Agilent 86140A
Optical Spectrum Analyzer Family
Technical Specifications
• Excellent “Close-In” Dynamic Range
Accurately characterize 50 GHz WDM system performance
• High Throughput
Fast sweep speeds at high sensitivity to maximize measurement throughput
• Built-In Applications
Agilent’s new application concept makes complex and repetitive measurements simple
• Benchtop and Portable Platforms
Choose between a large screen or small footprint package
Benchtop Portable
High Accuracy: Ideal for critical WDM system and component characterization Agilent 86142A Agilent 86145A
Standard: Ideal for a wide range of applications at value prices Agilent 86140A Agilent 86143A
The Agilent 86140A and 86142A optical spectrum analyzers are high performance benchtop instruments that offer a combination of flexibility, high accuracy and throughput for both R&D and manufacturing environments. These are complimented
by the portable Agilent 86143A and 86145A, providing performance in a compact 14.5 kg package for environments where
small size and weight are important.
The specifications apply to all functions autocoupled over the temperature range 0 to 55° C and relative humidity <95%
(unless otherwise noted). All specifications apply after the instrument’s temperature has been stabilized after 1 hour continuous operation and the auto-align routine has been run. Unless otherwise noted, specifications apply without USER CAL.
Characteristics and Specifications
The distinction between specifications and characteristics is described as follows:
• Specifications describe warranted performance.
• Characteristics provide useful, but nonwarranted information about the functions and performance of the instrument.
2
Specifications
Agilent Agilent Agilent Agilent
86140A 86143A 86142A 86145A
Standard High Accuracy
Benchtop Portable Benchtop Portable
Wavelength
Range 600 nm to 1700 nm
Span range (continuously variable) 0.2 nm to full range and zero span
Accuracy
After calibration with internal wavelength reference signal
1,2
±0.025 nm (1510–1570), ±0.035 nm (1570–1640)
After user calibration within ±40 nm of calibration signal
1,2
±0.05 nm
After user calibration over full wavelength range
1
±0.2 nm
Absolute accuracy (Factory Calibration Cycle 2 yrs)
1
±0.5 nm
Reproducibility (≤1 min)
1
±0.003 nm
Span linearity
1,3
±0.05 nm, for spans <40nm
Span linearity (1525 nm to 1570 nm)
1,2,3
±0.02 nm
Tuning repeatability
1
±0.003 nm
Resolution Bandwidth (RBW)
FWHM (selectable)
1,4
0.07, 0.1, 0.2, 0.5, 1, 2, 5, 10 nm 0.06, 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
Corrected Res. bandwidth accuracy (using noise markers)
1,3
≥0.5 nm, 1525–1610 nm ±4% ± 3%
0.2 nm, 1525–1610 nm ±6% ± 5%
0.1 nm, 1525–1610 nm ±12% ± 10%
Amplitude
Sensitivity
5
600–750 nm (No averaging required)
6,7
–60 dBm
750–900 nm (No averaging required)
6,7
–75 dBm
900–1250 nm (No averaging required)
6
–75 dBm
1250–1610 nm (No averaging required)
6
–90 dBm
1610–1700 nm (No averaging required)
3
–80 dBm
Maximum measurement power
2,8
1525–1700 nm +15 dBm per channel, +30 dBm total
600–1000 nm +15 dBm per channel, +30 dBm total
1000–1525 nm +12 dBm per channel, +30 dBm total
Maximum safe power
Total safe power +30 dBm
Total power within any 10 nm portion of the spectrum +23 dBm
Calibration accuracy at –20 dBm, 1310 nm/1550 nm
9
± 0.5 dB
Scale fidelity (autorange off)
3,10
± 0.07 dB ± 0.05 dB
(autorange on)
3,10
± 0.1 dB ± 0.07 dB
Display scale (log scale) 0.01–20 dB/DIV, –120 to +90 dBm
Amplitude stability (1310 nm, 1550 nm)
