NoticeInformation contained in this document is subject to change without notice.
All Rights Reserved. Reproduct ion, adaptation, or translati on without prior written
permission is prohibited, except as allowed under the copyright laws.
This material may be reproduced by or for the U.S. Government pursuant to the
Copyright License under the clause at DFARS 52.227-7013 (APR 1988).
Hewlett-Packard Company
Learning Products Department
24001 E. Mission
Liberty Lake, WA 99019-9599
U.S.A.
2
Manufacturer’s Declaration
This statement is provi ded to c omply with the req uir ements of the Ger man So und
Emission Directive, from 18 January 1991.
This product has a sound pressure emission (at the operator position) < 70 dB(A).
•Sound Pressure Lp < 70 dB(A).
•At Operator Position.
•Normal Operation.
•According to ISO 7779:1988/EN 27779:1991 (Type Test).
Herstellerbescheinigung
Diese Information steht im Zusammenhang mit den Anforderungen der
Maschinenlärminformationsverordnung vom 18 Januar 1991.
•Schalldruckpegel Lp < 70 dB(A).
•Am Arbeitsplatz.
•Normaler Betrieb.
•Nach ISO 7779:1988/EN 27779: 19 91 (T ypp rüfung).
3
Safety
Considerations
GENERAL
This product and related doc umentation must be re viewed for famil iarizatio n with
safety markings and instructions before operation.
This product has been designed and tested in accordance with IEC Publication
1010, "Safety Requirements for Electronic Measuring Apparatus," and has been
supplied in a s af e c ondi ti on. This instructi on d ocumentation contains i nformation
and warnings which must be followed by the user to ensure safe operation and to
maintain the product in a safe condition.
SAFETY EARTH GROUND
A uninterruptible safety earth ground must be provided from the main power
source to the product input wiring terminals, power cord, or supplied power cord
set.
CHASSIS GROUND TERMINAL
To prevent a potential shoc k hazard, always co nnect the rear -panel chassi s ground
terminal to earth ground when operating this instrument from a dc power source.
SAFETY SYMBOLS
Indicates instrument damage ca n occur if ind icate d opera ting l imits are exc eeded.
!
Refer to the instructions in this guide.
Indicates hazardous voltages.
Indicates earth (ground) terminal
WARNINGA WARNING note denotes a hazard. It calls attention to a procedure, practice, or the
like, which, if not correctly performed or adhered to, could result in personal injury.
Do not proceed beyond a WARNING sign until the indicated conditions are fully understood and met.
CAUTIONA CAUTION note denotes a hazard. It calls attention to an operation procedure, practice,
or the like, which, if not correctly performed or adhered to, could resu lt in damage to or
destruction of part or all of the product. Do not proceed beyond an CAUTION note until
the indicated conditions are fully understood and met.
4
Safety Considerations for this Instrument
WARNINGThis product is a Safety Class I instrument (provided with a protective
earthing ground incorporated in the power cord). The mains plug shall only
be inserted in a socket outlet provided with a protective earth contact. Any
interruption of the protective conductor inside or outside of the product is
likely to make the product dangerous. Intentional interruption is
prohibited..
Whenever it is likely that the protection has been impaired, the instrument
must be made inoperative and be secured against any unintended operation.
If this instrument is to be energized via an autotransformer (for voltage
reduction), make sure the common terminal is connected to the earth
terminal of the power source.
If this product is not used as specified, the protection provided by the
equipment could be impaired. This product must be used in a normal
condition (in which all means for protection are intact) only.
No operator serviceable parts in this product. Refer servicing to qualified
personnel. To prevent electrical shock, do not remove covers.
Servicing instructions are for use by qualified personnel only. To avoid
electrical shock, do not perform any servicing unless you are qualified to do
so.
The opening of covers or removal of parts is likely to expose dangerous
voltages. Disconnect the product from all voltage sources while it is being
opened.
Adjustments described in the manual are performed with power supplied to
the instrument while protective covers are removed. Energy available at
many points may, if contacted, result in personal injury.
The power cord is connected to internal capacitors that my remain live for
5 seconds after disconnecting the plug from its power supply.
For Continued protection against fire hazard, replace the line fuse(s) only
with 250 V fuse(s) or the same current rating and type (for example, normal
blow or time delay). Do not use repaired fuses or short circuited
fuseholders.
5
WARNING:Always use the three-prong ac power cord supplied with this product. Failure to
ensure adequate earth grounding by not using this cord may cause product damage.
This product is designed for use in Installa t ion Category II and Pollution
Degree 2 per IEC 1010 and IEC 664 respectively. For indoor use only.
This product has autoranging line voltage input, be sure the supply voltage
is within the specified range.
To prevent electrical shock, disconnect instrument from mains (line) before
cleaning. Use a dry cloth or one slightly dampened with water to clean the
external case parts. Do not attempt to clean internally.
Ventilation Requirements: When installing t he pro duct in a cabinet, the
convection into and out of the product must not be restricted. The ambient
temperature (outside the cabinet) must be less than the maximum operating
temperature of the product by 4° C for every 100 watts dissipated in the
cabinet. If the total power dissipated in the cabinet is greater than 800 watts,
then forced convection must be used.
Product MarkingsCE - the CE mark is a regist ered trademark of the European Community. A CE
mark accompanied by a year indicated the year the design was proven.
CSA - the CSA m ark is a regis tered trade mark of the Canadian Standards Associ-
ation.
CERTIFICATIONHewlett-Packard Company certifies that this product met its published specifica-
tions at the time of shipment from the factory. Hewlett-Packard further certifies
that its calibration measurements are traceable to the United States National In-
stitute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards
Organization members
6
Hewett-Packard Warranty Statement for Commercial Products
HP 8920B RF
Communications
Test Set
Duration of
Warranty: 1 year
1. HP warrants HP hardware, accessories and supplies against defects in materials and
workmanship for the period specified above. If HP receives notice of such defects
during the warranty period, HP will, at its option, either repair or replace products
which prove to be defective. Replacement products may be either new or like-new.
2HP warrants that HP software will not fail to execute its programming instructions, for
the period specified above, due to defects in material and workmanshi p when properly
installed and used. If HP receives notice of such defects during the warranty period, HP
will replace software media which does not execute its programming instructions due
to such defects.
3. HP does not warrant that the operation of HP products will be uninterrupted or error
free. If HP is unable, within a reasonable time, to repair or replace any product to a
condition as warranted, customer will be entitled to a refund of the purchase price upon
prompt return of the product.
4HP products may contain remanuf actured parts equival ent to new in performance or
may have been subject to incidental use.
5. The warranty period begins on the date of deliv ery or on the date of insta llation if
installed by HP. If customer schedules or delays HP installation more than 30 days after
delivery, warranty begins on the 31st day from delivery.
6Warranty does not apply to defects resulting from (a) improper or inadequate mai nte-
nance or calibration, (b) software, interfacing, parts or supplies not supplied by HP, (c)
unauthorized modification or misuse, (d) operation outside of the published environmental specifications for the product, or (e) improper site preparation or maintenance.
7TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE WARRANTIES
ARE EXCLUSIVE AND NO OTHER WARRANTYOR CONDITION, WHETHER
WRITTEN OR ORAL IS EXPRESSED OR IMPLIED AND HP SPECIFICALLY
DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS FOR A PARTICULAR
PURPOSE.
8HP will be liable for damage to tangible property per incident up to the greater of
$300,000 or the actual amount paid f or the product th at is the subject of the claim, and
for damages for bodily injury or death, to the extent that all such damages are determined by a court of competent jurisdiction to have b een directly caused b y a defective
HP product.
7
9. TO THE EXTENT ALLOWED BY LOCAL LAW, THE REMEDIES IN THIS
WARRANTY STATEMENT ARE CUSTOMER’S SOLE AND EXCLUSIVE
REMEDIES. EXCEPT AS INDICATED ABOVE, IN NO EVENT WILL HP OR ITS
SUPPLIERS BE LIABLE FOR LOSS OF DATA OR FOR DIRECT, SPECIAL,
INCIDENTAL, CONSEQUENTIAL (INCLUDING LOST PROFIT OR DATA), OR
OTHER DAMAGE, WHETHER BASED IN CONTRACT, TORT, OR
OTHERWISE.
FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW ZEALAND:
THE WARRANTY TERMS CONTAINED IN THIS STATEMENT, EXCEPT TO
THE EXTENT LAWFULLY PERMITTED, DO NOT EXCLUDE RESTRICT OR
MODIFY AND ARE IN ADDITION TO THE MANDATORY STATUTORY
RIGHTS APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU.
ASSISTANCEProduct maintenance agreements and other customer assistance agreements are
available for Hewle tt-Packard products . For any assistance , contact your near est
Hewlett-Packard Sales and Service Office.
8
DECLARATION OF CONFORMITY
Manufacturer’s Name:
according to ISO/IEC Guide 22 and EN 45014
Hewlett-Packard Co.
