Agilent 8920A User Manual

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Agilent Technologies 8920A

RF Communications Test Set

User’s Guide

Firmware Version A.18.01 an d above

POWE

OF O

SCREEN CONTROL

CONFIHELPMSSG HOLD PRINT DUPLETXRX PREV TESTS

DATA FUNCTIONS

USER

k1’

REF

METER

INCR

k2’

LO HI

k2 k3’

CURSOR CON-

ASSIG

RELEA

PUSH TO

SHIFT

CANCE

MIC/

MAX POWER

ANT INDUPLEX OUTRF IN/OUT

MAX POWER 200

Agilent Part Number: 08920-90219

Printed in U. S. A.

April 2000

Rev. C

AVG INCR

ON/OFF

INSTRUMENT STATE

ADRS

SAVE

LOCAL

RECAL

DATA

789 456

123

YES

AUDIO SQUELCVOL-

MAX

MEAS

ENTER

GHz

MHz

kHz

Hzms% Ωppm

AUDIO IN

PRESE

MEMO

LOHI

MAX

Notice No part of this manual may be reproduc ed in any form or by any means (i ncluding

electronic sto rage and retrie val or translat ion into a for eign language) wit hout prior agreement and written consent from Agilent Technologies Inc. as governed by United States and international copyright laws.

The material contained in this document is subject to change without notice. Agilent Technologies makes no warranty of any kind with regard to th is mate rial, including, but not limit ed to, the implied war ranties of merc hantabil ity and fi tness for a particular purpo se. Agilent Technologies Inc. shall not be liable fo r errors contained herein or for inciden tal or conseque ntial damages in connection wi th the furnishing, performance, or use of this material.

U.S. Government users will receive no greater than Limited Rights as defined in FAR 52.227-14 (June 1987) or DFAR 252.227-7015 (b)(2) (November 1995), as applicable in any technical data.

Agilent Technologies Learning Products Department 24001 E. Mission Liberty Lake, WA 99019-9599 U.S.A.

Edition/Print Date All Editions and Updates of this manual and their creation dates are listed below.

Rev. A . . . . . December 1997

Rev. B . . . . . March 1998

Rev. C . . . . . April 2000

Safety Summary The following gener al safety prec autions must be observed du ring all phase s of op-

eration of this instr ument. Failure to comply with thes e precautions or with specifi c warnings elsewhere in this manual violates safety standards of design, manufacture, and intended use of the instrument. Agilent Technologies Inc. assumes no liability for the customer’s failure to comply with these requirements.

GENERAL

This product is a Safety Class 1 instrument (provided with a protective earth terminal). The protective features of this product may be impaired if it is used in a manner not specified in the operation instructions.

All Light Emitting Diodes (L EDs) used in this product are Class 1 LEDs as per IEC 60825-1.

This product has been designed and tested in accordance with IEC Publication 1010, "Safety Requirements for Electronic Measuring Apparatus," and has been supplied in a safe condition. This ins tr uct io n d ocumentation contains information and warnings which must be followed by the user to ensure safe operation and to maintain the product in a safe condition.

ENVIRONMENTAL CONDITIONS

This instrument is intended for indoor use in an installation category II, pollution degree 2 environment. It is desi gned to operate at a maximum relative humi dity of 95% and at altitudes of up t o 2000 meters. Re fer to the s pecifications tables for the ac mains voltage requirements and ambient operating temperature range.

V entilation Requirements: When installing the product in a cabinet, the convection into and out of the product must not be restricted. The ambient temperature (outside the cabinet) must be les s than the maximum operating temperature of the prod-

uct by 4° C for every 100 watts dissipated in the cabinet. If the total power dissipated in th e cabi net is gr eater than 8 00 watts , t hen for ced con vec tion mus t be used.

BEFORE APPLYING POWER

Verify that the product is set to match the available line voltage, the correct fuse is installed, and all s afety precaut ions are ta ken. Note the inst rument's exter nal markings described under Safety Symbols.

GROUND THE INSTRUMENT

T o mi nimize s hock hazard , the inst rument chas sis and c over must be connec ted to an electrical protective earth ground. The instrument must be connected to the ac power mains through a grounded power cable, with the ground wire firmly connected to an elec trical ground (safety ground) at the power outlet. Any inte rruption of the protective (grounding) conductor or disconnection of the protective earth terminal will cause a potential shock hazard that could result in personal injury.

FUSES

Only fuses with the requ ired rated current, voltage, and spe cified type (normal blow , time de lay, etc.) should be used. Do not use repai red fuses or short-cir cuited fuse holders. To do so could cause a shock or fire hazard.

DO NOT OPERATE IN AN EXPLOSIVE ATMOSPHERE

Do not operate the instrument in the presence of flammable gases or fumes.

DO NOT REMOVE THE INSTRUMENT COVER

Operating personnel mus t not remove in strument cover s. Component repl acement and internal adjustments must be made only by qualified service personnel.

Instruments that appear damaged or defective should be made inoperative and secured against un intended operation until they can be repaired by quali fied service personnel.

WARNING: The WARNING sign denotes a hazard. It calls attention to a procedure, practice, or

the like, which, if not correctly performed or adhered to, could result in personal injury. Do not proceed beyond a WARNING sign until the in dicated conditions are fully understood and met.

CAUTION: The CAUTION sign denotes a hazard. It calls attention to an operating procedure, or the

like, which, if not correctly performed or adhered to, could result in damage to or destruction of part or all of the product. Do not proceed beyond a CAUTION sign until the indicated conditions are fully understood and met.

Safety Symbols

Caution, refer to accompanying documents

Warning, risk of electric shock

Earth (ground) terminal

Alternating current

Frame or chassis terminal

Standby (supply). Units with this s ymbol are not compl etely disco nnected from a c mains when th is switch is off.

T o completely disconnec t the unit from ac mains, either disco nnect the power cord, or have a qualified electrician install an external switch.

Product Markings CE - the CE mark is a registered trademark of the European Community. A CE

mark accompanied by a year indicated the year the design was proven. CSA - the CSA mark is a registered trademark of the Canadian Standards Associ-

ation.

CERTIFICATION Agilent Technologies certifies that this product met its published specifications at

the time of shipment fr om the fac tory . Agilent T echnol ogies further cer tifies tha t its calibration measurements are traceable to the United States National Institute of

Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members

Agilent Technologies Warranty Statement for Commercial Products Agilent Technologies 8920A RF Communications Test Set

Duration of Warranty: 1 year

1. Agilent Technologies warrants Agilent Technologies hardware, accessories and

supplies against defects in materials and workmanship for the period specified above. If Agilent Technologies receives notice of such defects during the warranty period, Agilent Technologies will, at its option, either repair or replace products which prove to be defective. Replacement products may be either new or like-new.

2 Agilent Technologies warrants that Agilent Technologies software will not fail to exe-

cute its programming instructions, for the period specified above, due to defects in material and workmanship when properly installed and used. If Agilent Technologies receives notice of such defects during the warranty period, Agilent Technologies will replace software media which does not execute its programming instructions due to such defects.

3. Agilent Technologies does not warrant that the operation of Agilent Technologies

products will be uninterrupted or error free. If Agilent Technologies is unable, within a reasonable time, to repair or replace any product to a condition as warranted, customer will be entitled to a refund of the purchase price upon prompt return of the product.

4 Agilent Technologies products may contain remanuf actured parts equ ivalent to new in

performance or may have been subject to incidental use.

5. The warranty period begins on the date of delivery or on the date of installation if

installed by Agilent Technologies. If customer schedules or delays Agilent Technologies installation more than 30 days after delivery, warranty begins on the 31st day from delivery.

6 Warranty does not apply to defects resulting fro m (a) improper or inadequate mainte-

nance or calibration, (b) software, interfacing, parts or supplies not supplied by Agilent Technologies, (c) unauthorized modification or misuse, (d) operation outside of the published environmental specifications for the product, o r (e) improper site preparation or maintenance.

7 TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE WARRANTIES

ARE EXCLUSIVE AND NO OTHER WARRANTYOR CONDITION, WHETHER WRITTEN OR ORAL IS EXPRESSED OR IMPLIED AND AGILENT TECHNOLOGIES SPECIFICALLY DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS FOR A PARTICULAR PURPOSE.

8. Agilent Technologies will be liable for damage to tangible property per incident up to

the greater of $300,000 or the actual amou nt pai d for the prod uct that i s the subject of the claim, and for damages for bodily injury or death, to the extent that all such damages are determined by a court of competent jurisdiction to have been directly caused by a defective Agilent Technologies product.

9. TO THE EXTENT ALLOWED BY LOCAL LAW, THE REMEDIES IN THIS

WARRANTY STATEMENT ARE CUSTOMER’S SOLE AND EXCLUSIVE REMEDIES. EXCEPT AS INDICATED ABOVE, IN NO EVENT WI LL AGIL ENT TECHNOLOGIES OR ITS SUPPLIERS BE LIABLE FOR LOSS OF DATA OR FOR DIRECT, SPECIAL, INCIDENTAL, CONSEQUENTIAL (INCLUDING LOST PROFIT OR DATA), OR OTHER DAMAGE, WHETHER BASED IN CONTRACT, TORT, OR OTHERWISE.

FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW ZEALAND: THE WARRANTY TERMS CONTAINED IN THIS STATEMENT, EXCEPT TO THE EXTENT LAWFULLY PERMITTED, DO NOT EXCLUDE RESTRICT OR MODIFY AND ARE IN ADDITION TO THE MANDATORY STATUTORY RIGHTS APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU.

ASSISTANCE Product maintenance agreements and other customer assistance agreements are

available for Agilent Technologies products. For any assistance, contact your nearest Agilent Technologies Sales and Service Office.

