Agilent 86100C Data Sheet

Agilent 86100C Infiniium DCA-J

The fastest way to the right answer

The multi-functional analysis tool

One button – many insights

Time domain

reflectometer

Digital

communications

analyzer

Wide band

oscilloscope

Jitter

analyzer

2

New Enhancements

Reference receiver for
39-43 Gb/s systems

In 2002 Agilent was the first to
provide an oscilloscope with the low
intrinsic jitter necessary to accurately
view 40 Gb/s signals. The 86100 in
conjunction with the 86107A
Precision Timebase became the
de facto standard for 40 Gb/s R&D.
As such systems are now beginning
to make their way from the lab to
production; the new 86116C performs
as a reference receiver that allows
designers, manufacturers and their
customers to reliably verify component
and system specifications.

Variable loop bandwidth clock recovery
suited for spread-spectrum clocking

The 83496B multi-rate optical/
electrical clock recovery module
performs clock extraction for wave­form analysis with continuous,
unbanded tuning from 50 Mb/s to

13.5 Gb/s, ultra-low residual jitter
and Golden PLL (phase locked loop)
operation. It tolerates large periodic
jitter from Spread Spectrum Clocking
(SSC), and can tune its loop
bandwidth between 15 kHz and
10 MHz. Internally the recovered
clock signal is a subrate (1:8) and
routed to the mainframe. The front
panel provides the recovered clock
at a user-selectable rate (1:1

1

, 1:2, 1:4,

1:8, 1:16).

Solving jitter problems through
phase/frequency domain analysis

The 83496B can be used as a phase
noise analysis system. Phase noise
based measurements can be achieved
on both clock and data signals at
rates from 25 MHz to 6.75 GHz and
50 Mb/s to 13.5 Gb/s respectively.
The examples above show frequency
resolved jitter for the clock and
data lines of a PCI-Express system,
indicating how the jitter from the
reference clock is translated to the
data line. With high dynamic range,
low level random jitter spectra can
be observed at the same time as large
spread spectrum clocking jitter and
harmonics. The ability to observe
specific jitter tones as well as the broad
noise spectra provides important
insights into the root causes of jitter.
The measurement range is from
300 Hz to 20 MHz. Since jitter is
obtained in an analog technique,
results are obtained in a matter of
seconds. Virtual PLL responses can
be built in to emulate system level
performance.

1 The 1:1 choice works up to 7.1Gb/s, all other

up to 13.5 Gb/s.

Data

Clock

3

Get Deep Insights To Address Root Causes

T

he 86100C Infiniium DCA-J can now decompose amplitude
interference (Option 300) and timing jitter (Option 200) so that
designers can accurately see interference and jitter contributions,

and get a full picture to get to the root cause.

Relative intensity noise (RIN)

RIN is a random
noise contribu­tion caused by
the spontaneous
emission background of lasers. Excessive RIN can limit the power budget in
an optical system. Option 300 measures RIN either based on the “1” power
level or on OMA. Combined with automatic normalization to 1 Hz, the
DCA-J’s results compare easily and directly with those recommended by
standards (e.g., IEEE 802.3ae).

Signal/modulation impairments

Large separation between ‘one’ and
‘zero’ levels is essential for error-free
communications. This type of signal
strength is commonly determined
with standard 86100C automatic
measurements like “eye-amplitude” or
OMA (optical modulation amplitude).
Option 300 provides an advanced
technique for determining signal
amplitude. The user can isolate specific bit sequences to compose a signal
amplitude measurement. The impact of various data patterns can be
examined. Standards based OMA test, usually requiring a square wave
pattern, can now be derived from virtually any data pattern. Option 300
also separates out the various mechanisms that cause eye amplitude
closure similar to timing closure (jitter) examined using option 200.

