Agilent 8568B Performance Tests and Adjustments Manual

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Performance Tests and Adjustments Manual

8568B Spectrum Analyzer

HEWLETT PACKARD

HP Part No. 08568-90118 Printed in USA

September 1993

1212 Valley House Drive, Rohnert Park, CA 94928-4999, USA

Certification

Hewlett-Packard Company certifies that this product met its published specifications at the time of shipment from the factory. Hewlett-Packard further certifies that its calibration measurements

are traceable to the United States National Institute of Standards and

Technology, to the extent allowed by the Institute’s calibration facility,

and to the calibration facilities of other International Standards

Organization members.

Warranty

This Hewlett-Packard instrument product is warranted against defects in material and workmanship for a period of one year from date of shipment. During the warranty period, Hewlett-Packard Company will, at its option, either repair or replace products which prove to be defective.

For warranty service or repair, this product must be returned to a service facility designated by Hewlett-Packard. Buyer shall prepay shipping charges to Hewlett-Packard and Hewlett-Packard shall pay shipping charges to return the product to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes for products returned to Hewlett-Packard from another country.

Hewlett-Packard warrants that its software and firmware designated by Hewlett-Packard for use with an instrument will execute its programming instructions when properly installed on that instrument. Hewlett-Packard does not warrant that the operation of the instrument, or software, or firmware will be uninterrupted or error-free.

LIMITATION OF WARRANTY

The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by Buyer, Buyer-supplied software or interfacing, unauthorized modification or misuse, operation outside of the environmental specifications for the product, or improper site preparation or maintenance.

NO OTHER WARRANTY IS EXPRESSED OR IMPLIED. HEWLETT-PACKARD SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.

EXCLUSIVE REMEDIES

THE REMEDIES PROVIDED HEREIN ARE BUYER’S SOLE AND EXCLUSIVE REMEDIES. HEWLETT-PACKARD SHALL NOT BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL, INCIDENTAL, OR CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT, TORT, OR ANY OTHER LEGAL THEORY.

. . .

III

Assistance

Product maintenance agreements and other customer assistance agreements are available for Hewlett-Rwkard products.

Fbr

any assistance, contact your nearest

Service

OJke.

Hewlett-Packard

Sales and

Safety Symbols

The following safety symbols are used throughout this manual. Familiarize yourself with each of the symbols and its meaning before operating this instrument.

Caution

Warning

General Safety Considerations

Warning

The caution sign denotes a hazard. It calls attention to a procedure which, if not correctly performed or adhered to, could result in damage to or destruction of the instrument. Do not proceed beyond a caution sign until the indicated conditions are fully understood and met.

The warning

procedure which, if not correctly performed or adhered to, could result in injury or loss of life. Do not proceed beyond a sign until the indicated conditions are fully understood and met.

Before this instrument is switched on,

properly grounded through the protective conductor of the ac power cable to a socket outlet provided with protective earth

contact. Any interruption of the protective (grounding) conductor, inside

or outside the instrument, or disconnection of the protective

earth terminal can result in personal injury.

sign denotes a hazard. It calls attention to a

warning

make sure it has been

Warning

Caution

There are many points in the instrument which can, if contacted,

cause personal injury. Be extremely careful.

Any adjustments or service procedures that require operation of the instrument with protective covers removed should be performed only by trained service personnel.

Before this instrument is switched on, make sure its primary power circuitry has been adapted to the voltage of the ac power source.

Failure to set the ac power input to the correct voltage could cause damage to the instrument when the ac power cable is plugged in.

8568B

Spectrum Analyzer Documentation Outline

Included with the HP Model manuals: the Installation and Verification Manual, the Operating and Programming Manual, and the Performance Tests and Adjustments Manual.

8568B

Spectrum Analyzer are three

8568B

and Programming

Performance

Adjustments Manual

85680B

Troubleshooting and

85662A

Troubleshooting and

Installation

and Verification

Manual

8568B

Operating

Manual

8568B

Tests

RF Section

Repair Manual

IF-Display

Section

Repair Manual

General information, installation, specifications, characteristics, and operation verification.

Manual and remote operation, including complete syntax and command description. Accompanying this manual is the separate, pocket-sized Quick Reference Guide.

Electrical performance tests and adjustment procedures.

and

RF Section service information.

IF-Display Section service information.

Contents

1. General Information

Introduction

Instruments Covered by this Manual Operation Verification Option 462 Instruments Option 857 Instruments

2. Performance Tests

Introduction

Verification of Specifications Calibration Cycle Equipment Required Test Record

1. Center Frequency Readout Accuracy Test ....

2. Frequency Span Accuracy Test

3. Sweep Time Accuracy Test

4. Resolution Bandwidth Accuracy Test

5. Resolution Bandwidth Selectivity Test

6. Resolution Bandwidth Switching Uncertainty Test

7. Input Attenuator Switching Uncertainty Test . .

8. Frequency Response Test

9. RF Gain Uncertainty Test

10. IF Gain Uncertainty Test

11. Log Scale Switching Uncertainty Test .....

12. Amplitude Fidelity Test

13. Average Noise Level Test

14. Residual Responses Test

15. Spurious Responses Test

16. Residual FM Test

17. Line-Related Sidebands Tests

18. Calibrator Amplitude Accuracy Test

19. Fast Sweep Time Accuracy Test

20.

21. Frequency Reference Error Test

‘Ihble

2-19. Performance Test Record

Test 1. Center Frequency Readout Accuracy Test ... Test 2. Frequency Span Accuracy Test Test 3. Sweep Time Accuracy Test 4. Resolution Bandwidth Accuracy Test 5. Resolution Bandwidth Selectivity Test 6. Resolution Bandwidth Switching Uncertainty

Test Test 7. Input Attenuator Switching Uncertainty Test Test 8. Frequency Response Test Test 9. RF Gain Uncertainty Test Test 10. IF Gain Uncertainty Test

.....................

.........

................

...............

.....................

.............

..................

................

....................

.........

(220

ms)

............

...........

............

...........

............

...............

.........

(~20

1st

LO Output Amplitude Test

......................

.........

........

..........

........

............

.......

..........

......

ms) ....

l-l l-l

l-2

1-2

l-2

2-l 2-l 2-l

2-2 2-2 2-3 2-6

2-9 2-13 2-15 2-18 2-20

2-22 2-31 2-33 2-39 2-41

2-45

2-47

2-49 2-56 2-60

2-62 2-63 2-66

2-67

2-69

2-70

2-71 2-72 2-73 2-74

2-75 2-76

2-77

2-78

2-79

Contents-l

Test 11. Log Scale Switching Uncertainty Test Test 12. Amplitude Fidelity Test Test 13. Average Noise Level Test Test 14. Residual Responses Test Test 15. Spurious Responses Test Test 16. Residual FM Test Test 17. Line-Related Sidebands Test

...........

..........

...........

..........

..............

.........

Test 18. Calibrator Amplitude Accuracy Test Test 19. Fast Sweep Time Accuracy Test Test 20.

1st

LO Output Amplitude Test

Test 21. Frequency Reference Error Test

Adjustments

(~20

ms)

........

.......

Introduction .....................

Safety Considerations .................

Equipment Required .................

Adjustment Tools ...................

Factory-Selected Components

.............

Related Adjustments .................

Location of Test Points and Adjustments

........

1. Low-Voltage Power Supply Adjustments ......

2. High-Voltage Adjustment (SN

3. Preliminary Display Adjustments (SN

3001A

and Below) . .

3004A

and Above) . .

3001A

Below) .....................

3. Preliminary Display Adjustments (SN

3004A

Above) .....................

4. Final Display Adjustments (SN

3001A 3004A

and Below) and Above)

5. Log Amplifier Adjustments ............

6. Video Processor Adjustments ...........

7. 3 MHz Bandwidth Filter Adjustments .......

8. 21.4 MHz Bandwidth Filter Adjustments .....

9. 3 dB Bandwidth Adjustments ..........

10. Step Gain and 18.4 MHz Local Oscillator

Adjustments ..................

11. Down/Up Converter Adjustments ........

12. Time Base Adjustment (SN 32

17AO5568

and Above)

12. Time Base Adjustment (SN

2840A

and Below, also

.............

2848A

3217A05567)

13. 20 MHz Reference Adjustments .........

14. 249 MHz Phase Lock Oscillator Adjustments

15. 275 MHz Phase Lock Oscillator Adjustment ....

16. Second IF Amplifier and Third Converter

Adjustment ...................

17. Pilot Second IF Amplifier Adjustments ......

18. Frequency Control Adjustments .........

19. Second Converter Adjustments .........

20. 50 MHz Voltage-Tuned Oscillator Adjustments

2 1. Slope Compensation Adjustments ........

22. Comb Generator Adjustments ..........

23. Analog-To-Digital Converter Adjustments .....

24. Track and Hold Adjustments ...........

25. Digital Storage Display Adjustments .......

Low-Noise DC Supply

................

....

.....

. .

and

. .

...

. .

2-82 2-83 2-84 2-85

2-86 2-87 2-88 2-89 2-90 2-91 2-92

3-l

3-2 3-2 3-2 3-3 3-4

3-4 3-25 3-29 3-39

3-45

3-52 3-59 3-61 3-65 3-69 3-72 3-77 3-84

3-87 3-92

3-95 3-99

3-103 3-107 3-110

3-112 3-116 3-119 3-123 3-130 3-133 3-136 3-139 3-142 3-145 3-150

Contents-2

Crystal Filter Bypass Network Configuration . . . . . 3-151

4. Option 462

Introduction . . . . . . . . . . . . . . . . . . . . .

4. 6 dB Resolution Bandwidth Accuracy Test . . . . .

4. Impulse and Resolution Bandwidth Accuracy Test

5. 6 dB Resolution Bandwidth Selectivity Test . . . .

5. Impulse and Resolution Bandwidth Selectivity Test .

6. Impulse and Resolution Bandwidth Switching

Uncertainty Test . . . . . . . . . . . . . . . .

Test 4. 6 dB Resolution Bandwidth Accuracy Test (p/o

Table

2-19, Performance Test Record) . . . . . . .

Test 4. Impulse and Resolution Bandwidth Accuracy

Test (p/o

Table

2-19, Performance Test Record) . .

Test 5. 6 dB Resolution Bandwidth Selectivity (p/o

‘Ihble

2-19, Performance Test Record) . . . . . . .

Test 5. Impulse and Resolution Bandwidth Selectivity

(p/o Table 2-19, Performance Test Record) . . . . .

Test 6. Impulse and Resolution Bandwidth Switching

Uncertainty (p/o

‘Iable

2-19, Performace Test

Record) . . . . . . . . . . . . . . . . . . . . .

9. 6 dB Resolution Bandwidth Adjustments . . . . .

9. Impulse Bandwidth Adjustments . . . . . . . . .

4-l

4-2 4-4

4-10 4-13

4-16

4-18

4-19

4-21

4-22

4-23

4-24

4-27

5. Option 857

Introduction . . . . . . . . . . . . . . . . . . . . .

12. Option 857 Amplitude Fidelity Test . . . . . . .

Performance Test Record . . . . . . . . . . . . . . .

Test 12. Option 857 Amplitude Fidelity Test . . . . .

Major Assembly and Component Locations

IF-Display Section Figure Index . . . . . . . . . . . .

RF Section Figure Index . . . . . . . . . . . . . . .

5-l

5-2

5-7

5-8

6-l

6-2

Contents-3

Figures

l-l. Service Accessories, HP Part Number 08568-60001

2-l.

Center Frequency Accuracy Test Setup 2-2. Center Frequency Readout Error Measurement 2-3. Frequency Span Accuracy Test Setup 2-4. Sweep Time Accuracy Test Setup 2-5.

Penlift

Output Signal 2-6. Resolution Bandwidth Measurement 2-7. 60 dB Bandwidth Measurement 2-8. Bandwidth Switching Uncertainty Measurement 2-9. Attenuator Switching Uncertainty Test Setup

2-10. Attenuator Switching Uncertainty Measurement

2-l

1. Frequency Response Test Setup (20 MHz to 1.5 2-12. Frequency Response Measurement (20 MHz to 1.5 2-13. Frequency Response Test Setup (100 kHz to 20 MHz) 2-14. Frequency Response Measurement (100 kHz to 20 MHz) 2-15. Frequency Response Test Setup (100 Hz to 100 2-16. RF Gain Uncertainty Measurement 2-17. IF Gain Uncertainty Test Setup

2-18. IF Gain Uncertainty Measurement 2-19. IF Gain Uncertainty Measurement (2 2-20. Log Scale Switching Uncertainty Measurement 2-21. Amplitude Fidelity Test Setup 2-22. Amplitude Fidelity Measurement 2-23. Average Noise Level Measurement 2-24. Residual Responses Measurement 2-25. Harmonic Distortion Test Setup 2-26. Intermodulation Distortion Test Setup 2-27. Intermodulation Distortion Products 2-28. Bandwidth Filter Slope Measurement 2-29. Slope Detected Residual FM

2-30. Peak-to-Peak Amplitude Measurement 2-31. Line Related Sidebands Measurement 2-32. Calibrator Amplitude Accuracy Test Setup 2-33. Fast Sweep Time Accuracy 2-34. Fast Sweep Time Measurement 2-35.

1st

LO Output Amplitude Test Setup

2-36.

Frequency Reference Test Setup

3-l.

Low-Voltage Power Supply Adjustments Setup

3-2. IF-Display Section Low-Voltage Adjustments (SN

and Below) ...................

3-3. IF-Display Section Low-Voltage Adjustments (SN

and Above) ...................

3-4. Location of RF Section Low-Voltage Adjustments 3-5. High Voltage Adjustment Setup 3-6. Location of High Voltage Adjustments

3-7. Location of Label and Test Point . . . . . . . . . . .

................

...........

............

.............

(~20

ms Test Setup)

(~20

........

..........

.........

.....

.........

...........

..........

.......

dB)

..........

...........

........

.........

........

......

.......

ms)

.........

...........

........

. .

....

... ...

GHz)

kHz)

....

3001A

3004A

...

l-8

2-3

2-4

2-6

2-9 2-11 2-14 2-16 2-19 2-20 2-21 2-22

2-24 2-25

2-26

2-27

2-32 2-33 2-35 2-36 2-40 2-41 2-43 2-46 2-48 2-50 2-52 2-53 2-57

2-58 2-58 2-61

2-62

2-63 2-64 2-66

2-68

3-25

3-26

3-27

3-30

3-31

3-32

Contents-4

3-8. Location of

AlA

Components ...........

3-9. CRT Cut-Off Voltage 3-10. Waveform at AlA3TP5’ : : : : : : : : : : : : : : 3-11. Discharging the CRT Post-Accelerator Cable 3-12. High Voltage Adjustment Setup

...........

3-13. Location of High Voltage Adjustments 3-14. Location of

AlA

Label and Test Point

........

3-15. Discharging the CRT Post-Accelerator Cable 3-16. Preliminary Display Adjustments Setup 3-17. Location of

3-18.

AlA2, AlA4,

3-19. X+ and X- Waveforms 3-20. Composite X Deflection Waveform

AlA2, AlA4, AlA5,

and

AlA

Adjustment Locations

...............

and

A3A2

..........

.....

........

.....

.......

.....

....

3-21. Rise and Fall Times and Overshoot Adjustment

Waveform

3-22.

5OV,-,

Signal ....................

