DCA-J
Agilent 86100C
Wide-Bandwidth Oscilloscope
Mainframe and Modules
Technical Specifi cations
Four instruments in one
A digital communications analyzer,
a full featured wide-bandwidth
oscilloscope, a time-domain
refl ectometer, and a jitter analyzer
• Accurate compliance
testing of optical transceivers
• Automated jitter and amplitude
interference decomposition
• Internally generated pattern trigger
• Modular platform for testing waveforms to
40 Gb/s and beyond
• Broadest coverage of data rates with optical reference
receivers, electrical channels, and clock recovery
• Built-in S-parameters with TDR measurements
• Compatible with Agilent 86100A/B-series,
83480A-series,and 54750-series modules
• < 100 fs intrinsic jitter
• Open operating system – Windows® XP Pro
Table of Contents
Overview
Features 3
Eye-diagram/mask test 4
Jitter analysis 5
Equalization and amplitude analysis 6
Jitter spectrum/PLL bandwidth 7
TDR/TDT/S-parameters 7
Measurements 8
Additional capabilities 9
Clock recovery 10
Specifi cations
Mainframe & triggering
(includes precision time base module
and precision waveform analyzer module) 13
Computer system & storage 16
Modules
Overview 17
Module selection table 18
Specifi cations
Multimode/single-mode 19
Single-mode 21
Dual electrical 23
TDR 25
Clock recovery 27
Ordering Information 29
2
Overview of Infi niium DCA-J
Features
Four instruments in one
The 86100C Infi niium DCA-J can be viewed as four
high-powered instruments in one:
• A general-purpose wide-bandwidth sampling
oscilloscope. PatternLock triggering signifi cantly
enhances the usability as a general purpose scope.
• A digital communications analyzer
• A time domain refl ectometer
• A precision jitter and amplitude interference analyzer
Just select the desired instrument mode and start making
measurements.
Confi gurable to meet your needs
The 86100C supports a wide range of modules for testing
both optical and electrical signals. Select modules to get
the specifi c bandwidth, fi ltering, and sensitivity you need.
Digital communications analysis
Accurate eye-diagram analysis is essential for
characterizing the quality of transmitters used
from 100 Mb/s to 40 Gb/s. The 86100C is designed
specifi cally for the complex task of analyzing digital
communications waveforms. Compliance mask and
parametric testing no longer require a complicated
sequence of setups and confi gurations. If you can press
a button, you can perform a complete compliance test.
The important measurements you need are right at your
fi ngertips, including:
The key to accurate measurements of lightwave
communications waveforms is the optical receiver.
The 86100C has a broad range of precision receivers
integrated within the instrument.
• Built-in photodiodes, with fl at frequency responses,
yield the highest waveform fi delity. This provides
high accuracy for extinction ratio measurements.
• Standards-based transmitter compliance measurements
require fi ltered responses. The 86100C offers a broad
range of fi lter combinations. Filters can be automatically
and repeatably switched in or out of the measurement
channel remotely over GPIB or with a front panel
button. The frequency response of the entire
measurement path is calibrated, and will maintain
its performance over long-term usage.
• The integrated optical receiver provides a calibrated
optical channel. With the accurate optical receiver
built into the module, optical signals are accurately
measured and displayed in optical power units.
• Switches or couplers are not required for an average
power measurement. Signal routing is simplifi ed and
signal strength is maintained.
• industry standard mask testing with built-in
margin analysis
• extinction ratio measurements with accuracy and
repeatability
• eye measurements: crossing %, eye height and width,
‘1’ and ‘0’ levels, jitter, rise or fall times and more
Windows is a U. S. registered trad emark of Microsoft C orpor ation .
3
Eye diagram mask testing
The 86100C provides effi cient, high-throughput
waveform compliance testing with a suite of standards
based eye-diagram masks. The test process has been
streamlined into a minimum number of keystrokes for
testing at industry standard data rates.