1 minute ±0.01 dB
15 minutes
2
±0.02 dB
Flatness
1290–1330 nm
1
±0.2 dB
1525–1570 nm
1
±0.2 dB
1525–1610 nm
1
±0.2 dB
1250–1610 nm
1,11
±0.7 dB
Polarization dependence
1,12,13
1310 nm ±0.25 dB ± 0.12 dB
1530 nm, 1565 nm ±0.2 dB ± 0.05 dB
1600 nm ±0.25 dB ±0.08 dB
1250–1650 nm ±0.3 dB ±0.25 dB
1250–1650 nm (Multimode Fiber Opt. 025) ±0.4 dB —
3
Agilent Agilent Agilent Agilent
HP 86140A HP 86143A HP 86142A HP 86145A
Standard High Accuracy
Benchtop Portable Benchtop Portable
Dynamic Range
In 0.1 nm resolution
1,14
1250–1610 nm (chop mode on)2 ±0.5 nm, ±1 nm, ±5 nm –70 dB
1550 nm at ±0.8 nm (±100 GHz at 1550 nm)
15
–60 dB
1550 nm at ±0.5 nm (±62.5 GHz at 1550 nm) –55 dB –58 dB
1550 nm at ±0.4 nm (±50 GHz at 1550 nm) –52 dB –55 dB
1550 nm at ±0.2 nm (±25 GHz at 1550 nm)
2
–40 dB
Monochromator Input
Input return loss
Straight connector (9/125 µm)
16
>35 dB
Sweep
Max. sweep rate
2
40 nm/50 ms
Max. sampling rate in zero span
2
50 µs/trace point
Sweep cycle time
2
50 nm span auto zero off <180 ms
50 nm span <340 ms
100 nm span <400 ms
500 nm span <650 ms
ADC trigger accuracy
2
Jitter (distributed uniformly) <±0.5 µs
Trigger delay range 2 µs–6.5 ms
Pulse Mode Accuracy
Turn on (≥2 µs after rising edge)
2
<± 0.2 dB (starting from dark)
Turn off (≥10 µs after falling edge) <±0.2 dB2 <±0.2 dB (30 dB extinction)
Computer Interfacing
Remote control
Compatibility IEEE-488-1, IEEE-488.2 (100%)
Interfaces GPIB, Parallel Printer Port, External VGA Monitor, Keyboard (PS/2)
and Mouse
Floppy Disk 3.5” 1.44MB, MS-DOS
®
Data export Spreadsheet and Word Processor Compatible (CSV ASCII)
Graphics export CGM
Instrument drivers Universal Instrument Drivers (PNP), Compatible with VEE,
Labview
®
, Visual Basic and C++
MS-DOS is a U.S. registered trademark of Microsoft Corporation.
Labview is a U.S. registered trademark of National Instruments.
4
Benchtop OSA Portable OSA
Agilent 86140A/86142 Agilent 86143A/86145A
General Specifications
Dimensions 222 high x 425 wide x 427 mm long 163 high x 325 wide x 427 mm long
Weight 16.5 Kg 14.5 Kg
Environmental
Temperature
17
Operating 0°C to 55°C, Storage –40°C to 70°C
Humidity Operating <95% RH, Storage Noncondensing
EMI Conducted and radiated interference is in compliance with CISPR pub11,
IEC 801-3,IEC 801-4 and IEC555-2
Power Requirements
Voltage and frequency 90 Vac to 260 Vac, 44 to 444 Hz
Maximum power consumption 230 W
Option 004/005 EELED Sources
Minimum spectral power density
18
1540 to 1560 nm (Option 005) >–40 dBm/nm 100 nW/nm
1470 to 1620 nm (Option 005)
2
>–60 dBm/nm 1 nW/nm
1300 to 1320 nm, 1540 to 1560 nm (Option 004) >–40 dBm/nm 100 nW/nm
1250 to 1620 nm (Option 004)
2
>–60 dBm/nm 1 nW/nm
Return loss
2
With straight connector >25 dB
Stability (ambient temp. <±1°C)
2
Over 15 minutes <±0.02 dB
Over 6 hours <±0.05 dB
1
With applied input fiber 9/125 µm
2
Characteristic
3
Temperature range 20 to 30°C
4
Resolution of 10 nm is available in first order only
5
Sensitivity is defined as signal value >6 x RMS noise value.
6
Temperature range 0 to 30°C.
7
Second order
8
Resolution bandwidth setting <channel spacing.
9
For resolution ≥0.1 nm
10
Excluding amplitude errors at low power levels due to noise
11
Between 1350 nm and 1420 nm absorption of light by atmospheric moisture affects flatness.
12
For resolution ≥0.2 nm
13
At room temperature
14
Excluding multiple order grating response
15
Average of all states of polarization.
16
Depends on the quality of the attached connector
17
Floppy disk and printer operating temperature range 0 to 45°C.