Amplitude analysis

Interference decomposition tree

Jitter decomposition tree

Total Interference

(TI)

Deterministic

Interference (DI)

Data Dependent

Interference (DDI)

Inter-Symbol
Interference

(ISI)

Correlated
to Data

Uncorrelated
to Data

Total Jitter

Deterministic

Jitter (DJ)

Data Dependent

Jitter (DDJ)

Inter-Symbol
Interference

(ISI)

Correlated
to Data

Duty Cycle

Distortion

(DCD)

Uncorrelated
to Data

(TJ)

Sub-rate

Interference (PI)

Asynchronous

Jitter
(SRJ)

Random

Noise (RN)

Periodic

PI

(API)

Correlated
Uncorrelated to Data

Random

Jitter (RJ)

Periodic

Jitter (PJ)

Asynchronous

Correlated
Uncorrelated to Data

or

PJ

(APJ)

or

T

he ultimate
flexible tool—

the 86100C digital
communications analyzer
with advanced jitter
analysis (DCA-J). Four
instruments in one – a
digital communications
analyzer with automated
eye measurements; a full-

function time domain reflectometer
(TDR) for impedance analysis; a full
function oscilloscope with band­width in excess of 80 GHz; an innova­tive and accurate jitter analyzer for
electrical and optical signals.

With the ability to accept plug-in
modules that you already own from
the 83480A/54750A and 86100A/B,
the DCA-J also protects your
investment.

Advantages

• Interference and jitter

measurements at any rate, even
beyond 40 Gb/s

• No need for an external

pattern trigger

• Stable, accurate measurements

• One button ease

• Support for all past and present

DCA plug-ins

Capabilities

• Broadest coverage – receivers

and clock recovery modules cover
widest range of data rates and
wavelengths

• S-parameters – one button push

shows you reflection and
transmission parameters –
Option 202 and TDR

• Pattern lock – internally generates

pattern trigger from an ordinary
clock

• Eyeline mode – isolates specific bit

sequences, creates an averaged
eye diagram

• Interference and jitter mode –

one-button RJ/DJ, RN/DI
separation; accurate, stable,
in-depth interference and jitter
analysis

• Jitter analysis with the 86107A

precision timebase –
achieve the most accurate jitter
measurements with the lowest
jitter intrinsics of any enterprise
jitter solution to measure ultra
high performance components

• Open operating system – Windows®

XP Pro allows external applications
to be installed

Essential tools for the high speed digital designer…

• Wide bandwidth oscilloscope

• Communications analyzer

…all in one instrument!

• Signal integrity analyzer

• Interference and jitter analyzer

4

“

”

Easy jitter analysis that scales to any bit rate I
might need in the future – at an amazingly cost­effective price. That this comes with 3 other other
instruments in the same package is amazing!

DCA-J: Expect More

Smashing through the barriers
to gigabit jitter analysis

Derived
pattern
trigger

Pattern lock

Eyeline

Jitter analysis

Clock

Data

Hardware Enabler

• Analysis of single-ended and

mixed-mode S-parameters
through embedded software

• Verify the transmission quality

of components and channels
with a precision time domain
reflectometer

• Single ended or differential

TDR for accurate impedance
measurements

• Advanced calibration techniques remove cabling/

fixturing/probe effects; measure just the test device

• Widely trusted for optical and electrical eye diagram analysis

• Easy transmitter compliance testing to international standards

• Optical bitrate coverage from 155 Mb/s to > 40 Gb/s

• Optical module bandwidth to > 65 GHz

• Fast test throughput for manufacturing

• NRZ/RZ built-in measurement ease

• Completely compatible with the 86100B

• Windows® XP Pro open environment

and easy networking

• Eyeline mode allows averaging of eye

diagrams, isolation of mask violation
bit sequences

• One button does it all

• Easy set up means you get right

answers faster

• Separation of interference and

jitter into subcomponents for fast
debugging

• Highly repeatable measurements

• High sensitivity – ideal for testing devices with low intrinsic

interference and jitter

• Negligible jitter contribution from the instrument –

you’re measuring your device, not your test equipment

Jitter analyzer

Pages 6-7

• Electrical bandwidths

from 12 to over 80 GHz
ensure the most accurate
waveforms

• Pulse trains viewed with-

out the need for a separate
pattern or frame trigger

• Analog scope look and feel

• Trigger bandwidth to

> 13 GHz (option 001) or 43 GHz
(with 86107A precision time base)

5

Wide bandwidth

oscilloscope

Page 10

Signal
integrity
analyzer

Page 11

Digital

communications

analyzer

Pages 12-13

4 essential

tools in 1

6

“

”

As bit rates increase, jitter budgeting and
characterization of jitter performance present an
ever increasing challenge. In order to manage jitter
effectively, we need tools that can decompose the jitter
into the numerical and statistical forms that allow us to predict
our performance effectively and provide the insight necessary to
solve problems quickly. The new capability of the DCA-J provides
irreplaceable visibility for the challenges of jitter characterization
of our world class products. This new instrument is a major
contribution to our ability to manage jitter.

