOR CONTROL knob or the ENTER key to move the unde rline under

the desire d choi ce.
The underlined setting is immedia tely activated whe n se lected.

44

One-of-Many Field

Numeric-Entry Field

Chapter 1, Get Started

Changing A Field’s Setting

One-of-many field s display a list of choices whe n selected. See item 3 in figure 3
to see an exa mple of a one-of many fiel d.

To make a one-of-many choice

1. Position the cursor at the field.

2. P ush the Cursor Control knob or the ENTER key to display the choices.

3. Move the cursor through the choic es by turning the knob.

4. P ush the Cursor Control knob or the ENTER key to make the choice.

The choice is immediately activated when selected.

The To Screen menu (see item 5 in figure 3 ) is a variation of the one-of-many
field.

Numeric-entry f ields conta in va lues f or setting s l ike Ext ernal Load Resi sta nce an d
RF Generator Frequency.See item 4 in

figure 3 to see an example of a numeric-

entry field.

To change a value

1. Position the cursor at the field.

2. Key in the desired number using the DATA keys.

3. Press ENTER to select the choice.

OR

1. Position the cursor at the field.

2. Push the Cursor Control knob to highlight the desired choice.

3. Turn the knob to increment or decrement the value.

4. P ush the Cursor Control knob or the ENTER key to select the choice.

45

Chapter 1, Get Started

How do I Verify that the Test Set is Operating Properly?

How do I Verify that the Test Set is Operating Properly?

If your Test Set powers-up and displays the RX TEST screen, but you suspect an
instrument problem, use the Instrument Quick Check to verify operation of the
basic instrument functions.

If no failure is indicated by this test, but you still suspect a problem, refer to the

“Performance Tests” information in the Assembly Level Repair Manual.

Instrument Quick Ch eck

1. Set up the quick check:
a. Connect a cable between the DUPLEX OUT and ANT IN ports.

b. Turn instrument power on (if it is not already on).
c. Press PRESET.
d. Press DUPLEX to access the DUPLEX TEST screen.
e. Set the Tune Mode field to Manual
f. Set the Tune Freq field to 825 MHz.
g. Set the Input Port field to Ant.
h. Set the RF Gen Freq field to 825 MHz.
i. Set the Amplitude field to -10 dBm.
j. Set the Output Port field to Dupl
k. Verify that AFGen1 Freq is set to 1.0000 kHz, an d that AFGen1 To is set to

FM and 3.00 kHz.

l. Set the AF Anl In field to FM Demod.
m. Set the Filter 1 field to 300Hz HPF.
n. Set the Filter 2 field to 3kHz LPF.
o. Verify that De-Emphasis is Off
p. Set the Detector field to Pk+-/2.
q. Turn the VOLUME knob clockwise until you hear a tone (1 kHz default for

AFGen1 Freq).

.

.

.

2. Check the following readings:

❒ SINAD should be >35 dB.
❒ FM Deviation should be about 3.0 kHz.

3 Access the OSCILLOS C O P E scr een usin g the To Screen menu. With the default

Vert/div setting of 2 kHz a nd a default Time/div s etting of 200 µs, you should

see two complete sine wav e s across the scree n.

4 Access the SPECTRUM ANALYZER using the To Screen menu. You should see

an 850 MHz FM carrier.

46

Instrument Function al Diagram

Chapter 1, Get Started

Instrument Functional Diagram

Figure 4 Instrument Functio n al Diagram (1 of 2)

47

Chapter 1, Get Started

Instrument Functional Diagram

Figure 5 Instrument Functio n al Diagram (2 of 2)

48

intr-bd2.wmf

2

Configuring You r Test Set

The CONFIGURE and I/O CONFIGURE screens contain a number of settings used to
alter instrument operation and hardware communication settings. T he HP-IB address,
screen intensity, serial communica tion paramete rs , and several other s ettings, are changed
in thes e scr eens.

Most CONFIGURE and I/O CONFIGURE screen entries are saved when th e instrument
is turned off.

49

Chapter 2, Configuring Your Test Set

General Operating Information

General Operating Information

The following configuration information discusses general operating information
for some of the fields in these screens.

To Set Screen Intensity

1. Access the CONFIGURE screen.

2. Select the Intensity field.

3. Rotate the knob to change the set ting (1=dim, 8=bright).

To Set RF Voltage Interpretation (50 / emf)

1. Access the CONFIGURE screen.

2. Position the cursor in front of the RFGen Volts field.

3. Press the Cursor Control knob or press ENTER to select 50 ohm or emf.

Ω

Voltage settings can cont ro l either:

• the voltage acros s a 50- ohm load, or

• the open circuit voltage (emf).

This setting affects the RF Generator’s and the Tracking Generator’s amplitudes.

To Set th e D ate and Time

1. Access the CONFIGURE screen.

2. Select the Date field and use the DATA keys to enter the date in the format sho wn be-

low the field.

3. Select the Time field and use the DATA keys to enter the time in the format shown
below the field.

The Test Set has a built-in clock that keeps track of the date and time. It is
powered by an inter na l batt ery to keep it oper at ing wh en the instrument is off.

50

To Change the Beeper Volume

1. Access the CONFIGURE screen.

2. Select the Beeper field to display the volume choices.

3. Select the desired choice.

The beeper alerts you to important ope rating and measurement condition s. I t
beeps any time a message is displayed at the top of the screen. These messag es
warn you of conditi ons such as e xceeding the RF input l ev el or tryi ng to set a f ield
to an unacceptable value. Therefore, it is recommended that you do not disable the
beeper.

To Verify or Change the
Low-Battery Setting

1. Access the CONFIGURE screen.

Chapter 2, Configuring Your Test Set

General Operating Information

2. The current time settin g is shown under the Low Battery field.

3. Select that field to display a list of setting choices.

• Select the desired tim e, or

• Select Disable to eliminate the low-ba ttery warning.

The low-battery warning system is used to alert you when you have not used any
front-panel cont rols within a specified amount of time. This setting is only used
with DC power. It does not actually monitor the DC supply voltage. Since
batteries are most ofte n used for a DC supply, this f unct ion helps you conserve
power by reminding you that the Test Set is still turned on.

When the specified time has elapsed between front-panel entries, the Beeper
sounds and a message appears at the top of the screen aler ting you to the
condition.

This setting is saved when the instr ument is tur ned off.

51

Chapter 2, Configuring Your Test Set

General Operating Information

52

3

Operating Overview

The information in this section discusses som e fr equently used operating features
of the Test Set.

From reading

• What “fields” and “screens” are.