DECLARATION OF CONFORMITY

according to ISO/IEC Guide 22 and EN 45014

Manufacturer’s Name:

Agilent Technologies

Manufacturer’s Address:

24001 E. Mission Avenue Liberty Lake, Washington 99019-9599 USA

declares that the product

Product Name: Model Number: Product Options:

RF Communications T est Set / Cell Site Test Set A g i l e nt Te c h n o l o gi e s 8 9 20 A , 8 92 0 B , a nd 8 92 1 A This declaration covers all options of th e above

product.

conforms to the following Product specifications:

Safety: IEC 1010-1:1990+A1+A2/EN 61010-1:1993

EMC: CISPR 11:1990 / EN 55011:1991 Group 1, Class A

EN 50082 -1 : 1 9 9 2 IEC 801-2:1991 - 4 kV CD, 8 kV AD IEC 801-3:1984 - 3V/m IEC 801-4:1988 - 0.5 kV Sig. Lines, 1 kV Power Lines

Supplementary Information:

This is a class A product. In a domestic environment this product may cause radio interference in which case the user may be required to take adequate measures.

This product herewith complies with the requirements of the Low Voltage Directive 73/23/EEC and the EMC Directive 89/336/EEC and carries the CD-marking accordingly

Spokane, Washington USA November 20, 1998 Vince Roland/Quality Manager

Table 1 Regional Sales Offices

United States of America: Agilent Technologies Test and Measurement Call Center P.O. Box 4026

Englewood, CO 80155-4026

(tel) 1 800 452 4844

Japan:

Agilent Technologies Japan Ltd. Measurement Assist ance Center 9-1 Takakura-Cho, Hachioji-Shi, Tokyo 192-8510, Japan

(tel) (81) 456-56-7832 (fax) (81) 426-56-7840

Asia Pacific:

Agilent Technologies 24/F, Cityplaza One, 111 Kings Road, Taikoo Shing, Hong Kong

Canada: Agilent Technologies Canada Inc. 5150 Spectrum Way Mississauga, Ontario L4W 5G1

(tel) 1 877 894 4414

Latin America:

Agilent Technologies Latin America Region Headquarters 5200 Blue Lagoon Drive, Suite #950 Miami, Florida 33126 U.S. A.

(tel) (305) 267 4245 (fax) (305) 267 4286

Europe: Agilent Technologies European Marketing Organization P.O. Box 999 1180 AZ Amstelveen The Netherlands

(tel) (3120) 547 9999 Australia/New Zealand:

Agilent Technologies Australia Pty Ltd. 347 Burwood Highway Forest Hill, Victoria 3131

Australia (tel) 1 800 629 485 (fax) (61 3) 9272 0749

New Zealand (tel) 0 800 738 378 (fax) (64 4) 802 6881

(tel) (852) 3197 7777 (fax) (852) 2506 9233

Service and Support

Table 2

Any adjustment, maintenance, or repair of this p roduct must be performed by qu alified personnel. Contact your customer engineer through your local Agilent Technologies Service Cen ter. You can find a list of local service representat ive s on the Web at:

http://www.agilent-tech.com/services/English/index.html If you do not have ac cess to the I nternet, one of these centers c an direct you t o your

nearest representative:

United States Test and Measu rement Call Center (Toll free in US)

Europe

Canada

Japan Measurement Assistance Center

Latin America

Australia/New Zealand

Asia-Pacific

(800) 452-4844

(31 20) 547 9 900

(905) 206-4725

(81) 426 56 7832 |(81) 426 56 7840 (FAX)

(305) 267 4288 (FAX)

1 800 629 485 (Australia) 0800 738 378 (New Zealand)

(852) 2599 7777 (852) 2506 9285 (FAX)

Manufacturer’s Declaration

This statement is provi ded to co mply with the req uiremen ts of t he German Sou nd Emission Directive, from 18 January 1991.

This product has a sound pressure emission (at the operator position) < 70 dB(A).

• Sound Pressure Lp < 70 dB(A).

• At Operator Position.

• Normal Operation.

• According to ISO 7779:1988/EN 27779:1991 (Type Test).

Herstellerbescheinigung

Diese Information steht im Zusammenhang mit den Anforderungen der

Maschinenlärminformationsverordnung vom 18 Januar 1991.

• Schalldruckpegel Lp < 70 dB(A).

• Am Arbeitsplatz.

• Normaler Betrieb.

• Nach ISO 7779:1988/EN 27779:1991 (Typprüfung).

In this Book The Agilent 8920A is refer red to in this document as the "Test Set."

Chapter 1, Get Started

This chapter describes the basic operation of the Test Set. It also provides a quick check that verifies that the Test Set is operating properly.

Chapter 2, Configuring Your Test Set

This chapter describes various instrument configuration settings that affect the general operation of the instrument.

Chapter 3, Operating Overview

This chapter contains detailed operating instructions a nd examp les for using several instrument features.

Chapters 4 through 23, Screen and Field Descriptions

These chapters contains reference information for each screen an d its fields. Man y of

the descriptions contain signal flow diagrams that relate the screen’s fields to the functions they perform. The screens are arranged in alphabetical order by title at the top of the screen; Signaling Encoder and Signaling Decoder are alphabetized by the names Encoder and Decoder.

Chapter 24, Connector, Key, and Knob Descriptions

This chapter describes the purpose and use of each connector and control.

Chapter 25, Modifications, Accessories, Manuals, Support

This chapter describes retrofit kits, accessories, manuals, and customer support available for your Test Set.

Error Messages

This section discusses error and operating messages.

Contents

1 Get Started

Before Connecting a Radio 40

Accessing the Test Set’s Screens 41

Changing A Field’s Setting 43

How do I Verify that the Test Set is Operating Properly? 46

Instrument Functional Diagram 47

Contents

2 Configuring Your Test Set

General Operating Info rmation 50

Contents

Operating Overview

Interaction Between Screens 54

Displaying Measurements 57

Entering and Changing Numbers 63

Printing A Screen 66

Using Measurement Limit Indicators 67

Averaging Measurements 69

Setting A Measurement Reference 70

Using Memory Cards 71

Saving and Recalling Instrument Setups 76

Using USER Keys 80

Setting an RF Generator/Analyzer Offset 84

Using Remote Control 85

Contents

4 Adjacent Channel Power Screen

How the Test Set Measures Adjacent Channel Power (ACP) 90

Field Descriptions 91

Contents

5 AF Analyzer Screen

Block Diagram 100

Contents

6 Call Processing Subsystem

Description of the Call Processing Subsystem 114

Using the Call Processing Subsystem 118

The CALL CONTROL Screen 122

Using the CALL CONTROL Screen to Test Call Processing Functions 134

CALL DATA Screen 144

CALL DATA Screen Message Field Descriptions 149

Using the CALL DATA Screen 158

CALL BIT Screen 166

CALL BIT Screen Message Field Descriptions 172

Using the CALL BIT Screen 192

ANALOG MEAS Screen 197

Using the ANALOG MEAS Screen 200

CALL CONFIGURE Screen 203

Contents

7 Configure Screen

Field Descriptions 206

Contents

8 Signaling Decoder Screen

Field Descriptions for Decoder Modes 220

AMPS-TACS, NAMPS-NTACS Decoder 221

Using the AMPS/TACS, NAMPS/NTACS Decoder 226

Continuous Digital Controlled Squelch System Decoder 230

Using the CDCSS Decoder 234

Digital Paging Decoder 235

Dual-Tone Multi-Frequency (DTMF) Decoder 239

Using the DTMF Decoder 244

EDACS Decoder 245

Using the EDACS Decoder 248

Function Generator Decoder 251

Using the Function Generator Decoder 254

LTR Decoder 255

Using the LTR Decoder 259

MPT 1327 Decod er 261

NMT Decoder 266

Using the NMT Decoder/Encoder 271

Creating NMT Tests 276

Tone Sequence Decoder 285

Contents

9 Duplex Test Screen

Block Diagram 290

Field Descriptions 291

Contents

Signaling Encoder (AF Generator 2)

Field Descriptions for Encoder Modes 304

AMPS-TACS NAMPS-NTACS Encoder 305

Using the AMPS-TACS, NAMPS-NTACS Encoder 318

CDCSS Encoder 319

Using the CDCSS Encoder 323

Digital Paging Encoder 324

DTMF Sequence Encoder 329

EDACS Encoder 333

Using the EDACS Encoder 339

Function Generator Encod er 344

LTR Encoder 347

Using the LTR Encoder 351

MPT 1327 Encod er 355

Using the MPT 1327 Encoder 368

Nordic Mobile Telephone (NMT) Encoder 371

Tone Sequence Encoder 383

Contents

11 Help Screen

Field Descriptions 388

Contents

12 I/O Configure Screen

Field Descriptions 390

Contents

13 Message Screen

Field Descriptions 396

Contents

14 Oscilloscope Screen

Field Descriptions 398

Using the Oscilloscope 404

Contents

15 Print Configure Screen

Field Descriptions 406

Contents

16 Radio Interface Screen

Radio Interface Functional Description 410

Field Descriptions 412

Using the Radio Interface (Manual Operation) 415

Using The Radio Interface (Remote Operation) 421

Contents

17 RF Analyzer Screen

Block Diagram 424

Field Descriptions 425

Contents

18 RF Generator Screen

Block Diagram 436

Field Descriptions 437

Contents

19 RX Test Screen

Block Diagram 446

Field Descriptions 447

Contents

20 Service Screen

Field Descriptions 454

Contents

21 Spectrum Analyzer Screen

Field Descriptions 458

Using the Spectrum Analyzer 470

Contents

22 Tests Screen

Description of the Tests Subsystem 472

TESTS (Main Menu) 474

TESTS (Channel Information) 477

TESTS (Test Parameters) 479

TESTS (Order of Tests) 480

TESTS (Pass/Fail Limits) 482

TESTS (Save/Delete Procedure) 484

TESTS (Execution Conditions) 487

TESTS (External Devices) 490

TESTS (Printer Setup) 493

TESTS (IBASIC Controller) 496

ROM Programs 498

Contents

23 TX Test Screen

Block Diagram 502

Field Descriptions 503

Contents

24 Connector, Key, and Knob Descriptions

Connector Descriptions 514

Key Descriptions 532

Knob Des criptions 536

Contents

25 Modifications, Accessories, Manuals Support

Modifications 538

Accessories 541

Agilent Technologies Support for Your Instrument 553

Contents

Index 569

Get Started

Chapter 1, Get Started

Before Connecting a Radio

The RF IN/OUT port should be used for all transmitter tests when the radio is connected directly to the Test Set. (All UUT transmitter power measurements are made through this port). Off-the-air measurements can be made using the ANT IN port.