—Anthony Sanders
Principal Engineer, Infineon Technologies

T

he DCA-J takes interference and
jitter analysis to a new level of

simplicity and accuracy. Add to
that the scalability to any data rate that
is likely in the future, and you have the
ultimate in investment protection.

As device performance and system
requirements push jitter performance
to ever higher levels, it is sometimes
hard to distinguish between the
behavior of your device and the inter­ference and jitter of your test equipment.
That will never be a problem with the
DCA-J. The instrument interference and
jitter in the standard main-frame is
already very low. Combine that with
the 86107A precision timebase, and
intrinsic interference and jitter falls
away to less than 250 fs. DCA-J –
see what’s really going on.

Key enablers

• Interference and jitter measure

ments at any rate, even beyond
40 Gb/s

• Interference and jitter separation

into subcomponents

• No need for a pattern trigger

• Stable, accurate measurements

• One button ease

• Wide bandwidth means lowest

intrinsic ISI/DDJ

• Lowest jitter floor means highest

sensitivity RJ measurements

• Support for all DCA plug-ins,

optical and electrical

• Limit tests provide quick pass-fail

interference and jitter results

Displays that save you time

Sometimes you want to get in-depth
analysis of a difficult device
performance issue. Sometimes you
want data views that are compatible
with other instruments so you can
correlate multiple answers. And
then, there are times when you
just want to know whether your
device meets a standard.

The DCA-J handles all of these
situations by providing revealing
histograms and intuitive graphical
views, and by providing an easy and
simple table of jitter sub-components.
Its aim is to save you time.

Think Interference And Jitter Measurements
Are Hard To Make? Think Again.

1

2

3

Easy setup, easy triggering

Many interference and jitter measurements
turn out to be inaccurate because of
some small but important error in a
complicated measurement setup.
With the DCA-J, a simple physical setup,
combined with a user interface that
never lets you get lost, makes getting
simple, accurate interference and jitter
measurements easy.

Interference and jitter mode – one button
gateway to understanding jitter

Interference and jitter can be a complex subject,
and sometimes it can seem that your test
equipment is making it even more complicated.
Ultimately, you just want to get a design
completed and working. Finally, there is
a test solution that makes things simpler.

Eye diagrams have proved useful because they
are so intuitive. Building on this intuitiveness,
the DCA-J shows you the behavior of your
device in the jitter domain but always tracks
back to the eye diagram. Measurements not
making sense? Maybe something changed in
your setup. It’s easy to switch back to the eye
and quickly see whether everything is how
you left it. Results are in familiar formats –
but that have never been available for 6, 10,
or 40 Gb/s applications. Simplicity in setup
and operation means you can be confident
that you are making accurate, valuable
measurements from the very beginning.

Eyeline mode—see your problem sequences

It’s easy to move between eye diagrams that
overlay all possible bit sequences to single
valued waveforms that show individual bit
sequences. Sometimes it would be useful to
make the noise disappear and just see the
inter-symbol effects (ISI). Averaging in eyeline
mode enables you to do exactly that. Now you
can see exactly which sequences are causing
mask violations. No need for a pattern trigger
either—connect your signal and in most cases
the instrument detects pattern length and
bit rate without being told—you have an
immediate display to work from.

7

The Fastest Way
To The Right Answer

Compatible

Modules for the 83480A/54750A

are compatible with the

86100 family.

NRZ/RZ

Complete set of

NRZ/RZ measurements

Touchscreen

A high performance touchscreen

allows easy navigation of the

instrument interface. Or, use

dedicated knobs or a mouse—

the choice is yours.

Easy user interface

A well-designed Windows®-based

graphical user interface makes it

easy to access advanced features.

Icons provide access to an

extensive set of common tests

and measurements.

Dedicated interference

and jitter analysis mode

Whether you are making electrical

or optical measurements, quickly

change between observing the

eye to making quick, accurate,

and intuitive interference and

jitter measurements with the

touch of a button.