Standard formats
Rate (Mb/s)
1X Gigabit Ethernet 1250
2X Gigabit Ethernet 2500
10 Gigabit Ethernet 9953.28
10 Gigabit Ethernet 10312.5
10 Gigabit Ethernet FEC 11095.7
10 Gigabit Ethernet LX4 3125
Fibre Channel 1062.5
2X Fibre Channel 2125
4X Fibre Channel 4250
8x Fibre Channel 8500
10X Fibre Channel 10518.75
10X Fibre Channel FEC 11317
Infi niband 2500
STM0/OC1 51.84
STM1/OC3 155.52
STM4/OC12 622.08
STM16/OC48 2488.3
STM16/OC48 FEC 2666
STM64/OC192 9953.28
STM64/OC192 FEC 10664.2
STM64/OC192 FEC 10709
STM64/OC192 Super FEC 12500
STM256/OC768 39813
STS1 EYE 51.84
STS3 EYE 155.52
Other eye-diagram masks are easily created through
scaling those listed above. In addition, mask editing
allows for new masks either by editing existing masks,
or creating new masks from scratch. A new mask can
also be created or modifi ed on an external PC using
a text editor such as Notepad, then can be transferred
to the instrument’s hard drive using LAN or Flash drive.
Perform these mask conformance tests with convenient
user-defi nable measurement conditions, such as mask
margins for guardband testing, number of waveforms
tested, and stop/limit actions. Mask margin can be
determined automatically to a user defi nable hit/error
ratio. Transmitter waveform dispersion penalty (TWDP)
tests can be performed directly in the 86100C. Exporting
the waveform for external post processing is not required.
(Option 201 and MATLAB® required. Dispersion penalty
script for specifi c test standards must be loaded into
the 86100C.)
Eyeline Mode
Eyeline Mode is available in the 86100C and provides
insight into the effects of specifi c bit transitions within a
data pattern. The unique view assists diagnosis of device
or system failures due to specifi c transitions or sets of
transitions within a pattern. When combined with mask
limit tests, Eyeline Mode can quickly isolate the specifi c
bit that caused a mask violation.
Traditional triggering methods on an equivalent time
sampling scope are quite effective at generating eye
diagrams. However, these eye diagrams are made up of
samples whose timing relationship to the data pattern
is effectively random, so a given eye will be made up
of samples from many different bits in the pattern
taken with no specifi c timing order. The result is that
amplitude versus time trajectories of specifi c bits in
the pattern are not visible. Also, averaging of the eye
diagram is not valid, as the randomly related samples
will effectively average to the “middle” of the eye.
MATLAB® is a registered trademark of The Mat hWorks , Inc.
Eyeline Mode uses PatternLock triggering (Option 001
required) to build up an eye diagram from samples taken
sequentially through the data pattern. This maintains
a specifi c timing relationship between samples and
allows Eyeline Mode to draw the eye based on specifi c
bit trajectories. Effects of specifi c bit transitions can be
investigated, and averaging can be used with the eye
diagram.
4
PatternLock Triggering advances the
capabilities of the sampling oscilloscope
The Enhanced Trigger option (Option 001) on the 86100C
provides a fundamental capability never available
before in an equivalent time sampling oscilloscope.
This new triggering mechanism enables the DCA-J to
generate a trigger at the repetition of the input data
pattern – a pattern trigger. Historically, this required the
pattern source to provide this type of trigger to the scope.
With the press of a button, PatternLock automatically
detects the pattern length, data rate and clock rate
making the complex triggering process transparent to
the user.
PatternLock enables the 86100C to behave more like a
real-time oscilloscope in terms of user experience.
Observation of specifi c bits within the data pattern is
greatly simplifi ed. Users that are familiar with real-time
oscilloscopes, but perhaps less so with equivalent time
sampling scopes will be able to ramp up quickly.
The DCA-J provides simple, one button setup and
execution of jitter analysis. Jitter Mode decomposes
jitter into its constituent components and presents
jitter data in various insightful displays. Jitter Mode
operates at all data rates the 86100C supports, removing
the traditional data rate limitations from complex jitter
analysis. The 86100C provides several key attributes to
jitter analysis:
• Very low intrinsic jitter (both random and
deterministic) translates to a ver y low jitter noise
fl oor which provides unmatched jitter measurement
sensitivity.
• Wide bandwidth measurement channels deliver very
low intrinsic data dependent jitter and allow analysis
of jitter on all data rates to 40 Gb/s and beyond.
• PatternLock triggering technology provides sampling
effi ciency that makes jitter measurements very fast.
• Firmware revision 8.0 allows for accurate jitter
measurements on signals with large RJ/PJ components
(up to 0.7 UI).
PatternLock adds another new dimension to pattern
triggering by enabling the mainframe software to take
samples at specifi c locations in the data pattern with
outstanding timebase accuracy. This capability is a
building block for many of the new capabilities available
in the 86100C described later.