CAUTION: Overpower Damage — Refer to the Test Set’s front panel for maximum input power level.

Exceeding this level can cause permanent instrument damage.

POWER

OFF0ON

SINAD dB

RF Gen Freq

AFGen1 Freq

100.000000

AFGEN1 To

Amplitude

-80.0

dBm

Atten Hold

On/Off

Output Port

RF Out/Dupl

RF IN/OUT

MAX PWR 60W

CONTINUOUS

RX TEST

AF Gen2 Freq

1.0000

kHzMHz

AFGEN2 To

Off

kHz

DUPLEX OUT ANT IN

AC Level

Filter 1

50Hz HPF

kHz

Filter 2

15kHz LPF

Ext Load R

8.00

MAX POWER 200mW

To Screen

RF GEN RF ANL AF ANL SCOPE SPEC ANL ENCODER DECODER RADIO INT

MSSG

USER

ENTER

k2’

k3’

ASSIGN

RELEASE

SHIFT CANCEL

SCREEN CONTROL

HELPTXCONFIG

REF SET METER AVGk1’

HOLD

DUPLEX

DATA FUNCTIONS

INCR

X10

SET

-10

HI LIMITLO LIMIT

CURSOR CONTROL

PUSH TO SELECT

VOLUME SQUELCHMIC/ACC AUDIO OUT AUDIO IN

ADRS

LOCAL

TESTS

7 8 9

E4F

5 6

1C2D3

0 .

NO ppm

ON/OFF

MAX

12 V PK

INSTRUMENT STATE

SAVE

RECALL

RESET

DATA

ENTER

EEX

dBuV

HI LO

20nobug.ds4

Speaker or Audio OutMic Audio InMic KeyAntenna

MEAS

PRESET

GHv dBm

MHv

V s

kHv mV

MEMORY

CARD

MAX

42 V PK

Radio Under Test

Figure 1 Connecting a Radio to the Test Set

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\getstart.fb

Accessing the Test Set’s Screens

List of Screens

The following table lists all the screens that could be provided by the Test Set.

Table 3

Chapter 1, Get Started

Accessing the Test Set’s Screens

Analog Measurement Screens

Adjacent Channel Power Configure AF Analyzer I/O Configure Decoder Print Configure Duplex Encoder Help Oscilloscope Message Radio Interface RF Analyzer Service RF Generator RX Test Call Control Spectrum Analyzer Call Data TX Test Call Bit

Software Control Screens

Instrument Configuration

User Assistance Screens

Service Assistance Screen

Call Processing Screens

Call Configure

Screens

Tests Analog Measure Tests (IBASIC Controller)

Chapter 1, Get Started

Accessing the Test Set’s Screens

Accessing Screens

Test Set’s screens can be accessed through

• Front-panel keys

• The front-panel Cursor Control knob (using the To Screen menu, see item 5 in Fig-

• GPIB, using the DISPlay subsystem.

ure 3 on page 43)

Knob

Access to

Additional

Screens

POWER

OFF0ON

SINAD dB

RF Gen Freq

AFGen1 Freq

100.000000

AFGEN1 To

Amplitude

-80.0

dBm

Atten Hold

On/Off

Output Port

RF Out/Dupl

RF IN/OUT

MAX PWR 60W

CONTINUOUS

Knob Access to

Screens

RX TEST

AC Level

AF Gen2 Freq

Filter 1

1.0000

Off

50Hz HPF

kHz

kHzMHz

Filter 2

AFGEN2 To

15kHz LPF

Off

kHz

Ext Load R

8.00

DUPLEX OUT ANT IN

MAX POWER 200mW

To Screen

RF GEN RF ANL AF ANL SCOPE SPEC ANL ENCODER DECODER RADIO INT

Front-Panel Key

Access to Screens

SCREEN CONTROL

MSSG

HELPTXCONFIG

HOLD

USER

ENTER

k2’

k3’

ASSIGN

RELEASE

SHIFT CANCEL

DATA FUNCTIONS

REF SET METER AVGk1’

INCR

-10

CURSOR CONTROL

PUSH TO SELECT

DUPLEX

TESTS

INCR

X10

SET

HI LIMITLO LIMIT

VOLUME SQUELCHMIC/ACC AUDIO OUT AUDIO IN

ADRS

LOCAL

7 8 9

E4F

5 6

1C2D3

0 .

NO ppm

ON/OFF

MAX

12 V PK

INSTRUMENT STATE

SAVE

RECALL

DATA

EEX

dBuV

HI LO

20nobug.ds4

MEAS

PRESET

RESET

ENTER

GHv dBm

MHv

V s kHv

mV ms Hz

MEMORY

CARD

MAX

42 V PK

Figure 2 Accessing the Screens

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\getstart.fb

Changing A Field’s Setting

There are several types of CRT display fields in the Test Set. This section describes some of the different types of fields.

Chapter 1, Get Started

Changing A Field’s Setting

Figure 3 Different Types of Fields

rxscrn.wmf

intro4.wmf

542

Chapter 1, Get Started

Changing A Field’s Setting

Unit-of-Measure Field

Unit-of-measure can be changed to display measurements in different values or magnitudes. See item 1 in

To change a unit-of-measure

1. Position the cursor at the unit field on th e display.

2. Press a key labeled with a different unit-of-measure (such as W).

If the new units are valid, the measurement value is displayed in the unit.

Underlined Immediate-Action Field

Underlined immediat e act ion f ield s provid e a c hoi ce of two s ett ings. See i te m 2 in

Figure 3 to see an example of an underlined immediate-action field.

To change an underlined entry

1. Position the cursor at the field.

2. Push the CURSOR CONTROL knob or the ENTER key to move the underline under

the desired choice.

Figure 3 to see an example of a units-of-measure field.

The underlined setting is immediately activated when selected .

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\getstart.fb

One-of-Many Field

Numeric-Entry Field

Chapter 1, Get Started

Changing A Field’s Setting

One-of-many fields disp la y a li st of choices when selected. See i te m 3 in Figure 3 to see an example of a one-of many field.

To make a one-of-many choice

1. Position the cursor at the field.

2. Push the Cursor Control knob or the ENTER key to display the choices.

3. Move the cursor through the choices by turning the knob.

4. Push the Cursor Control knob or the ENTER key to make the choice.

The choice is immediately activated when selected.

The To Screen menu (see item 5 in Figure 3) is a variation of the one-of-many field.

Numeric-entry fields con tain values for settings l ike External Load Resistance a nd RF Generator Frequency.See item 4 in

Figure 3 to see an example of a numeric-

entry field.

To change a value

1. Position the cursor at the field.

2. Key in the desired number using the DATA keys.

3. Press ENTER to select the choice.

1. Position the cursor at the field.

2. Push the Cursor Control knob to highlight the desired choice.

3. Turn the knob to increment or decrement the value.

4. Push the Cursor Control knob or the ENTER key to select the choice.

Chapter 1, Get Started

How do I Verify that the Test Set is Operating Properly?

If your Test Set powers-up and displays the RX TEST screen, but you suspect an instrument problem, use the Instrument Quick Check to verify operation of the basic instrument functions.

If no failure is indicated by this test, but you still suspect a problem, refer to the

“Performance Tests” infor m ation in the Assembly Level Repair Manual.

Instrument Quick Check

1. Set up the quick check: a. Connect a cable between the DUPLEX OUT and ANT IN ports.

b. Turn instrument power on (if it is not already on). c. Press PRESET. d. Press DUPLEX to access the DUPLEX TEST screen. e. Set the Tune Mode field to Manual f. Set the Tune Freq field to 825 MHz. g. Set the Input Port field to Ant. h. Set the RF Gen Freq field to 825 MHz. i. Set the Amplitude field to -10 dBm. j. Set the Output Port field to Dupl k. Verify that AFGen1 Freq is s e t t o 1.0000 kHz, and that AFGen1 To is set to

FM and 3.00 kHz.

l. Set the AF Anl In field to FM Demod. m. Set the Filter 1 field to 300Hz HPF. n. Set the Filter 2 field to 3kHz LPF. o. Verify that De-Emphasis is Off p. Set the Detector field to Pk+-/2. q. Turn the VOLUME knob clockwise until you hear a tone (1 kHz default for

AFGen1 Freq).

2. Check the following readings:

❒ SINAD should be >35 dB. ❒ FM Deviation should be about 3.0 kHz.

3 Access the OSCILLOSCOPE screen using the To Screen menu. With the default

Vert/div setting of 2 kHz and a default Time/div setting of 200 µs, you s hould

see two complete sinewaves across the screen.

4 Access the SPECTRUM ANALYZER

an 825 MHz FM carrier.