8

The Big Picture—4 Instruments In 1

Autoscale

Improved autoscale for a quick
display of waveforms including
eye-diagrams

Quick measure

Use quick measure to do a
compliance test with a single
button press. Quick measure
can also be configured to
automatically perform your
favorite four measurements.

Flexible storage

Internal hard drive, front panel
USB port, and supplied USB pen drive
make storage and transfer of setups, image
files, database files, and waveforms easy.

Dedicated controls for
common adjustments

Analog oscilloscope type front
panel provides simple controls
for basic functions.

4 instruments in 1

A digital communications
analyzer, a full featured wide­bandwidth oscilloscope, a time
domain reflectometer and now a
fast and accurate jitter analyzer.
Just select the desired operating
mode to set up the instrument
you want.

Very low intrinsic jitter

The intrinsic jitter noise floor of
the instrument is extremely low,
making it easy to measure high
performance designs where
instrument jitter might otherwise
hide the real device performance.
For the ultimate in performance,
the 86107A can be used to reduce
the intrinsic jitter to an industry
leading level.

Modular

Configure the 86100C for
the exact capability you need
with a large family of plug-in
modules to choose from.

9

Pattern Lock control

“

”

In the modern ultra high speed SERDES business,
understanding jitter at the zero crossing points of a wave­form is not enough. Accurate capture of very long data
packets becomes a requirement to permit post-processing
both for design analysis and standards compliance testing. It is also
our desire to have a single signal analysis platform to handle bit rates
from 1 Gb/s to 12.5 Gb/s and beyond.

The 86100C meets our requirements well. In addition to its new jitter
analysis package, the combination of its flexible triggering system and
precision timebase enables the capture of averaged very long data
packet waveforms with unprecedented accuracy. The speed of the
instrument has also been impressive with DDJ measurements that used
to take hours being reduced to less than a minute.

—Steve Hubbins
Silicon Evaluations Specialist, Texas Instruments

10

Fast Time To Insight

W

ith higher bit rates
being used in ever lower

target cost systems,
advanced techniques are being used
to get a low system BER. Circuit
boards constructed from FR-4 can be
cheap, but they distort pulse trains
passing across them. Designers are
increasingly employing pre-emphasis
and equalization to counteract inter­symbol interference (ISI) and open
up the eye. However, it can be hard
to measure the effectiveness of such
systems. Designers use modeling to
predict component performance,
but they ultimately need to verify with
real-world measurements.

An end to bit rates
outpacing your test equipment

• Even closed eyes can be captured

and opened as pulse train data
and the effectiveness of common
equalization techniques are seen
from on-board algorithms.

• With many standards scaling up in

bandwidth at an increasing rate, the
DCA-J has you covered for now and
for the foreseeable future. All at a
new price/performance benchmark.

The DCA-J can swiftly provide insight

• Pattern Lock enables single-valued

waveform viewing at even the fastest
bit rates when no separate pattern
trigger is available.

• Triggering is also enhanced with

the industry’s most capable optical

and electrical clock recovery

instrument solution, the 83496B.

• With electrical channels that have

bandwidths ranging from 12 GHz to
in excess of 80 GHz, you can be sure
of the most precise pulse fidelity.

• Probing – if connectorized test points

are not available, use the award­winning Infiniimax probes to their
maximum bandwidth advantage (in
excess of 12 GHz) by pairing them
with the N1022A probe adapter and
the DCA-J’s wide bandwidth inputs.

86100C

partnered

with N4906A

Serial BERT

11

Superior Signal Integrity Insight

C

onfigure the DCA as a time
domain reflectometer (TDR)

to quantify the transmission
and reflection properties of
components and channels.