Jitter analysis (Option 200)
The “J” in DCA-J represents the ability to perform
jitter analysis. The 86100C is a Digital Communications
Analyzer with jitter analysis capability. The 86100C adds
a fourth mode of operation – Jitter Mode. Extremely
wide bandwidth, low intrinsic jitter, and advanced
analysis algorithms yield the highest accuracy in jitter
measurements.
As data rates increase in both electrical and optical
applications, jitter is an ever increasing measurement
challenge. Decomposition of jitter into its constituent
components is becoming more critical. It provides
critical insight for jitter budgeting and performance
optimization in device and system designs. Many
communications standards require jitter decomposition
for compliance. Traditionally, techniques for separation of
jitter have been complex and often diffi cult to confi gure,
and availability of instruments for separation of jitter
becomes limited as data rates increase.
Jitter analysis functionality is available through the
Option 200 software package. Option 200 includes:
• Decomposition of jitter into Total Jitter (TJ), Random
Jitter (RJ), Deterministic Jitter (DJ), Periodic Jitter
(PJ), Data Dependent Jitter (DDJ), Duty Cycle
Distortion (DCD), and Jitter induced by Intersymbol
Interference (ISI).
• Various graphical and tabular displays of jitter data
• Export of jitter data to convenient delimited text
format
• Save / recall of jitter database
• Jitter frequency spectrum
• Isolation and analysis of Sub-Rate Jitter (SRJ), that is,
periodic jitter that is at an integer sub-rate of the bitrate.
• Bathtub curve display in both Q and logBER scale
• Adjustable total jitter probability
5
Equalization and advanced waveform analysis
(Option 201)
As bit rates increase, channel effects cause signifi cant
eye closure. Many new devices and systems are
employing equalization and pre/de-emphasis to
compensate for channel effects. Option 201 Advanced
Waveform Analysis will provide key tools to enable
design, test, and modeling of devices and systems that
must dea l with diffi cult channel effects:
• Capture of long single valued waveforms. PatternLock
triggering and the waveform append capability of
Option 201 enable very accurate pulse train data sets
up to 256 megasamples long, similar to a very deep
memory real-time oscilloscope acquisition.
• Equalization. The DCA-J can take a long single
valued waveform and route it through a linear
equalizer algorithm (default or user defi ned) and
display the resultant equalized waveform in real time.
The user can simultaneously view the input (distorted)
and output (equalized) waveforms.
• Interface to MATLAB® analysis capability. User can
defi ne a measurement with a MATLAB® script. Result
can be reported on oscilloscope results display.
• Automatic dispersion penalty analysis (such as
transmitter waveform dispersion penalty or TWDP).
User-entered MATLAB® scripts used to automatically
process waveforms and determine penalty values.
Advanced amplitude analysis/RIN/Q-factor
(Option 300)
In addition to jitter, signal quality can also be impacted
by impairments in the amplitude domain. Similar to
the many t ypes of jitter that exist, noise, inter-symbol
interference, and periodic fl uctuation can cause eye
closure in the amplitude domain. Option 300 can be
added to an 86100C mainframe (Option 200 must
also be installed) to provide in-depth analysis of the
quality of both the zero and one levels of NRZ digital
communications signals. A mplitude analysis is performed
at a single button press as part of the jitter mode
measurement process.
• Measurement results are analogous to those provided
for jitter and include Total Interference (TI),
Deterministic Interference (dual-Dirac model, DI),
Random Noise (RN), Periodic Interference (PI), and
Inter-symbol Interference (ISI)
• Tablular and graphical results for both one and
zero levels
• Export of interference data to delimited text format
• Save/recall of interference database
• Interference frequency spectrum
• Bathtub curve display
• Q-factor (isolated from deterministic interference)
• Adjustable probability for total interference estimation
Relative Intensity Noise (RIN)
Relative Intensity Noise (RIN) describes the effects of
laser intensity fl uctuations on the recovered electrical
signal. Like amplitude interference, excessive RIN can
close the eye diagram vertically, and therefore affect the
power budget or system performance. The DCA-J can
measure RIN on square wave as well as industrystandard PRBS and other patterns. In order to avoid
having the measurement infl uenced by inter-symbol
interference, the instrument searches the pattern for
sequences of consecutive bits (for example, fi ve zeroes or
fi ve ones) and measures the random noise and the power
levels in the center of this sequence. When a reference
receiver fi lter is turned on RIN is normalized to a 1 Hz
bandwidth. The user can also choose between RIN based
on the one level or on the optical modulation amplitude
(RIN OMA according to IEEE 802.3ae). RIN measurements
require Options 001, 200, and 300.