3-23. Preliminary Display Adjustments Setup 3-24. Location of 3-25.

AlA

Adjustment Locations 3-26. X+ and X- Waveforms 3-27. Composite X Deflection Waveform

...................

.......

AlA

and

A3A2

............

.............

...............

..........

3-28. Rise and Fall Times and Overshoot Adjustment

Waveform

3-29.

5OV,-,

Signal ....................

3-30. Location of Final Display Adjustments on

and

AlA5.

3-31. Final Display Adjustments Setup 3-32. Location of Final Display Adjustments on 3-33. Log Amplifier Adjustments Setup 3-34. Location of Log Amplifier Adjustments 3-35. Video Processor Adjustments Setup 3-36. Location of Video Processor Adjustments 3-37. 3 MHz Bandwidth Filter Adjustments Setup

...................

AlA2, AlA4,

...................

...........

AlA

...

..........

........

.........

.......

.....

3-38. Location of Center, Symmetry, and 10 Hz Amplitude

Adjustments 3-39. Location of 3 MHz Peak Adjustments 3-40. 21.4 MHz Bandwidth Filter Adjustments Setup 3-41. Location of 3-42. Location of 3-43. Location of

A4A4

A4AS

Adjustments

3-44. Location of

A4A8

3-45. Location of 3 dB Bandwidth Adjustments

..................

.........

....

21.4 MHz LC Filter Adjustments . .

21.4 MHz Crystal Filter Adjustments

21.4 MHz LC Filter and Attenuation

..................

21.4 MHz Crystal Filter Adjustments

......

3-46. Step Gain and 18.4 MHz Local Oscillator Adjustments

Setup

......................

3-47. Location of IF Gain Adjustment ...........

3-48. Location of 10 dB Gain Step Adjustments

3-49. Location of .l dB Gain Step, 18.4 MHz LO, and +

Adjustments

..................

......

1OV

3-50. Down/Up Converter Adjustments Setup .......

3-51. Location of Down/Up Converter Adjustments

.....

3-52. Time Base Adjustment Setup ............

3-53. Location of

A27Al

Adjustment ...........

3-54. Time Base Adjustment Setup ............

3-55. Location of

A27A2

Adjustment ...........

3-34 3-35 3-36 3-38 3-40 3-41 3-42

3-44 3-46 3-47 3-47 3-48 3-49

3-49 3-51 3-53 3-54 3-54 3-55 3-56

3-56 3-58

3-60 3-61 3-62 3-65 3-66 3-69 3-70 3-72

3-73 3-75 3-77 3-78 3-79

3-80 3-81 3-85

3-87 3-88 3-89

3-91

3-92 3-93 3-95 3-98 3-99

3-102

Contents-5

3-56. 20 MHz Reference Adjustments Setup ........

3-57. Location of 20 MHz Reference Adjustments .....

3-58. Typical Signal at

A16TP3

..............

3-59. 249 MHz Phase Lock Oscillator Adjustments Setup . . 3-60. Location of 249 MHz Phase Lock Oscillator Adjustments 3-61. 275 MHz Phase Lock Oscillator Adjustment Setup ...

3-62. Location of 275 MHz PLO Adjustment ........

3-63. Second IF Amplifier Adjustments Setup .......

3-64. Location of 301.4 MHz BPF and 280 MHz AMPTD

Adjustments ..................

3-65. 301.4 MHz Bandpass Filter Adjustment Waveform . .

3-66. Minimum Image Response at 258.4 MHz .......

3-67. Pilot Second IF Amplifier Adjustments Setup .....

3-68. Location of 269 MHz Bandpass Filter Adjustments . . 3-69. 269 MHz

Bandpass

Filter Adjustments Waveforms . .

3-70. Frequency Control Adjustments Setup ........

3-71. Location of Frequency Control Adjustments .....

3-72. Second Converter Adjustments Setup ........

3-73. Location of Second Converter Adjustments ......

3-74. Typical PILOT 3-75. Typical PILOT 3-76. Typical 3-77. Typical

Bandpass Bandpass

3-78. 50 MHz Voltage-Tuned Oscillator Adjustments Setup

2ND

IF Bandpass (SHIFT t)......

2ND

IF Bandpass (SHIFT 1)......

(SHIFT t).............

(SHIFT 1).............

3-79. Location of 50 MHz VT0 Adjustments ........

3-80. Slope Compensation Adjustment Setup ........

3-81. Location of

A22R66

TILT Adjustment ........

3-82. Slope Compensation Adjustment Waveforms .....

3-83. Location of Comb Generator Adjustments ......

3-84. Comb Teeth Display .................

3-85. Analog-To-Digital Converter Adjustments Setup ....

3-86. Location of Analog-To-Digital Converter Adjustments .

3-87. Track and Hold Adjustments Setup .........

3-88. Location of Track and Hold Adjustments .......

3-89. Digital Storage Display Adjustments Setup ......

3-90. Location of Digital Storage Display Adjustments ... 3-91. Sample and Hold Balance Adjustment Waveforms ...

3-92. Waveform Before Adjustment ............

3-93. Low-Noise DC Supply ................

3-94. Crystal Filter Bypass Network Configurations .....

4-l.

Resolution Bandwidth Measurement .........

4-2. Impulse Bandwidth Test Setup ............

4-3. 6 dB Resolution Bandwidth Measurement ......

4-4. 60 dB Bandwidth Measurement ...........

4-5. 60 dB Bandwidth Measurement ...........

4-6. Bandwidth Switching Uncertainty Measurement ...

4-7. Location of Bandwidth Adjustments .........

4-8. Location of Bandwidth Adjustments .........

5.1. Option 857 Amplitude Fidelity Test Setup ......

6-l.

RF Section, Top View ................

6-2. RF Section, Front View ...............

6-3. RF Section, Bottom View ..............

6-4. IF Section, Top View (SN 6-5. IF Section, Top View (SN

3001A

and Below) .....

3004A

and Above) .....

6-6. IF Section, Front View ...............

3-103 3-104 3-106 3-107 3-108 3-110 3-111 3-112

3-114

3-l

14 3-115 3-116 3-118 3-118 3-119 3-120 3-123 3-124 3-127 3-127 3-128 3-128 3-130 3-131 3-133 3-135 3-135 3-136 3-137 3-139 3-140 3-142 3-143 3-145 3-146 3-147 3-147 3-150 3-151

4-3 4-4

4-8 4-11 4-14 4-17 4-25 4-28

5-2

6-4 6-5 6-6 6-7 6-8 6-9

Contents-6

6-7. IF Section, Bottom View . . . . . . . . . . . . . .

6-10

Contents-7

lhbles

2-l.

Performance Test Cross-Reference ..........

2-2. Center Frequency Readout Error Test Record .....

2-3. Wide Span Error ..................

2-4. Span Error .....................

2-5. Sweep Time Accuracy, Sweep Times 2-6. Sweep Time Accuracy, Sweep Times 2-7. Sweep Time Accuracy, Sweep Times

220

ms .....

~20 s

220

......

ms (Alternate

Procedure) ...................

2-8. Bandwidth Accuracy ................

2-9. Resolution Bandwidth Selectivity ..........

2-10. Bandwidth Switching Uncertainty ..........

2-11. Input Attenuator Switching Uncertainty .......

2-12. IF Gain Uncertainty, 10 dB Steps ..........

2-13. IF Gain Uncertainty, 2 dB Steps ...........

2-14. IF Gain Uncertainty, 0.1 dB Steps ..........

2-15. Log Scale Switching Uncertainty ...........

2-16. Log Amplitude Fidelity ...............

17. Linear Amplitude Fidelity ..............

2-18. Fast Sweep Time Accuracy

(~20

ms) .........

3-1. Adjustment Cross Reference .............

3-2. Adjustable Components ...............

3-3. Factory-Selected Components ............

3-4. Standard Value Replacement Capacitors .......

3-5. Standard Value Replacement 0.125 Resistors .....

3-6. Standard Value Replacement 0.5 Resistors ......

3.5. Initial Adjustment Positions .............

3-6. Initial Adjustment Positions .............

3-7. Parts for Low-Noise DC Supply ...........

3-8. Crystal Filter Bypass Network Configuration for

and

A4A8

(21.4 MHz) ..............

3-9. Crystal Filter Bypass Network Configuration for

(3 MHz)

4-l.

6 dB Resolution Bandwidth Accuracy ........

.....................

A4A4

A4A7

4-2. Impulse Bandwidth Accuracy ............

4-3. 6 dB Resolution Bandwidth Accuracy ........

4-4. 6 dB Resolution Bandwidth Selectivity ........

4-5. Impulse and Resolution Bandwidth Selectivity ....

4-6. Bandwidth Switching Uncertainty ..........

5-l.

Log Amplitude Fidelity (10 Hz RBW; Option 857) ... 5-2. Log Amplitude Fidelity (10 kHz RBW; Option 857) . .

5-3. Linear Amplitude Fidelity . . . . . . _ . . . . . . .

2-2 2-5 2-7

2-8 2-11 2-12

2-12 2-14 2-17

2-19 2-21

2-35 2-36 2-38 2-40 2-42 2-44

2-65

3-3

3-5

3-13 3-20 3-21 3-23 3-59 3-62

3-150

3-151

4-3 4-8

4-9 4-12 4-15 4-17

5-4

5-5

5-6

Contents-E

General Information

Introduction

Warning

This HP Performance Tests and Adjustments Procedures. The Performance Tests provided should be performed for the following reasons:

If the test equipment for the Operation Verification Program is not

available.

n If the instrument does not pass all of the Operation Verification

tests.

For complete verification of specifications not covered by the

Operation Verification program.

The adjustment procedures should be performed for the following reasons:

If the results of a performance test are not within the specifications.

After the replacement of a part or component that affects electrical

performance.

The adjustment procedures require access to the interior of the instrument and therefore should only be performed by qualified service personnel. There are voltages at many points in the instrument which can, if contacted, cause personal injury. Be extremely careful. Adjustments should be performed only by trained service personnel.

8568B

Tests and Adjustments Manual contains two sections:

Instruments Covered

by this Manual

Power is still applied to this instrument with the LINE switch in STANDBY. There is no OFF position on the LINE switch. Before removing or installing any assembly or printed circuit board, remove the power cord from the rear of both instruments and wait for the MAINS indicators (red

Capacitors inside the instrument may still be charged even if the instrument has been disconnected from its source of power.

Use a non-metallic tuning tool whenever possible.

This manual contains procedures for testing and adjusting HP Spectrum Analyzers, including those with Option 001 (75 Ohm RF INPUT), Option 400 (400 Hz operation), Option 462, and Option 857 installed. The procedures in this manual can also be used to adjust HP

8568A

Spectrum Analyzers that have been converted into HP Spectrum Analyzers through the installation of an HP Kit (formerly HP 8568A+

OlK

Retrofit Kit).

LEDs)

to go completely out.

8568AB

General Information

8568B

Retrofit

l-1

Operation Verification

A high confidence level in the instrument’s operation can be achieved

by running only the Operation Verification Program, since it tests

most of the instrument’s specifications. It is recommended that the

Operation Verification Program be used for incoming inspection and

after repairs, since it requires much less time and test equipment. A description of the program can be found in the Installation and Verification manual.

Option 462

Instruments

Option 857

Instruments

Option 462 instruments require that the performance tests and adjustment procedures listed below be performed instead of their standard versions included in chapters two and three. Information on Option 462 versions are located in Chapter 4, Option 462.

6 dB Bandwidths:

Test 4, 6 dB Resolution Bandwidth Accuracy Test Test 5, 6 dB Resolution Selectivity Test

Adjustment 9, 6 dB Bandwidth Adjustments

Impulse Bandwidths:

Test 4, Impulse and Resolution Bandwidth Accuracy Test Test 5, Impulse and Resolution Selectivity Test Test 6, Impulse and Resolution Bandwidth Switching Uncertainty Test

Adjustment 9, Impulse Bandwidth Adjustments

Option 857 instruments require that the performance test procedure listed below be performed instead of the standard version included in Chapter 2. Information on Option 857 is located in Chapter 5, Option

857.

Test 12, Option 857 Amplitude Fidelity Test

l-2

General Information

‘Ihble

l-l. Recommended Test Equipment (1 of 5)

Instrument SIGNAL

SOURCES

Synthesized Sweeper

Signal Generator

Frequency Synthesizer

Critical Specifications for

Equipment Substitution

Frequency: 10 MHz to 1500 MHz Output Power: + 10 dBm maximum (leveled) Aging Rate: ~1 x 10mg/day Spurious Signals:

135

dBc

125

(~7 GHz)

dBc

(<20 GHz)

Amplitude Modulation: dc to 100 kHz Leveling: Internal, External Power Meter

Frequency: 20 MHz to 450 MHz SSB Phase Noise: >130 dB below carrier at

20 kHz away

Stability:

(HP

~10

ppm/lO min.

8340A

may be substituted)

Frequency: 200 Hz to 80 MHz Stability: f 1 x

lo-‘/day

Amplitude Range: + 13 to -86 dBm with 0.01

resolution

Attenuator Accuracy: <

f0.07 dB

(+ 13 to -47 dBm)

Zecommended

Model

8340A

8640B

3335A

Perf.

Test

4dj.

Pulse Generator

Function Generator

Frequency Standard

Pulse Width: 10 nsec to 250 nsec Rise and Fall Times: ~6 nsec Output Level: + Output: Sine Wave and Triangle Wave,

2.5V 2Vp-p

Range: 100 Hz to 500 kHz (Sweep Function Available)

Output: 1, 2, 5, or 10 MHz Accuracy: Aging Rate: ~1 x

<fl

lo-lo/day

10-l’

8116A

3312A

5061B

General Information 1-3

‘Ihble

l-l. Recommended Test Equipment (2 of 5)

Instrument

ANALYZERS

Spectrum Analyzer

AC Probe

Scalar Network Analyzer Detector

(2 required)

COUNTERS

Frequency Counter

Critical Specifications for

Equipment Substitution

Frequency: 100 Hz to 2.5

2 to 22

GHz

Preselected

RF Spectrum Analyzer Frequency: 9 kHz to 1.8

GHz

High Frequency Probe

10 MHz-l10

GHz

Compatible with HP 8757E

Frequency: 10 MHz to 18 Sensitivity: -30 dBm HP-IB Compatible

5343A

(HP

may be substituted)

GHz

Recommended

Model

8566A/B

8590B

85024A

HP 8757E

11664A

5340A

Perf.

Test

Adj.

Electronic Counter

j = Universal Counter

OSCILLOSCOPE

Oscilloscope

Probe

Range: Resolution: 2 x

>lO

MHz

lo-’

gate time Ext. Time Base: 1, 2, 5, or 10 MHz Frequency: dc to 100 MHz Time Interval A

B: 100 nsec to 200

set

Sensitivity: 50 mV rms Range: 30 mV to 5V p-p

Digitizing OSCOPE, 4 Channel Frequency: 100 MHz Sensitivity:

.005V/Division

10: 1 Divider, compatible with oscilloscope

5345A

5316B

54501A

10432A

l-4

General Information

‘Ihble

l-l. Recommended Test Equipment (4 of 5)

Instrument

ATTENUATORS (Cont’d)

Attenuator

TERMINATIONS

Termination

FIWERS

Low-Pass Filter

Critical Specifications for

Equipment Substitution

?requency: rype

Impedance: 500; BNC

?latness:

Cut-off Frequency:

Xejection: >40 dB at 1750 MHz

ht.-off

Cut-off Frequency: 50 MHz

200 Hz to 18

N Connectors

ho.25 dB

2400

Frequency: 300 MHz

GHz

MHz and ~500 MHz

Recommended

Model

8491B,

Option 020

11593A

Telonic

TLS450-7EE

HP 0955-0455

HP 0955-0306

Perf. Test

1dj.