• How to use the Cursor Control knob to select different fields and screens.

chapte r 1 , "Get Started" you should understand:

53

Chapter 3, Operating Overview

Interaction Between Screens

Interaction Between Screens

Most fields operate globally; changing the setting in any screen automatically
changes that setting in all screens where it is avail able. AFGen1 Freq is an
example of this field type.

Figure 6 Example of How Global Fields Work

Priority fields give the RX TEST and TX TEST screens priority control of their
settings. No matter what thes e fields were set to in other screens, if the RX TEST
or TX TEST screen is accessed, the field changes to whatever it was last set to in

these screens. The RF Generator’s

Amplitude field is an example of this field

type. These fields and their pr eset values are listed in table 3.

54

Chapter 3, Operating Overview

Interaction Between Screens

Table 3 Priori t y R X TEST and TX TEST Fields

Priority Field RX TEST TX TEST

RF Gen Amplitude Presets to −80 dBm (chang ea ble) Always Off
AFGen1 To Presets to FM (change able) Always Audio Out
AF Anl In Always Audio In Presets to FM Demod (changeable)
Detector Always RMS Presets to Pk +− Max (changeable)
De-emphasis Always Off

Presets to 750 (changeable)

µs

AF Anl Measurement Presets to SINAD (changeable) Presets to Audio Freq (changeable)

55

Chapter 3, Operating Overview

Interaction Between Screens

Using your Test Set, duplicate the steps in figure 7 to demonstrate how the
Priority fields ope rate.

fig2-2.wmf

Figure 7 Example of How Priority Fields Work

56

Displaying Measurements

Chapter 3, Operating Overview

Displaying Measurements

Figure 8 Where To Access Measurements

scntxrx.wmf

57

Chapter 3, Operating Overview

Displaying Measurements

Displaying RF Measurements

Transmitter Frequency

TX Frequency

is displayed when Tune Mode is set to Auto. (Refer to item (1)

in figure 8 on page 57.)

Transmitter Frequency Error

TX Freq Error

is displayed when Tune Mode is se t to Manual. (Refer to item

(1) in figure 8 on page 57.)

Transmitter Power

TX Power
RF In (Refer to item (2) in figure 8 on page 57). If Ant (antenna) is selected, the

is only measured and displayed here when the Input Port is set to

measurement is replace d by four dashes ( - - - -).
You can measure low power levels on the ANT IN port using the Spectrum

Analyzer.
Refer to the

description, on page 506

CAUTION: Connecting a signal of >200 mW to the ANT IN (antenna) port can cause instrument damage

(although internal protection circuits can typically withstand a short-duration signal of 1 or 2
Watts). If the overpower circuit is triggered, remove the signal from the ANT IN port and turn
the Test Set off and on to rese t it.

TX Power field description, on page 505 and the TX Pwr Zero field

for more information on measuring transmitter power.

58

Displaying AF Measurements

FM Deviation, AM Depth, AC Level

The AF Anl In se ttin g determines the AF Analyzer’ s inpu t and the measure ment
displayed in the top-right corner of the measurement area (see table 4). These
measurements are avail abl e in the TX TEST, DUPLEX TEST, RF
GENERATOR, RF ANALYZER, and AF ANALYZER screens. (Refer to item

(3) in figure 8 on page 57.)

Table 4 AF Measurements Selected by AF Analyzer Input Setting

Measurement AF Anl In Setting

FM Deviation FM Demod, FM Mod

Chapter 3, Operating Overview

Displaying Measurements

AM Depth AM Demod, AM Mod
AM Depth

a. AC Level is also measured in the RX TEST screen, but

a

always uses the AUDIO IN connector as the input. (Refer
to item (5 ) in figure 8 on page 57.)

SSB Demod, AudioIn, Radio Int,
Ext Mod, Mic Mod, Audio Out

59

Chapter 3, Operating Overview

Displaying Measurements

SINAD, Distortion, SNR, AF Frequency, DC Level, DC Current

Selecting th e curre ntly-dis playe d measuremen t ca uses the To Screen menu t o be
replaced by a list of measur ement choi ces. Select t he new choice t o rep lace th e old
measurement. These measurements are available in the RX TEST, TX TEST,
DUPLEX TEST, RF GENERATOR, RF ANALYZER, and AF ANALYZER
screens. (Ref er to item (4) in figure 8 on page 57)

The Distortion measurement is only for a 1 kHz tone.
The SINAD measurement is normally shown using an analog-type meter and

small digits, but can be changed to displa y in large digits only. (See

Analog METER Format" on page 62

.)

"To Use the

DC Current can only be measured using the rear-panel DC CURRENT
MEASUREMENT connections.

Selecting SNR (Signal/Noise Ratio) turns off the other audio measurement. For
more information on making this measu rement, see the

description, on page 445

.

RF Gen Freq field

AF Power

AF Power is measured in the RX TEST screen by specifying the external loa d
resistance, Ext Load R, and changing the unit of measure for the AC Level
measurement to W (Watts), mW, or dBm. (The milliwatt ( mW) unit is sele cted by
pressing SHIFT, ENTER) Refer to item (5) figure 8 on page 57.

60

To Change the Measurement’s Unit-of-Meas ure

1. Position the cursor in front of the present unit-of-measurement.

2. Press the key labeled with the desired unit.

All measurements allow you to change the associated unit-of- measure. For
instance; the TX Power measurement is usually displayed in Watts, but can be
changed to display in mW, dBm, V, mV, or dB

Select mW by pressing SHIFT, ENTER.
For example; to display transm itter power in units of dBm instead of Watts:

1. Move the cursor in front of the unit-of-measure for the TX Power measurem ent (W).

2. Press the dBm key. The measureme nt value is change d immediately to dis play in dBm.

Chapter 3, Operating Overview

Displaying Measurements

µV.

61

Chapter 3, Operating Overview

Displaying Measurements

To Use the Analog METER Format

To display measurement resul ts using the analog meter format, use the followi ng
procedure.

1. Position the c ursor i n front of t he unit-of-m easure for the mea sureme nt you wa nt to dis­play.

2. Press and release the SHIFT key, then the INCR SET key to display the Meters menu
in the lower-right corner of the screen.

3. Select On/Off to display the meter.

4. Repeat steps 1 and 2 to enter each meter end point and the meter intervals.

5. Repeat steps 1, 2, and 3 to cancel the METER function.

The METER function displays an equivale nt analog display. (This is the SINAD

measurement’s default state when the instrument is turned on or preset) . As the
measurement is display ed grap hically on the meter, the value is also displayed in
small digits below the meter.