Manufacturer’s Address:
Spokane Division
24001 E. Mission Avenue
Liberty Lake, Washington 99019-9599
USA
declares that the product
Product Name:
Model Number:
Product Options:
RF Communications Test Set / Cell Site Test Set
HP 8920A, HP 8920B, and HP 8921A
This declaration covers all options of the above
product.
conforms to the following Product specifications:
Safety:IEC 348:1978 / HD 401S1:1981
1)
EMC:CISPR 11:1990 / EN 55011:1991 Group 1, Class A
EN 50 08 2-1 : 1992
IEC 801-2:1991 - 4 kV CD, 8 kV AD
IEC 801-3:1984 - 3V/m
IEC 801-4:1988 - 0.5 kV Sig. Lines, 1 kV Power Lines
Supplementary Information:
This product herewith complies with the requirements of the Low Voltage Directive
73/23/EEC and the EMC Directive 89/336/EEC and carries the CD-marking accordingly
1) The product was introduced prior to 12/1993
Spokane, Washington USADateOctober 17, 1996 Vince Roland/Quality Manager
European Contact: Your local Hewlett-Packard Sales and Service Office or Hewlett-Packard GmbH
Department ZQ/Standards Europe, Herrenberger Strasse 130, D-71034 B
9
ö
blinger, Germany (FAX+49-7031-14-3143)
.
Table 1Regional Sales and Service Offices
United States of America
U.S. Instrument Suppor t Center
For Test & Measurement Equipment
Repair & Calibration.
Hewlett-Packard Company
Englewood, Colorado 80112
Telephone: (800) 403-0801
Fax: (888) 857-8161
South Eastern Europe
Sales and Service
Hewlett-Packard Ges. m.b.h.
Liebigasse 1
P.O. Box 72
A-1222 Vienna, Austria
Telephone: 43 222 2500 0
Telex: 13 4425
Asia
Sales and Service
Hewlett-Packard Asia Ltd.
22-30/F Pere gr i ne T ow e r
Lippo Center
89 Queensway, Central
Hong Kong
G.P.O. Box 863 Hong Kong
United States of America
Customer Information Center
For Assistance On All HP Products.
Hewlett-Packard Company
Tel: (800) 752-0900
6:00 am to 5:00 pm Pacific Time
Parts Direct: 1-800-227-8164
European Multicountry Region
Sales and Service
Hewlett-Packard S.A.
P.O. Box 95
150, Route dv Nant_dl_AVRIL
CH-1217 Meyrin 2
Geneva, Switzerland
Telephone: (41/22) 780-8111
Fax: (41/22) 780-8542
Japan
Hewlett-Packard Japan, Ltd.
Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi
Tokyo 192-8510, Japan
Telephone:(81)-426-56-7832
Fax: (81)-426-56-7840
United Kingdom
Sales and Service
Hewlett-Packard Ltd.
Cain Road
Amen Corner
Bracknell, Berkshire
RG12 1HN
United Kingdom
Telephone: 44 344 360000
Fax: 44 344 363344
Northern Europe
Sales and Service
Hewlett-Packard Nederland B.V.
Startbaan 16
1187 XR
Amstelveen, The Netherlands
P.O. Box 667
Telephone: 31/20 5476911 X 6631
Fax: 31-20-6471825NL
International Sales Branch Headquarters
Sales and Service
Hewlett-Packard S.A.
39 Rue Veyrot
P.O. Box 365
1217 Meyrin 1
Geneva, Switzerland
Telephone: 852-848-7777
Fax: 852-868-4997
Australia, New Zealand
Sales and Service
Hewlett-Packard Ltd.
P.O. Box 221
31-41 Joseph Street
Blackburn, Victoria 3130
Telephone: (61/3) 895-2895
Fax: (61/3) 898-9257
10
Canada
Sales and Service
Hewlett-Packard (Canada) Ltd.
5150 Spectrum Way
Mississauga, Ontario L4W 5G1
Canada
Telephone: (416) 206-4725
Fax: (416) 206-4739
Telephone: 41-22-780-4111
Fax: 41-22-780-4770
Canada
Service Center
Hewlett-Packard Company
17500 Transcanada Highway
S. Serv Road
Kirkland, Quebec H9J 2X8
Canada
Telephone: (416) 206-3295
Table 1Regional Sales and Service Offices (Continued)
Canada
Service Center
Hewlett-Packard Ltd.
11120 178 Street
Edmonton, Alberta T5S 1P2
Canada
Telephone: (403) 486-6666
Fax: (403) 489-8764
Latin America
Hewlett-Packard Company
LAHQ Mexico City
Col. Lomas de Virreyes
11000 Mexico D.F.
Mexico
Telephone: (52/5) 326-4000
Fax: (52/5) 202 7718
United Kingdom
Sales and Service
Hewlett-Packard Ltd.
Cain Road
Amen Corner
Bracknell, Berkshire
RG12 1HN
United Kingdom
Telephone: 44 344 360000
Fax: 44 344 363344
11
In this BookThe HP 8920B is referred to in this docum ent as "Test Set."
Chapter 1, Get Started
This chapter describes the basic operation of the Test Set. It also provides a quick
check that verifies that the Test Set is operating properly.
Chapter 2, Configuring Your Test Set
This chapter describes various instrument configuration settings that affect the general
operation of the instrument.
Chapter 3, Operating Overview
This chapter contains detailed op erating inst ructions and examples for u sing several
instrument features.
Chapters 4 through 23, Screen and Field Descriptions
These chapters contains reference informa tion fo r each screen an d its fields . Man y of
the descriptions contain signal flow diagrams that relate the screen’s f ields to the functions they perform. The screens are arranged in alphabetical order by title at the top of
the screen; Signaling Encoder and Signaling Decoder are alphabetized by the names
Encoder and Decoder.
Chapter 24, Connector, Key, and Knob Descriptions
This chapter describes the purpose and use of each connector and control.
Chapter 25, Modifications, Accessories, Manuals, Support
This chapter describes retrofit kits, accessories, manuals, and customer support available for your Test Set.
Error Messages
This section discusses error and operating messages.
12
Contents
1 Get Started
Before Connecting a Radio 40
Accessing the Test Set’s Screens 41
Changing A Field’s Setting 43
How do I Verify that the Test Set is Operating Properly? 46
Instrument Functional Diagram 47
13
Contents
2 Configuring Your Test Set
General Oper ating Information 50
14
Contents
3 Operating Overview
Interaction Between Screens 54
Displaying Measurements 58
Entering and Changing Numbers 64
Printing A Screen 67
Using Measurement Limit Indicators 68
Averaging Measurements 70
Setting A Measurement Reference 71
Using Memory Cards 72
Saving and Recalling Instrument Setups 77
Using USER Keys 81
Setting an RF Generator/Analyzer Offset 85
Using Remote Control 86
15
Contents
4 Adjacent Channel Power Screen
How the Test Set Measures Adjacent Channel Power (ACP) 92
Field Descriptions 93
16
Contents
5 AF Analyzer Screen
Block Diagram 102
17
Contents
6 Call Processing Subsystem
Description of the Call Processing Subsystem 116
Using the Call Processing Subsystem 120
The CALL CONTROL Screen 124
Using the CALL CONTROL Screen to Test Call Processing
Functions 142
Using the CALL CONTROL Screen to test AMPS
Authentication 153
AUTHENTICATION Screen 164
CALL DATA Screen 167
CALL DATA Screen Message Field Descriptions 172
Using the CALL DATA Screen 188
CALL BIT Screen 196
CALL BIT Screen Message Field Descriptions 203
Using the CALL BIT Screen 241
ANALOG MEAS Screen 246
Using the ANALOG MEAS Screen 249
CALL CONFIGURE Screen 252
18
Contents
7 Configure Screen
Field Descriptions 256
19
Contents
8 Signaling Decoder Screen
Field Descriptions for Decoder Modes 270
AMPS-TACS, NAMPS-NTACS Decoder 271
Using the AMPS/TACS, NAMPS/NTACS Decoder 276
Continuous Digital Controlled Squelch System Decoder 280
Using the CDCSS Decoder 284
Digital Paging Decoder 285
Dual-Tone Multi-Frequency (DTMF) Decoder 289
Using the DTMF Decoder 294
EDACS Decoder 295
Using the EDACS Decoder 298
Function Generator Decoder 301
Using the Function Generator Decoder 304
LTR Decoder 305
Using the LTR Decoder 309
MPT 1327 Decoder 311
NMT Decoder 316
Using the NMT Decoder/Encoder 321
Creating NMT Tests 326
Tone Sequence Decoder 335
20
Contents
9 Duplex Test Screen
Block Diagram 340
Field Descriptions 341
21
Contents
10 Signaling Encoder (AF Generator 2)
Field Descriptions for Encoder Modes 354
AMPS-TACS NAMPS-NTACS Encoder 355
Using the AMPS-TACS, NAMPS-NTACS Encoder 367
CDCSS Encoder 368
Using the CDCSS Encoder 372
Digital Paging Encoder 373
DTMF Sequence Encoder 378
EDACS Encoder 382
Using the EDACS Encoder 388
Function Generator Encoder 393
LTR Encoder 396
Using the LTR Encoder 400
MPT 1327 Encoder 404
Using the MPT 1327 Encoder 417
Nordic Mobile Telephone (NMT) Encoder 420
Tone Sequence Encoder 432
22
Contents
11 Help Screen
Field Descriptions 436
23
Contents
12 I/O Configure Screen
Field Descriptions 438
24
Contents
13 Message Screen
Field Descriptions 444
25
Contents
14 Oscilloscope Screen
Field Descriptions 446
Using the Oscilloscope 453
26
Contents
15 Print Configure Screen
Field Descriptions 456
27
Contents
16 Radio Interface Screen
Radio Interface Functional Description 460
Field Descriptions 462
Using the Radio Interface (Manual Operation) 465
Using The Radio Interface (Remote Operation) 471
28
Contents
17 RF Analyzer Screen
Block Diagram 474
Field Descriptions 475
29
Contents
18 RF Generator Screen
Block Diagram 486
Field Descriptions 487
30
Contents
19 RX Test Screen
Block Diagram 496
Field Descriptions 497
31
Contents
20 Service Screen
Field Descriptions 504
32
Contents
21 Spectrum Analyzer Screen
Field Descriptions 508
Using the Spectrum Analyzer 520
33
Contents
22 Tests Screen
Description of the Tests Subsystem 522
TESTS (Main Menu) 524
TESTS (Channel Information) 527
TESTS (Test Parameters) 529
TESTS (Order of Tests) 530
TESTS (Pass/Fail Limits) 532
TESTS (Save/Delete Procedure) 534
TESTS (Execution Conditions) 537
TESTS (External Devices) 540
TESTS (Printer Setup) 543
TESTS (IBASIC Controller) 546
ROM Programs 548
34
Contents
23 TX Test Screen
Block Diagram 552
Field Descriptions 553
35
Contents
24 Connector, Key, and Knob Descriptions
Connector Descriptions 566
Key Descriptions 584
Knob Descriptions 588
36
Contents
25 Modifications, Accessories, Manuals, Support
Modifications 590
Accessories 593
HP Support for Your Instrument 605
37
Contents
Index 621
38
1
Get Started
39
Chapter 1, Get Started
Before Connecting a Radio
Before Connecting a Radio
The RF IN/OUT port should be used for all transmitter tests when the radio is connected
directly to the Test Set. (All UUT transmitter power measurements are made through this
port). Off-the-air measurements can be made using the ANT IN port.
