Agilent 8510B User Manual

Notice

Hewlett-Packard to Agilent Technologies Transition

This documentation supports a product that previously shipped under the HewlettPackard company brand name. The brand name has now been changed to Agilent Technologies. The two products are functionally identical, only our name has changed. The document still includes references to Hewlett-Packard products, some of which have been transitioned to Agilent Technologies.

Printed in USA March 2000

User's Guide

HP 8510 Pulsed-RF Network Analyzer

ABCDE

08510{90505

No.

Part

HP

Printed

in

USA

March

1995

Notice

The information contained in this document is sub ject to change without notice.

Hewlett-Packard makes no warrantyofany kind with regard to this material, including,

but not limited to, the implied warranties of merchantability and tness for a particular

purpose. Hewlett-Packard shall not b e liable for errors contained herein or for incidental or

consequential damages in connection with the furnishing, performance, or use of this material.

Restricted Rights Legend.

Use, duplication, or disclosure by the U.S. Government is sub ject to restrictions as set forth

in subparagraph (c) (1) (ii) of the Rights in Technical Data and Computer Software clause

at DFARS 252.227-7013 for DOD agencies, and subparagraphs (c) (1) and (c) (2) of the

Commercial Computer Software Restricted Rights clause at FAR 52.227-19 for other agencies.

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CERTIFICATION

Hewlett-Packard Company certies that this product met its publishedspecications at the

time of shipment from the factory. Hew lett-Packard further certies that its calibration

measurements aretraceable to the United States National Institue of Standards and Technology

(NIST, formerly NBS), to the extent al lowed by the institute's calibration facility, and to the

calibration facilities of other International Standards Organization members.

WARRANTY

This Hewlett-Packard instrument product is warranted against defects in material and

workmanship for a p eriod of one year from date of delivery. During the warranty p eriod,

Hewlett-Packard Company will, at its option, either repair or replace pro ducts whichproveto

be defective.

For warranty service or repair, this product must be returned to a service facilit y designated

byHP.Buyer shall prepay shipping charges to HP and HP shall payshippingcharges to

return the product to Buyer. However, Buyer shall pay all shipping charges, duties, and taxes

for products returned to HP from another country.

HP warrants that its software and rmware designated by HP for use with an instrument

will

es

do

unin

execute

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that the

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FITNESS

AND

THE REMEDIES PROVIDED HEREIN ARE BUYER'S SOLE AND EXCLUSIVE

REMEDIES. HP SHALL NOT BE LIABLE FOR ANY DIRECT, INDIRECT, SPECIAL,

INCIDENTAL, OR CONSEQUENTIAL DAMAGES, WHETHER BASED ON CONTRACT,

TORT, OR ANY OTHER LEGAL THEORY.

ANCE

customer

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ASSIST

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iii

Introduction

This documentisintended for use with the HP 8510B/C Option 008 Network Analyzer

and is a supplement to the HP 8510B/C Operating and Programming manual. It contains

descriptions of the pulsed-RF network analyzer system features for measurements in the

frequency domain and in the pulse prole domain. With resp ect to the standard, swept CW

system, operation of the pulsed-RF system is identical except that the measurement is made

at a specic, known time during each pulse. For information ab out network analysis, please

refer to HP Pro duct Note 8510-10, HP 8510B Introductory User's Guide, for an intro duction

to using the front panel for measurement setup, measurement calibration, and basic network

measurements.

Organization

section

This

ts

ten

con

System

duces

tro

In

Principles

of

list

A

con

h

eac

of

Description

HP 8510B/C

the

Pulsed-RF

of

terms

the

of

tains

hapter.

c

and

This

a

Document

hapters

c

the

of

list

Option

Netw

008

ork

denitions used

cumen

do

this

in

Pulsed-RF

measuremen

Measurements

in pulsed-RF

netw

description

brief

a

and

t

capabilit

t

ork measuremen

y

ts.

the

of

.

Pulse Measurements Overview

A description of how the network analyzer measures pulsed-RF S-parameters versus frequency

and versus time.

Operating

Describes the setup, measuremen

the

t calibration, and measuremen

Pulsed-RF

for

8510

HP

system and making pulsed-RF measuremen

Measurements

t process for setting up the

ts.

Introduction

1-1

Frequency Domain Point-in-Pulse Measurements

This chapter contains measurement calibration and measurement procedures to display the

pulsed-RF S-parameters versus frequency.

Pulse Profile Domain Measurements

This chapter contains measurement calibration and measurement procedures to display the

pulsed-RF S-parameters versus time.

General Timing Information

Descriptions of the internal timing to show the system's internal pulse repetition p eriod and

duty cycle capabilities.

Using External Triggering and Pulse Modulation

This section contains information to help you determine if your application requires external

tain

t.

accuracy

mo

pulse

P

High

Discusses

making

when

dulating

er

w

o

the

equipmen

t,

Measurements

considerations

ecial

sp

at

measuremen

ts

instructions

and

high

required

o

p

RF

wer

for

protect

to

lev

connecting

the

els.

the

test

external

system

equipmen

main

and

Reference

option

all

ws

Sho

Data

008

men

structures

u

and

denitions,

ey

k

including

programming

co

des.

1-2

Introduction

Figure

1-1.

HP

8510

Pulsed-RF

Netw

ork

Analyzer

System

Introduction

1-3

System Description

This chapter contains the following information.

A description of the HP 8510 Pulsed-RF Network Analyzer System.

A simplied block diagram of the HP 8510 Pulsed-RF Network Analyzer System.

A signal ow diagram of the HP 85110-series S-parameter Test Set.

Who Should Make Pulsed-RF Measurements?