18
Temperature range 0 to 45°C
5
Options and Accessories
Benchtop OSA Portable OSA
Agilent 86140A/86142A Agilent 86143A/86145A
Options (available on new instruments only)
Built-in 1310 & 1550 nm EELED Source Opt. 004 —
Built-in 1550 nm EELED Source Opt. 005 —
Wavelength Calibrator Opt. 006 Opt. 006
Passive Component Test Aplication Included Included
Alternative Connector Interface FC/PC Standard Standard
HMS-10 Opt. 011 Opt. 011
DIN Opt. 013 Opt. 013
ST Opt. 014 Opt. 014
SC Opt. 017 Opt. 017
Multimode Fiber Input
19
Opt. 025 (Agilent 86140A) Opt. 025 (Agilent 86143A)
Certificate of Calibration Included Included
19
50 µm multimode input available on Agilent 86140A and 86143A OSAs only.
6
Wavelength Calibrator Option 006
Figure 1. Wavelength calibrator block diagram
Figure 2. Wavelength calibrator absorption spectrum
The wavelength calibrator option provides an onboard wavelength reference that can be used to automatically calibrate the
optical spectrum analyzer. The calibrator is based on an EELED and an Acetylene gas absorption cell, Figure 1. The
Acetylene absorbs light at very specific wavelengths based on the molecular properties of gas. The cell is illuminated by an
EELED and the OSA uses the absorption pits to perform a wavelength calibration, Figure 2. Since the absorption of the
Acetylene gas is a physical constant it never needs calibrating.
The wavelength calibrator enhances the OSA to achieve better than ±50 pm wavelength accuracy and removes the need to
use a tunable laser source and multi-wavelength meter as an external reference.
Benchtop OSA Portable OSA
Agilent 86140A/86142A Agilent 86143A/86145A
Additional Parts and Accessories
Printer Paper (5 rolls / box) 9270-1370 9270-1370
Additional Connector Interfaces See Agilent 81000 series See Agilent 81000 series
101/102 Keyboard (OSA requires US layout) C4735A C4735A
PS/2 Style Mouse C3751B C3751B
External 10 dB Attenuator (FC/PC) Opt. 030 Opt. 030
Rack-mount Flange Kit Opt. AX4 N/A
Transit Case 9211-2657 9211-5604
Soft Carrying Case N/A Opt. 042
BenchLink Lightwave Software
20
Standard Standard
20
Agilent N1031A BenchLink Lightwave allows transfer of measurement results over an GPIB Interface to a PC for the purposes of archiving, printing and further analysis.
Literature Reference
Brochure
(Agilent literature # 5968-1123E)
Agilent 86140 Series Optical Spectrum Analysis Remote Programming.
Agilent product note (Agilent literature # 5968-1548E)
Agilent Lightwave Catalog
EELED
Acetylene
Cell
7
Definition of Terms
Wavelength
• Absolute Accuracy (after user cal) refers to the wavelength accuracy after the user has performed the internal wavelength
calibration using a source of known wavelength.
• Reproducibility refers to the amount of wavelength drift which can occur over the specified time while the OSA is swept
across a source of known wavelength.
• Tuning Repeatability refers to the wavelength accuracy of returning to a wavelength after having tuned to a different
wavelength.
Resolution
• FWHM refers to the Full-Width-Half-Maximum resolutions that are available. This indicates the width at half power level
of the signal after passing through the resolution slits.
Amplitude
• Scale Fidelity refers to the potential errors in amplitude readout at amplitudes other than at the calibration point. This
specification is sometimes called linearity.
• Flatness defines a floating band which describes the error in signal amplitude over the indicated wavelength range. (This
error may be removed at a given wavelength by performing the user amplitude calibration.)
• Polarization Dependence refers to the amplitude change that can be seen by varying the polarization of the light entering
the OSA. This is not to be confused with amplitude variations caused by the varying distribution of energy between the
different modes in fiber that are multimode at the wavelength of interest.
Sensitivity
• Sensitivity is defined as the signal level that is equal to six times the RMS value of the noise. Displayed sensitivity values
are nominal. Slightly lower values may have to be entered to achieve specified sensitivity.
Dynamic Range
• Dynamic Range is a measure of the ability to see low-level signals that are located very close (in wavelength) to a stronger
signal. In electrical spectrum analyzers, this characteristic is generally called shape factor.
Sweep Time
• Maximum Sweep Rate refers to the maximum rate that the instrument is able to acquire data and display it. This rate
may be limited by multiple internal processes.
• Sweep Cycle Time refers to the time required to make a complete sweep and prepare for the next sweep. It can be
measured as the time from the start of one sweep to the start of the next sweep.
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Technical data subject to change
Copyright © 1999
Agilent Technologies
Printed in U.S.A. 12/99
5968-1124E
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