CAUTION:Overpower Damage — Refer to the Test Set’s front panel for max imum input power level.
Exceeding this level can cause permanent instrument damage.
Speaker or Audio OutMic Audio InMic KeyAntenna
Radio Under Test
Figure 1 Connecting a Radio to the Test Set
40
S:\HP892XX\USRGUIDE\manual\getstart.fb
Accessing the Test Set’s Screens
List of Screens
The following table lists all the screens that could be provided by the Test Set.
Table 2
Chapter 1, Get Started
Accessing the Test Set’s Screens
Analog Measurement Screens
Adjacent Channel PowerConfigure
AF AnalyzerI/O Configure
DecoderPrint Configure
Duplex
EncoderHelp
OscilloscopeMessage
Radio Interface
RF AnalyzerService
RF Generator
RX TestCall Control
Spectrum AnalyzerCall Data
TX TestCall Bit
•The front-panel Cursor Control knob (using the To Screen menu, see item 5 in fig-
ure 3 on page 43)
•HP-IB, using the DISPlay subsystem.
Knob
Access to
Additional
Screens
Knob Access to
Screens
Front-Panel Key
Access to Screens
Figure 2 Accessing the Screens
42
S:\HP892XX\USRGUIDE\manual\getstart.fb
Changing A Field’s Setting
There are several types of CRT display fields in the Test Set. This section
describes some of the different types of fields.
Chapter 1, Get Started
Changing A Field’s Setting
3
Figure 3 Different Types of Fields
1
rxscrn.wmf
intro4.wmf
542
43
Chapter 1, Get Started
Changing A Field’s Setting
Unit-of-Measure Field
Unit-of-measure can be changed to display measurements in different values or
magnitudes. See item 1 in
To change a unit-of-measure
1. Position the cursor at the unit field on the display.
2. Press a key labeled with a different unit-of-measure (such as W).
If the new units are valid, the measurement value is displayed in the unit.
Underlined Immediate-Action Field
Underlined immediate ac tion fiel ds pro vide a choi ce of tw o set tings. Se e it em 2 in
figure 3 to see an example of an underlined immediate-action field.
To change an underlined entry
1. Position the cursor at the field.
2. Push the CURSOR CONTRO L knob or th e EN TER key to move the underline under
the desired choice.
figure 3 to see an example of a units-of-measure field.
The underlined setting is immediately activated when selected.
44
S:\HP892XX\USRGUIDE\manual\getstart.fb
One-of-Many Field
Numeric-Entry Field
Chapter 1, Get Started
Changing A Field’s Setting
One-of-many fields displ ay a lis t of choi ces when selected. See item 3 in figure 3
to see an example of a one-of many field.
To make a one-of-many choice
1. Position the cursor at the field.
2. Push the Cursor Control knob or the ENTER key to display the choices.
3. Move the cursor through the choices by turning the knob.
4. Push the Cursor Control knob or the ENTER key to make the choice.
The choice is immediately activated when selected.
The To Screen menu (see item 5 in figure 3 ) is a variation of the one-of-many
field.
Numeric-entry field s contain val ues for sett ings like Ext ernal Load Resi stance and
RF Generator Frequency.See item 4 in
figure 3 to see an example of a numeric-
entry field.
To change a value
1. Position the cursor at the field.
2. Key in the desired number using the DATA keys.
3. Press ENTER to select the choice.
OR
1. Position the cursor at the field.
2. Push the Cursor Control knob to highlight the desired choice.
3. Turn the knob to increment or decrement the value.
4. Push the Cursor Control knob or the ENTER key to select the choice.
45
Chapter 1, Get Started
How do I Verify that the Test Set is Operating Properly?
How do I Verify that the Test Set is Operating Properly?
If your Test Set powers-up and displays the RX TEST screen, but you suspect an
instrument problem, use the Instrument Quick Check to verify operation of the
basic instrument functions.
If no failure is indicated by this test, but you still suspect a problem, refer to the
“Performance Tests” information in the Assembly Level Repair Manual.
Instrument Quick Check
1. Set up the quick check:
a. Connect a cable between the DUPLEX OUT and ANT IN ports.
b. Turn instrument power on (if it is not already on).
c. Press PRESET.
d. Press DUPLEX to access the DUPLEX TEST screen.
e. Set the Tune Mode field to Manual
f. Set the Tune Freq field to 825 MHz.
g. Set the Input Port field to Ant.
h. Set the RF Gen Freq field to 825 MHz.
i. Set the Amplitude field to -10 dBm.
j. Set the Output Port field to Dupl
k. Verify that AFGen1 Freq is set to 1.0000 kHz, and that AFGen1 To is set to
FM and 3.00 kHz.
l. Set the AF Anl In field to FM Demod.
m. Set the Filter 1 field to 300Hz HPF.
n. Set the Filter 2 field to 3kHz LPF.
o. Verify that De-Emphasis is Off
p. Set the Detector field to Pk+-/2.
q. Turn the VOLUME knob clockwise until you hear a tone (1 kHz default for
AFGen1 Freq).
.
.
.
2. Check the following readings:
❒ SINAD should be >35 dB.
❒ FM Deviation should be about 3.0 kHz.
3Access the OSCILLOSCOPE screen using the To Screen menu. With the default
Vert/div setting of 2 kHz and a default Time/div setting of 200 µs
see two complete sinewaves across the screen.
1
4Access the SPECTRUM ANALYZER
an 850 MHz FM carrier.
1.O ptional on some Test Set models.
46
S:\HP892XX\USRGUIDE\manual\getstart.fb
using the To Screen menu. You shou ld see
, you should
Instrument Functional Diagram
Chapter 1, Get Started
Instrument Functional Diagram
Figure 4 Instrument Functional Diagram (1 of 2)
47
Chapter 1, Get Started
Instrument Functional Diagram
intr-bd2.wmf
Figure 5 Instrument Functional Diagram (2 of 2)
48
S:\HP892XX\USRGUIDE\manual\getstart.fb
2
Configuring Your Test Set
The CONFIGURE and I/O CONFIGURE screens contain a number of settings used to
alter instrument operation and hardware communication settings. The HP-IB address,
screen intensity, serial communication parameters , and sever al other settings , are changed
in these screens.
Most CONFIGURE and I/O CONFIGURE screen entries are saved when the instrument
is turned off.
49
Chapter 2, Configuring Your Test Set
General Operating Information
General Operating Information
The following configuration information discusses general operating information
for some of the fields in these screens.
To Set Screen Intensity
1. Access the CONFIGURE screen.
2. Select the Intensity field.
3. Rotate the knob to change the setting (1=dim, 8=bright).
To Set RF Voltage Interpretation (50 /emf)
1. Access the CONFIGURE screen.
2. Position the cursor in front of the RFGen Volts field.
3. Press the Cursor Control knob or press ENTER to select 50 ohm or emf.
Ω
Voltage settings can control either:
•the voltage across a 50-ohm load, or
•the open circuit voltage (emf).