You can specify the high and low end points and display interval, or you can use
the default meter settings.

This function is only avail abl e for measurements displayed using the larg e digits,
such as the measurements displayed in the RX TEST and TX TEST screens.

To Make Beat Frequency Measurements

1. Select t he DU PL EX TES T s cre en to s et u p for b ea t f re que ncy os ci ll ato r meas ur em ent s .

2. Set th e AF Anl In field to SSB Demod.

3. Manually adjust the Tune Freq field to the desired ca rrie r frequency.

62

Entering and Changing Num bers

Values for numeric entry fie lds can be entered and changed using various
methods, depending on your testing needs. The unit -of-measure for some of these

fields can also be changed (such as changing the RF Generator’s Amplitude
units from dBm to

To Enter Numbers

1. Position the cursor in front of the numeric entry field to be changed.

2. Use one of the following methods:
a. enter the number and unit-of-measure directly usi ng the keypad,

or
b. press the Cursor Control knob or ENTER to highlight the field, and use the

knob,

µV).

Chapter 3, Operating Overview

Entering and Changing Numbers

or
c. use th e dow n-a rr ow or t he up- ar ro w k ey s t o in cr emen t o r de cr em ent t he pr es ent

value.

Decimal Values

Decimal values are used for most numeric entry fields, such as the RF Gen Freq
setting. The acceptable entries for decimal values are 0 through 9, ., +/-, an d EEX.

The +/- key is used for entering negative numbers. For example; when entering
the R F Gener ator

−47 dBm: +/- 4 7 dBm.

Amplitude you can enter this sequence to set the value to

The EEX key can be used when entering exponential notation. For example; to
enter 1.25

3

× 10

kHz you could use the sequence: 1 . 2 5 EEX 3 kHz.

63

Chapter 3, Operating Overview

Entering and Changing Numbers

Hexadec imal Values

Hexadecimal (Hex) val ues are used for entering some signaling parameters in the
ENCODER, such as AMPS Filler data field, and for specif ying remote
communications parameters, such as the RADIO INTERFACE Output Data
field. The acceptable entries for decimal values are 0 through 9 and A through F.
No unit-of-measure is associated with these values.

Hexadecimal values are either entered from the keypad (A through F are shifted
functions), or by using the
selected (such as the AMPS Filler field).

To Enter and Change the Unit-of-Measure

Entering the Unit-of-Measure for Settings

When a number is entered, the unit-of- measure is either specified or implie d.

Choices menu displayed when certain fields are

When the unit is implied, the current unit is used. For example; if the present RF
frequency is 250 MHz, and you want to change it to 225 MHz, you would enter
this sequence: 2 2 5 ENTER.

When the unit is spe cifi ed, the unit s change to whatever y ou spec ify. For example;
if the present

RF Gen Freq setting is 250 MHz, and you want to change it to 455

kHz, you would enter this sequence: 4 5 5 kHz.

Changing the Unit-of-Measure for Settings

To change the present un it-of -measu re, positi on the cu rsor in front of the fie ld and
press the key labeled with the desired unit. For example, position the cursor in
front of the RF Gen Freq field and push GHz or kHz to display the setting in
either of these units.

64

To Change the Increment or Decrement Setting

Using the Pre-Defined Increment/Decrement Keys

The INCR ×10] and INCR ÷10] keys change the increment/decrement value by a
factor of 10.

Chapter 3, Operating Overview

Entering and Changing Numbers

For example; if the

Tune Freq presently changes by 10 MHz for every click of

the knob or push of the down-arrow or up-arrow keys, pushing INCR ×10] once
changes the increment value to 100 MHz.

Specifying An Increment Value

The INCR SET key is used to assign a specific increment value. The increment
value may use different units than the field you are incrementing/decrementing.
For instance; if the RF Generator Amplitude setting is displayed in dBµV, you
could increment in units of dB or mV.

To change the increment value;

1. Move the cursor to the numeric entry field to be changed.

2. Press INCR SET, and enter the desired value and unit-of-measure using the DATA

keys.

3. Use the down-arrow and up-arrow keys or CURSOR CONTROL knob to change the

field ’s val u e by th e inc r ement valu e yo u set .

Example of Setting an Increment Value

This example changes the Tune Freq in increments of 15 MHz.

1. Access the TX TEST scree n and positio n the cursor in front of the Tune Freq field.

2. Press 1 0 0 MHz to set the frequency at 100 MHz.

3. Press INCR SET 1 5 MHz.

4. Turn the Cursor Control knob. The field’s value changes by 15 MHz for each knob

click.

65

Chapter 3, Operating Overview

Printing A Screen

Printing A Screen

To Print A Screen’s Contents

1. Connect a printer to the appropriate rear-panel connector.

2. Access the PRINT CONFIGURE screen from the More menu and set the Printer

Port field to the appropriate type of printer connection.

If HP-IB is selected, enter the HP-IB Printer Address of the p r in t er .

3. Select the type of printer you are using in the Model field. If your printer is not listed,

configure your printer to emulate one that is listed.

4. Enter a Print Title using the knob, if desired. This text will appear at the top of

your printout.

5. Display the screen you want to print and press and release the SHIFT key, then the

TESTS key to access the PRINT funciton.

To interrupt pr inting, select the Abort Print field on t he PRINT CONFIGURE
screen.

66

Using Measurement Limit Indicators

The LO LIMIT and HI LIMIT functions are used to define a measurement

“window” to alert you to measurement s tha t are outside these limits. When limits
are assigned, Lo and/or Hi appear by the measure ment.

A measurement that goes a bove or below the defined limits causes three things to
happen:

1. A message appears at the top of the screen indicating a limit was exceeded.

2. The Lo or Hi indicator by the measuremen t flashes.

3. The Beeper bee ps if it is has been en ab led in the CO NFIGURE screen .

Limits are helpful when you can’t watch the Test Set’s display while you are
making an adjust ment on the equipment y ou are te sting or re pairing. They are also
a convenient way of alerting you to long-term measurement drift without having
to observe the screen.

Chapter 3, Operating Overview

Using Measurement Limit Indicators

To Set A HI and/or LO LIMIT

1. Position the cursor in front of the u nit-of-meas ure for t he measure ment tha t you a re set-

ting limits for.

2. Press and release the SHIFT key, then the down-arrow key to acces s the LO LIMIT

function, and enter the measurement’s low-limit value and its unit-of-measure.

3. Press and release the SHIFT key, then the up-arrow key to access the HI LIMIT func-

tion, and enter the measurement’s high-l im it value and its unit-of-measure.