MISCELLANEOUS DEVICES

Power

Splitter

Directional

Bridge

SPECIAL DEVICES

Display Adjustment PC Board

Low-Noise DC Supply

Crystal Filter Bypass Network (4 required)

Frequency:

backing:

Required for preliminary display adjustments

Zefer to Figure 70

(Optional)

Xefer

1 MHz to 1500 MHz

~0.2 dB

to Figure 71

11667A

8721A

HP85662-60088

l-6

General Information

‘Ihble

l-l. Recommended

Test

Equipment (5 of 5)

Instrument

Critical Specifications for

Recommended Perf. Adj

Equipment Substitution

Model

Test

CABLES

Cable Assembly Frequency Range: 200 Hz to 22

GHz

HP 8120-4921

X APC 3.5 Male Connectors Length: 91 cm (36 inches)

SWR:

cl.4

at 22

Cable BNC, 122 cm (48 in.) (3 required)

Test Cable *

BNC (m) to SMB Snap-On (f)

Test Cable SMA (m) to SMA (m)

GHz

10503A

x x

HP 85680-60093 HP 85680-20094

HP5061-5458 X X

ADAPTERS

Adapter Type N (f) to BNC (m) HP1250-0077 X Adapter Type N (m) to BNC (m) HP1250-0082 X Adapter Tee, SMB Male Connectors HP 1250-0670 Adapter Type N (m) to N (m)

(f)(2

Adapter

Type N (m) to BNC

required) HP1250-0780 X Adapter BNC Tee (m) (f) (f) Adapter Type N (m) to SMA (f) Adapter Type N (f) to BNC Adapter Adapter

APC-3.5

(f) to (f) TO N

(f)(2

APC-3.5

(f)(2

required) HP1250-1474 X

(f) HP1250-1749 X

required) HP 1250-1745

HP1250-0778 X

HP1250-0781 X HP1250-1250 X

X X

BOARD EXTENDERS

Extender *

required)

Extender *

required)

Extender *

PC Board: 36 contacts;

2 rows of 18

PC Board: 30 contacts;

2 rows of 15

PC Board: 20 contacts;

2 rows of 10

Extender * PC Board: 12 contacts;

required) 2 rows of 6

PC Board

PC Board extracting tool Extractor * Part of Service Accessories

HP 08505-60042

HP 08505-60041

HP 85680-60028

HP08505-60109

HP 03950-4001

General Information

l-7

Description

HP Part Number

ExtenderBoard:20contacts;2rowsof Cable: 4-foot long; BNC to SMB snap-on PC Board: Display Adjustment Test ExtenderBoard:

contacts;2rowsof ExtenderBoard:12contacts;2rowsof ExtenderBoard:50contacts;2rowsof ExtenderBoard:36contacts;2rowsof

15 6 25

85680-60028 85680-60093 85662-60088 08505-60041

08505-60109

85680-60034 08505-60042

Figure l-l. Service Accessories, HP Part Number 08568-60001

l-8

General Information

Performance Tksts

Introduction

Verification of

Specifications

The procedures in this section test the instrument’s electrical performance using the Specifications in the Installation and Verification Manual as the performance standards. None of the tests require access to the interior of the instrument. The manual Performance Tests if semi-automatic test equipment (for Operation Verification) is not available or the Performance Test is not in the Operation Verification Program. (Refer to the Installation and Verification Manual for information on Operation Verification.)

When a complete verification of specifications is required, proceed as follows:

1. Run the Operation Verification Program.

2. The Operation Verification Program verifies compliance with specifications of all tests it performs. The tests not performed by the Operation Verification Program must be done manually and are as follows:

n Center Frequency Readout Accuracy n Spurious Responses

Fast Sweep Time Accuracy

1st

LO Output Amplitude Responses

provided

in this section should be performed only

Calibration Cycle

n Frequency Reference Error

If the results of a performance test are marginally within specification, go to the Adjustments section of this manual and perform the related adjustment procedures. When an adjustment is directly related to a performance test, the adjustment procedure is referenced under RELATED ADJUSTMENT in the performance test.

This instrument requires periodic verification of performance. The instrument should have a complete verification of specifications at least every six months.

Performance Tests

2-l

Equipment Required

Equipment required for the manual performance tests and adjustments is listed in at the beginning of this manual. Any equipment that satisfies the critical specifications given in the list may be substituted for the recommended model.

‘Ihble

2-1, Recommended Test Equipment,

Test Record

Note

Function or Characteristic Tested Test Performance Test

Center Frequency Readout Frequency Spans Sweep Time Accuracy

3-dB

Bandwidths Bandwidth Shape Bandwidth Amplitudes

The Operation Verification Program provides a detailed test record

when a printer is used with the controller. If manual performance tests are done, results of the performance tests may be tabulated in the HP

and the acceptable ranges for the measurement values obtained during the tests.

Allow Performance Tests.

able

(220

8568B

Performance Test Record at the end of this section. The

8568B

Performance Test Record lists all of the tested specifications

l/2-hour

2-1. Performance Test Cross-Reference

ms)

warm-up time for the HP

No.

Center Frequency Readout Accuracy Test

Frequency Span Accuracy Test

Sweep Time Accuracy Test

Resolution Bandwidth Accuracy Test

Resolution Bandwidth Selectivity Test

Resolution Bandwidth Switching Uncertainty Test

8568B

before beginning the

Input Attenuator Frequency Response RF Gains IF Gains Log Scales Accuracy Log and Linear Amplifier Fidelity 12 Amplitude Fidelity Test Noise Floor Residual Responses Spurious Responses Residual FM Line-Related Sidebands CAL OUTPUT Level

Fast Sweep Times

1ST

LO OUTPUT Amplitude

Frequency Reference

Accuracay

Input Attenuator Switching Uncertainty 8 Frequency Response Test 9

RF Gain Uncertainty Test

IF Gain Uncertainty Test

Log Scale Switching Uncertainty Test

Average Noise Level Test

14 Residual Responses Test 15 Spurious Responses Test 16 Residual FM Test 17 Line-Related Sidebands Test 18

Calibrator Amplitude Accuracy Test

Fast Sweep Time Accuracy Test

1ST

LO OUTPUT Amplitude Test

Frequency Reference Error Test

2-2 Performance Tests

1. Center Frequency Readout Accuracy ‘I&t

1. Center Frequency Readout Accuracy

Test

Related Adjustments

Specification

Description

Frequency Control Adjustments Time Base Adjustment Step Gain and 18.4 MHz Local Oscillator Adjustments 50 MHz Voltage-Tuned Oscillator Adjustments

(uncorrected)

f2%

of frequency span + frequency reference error x tune frequency

+30% of resolution bandwidth setting + 10 Hz) in AUTO resolution

bandwidth after adjusting FREQ ZERO at stabilized temperature.

A synthesized signal source that is phase-locked to a known frequency standard is used to input a signal to the analyzer. The frequency readout of the analyzer is compared to the actual input frequency for several different frequency settings over the analyzer’s range. The signal source is phase-locked to a standard known to be as accurate as the analyzer’s internal frequency reference to minimize the “frequency reference error x center frequency” term of the specification.

SPECTRUH

FAEQUENCY

ANALYZER

SIONAL

INPUT

ADAPTER

STANDARD

CABLE ASSENBLY

Figure 2-1. Center Frequency Accuracy

SYNTHESIZED

Test

Setup

SHEEPER

Performance Tests

2-3

1. Center Frequency Readout Accuracy Test

Equipment

Procedure 1.

Synthesized Sweeper . . . . . . . . . HP

Frequency Standard . 10 MHz standard, e.g. HP

5061A

accy

within + 1 part in

8340A

Adapter, Type N (m) to SMA (f) . . . HP1250-1250 61 cm (24 in.) Cable Assembly, SMA Male Connectors HP 5061-1086

Connect CAL OUTPUT to SIGNAL INPUT 2.

Press

[INSTR

PRESET),

on the analyzer. Adjust FREQ ZERO for a maximum amplitude trace. Press

(1tds-r~

PRESET).

Set the synthesized sweeper for a 100.000 MHz signal at a level of approximately 0

Connect equipment as shown in Figure Set analyzer

dBm.

~CENTER

2-l.

FREQUENCY) and [FREQUENCY SPAN) and

synthesized sweeper frequency according to Table 2-2. At each setting, press

CREFERENCE

[PEAK

SEARCH).~~)

LEVEL) as necessary to place signal peak at a convenient

to center the signal. Adjust

level.

Record the CENTER readout frequency in the table for each setting. The limits for this frequency are given in the table. See

Figure 2-2.

lOlo,

2-4 Performance Tests

Figure 2-2. Center Frequency Readout Error Measurement

1. Center Frequency Readout Accuracy

Test

Note

Spectrum analyzer center frequency readout can fall outside of specified limits if 10 MHz frequency reference has not been calibrated within the past year. To eliminate “frequency reference error x tune frequency” term, substitute spectrum analyzer 10 MHz FREQ REFERENCE rear panel output for frequency standard and repeat test.

‘Ihble

2-2. Center Frequency Readout Error

[FREQUENCYSPAN)I(CENTER FREQumcy~

100 MHz 100 MHz 100 MHz

10 MHz 10 MHz 10 MHz 10 MHz

1 MHz

100

kHz

Spectrum Analyzer

(MHz)

100

500

1000

100

500 1000 1500 1000 1000 1000

Test

Center Readout

(MHZ)

Min Measured

98 498 998

99.8

499.8

999.8

1499.8

999.98

999.998

999.9998

Record

Max

102

502

1002

100.2

500.2

1000.2

1500.2

1000.02

1000.002

1000.0002

Performance Tests 2-5

2. Frequency Span Accuracy

lkst

Related Adjustments

Specification

Description

Frequency Control Adjustments 50 MHz Voltage-Tuned Oscillator Adjustments

Span

MHz

51 MHz

Frequency Span accuracy is determined by measuring a frequency at 5% of sweep and then at 95% of sweep. These frequencies correspond to half a division from

The spans chosen are based on the architecture of the HP hardware:

200 Hz

100

100.1 kHz 1 MHz

1.01 MHz

20 MHz

20.1 MHz

1.5

f(2%

of the actual frequency separation between two points +0.5% of span setting)

445%

of the actual frequency separation between two points +0.5% of span setting)

each edge of the CRT.

Span

kHz

GHz

Uncertainty

Assembly Being Swept

VT0 Oscillator (low divide) VT0 Oscillator (low divide) VT0 Oscillator (high divide) VT0 Oscillator (high divide)

FM Coil of Yig Oscillator FM Coil of Yig Oscillator Main Coil of Yig Oscillator Main Coil of Yig Oscillator

8568B

2-6

Performance Tests

SYNTHESIZED WEEPER

Figure 2-3. Frequency Span Accuracy Test Setup

2. Frequency Span Accuracy Test

Equipment

Procedure

Synthesized Sweeper.....................................................................

83640A

AdapterTypeN(m) to SMA(f).................................................1250-1250

Cable;SMAconnectors....................................................................

Cable; BNC122cm(48in)............................................................HP

.5061-5458

10503A

1. Connect equipment as shown in Figure 2-3.

2. Press

3. Press [CENTER FREQUENCY] 100 MHz, [FREQUENCY

QNsTR

PRESET]

on analyzer.

SPAN_) 200

Hz.

4. Connect synthesized sweeper tot spectrum analyzer RF input 2.

5. On synthesized sweeper, select external REFERENCE and key in

(jj’

6. Press

0 dBm.

Icw]

and key in 99.999 910 MHz.

7. Press MARKER [PEAK SEARCH) on spectrum analyzer and record marker reading under FREQ C of

Table

2-3.

8. Set synthesized sweeper frequency to 100.000 090 MHz.

9. Press MARKER

[PEAK SEARCH] and record marker reading under

FREQ D of Table 2-3.

10. Repeat the span measurement procedure of steps 6 through 9 for each frequency span listed in

Table

2-3.

Spectrun

Frequent y

&an

200Hz

IOOkHz

100.1

kHz

1MHz

1.01 MHz

20MHz

20.1 MHz

1.5

GHz

Analyzer

Center

Frequent y

100

MHz

100MHz

100

MHz

100

MHz

100

MHz

100

MHz

100

MHz

900

MHz

11. Determine the frequency difference between the two measured points. Enter this value under the A DUT column in

‘fable

2-3.

12. The frequency span error is the difference between A DUT and A SYNTH. (See table 2-3 for values). Calculate the span error and record it in

13. Compare the table 2-4

Table

2-4.

spec

to the span error value calculated in

step 12.

lhble

2-3. Wide Span Error

Synthesized

Freq. A

Cf-.45

99.999 910 MHz

99.955 000 MHz

99.954955 MHz

99.550 000 MHz

99.550550MHz

91.000 000 MHz

90.955 000 MHz 225 MHz

span

100.000090 MHz

100.045 000 MHz

100.045 045 MHz

100.450000 MHz

100.450500 MHz

109.000000 MHz

109.045.000 MHz

Freq. B

cf +

SweeDer

.45 span

1575 MHz

A Synth

(B-4

180 Hz

90.000 Hz

90.090kHz

900.000kHz

909.000kHz

18.000 MHz

18.090 MHz 1350 MHz

I I

Performance Tests 2-7

2. Frequency Span Accuracy

Test

Freq Span

1.5

GHz

-I-

SDan

ADUT-ASyn

from

‘Ihble

Error

‘Ihble

2-4. Span Error

Min

2-3

-5000

-5,005

-50,000

-23,230

-460,000

-462,300

-34,500.OOO

Spec.

-10

Hz Hz Hz Hz Hz Hz Hz

Hz ]

34,500O.OOO

Max

5000

5,005 50,000 23,230

460,000 462,300

-I

Hz Hz

Hz Hz Hz

Note

The specification in Table 2-4 was derived using the following formula: For spans For spans 2 1 MHz, the

> 1 MHz, the

spec

is: >*[(.02)(A synth freq) + (.005)(span)]

spec

is:

>&[(.05)(A

synth freq) + (.005)(span)]

2-8 Performance Tests

3. Sweep Time

Accuracy Test

(220

ms)

3. Sweep Time Accuracy Test (220 ms)

Related Adjustment

Specification

Description

Frequency Control Adjustments

*lo%

for sweep times

&20%

for sweep times

Preferred Procedure

This test is for sweep times Fast Sweep Time Accuracy Test (Test 19).

A universal counter is connected to the PENLIFT RECORDER OUTPUT (on the rear panel) of the spectrum analyzer. The counter is used in time interval mode to determine the “pen down” (sweep time) interval of the PENLIFT RECORDER OUTPUT. The voltage level corresponds directly to the sweeping of the analyzer (pen down = OV) and not-sweeping of the analyzer (pen up = DVM is used to set the appropriate trigger level for the counter.

Alternate Procedure

Perform this procedure if the equipment for the preferred procedure is unavailable.

Sweep time accuracy for sweep times using the HP measurement.