6
Phase noise/jitter spectrum analysis
Analysis of jitter in the frequency domain can provide
valuable insight into jitter properties and the root causes
behind them. The phase locked-loop of the 83496B clock
recovery module or 86108A precision waveform analyzer
module can effectively be used as a jitter demodulator.
Internally monitoring the loop error signal and
transforming it into the frequency domain allows the
jitter spectrum of a signal to be observed. Through
self-calibration, effects of the loop response are removed
from the observed signal, allowing accurate jitter spectral
analysis over a 300 Hz to 20 MHz span.
This technique provides measurements not available with
other test solutions:
• Jitter spectrum/phase noise for both clock or data
signals
• Display in seconds or dBc/Hz
• High sensitivity: for input signals > 0.5 Vpp,
< –100 dBc/Hz at 10 kHz offset for 5 Gb/s, –106 dBc/Hz
for 2.5 Gb/s, –140 dBc/Hz at 20 MHz offset (integrated
spectrum of the instrument jitter from 10 kHz to 20 MHz
is less than 100 fs)
• High dynamic range: can lock onto and display signals
with > 0.5% pp frequency deviation such as
spread spectrum clocks and data
• Data rates from 50 Mb/s to 13.5 Gb/s
• Clock rates from 25 MHz to 6.75 GHz
Spectral results can be integrated to provide an estimate
of combined jitter over a user-defi ned span. As both
clock s and data signals can be observed, the ratio of
data-to-clock jitter can be observed. The displayed jitter
spectrum can also be altered through a user-defi ned
transfer function, such as a specifi c PLL frequency
response.
Phase noise analysis is achieved via an external
spreadsheet application run on a personal computer
communicating to the 83496B/86108A through the
86100C mainframe (typically using a USB-GPIB
connection). An 83496A clock recovery module must
be upgraded to a “B” version to function in the phase
noise system.
PLL bandwidth/jitter transfer
The on-board phase detector of the 83496B and 86108A
allows for a precision measurement of phase-locked loop
(PLL) bandwidth, sometimes referred to as jitter transfer.
The external software application discussed above for
phase noise/jitter spectrum controls several jitter
sources including the Agilent N4903 JBERT, 81150A
function generator, N5182A MXG, or pat tern generators/
sources with delay line or phase modulation inputs
(modulated with a 33250A function generator) to provide
a modulated stimulus to the device under test (DUT). The
application will monitor the internal phase detector of the
83496B or 86108A to measure the stimulus as well as the
DUT response. By sweeping the frequency of the jitter
stimulus, the ratio of the output jitter to the input jitter
provides the PLL bandwidth. The measurement system
is extremely fl exible and can test input/outputs from 50
Mb/s to 13.5 Gb/s (data signals) and/or 25 MHz to 6.75
GHz (clock signals). Thus several classes of DUTs can be
measured including clock extraction circuits, multiplier/
dividers, and PLLs. Similar to a phase noise analysis, this
capability is achieved via an external application run
on a PC.
S-parameters and time domain refl ectometery/
time domain transmission (TDR/TDT)
High-speed design starts with the physical structure.
The transmission and refl ection properties of electrical
channels and components must be characterized to
ensure suffi cient signal integrity, so refl ections and
signal distortions must be kept at a minimum. Use TDR
and TDT to optimize microstrip lines, backplanes, PC
board traces, SMA edge launchers and coaxial cables.
Analyze return loss, attenuation, crosstalk, and other
S-parameters (including magnitude and group delay) with
one button push using the 86100C Option 202 Enhanced
Impedance and S-parameter software, either in singleended or mixed-mode signals.
Calibration techniques, unique to the 86100C, provide
highest precision by removing cabling and fi xturing
effects from the measurement results. Translation of TDR
data to complete single-ended, differential, and mixed
mode S-parameters (including magnitude and group
delay) are available through Option 202 and the N1930A
Physical Layer Test System software. Higher two-event
resolution and ultra high-speed impedance measurements
are facilitated through TDR pulse enhancers from
Picosecond Pulse Labs
1
.
1. Picosecond Pulse Labs 4020 Source Enchancement Module (www.picosecond.com)
N1024 TDR calibration kit
The N1024A TDR calibration kit contains precision
standard devices based on SOLT (Short-Open-LoadThrough) technology to calibrate the measurement path.
7
Measurements
The following measurements are available from the
tool bar, as well as the pull down menus. The available
measurements depend on the DCA-J operating mode.