1. The fundamental unit for the LIMITs does not have to be the same as the measure-

ment’s units. For instance; when measuring AC Level in Volts, you can set HI and LO
LIMITs in units of dBm .

1

1

67

Chapter 3, Operating Overview

Using Measurement Limit Indicators

To Reset or Remove Limits

To reset a limit that has been exceeded

1. Position the cursor in front of the measurement’s uni t-of-measure.

2. Press and relese the SHIFT key, then the down-a rrow (or up-arrow key) to access the

LO LIMIT (or HI LIMIT) function, then press ENTER or MEAS RESET.

To remove a limi t

1. Position the cursor in front of the unit-of-measure for the assigned limit.

2. Press and relese the SHIFT key, then the down-arrow (or up-arrow key) to access the

LO LIMIT (or HI LIMIT) function, then press ON/OFF.

Example of Setting HI and LO LIMITs

This example sets limit s for the TX Freq Error measurement . Lim its are b ei ng
set to indicate if a 100 MHz carrier varies more than ± 10 kHz.

1. Position the cur so r in front of the unit-of-measure for the TX FREQ ERROR measure-

ment (the default is kHz).

2. Press and relese the S HIFT key, then t he down-arrow to access the L O LIMIT function ,

then enter 1 0 kHz.

3. Press and relese the SHIFT key, then the up-arrow to access the HI LIMIT function,

then enter 1 0 kHz.

68

Averaging Measurements

The AVG (average) func tion allows you to display the average value of a number
of measurements. You enter the number of measure ment sa mples used to
calculate and displ ay the measu rement average. This dampens the effects of
rapidly changing measur ements, providing a more usable measurement displa y.

To Use Measurement Averaging

1. Position the cursor in front of the measurement’s uni t-of-measure.

2. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function.

The default number of avera ge s amples is displayed below the measurement.

• Enter the desired numbe r of measur ement sampl es t o b e used f or c alcul ating th e av­erage, or

Chapter 3, Operating Overview

Averaging Measurements

• Press ON/OFF to use the currently-displayed number of samples.

3. To turn averaging off, posit ion the cur sor in fr ont of the unit -of-me asure and press and

releas e the SHI FT key, then the INCR ×10 key to access the AVG function, then pr es s
the ON/OFF key.

When the averaging function is first enabled, a numeric average is calculate d and
displayed each time a measurement is made. This c ontinues until the specified
number of samp les is reac h ed . From that point on, the averaging function
performs an exponential filtering operation that mimics an RC filter.

Because of the exponential response, any large measurement changes result in a
displayed value that ramps up or down to the actual measured value.

Pressing MEAS RESET clears the measurement history for all measurements and
starts the averaging process over.

For more information on the theory of this filte ring technique, refer to the April
1986 issue of the HP Journal, page 24.

Example of Using Measurement Averaging

This example enables the SINAD measurement to be average d using 25 samples.

1. Press PRESET and wait for the instrument to display the RX TEST screen.

2. Position the cursor in front of the unit-of -measure for the SINAD measurement (def ault

is dB).

3. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function,

enter 2 5, then press the ENTER key. Avg appears below the displayed measurement
value to indicate that averaging is being used.

69

Chapter 3, Operating Overview

Setting A Measurement Reference

Setting A Measurement Reference

The REF SET function establishes a measurement reference point. This allows
you to make a direct comparison between two measurement results, or between a
measurement standar d and the actual measurement results.

Referenced me as u rem ent s ar e displayed in one of two ways, depending on the
type of measurement:

Displayed value = Measurement − Reference. The difference between the measured
value and the reference value is displayed in the same unit-of-measure.

or
Displayed value = Measurement ÷ Reference. A ratio of the meas ured value to the

reference value is dis played in dB.

To Use the Present Value as a Reference

1. Position the cursor in fro nt of t he unit-o f-mea sure for the mea surement you want t o set

the reference for.

2. Press and release the SHIFT key, th en the INC R ÷10 key to access the REF SET func-

tion; then press enter ENTER.

3. Ref appea r s be lo w th e measurem en t .

The measurement displayed is now referenced to the measu re ment value prese nt
when the reference was set.

To Set a Specific Reference

1. Position the cursor in fro nt of t he unit-o f-mea sure for the mea surement you want t o set

the reference for.

2. Press and release the SHIFT key, th en the INC R ÷10 key to access the REF SET func-

tion.

3. Enter a reference value.

4. Ref appears below the measurement value to indicate a reference has been set.

The measurement displayed is now referenced to the value you entere d .

70

Savin g and Recalling In strument Setup s

The SAVE and RECALL functions a llow you to store different instrument setups
and retrieve them later, eliminating the task of re-configuring the Test Set.

The number of a vailable save registers depends on how many changes were made
to the base i nstrument setup for each save. (See
smaller the number of changes, the greater the number of save registers that can
be used (typically over 200).

Save/Recall registe r settings can be saved to several types of mass storage . This

allows you to “back up the settings in case you need to clear them from memory
(see

"Memory Considerati on s" on page 74) for running large programs, or when a

firmware upgrad e i s perf or me d (see "Save/Recall" on page 387).

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

"BASE Settings" on page 74.) The

To Save an Instrument Setup

1. Use the More menu to access the I/O CONFIGURE screen. )

2. Select the storage media using the Save/Recall field. (The default is in ternal mem-

ory.

3. Make any changes to the instrume nt that you want to save in a registe r .

4. Press and release the SHIFT ke y then the RECALL key to access the SAVE func tion.

5. Use the DATA keys or the Save menu at the bottom right of the screen to enter the

register’s name.

To Recall an Instrument Setup

1. Use the More menu to access the I/O CONFIGURE screen.

2. Select the m edia to recall settings from using the Save/Recall field. The default is

internal memory .

3. Press RECA LL .

4. Use the knob to select the desired setup to be recalled from the Recall menu at the

bottom-righ t of the screen.

71

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

Example of Saving and Recalling an Instrument Setup

This example SAVES changes m ade to the RX TEST screen, and then RECALLS
them. The register is saved to wherever the Save/Recall field is set (internal
memory - unless you have changed it).

1. Access the RX TEST screen and set the RF Gen Freq to 500 MHz.

2. Set Amplitude to -35 dBm.

3. Press and release the SHIFT ke y then the RECALL key to access th e SAVE func tion.

A prompt appears at the top of the screen asking you to enter a name.

4. Using the DATA keys, press 1 2 3 ENTER to assign a name to these changes.

5. Press PRESET and wait for the instr ume nt to return to normal operation.

6. If not already displayed, access the RX TEST screen. Notice that the RF Gen Freq

and Amplitude settings are reset to their preset values.