8568B’s

5100

seconds

>lOO

seconds

220

ms. For faster sweep times, refer to

penlift

220

ms can also be measured

internal frequency counter for a time interval

output

15V).

SPECTRUM ANALYZER

DIGITAL

Figure 2-4. Sweep Time Accuracy Test Setup

VOLTMETER

UNIVERSAL

COUNTER

Performance Tests 2-9

3. Sweep Time Accuracy

Test

(220 ms)

Equipment

Procedure

Sweep Times 220 ms

Universal Counter ..........................................

Digital Voltmeter

...........................................

1. Connect equipment as shown in Figure 2-4.

2. Press [INSTR PRESET) on the spectrum analyzer.

3. Key in the following settings:

(CENTER FREQUENCY) [FREQUENCY SPAN]

.....................................

...........................................

4. Set up the universal counter as follows: a. Set all front panel keys in “out” position. b. Set POWER switch to ON.

c. Set GATE TIME vernier control to 9 o’clock. d. Set SEPXOM A switch to COM A position. e. Depress T.I. A + B switch (making sure the blue shift key is

out).

f. Set Channel A trigger level to trigger on negative slope.

HP HP

500

5316A

3456A

MHZ

0 kHz

g. Set Channel B trigger level to trigger on positive slope.

h. Set both Channel A and Channel B

ac/dc

switches to

de.

i. Connect the digital voltmeter to Channel A TRIGGER LEVEL

OUT. (Be sure to ground the DVM properly.)

j. Adjust Channel A trigger level to set a DVM voltage reading of

0.3 v.

k. Repeat steps i and j for Channel B.

5. Set analyzer @WEEP TIME) to 20 ms. Allow the universal counter enough time to settle at this sweep time.

2-10

Performance Tests

3. Sweep Time Accuracy Test (220 ms)

+15v

-r-l

ov- ---

START+TI”E

MEASUREMENT

Figure 2-5.

NOTE:PULSE

INTERVAL

WIDTH APPROXIMATE

t-SWEEP RETRACE

t-ACTIVE SNEEP +

MEASUREMENT

Penlift

Output Signal

1 L

STOPhE

INTERVAL

---

6. Note the measured sweep time on the universal counter and record this value in

Table

2-5. The measured sweep time should

be a value between the minimum and maximum values given in

Table

2-5.

7. Repeat steps 5 and 6 for each sweep time setting in

‘Ihble

2-5.

Sweep Time Accuracy, Sweep Times

220

Table

2-5.

[SWEEP

20 50

100 ms

500

8. Press MARKER

TIME)

ms ms

450

900

(NORMAL].

Min

Marker A Time

Measured

ms ms ms ms ms

9. Use @J to place the marker at the second vertical graticule.

10. Press

@FiHIFT),[Xi!FF~.

11. Set analyzer [SWEEP TIME) to 20 s. Allow the universal counter enough time to settle at this sweep time.

12. Note the measured sweep time on the universal counter and record this value in Table 2-6. The measured sweep time should

be a value between the minimum and maximum values given in

Table

2-6.

13. Repeat steps 11 and 12 for 200 s sweep time.

Performance Tests

2-11

3. Sweep Time Accuracy Test (220 ms)

‘Ihble

2-6.

Sweep Time Accuracy, Sweep Times

220

Sweep Times 220 ms

(Alternate Procedure)

Start-Up Time

Measurement

[SWEEP TIME)

Marker A Time

Min Measured Max

4.4 s

14. Sweep times

20 s 3.6 s

200 s

220

ms are tested without external test equipment

32 s 48 s

by the following procedure.

15. Press

16. Set @WEEP TIME] according to

~NSTR PRESET).

Table

2-7. Press MARKER

Rotate the DATA knob to place the marker on the left edge of the CRT display. Key in

17. Press

[SHIFT) [REsy

CSHIFT) [my.

three times. The Active Function Block reads SWEEP GEN followed by a measured sweep time. This is the start-up time. Record it in

‘Ihble

2-7. The start-up time must be subtracted from the SWEEP GEN time measured in step 19. (Adding the start-up time to the

[SWEEP TIME] setting effectively

subtracts it from the SWEEP GEN time.)

18. Press MARKER (OFF).

(j-1.

Sweep Time

Measurement

19. Press

@?i] (REST

three times and note the SWEEP GEN reading. The limits for the SWEEP GEN reading are listed in

Table

2-7. (For example, assume the start-up time measured in

step 17 was 700

,US

for a [SWEEP TIME) of 20 ms. The limits for the

SWEEP GEN readings would be 19.3 to 22.7 ms.)

20. Repeat steps 16 to 19 for each sweep time shown in Table 2-7.

lhble

2-7.

Sweep Time Accuracy, Sweep Times

220

(Alternate Procedure)

SWEEP

20 ms 50 ms

100 ms

500 ms

10 s

50 s 100 s 150 s

-rIME_)

Min Measured

18.0 ms 22.0 ms

45.0 ms 55.0 ms

90.0 ms 450ms 900

45.0

90.0 ms 10.0 ms

20.0 s 80.0 ms

Sweep Gen Readout

Max

110

550

1.10 ms

9.00 ms 11.0 ms

ms 55.0 ms

2-12 Performance Tests

4. Resolution Bandwidth Accuracy

Test

4. Resolution Bandwidth Accuracy Test

Related Adjustment

Specification

Description

Equipment

Procedure

(For instruments with Option 462, refer to Chapter 4.)

3-dB

Bandwidth Adjustments

&20%,

3 MHz

+lO%, 3 kHz to 1 MHz &20%

10 Hz to 1 kHz

30 kHz and 100 kHz bandwidth accuracy figures apply only with

190% Relative Humidity, <

40°C.

The 3 dB bandwidth for each resolution bandwidth setting is measured with the MARKER function to determine bandwidth

accuracy. The CAL OUTPUT is used for a stable signal source.

None Required

Press [INSTR PRESET).

Connect CAL OUTPUT to SIGNAL INPUT 2.

Key in spectrum analyzer setting as follows:

(CENTER FREQUENCY)

FREQUENCY SPAN)

[m)

[REFERENCE LEVEL)

Press SCALE LIN pushbutton. Press

.....................................................

........................................

...........................................

........................................

csHIFT],[my

(resolution

-10 dBm

bandwidth).

Adjust [REFERENCE LEVEL] to position peak of signal trace at reference level (top) graticule line. Press SWEEP

Press MARKER

[ml

and place marker at peak of signal trace

[SINGLE).

with DATA knob. Press MARKER In] and position movable marker 3 dB down from the stationary marker on the positive-going edge of the signal trace (the MARKER A amplitude readout should be

-3.00 dB

ho.05 dB).

It may be necessary to press SWEEP

ICONT)

and adjust [CENTER FREQUENCY) to center trace on screen.

Press MARKER

(ZJ

and position movable marker 3 dB down

from the signal peak on the negative going edge of the trace (the MARKER A amplitude readout should be .OO dB

bandwidth is given by the MARKER A frequency readout (see

Figure 2-6). Record this value in

Table

2-8.

f0.05 dB).

MHZ

MHz

3 MHz

The 3

Performance Tests

2-13

4. Resolution Bandwidth Accuracy Test

Figure 2-6. Resolution Bandwidth Measurement

8. Vary spectrum analyzer settings according to the 3 dB bandwidth for each resolution bandwidth setting by the procedure of steps 6 and 7 and record the value in measured bandwidth should fall between the limits shown in the table.

‘Ihble

2-8. Bandwidth Accuracy

[REW)

1 MHz

300

100 kHz

300

100 Hz

10 Hz

‘FREQUENCY SPAN] MARKER A Readout of 3

MHz

kHz

kHz kHz kHz kHz

2 500 200

50 20

2 500 200

100 Hz 100 Hz

MHz

kHz kHz kHz kHz kHz kHz

Hz Hz

Min

2.400

270.0

27.00

2.700

MHz

900 kHz

kHz

90.0 kHz

kHz

9.00 kHz

kHz

800 240

80 24

Hz Hz Hz Hz Hz

‘fable

Measured

2-8. Measure

‘Ihble

2-8. The

Bandwidth

Max

3.600

1.100 MHz

330.0

33.00

3.300

MHz

kHz

110.0 kHz

kHz

11.00 kHz

kHz

1.200 kHz

360

120 Hz

12 Hz

2-14 Performance Tests

5. Resolution Bandwidth Selectivity Test

6. Read the 60 dB bandwidth for the 3 MHz resolution bandwidth setting from the MARKER A frequency readout (see Figure 2-7) and record the value in

7. Vary spectrum analyzer settings according to Table 2-9. Measure

the 60 dB bandwidth for each resolution bandwidth setting by the procedure of steps 4 through 6 and record the value in

Table

2-9.

‘fable

2-9.

8. Record the 3 dB bandwidths from

Table

2-8 in

Table

2-9.

9. Calculate the bandwidth selectivity for each setting by dividing

the 60 dB bandwidth by the 3 dB bandwidth. The bandwidth ratios should be less than the maximum values shown in

‘fable

2-9.

10. The 60 dB bandwidth for the 10 Hz resolution bandwidth setting should be less than 100 Hz.

2-16 Performance Tests

Figure 2-7. 60 dB Bandwidth Measurement

5. Resolution Bandwidth Selectivity Test

‘lhble

2-9. Resolution Bandwidth Selectivity

Spectrum Analyzer

RES]

(FREQUENCY SPAN)

@iiFSE]

3 MHz 20 MHz 100 Hz

1 MHz

300

kHz

100

kHz

30 kHz500 kHz

3 kHz 50 kHz

300 Hz 5 kHz

100 Hz

30 Hz 500 Hz

10 Hz 100 HZ

15 MHz

5 MHz 2 MHz

kHz200 kHz

kHz 10 kHz

2 kHz

300 Hz

AUTO AUTO AUTO AUTO AUTO AUTO AUTO AUTO AUTO

AUTO

Measured Measured

6OdB

Bandwidth Selectivity Selectivity Ratio

Bandwidth Bandwidth (60 dB BW

3dBBW)

60 dB points separated by

cl00

Maximum

15:l

15:l 15:l 15:l 13:l 13:l 13:l 11:l 11:l 11:l 11:l

Performance Tests 2-17

6. Resolution Bandwidth Switching Uncertainty Test

(For instruments with Option 462, refer to Chapter 4.)

Related Adjustments

Specification

Description

Equipment

Procedure

3 MHz Bandwidth Filter Adjustments

21.4 MHz Bandwidth Filter Adjustments Down/Up Converter Adjustments

(uncorrected; referenced to 1 MHz bandwidth; 20 warm-up)

f0.8 dB,

fl.O

k2.0 dB,

30 Hz bandwidth

dB,

3 MHz bandwidth 30 kHz and 100 kHz bandwidth switching

10 Hz bandwidth

*0.5 dB,

100 Hz to 1 MHz bandwidth

30°C

after 1 hour

uncertainty figures only applicable 190% Relative Humidity

The CAL OUTPUT signal is applied to the input of the spectrum

analyzer. The deviation in peak amplitude of the signal trace is then measured as each resolution bandwidth filter is switched in.

None Required

Press (INSTR PRESET). Connect CAL OUTPUT to SIGNAL INPUT 2.

Key in the following control settings:

(CENTER FREQUENCY) [FREQUENCY SPAN]

REFERENCE LEVEL]

&sTE,

..................

......................

.......................

......................

.......................

-8

MHz MHz

dBm

MHz

2-18 Performance Tests

Press LOG (ENTER

[PEAK SEARCH)

Press

m,@J

Key in settings according to Table 2-10. Press MARKER

[PEAK SEARCH] at each setting, then read the amplitude deviation

dB/bIvj

and key in 1

dB.

Press MARKER

from the MARKER A readout at the upper right of the display (see Figure 2-8). The allowable deviation for each resolution bandwidth setting is shown in the table.

6. Resolution Bandwidth Switching Uncertainty Test

Figure 2-8. Bandwidth Switching Uncertainty Measurement

‘Ihble

2-10. Bandwidth Switching Uncertainty

1 MHz

5 MHz

3 MHz 5 MHz

300 kHz

100

kHz 500 kHz

5 MHz

30 kHz 500 kHz

10 kHz 50 kHz

3 kHz 50

kHz 10

300 Hz 1

100 Hz

1 30 Hz 200 Hz 10 Hz 100 Hz

kHz kHz kHz kHz

Deviation

(MKR A

Readout,

0 (ref)

dB)

Allowable

Deviation

(dB)

0 (ref)

IlIl.00 Zto.50 Ito. Ito. f0.50 f0.50 Ito. dZo.50 Ito. f0.80 f2.00

Performance Tests

2-l

7. Input Attenuator Switching Uncertainty

Test

6. Press MARKER

7. Set

[~~J’JREFERENCE

amplitude according to

(PEAK SEARCH) and record the deviation from the 10

CPEAK SEARCH),(KJ

LEVEL], and frequency synthesizer

Table 2-l

1. At each setting, press MARKER

setting from the MARKER A amplitude readout (see Figure 2-10). The deviation should not exceed

~Sl”‘i

r’

*l.O dB

-40. i

dBm l

at any setting.

ATTi” 20 ,dB ,

, , ,

HKR A

Hz i

Figure

‘Ihble 2-l

Lz)

20 30 40 50

[REFERENCE LEVEL) Frequency

-50

-40

-30 -32

-20

-10 -12

60 0 70

+lO

CENTER

Wm)

28.0000

2-10.

RES

MHz

BY30

kHz

VBW

100 Hz SVP 500

SPAN

Attenuator Switching Uncertainty Measure]

1. Input Attenuator Switching Uncertainty Deviation Corrected Allowable

Synthesizer (MARKER A Deviation Deviation

Amplitude Amplitude

Wm)

-52

(ref)

-42

-22

-2 8

100.

n3mP.z

ktiz

nent

Performance Tests 2-21

8. Frequency

Response Test

Related Adjustment

Specification

Description

SYNTHESIZED SWEEPER

Slope Compensation Adjustment

SIGNAL INPUT 1

~tl.5 dB, *I dB,

100 Hz to 1.5

GHz

100 Hz to 500 MHz

SIGNAL INPUT 2

fl dB,

100 kHz to 1.5

GHz

Frequency response at both analyzer inputs is tested by slowly sweeping a flat signal source over the frequency range and observing the peak-to-peak variation in trace amplitude. The test is divided into three parts. First, the response is tested from 20 MHz to 1.5

GHz

with a power-meter-leveled synthesized sweeper. Next, a frequency synthesizer is used to check the response from 100 kHz to 20 MHz. Finally, SIGNAL INPUT 1 is tested from 100 Hz to 100 kHz with a function generator.

SPECTRUM ANALYZER

POWER METER

OPTION 001. ADD 50

Figure 2-11. Frequency Response Test Setup (20 MHz to 1.5

OHMS/75

RECORDER

OUTPUT

I I

OHM PAD AND ADAPTER

POWER SENSOR

GHz)

ADA,PT,ERS

GNAL

NPUT

gb12b

2-22 Performance Tests

8. Frequency Response Test

Note

Equipment

Procedure

20 MHz to 1.5

GHz

Equipment listed is for three test setups, Figure 2-11, Figure 2-13, and Figure 2-15.

Synthesized Sweeper .......................................

Power Meter Power Sensor

...............................................

Frequency Synthesizer .....................................

Function Generator ........................................