Pulsed-RF stim

the

y

destro

could

tested

e

b

ust

m

8510 pulsed-RF

HP

The

optimized

pulsed-RF

circuits

a

at

to

in

devices

rm

resp

vides

pro

precisely

ma

o

tw

whic

kno

jor

h

ulus ma

device,

using

are

w

onses.

precise

wn,

areas:

accept

y

PRF

a

netw

feature

or

F

sync

eatable

rep

tests

CW

a

required

e

b

as

h

suc

and

ork

to

set

rst

the

hronization

whic

in

input

in

when

duty

analyzer

e

mak

time,

during

time

the

h

and

where

cases

testing

cycle that

conguration

error-corrected

fully

com

the

with

the pulse.

ulus

stim

duce

pro

con

ccurs

o

accurately

bination

pulse, allo

signal

pulsed

a

tin

prior

adds

This

to

output.

application

uous

pack

to

represen

ecialized

sp

S-parameter

wideband

of

wing

extends

device

the

aging, or

ts

S-parameters

of

where the

nal

its

hardw

measuremen

and

IF

HP

the

pulsed,

is

8510

2

signal

test

the

device

application.

an

and

are

of

ts

accurate timing

measured

e

b

to

applications

of

tests

and

same

the

high p

mo

in

ow

Calibration

de.

pulsed-RF

er,

data

is

8510

HP

The

vironmen

en

measuremen

pulsed-RF

our

y

as

t

ou

y

t,

net

measuremen

calibrate

can

w

ork

analyzer

or

F

t.

in the

system

example,

same high

allo

if

po

ws

ou are

y

wer,

calibrate

to

ou

y

making a

pulsed-RF

taken only while the pulse is on. This type of calibration mayprevent damage to calibration

standards that would be damaged in high power, CW calibrations.

The recommended conguration of the HP 85108 Pulsed-RF Network Analyzer consists of the

following items.

HP

rm

8510B/C

revision

are

w

net

work

B.05.11

analyzer

greater

or

equipp

ed

(for

Option

with

HP 8510B),

the

008,

or

Wideband

revision

IF,

C.06.54

or

greater

(for

8510

HP

and

HP 8510C).

HP 83622 syn

HP 83624

synthesized sweeper with options 003, 004, and 008.

thesized sw

eeper with options 001, 003, 004, and

HP 85110-series pulsed-RF fundamen

tally mixed S-parameter test set

008.

Also, other external equipmentsuchaspower ampliers, bias supplies and pulse generators

system.

ma

e

b

y

included in

the

System

Description

2-1

The pulsed-RF network analyzer system allows you to select either the normal precision 10

kHz IF bandwidth or the new wideband 3 MHz IF bandwidth. The wide IF and detection

bandwidth allows testing using pulses as short as 1 microsecond but with accuracy comparable

to traditional non-pulsed measurements.

These system components may be rack-mounted or arranged on a desktop.

Theory of Operation

A simplied block diagram of the system is shown in Figure 2-1. One synthesizer provides

the test signal stimulus to the RF input of the test set and the other provides the LO signal

to the four frequency converters (only two are shown). The LO source is always tuned 20

MHz above the test signal source. The standard internal phaselocktechnique is not used;

instead, a common 10 MHz frequency reference is used for both of these sources and the

internal sample selection and timing logic in the HP 8510. These sources are considered to be

coherent, thus generating the correct 20 MHz rst IF and the correct clock frequency for the

reference and test synchronous detectors. This eliminates the need to use the reference signal

for receiver phaselock and allows all reference and test signals to b e pulsed, therebymaking

fully error-corrected 2-port, pulsed-RF S-parameter measurements possible.

Figure 2-1. Simplified Pulsed-RF Network Analyzer Block Diagram

detectors

exible

y the HP 8510

and

in

accurate

Using

erate

op

wider

a

at

bandwidth

MHz,

20

of device response during the

oth the

b

reference

measuremen

and

sample

t

timing

circuits

sync

IF,

test

the

pulse. With the sources and test set con

hronous

allow

trolled b

over the 8510 system bus, and with all necessary pulse generation and measuremen

signals generated in

ternally from a common

pulsed-RF stimulus/response test system. One pulse of a

each data poin

t and the measuremen

t is sync

10 MHz reference, the HP 85108 is a complete

user-specied width is measured at

hronized so that it is made at a certain kno

that

analysis

t timing

wn

time in the pulse. The stimulus duty cycle can be predicted for a given instrument state,

but the actual pulse rep etition p eriod depends upon the current domain, cal type, averaging,

y

dut

to

eep

sw

cycle,

2-2

time,

refer

System

pulse

and

to General

Description

width

Timing

selections.

Information.

this reason,

or

F

sensitiv

device

our

y

if

is

e

Either the internal logic, the TTL Trigger Input, or the HP-IB Group Execute Trigger from

an external controller can initiate a measurement cycle. When control of the pulse rep etition

period and duty cycle is required, the HP 8510 can use the trigger input to synchronize with

the internal or an external pulse mo dulator. The HP 8510 Stop Sweep output can be used as

a gating signal to tell when the analyzer is ready for the next measurement. The measurement

is made with 100 nanosecond resolution and about 200 picosecond uncertainty with respect to

the internally- or externally-generated measurement trigger.

Test Set Signal Flow

Figure 2-2 shows a detailed diagram of the HP 85110-series test set signal separation, signal

routing, and frequency conversion. This is a fundamentally mixed test set, providing four 20

MHz outputs to the network analyzer. Placement of a 0 to 90 db (10 dB/step) attenuator

before each mixer provides control of the signal levels into the mixers while allowing operation

at high PORT 1 and PORT 2 signal levels necessary in many pulsed-RF applications.