7. Press RECALL 1 2 3 ENTER. The RF Gen Freq and Amplitude are changed to

the settings you saved in register 123 (500 MHz and -35 dBm) .

To Remove (Clear) an Individual Save Register

1. Specify where the register is stored using the Save/Recall field on the I/O CON-

FIGURE screen.

2. Press RECA LL .

3. Use the knob to position the cursor in front o f the register to be removed from the Re-

call menu at the bottom-right of the screen. The registe r nam e a nd percentage of
memory occupied by that register are indica ted at the top of the screen.

4. Press ON/OFF. A prompt appears, asking if you want to delete the save register.

5. Press YES.

72

To Clear All Save Registers

1. Press RECA LL .

2. Use the knob to position the cu rso r in front of the *Clr All* entry in th e Recall

menu at the bottom-right of the screen.

3. Press the kno b or press ENTER. A p rompt appear s at the to p of the scre en to verify t hat

you want to clear all registers.

4. Press YES.

Register Names

You can use any number, letter, or combination of numbers and letters as a name
for storing instr ument se tting s. For insta nce; if you want to s ave a set up for tes ting

a “Vulcan7” radio, you can save the setting as “VULCAN7”.
Two register names are reserved for special purposes: POWERON and BASE.

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

POWERON Settings

When the Test Set is turned on, it uses a set of instrument setup parameters
specified at the time of manufacture. You can have the instrument power up in a
different state by making the desired changes to the original settings, and then
saving them using the name POWERON.

The next time the instrument is turne d on, the instrument returns to the state
present when you saved the POWERON setting. For insta nce; if the
OSCILLOSCOPE screen was displayed when POWERON was saved, it is the
screen that is displayed when you turn the instrument on.

73

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

BASE Settings

The BASE register con tains any field settings the user has saved that are dif ferent
from the instrument preset state. It establishes a reference point for all future
saves. If a base is not saved, the preset state is used as the reference.

When you save an instrument setup, the new setup is compar ed to the base
settings, and any differences are stored under the regist er name you supply.
Because only differences are stored, a much larger number of instrument setups
can be saved than if the contents of every field was saved.

When you recall an i nstrument setting , every fie ld is reset to the base settin gs. Th e
saved settings are then use d to re-establish the desired inst rumen t setup.

CAUTION: Since each sa ve/recall register only contains the di fferences between the setup being saved and

the present bas e register setti ngs , changing the base settings causes all other saved setups t o be
erased from memory (including the POWERON setting if one has been saved).
Unless you consistently change the same fields to the same value each time you use the
instrument, you should avoid cr eating your own BASE settings.

Memory Considerations

When the Save/Recall field of the I/O CONFIGURE screen is set to

Internal, programs are saved to the same non-volatile RAM used to create

RAM Disk(s) and run I BASIC programs. By saving a large number of instrument
setups, you reduce the amount of RAM available to run programs. If you get a

“memory overflow” message while trying to load a program, you must clear one
or more save/rec al l regist ers to free RA M sp ace .

Instrument Hardware Changes

Recalling a saved register that uses a hardware option that has been removed
(such as an audio filter) results in unspecified operation. Re-install the needed
option before attempting to recall the associated registe r(s).

74

Using USER Keys

Chapter 3, Operating Overview

Using USER Keys

User keys instantly acce ss instrument settings without using the knob. You can
use user keys to move quickly between fiel ds on the same scre en , and to access
field settings tha t are not normally avail abl e on the s cre en you are using.

Local user keys are used t o move between settings on the screen that is displayed.
When the user key is pressed, the cursor instantly moves to, and selects, the
assigned field; eliminating the need to turn and push the knob. Five local user
keys are available for each screen: k1, k2, k3, k4, and k5.

Five factory-assigned local user keys are available in each screen; however, using
these keys removes any other local user keys you may have already set up.

Global user keys are used to access settings that are not available on the current
screen. Thr ee glob al u se r keys are available: k1’, k2’, and k3’. (T hes e are shifted
functions of the local user keys.)

When defining user keys, the ASSIGN functi on is use d to create key definitions;
the RELEASE function removes the definitions. Re-assigning a user key to a
different fiel d setting automatically releases it from the setting it was previously
associated with.

75

Chapter 3, Operating Overview

Using USER Keys

To Use the Pre-Assigned Local USER Keys

1. Press and release the SHIFT key, then the k4 key to acces s the ASSIGN funct ion; then

press the ENTER key. The numbers 1 throug h 5 appear in front of various field s. (S ee

figure 9 .)

2. Press the different local user keys (k1 to k5) and notice how the cursor immediately

moves to the correspondi ng field.

3. To stop using the default local user keys, press a nd release th e SHIFT key, the n the k5

key to access the RELEASE function; then press the ENTER key.

Figure 9 An Examp l e of Pr e- A ss i g ned Local User Keys

76

scnusr.wmf

To Assign Local USER Keys

1. Move the cursor to the field you want to assign a local user key to.

2. Press and release t he SHIFT key, t hen t he k4 k ey to access the AS SIGN fu nction. The n

press a local USER key (k1-k5). The user key number appears in front of the field you
assigned it to.

Example of Assigning a Local USER Key

Use this example to assign local USER key k1 to the Filter 1 field in the RX
TEST screen.

1. Access the RX TEST screen and position the cursor in front of th e Filter 1 field.

2. Press and release the SHIFT key, then the k4 key to acces s the ASSIGN funct ion; then

press k1. A small 1 a ppea r s next to the field indi cating that USER key k1 has been as ­signed to it.

Chapter 3, Operating Overview

Using USER Keys

3. Move the cursor to any other field on the screen and press k1. The cursor immediately

returns to the Filter 1 field . T he field is also highlighted t o change the entry using
the CURSOR CONTROL knob or arrow keys.

To Release Local USER Keys

1. Display the screen containing the user key assignment to be removed.

2. Press and rele ase the SHIFT key , then the k5 key to access the RELEAS E function; th en

press the USER key (k1-k5).

77

Chapter 3, Operating Overview

Using USER Keys

To Assign Global USER Keys

1. Move the cursor to the field you want to assign a global user key to.

2. Press and release t he SHIFT key, t hen t he k4 k ey to access the AS SIGN fu nction. The n

press SHIFT and a global USER key (k1’ - k3’). Unlike a local user key, th e us er key
number does not appear at this fi eld; instead, a prompt appears at the to p of the screen
confirming the key assignment.