Power Splitter

.............................................

Adapter, Type N (m) to BNC (f) ........................

Adapter, Type N (m) to BNC (m) .......................

Adapter, Type N (m) to Type N (m) Adapter, Type N (m) to SMA (f) Adapter, APC-3.5 (f) to APC-3.5 (f)

....................

........................

....................

Cable, SMA Connectors ................................

8340A

..HP436

8482A

3335A

3312A

11667A

HP 1250-0780 HP 1250-0082 HP 1250-0778

HP 1250-1250 HP 1250-1749 HP 5061-5458

Additional Equipment for Option 001:

5OfY700

Adapter, Type N (f) to BNC (m) (7561)

Minimum Loss Pad ...............................

..................

HP 1250-1534

Press ~NSTR PRESET) on spectrum analyzer and synthesized

11852A

sweeper.

Set controls as follows:

Power Meter

MODE RANGE HOLD CAL FACTOR %

. . . . . dBm

. . . OFF

. . . 100

Synthesized Sweeper

START FREQ STOP FREQ SWEEP SWEEP TIME POWER LEVEL

Connect equipment as shown in Figure

...........................................

............................................

.................................................

.............................................

......................................

2-l

1. The RECORDER

0.00 dBm

OUTPUT on rear panel of power meter is connected to LEVELING EXT INPUT of the synthesized sweeper. One output arm of the power splitter is connected directly to SIGNAL INPUT 2 of the spectrum analyzer via the N-to-N adapter. The power sensor connects directly to the other splitter output.

Depress RANGE HOLD button on power meter.

Select METER leveling on synthesized sweeper.

Key in the following spectrum analyzer settings:

20 MHz

1.5

GHz

[-)

120 s

[CENTER FREQUENCY)

FREQUENCY SPAN]

km)

............................................................................................

......................................

Performance Tests

.20

MHZ

MHz

2.23

8. Frequency Response Test

Adjust POWER LEVEL on synthesized sweeper (using data knob)

to place peak of 20 MHz signal near reference level (top) graticule line.

Press

[ENTER

dB/mv],

on spectrum analyzer. Adjust POWER LEVEL on synthesized sweeper to position peak of signal 2 divisions below the reference level line.

Key in the following spectrum analyzer settings:

START FREQ)

km)

Press TRACE A

10.

Press SWEEP SINGLE on the synthesized sweeper.

11.

I dB/

-.B

dBm

START 20 nnz

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . .

REF .0

darn

RES BW

[MAX)

..__..................................

on the analyzer.

ATTEN

Mnt

VBW 1 MHZ

STOP 1500 MHZ

SWP 20

mssc

20.MHz

1.5GHz

2-24 Performance Tests

Figure 2-12. Frequency Response Measurement (20 MHz to 1.5

12. Press DISPLAY LINE

[ENTER)

on the spectrum analyzer. Use the

GHz)

Display Line to measure the maximum and minimum points on the trace. Record measurements below.

SIGNAL INPUT 2 (20 MHz to 1.5 Maximum Minimum

GHz)

dBm

13. To check SIGNAL INPUT 1, use the type N male to BNC male adapter to connect the power splitter directly to SIGNAL INPUT

1. Option 001: Use HP

11852A

Minimum Loss Pad and adapters

between splitter and spectrum analyzer input.

14. Press

[INSTR PRESET) on spectrum analyzer, then activate SIGNAL

INPUT 1 with the pushbutton.

8. Frequency Response Test

Option 001: Set [REFERENCE LEVEL] TO -6.0 dBm.

100

kHz

to 20 MHz

15. Repeat steps 6 through 11. Press DISPLAY LINE

[ENTER)

spectrum analyzer. Use the Display Line to measure the maximum and minimum points on the trace. Record measurements below.

SIGNAL INPUT 1 (20 MHz to 1.5 Maximum Minimum

16. Press MARKER MHz. Press DISPLAY LINE

(-1

GHz)

dBm

on spectrum analyzer. Set marker to 500

(ENTER]

on the spectrum analyzer. Use the Display Line to measure the maximum and minimum points between 20 MHz and 500 MHz. Record measurements below.

SIGNAL INPUT 1 (20 MHz to 500 Maximum

Minimum

GHz)

dBm

17. Set the frequency synthesizer controls as follows: FREQUENCY

SWEEP WIDTH AMPLITUDE

.............................................

.........................................

.............................................

(Option 001: + 4 dBm)

on the

20 MHz

19.9 MHz

-2 dBm

OPTIOW 001: MO

Figure 2-13. Frequency Response Test Setup (100

18. Connect equipment as shown in Figure 2-13. The output of the

frequency synthesizer should be connected to SIGNAL INPUT 1.

Option

SPECTRUM ANALYZER

8IHIAL

INPUT

l-f

80 oHMa/ 78 ON88 PM AW AIDAPTUII

19. Press ~NSTR PRESET) on the spectrum analyzer. Activate SIGNAL INPUT 1 with the pushbutton.

001:

Use HP 11852 Minimum Loss Pad and adapters.

FREQUENCY SYNTHESIZER

#IONAL

IaPuT P

ADAPTER

kHz

to 20 MHz)

20. Key in the following spectrum analyzer settings:

Performance Tests 2-25

8. Frequency Response

Test

25. After completion of sweep, press DISPLAY LINE

(j?KiK]

on the

spectrum analyzer. Use the Display Line to measure the maximum and minimum points on the trace. Record the measurements

below.

SIGNAL INPUT 1 (100 kHz to 20 MHz) Maximum dBm Minimum dBm

26. Measure and record signal level at start of trace (100

kHz).

SIGNAL INPUT 1 (100

kHz)

dBm

27. Connect output of frequency synthesizer to SIGNAL INPUT 2. Activate this input with the pushbutton.

Option 001. Do not use HP

11852A

Minimum Loss Pad. Set

frequency synthesizer output amplitude to -2 dBm.

28. Press TRACE A

CCLEAR-WRITE)

and DISPLAY LINE

(OFF)

spectrum analyzer.

29. Set frequency synthesizer FREQUENCY to 20 MHz. Set spectrum analyzer (CENTER FREQUENCY_) to 20 MHz, and (FREQUENCY SPAN) to

1 MHz.

30. Repeat steps 22 through 24.

31. After completion of sweep, press DISPLAY LINE

[ENTER]

spectrum analyzer. Use the Display Line to measure the maximum and minimum points on the trace. Record the measurements below.

SIGNAL INPUT 2 (100 kHz to 20 MHz) Maximum Minimum

dBm

Figure 2-15.

Frequency Response

Test

Setup (100 Hz to 100

on the

k=)

Performance Tests

2-27

8. Frequency Response Test

100Hzto

100

kHz

Press (INSTR PRESET) on the spectrum analyzer. Activate SIGNAL

32. INPUT 1.

Key in the following spectrum analyzer settings:

33.

START FREQ) . . . .

;&TEq

Connect equipment as shown in Figure 2-15 with function

34.

.._..............................

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

...........

.........

generator to SIGNAL INPUT 1. Set the function generator controls as follows:

35.

LINE . . . . . . . . . . . . . . . . . . .. . . . . . .. . . . . . . . . . . . . . . . . . . . ON

RANGE Hz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 K

FUNCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

OFFSET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CAL (button in)

AMPLITUDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 V

AMPLITUDE VERNIER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . midrange

SYM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CAL

TRIGGER PHASE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . FREE RUN

MODULATION

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . all out

MODULATION RANGE Hz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I

MODULATION RANGE Hz VERNIER .......fully CCW

MODULATION SYM Percent Modulation

Adjust function generator FREQUENCY to place signal between

36.

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CAL

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

the last two graticule lines (right side) on the signal analyzer display.

100

.. . . fully

kHz kHz

Adjust AMPLITUDE VERNIER on the function generator until

37. the peak of the signal is at the reference graticule line on the spectrum analyzer display.

Press LOG

38. DISPLAY LINE

CENTER

[ENTER]

dB/DIv_) 1

on the spectrum analyzer. Press

and set the Display Line to the level

recorded for 100 kHz in step 25. Adjust function generator AMPLITUDE VERNIER to place peak of

39. signal at the Display Line.

Adjust FREQUENCY on the function generator to position the

40. signal trace at the right edge of the spectrum analyzer display (last graticule line).

Press MODULATION SWP on the function generator and allow the

41. function generator to make at least two complete sweeps. Press TRACE A [MAX HOLD). Allow the function generator to make one complete sweep. After completion of the sweep, press TRACE A

m).

2.28

Performance Tests

8. Frequency Response

Test

42. Press DISPLAY LINE

[ENTER]

on the spectrum analyzer. Use the Display Line to measure the maximum and minimum points on the trace. (Disregard LO Feedthrough at 1

kHz.) Record the

measurements below.

SIGNAL INPUT 1 (1

kHz to 100 kHz)

Maximum dBm Minimum dBm

43. Set Display Line to peak of trace at 1 kHz.

44. Key in the following spectrum analyzer settings:

TRACE A

(CLEAR-WRITE)

. . . . . . . . . . . . . . . . . . . .

45. Set function generator controls as follows:

RANGE Hz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 (button)

FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

MODULATION. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ..all out

46. Adjust function generator FREQUENCY as necessary to place

signal near center graticule line and adjust AMPLITUDE VERNIER

to place peak of signal at Display Line.

iO0

kHz

47. Key in the following spectrum analyzer settings:

FREQUENCY SPAN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 Hz

48.

&TT!,

Set (CF

(CENTER

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Hz

STEP SIZE] to 100 Hz. Step spectrum analyzer

IEQUENCY]

from 1 kHz to 100 Hz with

function generator FREQUENCY to match spectrum analyzer center frequency at each step. Record level-at each setting.

SIGNAL

1000 Hz

INPUT

dBm

900 Hz dBm 800 Hz dBm 700 Hz dBm 600 Hz dBm 500 Hz dBm 400 Hz dBm 300 Hz dBm 200 Hz dBm

100 Hz

dBm

while setting

Performance Tests 2-29

8. Frequency Response Test

49. For each input, subtract the lowest minimum level (greatest negative) from the highest maximum (least negative) measurement recorded in steps indicated. The result should not

exceed 2

dB.

SIGNAL INPUT 1

100 Hz to 500 MHz (from steps 16, 25, 42, or 48)

Spec: ~2

Overall Maximum dBm

-Overall Minimum dBm

Overall Deviation dBm

SIGNAL INPUT 2

100 kHz to 1.5

Spec: ~2

Overall Maximum

GHz

(from steps 12 or 31)

dBm

-Overall Minimum dBm

Overall Deviation

dBm

50. Subtract the lowest minimum level (greatest negative) from the highest maximum (least negative) measurement recorded in steps indicated. The result should not exceed 3

dB.

SIGNAL INPUT 1

100 Hz to 1.5

GHz

(from steps 15, 16, 25, 42, or 48)

2.30

Performance Tests

Spec: ~3

Overall Maximum

-Overall Minimum

Overall Deviation

dBm

9. RF Gain Uncertainty Test

Figure 2-16. RF Gain Uncertainty Measurement

1 I

I\ I

2-32 Performance Tests

10. IF Gain

Uncertainty Test

10. IF Gain Uncertainty

Test

Related Adjustments

Specification

0 dBm to -55.9 dBm Res BW

-56.0 dBm to -129.9 dBm

Description

Step Gain and 18.4 MHz Local Oscillator Adjustments

21.4 MHz Bandwidth Filter Adjustments

Assuming the internal calibration signal is used to calibrate the reference level at -10 dBm and the input attenuator is fixed at 10

dB,

any changes in reference level from the -10 dB setting will contribute

to IF gain uncertainty as shown:

Range

Uncertainty (uncorrected; 20 -

Res BW

230 230

Hz, Hz,

f0.6 dB; f1.0 dB;

Res BW = 10 Hz, Res BW = 10 Hz,

30°C)

h1.6 dB f2.0 dB

The IF gain steps are tested over the entire range from 0 dBm to

-129.9 dBm using an RF substitution method. The 10

dB,

and

0.1 dB steps are compared against a calibrated signal source provided by an HP

SIGNAL GENERATOR

3335A

Frequency Synthesizer.

SPECTRUM ANALYZER

RF OUTPUT

ADAPTER

STEP ATTENUATOR

355CbHE9

STEP ATTENUATOR

355C-HZ5

Figure 2-17. IF Gain Uncertainty

Test

SIGNAL INPU

ADAPTER

Setup

Performance Tests 2-33

10. IF Gain Uncertainty Test

Equipment

Procedure 1.

10 dB Gain Steps

Frequency Synthesizer Adapter, Type N (m) to BNC (f)

Press (

Connect CAL OUTPUT to SIGNAL INPUT.

Press

-10.00 dBm

Press

Set the frequency synthesizer for an output frequency of 20.0010

INSTR pfwm-).

Cm]

8. Adjust AMPTD CAL for a MARKER amplitude of

50.02 dB.

(1~~733

PRESET).

.....................................HP

........................

HP 1250-0780

MHz and an output power level of -2.0 dBm. Set the amplitude increment for 10 dB steps.

Connect the equipment as shown in Figure 2-17.

Key in analyzer settings as follows:

CCENTER CFREQUENCY

Press MARKER

(CENTER FREQUENCY) to center signal trace on display.

Set analyzer as follows:

FREQUENCY) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20.001 MHZ

SPAN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 kHz

(PEAK

SEARCH).~~)

or adjust

3335A

Note

[V’DEO(j-1

LOG

10.

Press MARKER [PEAK SEARCH),

11.

Press

(SHIFT),(m]I

Set the analyzer (REFERENCE

12. synthesizer amplitude according to

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 Hz

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 kHz

CENTER

dB/DIv]

. . . . . . . . . . . . . . . . . . . . . . . . . . 1

to permit extended reference level settings.

LEVEL],(VIDEO],

Table

and frequency

2-12 settings. (Use the

frequency synthesizer @J for 10 dB steps.) At each setting, note

the MKR A amplitude displayed in the upper right corner of the

analyzer display (deviation from

the 0

reference setting) and

record it in the table. See Figure 2-18.

After measurement at the (REFERENCE LEVEL) = -70 dBm setting, press

[SHIFT),(ENTER dB/DIvP

as indicated in

‘lhble

2-12.

2-34 Performance Tests

10. IF Gain Uncertainty Test

‘Ihble

2-12. IF Gain Uncertainty, 10 dB Steps

[REFERENCE LEVEL)

Pm)

-10

-20

-30

-40

-50

-60

-70

-80 -32

-90

-100

-110

Frequency

Synthesizer

Amplitude

Pm)

-2

-12

-22

-32

-42

-52

-62

-72

-42

-52

-62

100 100 100 100 100

100

10 10

100 100

10 10

Deviation (Marker

Amplitude

0 (ref.)

-120

Figure 2-18. IF Gain Uncertainty Measurement

-72

Performance Tests 2-35

10. IF Gain Uncertainty Test

2 dB Gain Steps

13. Press

QNSTR

pREsETj,(jRECALL) 7.

14. Set [REFERENCE LEVEL] to -1.9 dBm.

15. Press MARKER (OFF). Set

CVlDEo]

to 100 Hz.

16. Set the frequency synthesizer for an output power level of -3.9

dBm. Set the amplitude increment for 2 dB steps.