This setting affects the RF Generator’s and the Tracking Generator’s amplitudes.
To Set the Date and Time
1. Access the CONFIGURE screen.
2. Select the Date field and use the DATA keys to enter the d ate in the fo rmat shown be-
low the field.
3. Select the Time field and use the DATA keys to enter the time in the format shown
below the field.
The Test Set has a built-in clock that keeps track of the date and time. It is
powered by an internal battery to keep it operating when the instrument is off.
50
S:\HP892XX\USRGUIDE\manual\configts.fb
To Change the Beeper Volume
1. Access the CONFIGURE screen.
2. Select the Beeper field to display the volume choices.
3. Select the desired choice.
The beeper alerts you to important operating and measurement conditions. It
beeps any time a message is displayed at the top of the screen. These messages
warn you of conditio ns such as ex ceeding th e RF input level or t rying to s et a field
to an unacceptab le value. Therefore, it is recommende d that y ou do not disable the
beeper.
To Verify or Change the
Low-Battery Setting
1. Access the CONFIGURE screen.
Chapter 2, Configuring Your Test Set
General Operating Information
2. The current time setting is shown under the Low Battery field.
3. Select that field to display a list of setting choices.
•Select the desired time, or
•Select Disable to eliminate the low-battery warning.
The low-battery warning system is used to alert you when you have not used any
front-panel controls within a specified amount of time. This setting is only used
with DC power. It does not actually monitor the DC supply voltage. Since
batteries are most often used for a DC supply, this function helps you conserve
power by reminding you that the Test Set is still turned on.
When the specified time has elapsed between front-panel entries, the Beeper
sounds and a message appears at the top of the screen alerting you to the
condition.
This setting is saved when the instrument is turned off.
51
Chapter 2, Configuring Your Test Set
General Operating Information
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3
Operating Overview
The information in this section discusses some fre que ntl y used operating features
of the Test Set.
From reading
•What “fields” and “screens” are.
•How to use the Cursor Control knob to select different fields and screens.
chapter 1, "Get Started" you should understand:
53
Chapter 3, Operating Overview
Interaction Between Screens
Interaction Between Screens
Most fields operate globally; changing the setting in any screen automatically
changes that setting in all screens where it is available.
example of this field type.
AFGen1 Freq is an
Figure 6 Example of How Global Fields Work
Priority fields give the RX TEST and TX TEST screens priority control of their
settings. No matter wh at these fields were set to in other screens, if the RX TEST
or TX TEST screen is accessed, the field changes to whatever it was last set to in
these scree ns. The RF Generator’s
Amplitude field is an example of this field
type. These fields and their preset values are listed in
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table 3.
Chapter 3, Operating Overview
Interaction Between Screens
Table 3Priority RX TEST and TX TEST Fields
Priority Field RX TESTTX TEST
RF Gen AmplitudePresets to −80 dBm (changeable)Always Off
AFGen1 ToPresets to FM (changeable)Always Audio Out
AF Anl InAlways Audio InPresets to FM Demod (changeable)
DetectorAlways RMSPresets to Pk +− Max (changeable)
De-emphasisAlways Off
AF Anl MeasurementPresets to SINAD (changeable)Presets to Audio Freq (changeable)
Presets to 750 (changeable)
µs
Using your Test Set, duplicate the steps in figure 7 to demonstrate how the
Priority fields oper ate .
55
Chapter 3, Operating Overview
Interaction Between Screens
fig2-2.wmf
Figure 7 Example of How Priority Fields Work
56
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Priority CALL CONFIGURE Field
The Input Att field located on the CALL CONFIGURE screen is another
priority field. Similar fields labeled
ADJACENT CHANNEL POWER screen, RF ANALYZER screen, and the
SPECTRUM ANALYZER screen.
Chapter 3, Operating Overview
Interaction Between Screens
Input Atten are located on the
Setting the
Input Atten fields found on the other screens. Setting the Input Atten field
updates all other
Input Att field. Accessing the CALL CONFIGURE screen changes the input
attenuator to the current value of the
Atten
Input Att field from the CALL CONFIGURE screen updates all
Input Atten fields but does not change the setting of the
Input Att field and updates all Input
fields.
57
Chapter 3, Operating Overview
Displaying Measurements
Displaying Measurements
Figure 8 Where To Access Measurements
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scntxrx.wmf
Displaying RF Measurements
Transmitter Frequency
Chapter 3, Operating Overview
Displaying Measurements
TX Frequency
figure 8 on page 58.)
in
Transmitter Frequency Error
TX Freq Error
figure 8 on page 58.)
(1) in
Transmitter Power
TX Power
RF In (Refer to item (2) in figure 8 on page 58). If Ant (antenna) is selected, the
is displayed when Tune Mode is set to Auto. (Refer to item (1)
is displayed when Tune Mode is set to Manual. (Refer to item
is only measured and displayed here when the Input Port is set to
measurement is replaced by four dashes (- - - -).
You can measure low power levels on the ANT IN port using the Spectrum
Analyzer.
1
Refer to the TX Powerfield description, on page 561 and the TX Pwr Zerofield
description, on page 563
CAUTION:Connecting a signal of >200 mW to the ANT IN (antenna) port can cause instrument damage
(although internal protection circuits can typically withstand a short-duration signal of 1 or 2
Watts). If the overpower circuit is triggered, remove the signal from the ANT IN port and turn
the Test Set off and on to reset it.
for more information on measuring transmitter power.
1.O ptional on some Test Set models.
59
Chapter 3, Operating Overview
Displaying Measurements
Displaying AF Measurements
FM Deviation, AM Depth, AC Level
The AF Anl In setti ng determine s the AF Anal yzer’s inp ut and the measureme nt
displayed in the top-right corner of the measurement area (see
measurements are available in the TX TEST, DUPLEX TEST, RF
GENERATOR, RF ANALYZER, and AF ANALYZER screens. (Refer to item
figure 8 on page 58.)
(3) in
Table 4AF Measurements Selected by AF Analyzer Input Setting
Measurement AF Anl In Setting
FM DeviationFM Demod, FM Mod
table 4). These
AM DepthAM Demod, AM Mod
AM Depth
a. AC Level is also measured in the RX TEST screen, but
a
always uses the AUDIO IN connector as the input. (Refer
to item (5) in figure 8 on page 58.)
SSB Demod, AudioIn, Radio Int,
Ext Mod, Mic Mod, Audio Out
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Chapter 3, Operating Overview
Displaying Measurements
SINAD, Distortion, SNR, AF Frequency, DC Level, DC Current
Selecting the curr ently-displaye d measurement c auses the To Sc reen menu to be
replaced by a list of measuremen t choices. Select the new choice to repla ce the old
measurement. These measurements are available in the RX TEST, TX TEST,
DUPLEX TEST, RF GENERATOR, RF ANALYZER, and AF ANALYZER
screens. (Refer to item (4) in
figure 8 on page 58)
The Distortion measurement is only for a 1 kHz tone.
The SINAD measurement is normally shown using an analog-type meter and
small digits, but can be changed to display in large digits only. (See
Analog METER Format" on page 63
.)
"To Use the
DC Current can only be measured using the rear-panel DC CURRENT
MEASUREMENT connections.
Selecting SNR (Signal/Noise Ratio) turns off the other audio measurement. For
more information on making this measurement, see the
description, on page 501
.
RF Gen Freq field
AF Power
AF Power is measured in the RX TEST screen by specifying the external load
resistance,
Ext Load R, and changing the unit of measure for the AC Level
measurement to W (W att s), m W, or dBm . (Th e mi lliwa tt ( mW) unit is sel ected by
pressing SHIFT, ENTER) Refer to item (5)
figure 8 on pa ge 58.
61
Chapter 3, Operating Overview
Displaying Measurements
To Change the Measurement’s Unit-of-Measure
1. Position the cursor in front of the present unit-o f-measurement.
2. Press the key labeled with the desired unit.
All measurements allow you to change the associated unit-of- measure. For
instance; the
changed to display in mW, dBm, V, mV, or dB
Select mW by pressing SHIFT, ENTER.
For example; to display transmitter power in units of dBm instead of Watts:
1. Move the cursor in front of the unit-of-measure for the TX Power measurement (W).
2. Press the dBm key. The measurement value is changed immediately to display in dB m.
TX Power measurement is usually displayed in Watts, but can be
µV.
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To Use the Analog METER Format
To display measurement results using the analog meter format, use the following
procedure.
1. Position the cursor in front of the unit-of-measure for the measurement you want to dis-
play.
2. Press and release the SHIFT key, then the INCR SET key to display the Meters menu
in the lower-right corner of the screen.
3. Select On/Off to display the meter.
4. Repeat steps 1 and 2 to enter each meter end point and the meter intervals.
5. Repeat steps 1, 2, and 3 to cancel the METER function.
The METER function displays an equivalent analog display. (This is the SINAD
measurement’s default state when the instrument is turned on or preset). As the
measurement is displayed graphically on the meter, the value is also displayed in
small digits below the m eter.