1. Optional on some Test Set models.

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\getstart.fb

using the To Screen menu. You should see

Instrument Functional Diagram

Chapter 1, Get Started

Instrument Functional Diagram

Figure 4 Instrument Functional Diagram (1 of 2)

Chapter 1, Get Started

Instrument Functional Diagram

intr-bd2.wmf

Figure 5 Instrument Functional Diagram (2 of 2)

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Configuring Your Test Set

The CONFIGURE and I/O CONFIGURE screens contain a num ber of s ettings used to alter instrument operation and hardware communication settings. The GPIB address, screen intensity, serial communication parameters, and several other settings, are changed in these screens.

Most CONFIGURE and I/O CONFIGURE screen entries are saved when the instrument is turned off.

Chapter 2, Configuring Your Test Set

General Operating Information

The following configuration information discusses general operating information for some of the fields in these screens.

To Set Screen Intensity

1. Access the CONFIGURE screen.

2. Select the Intensity field.

3. Rotate the knob to change the setting (1=dim, 8=bright).

To Set RF Voltage Interpretation (50 /emf)

1. Access the CONFIGURE screen.

2. Position the cursor in front of the RFGen Volts field.

3. Press the Cursor Control knob or press ENTER to select 50 ohm or emf.

Ω

Voltage settings can contro l eit her :

• the voltage across a 50-ohm load, or

• the open circuit voltage (emf).

This setting affects the RF Generator’s and the Tracking Generator’s amplitudes.

To Set the Date and Time

1. Access the CONFIGURE screen.

2. Select the Date field and use the DATA keys to enter the date in the fo rmat shown b e-

low the field.

3. Select the Time field and use the DATA keys to enter the time in the format shown below the field.

The Test Set has a built-in clock that keeps track of the date and time. It is powered by an internal battery to keep it operating when the instrument is off.

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To Change the Beeper Volume

1. Access the CONFIGURE screen.

2. Select the Beeper field to dis play the volume choices.

3. Select the desired choice.

The beeper alerts you to important operating and measurement conditions. It beeps any time a message is displayed at the top of the screen. These messages warn you of condition s such as exc eeding the RF input level or t rying to set a fi eld to an unacceptable value. The refore, it is rec ommended that you do no t dis able the beeper .

To Verify or Change the Low-Battery Setting

1. Access the CONFIGURE screen.

Chapter 2, Configuring Your Test Set

General Operating Information

2. The current time setting is shown under the Low Battery field.

3. Select that field to display a list of setting choices.

• Select the desired time, or

• Select Disable to eliminate the low-battery warnin g.

The low-battery warning system is used to alert you when you have not used any front-panel controls within a specified amount of time. This setting is only used with DC power. It does not actually monitor the DC supply voltage. Since batteries are most often used for a DC supply, this function helps you conserve power by reminding you that the Test Set is still turned on.

When the specified time ha s elapsed between front-pan el entries, the Beeper sounds and a message appears at the top of the screen alerting you to the condition.

This setting is saved when the instrument is turned off.

Chapter 2, Configuring Your Test Set

General Operating Information

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Operating Overview

The information in this section discusses some frequently used operating features of the Test Set.

From reading

• What “fields” and “screens” are.

• How to use the Cursor Control knob to select different fields and screens.

Chapter 1, “Get Started,” you should understand:

Chapter 3, Operating Overview

Interaction Between Screens

Most fields operate globally; changing the setting in any screen automatically changes th at setting in all screens where it is available. example of this field type.

AFGen1 Freq is an

Figure 6 Example of How Global Fields Work

Priority fields give the RX TEST and TX TEST screens priority control of their settings. No matter what these fields were set to in other screens, if the RX TEST or TX TEST screen is accessed, the field changes to whatever it was last set to in

these screens. The RF Generator’s

Amplitude field is an example of this field

type. These fields and their preset values are listed in

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Table 4.

Chapter 3, Operating Overview

Interaction Between Screens

Table 4 Priority RX TEST an d TX T ES T Field s

Priority Field RX TEST TX TEST

RF Gen Amplitude Presets to −80 dBm (changeable) Always Off AFGen1 To Presets to FM (changeable) Always Audio Out AF Anl In Always Audio In Presets to FM Demod (changeable) Detector Always RMS Presets to Pk +− Max (chang eable) De-emphasis Always Off

AF Anl Measurement Presets to SINAD (changeable) Presets to Audio Freq (changeable)

Presets to 750 (changeable)

µs

Using your Test Set, duplicate the steps in Figure 7 to demonstrate how the Priority fields operate.

Chapter 3, Operating Overview

Interaction Between Screens

fig2-2.wmf

Figure 7 Example of How Priority Fields Work

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Displaying Measurements

Chapter 3, Operating Overview

Displaying Measurements

Figure 8 Where To Access Measurements

scntxrx.wmf

Chapter 3, Operating Overview

Displaying Measurements

Displaying RF Measurements

Transmitter Frequency

TX Frequency

Figure 8 on page 57.)

Transmitter Frequency Error

TX Freq Error

Figure 8 on page 57.)

(1) in

Transmitter Power

TX Power RF In (Refer to item (2) in Figure 8 on page 57). If Ant (antenna) is selected, the

is displayed when Tune Mode is set to Auto. (Refer to item (1)

is displayed when Tune Mode is set to Manual. (Refer to item

is only measured and displayed here when the Input Port is set to

measuremen t is replaced by four dashes (- - - -). You can measure low power levels on the ANT IN port using the Spectrum

Analyzer.

Refer to “TX Power” on page 511 and “TX Pwr Zero” on page 512 for more information on measuring transmitter power.

CAUTION: Connecting a signal of >200 mW to the ANT IN (antenna) port can cause instrument damage

(although internal protection circuits can typically withstand a short-duration signal of 1 or 2 Watts). If the overpower circuit is triggered, remove the signal from the ANT IN port and turn the Test Set off and on to reset it.

1. Optional on some Test Set models.

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Displaying AF Measurements

FM Deviation, AM Depth, AC Level

The AF Anl In set ting deter mines th e AF Analyzer’ s input and the measu rement displayed in the top-right corner of the measurement area (see measurements are available in the TX TEST, DUPLEX TEST , RF GENERATOR, RF ANALYZER, and AF ANALYZER screens. (Refer to item (3) in

page 57

Table 5 AF Measurements Selected by AF Analyzer Input Setting

Measurement AF Anl In Setting

FM Deviation FM Demod, FM Mod

Chapter 3, Operating Overview

Displaying Measurements

Table 5). These

Figure 8 on

AM Depth AM Demod, AM Mod

AM Depth

a. AC Level is also measured in the RX TEST screen, but

always uses the AUDIO IN connector as the input. (Refer to item (5) in Figure 8 on page 57.)

SSB Demod, AudioIn, Radio Int, Ext Mod, Mic Mod, Audio Out

Chapter 3, Operating Overview

Displaying Measurements

SINAD, Distortion, SNR, AF Frequency, DC Level, DC Current

Selecting the curre ntly-displ ayed measureme nt causes the To Screen menu to be replaced by a list of measurement choi ces. Select the ne w choice to replace the old measurement. These measurements are available in the RX TEST, TX TEST, DUPLEX TEST, RF GEN ERATOR, RF ANALYZER, and AF ANALYZER screens. ( Refer to item (4 ) in

Figure 8 on page 57)

The Distortion measurement is only for a 1 kHz tone. The SINAD measurement is normally shown using an analog-type meter and

small digits, but can be changed to display in large digits only. (See

Analog METER Format” on page 62

“To Use the

DC Current can only be measured using the rear-panel DC CURRENT MEASUREMENT connections.

Selecting SNR (Signal/Noise Ratio) turns off the other audio measurement. For more information on making this measurement, see

AF Power

“RF Gen Freq” on page 451.

AF Power is measured in the RX TEST screen by specifying the external load resistance,

Ext Load R, and changing the unit of measure for the AC Level

measurement to W (Watts), mW, or dBm. (The milliwatt (mW) unit is selected by pressing SHIFT, ENTE R ) Refer to item (5)

Figure 8 on page 57.

1. Optional on some Test Set models.

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To Change the Measurement’s Unit-of-Measure

1. Position the cursor in front of the present unit-of-measurement.

2. Press the key labeled with the desired unit.

All measurements allow you to change the associated unit-of- measure. For instance; the changed to display in mW, dBm, V, mV, or dB

Select mW by pressing SHIFT, ENTER. For example; to display transmitter power in units of dBm instead of Watts:

1. Move the cursor in front of the unit-of-measure for the TX Power measurement (W).

2. Press the dBm key . The measuremen t value is changed imm ediately to display in dBm.

TX Power measurement is usually displayed in Watts, but can be

Chapter 3, Operating Overview

Displaying Measurements

µV.

Chapter 3, Operating Overview

Displaying Measurements

To Use the Analog METER Format

To display measurement results using the analog meter format, use the following procedure.

1. Position the cursor in front of the unit-of-measure for the measurement you want to display.

2. Press and release the SHIFT key, then the INCR SET key to display the Meters menu in the lower-right corner of the screen.

3. Select On/Off to display the meter.

4. Repeat steps 1 and 2 to enter each meter end point and the meter intervals.

5. Repeat steps 1, 2, and 3 to cancel the METER function.

The METER function displays an equivalent analog display. (This is the SINAD

measurement’s default state when the instrument is turned on or preset). As the measurement is displayed graphically on the meter, the value is also displayed in small digits below the meter.

You can specify the high and low end points and display interval, or you can use the default meter settings.

This function is only available for measurements displayed using the large digits, such as the measurements displayed in the RX TEST and TX TEST screens.