17. Press MARKER [PEAK

18. Set the analyzer amplitude according to

SEARCH),@

CREFERENCE

‘Iable

LEVEL) and the frequency synthesizer

2-13. At each setting, note the MKR

A amplitude and record it in the table.

‘lhble

2-13. IF Gain Uncertainty, 2 dB Steps

LREFERENCE

CdBm)

-1.9

-3.9

-5.9

-7.9

LEVEL) Frequency

Synthesizer (MARKER A

Amplitude

Wm)

-3.9

-5.9

-7.9

-9.9

Deviation

‘Amplitude

W-9

(ref)

-9.9

REF -1.0

1 m/

CENTER

22.001

RES 81 1

dBm

Nbb

hbix

Figure 2-19. IF Gain Uncertainty Measurement (2

-11.9

AtfEN10

VBU

100

YKRAE Hz

0.02 dB

SPAM

2.00

SUP SW “.O

kl4z

dB)

2-36 Performance Tests

10. IF Gain Uncertainty

Test

0.1 dB Gain Steps

19. Set [REFERENCE LEVEL) to 0

dB.

20. Set the frequency synthesizer for an output power level of -2.00

dBm. Set the amplitude increment for 0.1 dB steps.

21. Press MARKER [PEAK

SEARCH),@.

22. Set the analyzer and the frequency synthesizer amplitude according to

lkble

2-14. At each setting, note the MKR A

amplitude and record it in the table.

23. Find the largest positive deviation and the largest negative deviation for reference level settings from 0 dBm to -70 dBm in

Table

2-12. Also, find the largest positive and negative deviations

for the last five settings in the table.

Reference Level Range: 0 to -70 dBm Largest Positive Deviation: Largest Negative Deviation:

-80 to -120 dBm

dB dB

24. Find the largest positive and negative deviations in

Yhble

2-14:

‘Ihble 2-13

‘lkble

‘able

2-13 and

2-14

dB dB

Largest Positive Deviation: Largest Negative Deviation:

dB dB

Performance Tests 2-37

10. IF Gain Uncertainty

Test

‘Ihble

2-14. IF Gain Uncertainty, 0.1 dB Steps

[REFERENCE LEVEL) Frequency

Pm)

Synthesizer

Amplitude

(am)

0.0

-0.1

-0.2

-0.3

-0.4

-0.5

-0.6

-0.7

-0.8

-0.9

-1.0

-1.1

-1.2

-2.00 0(ref)

-2.10

-2.20

-2.30

-2.40

-2.50

-2.60

-2.70

-2.80

-2.90

-3.00

-3.10

-3.20

Deviation

(MKR A

Amplitude

-1.3

-1.4

-1.5

-1.6

-1.7

-1.8

-1.9

25. The sum of the positive deviations recorded in A, not exceed 0.6

dB.

-3.30

-3.40

-3.50

-3.60

-3.70

-3.80

-3.90

and D should

26. The sum of the negative deviations recorded in A, C, and D should not be less than -0.6

dB.

27. The sum of the positive deviations recorded in A, B, C, and D should not exceed 1.0

dB.

28. The sum of the negative deviations recorded in A, B, C, and D

should not exceed

1 .O

dB.

2.38 Performance Tests

11. Log Scale Switching Uncertainty Test

REP -9.8 dml

2 dB/2

dB/

CENTER 100.000 MHZ

RES BW 30 kliz

RES BW 30 kHz

ATTEN 10 de

ATTEN 10

VBW

100

kHz

HKA 100.001 B MHZHKA 100.001 B MHZ

-a.a2 *em

SPAN

100

kHZSPAN

100

20.0 nl*ec

kHZ

SWP

Figure 2-20. Log Scale Switching Uncertainty MeasurementFigure 2-20. Log Scale Switching Uncertainty Measurement

able

2-15. Log Scale Switching Uncertainty

SCALE

(dB/DIV)

Allowable

Deviation

0 (ref)

2 5

f0.5 f0.5 f0.5

2-40

Performance Tests

12. Amplitude Fidelity

Test

12. Amplitude

Fidelity Test

Related Adjustment

Specification

Description

(For instruments with Option 857, refer to Chapter 5.)

Log Amplifier Adjustments

Log:

Incremental

ho.1

dB/dB over 0 to 80 dB display

Cumulative

3 MHz to 30 Hz Resolution Bandwidth

<kl.O dB 5%

1.5 dB max over 0 to 90 dB display

max over 0 to 80 dB display (20 -

30°C).

Linear:

f3%

of Reference Level for top

9-l/2

divisions of display

Amplitude fidelity in log and linear modes is tested by decreasing the signal level to the spectrum analyzer in 10 dB steps with a calibrated signal source and measuring the displayed amplitude change with the analyzer’s MARKER A function.

SIGNAL

ANALYZER

SYNTHESIZER LEVEL

GENERA OR

ADAPTER

Figure 2-21. Amplitude Fidelity Test Setup

Performance Tests

2-41

12. Amplitude Fidelity Test

Equipment

Procedure

Log Fidelity

Frequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP

3335A

Adapter, Type N (m) to BNC (f) . . . . . . . . . . . . . . . . . . . . . HP 1250-0780

1. Set the frequency synthesizer for an output frequency of 20.000 MHz and an output power level of + 10

dBm. Set the amplitude

increment for 10 dB steps.

2. Connect equipment as shown in Figure 2-21.

3. Press ~NSTR PRESET) on the analyzer. Key in analyzer settings as

follows:

[CENTER FREQUENCY)......................................

FREQUENCY CREFERENCE

4. Press MARKER

SPAN]

LEVEL)

.........................................

.......................................

SPEAK SEARCHJ@~K~GTJ~MKR

+ REF

center the signal on the display.

5. Key in the following analyzer settings:

FREQUENCY SPAN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . O Hz

[&Xi,

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Hz

6. Press MARKER A. Step the frequency synthesizer output amplitude from + 10

dBm to -80 dBm in 10 dB steps, noting

the MARKER A amplitude (a negative value) at each step and recording it in column 2 of

‘fable

2-16. Allow several sweeps after

each step for the video filtered trace to reach its final amplitude (see Figure 2-22).

LVL)

.20

.50

+ 10

MHZ

kHz

dBm

7. Subtract the value in column 1 from the value in column 2 for each setting to find the fidelity error.

‘Ihble

2-16. Log Amplitude Fidelity

Frequency

Fidelity Error

Cumulative

Synthesizer Calibrated MARKER A Amplitude (Column 2 - Column 1)

Amplitude Amplitude

(mm)

+lO

-10

Step

0 (ref) 0 (ref)

-10

-20

(dB)

0 (ref)

0 to 80

-20 -30

-30 -40

-40

-50

-50 -60

-60 -70

-70

-80

-90

<*l.O dB

Cumulative

Error

0 to 90

~f1.5 dB

Error

(dW

2-42 Performance Tests

12. Amplitude Fidelity

Test

8. The fidelity error for amplitude steps from -10 dB to -80 should be <& 1.0

9. The fidelity error at the -90 dB setting should be

d0/

CENTER

REF

9.7

20.000 RES BW I kHZ

dB.

d&n ATTEN 20 dB

iB0

MHz

I I

VBW

s&l.5 dB.

YKR A

I I I

HT.

SWP

SPAN 0

300 n..c

I 1

Linear Fidelity

Figure 2-22. Amplitude Fidelity Measurement

10. Key in analyzer settings as follows:

(jEGi--

FREQUENCY SPAN)

[M,

.................................................

....................................................

..........................................

300

MHz

1 MHz

11. Set the frequency synthesizer for an output power level of + 10

dBm.

12. Press SCALE LIN pushbutton. Press MARKER

CPEAK SEARCHJ[MKR)

13. Set (FREQUENCY SPAN) to 0 Hz and

@‘iYiF),[XF6-~

(resolution bandwidth), MARKER

to center the signal on the display.

[VlDEo]

to 1 Hz. Press

14. Decrease frequency synthesizer output amplitude by 10 dB steps,

noting the MARKER A amplitude and recording it in column 2 of

‘Ikble

2-17.

Performance Tests 2-43

12. Amplitude Fidelity Test

‘Ihble

2-17. Linear Amplitude Fidelity

Frequency MARKER A

Synthesizer Amplitude

Amplitude

(dB)

I I

(f3

I I

-10

Allowable Range

% of Reference Level)

Min

Max

-10.87 -9.21

-23.10

-17.72

2-44 Performance Tests

13. Average Noise

Level

Tkst

13. Average Noise Level Test

Specification

Description

Equipment

Procedure

c-135 <l

dBm for frequencies >I MHz,

c-112

dBm for frequencies

MHz but >500 Hz with 10 Hz resolution bandwidth, 0 dB input

attenuation, 1 Hz video filter.

Option 001:

c-129

dBm for frequencies >l MHz,

c-106

dBm for frequencies 51 MHz but >500 Hz with 10 Hz resolution bandwidth, 0

input attenuation, 1 Hz video filter (SIGNAL INPUT 1 only).

The average noise level is checked by observing the displayed noise level at several frequencies with no input signal applied.

50 Ohm Termination. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .HP

Press

(~NsTR

PRESET].

Connect CAL OUTPUT to SIGNAL INPUT 2.

Press of -10.00 dBm

@. Adjust AMPTD CAL for a MARKER amplitude

50.02 dB.

Press ~NSTR PRESET]. Disconnect CAL OUTPUT from analyzer. Terminate SIGNAL

11593A

INPUT 2 with a 509 coaxial termination.

Key in spectrum analyzer settings as follows:

CATTEN)

(CENTER FREQUENCY] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 501 HZ

FREQUENCY SPAN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O Hz

;W,

REFERENCE LEVEL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -80 dBm

i-1

@WEEP TIME] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Press SWEEP

Press DISPLAY LINE

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Hz

. . . .

..__............__.............................. 1Hz

.20

seconds

(SINGLE]

and wait for completion of the sweep.

[ENTER).

Using DATA knob, place display line at the apparent average amplitude of the noise trace (see Figure 2-23).

Performance Tests 2-45

13. Average Noise Level

Test

Figure 2-23. Average Noise Level Measurement

9. Read the average noise level from the DISPLAY LINE readout. The value should be

c-112

dBm.

dBm

10. Change [CENTER FREQUENCY) to 1.001 MHz. Follow the procedure to steps 7 through 9 to determine the average noise level. The value should be

c-135

dBm.

dBm

11. Change

(-CENTER

FREQUENCY) to 1501 Mhz. Follow the procedure of

steps 7 through 9 to determine the average noise level. The value should be <- 135 dBm.

dBm

2-46 Performance Tests

14. Residual

Responses Test

14. Residual Responses

Test

Specification

Description

Equipment

Procedure

c-105

dBm for frequencies >500 Hz with 0 dB input attenuation (no

signal present at input) Option 100:

c-99

dBm for frequencies >500 Hz with 0 dB input attenuation

(SIGNAL INPUT 1 only).

Option 400:

c-95

dBm for frequencies >500 Hz with 0 dB input attenuation.

c-105

The spectrum analyzer is checked for residual responses across its frequency range with attenuation.

dBm for frequencies

no signal applied to the input and 0

50 Ohm Termination

Press (INSTR PRESET].

Connect CAL OUTPUT to SIGNAL INPUT 2.

IRECALL) @J

Press of -10.00 dbm

Press

QNSTR

Adjust AMPTD CAL for a MARKER amplitude

f0.02 dB.

PRESET).

Disconnect CAL OUTPUT from analyzer. Terminate SIGNAL

>2.5

kHz with 0 dB input attenuation.

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP

INPUT 2 with a 50 ohm coaxial termination.

input

11593A

Note

Key in control settings as follows:

(FREQUENCY). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ...50 MHz

CREFERENCE

(CENTER FREQUENCY) .

CF STEP SIZE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

km, (@EGG-) (ATTEN)

Press DISPLAY LINE

Reduce

LEVEL] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -60 dBm

.25

.45

MHz

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 kHz

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3 kHz

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0

[RESBW)

CENTER_)

[VlDEOBW),

and key in -105 dBm.

if necessary, for a margin of at least 4 dB between the noise trace and the display line (refer to Figure 2-24). Do not reduce either bandwidth to less than 300 Hz.

This test will require approximately 30 minutes to complete using the settings given in step 6. If the resolution bandwidth or video bandwidth are further reduced, a full band check of residual responses will take up to 15 hours to complete

MHz

Performance Tests 2-47

14. Residual Responses Test

Figure 2-24. Residual Responses Measurement

Press SWEEP

[SINGLE_)

and wait for completion of sweep. Look for any residual responses at or above the display line. If a residual is suspected, press SWEEP

CRINGLE)

again and see if the response persists. A residual will persist on repeated sweeps, but a noise peak will not. Any residual responses must be

c-105 dBm.

Option 400:

Any residual 500 Hz to 2.5 kHz must be

>2.5

kHz must be

If a response appears marginal, do the following to determine

10.

c-105

dBm

c-95 dBm;

any residuals

whether or not it exceeds the specification. a. Press

b. Press MARKER

ISAVE_) 0.

[NORMAL)

and place the marker on the peak of

the response in question.

c. Press MARKER

Ijj),

then activate SWEEP

d. Reduce [FREQUENCY SPAN] to 1 MHz or less. The amplitude of

the response should be

c-105

dBm (below the display line).

e. Press (RECALL] (iJ to resume the search for residuals. Step [CENTER FREQUENCY) to 1510 MHz with @) checking for

11. residual responses at each step by the procedure of steps 9 and

10. There should be no residual responses at or above the display

line below 1500 MHz.

2-46 Performance Tests

Maximum Residual Response

dBm

MHz

15. Spurious

Responses Test

15. Spurious Responses Test

Related Adjustment

Specification

Second Converter Adjustments

For total signal power of analyzer, all image and out-of-band mixing responses, harmonic and intermodulation distortion products are >75 dB below the total signal power for input signals 10 Mhz to 1500 MHz; signal power for input signals 100 Hz to 10 MHz.

Second Harmonic Distortion

For a signal -30 dBm at the mixer and distortion is

Third Order Intermodulation Distortion

For two signals each -30 dB at the mixer, third-order intermodulation products are:

>70 dB

c-40

dBm at the input mixer of the

>70 dB

210

MHz, second harmonic

down; 60 dB down for signals

below the total

~10

MHz.

Description

Harmonic distortion (second and third) is tested using a signal source and a low-pass filter. The LPF insures that the harmonics measured are generated by the spectrum analyzer and not by the signal source.

Spurious responses due to image frequencies, out-of-band mixing, and intermodulation distortion are measured by applying signals from two separate sources to the spectrum analyzer input.

Performance Tests

2-49

15. Spurious Responses Test

SPECTRUM ANALYZER

Note

Equipment

SYNTHESIZED

SMEEPEA

10 DB

ATTENUATOR

300 MHZ

LPF

Figure 2-25. Harmonic Distortion Test Setup

Equipment listed is for two test setups, Figure 2-25 and Figure 2-26.

Synthesized Sweeper ........................

Frequency Synthesizer ...................... HP

10 dB Attenuator (2 required) ..............

Lowpass Filter (300 MHz) ...................

Adapter, Type N (m) to BNC (f) (2 required)

Adapter, Type N (m) to SMA (f) .............

Adapter, Type N (f) to BNC (m) .............

Adapter, Type N (f) to BNC (f) ..............

Directional Bridge ........................... ........... HP

Lowpass Filter (50 MHz) (2 required) .......

...........