• View S-parameter performance

at the touch of one button for
single-ended or mixed-mode circuits

• Unique calibration capabilities

remove systematic measurement
errors from cabling, connectors,
and probes so you see only the
properties of the test device

• Similar to calibrations of network

analyzers...just place a short circuit
and load at the reference plane of
the test device

• Increase the two-event resolution

impedance precision of the TDR
through pulse enhancement

• See sub-millimeter two-event

resolution and accurately measure
impedance for ultra-fast edge
speeds with accessories from
Picosecond Pulse Labs
(www.Picosecond.com)

• Highest fidelity and most

symmetrical dual-TDR outputs
yield precision differential and
common mode results in a single
setup

• Gain insight and improved

modeling through frequency
domain S-parameters and export
in Touchstone format

• Use the N1930A physical layer

test system software to
automatically configure and
calibrate the 86100 TDR system,
providing a complete set of
single-ended and mixed-mode
frequency domain S-parameters

The DCA-J, TDR module and
S-parameter software covers
the challenge of characterizing
complex circuitry such as
backplanes.

Intuitive setup guides lead to
accurate results in the time
and frequency domain.

12

With a press of a button, filters

can be switched in or out for

compliance testing or wide

bandwidth analysis.

Mask test diagnostics—

86100C infiniium DCA-J

goes beyond basic testing

with margin analysis

for process monitoring.

Mask hits/failures are easily

viewed with red pixels.

SONET/SDH compliance

T

ransmitters used in SONET/SDH
applications must perform

according to a rigorous set
of industry-defined standards. A
significant portion of what defines
acceptable performance is based
on waveform quality tested with a
high-speed sampling oscilloscope.
The 86100C is ideally suited to verify
transmitter compliance quickly and
accurately. Tests are performed
automatically according to industry­recognized procedures. The 86105B
and 86105C are industry leaders in
waveform fidelity, mask margin,
and extinction ratio accuracy up to
11 Gb/s applications.

Easy. Quick. Accurate.

The 86100C makes compliance
testing straightforward—only two
keystrokes are needed to perform a
complete compliance test. Scaling the
waveform, acquiring the data, and
completing the compliance test require
only a few seconds. Many plug-in
modules contain multiple filters so
many different rates can be tested
with the required standards-based
reference receiver methodology. Filters
are easily switched out to allow testing
with the full instrument bandwidth.

Enterprise & storage

Transmitter testing for 10 Gigabit
Ethernet and 10X Fiber Channel uses
similar methodologies to those used
in SONET/SDH, but there are some
important variations. An aspect that
makes testing easier is that despite
the differing bit rates (10.3125 Gb/s
and 10.51875 Gb/s respectively) the
compliance filter has been specified
to be the same frequency as for

9.95 Gb/s SONET/SDH.

Clock recovery is a more significant
difference. Transmitter test requires
the use of a clock trigger that is
derived from the transmitted signal
itself. A critical feature of the clock
recovery process is the loop
bandwidth. This is intended to
“track out” the jitter components
that are less than the specified
bandwidth, so that only elements
beyond this are displayed on the
eye diagram. The 83496B clock
recovery module is compliant to
this requirement as well as offering
continuous rate coverage from
50 Mb/s to 13.5 Gb/s to cover
nearly all applications. In addition,
the 83496B can track spread­spectrum clocking (SSC), and
provide the data to measure phase
noise.

In Just A Few Minutes, Become
An Expert In Compliance Testing

13

The same 40 GB/s RZ signal captured

using current DCA (right) and now

with the 86107A patented precision

timebase module (left).

T

here are many demanding

aspects to 40 Gb/s testing.

RZ modulation is now a
common format in 40 Gb/s systems,
and has a unique set of measurement
parameters defined to describe it.
Components designed for 40 Gb/s
systems also must have very low
intrinsic jitter to successfully operate,
with levels sometimes so low that it
is difficult to tell whether measured
jitter is the result of component jitter
or the inherent jitter noise floor of
the measuring instrument.

To counter both of these new
challenges, Agilent has industry
leading answers to enable your
success. A broad choice of modules
is led by the 86118A module with
70+ GHz dual electrical remote heads,

or choose the
86116C 65 GHz
optical/ 80 GHz
electrical module

1

.
In both cases,
once the signal
is acquired, it
is a breeze to
activate the
automated RZ

measurements to instantly see
contrast ratio, eye opening factor,
and many other critical parameters.

The 86116C also has 4th order
Bessel-Thomson filters that make it
a reference receiver for 39-43 Gb/s
signals.

To lower the intrinsic jitter of the
instrument for the most demanding
applications, the 86107A has enabled
many, many customers to see their true
device performance. This module has
revolutionized high performance

10 Gb/s and 40 Gb/s measurements.
The 86107A

2

reduces the inherent
timebase interference and jitter to
about 200 fs – almost a factor of
5 reduction in system jitter.

