Enables you to drop a single DWDM channel or
measure time resolved chirp (TRC) and calculate
dispersion penalty (DPC).
· Excellent “Close-In” Dynamic Range
Accurately characterize 50 GHz WDM system
performance
· High Throughput
Fast sweep speeds at high sensitivity to
maximize measurement throughput
· Built-In Applications
Agilent’s powerful application concept makes
complex and repetitive measurements simple
· Benchtop and Portable Platforms
Choose between a large screen or small
footprint package
Agilent 8614xB
Optical Spectrum Analyzer Family
Technical Specifications
August 2003
BenchtopPortable
Ideal for critical WDM system and component characterization
Ideal for a wide range of applications at value prices
Features filter mode, single mode monochromator output
Agilent Technologies offers a wide variety of optical spectrum analyzers (OSA) to meet your test needs
whether it’s in R&D, manufacturing, installation, or maintenance and commissioning. Both benchtop and
portable models are available at different price and performance points so you can choose the most cost
effective solution to meet your test needs.
The distinction between specifications and characteristics is described as follows:
· Specifications describe warranted performance.
· Characteristics provide useful, but non-warranted information about the functions and performance of the
instrument.
The specifications apply to all functions autocoupled over the temperature range 0 to 55° C and relative
humidity <95% (unless otherwise noted).
All specifications apply after the instrument’s temperature has been stabilized after 1 hour continuous operation
and the auto-align routine has been run. Unless otherwise noted, specifications apply without USER CAL.
The 86146B specifications are for the 50 µm internal path only.
Wavelength
Range
Span Range
Accuracy
After calibration with internal calibration
source and with enhanced wavelength
calibration on for specified range. *
1480-1570 nm
1570-1620 nm
After calibration with external reference
source(s)
±10 nm of calibration reference point(s)*±0.01 nm
After user calibration over full
wavelength range (600-1700 nm) *
Absolute Accuracy±0.5 nmFactory cal. 2 yr. cycle
Excluding amplitude errors
at low power levels due to
noise.
(20-30°C)
T
For signals within 8 dB of
top of screen
Absorption of light by
atmospheric moisture
affects flatness
at 1350-1420 nm
For resolution
(room)
T
³0.2 nm,
The 86146B specifications are for the 50 mm internal path only.
Char. indicates the number is a characteristic.
T(#) indicates temperature dependence.
* With applied input fiber 9/125
mm.
Page 3 of 10
Dynamic Range
In 0.1 nm Resolution Bandwidth *
Agilent 86140B,
86143B
Agilent 86142B,
86145B, 86146B
Notes
Excluding multiple order grating
response
1250-1610 nm (chop mode on)
±0.5 nm, ± 1nm, ±5 nm
-70 dBChar., Chop mode not available
on the 86146B model
1550 nm
At ±0.8 nm (±100 GHz at 1550 nm)-60 dBAverage of all states of
polarization
At ±0.5 nm (±62.5 GHz at 1550 nm)
-58 dB
Char. (86140B, 86143B)
At ±0.4 nm (±50 GHz at 1550 nm)-55 dB
At ±0.2 nm (±25 GHz at 1550 nm)-40 dB-40 dBChar.
Monochromator Input
Input Return Loss
Straight connector (9/125
mm)
Sweep
Max. Sweep Rate
Max. Sampling Rate in Zero Span
Agilent 8614xBNotes
>35 dBDepends on the qualitiy of the
Agilent 8614xBNotes
40 nm/56.3 msChar.
50
ms/trace point
Sweep Cycle Time
50 nm span, auto zero off
50 nm span, auto zero on
100 nm span
500 nm span
<180 ms
<340 ms
<400 ms
<650 ms
ADC Trigger Accuracy
Jitter (distributed uniformly)
Trigger delay range
Pulse Mode Accuracy
Agilent 86140B,
86143B
<
±0.5 ms
2
ms-6.5 ms
Agilent 86142B,
86145B, 86146B
Turn On (³2ms after rising edge)<±0.2 dB (starting from dark)
Turn Off (³10ms after falling edge)<±0.2 dB<±0.2 dB (30 dB
Data exportSpreadsheet and Word Processor Compatible
(CSV ASCII)
Graphics exportCGM, PCL, GIF
Instrument Drivers
Universal Instrument Drivers (PNP),
Compatible with VEE, Labview, Visual Basic
and C++
attached connector.
Char.
Char.
Notes
Char.
Char. (86140B, 86143B, 86146B)
MS-DOS is a U.S. registered
trademark of Microsoft
Corporation
Labview is a U.S. registered
trademark of National
Instruments.
The 86146B specifications are for the 50 mm internal path only.
Char. Indicates the number is a characteristic.
T(#) indicates temperature dependence.
* With applied input fiber 9/125
mm
Page 4 of 10
General Specifications
Dimensions
Weight
Environmental
Temperature
Humidity
EMI
Power Requirements
Voltage and frequency
Maximum power consumption
Benchtop OSA Agilent
86140B, 86142B, 86146B
222 high x 425 wide x 427 mm long163 high x 325 wide x 427 mm long
16.5 Kg14.5 Kg
Operating 0°C to 55°C, Storage –40°C to 70°C
Operating <95% RH, Storage: Noncondensing
Conducted and radiated interference is in compliance with CISPR pub 11,
IEC 801-3, IEC 801-4 and IEC 555-2
90 Vac to 260 Vac, 44 to 444 Hz
230W
Additional Specifications: Agilent 86146B
Insertion Loss Stability** (For 0.1 nm filter bandwidth and greater)
1550 nm,15 minutes0.5 dB
Insertion Loss***(For 0.1 nm filter bandwidth and greater)
* Characteristic value
** Immed iately following enhanced single point auto align, at constant temperature
***At room temperature
All data applies across 0-55 degrees C operating range unless otherwise noted.