8340A

3335A

ii< 84&A

.......

........

Opt 010

HP 0955-0455

HP 1250-0780

....... HP 1250-1250

.......

HP 1250-0077

....... HP 1250-1474

8721A

.......

HP 0955-0306

2-50

Performance Tests

Procedure

Harmonic Distortion

1. Connect equipment as shown in Figure 2-25.

2. On the spectrum analyzer, press [INSTR PRESET). Set the controls of the spectrum analyzer as follows:

CENTER FREQUENCY FREQUENCY SPAN

REFERENCE LEVEL-...................

.................

....................

..............

................

.............

3. On the synthesized sweeper, key in ~NSTR PRESET],

(POWER LEVEL) -10 dBm.

4. On the spectrum analyzer, key in DISPLAY LINE

Icw)

CENTER]

280 MHz

20 dBm

280 MHz,

-90

dBm, MARKER [PEAK SEARCH] to position a marker on the peak of

the displayed 280 MHz signal.

5. On the synthesized sweeper, press

~POWER

LEVEL] and use the

ENTRY knob to adjust the amplitude of the displayed 280 MHz

kHz

15. Spurious Responses Test

signal for a marker indication of -20.00 dBm (-30.0 dBm at the input mixer with 10 dBm of input attenuation).

On the spectrum analyzer, key in MARKER

CCENTER

FREQUENCY) 560 MHz, MARKER

CPEAK

SEARCH) to position

a second marker on the peak of the second harmonic distortion product of the 280 MHz input signal. The response should be below the display line

Second Harmonic

7. On the synthesized sweeper, key in the amplitude of the 280 MHz signal by 10

8. On the spectrum analyzer, key in MARKER

CCENTER

FREQUENCY) 280 MHz, [REFERENCE LEVEL) -30 dBm,

DISPLAY LINE [ENTER] -105 dBm, MARKER

(>70 dB

below the input signal level).

dBm

~POWER

LEVEL)

ato

decrease

dB.

loFF),

CPEAK

SEARCH) to

position a marker on the peak of the displayed 280 MHz signal.

9. On the synthesized sweeper, press [POWER LEVEL] and use the

ENTRY knob to adjust the amplitude of the displayed 280 MHz signal for a marker indication of -30.00 dBm (-40.0 dBm at the input mixer with 10 dBm of input attenuation).

10. On the spectrum analyzer, key in MARKER

[CENTER FREQUENCY) 840 MHz, MARKER [PEAK SEARCH) to position

a],

a second marker on the peak of the third harmonic distortion product of the 280 MHz input signal. The response should be

below the display line (>75 dB below the input signal level).

Third Harmonic

dBm

Performance Tests 2-51

15. Spurious Responses Test

Intermodulation

Distortion

SPECTRUM ANALYZER

ATTENUATOR

DIRECTIONAL

50 MHz LON

PASS

FILTER

Figure 2-26. Intermodulation Distortion

Test

ATTENUATOR

Setup

11. Connect equipment as shown in Figure 2-26.

12. Set the controls of the spectrum analyzer as follows:

CENTER FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . . . 29.5 MHz

FREQUENCY SPAN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 MHz

REFERENCE LEVEL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -20

DISPLAY LINE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . OFF

13. On the synthesized sweeper, key in

[cw

30 MHz, [POWER LEVEL],

-4 dBm and use the ENTRY knob to position the peak of the displayed 30 MHz signal at the top CRT graticule line.

14. On the frequency synthesizer, key in

(AMPLITUDE)

-4

dBm.

Readjust the signal amplitude as necessary

[FREQUENCY) 29 MHz,

to position the peak of the displayed 29 MHz signal at the top CRT

graticule line.

dBm

2-52 Performance Tests

15.

Set the controls of the spectrum analyzer as follows:

CENTER FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 MHz

FREQUENCY SPAN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 Hz

16.

On the spectrum analyzer, key in DISPLAY LINE (ENTER) -100

dBm, MARKER [PEAK SEARCH) to position a marker on the peak of

the displayed 29 MHz signal. On the frequency synthesizer, adjust the signal amplitude for a

17. marker indication of -20.00

On the spectrum analyzer, key in [CENTER FREQUENCY) 30 MHz,

18. MARKER

[PEAK SEARCH) to position a marker on the peak of the

dBm.

displayed 30 MHz signal. On the synthesized sweeper, adjust the signal power level for a

19. marker indication of -20.00

dBm.

15. Spurious Responses Test

Note

-0

-10

-20

z E

i.i

-30

If unable to locate intermodulation distortion products, temporarily

increase output power level of frequency synthesizer and synthesized

sweeper by + 10 signal sources to the previous settings before making distortion measurements.

20. On the spectrum analyzer, key in MARKER

[CENTER FREQUENCY) 31 MHz, MARKER [PEAK SEARCH) to position

a marker at the peak of the 31 MHz third-order intermodulation product. The response should be below the display line below the input signals).

TO1

Distortion (1 MHz separation @ 30 MHz)

21. On the spectrum analyzer, key in [CENTER FREQUENCY) 28 MHz,

MARKER [PEAK SEARCH] to position a marker at the peak of the 28 MHz third-order intermodulation product. The response should be below the display line

TO1

Distortion (1 MHz separation @ 30 MHz)

dB.

Return the output power level of both

[n),

dBm

(>80 dB

dBm

below the input signals).

SECOND

HARMONICS FROM SIGNAL

(GO dB

3 -40

-50

-60

-70

f2 - fl

SECOND

ORDER

GENERAToRS

THIRD

ORDER

Figure 2-27. Intermodulation Distortion Products

22. On the frequency synthesizer, key in [FREQUENCY) 29.99 MHz.

23. On the spectrum analyzer, key in MARKER

CCENTER

MARKER (PEAK SEARCH).

FREQUENCY) 29.99 MHz, DISPLAY LINE

IOFF),

211

SECOND

ORDER

[ENTER]

-90

2f2

dBm,

Performance Tests 2-53

15. Spurious Responses Test

24. On the frequency synthesizer, readjust the signal amplitude as necessary to position the peak of the displayed 29.99 MHz signal

at the top CRT graticule line.

25. On the spectrum analyzer, key in MARKER

(CENTER FREQUENCY) 30.01 MHz, MARKER (PEAK SEARCH) to

position a second marker at the peak of the 30.01 MHz third-order intermodulation product. The response should be below the

display line

TO1

(>70 dB

below the input signals).

Distortion (10 kHz separation @ 30 MHz)

dBm

26. On the spectrum analyzer, key in [CENTER FREQUENCY) 29.98 MHz, MARKER

[PEAK SEARCH) to position a second marker at the peak

of the 29.98 MHz third-order intermodulation product. The

response should be below

the display line

(>70 dB

below the

input signals).

TO1

Distortion (10 kHz separation @ 30 MHz)

dBm

27. On the synthesized sweeper, press (POWER LEVEL] and decrease

the amplitude of the 30 MHz signal by 13.0 dB from the current

setting.

28. On the frequency synthesizer, key in

(AMPLITUDE] and then decrease the amplitude of the 29 MHz signal

by 13.0

from the current setting.

[FREQUENCY] 29 MHz,

29. Set the controls of the spectrum analyzer as follows:

CENTER FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 MHz

FREQUENCY SPAN . . . . . . . . . . . . . . . . . . . . . . . . .

,500

REFERENCE LEVEL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -33 dBm

MARKER . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . OFF

30. On the spectrum analyzer, key in DISPLAY LINE

dBm, MARKER

CPEAK

SEARCH) to position a marker on the peak of

[ml

-105

the displayed 29 MHz signal.

31. On the frequency synthesizer, adjust the signal amplitude for a marker indication of -33.0

32. On the spectrum analyzer, key in

dBm.

CCENTER

FREQUENCY) 30 MHz,

MARKER [PEAK SEARCH) to position a marker on the peak of the displayed 30 MHz signal.

33. On the synthesized sweeper, adjust the signal power level for a marker indication of -33.0

dBm (total signal power of -40 dBm

at the input mixer with 10 dB of input attenuation).

34. On the spectrum analyzer, key in MARKER

[CENTER FREQUENCY) 1 MHZ, MARKER [PEAK SEARCH] to position

a second marker at the peak of the 1 MHz second-order intermodulation distortion product. The response should be below the display line

SO1

Distortion (1 MHz separation @ 30 MHz)

(>75 dB

below the total input power).

dBm

2-54 Performance Tests

15. Spurious Responses Test

35. On the spectrum analyzer, key in [CENTER FREQUENCY] 59 MHz, MARKER [PEAK SEARCH) to position a second marker at the peak

of the 59 MHz second-order intermodulation distortion product.

The response should be below the display line (>75 dB below the

total input power).

SO1

Distortion (1 MHz separation @ 30 MHz)

dBm

Performance Tests 2-55

16. Residual FM

Test

Specification

Hz peak-to-peak in

bandwidth

530

Hz, video bandwidth

110

s; frequency span ~100 kHz, resolution

530

Hz.

Description

Equipment

Procedure

The spectrum analyzer CAL OUTPUT is used to supply a stable 20 MHz signal to the analyzer. The analyzer is tuned in zero span to a point on the 30 Hz bandwidth response for which the slope of the response is known from direct measurement. The residual FM is then slope detected over a 10 second interval, yielding a trace whose peak-to-peak excursion is proportional to the residual FM.

None Required

1. Press

(~N~TR

PRESET).

2. Connect CAL OUTPUT to SIGNAL INPUT 2.

3. Press (RECALL) 8 and adjust AMPTD CAL for a MARKER amplitude of -10.00 dBm

4. Press

CRECALL)

ho.02 dB.

9 and adjust FREQ ZERO for a maximum amplitude

trace.

5. Set

PREFERENCE

LEVEL) to -10 dBm. Adjust FREQ ZERO

counterclockwise until trace is at the center graticule line.

6. Set

~FREQUENCY

SPAN) to 100 Hz. Press SWEEP

CSINGLE)

and wait

for completion of the sweep.

7. Press MARKER

Cm),

and place marker 1 division above the center graticule line on the negative-going side of the trace. Press MARKER In] and set the movable marker 1 division below the center graticule line. See Figure 2-28.

2-56 Performance Tests

16. Residual FM Test

RF -I... L

Figure 2-28. Bandwidth Filter Slope Measurement

8. Compute the detection slope of the 30 Hz filter between the markers by dividing the MARKER A amplitude by the MARKER A frequency:

filter slope = MARKER A amplitude/MARKER Afrequency =

dB/Hz

9. Press SWEEP

10. Change necessary, to position the trace at the center graticule line. The

amplitude variations of the trace (see Figure 2-29) represent the analyzer residual FM.

[CONT),(mj

FREQUENCY

IOFF).

SPAN] to 0 Hz. Readjust FREQ ZERO, if

Performance Tests

2-57

16. Residual FM Test

Figure 2-29. Slope Detected Residual FM

11. Press SWEEP

CRINGLE)

and wait for completion of the sweep.

12. Press MARKER [PEAK SEARCH_). Press DISPLAY LINE position the display line at the lowest point on the trace.

(m’

and

2-58 Performance Tests

Figure 2-30. Peak-to-Peak Amplitude Measurement

16. Residual FM Test

13. Press MARKER

Ia]

and position movable marker at the lowest

point on the trace (see Figure 2-30). Read the MARKER A amplitude from the display and record its absolute value.

MARKER A amplitude = p-p amplitude =

14. Divide the peak-to-peak amplitude by the slope computed in step 8 to obtain the residual FM:

p-p amplitude/filter slope = residual FM

dB/

dB/Hz

= residual FM

The residual FM should be less than 3 Hz.

15. Press ~NSTR PRESET].

16. Press

Cm]

9 and adjust FREQ ZERO for a maximum amplitude

trace.

Performance Tests 2-59

17. Line-Related

Sidebands Tests

Specification

Description

Equipment

Procedure

95 dB

below the peak of a CW signal. Option

$00: >75 dB

below

the peak of a CW signal.

The spectrally pure calibrator signal of the spectrum analyzer is

applied to the analyzer input and the line related sidebands near the signal are measured.

None required

Press ~NSTR PRESET) on the analyzer. Connect CAL OUTPUT to SIGNAL INPUT 2.

Press

C-j

of -10.00 dBm

Press

(~NSTR

Key in the following analyzer settings:

[CENTER FREQUENCY)

[REFERENCE LEVEL] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -10 dBm

CFREQUENCY

Wait for completion of sweep, then press MARKER

[PEAK

SEARCH),(jj).

8 and adjust AMPTD CAL for a MARKER amplitude

f0.02 dB.

PRESET).

.20

MHZ

SPAN]

....................

600 Hz

Press (SHIFT)

(-1

SWEEP

@‘i7ZZ],

(j-/Iv

to initiate

video averaging of 10 sweeps. Wait for completion of sweeps.

Press MARKER

(PEAK

SEARCH],(~)

and position movable marker at

the peak of each line related sideband (120 Hz, 180 Hz, and 240 Hz

for 60 Hz line frequency; 100 Hz, 150 Hz, and 200 Hz for 50 Hz line frequency, etc.). The MARKER A amplitude for each sideband should be

120 Hz (100 Hz) 180 Hz (150 Hz)

240

c-85 dB

Hz (200 Hz)

(see Figure 2-31).

dB dB dB

2-60

Performance Tests

17. Line-Related Sidebands

Tests

Option 400

Figure 2-31. Line Related Sidebands

Press ~NSTR PRESET]. Connect CAL OUTPUT

Press

(ml

of -10. 00 dBm l

Press

ONSTR

Key in the following analyzer settings:

[CENTER FREQUENCY] PREFERENCE

(FREQUENCY SPAN]

Wait for completion of the sweep, then press MARKER

[PEAK

SEARCH],(-).

Press (SHIFT)

8 and adjust AMPTD CAL for a MARKER amplitude

tO.02 dB.

PRESET).

.....................................

LEVEL]

[VlDEo]

.......................................

SWEEP

(-1,

Measurement

to SIGNAL INPUT 2.

cm/Iv

to initiate

video averaging of 10 sweeps. Wait for completion of sweeps.

Press MARKER

SPEAK SEARCH],@

and position movable marker at

the peak of each line related sideband (400 Hz, 800 Hz, and 1200 Hz). The MARKER A amplitude for each sideband should be

dB.

400 Hz 800 Hz

dB dB

20 MHz

-10 dBm 3 kHz

c-75

1200 Hz

Performance Tests 2-61

18. Calibrator Amplitude Accuracy

Test

Related Adjustment

Specification

Description

20 MHz Reference Adjustments

-10 dBm

The output level of the calibrator signal is measured with a power meter.

f0.3 dB

SPECTRUW ANILYZER

Equipment

Procedure

2-62 Performance Tests

Figure 2-32. Calibrator Amplitude Accuracy

Power Meter Power Sensor Adapter, Type N (f) to BNC (m)

1. Connect equipment as shown in Figure 2-32.

2. Measure output level of the CAL OUTPUT signal. The value should be -10.0 dBm

.................................................

...............................................

........................

ho.3 dB.

dBm

Test

Setup

HP 1250-0077

HP 436A

8482A

19. Fast Sweep Time Accuracy Test

(430

ms)

19. Fast Sweep Time Accuracy Test

(~20

ms)

Related Adjustment

Specification

Description

None

&lo% for sweep times

5100

seconds

The triangular wave output of a function generator is used to modulate a 500 MHz signal which is applied to the spectrum analyzer SIGNAL INPUT. The signal is demodulated in the zero span mode to display the triangular waveform. Sweep time accuracy for sweep times

~20

ms is tested by checking the spacing of the signal peaks on

the displayed waveform.