The test set has rear panel access links to allow integration of additional test and signal

conditioning equipment in the low-loss main signal paths to the test p orts. If your device

exhibits more than about 20 dB of gain, or higher p ort signal levels are required, refer to the

chapter.

include

test

IF

and

ts

mixing

set.

detectors.

and

detectors.

the HP

IF

This

and

sets

test

8514, 8515,

85110

HP

There

HP

The

erform

p

designed to

are

and

fundamen

applications

are

85104

pulse

the

work

coaxial

8516

mixing

tal

millimeter

measuremen

with the

whic

in

test sets

sets;

test

the

h

can

functions

t

normal 10

and

is

set

HP

e

b

describ

HP

the

designed

can

85110

congured

ed

kHz

to

IF

85104

w

e

b

to

here.

ork

w

o

P

High

Hewlett-P

detectors.

and

millimeter

the

with

used

with

erate

op

Measuremen

er

ard

k

ac

These

eguide

v

a

w

wideband

normal

the wideband

harmonic

IF

All

Test

four

coaxial

HP

Sets,

coaxial

so

a

test

sets

test

system

sets

can

and

can b

a

equipp

e

b

equipp

ed

millimeter-w

ed

for

a

v

to

a

e

include

wide

set.

test

Option

range

001,

applications

of

IF

Switc

hing

including

y

b

for

Multiple

to

up

System

Description

2-3

Figure

2-2.

HP

85110A

arameter

S-P

T

est

Signal Flo

Set

w

2-4

System

Description

3

Principles of Pulsed-RF Network Measurements

This chapter contains a list of terms used to describe the pulsed-RF stimulus and response.

Figure 3-1 shows a typical envelope of the pulsed-RF waveform output by the RF signal

source. For internal measurement triggering, the RF frequency and the ON time of the pulse

is controlled by the HP 8510 so that there is one pulse per measurement.

Pulse Repetition Period, PRP

The time from the 50 percentpoint on the rising edge of one pulse to the 50 percentpointon

pulse.

of

edge

rising

the

eration

ternal

in

or

F

ypically

T

and

time

for

width

the

is

The

the

frequency

ab

pulse.

up

pulse

In

PRP

making the

millisecond

calibration

PRP

the

If

triggering

is

there

measuremen

the

time

measuremen

30

out

maxim

during

e,

yp

t

con

is

op

pulse

one

tis

til

un

cycle

y

dut

domain,

when

milliseconds. In

PRP

um

of

part

width,

pulse

trolled

externally

the analyzer with the pulse.

Pulse

Repetition

Frequency,

the

measuremen

er

p

made at

pulse

and

t

limit.

the

out

ab

measuremen

the

dut

system

some

consists

second,

analyzer

Pulse

the

milliseconds.

3

y cycle,

HP

the

,

PRF

PRP

The

t.

user-sp

rst

necessary

if

tuned

is

Prole

Other

t.

and pulse

external trigger

8510

=

PRP

up

ends

dep

time

aiting

w

the

a

time

eraging,

v

turned ON

whic

pulse is

ecied

the

of

,

to

domain,

With

factors

prole domain

1

the

on

relativ

required

satisfy

to

frequency,

frequency

the

aect

h

stop time.

input is

instrumen

user-sp

a

for

the

to

e

the

for

user-sp

the

es

do

can

PRP

system

the

used to

t state.

ecied

of

start

analyzer

ecied

maxim

hange,

c

not

ab

e

b

PRP

sync

the

set

to

um

1

out

are

hronize

Principles

Pulsed-RF

of

Netw

Measurements

ork

3-1

Duty Cycle

The ratio of the time that the pulse is ON to the total Pulse Repetition Period. If the pulse

ON and OFF times are equal, the Duty Cycle is 50 percent.

For internal operation, the maximum duty cycle percent limit can be specied, but the actual

duty cycle may be less, depending upon the user-specifed pulse width and the time it takes for

the analyzer to set up for the next measurement.

Pulse Width

The ON time from the 50 p ercent p oint on the rising edge to the 50 p ercentpointon the

falling edge.

The internally-generated Pulse Width can be set from less than 100 nanoseconds to 40.88

milliseconds.

Time

Rise/F

all

time

es

for

time:

the

pulse

to

rise

from

the

10

The

tr

The

=

pulse

time

transition

rise

tak

it

condition.

time

fall

pulse

=

tf

90

the

from

fall

to

pulse

the

for

es

tak

it

time

The

condition.

The

normal

IF

resp

onds

rise/fall

to

times

out 75

ab

of

to rise/fall times of about 300 nanoseconds.

y

Trigger

time

The

In the F

Dela

the

that

ON

pulse

after

requency domain, the T

measuremen

rigger Dela

t

y can b e set from do

(internal) or +3 resolution perio ds (external) and

Prole domain the trigger dela

width,

and number of p oin

y is automatic depending upon the displa

ts.

ON

t

ercen

p

ON

t

ercen

p

microseconds; the

actually made.

is

condition

condition to

to

the 10

wideband IF

90 p

the

wn to -6 resolution p erio

up to 40.88 milliseconds. In the Pulse

y time span, pulse

ercen

p

ON

t

ON

t

responds

ds

3-2

Principles

Pulsed-RF

of

Netw

Measurements

ork

Pulse Profile Measurement Resolution Period

The time between adjacent Pulse Prole domain data p oints. The minimum is 100

nanoseconds. This is set by an algorithm depending upon the Pulse Prole stop time, pulse

width, and number of time points.

Figure

3-1.

Pulse

erms

T

Definitions

and

Principles

Pulsed-RF

of

Netw

Measurements

ork

3-3

4

Pulse Measurements Overview

This chapter contains information ab out how the HP 8510 pulsed-RF network analyzer system

measures pulsed-RF S-parameters versus frequency and versus time.