Chapter 3, Operating Overview
Displaying Measurements
You can specify the high and low end points and display interval, or you can use
the default m eter settings .
This function is only available for measurements displayed using the large digits,
such as the measurements displayed in the RX TEST and TX TEST screens.
To Make Beat Frequency Measurements
1. Select the DUPLEX TEST screen to set up for beat frequency oscillator measurements.
2. Set the AF Anl In field to SSB Demod.
3. Manually adjust the Tune Freq field to the desired carrier frequency.
63
Chapter 3, Operating Overview
Entering and Changing Numbers
Entering and Changing Numbers
Values for numeric entry fields can be entered and changed using various
methods, depending on y our testing needs. The unit-of-measure fo r some of these
fields can also be changed (such as changing the RF Generator’s
units from dBm to
To Enter Numbers
1. Position the cursor in front of the numeric entry field to be changed.
2. Use one of the following methods:
a. enter the number and unit-of-measure directly using the keypad,
or
µV).
Amplitude
b. press the Cursor Control knob or ENTER to highlight the field, and use the
knob,
or
c. use the down-arrow or the up-arrow key s to increment or decrement the present
value.
Decimal Values
Decimal values are used for most numeric en try fi elds, suc h as th e RF Gen Freq
setting. The acceptabl e e ntr ies for decimal values a re 0 thr ough 9, ., +/-, and EEX.
The +/- key is used for entering negative numbers. For example; when entering
the RF Generator
−47 dBm: +/- 4 7 dBm.
Amplitude you can enter this sequence to set the value to
The EEX key can be used when entering exponential notation. For example; to
3
× 10
enter 1.25
kHz you could use the sequence: 1 . 2 5 EEX 3 kHz.
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Hexadecimal Values
Hexadecimal (Hex) values are used for entering some signaling parameters in the
ENCODER, such as AMPS
communications parameters, such as the RADIO INTERFACE
field. The acceptable entries for decimal values are 0 through 9 and A through F.
No unit-of-measure is associated with these values.
Hexadecimal values are either entered from the keypad (A through F are shifted
functions), or by using the
selected (such as the AMPS
To Enter and Change the Unit-of-Measure
Entering the Unit-of-Measure for Settings
When a number is entered, the unit-of-measure is either specified or implied.
Chapter 3, Operating Overview
Entering and Changing Numbers
Filler data field, and for specifying remote
Output Data
Choices menu displayed when certain fields are
Filler field).
When the unit is implied, the current unit is used. For example; if the present RF
frequency is 250 MHz, and you want to change it to 225 MHz, you would enter
this sequence: 2 2 5 ENTER.
When the unit is specif ied, the units change to whatever you specify. For ex ample;
if the present
RF Gen Freq setting is 250 MHz, a nd you want to cha nge it to 455
kHz, you would enter this sequence: 4 5 5 kHz.
Changing the Unit-of-Measure for Settings
To change the present unit-of- measure , position the cursor in front of the field and
press the key labeled with the desired unit. For example, position the cursor in
front of the
RF Gen Freq field and push GHz or kHz to display the setting in
either of these units.
65
Chapter 3, Operating Overview
Entering and Changing Numbers
To Change the Increment or Decrement Setting
Using the Pre-Defined Increment/Decrement Keys
The INCR ×10] and INCR ÷10] keys change the increment/decrement value by a
factor of 10.
For example; if the
the knob or push of the down-arrow or up-arrow keys, pushing INCR
Tune Freq presently changes by 10 MHz for every click of
×10] once
changes the increment value to 100 MHz.
Specifying An Increment Value
The INCR SET key is used to assign a specific increment value. The increment
value may use differen t units than the field you are incrementing/decrementing.
For instance; if the RF Generator
Amplitude setting is displayed in dBµV, you
could increment in units of dB or mV.
To change the increment value;
1. Move the cursor to the numeric entry field to be changed.
2. Press INCR SET, and enter the desired value and unit-of-measure using the DATA
keys.
3. Use the down-arrow and up-arrow keys or CURSOR CONTROL knob to change the
field’s value by the increment value you set.
Example of Setting an Increment Value
This example changes the Tune Freq in increments of 15 MHz.
1. Access the TX TEST screen and position the cursor in front of the Tune Freq field.
2. Press 1 0 0 MHz to set the frequency at 100 MHz.
3. Press INCR SET 1 5 MHz.
4. Turn the Cursor Control knob. The field’s value changes by 15 MHz for each knob
click.
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Printing A Screen
To Print A Screen’s Contents
1. Connect a printer to the appropriate rear-panel connector.
2. Access the PRINT CONFIGURE screen from the More menu and set the Printer
Port field to the appropriate type of printer connection.
If HP-IB is selected, enter the HP-IB Printer Address of the printer.
3. Select the type of printer you are using in the Model field. If your printer is not lis ted,
configure your printer to emulate one that is listed.
4. Enter a Print Title using the knob, if desired. This text will appear at the top of
your printout.
Chapter 3, Operating Overview
Printing A Screen
5. Display the screen you want to print and press and release the SHIFT key, then the
TESTS key to access the PRINT function.
To interrupt prin ti ng, s el ect the Abort Print field on the PRINT CONFIGURE
screen.
67
Chapter 3, Operating Overview
Using Measurement Limit Indicators
Using Measurement Limit Indicators
The LO LIMIT and HI LIMIT functions are used to define a measurement
“window” to alert you to measurements that are outside these limits. When limits
are assigned, Lo and/or Hi appear by the measurement.
A measurement that goes a bove or be low the defined limits causes three things to
happen:
1. A message appears at the top of the screen indicating a limit was exceeded.
2. The Lo or Hi indicator by the measurement flashes.
3. The Beeper beeps if it is has been enabled in the CONFIGURE screen.
Limits are helpful when you can’t watch the Test Set’s display while you are
making an adjustment on the eq uipment you are test ing or r epairing . They ar e also
a convenient way of alerting you to long-term measurement drift without having
to observe the screen.
To Set A HI and/or LO LIMIT
1. Position the cursor in front of the unit-of-measur e for the measuremen t that you are set-
ting limits for.
2. Press and release the SHIFT key, then the down-arrow key to access the LO LIMIT
function, and enter the measurement’s low-limit value and its unit-o f -measu re.
3. Press and release the SHIFT key, then the up-arrow key to access the HI LIMIT function, and enter the measurement’s high-limit value and its unit-of-measure.
1.The fundamental unit for the LIMITs does not have to be the same as the measure-
ment’s units. For instance; when measuring AC Level in Volts, you can set HI and LO
LIMITs in units of dBm.
1
1
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To Reset or Remove Limits
To reset a limit that has been exceeded
1. Position the cursor in front of the measurement’s unit-of-measure.
2. Press and release the SHIFT key, then the down-arrow (or up-arrow key) to access the
LO LIMIT (or HI LIMIT) function, then press ENTER or MEAS RESET.
To remove a limit
1. Position the cursor in front of the unit-of-measure for the assigned limit.
2. Press and release the SHIFT key, then the down-arrow (or up-arrow key) to access the
LO LIMIT (or HI LIMIT) function, then press ON/OFF.
Example of Setting HI and LO LIMITs
This example sets limits for the TX Freq Error measurement. Limits are being
set to indicate if a 100 MHz carrier varies more than
Chapter 3, Operating Overview
Using Measurement Limit Indicators
± 10 kHz.
1. Position the cursor in front of the unit-of-measure for the TX FREQ ERROR measure-
ment (the default is kHz).
2. Press and release the SHIFT key, then the down-arrow to access the LO LIMIT func-
tion, then enter 1 0 kHz.
3. Press and release the SHIFT key, then the up-arrow to access the HI LIMIT function,
then enter 1 0 kHz.
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Chapter 3, Operating Overview
Averaging Measurements
Averaging Measurements
The AVG (average) fun cti on al lows you to display the ave rag e va lue of a number
of measurements. You enter the number of measurement samples used to
calculate and display the measurement average. This dampens the effects of
rapidly changing measurements, providing a more usable measurement display.
To Use Measurement Averaging
1. Position the cursor in front of the measurement’s unit-of-measure.
2. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function.
The default number of average samples is displayed below the measurement.
•Enter the desired number of measurement samples to be used for calculating the av-
erage, or
•Press ON/OFF to use the currently-displayed number of samples.
3. To turn averaging off, position the cursor in front of the unit-of-measure and press and
release the SHIFT key, then the INCR ×10 key to access the AVG function, then press
the ON/OFF key.
When the averaging function is first enabled, a numeric average is calculated and
displayed each time a measurement is made. This continues until the specified
number of samples is reached. From that point on, the averaging function
performs an exponential filtering operation that mimics an RC filter.
Because of the exponential response, any large measurement changes result in a
displayed value that ramps up or down to the actual measured value.
Pressing MEAS RESET clears the measur ement hi story for all measure ments and
starts the averaging process over.
For more information on the theory of this filtering technique, refer to the April
1986 issue of the HP Journal, page 24.