Example of Assigning a Global USER Key

Use this example to assig n global USER key k1’ to the AF Anl In field, and then
access this field fro m the OSCILLOSCOPE screen.

1. Access the AF ANALYZER screen and po siti on t he cu rsor i n fr ont of t he AF Anl In

field.

2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function.

3. Press SHIFT, k1’. Notice the pro mpt Global User key 1 assigned. at th e t op

of the screen.

4. Access the OSCILLOSCOPE screen.

5. Press SHIFT, k1’.

AF Anl Input

present input is set to FM Demod). To change the input, use the arrow keys
(down-arrow or up-arrow), or press ENTER to access the

A field that is accessed using a global user key is only displayed at the top of the
screen while it is being accessed. Moving the cursor to any other field in the
screen causes the user key field to disappear until it is accessed again.

To Release Global USER Keys

1. Move the cursor to the field with the global user key assigned to it.

2. Press and release the SHIFT key, then the k5 key to access the RELEASE function.

Then press SHIFT and the USER key to be released (k1’-k3’).

, FM Demod is displayed at the top of the screen (assuming the

Choices menu.

78

Setting an RF Generator/Analyzer Offset

You can set a fixed frequency offset between the RF Generator and the
RF Analyzer. This feature is conve nient for testing radios with a fixed
transmit/receive frequency offset.

To Set a n R F Offset

1. Access the CONFIGURE screen.

2. Position the cursor in front of the RF Offset field, and press t he Cursor Control k nob,

or press ENTER to turn the offset On or Off.

3. Select the (Gen)-(Anl) field and enter the frequen cy offset value.

Chapter 3, Operating Overview

Setting an RF Generator/Analyzer Offset

Example of Setting an RF Offset

1. Access the CONFIGURE screen.

2. Set th e RF Offset to On.

3. Enter an offset frequency ((Gen)-(Anl)) of 10 MHz.

4. Access the DUPLEX screen.

5. Set th e Tune Mode to Manual.

6. Select the RF Gen Freq field, and rotat e the Cursor Cont rol knob to vary the RF Gen-

erator’s frequency.

7. Notice that th e Tune Freq value c hanges to mai ntain t he 1 0 MHz differ ence betwe en

the generator and the analyzer.

1

1. Manual tuning is used in this example to prevent possibl e unexpected Tune
Frequency chang es during the procedure.

79

Chapter 3, Operating Overview

Using Remote Control

Using Remote Control

The Test Set can be remotely controlled several ways:

• Using HP-IB control from a computer/controller.

• Using IBASIC programs on memory cards.

• Using an ASCII terminal connected to the serial port.

Using HP-IB Control

The Programmer’s Guide contains information on writing HP-IB control
programs for the Test Set. Programming examples and a syntax listing provide
general HP-IB operation guidelines.

Running IBASIC Programs from Memory Cards

The documentation shipped with HP 11807 software packages explains how to
run those programs from memory cards. Refer to the Programmer’s Guide for
detailed information on using memory cards with your own IBASIC programs.

80

Using an ASCII Terminal

Connecting an ASCII terminal to the serial port allows you to remotely operate
the Test Set by entering characters that represent each front-panel control.

Before you can use this feature, you must first set the required serial port settings
in the I/O CONFIGURE screen, and make any hardware connections.

Chapter 3, Operating Overview

Using Remote Control

The Serial Port connecti ons are described in

Knob Descriptions"

To Configure for Serial Port Operation

1. Access the I/O CONFIGURE screen.

2. Set th e Serial In field to Inst.

3. Set th e IBASIC Echo field to On.

4. Set th e Inst Echo field to On.

5. Set the remai ning serial c ommunications fields according to your terminal/c omp uter’s

serial communication requirements. These fields include:

• Serial Bau d

•Parity

• Dat a Le n gt h

• Stop Length

• Rcv Pace

•Xmt Pace

6. The Test Set now responds to the equivalent characters sent to it by the terminal/com-

puter.

Equivalent Front-Panel Control Characters

Table 5 on page 82

.

lists the terminal/computer keystrokes that equate to front-

chapter 24, "Connector, Key, and

panel controls. Each sequence must be preceded by the Escape key.
For example, to remotely a ccess the CONFIGURE screen, press the Esc key, then

press the C key on your terminal/computer. Be sure to use upper-case C for this
example.

81

Chapter 3, Operating Overview

Using Remote Control

Table 5 Equivalent Front-Panel Control Characters

Equivalent

Function

ESC

Function

Character

CANCEL ! A X
PERCENT MHZ_V ( EEX Z
S_KHZ_MV ) YES_ON_OFF [
BACKSPACE - NO_PPM_W ]
ENTER . RX a
RELEASE 0 TX b
K1 1 DUPLEX c
K2 2 PREV d
K3 3 TESTS_MAIN e
K4 4 LOCAL f
K5 5 RECALL g
K1_PRIME 6 MEAS_RESET h
K2_PRIME 7 PRESET i
K3_PRIME 8 INCR_DIV_10 j
ASSIGN 9 INCR_SET k
KNOB_TURN_CCW < INC R _TIMES_10 l
KNOB_TURN_CW > DOWN m
MSSG A UP n
HELP B SEVEN o
CONFIG C EIGHT p
HOLD D NINE q
PRINT E FOUR r
ADRS F FIVE s
SAVE G SIX t
REF_SET J ONE u
METER K TWO v
AVG L THREE w
LO_LIMIT M ZERO x
HI_LIMIT N POINT y

Equivalent

ESC

Character

82

Chapter 3, Operating Overview

Table 5 Equivalent Front-Panel Control Characters (Continued)

Using Remote Control

Equivalent

Function

E R PLUS_MINUS z
F S OHM_PCT_DEL_DBUV
B U DB_GHZ_DBM |
CVMS_HZ_UV
DW

ESC

Character

Function

Equivalent

Character

Alternate sequences for 5 commonly-used functions are also available. Hold
down the Cntl (control) key and select the corresponding key for the desired
function. Example: Cntl H moves the curso r to the left one space.

ENTER - J or M
CANCEL - C
BACKSPACE - H
KNOB_TURN_CW - R
KNOB_TURN_CCW - L

ESC

83

Chapter 3, Operating Overview

Using Remote Control

84

4

Adjacent Channel Power Screen

This screen i s used t o measur e Adjacent Channe l Power. Thi s is a meas urement of
the power of signals at a specific channel spacing above and below the RF

Analyzer’s center fre que ncy. This screen is accessed by select ing AD CH PWR
from the

To Screen menu.