The pulsed-RF conguration allows use of vector network analysis techniques for twotypes of

measurements:

Pulsed-RF S-Parameters versus Frequency

. The measurementissynchronized with the

pulse so that the measurement result is the S-parameter at a sp ecic user-specied pointin

the pulse at each frequency of the sweep

Pulse Prole

. The system is tuned to a single frequency and the measurementis

synchronized with the pulse so that the measurement result is the S-parameter as a function

of time

during the

Pulsed-RF

with

the

p

of

oin

tests

pulse.

t

t-in-pulse"

t

the

Pulsed-RF

cess

pro

during

measuremen

domain

measuremen

onse

resp

external

or

F

the

is

trigger. F

trigger

pulse.

S-parameters

frequency domain

the

in

the

that

so

pulse

frequency

h

eac

t

A

certain

a

after

made

measuremen

ternal

or in

pulsed

the

mo

to

de,

eac

h

device

ersus

v

measuremen

the

,

dela

using

t

trigger

stim

oin

p

data

Frequency

accomplished

are

is

t

Figure

in

the

de,

at

the trace

are

ternal pulse

eac

the

sources

.

y

mo

ulus

tof

made

tuned,

4-1

data

h

same

sync

y

b

single,

a

at

the

an

ws

sho

output and

oin

p

terv

in

represents

hronizing

user-sp

is turned

RF

example

the

of

t

after

al

the resp

of this

the

trace

the

onse

measuremen

the

ecied

then

on,

\frequency

ternal

in

represen

pulse is

of

time

the

ts

turned on.

device

the

the pulsed stimulus after the falling edge of the externally-generated measurementtrigger.

t

to

Measurements

Pulse

Ov

erview

4-1

Figure 4-1. Pulsed-RF S-Parameters versus Frequency (Frequency Domain Point-in-Pulse)

erview

4-2

Pulse

Measurements

Ov

Pulse Profile Domain

Measurements in the Pulse Prole domain create a plot of the resp onse as a function of

time in synchronization with the internal or the external measurement trigger. A rep etitive

sampling technique is used, in which the data is reconstructed from samples taken from a

series of pulses. This allows display of the S-parameters versus time during the pulse. Figure

6 is an example of this pro cess showing a timing diagram using the internal pulse mo dulation

and internal measurement trigger. For each pulse, a single point in the pulse is measured. A

prole of the pulse is made by measuring the rst pulse at the user-specied Start time, then

increasing the measurement trigger delayby a certain time increment for each pulse until the

specied number of points is measured.

Time zero is the leading edge of the internally-generated pulse output waveform, or the falling

edge of the externally-generated measurement trigger waveform. The HP 8510 automatically

controls the time incrementbetween samples, called the measurement resolution perio d,

using an algorithm that depends up on the greater of the user-specied pulse width or stop

time. This automatic selection of the time resolution can be seen bychanging the number

of points and the time span. For narrow pulses and small time spans, the measurement

spans,

time

large

d

erio

resolution

can

it

rst

the

p

increase to

sample

can b

external triggering,

ds

erio

resolution

p

e

b

can

multiples

etak

external

the

time

after

as

en up

100

as

small

microseconds. With

of 10

resolution

to 6

trigger

sets

zero.

nanoseconds;

erio

p

zero

time

the

ds

for

prior

and

wide

ternal

in

the

pulses

to

rst

and

measuremen

zero.

time

sample

t

When

can

trigger,

using

tak

e

b

en

three

Measurements

Pulse

Ov

erview

4-3

Pulsed-RF

S-Parameters

Internal

Pulse

ersus

v

Output

Figure

Time

and

4-2.

(Pulse

Internal

Profile

Measurement

Domain)

Measurement

Trigger

4-4

Measurements

Pulse

Ov

erview

5

Operating the HP 8510 for Pulsed-RF Measurements

This chapter describes the setup, measurement calibration, and measurement process for

conguring the system and making frequency domain p oint-in-pulse measurements and

pulse prole domain measurements. These pro cedures use the internal pulse modulation and

internal measurement trigger capabilities of the HP 8510 Option 008. Familiarize yourself

with these capabilities before setting up measurements that use external triggering techniques.

For more detailed information on the standard features of the HP 8510, refer to the HP 8510

Operating and Programming manual.

System

Figure

Notice

the

5-1

that

reference

supplies,

dulators,

mo

equipmen

other

Connections

ws the

sho

the

can

ampliers

and a

cable connections

source

RF

the

e

b

connected

computer.

ma

that

t

LO

y

serv

b

as

es

source

the

to

erify

V

connected

e

the

or

test

these

for

the

10

to

recommended

the

MHz

8510.

HP

rear

set

basic

system.

the

frequency

y

Man

links, external

panel

connections

85108

HP

reference

for

applications

familiarize

and

pulse

the

will

pulse

conguration.

system,

although

also include

generators

ourself

y

with

bias

and

Operating

the

HP

8510

Pulsed-RF

for

Measurements

5-1

Figure

5-1.

System

Cable

Connections

5-2

Operating

the

HP

8510

Pulsed-RF

for

Measurements

Turn On System Power

Turn on rackpower, line power to the sources, test set, and other equipment, and then the HP

8510. Depending upon the contents of HP 8510 Instrument State 8 and the current HP 8510

Hardware State, the system may not be fully op erational immediately after initial power up.

Messages to the operator may appear on the screen and b eep sounds may be heard. If so, load

the pulse instrument state and hardware state as described below. The rmware revision will

be displayed on the screen. It should be B.05.11 or later for HP 8510B, and C.06.54 or later

for HP 8510C.

Load Pulse Hardware State and Instrument State Files

The pulsed-RF conguration les are supplied with the option 008 equipment. Use the

following pro cedure to load the hardware state le 8 and the instrument state all le 8 into

HP 8510 memory.

1. Load the conguration tap e/disk.

Press

4

TAPE/DISC

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

5

STORAGE IS TAPE/DISC

.