Oscilloscope mode
Time
Rise Time, Fall Time, Jitter RMS, Jitter p-p, Period,
Frequency, + Pulse Width, - Pulse Width, Duty Cycle,
Delta Time, [Tmax, Tmin, Tedge—remote commands only]
Amplitude
Overshoot, Average Power, V amptd, V p-p, V rms,
V top, V base, V max, V min, V avg, OMA (Optical
Modulation Amplitude)
Eye/mask mode
NRZ eye measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Crossing Percentage, Rise Time, Fall Time, One Level,
Zero Level, Eye Height, Eye Width, Signal to Noise,
Duty Cycle Distortion, Bit Rate, Eye Amplitude
RZ Eye Measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Rise Time, Fall Time, One Level, Zero Level, Eye Height,
Eye Amplitude, Opening Factor, Eye Width, Pulse Width,
Signal to Noise, Duty Cycle, Bit Rate, Contrast Ratio
Mask Test
Open Mask, Start Mask Test, Exit Mask Test, Filter,
Mask Test Margins, Mask Test Scaling, Create NRZ Mask
Advanced measurement options
The 86100C has four software options that allow
advanced analysis. Options 200, 201, and 300 require
mainframe Option 001. Option 202 does not require
Option 86100-001.
Option 200: Enhanced jitter analysis software
Option 201: Advanced waveform analysis
Option 202: Enhanced impedance and S-parameters
Option 300: Amplitude analysis/RIN/Q-factor
Measurements (Option 200 jitter analysis)
Total Jitter (TJ), Random Jitter (RJ), Deterministic
Jitter (DJ), Periodic Jitter (PJ), Data Dependent
Jitter (DDJ), Duty Cycle Distortion (DCD),
Intersymbol Interference (ISI), Sub-Rate Jitter (SRJ),
Asynchronous periodic jitter frequencies, Subrate
jitter components.
Data Displays (Option 200 jitter analysis)
TJ histogram, RJ/PJ histogram, DDJ histogram,
Composite histogram, DDJ versus Bit position,
Bathtub curve (log or Q scale)
Measurements (Option 201 advanced
waveform analysis)
Deep memory pattern waveform, user-defi ned
measurements through MATLAB® interface,
Transmitter Waveform Dispersion Penalty (TWDP)
Data Displays (Option 201 advanced
waveform analysis)
Equalized waveform
Measurements (Option 300 advanced
amplitude analysis/RIN/Q-factor, requires
Option 200)
Total Interference (TI), Deterministic Interference
(Dual-Dirac model, DI), Random Noise (RN),
Periodic Interference (PI), and Inter-symbol
Interference (ISI), RIN (dBm or dB/Hz), Q-factor
Data Displays (Option 300 advanced
amplitude analysis/RIN/Q-factor, requires
Option 200) TI histogram, RN/PI histogram,
ISI histogram
TDR/TDT Mode (requires TDR module)
Quick TDR, TDR/TDT Setup, Normalize, Response,
Rise Time, Fall Time, Δ Time, Minimum Impedance,
Maximum Impedance, Average Impedance,
(Single-ended and Mixed-mode S-parameters with
Option 202)
8
Additional capabilities
Standard functions
Standard functions are available through pull down
menus and soft keys, and some functions are also
accessible through the front panel knobs.
Markers
Two vertical and two horizontal (user selectable)
TDR markers
Horizontal — seconds or meter
Vertical — Volts, Ohms or Percent Refl ection
Propagation — Dielectric Constant or Velocity
Limit tests
Acquisition limits
Limit Test “Run Until” Conditions — Off, # of
Waveforms, # of Samples
Report Action on Completion — Save waveform to
memory, Save screen image
Measurement limit test
Specif y Number of Failures to Stop Limit Test
When to Fail Selected Measurement — Inside Limits,
Outside Limits, Always Fail, Never Fail
Report Action on Failure - Save waveform to memor y,
Save screen image, Save summary
Mask limit test
Specif y Number of Failed Mask Test Samples
Report Action on Failure — Save waveform to memor y,
Save screen image, Save summary
Confi gure measurements
Thresholds
10%, 50%, 90% or 20%, 50%, 80% or Custom
Eye Boundaries
Defi ne boundaries for eye measurments
Defi ne boundaries for alignment
Format Units for
Duty Cycle Distortion — Time or Percentage
Extinction/Contrast Ratio — Ratio, Decibel
or Percentage
Eye Height — Amplitude or Decibel (dB)
Eye Width — Time or Ratio
Average Power — Watts or Decibels (dBm)
Top Base Defi nition
Automatic or Custom
Δ Time Defi nition
First Edge Number, Edge Direction, Threshold
Second Edge Number, Edge Direction, Threshold
Jitter Mode
Units (time or unit interval, watts, volts, or unit
amplitude)
Signal type (data or clock)
Measure based on edges (all, rising only, falling only)
Graph layout ( single, split, quad)
Quick measure confi guration
4 User Selectable Measurements for Each Mode,
Eye-mask, TDR etc.)