SPECTRUM ANALYZER

SYNTHESIZED SWEEPER

Equipment

Procedure

Figure 2-33.

Function Generator Universal Counter Signal Generator

Fast

Sweep Time Accuracy

(~20

........................................HP

..........................................HP

...........................................

Test

Setup)

3312A

5316A

8340A

1. Connect equipment as shown in Figure 2-33.

2. Press

PRESET)

on spectrum analyzer.

QNSTR

3. Key in analyzer settings as follows:

~CENTER

(FREQUENCY SPAN)

FREQUENCY)

.....................................

........................................100

500

kHz

4. Set synthesized sweeper for an output frequency of 500 MHz and an output power level of -10

dBm.

Performance Tests 2-63

MHZ

19. Fast Sweep Time Accuracy Test

(~20

ms)

5. Press MARKER (PEAK

6. Set [FREQUENCY SPAN) to 0 Hz, MHz, and press TRIGGER

SEARCHJ@~EFZF),~.

(j-1

to 3 MHz,

Cm].

[VlDEoBW)

to 3

7. Set synthesized sweeper for an amplitude-modulated output.

8. Set function generator controls as follows:

FUNCTION .

AMPLITUDE . . . . . . . . . . . . . .

OFFSET

SYM . . . .

TRIGGER PHASE MODULATION

. . . . . . . . . . . . . . . . . . . . . . . . . . . . triangular wave

. .

approximately 1 Vp-p

...... CAL position (in)

. .CAL position (in)

. .

. all out

FREE RUN

9. Key in (SWEEP TIME] 5 ms and set function generator for a counter reading of 2.00

f0.02

kHz.

10. Adjust spectrum analyzer TRIGGER LEVEL to place a peak of the triangular waveform on the first graticule from the left edge of the CRT display as a reference. (Adjust function generator amplitude, if necessary, to provide a signal large enough to produce a stable display). The fifth peak from the reference should be within

~l~0.5

division of the sixth graticule from the left

edge of the display (see Figure 2-34).

11. Using sweep times and function generator frequencies in

Table

2-18, check sweep time accuracy for sweep times

~20

ms by

procedure of step 10.

2-64 Performance Tests

Figure 2-34. Fast Sweep Time Measurement

(~20

ms)

19. Fast Sweep Time Accuracy Test (~20 ms)

‘able

2-18. Fast Sweep Time Accuracy (~20 ms)

[SWEEP TIME] Function Generator Frequency Sweep Time Error

(divisions)

5 ms 2.00 2 ms 5.00

f0.02 f0.05

1 ms 10.0 fO.1

200

100

ps ,Ls

50.0 100

Iko.5

Performance Tests 2-65

20.

1st

LO Output

Amplitude Test

Specification

>+4

dBm from 2.0

GHz

to 3.7

GHz

Description

The power level at the first L.O. is swept over its 2.0

SPECTRUM ANALYZER

Figure 2-35.

1ST

LO OUTPUT connected is measured as the

1st

LO Output Amplitude Test Setup

GHz

to 3.1

GHz

range.

POWER METER

Equipment

Procedure

2-66 Performance Tests

Power Meter Power Sensor

1. Press (INSTR PRESET].

2. Set [SWEEP TIME) to 100 seconds.

3. Calibrate power meter and sensor. Connect equipment as Figure 2-35.

4. Observe the meter indication as the analyzer makes a complete sweep. The indication should be > + 4 dBm across the full sweep range.

5. Replace 50 ohm terminator on

.................................................

...............................................HP

dBm

1ST

LO OUTPUT.

shown in

436A

8482A

21. Frequency Reference Error Test

21. Frequency Reference Error

Test

Related Adjustment

Specification

Description

Note

Time Base Adjustment

Aging Rate

x 10eg/day and

from cold start at Temperature Stability

lo-’

0” to

frequency within 30 minutes.

The frequency of the spectrum analyzer time base oscillator is measured directly using a frequency counter locked to a frequency reference which has an aging rate less than one-tenth that of the time base specification. After a 30 day warmup period, a frequency measurement is made. The analyzer is left undisturbed for a period and a second reading is taken. The frequency change over this

24-hour

This test requires that the spectrum analyzer be turned on (not in STANDBY) for a period of 30 days to ensure that the frequency reference attains its aging rate. However, after aging rate is attained, the frequency reference typically attains aging rate again in 72 hours of operation after being off for a period not exceeding 24 hours.

period must be less than one part in

~2.5

10m7

year; attained after 30 days warmup

25°C.

5E9’C.

Frequency is within 1 x

10’.

lo-”

of final stabilized

24-hour

Care must be taken not to disturb the spectrum analyzer during the

24-hour

shock and vibration. The frequency reference should remain within its attained aging rate if the instrument is left on, the instrument orientation with respect to the earth’s magnetic field is maintained, and the instrument does not sustain any mechanical shock. Frequency changes due to orientation with respect to the earth’s magnetic field and altitude changes will usually be nullified when the instrument is returned to its original position. Frequency changes due to mechanical shock will usually appear as a fixed frequency error.

The frequency reference is also sensitive to temperature changes; for this reason the ambient temperature near the instrument at the first measurement time and the ambient temperature at the second measurement time should not differ by more than

Placing the spectrum analyzer in STANDBY mode turns the instrument off while continuing to provide power for the frequency reference oven, helping to minimize warmup time. However, the frequency reference must be on to attain its aging rate.

test interval, since the frequency reference is sensitive to

1°C.

Performance Tests 2-67

‘lhble

Performance

2-19.

Tkst

Record

Hewlett-Packard Company Model HP

8568B

Tested by Report No.

Serial No.

IF-Display Section RF Section

Date

Performance Tests 2-69

Tkst

1. Center Frequency Readout Accuracy Test

Step 8. Center Frequency Readout Error Test Record

Comb

Generator

Comb

Frequency

100 MC

EXT TRIG

(1, 2, 5, or 10 MHz)

trigger signal

Spectrum Analyzer

[FREQUENCY SPAN) [CENTER FREQUENCY)

100 MHz 100 MHz 500 100 MHz 1000

10 MHz 10 MHz 500 10 MHz 1000 10 MHz 1500

1 MHz 1000

100

kHz

10 kHz

100

1000

498

998

99.8

499.8

999.8

1499.8

999.98

999.998

999.9998

Min

Center Readout

W-W

Measured

Max

102

502

1002

100.2

500.2

1000.2

1500.2

1000.02

1000.002

1000.0002

2-70

Performance Tests

‘I&t 2. Frequency

Span Accuracy Test

Test 2. Frequency Span Accuracy Test

Steps 7, 9, and 11. Wide Span Error

Spectrum

kequency

Span

200

100kHz

100.1

IMHz

1.01 MHz

20.1

1.5

kHz

MHz MHz

GHz

Analyzer

Center

Frequency

100

MHz

100

MHz

100

MHz

100

MHz

100

MHz

100

MHz

100

MHz

900

MHz

Synthesized Sweeper

Freq. A

Cf-.45

span

99.999 910 MHz

99.955 000 MHz

99.954955 MHz 100.045045

99.550

OOOMHz

99.550 550 MHz

91.000000 MHz

90.955 000 MHz

225

MHz

Freq Span Span Error

Freq. B

cf +

.45

span

100.000 090

100.045 000

100.450 000

100.450 500

109.000000

109.045.000

1575

ADUT- ASyn

from

200

100

kHz

100.1 kHz 1 MHz

1.01 MHz

MHz

20.1 MHz

1.5

GHz

A Synth

P-4

MHz MHz MHz MHz MHz

MHz

MHz MHz

180 Hz

90.000 Hz

90.090kHz

900.000kHz

909.000kHz

18.000 MHz

18.090MHz 1350MHz

Step 12. Span Error

‘able

2-3

-34,500.OOO

DUT Measured

Freq. C

Min

-10

-5000

-5,005

-50,000

-23,230

-460,000

-462,300 Hz

Freq. D

A DUT

(D-C)

Spec.

Max

Hz 10 Hz Hz Hz Hz Hz Hz Hz

34,500O.OOO

5000

5,005

50,000

23,230 460,000 462,300

Hz Hz Hz Hz

Note

The specification in Table 2-4 was derived using the following formula: For spans > 1 MHz, the For spans 5 1 MHz, the

spec spec

is:

>&[(.02)(A

is:

>&[(.05)(A

synth freq) + (.005)(span)] synth freq) + (.005)(span)]

Performance Tests 2-71

Test 3. Sweep Time Accuracy

Step 6. Sweep Time Accuracy, Sweep Times

220

[SWEEP TIME)

20 ms 50 ms

100 ms

500 ms

Min

18 45 90

450 900

Marker A Time

Measured

Max

ms 22 ms ms 55 ms ms 110 ms ms 550 ms ms 1.10

Step 12. Sweep Time Accuracy, Sweep Times

Step 19. Sweep Time Accuracy, Sweep Times

ms (Alternate Procedure)

[SWEEP TIME)

20 ms 50 ms

100 ms

500 ms

100

150

Min

18.0 ms

45.0 ms

90.0 ms 450 ms

900 ms

9.00 s

45.0 s

90.0

20.0

Sweet

s s

Gen Readout

Measured

220

2-72 Performance Tests

‘I&t 4. Resolution

Bandwidth Accuracy

Test 4. Resolution Bandwidth Accuracy

Step 8. Bandwidth Accuracy

[REW-

3MHz 1MHz

300kHz

100kHz

30kHz 10kHz

300Hz

100Hz

3kHz

1kHz

30Hz

10Hz

[FREQUENCY SPAN)

5MHz

2 MHz

500kHz

200kHz

50kHz 20kHz

5kHz

2 kHz

500 Hz

200Hz

100Hz 100Hz

MARKER A Readout of 3

Min

2.400 MHz

900kHz

270.0 kHz

90.0 kHz

27.00 kHz

9.00 kHz

2.700 kHz

800Hz 240Hz

80Hz 24Hz

8Hz

Measured

(

Bandwidth

3.600 MHz

1.100 MHz

330.0 kHz

110.0 kHz

33.00 kHz

11.00 kHz

3.300 kHz

1.200 kHz

Max

360Hz

120Hz

36 Hz

12 Hz

Performance Tests 2-73

Test 5. Resolution

Bandwidth Selectivity

Steps 7, 8 and 9. Resolution Bandwidth Selectivity

Spectrum

RES]

(

3 MHz

300

100

30 kHz

300 Hz

100 Hz

[FREQUHKYWANJ

20 MHz

1MHz 15MHz

kHz

500

kHz

200

3 kHz 50 kHz

1 kHz

30 Hz 500 Hz

10 Hz 100 Hz

5 MHz 2 MHz

kHz kHz

kHz

5 kHz 2 kHz

Analyl

(VIDEOBW]

100 Hz

300 Hz

AUTO AUTO

AUTO

AUTO AUTO AUTO AUTO AUTO AUTO AUTO

Bandwidth

Measured

Measured Bandwidth Maximum

Bandwidth (60 dB BW

60 dB points separated by

Selectivity Selectivity Ratio

3 dB BW)

I I

cl00

15:l

15: 1

15:l

13: 1

13:l 13:l 11:l 11:l

2-74 Performance Tests

lkst

6. Resolution Bandwidth Switching Uncertainty Test

Test 6. Resolution Bandwidth Switching Uncertainty Test

Step 6. Bandwidth Switching Uncertainty

1 MHz

300

100

10 kHz

300

100 Hz

10 Hz

‘FREQUENCY SPAN]

MHz

kHz kHz kHz

kHz kHz

5 5

5 500 500

50 50

10 kHz

1 1

200

100 Hz

MHz MHz

MHz

kHz kHz kHz kHz

kHz kHz

Deviation

(MKR

Readout,

0 (ref)

dB)

Allowable Deviation

(ref)

AZ1.00

Iko.50 zto.50 Ito. dzo.50

kO.50 f0.50 f0.50 f0.50 1tO.80 f2.00

Performance Tests 2-75

Test 7. Input Attenuator Switching Uncertainty Test

Step 7. Input Attenuator Switching Uncertainty

10 20 30

50 60

(REFERENCE LEVEL]

-50

-40

-30

-20

-10 0

+lO

Frequency

Synthesizer

Amplitude

Wm)

-52

-42

-32

-22

-12

-2 8

Deviation

(MARKER A

Amplitude

0 (ref)

Corrected Allowable Deviation Deviation

0 (ref)

0-W

ztl dB *l dB ztl dB kl dB fl dB kl dB

2-76 Performance Tests

Test

8. Frequency

Respons

kep

SIGNAL INPUT 2

(20 MHz to 1.5

SIGNAL INPUT 1

(20 MHz to 1.5

SIGNAL INPUT 1

(20 MHz to 500 MHz)

SIGNAL INPUT 1

(100 kHz to 20 MHz)

SIGNAL INPUT 1

(100

SIGNAL INPUT 2

(100 kHz to 20 MHz)

kHz)

Signal Input

GHz)

Test 8. Frequency Response Test

Min Measured

Max

SIGNAL INPUT 1

(1 kHz to 100

SIGNAL INPUT 1

1000 Hz 900 Hz 800 Hz 700 Hz 600 Hz 500 Hz 400 Hz 300 Hz 200 Hz

100 Hz

SIGNAL INPUT 1 (deviation in

100 Hz to 500 MHz (steps 16, 25, 42, or 48) (overall max - overall min)

SIGNAL INPUT 2 (deviation in

100 kHz to 1.5 (overall max - overall min)

kHz)

GHz

dB)

(steps 12 or 31)

SIGNAL INPUT 1 (deviation in

100 Hz to 1.5 (overall max - overall min)

GHz

dB)

(steps 15, 16, 25, 42, or

48) <3 dB

Performance Tests 2-77

Test 9. RF Gain Uncertainty Test

Step 6. 2nd LO Shift

Min

-1.0

Measured

Max

+ 1.0

2-78 Performance Tests

Agilent 8568B Performance Tests and Adjustments Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Certification

Warranty

Assistance

Safety Symbols

General Safety Considerations

General Information

Introduction

Operation Verification

Introduction

Calibration Cycle

Performance Tests

Equipment Required

Test Record

Related Adjustments

Specification

Description

Equipment

Related Adjustments

Specification

Description

Equipment

Procedure

3. Sweep Time Accuracy Test (220 ms)

Equipment

Procedure

Sweep Times 220 ms

4. Resolution Bandwidth Accuracy Test

Related Adjustment

Specification

Description

Equipment

Procedure

6. Resolution Bandwidth Switching Uncertainty Test

Related Adjustments

Specification

Description

Equipment

Procedure

Related Adjustment

Specification

Description

Equipment

Procedure

Related Adjustments

Specification

Description

Equipment

10 dB Gain Steps

2 dB Gain Steps

0.1 dB Gain Steps

Related Adjustment

Specification

Description

Equipment

Procedure

Linear Fidelity

13. Average Noise Level Test

Specification

Description

Equipment

Procedure

Specification

Description

Equipment

Procedure

15. Spurious Responses Test

Related Adjustment

Specification

Description

Equipment

Procedure

Specification

Description

Equipment

Procedure

Specification