Load pulse

2.

Press

M

The

the

that

Load

3.

Press

4.

After

Recalling

the

If

shows

This

HP 8510 rear panel PULSE OUTPUT connector is activated. Select the wideband IF by

pressing the following keys.

5.

Press

Note

hardware

N

LOAD

enhancemen

HP

pulsed-RF

N

LOAD

loading the

wideband IF

4

SYSTEM

N

MORE

8510

N

INST.

instrumen

that

5

,

Preset

state.

N

NNNNNNNNNNNNNN

N

HARDWARE

annotation

t

op

is

instrumen

N

NN

N

STATE

les,

t state

is selected,

wideband

the

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

PULSE CONFIG

alw

NN

N

erating

t

N

8

press

8sets

selects

ys

a

N

NN

STATE

should

the

in

state in

N

FILE

N

RECALL

a

W

IF

NN

N

FILE

m

to

N

.

8

N

NN

N

INST.

correct

the

annotation will

detectors

and

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

N

NN

N

DETECTOR:

N

NN

N

inst.

N

DETECTOR: WIDE BW

N

8

ear

app

ultiple

N

NN

N

NN

N

.

at

source

state

N

STATE 8

instrumen

are

N

NN

N

NORMAL

the

8.

N

left

mode.

N

NN

N

.

state

t

ear

app

selected

N

NN

N

BW

side

at

.

for

the

and

of

the

pulse

left

that

screen.

eration.

op

side

TTL

the

of

This

the

signal

screen.

sho

ws

at

the

If these les are not a

as described in the Creating Pulse Hardw

vailable, create

the correct hardw

Operating

are state le and instrumen

are and Instrumen

8510

HP

the

t States c

Pulsed-RF

for

hapter.

Measurements

t state le

5-3

Typical Response

After

Recall,

Inst.

Figure

State

5-2.

Frequency

8,

Detector:

,

WB,

Mult.

Srce.

On

5-4

Operating

the

HP

Figure 5-3. Domain, Pulse Profile,

8510

Pulsed-RF

for

Measurements

Marker

Operator's Check

After loading the pulse instrument state and hardware state les, then recalling instrument

state 8, check operation of the pulsed-RF network analyzer (using internal triggering) by

performing the following basic tests. Refer to the menu diagrams on the last pages of this

document.

Pulse Profile Domain Check

1. Connect a short circuit to p ort 1 of the test set.

2.

Press

4

PARAMETER

NNNNNNNNNNNNNN

5

MENU

NNNNNNNNNNNNNNNNNNNNNNN

USER a1

.You are viewing the unratio ed value of the a1

reference signal.

3.

Press

4

DOMAIN

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

5

PULSE PROFILE

. The signal level is high when the pulse is On and low

when the pulse is O.

4. Press

5.

Press

Change

6.

oin

p

7.

Press

cycle

of

eac

Press

8.

the

9.

Press

pulse c

10.

Press

t,

long

data

h

stop

4

MARKER

4

SYSTEM

the

measuremen

the

N

DUTY

ercen

p

pulse

p

4

5

STOP

time to

4

SYSTEM

hanges.

N

NN

N

PULSE

5

then move the marker to various points on the trace.

NNNNNNNNNNNNNN

5

pulse

N

NN

CYCLE

t allo

width

t.

oin

then

,

N

5

N

OUT:

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

PULSE CONFIG

width

t time

N

then c

,

y

b

wed

and

hange

c

e

hiev

ac

N

NN

N

MORE

N

PULSE

N

NN

N

HIGH

N

alue.

v

the

lo

the

NN

N

.

for eac

hange

in

ercen

p

w

the

desired

N

NN

CONFIG

Notice

the

ternal

Stop

N

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE WIDTH

that

h data

dut

the

measuremen

cycle

y

dut

t

Adjust

time.

displa

NN

N

NN

N

PULSE

as

poin

.

y

N

cycle

y

N

OUT:

.

increase the

ou

y

will

t

limit.

timing

t

increase

will

the pulse

NN

N

LOW

increase.

This

logic.

N

Notice

.

pulse width

sets

measuremen

the

width,

that

the

Notice

um

n

the

maxim

that

er

b

p

past a

com

t

p

of

olarit

certain

dut

um

binations

time

ts,

oin

of

y

for

and

the

Operating

the

HP

8510

Pulsed-RF

for

Measurements

5-5

1.

Press

and noisy

On

a1,

that the

trace

is

pulse

the

when

at

is

t.

User1

Notice

Profile,

Pulse

ed

pulse

5-4.

measuremen

O.

is

Figure

S

11

to

view

when

the

ratio

the

er

Mark

5-6

Operating

the

HP

8510

Figure

Pulsed-RF

for

Pulse

5-5.

Measurements

Profile,

S

11

This occurs because when the pulse is O, the network analyzer is measuring the ratio of

noise to noise, and since the noise is approximately equal in the reference and test signal

paths, the result is near 0 dB with respect to the On perio d of the pulse. Also, in this

measurement, some large spikes may be seen in the noisy part of the trace. If the noise in the

reference channel instantaneously go es to a very small value, the ratio will increase to a very

large value.

Note

In the Pulse Prole domain:

Without averaging, pulse width and duty cycle settings resulting in less than

about 3 milliseconds PRP will not change the actual system PRP.

With averaging, pulse width and duty cycle settings resulting in less than

about 1 millisecond PRP will not change the actual system PRP.

Also, the PRP and duty cycle can vary during the sweep. To learn more ab out

control of these values, refer to the General Timing Information chapter.

Frequency Domain Check

N

NN

N

1.

Press

2.

the

If

N

DETECTOR:

3. Press

4.