To Make Beat Frequency Measurements

1. Select the DUPLEX TEST screen to set up for beat frequency oscillator measurements.

2. Set the AF Anl In field to SSB Demod.

3. Manually adjust the Tune Freq field to the desired carrier frequency.

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Entering and Changing Numbers

Values for numeric entry fields can be entered and changed using various methods, depending on your testing needs . The unit-of-measure fo r some of these

fields can also be changed (such as changing the RF Generator’s units from dBm to

To Enter Numbers

1. Position the cursor in front of the numeric entry field to be changed.

2. Use one of the following methods: a. enter the number and unit-of-measure directly using the keypad,

or b. press the Cursor Control knob or ENTER to highlight the field, and use the

knob,

µV).

Chapter 3, Operating Overview

Entering and Changing Numbers

Amplitude

or c. use the down-arrow or the up-arrow keys to in crement or decrement the present

value.

Decimal Values

Decimal values are us ed for most numeric ent r y f ie lds, such as the RF Gen Freq setting. The acceptabl e en tr ies for decimal values ar e 0 t hr ough 9, ., +/-, and EEX.

The +/- key is used for entering negative numbers. For example; when entering the RF Gene rator

−47 dBm: +/- 4 7 dBm.

Amplitude you can enter this sequence to set the value to

The EEX key can be used when entering exponential notation. For example; to

× 10

enter 1.25

kHz you could use the sequence: 1 . 2 5 EEX 3 kHz.

Chapter 3, Operating Overview

Entering and Changing Numbers

Hexadecimal Values

Hexadecimal (Hex) values are used for entering some signaling parameters in the ENCODER, such as AMPS communications parameters, such as the RADIO INTERFACE field. The acceptable entries for decimal values are 0 through 9 and A through F. No unit-of-measure is associated with these values.

Hexadecimal values are either entered from the keypad (A through F are shifted functions), or by using the selected (such as the AMPS

To Enter and Change the Unit-of-Measure

Entering the Unit-of-Measure for Settings

When a number is entered, the unit-of-measure is either specified or implied.

Filler data field, and for specifying remote

Output Data

Choices menu displ ayed when certain fields are

Filler field).

When the unit is implied, the current unit is used. For example; if the present RF frequency is 250 MHz, and you want to change it to 225 MHz, you would enter this sequence: 2 2 5 ENTER.

When the unit i s specif ied, the units c hange t o whatever you s pecify. For example; if the present

RF Gen Freq setting is 250 MHz, and yo u want to change i t to 4 55

kHz, you would enter this sequence: 4 5 5 kHz.

Changing the Unit-of-Measure for Settings

T o chang e the prese nt unit- of-mea sure, posit ion the c ursor in f ron t of the f ield and press the key labeled with the desired unit. For example, position the cursor in front of the

RF Gen Freq field and push GHz or kHz to display the setting in

either of these units.

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To Change the Increment or Decrement Setting

Using the Pre-Defined Increment/Decrement Keys

The INCR ×10] and INCR ÷10] keys change the increment/decrement value by a factor of 10.

Chapter 3, Operating Overview

Entering and Changing Numbers

For example; if the the knob or push of the down-arrow or up-arrow keys, pushing INCR

Tune Freq presently changes by 10 MHz for every click of

×10] once

changes the increment va lue to 100 MHz.

Specifying An Increment Value

The INCR SET key is used to assign a specific increment value. The increment value may use different units than the field you are incrementing/decrementing. For instance ; if the RF Generator

Amplitude setting is displayed in dBµV, you

could increment in units of dB or mV. To change the increment value;

1. Move the cursor to the numeric entry field to be changed.

2. Press INCR SET, and enter the desired value and u nit-of-measure using the DAT A keys.

3. Use the down-arrow and up-arrow keys or CURSOR CONTROL knob to change the

field’s value by the increment value you set.

Example of Setting an Increment Value

This example changes the Tune Freq in increments of 15 MHz.

1. Access the TX TEST screen and position the cursor in front of the Tune Freq field.

2. Press 1 0 0 MHz to set the frequency at 100 MHz.

3. Press INCR SET 1 5 MHz.

4. Turn the Cursor Control knob. The field’s value changes by 15 MHz for each knob

click.

Chapter 3, Operating Overview

Printing A Screen

To Print A Screen’s Contents

1. Connect a printer to the appropriate rear-panel connector.

2. Access the PRINT CONFIGURE screen from the More menu and set the Printer

Port field to the appropriate type of printer connection.

• If HP-IB is selected, enter the GPIB Printer Address of the printer.

3. Select the type of printer you are using in the Model field. If your printer is not list ed,

configure your printer to emulate one that is listed .

4. Enter a Print Title using the knob, if desired. This text will appear at the top of

your printout.

5. Display the screen you want to print and press and release the SHIFT key, then the

TESTS key to access the PRINT function.

To interrupt pr inting, select th e Abort Print field on the PRINT CONFIGURE screen.

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Using Measurement Limit Indicators

The LO LIMIT and HI LIMIT functions are used to define a measurement

“window” to alert you to measurements that are outside these limits. When limits are assigned, Lo and/or Hi appear by the measurement.

A measurement that goes above or be low t he defined limits causes thr ee thi ngs to happen:

1. A message appears at the top of the screen indicating a limit was exceeded.

2. The Lo or Hi indicator by the measurement flashes.

3. The Beeper beeps if it is has been enabled in the CONFIGURE screen.

Limits are helpful when you can’t watch the Test Set’s display while you are making an adjustment on the equip ment you are test ing or re pairing. They are a lso a convenient way of alerting you to long-term measurement drift without having to observe the screen.

Chapter 3, Operating Overview

Using Measurement Limit Indicators

To Set A HI and/or LO LIMIT

1. Position the cursor in front of the unit-of-measure for the measurement that you are set-

ting limits for.

2. Press and release the SHIFT key, then the down-arrow key to access the LO LIMIT

function, and enter the measurement’s low-limit value and its unit-of-measure.

3. Press and release the SHIFT key, then the up-arrow key to access the HI LIMIT func-

tion, and enter the measurement’s high-limit value and its unit-of-measure.

1. The fundamental unit for the LIMITs does not have to be the same as the measure-

ment’s units. For instance; when measuring AC Level in Volts, you can set HI and LO LIMITs in units of dBm.

Chapter 3, Operating Overview

Using Measurement Limit Indicators

To Reset or Remove Limits

To reset a limit that has been exceeded

1. Position the cursor in front of the measurement’s unit-of-measure.

2. Press and release the SHIFT key, then the down-arrow (or up-arrow key) to access the

LO LIMIT (or HI LIMIT) function, then press ENTER or MEAS RESET.

To remove a limit

1. Position the cursor in front of the unit-of-measure for the assigned limit.

2. Press and release the SHIFT key, then the down-arrow (or up-arrow key) to access the

LO LIMIT (or HI LIMIT) function, then press ON/OFF.

Example of Setting HI and LO LIMITs

This example sets limits for the TX Freq Error measurement. Limits are being set to indicate if a 100 MHz carrier varies more than

± 10 kHz.

1. Position the cursor in front of the unit-of-measure for the TX FREQ ERROR measure-

ment (the default is kHz).

2. Press and release the SHIFT key, then the down-arrow to access the LO LIMIT func-

tion, then enter 1 0 kHz.

3. Press and release the SHIFT key, then the up-arrow to access the HI LIMIT function,

then enter 1 0 kHz.

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Averaging Measurements

The AVG (average) function allows you to display the average value of a number of measurements. You enter the number of measu rement samples us ed to calculat e and display the measurement average. This dampens the effects of rapidly changing measurements, providing a more usable measurement display.

To Use Measurement Averaging

1. Position the cursor in front of the measurement’s unit-of-measure.

2. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function.

The default number of average samples is displayed below the measurement.

• Enter the desired number of measurement samples to be used for calculating the av erage, or

Chapter 3, Operating Overview

Averaging Measurements

• Press ON/OFF to use the currently-displayed number of samples.

3. To turn averaging of f, position the cursor in front of the unit- of-measure and pr ess and

release the SHIFT key , then the INCR ×10 key to access the AVG function, then press the ON/OFF key.

When the averaging function is first enabled, a numeric average is calculated and displayed each time a measurement is made. This continues until the specified number of samples is reached. From that point on, the averaging function performs an exponential filtering operation that mimics an RC filter.

Because of the exponential response, any large measurement changes result in a displayed value that ramps up or down to the actual measured value.

Pressing MEAS RESET clears the mea suremen t hist ory for all measu rements and starts the averaging process over.

Example of Using Measurement Averaging

This example enables the SINAD measurement to be averaged using 25 samples.

1. Press PRESET and wait for the instrument to display the RX TEST screen.

2. Position the cursor in front of the unit-of-measure for the SINAD measurement (default

is dB).

3. Press and release the SHIFT key, then the INCR ×10 key to access the AVG function,

enter 2 5, then press the ENTER key. Avg appears below the displayed measurement value to indicate that averaging is being used.

Chapter 3, Operating Overview

Setting A Measurement Reference

The REF SET function establishes a measurement reference point. This allows you to make a direct comparison between two measurement results, or between a measurement standard and the actual measurement results.

Referenced measurements are displayed in one of two ways, depending on the type of measurement:

Displayed value = Measurement − Reference. The difference between the measured value and the reference value is displayed in the same unit-of-measure.

or Displayed value = Measurement ÷ Reference. A ratio of the measured value to the

reference value is displayed in dB.

To Use the Present Value as a Reference

Position the cursor in front of the unit-of-m easure for the measurem ent you want to set the reference for .

1. Press and release the SHIFT key, then the INCR ÷10 key to access the REF SET func-

tion; then press enter ENTER.