85

Chapter 4, Adjacent Channel Power Screen

How the Test Set Measures Adjacent Channel Power (ACP)

How the Test Set Measures Adjacent Channel Power (ACP)

When you access this scree n, the Test Set automatic ally starts a multi- step proc ess
for measuring ACP:

1. AF Generator 1 is turned of f if the Carrier Ref field is set to Unmod.

2. The amplitude of the center frequency (Tune Freq) is mea sured to establish a

reference.

3. AF Generator 1 is turned back on if it was previously turned off.

4. The po w e r in ea ch of th e ad j ac en t cha n nels is anal y zed .

5. Adjacent Channel Power is cal culated and disp layed. This val ue can be displayed as an

absolute power level or as a ratio referenced to the center frequency’s level.

Which Input Port to Use. The TX Power mea surement is used to calculat e absolute
Adjacent Channel Power. Since TX Power can only be measured us ing the RF IN/OUT
port, you must use this port to measure ACP Level . ACP Ratio can be measured using
either the RF IN/OUT or the ANT IN port.
Measuring ACP on AM Transmitters. When measuri ng AM signa ls, th e refere nce lev el
must be measured on an unmodulated carrier ; so th e Carrier Ref field must be set to
Unmod. After the reference is measured , the power in the adjacent chan nels must be mea­sured with modulation. This requires the modulating signal to be turned off and on rep eat­edly as measure ment s are being ca lcula ted and dis playe d. Si nce th e Test S et a utomat ical ly
turns AFGen1 on and off when the Carrier Ref field is set to Unmod, you must use
AFGen1 and the AUDIO OUT port as the modulation source for making AM ACP mea­surements.

86

Field Descriptions

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Figure 10 The Adjacent Channel Power Screen

ACP Meas

This field selects the format fo r displaying upper and lower adjacent channel
power levels.

• Ratio displays the power levels relative to the power around the center frequency
(Tune Freq). Levels can be disp layed in dB or as a percentage (%).

• Level displays the abs olute power level s in mW, W, dBm, V, mV, and dBmV.

Operating Considerations

TX Power

Four dashes are displayed for these measurements when the Input Port is se t to

Ant (ANT IN).
ACP Ratio can be measured on either the ANT IN port or RF IN/OUT port.

For more information, refer to

Power (ACP)" on page 86

and ACP Level can only be measured through the RF IN/OUT port.

.

adchpwr.wmf

"How the Test Set Measures Adjacent Channel

87

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

AFGen1 Freq

This field sets the frequency for the first audio frequency sinewave generator.

AFGen1 To

This field sets two values:

• The upper field de termines whe ther th e AFGen1 s ignal modul at es the RF Ge nerat or or
is output through the AUDIO OUT connector.

• The lower field s ets the dept h of modulation f or FM and AM in ki lohertz an d amplitude
(including Off) for audio out. The AUDIO OUT level is always in volts rms.

Operating Considerations

This is a priority control f ield. Accessing the RX TEST or TX TEST screen
overrides any changes made to this field in other screens.

Carrier Ref

Channel BW

See Also

"Interaction Between Screens" on page 54

Use the carrier refe ren c e fie ld to indicate whether the carrier (Tune Freq) being
measured should be unmodulated or modulate d when making the ACP reference
measurement. (For more information, refer to "How the Test Set Measures

Adjacent Channel Power (ACP)" on page 86

Operating Considerations

• FM transmitters can be measured with the carrier modulated or unmodulated.

• For AM transmitters, the carrier mus t be measured whi le unmodulated. AFGen1 and
the AUDIO OUT port must be used as the modulation source whenever Unmod is
selected.

.)

Use the channel bandwidth field to specify the bandwidth of the carrier and
adjacent channels to be measur ed . (Se e

figure 11 .)

88

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

adchpwr1.wmf

Figure 11 Relationship Between Tune Freq, Ch Offset, and Channel BW Fields

89

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Ch Offset

Use the channel offset field to enter the frequency difference between the Tune

Freq

setting and the cente r of the adjacent channels you wan t to measure. This is

an absolute value; only positive values can be entered. See figure 11 .

Ext TX key

This field controls a switch at the MIC/ACC connector . Use it to “key” an
external transmitter.

See Also

"MIC/ACC" on page 514

Input Atten

Input Attenuation sets the amount of input attenuation for the RF IN/OUT and
ANT IN connectors. This function controls two settings:

• The upper field determines if you want the instrument to set the attenuat ion automati­cally (Auto), or if you want to set the value manually (Hold).

• The lower field dis plays the pres ent attenuation value, and is used to set the desired at­tenuation leve l when the upper area is set to Hold.

Operating Considerations

Input Attenuator autoranging can interfere with oscilloscope or signaling decoder
operation under certain conditions.

See "Input Atten," in chapter 17, on page 421

for additional information.

90

Input Port

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

This field selects the RF IN/OUT or ANT IN port for making RF measurements.
The RF IN/OUT port must be used for making TX Power or ACP Level
measurements on this screen.

Operating Considerations

Power levels for each port are printed on the Test Set’s front panel. If the RF
power at the RF IN/OUT port exceeds allowable lim its, a loud warning signal
sounds and a message appears at the top of the screen. If this occurs, disconnect
the RF power, press the MEAS RESET key, and al low the Test Set to cool off for
approximately two minutes before making any other measurements on this port.

The ANT IN (antenna input) connector provides a highly-sensitive input for very
low level signals (such as “off the air” measurements). You cannot measure TX
(RF) Power or ACP Level on this screen using the ANT IN port.

CAUTION: Connecting a signal of >200 mW to the ANT IN port can cause instrument damage

(although inte rnal prot ecti on cir cuits can typi call y withst and a shor t-durati on signa l of 1 or
2 Watts).

If the overpower circuit is triggered (s ignified by a warning message at the top of
the screen), remove the signal from the ANT IN port, and press the MEAS
RESET key or turn the Test Set off and on to reset it.

Lower and Upper ACP [Ratio:Level]

These two measurements disp lay the amount of power in s ignals a bove and below
the Tune Freq signal. The level is displayed as a ratio (referenced to the power
around the Tune Freq) or as an absolute value.

See Also

ACP Meas

field description, on page 87

91

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Res BW

The resolution bandwidt h field selects the IF filter used when measuri ng the
power of the carrier and the adjacent channels.

Operating Considerations

Using a narrower bandwidth filter (300 Hz) slows the measurement, but rejects
carrier leakage and out of channel spurs. Using a wider bandwidth filter
(1 kHz) speeds measurements , but may a llow unwanted spurs and carrier leaka ge
to be integrated int o the measure ment when mea suring at the edges of the select ed
channel bandwidth.