Example of Using Measurement Averaging
This example enables the SINAD measurement to be averaged using 25 samples.
1. Press PRESET and wait for the instrument to display the RX TEST screen.
2. Position the cursor in front of the unit-of-measure for the SINAD measurement (default
is dB).
3. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function,
enter 2 5, then press the ENTER key. Avg appears below the displayed measurement
value to indicate that averaging is being used.
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Setting A Measurement Reference
The REF SET function establishes a measurement reference point. This allows
you to make a direct comparison between two measurement results, or between a
measurement standard and the actual measurement results.
Referenced measurements are displayed in one of two ways, depending on the
type of measurement:
Displayed value = Measurement − Reference. The difference between the measured
value and the reference value is displayed in the same unit-of-measure.
or
Displayed value = Measurement ÷ Reference. A ratio of the measured value to the
reference value is displayed in dB.
Chapter 3, Operating Overview
Setting A Measurement Reference
To Use the Present Value as a Reference
Position the cursor in front of the unit- of-measure for the measurement y ou want to set the
reference for.
1. Press and release the SHIFT key, then the INCR ÷10 key to access the REF SET func-
tion; then press enter ENTER.
2. Ref appears below the measurement.
The measurement displayed is now referenced to the measurement value present
when the reference was s et.
To Set a Specific Reference
1. Position the cursor in front of the unit-of-measure for the measurement you want to set
the reference for.
2. Press and release the SHIFT key, then the INCR ÷10 key to access the REF SET func-
tion.
3. Enter a reference value.
4. Ref appears below the measurement value to indicate a reference has been set.
The measurement displayed is now referenced to the value you entered.
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Chapter 3, Operating Overview
Using Memory Cards
Using Memory Cards
OTP (One Time Programmable) cards provide removable read-only storage. File
editing and erasure are not possible. These cards cannot be programmed by the
Test Set; they require a special memory card programmer to save files.
SRAM cards provide removable read/write memory for your files, similar to a
flexible disk. Data can be stored, re-stored, read, or erased as needed.
SRAM memory cards require a battery to maintain stored information.
Table 5Memory Card Part Numbers
Memory Type Part Number
64 kilobytesSRAMHP 83230A
1 MbyteSRAMHP 83231A
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Inserting and Removing Memory Cards
Figure 9 illustrates how to insert a memory card into the Test Set’s front panel. To
remove a memory card, simply pull it out.
The Test Set’s memory-card label is marked with an arrow that must be inserted
on the left side (when you are facing the Test Set) of the front-panel slot.
Memory cards may be inserted and removed with the Test Set powered on or off.
Chapter 3, Operating Overview
Using Memory Cards
Figure 9 Inserting a Memory Card
73
Chapter 3, Operating Overview
Using Memory Cards
Setting the Write-Protect Switch
The SRAM memory card’s write-protect switch lets the user secure its contents
from being overwritten or erased. The switch has two positions (see
•Read-write – The memory-card contents can be changed or erased, and new files may
written on the card.
•Read-only – The memory-card contents can be read by the Test Set, but cannot be
changed or erased.
figure 10 ):
Figure 10 Setting the SRAM Write-Protect Switch
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The Memory Card Battery
SRAM memory cards use a lithium battery to power the card. Listed below are the
batteries for the Test Set’s SRAM cards. SRAM cards typically retain data for
over 1 year at 25
SRAM Card Battery Part Numbers - CR2025 or HP 1420-0509Replacing the
Battery
Turn the Test Set on and insert the memory card. An inserted memory card takes power
from the Test Set, preventing the card’s contents from being lost.
1. Hold the memory card in the slot with one hand and pull the battery holder out with your
other hand. (See figure 11 .)
The Test Set’s SRAM cards have a Battery Holder Lock switch immediately above the
Write-Protect switch. If the switch is in the locked position the battery cannot be removed.
Ensure that the Battery Holder Lock switch is in the unlocked position before trying to
remove the battery.
Chapter 3, Operating Overview
Using Memory Cards
° C. To retain data, the battery should be replaced annually.
2. Install the battery with the side marked “+” on the same side marked “+” on the battery
holder. Avoid touching the flat sides of the battery, finger o ils may contaminate battery
contacts in the memory-card.
3. Re-insert the battery holder into the memory card.
The Test Set’s SRAM cards have a Battery Holder Lock switch immediately above the
Write-Protect switch. Ensure that the Battery Holder Lock switch is in the locked position
after installing the new battery.
4. Remove the memory card from the Test Set.
75
Chapter 3, Operating Overview
Using Memory Cards
Figure 11 Replacing the Memory Card’s Battery
WARNING:Do not mutilate, puncture, or dispose of batteries in fire. The batteries can burst or explode,
releasing hazardous chemicals. Discard unused batteries according to the manufacturer’s
instructions.
Memory Card Initialization
All new SRAM cards must be initialized before they can be used to store
information. The RAM_MANAGER procedure stored on the internal ROM Disk
can be used to quickly initialize any SRAM memory card.
SRAM Memory Cards can al so be initialize d f ro m th e TESTS screen by insert ing
the memory card i nto the front -panel slot an d selec ting t he Save /Delet e fie ld, then
selecting
on screen instructions to complete the process.
If the error message
the memory card has not been properly initialized. Check the SRAM battery to
ensure that it’s charged and inserted correctly in the battery holder.
Init Card or pressing the k3 USER k ey to i nitia lize a card. Follow t he
ERROR 85 Medium uninitialized appears on the screen
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Saving and Recalling Instrument Setups
The SAVE and RECALL functions al lo w you t o store different instr ument se tups
and retrieve them later, eliminating the task of r e-configuring the Test Set.
The number of available sa ve regi ster s depends on how many cha nges were made
to the base instrument setup for e ach save. (See
smaller the number of changes, the greater t he number of save regi sters that can
be used (typically over 200).
Save/Recall register settings can be saved to several types of mass storage. This
allows you to “back up the settings in case you need to clear them from memory
"Memory Considerations" on page 80) for running large programs, or when a
(see
firmware upgrade is performed (see
Chapter 3, Operating Overview
Saving and Recalling Instrument Setups
"BASE Settings" on page 80.) The
"Save/Recall" on page 441).
To Save an Instrument Setup
Use the More menu to access the I/O CONFIGURE screen. )
1. Select the storage media using the Save/Recall field. (The default is internal mem-
ory.
2. Make any changes to the instrument that you want to save in a register.
3. Press and release the SHIFT key then the RECALL key to access the SAVE function.
4. Use the DATA keys or the Save menu at the bottom right of the screen to enter the
register’s name.
To Recall an Instrument Setup
Use the More menu to access the I/O CONFIGURE screen.
1. Select the media to recall settings from using the Save/Recall field. The default is
internal memory.
2. Press RECALL.
3. Use the knob to select the desired setup to be recalled from the Recall menu at the
bottom-right of the screen.
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Chapter 3, Operating Overview
Saving and Recalling Instrument Setups
Example of Saving and Recalling an Instrument Setup
This example SAVES changes made to t he RX TEST screen, a nd then RECALLS
them. The register is s aved to wh ere ver th e
memory - unless you have changed it).
1. Access the RX TEST screen and set the RF Gen Freq to 500 MHz.
2. Set Amplitude to -35 dBm.
3. Press and release the SHIFT key then the RECALL key to access the SAVE function.
A prompt appears at the top of the screen asking you to enter a name.
4. Using the DATA keys, press 1 2 3 ENTER to assign a name to these changes.
5. Press PRESET and wait for the instrument to return to normal operation.
6. If not already displayed, access the RX TEST screen. Notice that the RF Gen Freq
and Amplitude settings are reset to their preset values.
7. Press RECALL 1 2 3 ENTER. The RF Gen Freq and Amplitude are changed to
the settings you saved in register 123 (500 MHz and -35 dBm).
Save/Recall field is set (internal
To Remove (Clear) an Individual Save Register
Specify where the register is stored using the Save/Recall field on the I/O CONFIGURE screen.
1. Press RECALL.
2. Use the knob to position the cursor in front of the register to be removed from the Re-
call menu at the bottom-right of the screen. The register name and percentage of
memory occupied by that register are indicated at the top of the screen.
3. Press ON/OFF. A prompt appears, asking if you want to delete the save register.
4. Press YES.
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To Clear All Save Registers
1. Press RECALL.
2. Use the knob to position the cursor in front of the *Clr All* entry in the Recall
menu at the bottom-right of the screen.
3. Press the knob or press ENTER. A prompt appears at the top of the screen to verify that
you want to clear all registers.
4. Press YES.
Register Names
You can use any number, letter, or combination of numbers and letters as a name
for storing instrument settings. For instance; if you want to save a setup for testing
a “Vulcan7” radio, you can save the setting as “VULCAN7”.
Two register names are reserved for special purposes: POWERON and BASE.
Chapter 3, Operating Overview
Saving and Recalling Instrument Setups
POWERON Settings
When the Test Set is turned on, it uses a set of instrument setup parameters
specified at the time of manufacture. You can have the instrument power up in a
different state by making the desired changes to the original settings, and then
saving them using the name POWERON.