After warmup period of 2 hrs
Adjacent Channel Rejection limited to 60 dB below total integrated power
Page 5 of 10
Options and Accessories
Options (available on new
instruments only)
Current Source *
White Light Source *
Built-in 1310 & 1550 nm EELED
Source
Wavelength Calibrator
DWDM Spectral Analysis Application
Passive Component Test Application
Amplifier Test Application
Source Test Application
Connector Interface
Agilent 86140B, 86142B, 86146B
Range
Resolution (char)50 mA steps
Accuracy
Clamp Voltage (nominal)±2.7 V
Noise Density at 1 kHz (char)
Stability Within 30 Minutes (char)
Temperature Drift (char)
Pulse Mode
Pulse Range
Pulse Resolution
Duty Cycle Range
Benchtop OSA
0 to
±200 mA (source or sink)
2%
±50 mA
<4 nA/
ÖHz
<100 ppm
<(100 ppm
10
Pulse width/1 s to 100%
±500 nA
±500 nA)/°C
ms to 6.5 ms
100 ns
8614xB-002 White Light Source
Wavelength
Minimum Output Power Spectral
Density
(9/125 mm fiber)
900 to 1600 nm
900 to 1600 nm (typical)
1600 to 1700 nm
Minimum Output Power Spectral
Density (char)
50/125
62.5/125
Output Stability (characteristic)±0.02 dB over 10 minutes
Lamp Lifetime, Mean Time Between
Failures
(MTBF) (char)>5000 hours
mm fiber
mm fiber
900 nm to 1700 nm
-67 dBm/nm (0.2 nW/nm)
-64 dBm/nm (0.4 nW/nm)
-70 dBm/nm (0.1 nW/nm)
-50 dBm/nm (10 nW/nm)
-46 dBm/nm (25 nW/nm)
8614xB-004 EELED Sources
Minimum Spectral Power Density
1300 to 1320 nm, 1540 to 1560 nm
1250 to 1620 nm
Return Loss
With straight connector>25dB
Stability (ambient temp. <±1°C)
Over 15 minutes
Over 6 hours
>-40 dBm/nm (10nW/nm)
>-60 dBm/nm (1nW/nm)
±0.02 dB
<
<
±0.05 dB
Page 7 of 10
8614xB-006 Wavelength Calibrator
The wavelength calibrator option provides an onboard wavelength reference that can be used to automatically
calibrate the optical spectrum analyzer. The calibrator is based on an EELED and an Acetylene gas absorption
cell, Figure 1. The Acetylene absorbs light at very specific wavelengths based on the molecular properties of gas.
The cell is illuminated by an EELED and the OSA uses the absorption pits to perform a wavelength calibration,
Figure 2. Since the absorption of the Acetylene gas is a physical constant it never needs calibrating.
The wavelength calibrator enhances the OSA to achieve better than ±10 pm wavelength accuracy and removes
the
need to use a tunable laser source and multi-wavelength meter as an external reference.
Additional Parts and
Accessories
Printer Paper (5 rolls / box)
Additional Connector Interfaces
9 µm Single Mode Connector Saver
Rack-mount Flange Kit
Transit Case
Soft Carrying Case
BenchLink Lightwave Software*
* Agilent N1031A BenchLink Lightwave allows transfer of measurement results over a GPIB Interface to a PC for the purposes of archiving, printing and
further anlysis
Agilent 86140B, 86142B, 86146B
Benchtop OSA
9270-13709270-1370
See Agilent 81000 seriesSee Agilent 81000 series
StandardStandard
8614xB-AX4N/A
9211-26579211-5604
N/A8614xB-042
StandardStandard
Portable OSA
Agilent 86143B, 86145B
Page 8 of 10
Definition of Terms
Wavelength
·Absolute Accuracy (after user cal) refers to the wavelength accuracy after the user has performed the
internal wavelength calibration using a source of known wavelength.
·Reproducibility refers to the amount of wavelength drift which can occur over the specified time while the
OSA is swept across a source of known wavelength.
·Tuning Repeatability refers to the wavelength accuracy of returning to a wavelength after having tuned to a
different wavelength.
Resolution
·FWHM refers to the Full-Width-Half-Maximum resolutions that are available. This indicates the width at half
powerlevel of the signal after passing through the resolution slits.
Amplitude
·Scale Fidelity refers to the potential errors in amplitude readout at amplitudes other than at the calibration
point. This specification is sometimes called linearity.
·Flatness defines a floating band which describes the error in signal amplitude over the indicated wavelength
range.
(This error may be removed at a given wavelength by performing the user amplitude calibration.)
·Polarization Dependence refers to the amplitude change that can be seen by varying the polarization of the
light entering the OSA. This is not to be confused with amplitude variations caused by the varying
distribution
of energy between the different modes in fiber that are multimode at the wavelength of interest.
Sensitivity
·Sensitivity is defined as the signal level that is equal to six times the RMS value of the noise. Displayed
sensitivity values are nominal. Slightly lower values may have to be entered to achieve specified sensitivity.
Dynamic Range
·Dynamic Range is a measure of the ability to see low-level signals that are located very close (in
wavelength) to
a stronger signal. In electrical spectrum analyzers, this characteristic is generally called shape factor.
Sweep Time
·Maximum Sweep Rate refers to the maximum rate that the instrument is able to acquire data and display it.
Thisrate may be limited by multiple internal processes when using default number of trace points.
·Sweep Cycle Time refers to the time required to make a complete sweep and prepare for the next sweep. It
can be measured as the time from the start of one sweep to the start of the next sweep.
Page 9 of 10
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