Default Settings
(Eye/Mask Mode)
Extinction Ratio, Jitter RMS, Average Power,
Crossing Percentage
Default Settings
(Oscilloscope Mode)
Rise Time, Fall Time, Period,
V amptd
Histograms
Confi gure
Histogram scale (1 to 8 divisions)
Histogram axis (vertical or horizontal)
Histogram window (adjustable Window via
marker knobs)
Math measurements
4 User-defi nable functions Operator — magnif y,
invert, subtract, versus, min, max
Source — channel, function, memory, constant,
response (TDR)
Calibrate
All calibrations
Module (amplitude)
Horizontal (time base)
Extinction ratio
Probe
Optical channel
Front panel calibration output level
User selectable –2V to 2V
Utilities
Set time and date
Remote interface
Set GPIB interface
Touch screen confi guration/calibration
Calibration
Disable/enable touch screen
Upgrade software
Upgrade mainframe
Upgrade module
9
Built-in information system
The 86100C has a context-sensitive on-line
manual providing immediate answers to your
questions about using the instrument. Links on
the measurement screen take you directly to the
information you need including algorithms for all of the
measurements. The on-line manual includes technical
specifi cations of the mainframe and plug-in modules. It
also provides useful information such as the mainframe
serial number, module serial numbers, fi rmware revision
and date, and hard disk free space. There is no need for a
large paper manual consuming your shelf space.
File sharing and storage
Use the internal 40 GB hard drive to store instrument
setups, waveforms, or screen images. A 256 MB USB
memory stick is included with the mainframe. Combined
with the USB port on the front panel this provides for
quick and easy fi le transfer. Images can be stored in
formats easily imported into various programs for
documentation and further analysis. LAN interface is
also available for network fi le management and printing.
An external USB DVD/CD-RW drive is available as an
option to the mainframe. This enables easy installation of
software applications as well as storage of large amounts
of data.
File security
For users requiring security of their data, 86100C
Option 090 offers a removable hard drive. This also
enables removal of the mainframe from secure
environments for calibration and repair.
Powerful display modes
Use gray scale and color graded trace displays to gain
insight into device behavior. Waveform densities are
mapped to color or easy-to-interpret gray shades.
These are infi nite persistence modes where shading
differentiates the number of times data in any individual
screen pixel has been acquired.
Direct triggering through clock recovery
Typically an external timing reference is used to
synchronize the oscilloscope to the test signal. In cases
where a trigger signal is not available, clock recovery
modules are available to derive a timing reference
directly from the waveform to be measured. The Agilent
83496A/B series of clock recovery modules are available
for electrical, multimode optical, and single-mode optical
input signals. 83496A/B modules have excellent jitter
performance to ensure accurate measurements. Each
clock recovery module is designed to synchronize to a
variety of common transmission rates. The 83496A/B
can derive triggering from optical and electrical signals
at any rate from 50 Mb/s to 13.5 Gb/s.
The 86108A module incorporates the clock recovery
capabilities of the 83496B into a module that also has
sampling channels. Since the clock recovery system is
integrated with the samplers, measurements are achieved
with a single instrument connection.
Clock recovery loop bandwidth
The Agilent clock recovery modules have adjustable loop
bandwidth settings. Loop bandwidth is very important
in determining the accuracy of your waveform when
measuring jitter, as well as testing for compliance. When
using recovered clocks for triggering, the amount of
jitter observed will depend on the loop bandwidth. As
the loop bandwidth increases, more jitter is “tracked out”
by the clock recovery resulting in less observed jitter.
• Narrow loop bandwidth provides a “jitter free” system
clock to observe a wide jitter spectrum
• Wide loop bandwidth in some applications is specifi ed by
standards for compliance testing. Wide loop bandwidth
settings mimic the performance of communications
system receivers
The 83496A/B and 86108A have a continuously adjustable
loop bandwidth from as low as 15 kHz to as high as 10 MHz,
and can be confi gured as a golden PLL for standards
compliance testing.
10
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