The next time the instrument is turned on, the instrument returns to the state
present when you saved the POWERON setting. For instance; if the
OSCILLOSCOPE screen was displayed when POWERON was saved, it is the
screen that is displayed when you turn the instrument on.
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Chapter 3, Operating Overview
Saving and Recalling Instrument Setups
BASE Settings
The BASE register contains any field settings the user has saved that are different
from the instrument preset state. It establishes a reference point for all future
saves. If a base is not saved, the preset state is used as the reference.
When you save an instrument setup, the new setup is compared to the base
settings, and any differences are stored under the register name you supply.
Because only differences are stored, a much larger number of instrument setups
can be saved than if the contents of every field was saved.
When you recall an ins trument se tting, ev ery fiel d is reset to the base sett ings. The
saved settings are then used to re-establish the desired instrument setup.
CAUTION:Since each save/recall register only contains the differences between th e setup bein g saved an d
the present base register setti ngs, changing the base settings causes all other saved setu ps to be
erased from memory (including the POWERON setting if one has been saved).
Unless you consistently change the same fields to the same value each time you use the
instrument, you should avoid creating your own BASE settings.
Memory Considerations
When the Save/Recall field of the I/O CONFIGURE screen is set to
Internal, programs are saved to the same non-volatile RAM used to create
RAM Disk(s) and run I BASIC p rog ram s . By saving a large number of instrument
setups, you reduce the amount of RAM available to run programs. If you get a
“memory overflow” message while trying to load a program, you must clear one
or more save/recall registers to fr ee RAM space.
Instrument Hardware Changes
Recalling a saved register that uses a hardware option that has been removed
(such as an audio filter) results in unspecified operation. Re-install the needed
option before attempting to recall the associated register(s).
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Using USER Keys
Chapter 3, Operating Overview
Using USER Keys
User keys instantly access instrument settings without using the knob. You can
use user keys to move quickly between fields on the same screen, and to access
field settings that are not normally available on the screen you are using.
Local user keys are used to move bet ween sett in gs on the scre en that is displa yed .
When the user key is pressed, the cursor instantly moves to, and selects, the
assigned field; eliminating the need to turn and push the knob. Five local user
keys are available for each screen: k1, k2, k3, k4, and k5.
Five factory-assi gned local user k eys ar e available in e ach screen; however, us ing
these keys removes any other local user keys you may have already set up.
Global user keys are used to access settings that are not available on the current
screen. Three global user keys are available: k1’, k2’, and k3’. (These are shifted
functions of the local user keys.)
When defining user keys, the ASSIGN function is used to create key definitions;
the RELEASE function removes the definitions. Re-assigning a user key to a
different field setting automatically releases it from the setting it was previously
associated with.
81
Chapter 3, Operating Overview
Using USER Keys
To Use the Pre-Assigned Local USER Keys
1. Press and release the SHIFT key, then the k4 key to access the ASSIGN function; then
press the ENTER key. The numbers 1 thr oug h 5 app ear in front of various fields. (See
figure 12 .)
2. Press the different local user keys (k1 to k5) and notice how the cursor immediately
moves to the corresponding field.
3. To stop using the default local user keys, press and release the SHIFT key, then the k5
key to access the RELEASE function; then press the ENTER key.
Figure 12 An Example of Pre-Assigned Local User Keys
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scnusr.wmf
To Assign Local USER Keys
1. Move the cursor to the field you want to assign a local user key to.
2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function. Then
press a local USER key (k1-k5). The user key number appears in front of the field you
assigned it to.
Example of Assigning a Local USER Key
Use this example to assign local USER key k1 to the Filter 1 field in the RX
TEST screen.
1. Access the RX TEST screen and position the cursor in front of the Filter 1 field.
2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function; then
press k1. A small 1 appears next to the field indicating that USER key k1 has been assigned to it.
3. Move the cursor to any other field on the s creen and press k1. The cursor immediately
returns to the Filter 1 field. The field is also highlighted to change the entry using
the CURSOR CONTROL knob or arrow keys.
Chapter 3, Operating Overview
Using USER Keys
To Release Local USER Keys
1. Display the screen containing the user key assignment to be removed.
2. Press and release the SHIFT key, then the k5 key to access the RELEASE function; then
press the USER key (k1-k5).
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Chapter 3, Operating Overview
Using USER Keys
To Assign Global USER Keys
1. Move the cursor to the field you want to assign a global user key to.
2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function. Then
press SHIFT and a global USER key (k1’ - k3’). Unlike a local user key, the user key
number does not appear at this field; instead, a prompt appears at the top of the screen
confirming the key assignment.
Example of Assigning a Global USER Key
Use this example to assi gn glob al USER k ey k1’ t o the AF Anl In field, and then
access this field from the OSCILLOSCOPE screen.
1. Access the AF ANALYZER screen and position the cursor in front of the AF Anl In
field.
2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function.
3. Press SHIFT, k1’. Notice the prompt Global User key 1 assigned. at the top
of the screen.
4. Access the OSCILLOSCOPE screen.
5. Press SHIFT, k1’.
AF Anl Input
present input is set to FM Demod). To change the input, use the arrow keys
(down-arrow or up-arrow), or press ENTER to access the
A field that is accessed using a global user key is only displayed at the top of the
screen while it is being accessed. Moving the cursor to any other field in the
screen causes the user key field to disappear until it is accessed again.
To Release Global USER Keys
1. Move the cursor to the field with the global user key assigned to it.
2. Press and release the SHIFT key, then the k5 key to access the RELEASE function.
Then press SHIFT and the USER key to be released (k1’-k3’).
, FM Demod is displayed at the top of the screen (assuming the
Choices menu.
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Setting an RF Generator/Analyzer Offset
You can set a fixed frequency offset between the RF Generator and the
RF Analyzer. This feature is convenient for testing radios with a fixed
transmit/receive frequency offset.
To Set an RF Offset
1. Access the CONFIGURE screen.
2. Position the cursor in front of the RF Offset field, and press the Cursor Control knob,
or press ENTER to turn the offset On or Off.
3. Select the (Gen)-(Anl) field and enter the frequency offset value.
Chapter 3, Operating Overview
Setting an RF Generator/Analyzer Offset
Example of Setting an RF Offset
1. Access the CONFIGURE screen.
2. Set the RF Offset to On.
3. Enter an offset frequency ((Gen)-(Anl)) of 10 MHz.
4. Access the DUPLEX screen.
5. Set the Tune Mode to Manual.
6. Select the RF Gen Freq field, and rotate the Cursor Control knob to vary the RF Gen-
erator’s frequency.
7. Notice that the Tune Freq value changes to maintain the 10 MHz difference between
the generator and the analyzer.
1
1.Manual tuning is used in this example to prevent possible unexpected Tune
Frequency changes during the procedure.
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Chapter 3, Operating Overview
Using Remote Control
Using Remote Control
The Test Set can be remotely controlled several ways:
•Using HP-IB control from a computer/controller.
•Using IBASIC programs on memory cards.
•Using an ASCII terminal connected to the serial port.
Using HP-IB Control
The Programmer’s Guide contains information on writing HP-IB control
programs for the Test Set. Programming examples and a syntax listing provide
general HP-IB operation guidelines.
Running IBASIC Programs from Memory Cards
The documentation shipped with HP 11807 software packages explains how to
run those programs from memory cards. Refer to the Programmer’s Guide for
detailed information on using memory cards with your own IBASIC programs.
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Using an ASCII Terminal
Connecting an ASCII terminal to the serial port allows you to remotely operate
the Test Set by entering characters that represent each front-panel control.
Before you can use this feature, you must first set the required serial port settings
in the I/O CONFIGURE screen, and make any hardware connections.
Chapter 3, Operating Overview
Using Remote Control
The Serial Port connections are described in
Knob Descriptions"
To Configure for Serial Port Operation
1. Access the I/O CONFIGURE screen.
2. Set the Serial In field to Inst.
3. Set the IBASIC Echo field to On.
4. Set the Inst Echo field to On.
5. Set the remaining serial communications fields according to your terminal/computer’s
serial communication requirements. These fields include:
•Serial Baud
•Parity
•Data Length
•Stop Length
•Rcv Pace
•Xmt Pace
6. The Test Set now responds to the equivalent characters sent to it by the terminal/com puter.
Equivalent Front-Panel Control Characters
Table 6 on page 88
.
lists the terminal/computer keystrokes that equate to front-
chapter 24, "Connector, Key, and
panel controls. Each sequence must be preceded by the Escape key.
For example, to remotely access th e CONFIGURE scr een, pre ss the Esc key , then
press the C key on your te rminal/com puter. Be sure to use uppe r -case C for this
example.
Alternate sequences for 5 commonly-used functions are also available. Hold
down the Cntl (control) key and select the corresponding key for the desired
function. Example: Cntl H moves the cursor to the left one space.
ENTER - J or M
CANCEL - C
BACKSPACE - H
KNOB_TURN_CW - R
KNOB_TURN_CCW - L
ESC
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Chapter 3, Operating Overview
Using Remote Control
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4
Adjacent Channel Power Screen
NOTE:This screen is displayed on the Test Set with Option 102, Spectrum Analyzer.