Press

N

4

DOMAIN

W

NN

N

4

MARKER

N

PULSE

N

5

FREQUENCY

annotation do

N

NN

WIDE

5

N

NN

N

WIDTH

N

,

N

NN

N

BW

then

N

NN

N

and

N

.

mo

es not

e

v

set the

N

.

the

app

mark

ear,

pulse

press

er to

width

4

SYSTEM

arious

v

to

N

5

MORE

on

ts

oin

p

microseconds.

10

N

PULSE

the

N

NN

N

trace.

N

NN

CONFIG

N

Figure

5-6.

S

11

Frequency

,

Domain,

Operating

Pulse

the

Width

HP

8510

10



for

s,Trigger

Pulsed-RF

s



5

y

Dela

Measurements

5-7

1.

Press

4

STIMULUS MENU

NNNNNNNNNNNNNN

5

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

TRIGGER MODE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGER DELAY

.

Change the trigger delay and notice that when the trigger delay is greater than the pulse

width, the trace level decreases to the noise o or b ecause the measurement is being made

after the pulse has turned O.

s



15

y

1.

2.

Press

that as

p

data

Press

Figure 5-7.

N

4

SYSTEM

you

oin

NN

N

5

MORE

increase the

increase.

will

t

N

DUTY CYCLE

s,Trigger



N

. Change

t,

oin

p

10

the

measuremen

S

, Frequency

11

N

PULSE CONFIG

N

NN

N

NN

N

pulse width

Domain,

N

past

N

Pulse

N

NN

N

PULSE WIDTH

certain

a

Width

N

. Change the the duty cycle limit. This changes the maximum duty

pulse

Dela

width

t

v

time

alue.

for

cycle percent allowed by the internal measurement timing logic. Notice that combinations

of long pulse width and low percentduty cycle will increase the measurement time for each

data point.

Cycle

y

Note

requency

F

the

In

Without a

Domain

requency

F

veraging, pulse

System

domain:

about 30 milliseconds PRP will not c

With a

veraging, pulse width

Dut

width and dut

y cycle settings resulting in less than

hange the actual system PRP

and duty cycle settings resulting in less than

.

about 1 millisecond PRP will not change the actual system PRP.

To learn more ab out control of these values, refer to the General Timing

hapter.

Information

c

Notice

h

eac

5-8

Operating

the

HP

8510

Pulsed-RF

for

Measurements

External Triggering Check

Connect the output of the external pulse generator to the HP 8510 rear panel TRIGGER IN

connector and to the RF source PULSE MODULATION INPUT (Figure 9-1). Set the pulse

generator to deliver a continuous TTL pulse train, going low for at least 100 nanoseconds at

any pulse repetition period less than about 1 millisecond. Activate the pulse generator pulse

output.

Press

4

STIMULUS MENU

NNNNNNNNNNNNNN

5

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

TRIGGER MODE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGERING EXTERNAL

.

The network analyzer should sweep normally in either the frequency domain or the pulse

prole domain. The analyzer is not aected by excess trigger inputs.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

Press

4

DOMAIN

5

PULSE PROFILE

. The trace represents the signal at the RF source Pulse

Modulation Input. The signal level is high when the pulse is On and low when the pulse is

O.

Press

4

MARKER

5

then move the marker to various points on the trace.

Adjust the time span and number of points for the desired display. Notice that the

measurement resolution period is set by the pulse width, stop time, and number of points.

N

NN

N

Press

NN

N

PULSE

Press

4

DOMAIN

N

NN

4

MARKER

NN

N

CONFIG

N

5

FREQUENCY

N

NN

N

DETECTOR:

5

then

4

press

ear,

app

not

es

p

do

oin

ts

on

the

trace.

SYSTEM

5

.

NN

N

NN

WIDE

the

e

v

mo

N

mark

N

BW

N

.

arious

v

to

er

annotation

W

the

If

NN

N

MORE

NN

the

In

desired

ma

ou

Y

high

es

go

rigger

T

of

Pulse Output

8510

frequency domain,

falling

the

after

time

y

also

to

In

monitor

indicate

and

the

that

Pulse

is not

adjust

rear

the

dulation

Mo

activ

edge

panel

HP

e

trigger

the

trigger

of

8510

Input and

when

STOP

ready

is

external

so

y

dela

in.

SWEEP

to

notice the

triggering

that

output

mak

measuremen

the

with

measurement.

the

e

timing

selected.

is

of

an

the

tak

t

oscillosop

Change

Sw

Stop

es

e.

eep.

place

Stop

the

The

at

Sw

p

the

eep

erio

HP

d

Operating

the

HP

8510

Pulsed-RF

for

Measurements

5-9

6

Frequency Domain Point-in-Pulse Measurements

This chapter contains measurement calibration and measurement procedures to displaythe

pulsed-RF S-parameters versus frequency.

Measurement Calibration for Point-in-Pulse

Measurement calibration for point-in-pulse is accomplished in exactly the same way as for the

standard HP 8510.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNN

not

1. Press

displa

N

DETECTOR:

4

DOMAIN

ed, select

y

NN

N

frequency

5

FREQUENCY

the wideband

N

NN

N

WIDE

BW

.

to

select

the

detector b

y pressing

domain.

4

SYSTEM

If

5

N

MORE

N

PULSE

NN

N

annotation

W

the

N

NN

CONFIG

is

N

2.

Select

the

appropriate

in

for

Note

pulse

8510

HP

standard.

the

indep

pulse

external

for

Note

measuremen

during

the

maxim

ternal

enden

t.

pulse for

um

measuremen

triggering,

assures

of

t

signal

the

output

This

triggering,

ust

m

ou

Y

calibration, then

calibration.

t

when

is set

that

trigger

ou

y

the

set

the

dela

trigger

of

er

b

um

n

Measurement

olarity

Pulse

Set

After instrumen

appearing

P

t preset, the pulse polarity is set to High for the

at the HP 8510 rear panel PULSE OUTPUT connector. Use the follo

procedure to set the pulse polarit y

NNNNNNNNNNNNNN

Press:

4

SYSTEM

5

MORE

NNNNNNNNNNNNNNNNNNNNN

PULSE CONFIG

oin

p

press

ou

y

the

to

calibration

.

y

trol

con

not c

.