The 86107A requires an electrical
reference clock that is synchronous
with the signal under test and allows
timebase resolution to be improved
from 2 ps/division to 500 fs/division.
For 40 Gb/s applications, the 86107A
is considered a must.

40 Gb/s RZ?
No Problem!

“

”

The most significant improvement is that
we can now show a repeatable, low jitter
result to customers without going into lengthy
discussions about test methods. As a result,
we are able to go to customers with results taken
directly from the equipment – results better than anything
they’ve seen before.

We expect additional future business directly as a result
of returning to the 86100 platform, recognizing this as
the premier solution in our measurement laboratory.

—Matt Isaacs
Verification Engineer, Broadcom Corporation

1 Requires an 86100C mainframe
2 Compatible with any 86100 A/ B/C mainframe

86100C Infiniium DCA-J Mainframe

Electrical

1 to 12 Gb/s

86112A

Dual channels

> 20 GHz each

83496B

Electrical clock recovery

(#100, 200, 300)

Electrical

20, 40 Gb/s

86118A

Dual remote heads

70 GHz each

86107A

Precision timebase

(#040)

Optical

1 to 12 Gb/s

86105C

9 GHz optical channel

20 GHz electrical channel

83496B

Optical clock recovery

(#101, 200, 300)

Optical

20, 40 Gb/s

86116C

65 GHz optical channel

80 GHz electrical channel

86107A

Precision timebase

(#040)

TDR

54754A

Differential TDR/

Dual 18 GHz channels

14

More details can be found in the Infiniium
DCA Technical Specifications, 5989-0278EN

See also the 86100C library at
www.agilent.com for application notes
and additional product information

Mainframe

86100C Digital communications

analyzer, 3.2 GHz trigger
bandwidth.

Option 001 Enhanced trigger to 13 GHz+.

pattern lock, eyeline mode.

Option 200 Jitter analysis software

package (requires Option 001).
TJ, RJ, DJ, DDJ, PJ, DCD
histograms and numerical
results. DDJ vs. Bit display.
SRJ analysis.

Option 201 Advanced waveform

analysis software package
(requires Option 001 & 101).
Bathtub, export of large
single valued waveform
segments, equalization of
closed eyes.

Option 202 Enhanced impedance and

S-parameter software.

Option 300 Advanced amplitude

analysis (requires Options
200 & 001

Dual Electrical Modules

54754A Differential TDR module

with dual 18 GHz TDR/
electrical channels

86112A Dual 20 GHz electrical channels
86117A Dual 50 GHz electrical channels
86118A Dual 70 GHz electrical remote

sampling channels

Optical / Electrical Modules

86105B 15 GHz optical channel

(single-mode, unamplified)/
20 GHz electrical channel

86105C 9 GHz optical channel

(multimode, amplified)/
20 GHz electrical channel

86106B 28 GHz optical channel

(single-mode, unamplified)/
40 GHz electrical channel

86116A 53 GHz optical channel/

63 GHz electrical channel

86116B 65 GHz optical channel/

80 GHz electrical channel

86116C

2

65 GHz optical channel
(single-mode, unamplified)
80 GHz electrical channel

Clock recovery and timebase modules

1

83496B-100250 Mb/s to 7.1 Gb/s

Electrical Clock Recovery

83496B-101

2

Single-Mode (1250 to
1620 nm) and Multimode
(780 to 1330 nm)
Optical Clock Recovery

86107A Precision Timebase Reference

Upgrade services

86100CS-001 Enhanced trigger hardware

upgrade

86100CU-200 Enhanced jitter analysis

SW upgrade

86100CU-201 Advanced waveform

analysis SW upgrade

86100CU-202 Enhanced impedance and

S-parameter software
upgrade

86100CU-300 Advanced amplitude

analysis SW upgrade

83496UAB Upgrades the 83496A to the

“B” performance

86100A/B Contact Agilent Technologies
to 86100C for current trade-in deals
upgrade

Time domain reflectometer

54754A Dual channel differential

TDR module.

1 See technical specifications for detailed

comfiguration options.