Tune Freq

This field sets the center freq uency for the RF signal to be analyzed.

Tune Mode

See Also

Tune Mode

field description (this page)

This field selects Automatic or Manual tuning of the RF Analyzer.

Auto tuning causes the RF Analyzer to find the signal with the greatest ampli tude

>-36 dBm, and to set the Tune Frequency for that signal.

Manual tuning requires the operator to set the Tune Frequency for the RF signal

to be analyzed.

Operating Considerations

Changing the Tune Mode also changes the RF frequ ency display. Automatic
tuning enables the TX Frequency measurement. Manual tuning enables the

TX Freq Error measurement.

92

TX Freq Error/TX Freque nc y

This measurement displays Transmitter Frequency Error or absolute Transmitter
Frequency.

See Also

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

TX Power

Tune Mode

field description (this page)

Transmitter Power measur es RF power at the RF IN/OUT port.

Operating Considerations

Only the RF IN/OUT port can be used for measuring TX Power on this screen.
When the Input Port is set to Ant, four dashes (- - - -) appear in place of dig its
for this measurement.

Use the Spectr um A n aly zer t o meas u re low-level RF power (

≤200 mW) at the

ANT IN port.

93

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

TX Pwr Zero

The transmitter power zero f unct ion establishes a 0.0000 W reference for
measuring RF power at the RF IN/OUT port.

CAUTION: RF power must not be applied while zeroing. Set the RF Generator sc reen’s Amplitude

field to off to preven t internal cross- coupling into the power detector while zeroing.

Operating Considerations

When power is applied to the RF IN/OUT connector, the temperature of the
internal ci rcuitry increa ses. This can c ause change s in the TX P ower measure ment
when low power levels are measured imm edi atel y following high power
measurements.

When alternately making high and low power measur ements, always zero the
power meter immediately before making the low power measurements; this
provides the best measurement accuracy.

94

5

AF Analyzer Screen

95

Chapter 5, AF Analyzer Screen

Block Diagram

Block Diagram

4O(I

&LOAT

'ND

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!-$EMOD
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Figure 12 AF ANALYZER Functional Block Diagram

1

The Settling, Gain Cntl, and Ext Load R fields are not shown.

2

Variable Frequency Notch if purcha sed .

96

6/,5-%

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Field Descriptions

AC Level

Chapter 5, AF Analyzer Screen

Block Diagram

This measurement displa ys either rms potential (voltage) or audio power (Watts
or dBm).

Operating Considerations

When the unit-of-measure is changed to measure AF power, the external load
resistance must be specified. Refer to the

Ext Load R field description, on page 102.

The input for the ac level measurement on this screen is always the AUDIO IN
connectors.

See Also

AF Anl In

"Entering and Changing Nu mber s" on page 63

The audio frequency analyz er input se lects the input for the analyzer. When
selected, this field displays a list of choices.

Signals can be analyzed from thre e diff erent types of inputs:

• The output of the AM, FM, or SSB demodulators.

• The AUDIO IN, RADIO INTERFACE, MODULATION INPUT, MIC/ACC, and
AUDIO OUT connectors.

• The signal present at the AM or FM modulators for the RF Gene rator.

See Also

"Interaction Between Screens" on page 54
"Displaying Measuremen ts" on page 57

97

Chapter 5, AF Analyzer Screen

Block Diagram

AF Cnt Gate

AF Freq

Audio frequency counter gate specifies how long the AF counter sa mples the
signal before displaying the fre quency. Specifying a shorter gate time may enable
you to see frequency fluctuations that might not be seen using a longer gate time.

This is the default measurement for this measurement field. Selecting this field
displays the following mea surement choices:

SINAD
Distortion
SNR (S i gnal to N o is e Rati o)
AF Frequency
DC Level

Current - DC only Operating Considerations

This is a priority control f ield. Accessing the RX TEST or TX TEST screen
overrides any changes made to this field in other screens.

SNR Operation

• Selecting SNR turns off the other audio measurem ent.

• The RF Generator and AFGen1 must be set up to pro vide the radio’s carrier. AFGen1
is automatically turned on and off repeatedly during this measure ment.

• AFGen2 must be turned off.

• The radio’s receiver’ s audio output must be connected to the AUDIO IN port (set
the AF Anl In field to Audio In).

See Also

"Interaction Between Screens" on page 54
"Displaying Measuremen ts" on page 57

98

AM Depth

Audio In Lo

Chapter 5, AF Analyzer Screen

Block Diagram

This field displays the percent depth of modulation of the AM signal. The field is
only visible when the AF ANL In field is set to AM MOD or AM DEMOD

This field sets the AUDIO IN LO connector’s state.

• Gnd causes the center pin of the connector to be connected directly to chassis ground.

• Float isolates the cente r pin of the co nnecto r from ground , providi ng a floati ng in put
to the AF Analyzer.

• 600 To Hi establi shes a 60 0-ohm imped ance be tween t he cente r pins of t he AUDIO
IN LO and AUDIO IN HI connectors. Als o, the Ext Load R fiel d is removed, since
the load is now fixed to 600 ohms.

Current

The Current field is found by selecting the SINAD field on the Test Set display
of the AF ANALYZER screen. This fie ld on ly displays the DC current measured
at the DC input port on the back of the Test Set. Any offset can be removed by
selecting Zero fro m the DC Current field.

DC Current

DC current me as urem en t zero removes any me asu rem en t off se t present before
making a dc-current measurement. The measurement is zeroed by selecting Zero,
and pressing the ENTER key or the Cursor Control knob.

NOTE: The current source must be disconnected before zeroing for accurate operation.

See Also

"DC CURRENT MEASUREMENT" on page 511
"SINAD, Distortion, SNR, AF Frequency, DC Level, DC Current" on page 60
Chapter 24, "Connector, Key, an d Knob Descri p t ion s "

99

Chapter 5, AF Analyzer Screen

Block Diagram

DC Level

De-Emp Gain

This field displays the DC voltage entering at the DC input port on the ba c k of the
Test Set.

De-emphasis gain displ ays and sel ects the desired AF analyzer de-emphasis
amplifier gain.

See Also

De-Emphasis

Distn

Gain Cntl

field description, on page 103

This setting select s or bypasse s the 750 ms de-emphasis networks in the audio
analyzer and speaker circuitry.

See Also

"Interaction Between Screens" on page 54

This field displays the percent of distortion. The Distortion measurement is only
for a 1 kHz signaling tone.

100