2. Ref appears below the measurement.

The measurement displayed is now referenced to the measurement value present when the reference was set.

To Set a Specific Reference

1. Position the cursor in front of the unit-of-measure for the measurement you want to set

the reference for.

2. Press and release the SHIFT key, then the INCR ÷10 key to access the REF SET func-

tion.

3. Enter a reference value.

4. Ref appears below the measurement value to indicate a reference has been set.

The measurement displayed is now referenced to the value you entered.

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Using Memory Cards

OTP (One Time Programmable) cards provide removable read-only storage. File editing and erasure are not possible. These cards cannot be programmed by the Test Set; they require a special memory card programmer to save files.

SRAM cards provide removable read/write memory for your files, similar to a flexible disk. Data can be stored, re-stored, read, or erased as needed.

SRAM memory cards require a battery to maintain stored information.

Inserting and Remov ing Memory Cards

Table 6 Memory Card Part Numbers

Memory Type

Chapter 3, Operating Overview

Using Memory Cards

Agilent

Techn ol ogies

Part Number

32 kilobytes SRAM 85700A 128 kilobytes OTP 85701A 128 kilobytes SRAM 85702A 256 kilobytes OTP 85703A 256 kilobytes SRAM 85704A 512 kilobytes SRAM 85705A 512 kilobytes OTP 85706A

Figure 9 illustrates how to insert a memory card int o th e Test Set’s front panel. To

remove a memory card, simply pull it out. The Test Set’s memory-card label is marked with an arrow that must be inserted

on the same side as the arrow shown on the front-panel slot.

Chapter 3, Operating Overview

Using Memory Cards

NOTE: Memory cards may be inserted and removed with the Test Set powered on or off.

Figure 9 Inserting a Memory Card

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Setting the Write-Protect Switch

The SRAM memory card’s write-protect switch lets the user secure its contents from being overwritten or erased. The switch has two positions (see

• Read-write – The memory-card contents can be changed or erased, and new files may written on the card.

• Read-only – The memory-card contents can be read by the Test Set, but cannot be changed or erased.

Chapter 3, Operating Overview

Using Memory Cards

Figure 10):

Figure 10 Setting the SRAM Write-Protect Switch

Chapter 3, Operating Overview

Using Memory Cards

The Memory Card Battery

SRAM memory cards use a lithium battery to powe r the card. Listed below ar e the

batteries for the Test Set’s SRAM cards. SRAM cards typically retain data for over 1 year at 25

SRAM Card Battery Part Numbers - CR2016 or Agilent Technologies1420-0383

Replacing the Battery

1. Turn the Test Set on and insert the memory card. An inserted memory card takes power

from the Test Set, preventing the card’s contents from being lost.

2. Hold the memory card in the slot with one hand and pull the battery holder out with your other hand. (See Figure 11 on page 74.)

3. Install the battery with the side marked “+” on the same side marked “+” on the battery holder. Avoid touching the flat sides of the battery , finger oils may con taminate battery contacts in the memory-card.

° C. To retain data, the battery should be replaced annually.

4. Re-insert the battery holder into the memory card.

5. Remove the memory card from the Test Set.

Figure 11 Replacing the Memory Card’s Battery

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Chapter 3, Operating Overview

Using Memory Cards

WARNING: Do not mutilate, puncture, or dispose of batteries in fire. The batteries can burst or explode,

releasing hazardous chemicals. Discard unused batteries according to the manufacturer’s instructions.

Memory Card Initialization

All new SRAM cards must be initialized before they can be used to store information. The RAM_MANAGER procedure stored on the internal ROM Disk can be used to quickly initialize any SRAM memory card.

SRAM Memory Cards can also be initialized f rom th e TESTS screen by inser t ing the memory card in to the front -panel slot and selec ting t he Save /Delet e f ield, then selecting on screen instructions to complete the process.

Init Card or pressing the k3 USER key t o init iali ze a ca rd. Foll ow the

If the error mes sage

ERROR 85 Medium uninitialized appears on the scree n

the memory ca rd has not been properly initialized. Check the SRAM bat tery to

ensure that it’s charged and inserted correctly in the battery holder.

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

The SAVE and RECALL functions allow you to store different instrument setups and retriev e them later, eliminating the task of re-confi guring the Test Set.

The number of available sa ve regist ers dep ends on how many chan ges were made to the base instrument setup for each save. (Se e smaller the number of changes, the g reater the number of save registers that can be used (typically over 200).

Save/Recall register settings can be saved to several types of mass storage. This

allows you to “back up the settings in case you need to clear them from memory

“Memory Considerations” on page 79) for running large programs, or when a

(see

firmware upgrade is performed (see

“BASE Settings” on page 79.) The

“Save/Recall” on page 393).

To Save an Instrument Setup

Use the More menu to access the I/O CONFIGURE screen. )

1. Select the storage media using the Save/Recall field. (The default is internal mem- ory.

2. Make any changes to the instrument that you want to save in a register.

3. Press and release the SHIFT key then the RECALL key to access the SAVE function.

4. Use the DA TA keys or the Save menu at the bottom right of the screen to enter the reg-

ister’s name.

To Recall an Instrument Setup

Use the More menu to access the I/O CONFIGURE screen.

1. Select the media to recall settings from using the Save/Recall field. The default is internal memory.

2. Press RECALL.

3. Use the knob to select the desired setup to be recalled from the Recall menu at the

bottom-right of the screen.

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Example of Saving and Recalling an Instrument Setup

This example SAVES changes made to the RX TEST scree n, and the n RECALLS them. The register is saved to wherever the memory - unless you have changed it).

1. Access the RX TEST screen and set the RF Gen Freq to 500 MHz.

2. Set Amplitude to -35 dBm.

3. Press and release the SHIFT key then the RECALL key to access the SAVE function.

A prompt appears at the top of the screen asking you to enter a name.

4. Using the DATA keys, press 1 2 3 ENTER to assign a name to these changes.

5. Press PRESET and wait for the instrument to return to normal operation.

6. If not already displayed, access the RX TEST screen. Notice that the RF Gen Freq

and Amplitude settings are reset to their preset values.

7. Press RECALL 1 2 3 ENTER. The RF Gen Freq and Amplitude are changed to

the settings you saved in register 123 (500 MHz and -35 dBm).

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

Save/Recall field is set (internal

To Remove (Clear) an Individual Save Register

Specify where the register is stored using the Save/Recall field on the I/O CONFIGURE screen.

1. Press RECALL.

2. Use the knob to position the cursor in front of the register to be removed from the Re-

call menu at the bottom-right of the screen. The register name and percentage of memory occupied by that register are indicated at the top of the screen.

3. Press ON/OFF. A prompt appears, asking if you want to delete the save register.

4. Press YES.

Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

To Clear All Save Registers

1. Press RECALL.

2. Use the knob to position the cursor in front of the *Clr All* entry in the Recall

menu at the bottom-right of the screen.

3. Press the knob or press ENTER. A prompt appears at the top of the screen to verify that you want to clear all registers.

4. Press YES.

Register Names

You can use any number, letter, or combination of numbers and letters as a name for storing instrumen t settin gs. For inst ance; if yo u want to save a set up for tes ting

a “Vulcan7” radio, you can save the setting as “VULCAN7”. Two register names are reserved for special purposes: POWERON and BASE.

POWERON Settings

When the Test Set is turned on, it uses a set of instrument setup parameters specified at the time of manufacture. You can have the instrument power up in a different state by making the desired changes to the original settings, and then saving them using the name POWERON.

The next time the instrument is turned on, the instrument returns to the state present when you saved the POWERON setting. For instance; if the OSCILLOSCOPE screen was displayed when POWERON was saved, it is the screen that is displayed when you turn the instrument on.

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Chapter 3, Operating Overview

Saving and Recalling Instrument Setups

BASE Settings

The BASE register contains any field settings the user has saved that are different from the instrument preset state. It establishes a reference point for all future saves. If a base is not saved, the preset state is used as the reference.

When you save an instrument setup, the new setup is compared to the base settings, and any differences are stored under the register name you supply. Because only differences are stored, a much larger number of instrument setups can be saved than if the contents of every field was saved.

When you recall an ins trument se tting, every fi eld is re set to the base se ttings. Th e saved settings are then used to re-establish the desired instrument setup.

CAUTION: Since each save/recall register only contains the differences between the setup being saved and

the present base register settings, changi ng the bas e settin gs causes all ot her sav ed setup s to be erased from memory (including the POWERON setting if one has been saved). Unless you consistently change the same fields to the same value each time you use the instrument, you should avoid creating your own BASE settings.

Memory Considerations

When the Save/Recall field of the I/O CONFIGURE screen is set to

Internal, programs are saved to the same non-volatile RAM used to create

RAM Disk(s) and run IBASIC pro gra ms. By saving a larg e nu mb er of instrument setups, you reduce the amount of RAM available to run programs. If you get a

“memory overflow” message while trying to load a program, you must clear one or more save/recall registers to free RAM space.

Instrument Hardware Changes

Recalling a saved register that uses a hardware option that has been removed (such as an audio filter) results in unspecified operation. Re-install the needed option befor e attempting to recall the associated register(s).

Chapter 3, Operating Overview

Using USER Keys

User keys instantly access instrument settings without using the knob. You can use user keys to move quickly between fields on the same screen, and to access field settings that are not normally available on the screen you are using.

Local user keys ar e u sed to move between se ttings on the screen that is displayed. When the user key is pressed, the cursor instantly moves to, and selects, the assigned field; eliminating the need to turn and push the knob. Five local user keys are available for each screen: k1, k2, k3, k4, and k5.

Five factory-as si gned local user keys a re available in each screen; however, using these keys removes any other local user keys you may have already set up.