NNNNNNNNNNNNNNNNN

k

state

e

is

pulse

to mak

for

to measure

ey

made

width

ethe

during

NNNNNNNNNNNNNNNNNNNNNNNNN

required

ts

the

activ

the

delay

hange it

NNNNNNNNNNNNNNNNNNNNN

PULSE OUT: HIGH

the measuremen

calibration

the

On)

ys

a

alw

(RF

ect

resp

with

cycle

y

dut

and

measurement

measuremen

the

On perio d of the pulse

N

NNNNNNNNNNNNNNNNNNNNN

or

PULSE OUT: LOW

t, then

during

the

to

during

at

NNNNNNNNNNNNNNNNNNNNNNN

erform

p

standard,

measuremen

ortion

p

On

calibration

correct

the

t.

wing

.

the

of

time

the

t

the

and

of

Frequency

Domain

oint-in-Pulse

P

Measurements

6-1

Set Pulse Width

After instrument preset, the pulse width is set to 10 microseconds. Use the following

procedure to set a dierent pulse width.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

Press

PULSE WIDTH

. Use the knob, step keys, or numeric entry to set the desired pulse

width.

Set Duty Cycle Limit

After instrument preset, the duty cycle limit is set to 10%. This means that the maximum

duty cycle will never be allowed to be greater than 10 percent regardless of the pulse width.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

To set the duty cycle limit, press

DUTY CYCLE

on the Pulse Conguration menu. Use the

knob, step keys, or numeric entry to set the desired maximum duty cycle limit. Note that

the actual duty cycle may be less.

Set Trigger Delay

frequency

the

zero.

N

,

on

then

that

Time

the

use

equals

pulse

the

mo

knob,

seconds

zero

dulator.

step

k

After

domain

is when

the

Use

Press

n

or

Preset,

the

measuremen

the HP

wing

follo

4

STIMULUS

umeric

en

trigger

8510

pro

MENU

try

will tak

t

pulse

cedure

set

to

5

dela

output

NN

N

MORE

the

is

y

e place

set

to

N

NN

N

TRIGGER

desired

5

to

set

5 microseconds

to

es

go

trigger

the

N

NN

N

trigger

microseconds.

e

activ

the

.

y

dela

N

NN

N

MODE

dela

N

NN

N

TRIGGER

.

y

This

after time

turning

el

lev

N

DELAY

means

N

NN

eys,

is

that

noisy

Notice

trace

Connect

Figure

6-1

frequency

trigger

the

if

to

due

Device Under

the

the resp

ws

sho

sweep.

lo

w

signal

y

dela

onse of

set

is

lev

Test

the

els.

outside

to

device

to

the

pulsed-RF

the

time

in

terv

al

stim

that

ulus

the

o

er

v

pulse

the

On,

is

curren

the

t

6-2

Frequency

Domain

oint-in-Pulse

P

Measurements

dynamic

The

wide

the

should

increase

b

IF

e

in

used.

visible

Figure

range can

bandwidth,

general,

In

dynamic

6-1.

increased

e

b

v

a

an

using

range.

Amplifier

eraging

an

Gain, Frequency

eraging,

v

a

IF

using

out

ab

eraging

v

of

factor

a

Domain P

but,

a

256

greater

giv

erages

v

than 256

oint-in-Pulse

system

the

en

maxim

the

is

will

not

noise

um

result

o

value

in

or

an

with

that

y

Frequency

Domain

oint-in-Pulse

P

Measurements

6-3

Pulse Profile Domain Measurements

This chapter contains measurement calibration and measurement procedures to displaythe

pulsed-RF S-parameters versus time.

Measurement Calibration for Pulse Profile

After selection of the pulse prole frequency, measurement calibration for pulse prole

measurements is accomplished in exactly the same way as for the standard HP 8510.

Following are two measurement calibration methods, one for calibration in the Pulse Prole

one

est

b

domain,

our

for y

and the

second for

application.

calibration using

the F

requency

List

feature.

Select

the

7

The pulse

pulse

the

prole

domain

calibration

general-purp

for

and

pro

cedure

is

measuremen

ose

ts

using

simple

familiarize

to

y

a

w

easy

an

correction.

the

can

frequency

timing,

pulse

describ

as

cedure.

calibrate

prole

the

Use

ort

2-P

stabilit

whether

cedure

pro

tage

an

adv

the list

frequency

correction

is

there

,

y

calibration

the

in

or

of calibration

only

while

tec

list

required.

is

tially

essen

frequency

the

connecting

hnique

erformed

p

is

in the

when

Giv

dierence

no

domain

frequency

the

more

en adequate

in

the

in

describ

as

domain

standards

than

signal

the

pulse

once.

pulse

one

lev

accuracy

prole

in the

ed

that

is

prole

accurate

els,

of

domain

second pro

ou

y

Pulse Profile Domain

Perform measurement calibration in the pulse prole domain as follows.

1.

Turn correction o by pressing

N

NN

N

2.

Press

select

3. Press

4

DOMAIN

the

4

START

N

5

FREQUENCY

de.

mo

eep

sw

5

then set the start frequency to

N

NN

N

to

select

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

4

5

CORRECTION OFF

CAL

frequency

the

.

4

domain.

Press

STIMULUS

the desired pulse prole frequency

be the frequency measured when the pulse prole domain is selected.