This screen is used to measure Adj acent Cha nnel Power . This is a measur ement of
the power of signals at a specific channel spacing above and below the RF
Analyzer’s center frequency. This screen is accessed by selecting
from the
To Screen menu.
AD CH PWR
91
Chapter 4, Adjacent Channel Power Screen
How the Test Set Measures Adjacent Channel Power (ACP)
How the Test Set Measures Adjacent Channel Power (ACP)
When you access t his scr een, the Te st Set au tomatical ly st arts a multi-st ep proces s
for measurin g ACP:
1. AF Generator 1 is turned off if the Carrier Ref field is set to Unmod.
2. The amplitude of the center frequency (Tune Freq) is measured to establish a
reference.
3. AF Generator 1 is turned back on if it was previously turned off.
4. The power in each of the adjacent channels is analyzed.
5. Adjacent Channel Power is calculated and displayed. This value can be displayed as an
absolute power level or as a ratio referenced to the center frequency’s level.
Which Input Port to Use. The TX Power measurement is used to calculate absolute
Adjacent Channel Power. Since TX Power can only be measured using the RF IN/OUT
port, you must use this port to measure ACP Level. ACP Ratio can be measured using
either the RF IN/OUT or the ANT IN port.
Measuring ACP on AM Transmitters. When measur ing AM signals, the reference level
must be measured on an unmodulated carrier; so the Carrier Ref field must be set to
Unmod. After the reference is measured, the power in the adjacent channels must be measured with modulatio n . This req uires th e m odulating signal to be turned off and on repeatedly as measurements are being calculated and displayed. Since the Test Set automatically
turns AFGen1 on and off w hen the Carrier Ref field is set to Unmod, you must use
AFGen1 and the AUDIO OUT port as the modulation source for making AM ACP measurements.
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Field Desc ri p tions
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
Figure 13 The Adjacent Channel Power Screen
ACP Meas
This field selects the format for displaying upper and lower adjacent channel
power levels.
•Ratio displays the power levels relative to the power around the center frequency
(Tune Freq). Levels can be displayed in dB or as a percentage (%).
•Level displays the absolute power levels in mW, W, dBm, V, mV, and dBmV.
Operating Considerations
TX Power
Four dashes are displaye d for these mea surements when the
Ant (ANT IN).
ACP Ratio can be measured on either the ANT IN port or RF IN/OUT port.
For more information, refer to
Power (ACP)" on page 92
and ACP Level can only be measured through the RF IN/OUT port.
.
adchpwr.wmf
Input Port is set to
"How the Test Set Measures Adjacent Channel
93
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
AFGen1 Freq
This field sets the frequency for the first audio frequency sinewave generator.
AFGen1 To
This field sets two values:
•The upper field determines whether the AFGen1 signal modulates the RF Generator or
is output through the AUDIO OUT connector.
•The lower field sets the depth of modulation for FM and AM in kilohertz and amplitude
(including Off) for audio out. The AUDIO OUT level is always in volts rms.
Operating Considerations
This is a priority control field. Accessing the RX TEST or TX TEST screen
overrides any changes made to this field in other screens.
Carrier Ref
Channel BW
See Also
"Interaction Between Screens" on page 54
Use the carrier reference field to indicate whether the carrier (Tune Freq) being
measured should be unmodulated or modulated when making the ACP reference
measurement. (For more information, refer to
Adjacent Channel Power (ACP)" on page 92
Operating Considerations
•FM transmitters can be measured with the carrier modulated or unmodulated.
•For AM transmitters, the carrier must be measured while unmodulated. AFGen1 and
the AUDIO OUT port must be used as the modulation source whenever Unmod is
selected.
"How the Test Set Measures
.)
Use the channel bandwidth field to specify the bandwidth of the carrier and
adjacent channels to be measured. (See
figure 14 .)
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Chapter 4, Adjacent Channel Power Screen
Field Descriptions
adchpwr1.wmf
Figure 14 Relationship Between Tune Freq, Ch Offset, and Channel BW Fields
95
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
Ch Offset
Use the channel offset field to enter the frequency difference between the Tune
setting and the center of the adjacent channels you want to measur e. Thi s is
Freq
an absolute value; only positive values can be entered. See
Ext TX key
This field controls a switch at the MIC/ACC connector. Use it to “key” an
external transmitter.
See Also
"MIC/ACC" on page 572
Input Atten
figure 14 .
Input Attenuation sets the amount of input attenuation for the RF IN/OUT and
ANT IN connectors. This function controls two settings:
•The upper field determines if you want the instrument to set the attenuation automatically (Auto), or if you want to set the value manually (Hold).
•The lower field displays the present attenuation value, and is used to set the desired attenuation level when the upper area is set to Hold.
Operating Considerations
Input Attenuator autor angi ng can interfere with oscill oscope or signaling decoder
operation under certain conditions.
See "Input Atten," in chapter 17, on page 477
for additional information.
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Input Port
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
This field selects the RF IN/OUT or ANT IN port for making RF measurements.
The RF IN/OUT port must be used for making TX Power or ACP Level
measurements on this screen.
Operating Considerations
Power levels for each port are printed on the Test Set’s front panel. If the RF
power at the RF IN/OUT port exceeds allowable limits, a loud warning signal
sounds and a message appears at the top of the screen. If this occurs, disconnect
the RF power, press the MEAS RESET key, and allow the Test Set to cool off for
approximately two minutes before making any other measurements on this port.
The ANT IN (antenna input) connector provides a highly-sensitive input for very
low level signals (such as “off the air” measurements). You cannot measure TX
(RF) Power or ACP Level on this screen using the ANT IN port.
CAUTION:Connecting a signal of >200 mW to the ANT IN port can cause instrument damage
(although internal protection circuits can typically withstand a short-duration signal of 1 or
2 Watts).
If the overpower circuit is triggered (signified by a warning message at the top of
the screen), remove the signal from the ANT IN port, and press the MEAS
RESET key or turn the Test Set off and on to reset it.
Lower and Upper ACP [Ratio:Level]
These two measurement s display th e amount of power in signals abo ve and below
Tune Freq signal. The level is displayed as a ratio (referenced to the power
the
around the
See Also
ACP Meas
Tune Freq) or as an absolute value.
field description, on page 93
97
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
Res BW
The resolution bandwidth field selects the IF filter used when measuring the
power of the carrier and the adjacent channels.
Operating Considerations
Using a narrower bandwidth filter (300 Hz) slows the measurement, but rejects
carrier leakage and out of channel spurs. Using a wider bandwidth filter
(1 kHz) speeds measurements, but may allow unwanted spurs and carrier leakage
to be integrated into th e measureme nt when measuri ng at the edges of the select ed
channel bandwidth.
Tune Freq
This field sets the center frequency for the RF signal to be analyzed.
Tune Mode
See Also
Tune Mode
field description (this page)
This field selects Automatic or Manual tuning of the RF Analyzer.
Auto tuning causes the RF Analyz er to f ind th e sign al with th e great est a mplitu de
>-36 dBm, and to set the Tune Frequency for that signal.
Manual tuning requires the operator to set the Tune Frequency for the RF signal
to be analyzed.
Operating Considerations
Changing the Tune Mode also changes the RF frequency display. Automatic
tuning enables the
TX Freq Error measurement.
TX Frequency measurement. Manual tuning enables the
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TX Freq Error/TX Frequency
This measurement displays Transmitter Frequency Error or absolute Transmitter
Frequency.
See Also
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
TX Power
TX Pwr Meas
Tune Mode
field description (this page)
Transmitter Power measures RF power at the RF IN/OUT port.
Operating Considerations
Only the RF IN/OUT port can be used for measuring TX Power on this screen.
When the
Input Port is set to Ant, four dashe s (- - - -) appear in place of di git s
for this measurement.
1
Use the Spectrum Analyzer
to measure low-level RF power (≤200 mW) at the
ANT IN port.
The transmitter power measurement field specifies how transmitter power
measurements are made:
•Peak can be used to measure AM, FM, and un-modulated (CW) signals.
•Sample can be used to measure FM or CW signals with increased measurement speed.
This method can only be used with signals having no amplitude modulation component.
TX Pwr Zero
Operating Considerations
If you change this field, zero the power measurement (using the TX Pwr Zero
field) before measuring power.
The transmitter power zero function establishes a 0.0000 W reference for
measuring RF power at the RF IN/OUT port.
1.O ptional on some Test Set models.
99
Chapter 4, Adjacent Channel Power Screen
Field Descriptions
CAUTION:RF power must not be applied while zeroing. Set the RF Generator screen’s Amplitude
field to off to prevent internal cross-coupling into the power detector while zeroing.
Operating Considerations
When power is applied to the RF IN/OUT connector, the temperature of the
internal circuit ry incr eases. This can cause chan ges in t he TX Power mea surement
when low power levels are measured immediately following high power
measurements.
When alternately making high and low power measurements, always zero the
power meter immediately before making the low power measurements; this
provides the best measurement accuracy.
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