Global user keys are used to access settings that are not available on the current screen. Three global user keys are available: k1’, k2’, and k3’. (These are shifted functions of the local user keys.)

When defining user keys, the ASSIGN function is used to create key definitions; the RELEASE function removes the definitions. Re-assigning a user key to a different field setting automatically releases it from the setting it was previously associated with.

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\opoverv.fb

To Use the Pre-Assigned Local USER Keys

1. Press and release the SHIFT key, then the k4 key to access the ASSIGN function; then

press the ENTER key. The n umb ers 1 through 5 appear in f ront of various fields. (See

Figure 12.)

2. Press the different local user keys (k1 to k5) and notice how the cursor immediately

moves to the corresponding field.

3. To stop using the default local user keys, press and release the SHIFT key, then the k5

key to access the RELEASE function; then press the ENTER key.

Chapter 3, Operating Overview

Using USER Keys

Figure 12 An Example of Pre-Assigned Local User Keys

scnusr.wmf

Chapter 3, Operating Overview

Using USER Keys

To Assign Local USER Keys

1. Move the cursor to the field you want to assign a local user key to.

2. Press and release the SHIFT k ey , then the k4 key to access the ASSIGN function. Then

press a local USER key (k1-k5) . The user key nu mber appears in front of the field you assigned it to.

Example of Assigning a Local USER Key

Use this example to assign local USER key k1 to the Filter 1 field in the RX TEST screen.

1. Access the RX TEST screen and position the cursor in front of the Filter 1 field.

2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function ; then

press k1. A small 1 appears next to the field indicating that USER key k1 has been assigned to it.

3. Move the cursor to any other field on the screen and press k1 . Th e cursor immediately returns to the Filter 1 field. The field is also highlighted to change the entry using the CURSOR CONTROL knob or arrow keys.

To Release Local USER Keys

1. Display the screen containing the user key assignment to be removed.

2. Press and release the SHIF T key , th en the k5 key to access the RELEASE f unction; then

press the USER k ey (k1-k5).

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To Assign Global USER Keys

1. Move the cursor to the field you want to assign a global user key to.

2. Press and release the SHIFT k ey , then the k4 key to access the ASSIGN function. Then

press SHIFT and a global USER key (k1’ - k3’). Unlike a local user key, the user key number does not appear at this field; instead, a prompt appears at the top of the screen confirming the key assignment.

Example of Assigning a Global USER Key

Use this example to assig n glob al USER ke y k1’ to the AF Anl In field, and then access this field from the OSCILLOSCOPE screen.

1. Access the AF ANALYZER screen and position the cursor in front of the AF Anl In

field.

2. Press and release the SHIFT key, then the k4 key to access the ASSIGN function.

Chapter 3, Operating Overview

Using USER Keys

3. Press SHIF T, k1’. Notice the prompt Global User key 1 assigned. at the top

of the screen.

4. Access the OSCILLOSCOPE screen.

5. Press SHIFT, k1’.

AF Anl Input

present input is set to FM Demod). To change the input, use the arrow keys (down-arrow or up-arrow), or press ENTER to access the

A field that is accessed using a global user key is only displayed at the top of the screen while it is being accessed. Moving the cursor to any other field in the screen causes the user key field to disappear until it is accessed again.

To Release Global USER Keys

1. Move the cursor to the field with the global user key assigned to it.

2. Press and release the SHIFT key, then the k5 key to access the RELEASE function.

Then press SHIFT and the USER key to be released (k1’-k3’).

, FM Demod is displayed at the top of the screen (assuming the

Choices menu.

Chapter 3, Operating Overview

Setting an RF Generator/Analyzer Offset

You can set a fixed frequency offset between the RF Generator and the RF Analyzer. This feature is convenient for testing radios with a fixed transmit/receive frequency offset.

To Set an RF Offset

1. Access the CONFIGURE screen.

2. Position the cursor in front of the RF Offset field, and press the Cursor Control knob,

or press ENTER to turn the offset On or Off.

3. Select the (Gen)-(Anl) field and enter the frequency offset value.

Example of Setting an RF Offset

1. Access the CONFIGURE screen.

2. Set the RF Offset to On.

3. Enter an offset frequency ((Gen)-(Anl)) of 10 MHz.

4. Access the DUPLEX screen.

5. Set the Tune Mode to Manual.

6. Select the RF Gen Freq field, and rotate the Cursor Contro l knob to vary the RF Gen -

erator’s frequency.

7. Notice that the Tune Freq value changes to maintain the 10 MHz difference between the generator and the analyzer.

1. Manual tuning is used in this example to prevent possible unexpected Tune

Frequency changes during the procedure.

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Using Remote Control

The Test Set can be remotely controlled several ways:

• Using GPIB control from a computer/controller.

• Using IBASIC programs on memory cards.

• Using an ASCII terminal connected to the serial port.

Using GPIB Control

The Pr ogr ammer’s Guide contains inform ation on wri ting GPIB contr ol progr ams for the Test Set. Programming examples and a syntax listing provide general GPIB operation guidelines.

Chapter 3, Operating Overview

Using Remote Control

Running IBASIC Programs from Memory Cards

The documentation shipped with Agilent Technologies11807 software packages explains how to run those programs from memory cards. Refer to the Programmer’s Guide for detailed information on using memory cards with y our own IBASIC programs.

Chapter 3, Operating Overview

Using Remote Control

Using an ASCII Terminal

Connecting an ASCII terminal to the serial port allows you to remotely operate the Test Set by entering characters that represent each front-panel control.

Before you can use this feature, you must first set the required serial port settings in the I/O CONFIGURE screen, and make any hardware connections.

The Serial Port connections are described in

Knob Descriptions.”

To Configure for Serial Port Operation

1. Access the I/O CONFIGURE screen.

2. Set the Serial In field to Inst.

3. Set the IBASIC Echo field to On.

4. Set the Inst Echo field to On.

5. Set the remaining serial communications fields according to your terminal/computer’s

serial communication requirements. These fields include:

• Serial Baud

• Parity

• Data Length

• Stop Length

• Rcv Pace

• Xmt Pace

6. The Test Set now responds to the equivalent characters sent to it by the terminal/computer.

Equivalent Front-Panel Control Characters

Table 7 on page 3 87

lists the terminal/computer keystrokes that equate to front-

Chapter 24, “Connector, Key, and

panel controls. Each sequence must be preceded by the Escape key. For example, to remotely acc ess the CONFIGURE screen, pr ess the Esc key, then

press the C ke y on your term inal/computer. Be sure to use upper-case C fo r this example.

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Ta ble 7 Equivalent Front-Panel Control Characters

Chapter 3, Operating Overview

Using Remote Control

Equivalent

Function

CANCEL ! A X PERCENT MHZ_V ( EEX Z S_KHZ_MV ) YES_ON_OFF [ BACKSPACE - NO_PPM_W ] ENTER . RX a RELEASE 0 TX b K1 1 DUPLEX c K2 2 PREV d K3 3 TESTS_MAIN e K4 4 LOCAL f K5 5 RECALL g K1_PRIME 6 MEAS_RESET h K2_PRIME 7 PRESET i K3_PRIME 8 INCR_DIV_10 j ASSIGN 9 INCR_SET k KNOB_TURN_CCW < INCR_TIMES_10 l KNOB_TURN_CW > DOWN m MSSG A UP n HELP B SEVEN o CONFIG C EIGHT p HOLD D NINE q PRINT E FOUR r ADRS F FIVE s SAVE G SIX t REF_SET J ONE u METER K TWO v AVG L THREE w LO_LIMIT M ZERO x HI_LIMIT N POINT y

ESC

Character

Function

Equivalen t

ESC

Character

Chapter 3, Operating Overview

Using Remote Control

Ta ble 7 Equivalent Front-Panel Control Characters (Continued)

Equivalent

Function

ESC

Function

Character

E R PLUS_MINUS z F S OHM_PCT_DEL_DBUV B U DB_GHZ_DBM | C V MS_HZ_UV DW

Alternate sequences for 5 commonly-used functions are also available. Hold down the Cntl (control) key and select the corresponding key for the desired function. Example: Cntl H moves the cursor to the left one space.

ENTER - J or M CANCEL - C BACKSPACE - H KNOB_TURN_CW - R KNOB_TURN_CCW - L

Equivalen t

ESC

Character

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Adjacent Channel Power Screen

NOTE: This screen is displayed on the Test Set with Option 102, Spectrum Analyzer.

This screen is used t o measure Adj acent Channe l Power. This is a measurement of the power of signals at a specific channel spacing above and below the RF

Analyzer’s center frequency. This screen is accessed by selecting from the

To Screen menu.

AD CH PWR

Chapter 4, Adjacent Channel Power Screen

How the Test Set Measures Adjacent Channel Power (ACP)

When you access this s creen, the Test Set automaticall y starts a multi-step pr ocess for measuring ACP:

1. AF Generator 1 is turned off if the Carrier Ref field is set to Unmod.

2. The amplitude of the center frequency (Tune Freq) is measured to establish a

reference.

3. AF Generator 1 is turned back on if it was previously turned off.

4. The power in each of the adjacent channels is analyzed.

5. Adjacent Channel Power is calculated and displayed. This value can be displayed as an

absolute power level or as a ratio referenced to the center frequency’s level.

Which Input Port to Use. The TX Power measurement is used to calculate absolute Adjacent Channel Power. Since TX Power can only be measured using the RF IN/OUT port, you must use this port to measure ACP Level. ACP Ratio can be measured using either the RF IN/OUT or the ANT IN port. Measuring ACP on AM Transmitters. When measuring AM signals, the reference level must be measured on an unmodulated carrier; so the Carrier Ref field must be set to Unmod. After the reference is measured, the power in the adjacent channels must be measured with modulation. This requires the modulating signal to be turned off and on repeatedly as measurements are being calculated and displayed. Since the Test Set automatically turns AFGen1 on and off when the Carrier Ref field is set to Unmod, you must use AFGen1 and the AUDIO OUT port as the modulation source for making AM ACP measurements.