2 Module not compatible with the 86100A and 86100B

DCA mainframe. If you want to upgrade older
DCAs, contact Agilent Technologies and ask for
current trade-in deals.

Configurations Matching Your Applications

Other modules and options available. See the Technical Specifications, Literature Number 5989-0278EN or www.agilent.com for configuration details.

15

Interfaces and Accessories

Probes, adapters and other interface kits

Other application-specific probe and interfaces kits are available from
Agilent Technologies or its channel partners. See

www.agilent.com or

contact your local sales office for details.

N1022A probe adapter for Agilent 1130 or
1150 probe series – literature number 5988-8541EN

N1024A TDR calibration kit
– literature number 5989-4149EN

N1020A TDR probe – literature number 5968-4811E

N1020A-K09, 10, 11 TDR cables for FireWire,
Gigabit Ethernet, HSSDC, and Fiber Channel –

literature number 5980-2933EN

Advanced TCA Tx/Rx SignalBlade™
(F9 Systems – www.f9-systems.com)

N1080A HDMI fixtures – literature number 5989-5118EN

V-connector pin-collette

Hermetic feedthrough Coaxial

feedthrough launch

Coaxial

microstrip launch

9ps Step

35ps Step

Picosecond Pulse Labs 4020
Source Enhancements Module
with 86118A Remote Head for
ultra-fast TDR measurements.

N1020A-K05 calibration substrate –

literature number 5968-7376E

Windows and MS Windows are U.S. registered
trademarks of Microsoft Corporation.

Remove all doubt

Our repair and calibration services will get
your equipment back to you, performing
like new, when promised. You will get
full value out of your Agilent equipment
throughout its lifetime. Your equipment will
be serviced by Agilent-trained technicians
using the latest factory calibration proce­dures, automated repair diagnostics and
genuine parts. You will always have the
utmost confidence in your measurements.

Agilent offers a wide range of additional
expert test and measurement services for
your equipment, including initial start-up
assistance onsite education and training,
as well as design, system integration, and
project management.

For more information on repair and
calibration services, go to

www.agilent.com/find/removealldoubt

www.agilent.com

For more information on Agilent
Technologies’ products, applications
or services, please contact your local
Agilent office. The complete list is
available at:

www.agilent.com/find/contactus

Online assistance:

www.agilent.com/comms/dca

Phone or Fax

United States:

(tel) 800 829 4444
(fax) 800 829 4433

Canada:

(tel) 877 894 4414
(fax) 800 746 4866

China:

(tel) 800 810 0189
(fax) 800 820 2816

Europe:

(tel) 31 20 547 2111

Japan:

(tel) (81) 426 56 7832
(fax) (81) 426 56 7840

Korea:

(tel) [phone]
(fax) [phone]

Latin America:

(tel) [phone]

Taiwan:
(tel) 0800 047 866
(fax) 0800 286 331

Other Asia Pacific Countries:

(tel) (65) 6375 8100
(fax) (65) 6755 0042
Email: [e-mail]

Revised: 11/08/06

Product specifications and descriptions
in this document subject to change with­out notice.

© Agilent Technologies, Inc. 2003 - 2007
Printed in USA, January 12, 2007
5988-5235EN

www.agilent.com/find/emailupdates

Get the latest information on the products
and applications you select.

www.agilent.com/find/agilentdirect

Quickly choose and use your test
equipment solutions with confidence.

www.agilent.com/find/open

Agilent Open simplifies the process of
connecting and programming test systems
to help engineers design, validate and
manufacture electronic products. Agilent
offers open connectivity for a broad range
of system-ready instruments, open industry
software, PC-standard I/O and global sup­port, which are combined to more easily
integrate test system development.

Complementary
Products

86100C Infiniium DCA-J (top) with a N4903A J-BERT
allows you complete insights into your physical layer
performance

The N1930A physical layer test system (PLTS)
software provides confidence in your design through
complete characterization and behavior model
extraction of your device under test (DUT).
It supports both TDR and VNA platforms from
Agilent Technologies.

Agilent’s PXI-based Digital Communication Analyzer,
Bit Error Ratio Tester, Pattern Generator and
Synthesizer provide fast and cost-effective test solu­tions for broadband optical transceiver manufacturing.

Agilent Email Updates

Agilent Direct

Agilent

Open