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Field Descriptions

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Figure 13 The Adjacent Channel Power Screen

ACP Meas

This field selects the format for displaying upper and lower adjacent channel power levels.

• Ratio displays the power levels relative to the power around the center frequency (Tune Freq). Levels can be displayed in dB or as a percentage (%).

• Level displays the absolute power levels in mW, W, dBm, V, mV, and dBmV.

Operating Considerations

TX Power

Four dashes are displayed for these meas urements when the

Ant (ANT IN). ACP Ratio can be measured on either the ANT IN port or RF IN/OUT port.

For more information, refer to

Power (ACP)” on page 90

and ACP Level can only be measured through the RF IN/OUT port.

adchpwr.wmf

Input Port is set to

“How the Test Set Measures Adjacent Channel

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

AFGen1 Freq

This field sets the frequency for the first audio frequency sinewave generator.

AFGen1 To

This field sets two values:

• The upper field determines whether the AFGen1 signal modulates the RF Generator or is output through the AUDIO OUT connector.

• The lower field sets the depth of modulati on for FM and AM in kilohert z and amplitude (including Off) for audio out. The AUDIO OUT level is always in volts rms.

Operating Considerations

This is a priority control field. Accessing the RX TEST or TX TEST screen overrides any changes made to this field in other screens.

Carrier Ref

Channel BW

See Also

“Interaction Between Screens” on page 54

Use the carrier reference field to indicate whether the carrier (Tune Freq) being measured should be unmodulated or modulated when making the ACP reference measuremen t. (For more information, refer to

Adjacent Channel Power (ACP)” on page 90

Operating Considerations

• FM transmitters can be measured with the carrier modulated or unmodulated.

• For AM transmitters, the carrier must be measured while unmodulated. AFGen1 and the AUDIO OUT port must be used as the modulation source whenever Unmod is selected.

“How the Test Set Measures

Use the channel bandwidth field to specify the bandwidth of the carrier and adjacent channels to be measured. (See

Figure 14 on page 93.)

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Chapter 4, Adjacent Channel Power Screen

Field Descriptions

adchpwr1.wmf

Figure 14 Relationship Between Tune Freq, Ch Offset, and Channel BW Fields

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Ch Offset

Use the channel offset field to enter the frequency difference between the Tune

setting and the center of the adja cen t cha nnels you want to measure. This is

Freq

an absolute value; only positive values can be entered. See

Ext TX key

This field controls a switch at t he MIC/ACC connector. Use it to “key” an external transmitter.

See Also

“MIC/ACC” on page 520

Input Atten

Figure 14 on page 93.

Input Attenuation sets the amount of input attenuation for the RF IN/OUT and ANT IN connectors. This function controls two settings:

• The upper field determines if you want the instrument to set the attenuation automatically (Auto), or if you want to set the value manually (Hold).

• The lower field displays the present attenuation value, and is used to set the desired attenuation level when the upper area is set to Hold.

Operating Considerations

Input Attenuator autora ngi ng ca n int er fe re wit h os cil loscope or signaling decod er operation under certain conditions.

See “Input Atten” on page 427 for additional

information.

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Input Port

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

This field selects the RF IN/OUT or ANT IN port for making RF measurements. The RF IN/OUT port must be used for making TX Power or ACP Level measurements on this screen.

Operating Considerations

Power levels for each port are printed on the Test Set’s front panel. If the RF power at the RF IN/OUT port exceeds allowable limits, a loud warning signal sounds and a message appears at the top of the screen. If this occurs, disconnect the RF power, press the MEAS RESET key, and allow the Test Set to cool off for approximately two minutes before making any other measurements on this port.

The ANT IN (antenna input) connector provides a highly-sensitive input for very low level signals (such as “off the air” measurements). You cannot measure TX (RF) Power or ACP Level on this screen using the ANT IN port.

CAUTION: Connecting a signal of >200 mW to the ANT IN port can cause instrument damage

(although internal pr otect ion circuits can ty picall y withs tand a s hort -durat ion s ignal of 1 o r 2 Watts).

If the overpower circuit is triggered (signified by a warning message at the top of the screen), remove the signal from the ANT IN port, and press the MEAS RESET key or turn the Test Set off and on to reset it.

Lower and Upper ACP [Ratio:Level]

These two measurements dis play the amount of power in sign als above and be low

Tune Freq signal. T he level is dis played as a ratio (referenced to the power

the around the

See Also

“ACP Meas” on page 91

Tune Freq) or as an absolute value.

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

Res BW

The resolution bandwidth field selects the IF filter used when measuring the power of the carrier and the adjacent channels.

Operating Considerations

Using a narrower bandwidth filter (300 Hz) slows the measurement, but rejects carrier leakage and out of channel spurs. Using a wider bandwidth filter (1 kHz) speeds measurements, but may allow unwanted spurs and carrier leakage to be integrated into the measurement when measuring at t he edges of the selected channel bandwidth.

Tune Freq

This field sets the center frequency for the RF signal to be analyzed.

Tune Mode

See Also

“Tune Mode” on page 96

This field selects Automatic or Manual tuning of the RF Analyzer.

Auto tuning causes the RF Anal yzer t o fin d the si gnal wi th the great est a mplitud e

>-36 dBm, and to set the Tune Frequency for that signal.

Manual tuning requires the operator to set the Tune Frequency for the RF signal

to be analyzed.

Operating Considerations

Changing the Tune Mode also changes the RF frequency display. Automatic tuning enables the

TX Freq Error measurement.

TX Frequency measurement. Manual tuning enables the

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TX Freq Error/TX Frequency

This measurement displays Transmitter Frequency Error or absolute Transmitter Frequency.

See Also

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

“Tune Mode” on page 96

TX Power

Transmitter (TX) Power measures RF power at the RF IN/OUT port.

Operating Considerations

Only the RF IN/OUT port can be used for measuring TX Power on this screen. When the

Input Port is set to Ant, four das hes (- - - -) appear in plac e of digits

for this measurement.

Use the Spectrum Analyzer

to measure low-level RF power (≤200 mW) at the

ANT IN port.

TX Pwr Zero

The transmitter power zero function establishes a 0.0000 W reference for measuring RF power at the RF IN/OUT port.

CAUTION: RF power must not be applied while zeroing. Set the RF Generator screen’s Amplitude

field to off to prevent internal cross-coupling into the power detector while zeroing.

Operating Considerations

When power is applied to the RF IN/OUT connector, the temperature of the internal circuit ry incr eases. Thi s can caus e changes in the TX Power measur ement when low power levels are measured immediately following high power measurements.

When alternately making high and low power measurements, always zero the power meter immediately before making the low power measurements; this provides the best measurement accuracy.

1. Optional on some Test Set models.

Chapter 4, Adjacent Channel Power Screen

Field Descriptions

S:\agilent\8920\8920b\USRGUIDE\BOOK\CHAPTERS\acpscrn.fb

AF Analyzer Screen

Chapter 5, AF Analyzer Screen

Block Diagram

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Figure 15 AF ANALYZER Functional Block Diagram

The Settling, Gain Cntl, and Ext Load R fields are not shown.

Variable Frequency Notch if purchased.

100

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Agilent 8920A User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Get Started

Before Connecting a Radio

Accessing the Test Set’s Screens

List of Screens

Accessing Screens

Changing A Field’s Setting

Unit-of-Measure Field

Underlined Immediate-Action Field

One-of-Many Field

Numeric-Entry Field

How do I Verify that the Test Set is Operating Properly?

Instrument Quick Check

Instrument Functional Diagram

Configuring Your Test Set

General Operating Information

To Set Screen Intensity

To Set RF Voltage Interpretation (50 /emf)

To Set the Date and Time

To Change the Beeper Volume

To Verify or Change the Low-Battery Setting

Operating Overview

Interaction Between Screens

Displaying Measurements

Displaying RF Measurements

Displaying AF Measurements

To Change the Measurement’s Unit-of-Measure

To Use the Analog METER Format

To Make Beat Frequency Measurements

Entering and Changing Numbers

To Enter Numbers

To Enter and Change the Unit-of-Measure

To Change the Increment or Decrement Setting

Printing A Screen

To Print A Screen’s Contents

Using Measurement Limit Indicators

To Set A HI and/or LO LIMIT

To Reset or Remove Limits

Averaging Measurements

To Use Measurement Averaging

Setting A Measurement Reference

To Use the Present Value as a Reference

To Set a Specific Reference

Using Memory Cards

Setting the Write-Protect Switch

The Memory Card Battery

Memory Card Initialization

Saving and Recalling Instrument Setups

To Save an Instrument Setup

To Recall an Instrument Setup

Example of Saving and Recalling an Instrument Setup

To Remove (Clear) an Individual Save Register

To Clear All Save Registers

Register Names

POWERON Settings

BASE Settings

Memory Considerations

Using USER Keys

To Use the Pre-Assigned Local USER Keys

To Assign Local USER Keys

To Release Local USER Keys

To Assign Global USER Keys

To Release Global USER Keys

Setting an RF Generator/Analyzer Offset

To Set an RF Offset

Using Remote Control

Using GPIB Control

Running IBASIC Programs from Memory Cards

Using an ASCII Terminal

Adjacent Channel Power Screen

How the Test Set Measures Adjacent Channel Power (ACP)

Field Descriptions

ACP Meas

AFGen1 Freq

AFGen1 To

Carrier Ref

Channel BW