NNNNNNNNNNNNNNNNNNNNNNNNN

4.

NNNNNNNNNN

Press

PULSE PROFILE

function readout sho

NNNNNN

on the Domain men

ws b oth the time v

u. Press

4

MARKER

alue at the mark

5

and notice that the active

er p osition

measurement frequency.

ourself

y

onse-only

resp

and 1-P

frequency

and

measured

the

in

ed

main

The

frequencies

all

at

MENU

. This will

and the curren

with

ort

rst

N

5

STEP

t

or

data

N

in

N

NN

N

to

Pulse

Profile

Domain

Measurements

7-1

5. Select the maximum number of points required for the measurement, then perform the

appropriate measure- ment calibration.

Note that the HP 8510 pulse output is set to the active state (RF always On) during

measurement of the calibration standards. For external triggering, the pulse mo dulation is

operating during the calibration, so the pulse width or time span cannot b e changed after

calibration.

6. For the next pulse prole frequency repeat this sequence.

With several cal sets created in this way,you can select each pulse prole frequency in turn by

recalling the corresponding cal set.

Frequency Domain Using Frequency List

In the above measurement calibration pro cedure it is necessary to perform a separate

calibration for each pulse prole frequency. This is not a problem for simple response-only

calibrations, but when accuracy considerations require the use of 1-Port or 2-Port calibrations,

connecting the necessary sequence of standards rep eatedly can be tedious. As an alternative,

the frequency list feature allows the standards to be connected once for all pulse prole

frequencies.

ws.

follo

erform

P

Press

1.

calibration

the

4

DOMAIN

5

as

N

NN

N

FREQUENCY

NN

N

to

select

the

frequency

domain.

the

If

ceeding.

pro

2.

Press

3.

Press

each

for

start

um

n

wing sequence

follo

points each.

a.

Press

b.

Press

c.

Press

d.

Press

e.

Press

Figure 7-1

calibration.

W

4

SYSTEM

4

STIMULUS

pulse

and

of

er

b

annotation

5

prole

stop

oin

p

NNNNNNNNNNN

ADD

4

NNNNNNNNNNN

ADD

4

N

4

ADD

N

NN

N

ADD

4

NNNNNNNNNNNNNN

DONE

shows the resulting displa

is

N

NN

N

MORE

frequencies

ts

START54354G/n

START54454G/n54x1

ST

START

NNNNNNNNNNNNNNNNNN

FREQUENCY LIST

MENU

to b

creates a

ART

N

PULSE

5

frequency

e displa

4

5

54654

N

NN

N

5

NNNNNNNNNNNNNNNNNNNNNNNNN

CONFIG

N

NN

N

MORE

EDIT

are

yed

frequency list

5

4

5

G/n

G/n54x1

N

iden

N

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

NUMBER of POINTS

4

N

displa

not

e

b

ust

N

BW

Edit

of

N

p

m

.

List

t

oin

pulse

NNNNNNNNNNNNNN

DONE

men

dened

is

in eac

ts

t.

prole

or

F

.

N

NN

N

WIDE

y

Eac

um

n

prole

detector

N

the

segmen

h

er

b

measuremen

four

4554154x15

wideband

the

ed,

y

N

NN

N

x1

N

to

N

5

N

NN

N

DETECTOR:

N

NN

LIST

measured.

e

b

tical

in the

NNNNNNNNNNNNNN

DONE

NN

N

DONE

N

NN

N

DONE

. The frequency list will b e measured.

y. Proceed with the appropriate measuremen

N

displa

to

the

and

pulse

to measure

.

N

.

N

.

N

selected

Create

u.

h

suc

h segmen

example,

frequencies,

efore

b

a

that

segmen

the

is

t

the

of

t

51

7-2

Pulse

Profile

Domain

Measurements

4.

5.

Press

The

4

DOMAIN

4

STIMULUS

selected

last

Figure

N

5

PULSE

MENU

7-1.

N

NN

N

PROFILE

N

5

FREQUENCY

segmen

Frequency

N

NN

N

NN

N

b

will

t

N

e

N

activ

List

N

LIST

N

e.

Displa

N

SINGLE

N

y

N

During

NN

N

Measurement

N

SEGMENT

Calibration

N

.

Figure

7-2.

Pulse

Profile,

Frequency

List

Pulse

Segment

Profile

Number

Domain

1

Measurements

7-3

6. To measure another frequency, select the appropriate active segment.

When either of these calibration pro cedures is complete, the device can be connected for

measurement.

Again, in both of these pro cedures, note that when you press the key to measure the

calibration standard, the HP 8510 pulse output is set to the active state (RF always On)

during measurement of the standard. This ensures that the calibration data at every pointis

with respect to the On p ortion of the pulse.

Measurement

After calibration, rst view the resp onse of one of the calibration standards. Figure 7-3 is

typical: the trace is at at 0 dB when the pulse is On, and noisy around 0 dB when the pulse

is O. The noise during pulse O will vary depending upon the relative signal levels in the

reference and test signal paths.

Figure 7-3. S21, Pulse Profile, Thru

Set Pulse P

After instrumen

olarity

t preset, the pulse polarit

y is set to High for the On p eriod of the pulse

appearing at the HP 8510 rear panel PULSE OUTPUT connector. Use the following

procedure to set the pulse polarit y.

NNNNNNNNNNNNNN

7-4

Press

Pulse

4

SYSTEM

Profile

5

MORE

Domain

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE CONFIG

Measurements

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE OUT:

HIGH

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

or

PULSE OUT:

LOW

.

For internal pulse modulation and internal triggering, time equals zero seconds is always the

point where the pulse transitions to the active level. The internal pulse mo dulator in the RF

source turns the RF pulse On when the analyzer output is positive, so the noisy part of the

trace will change location depending on the pulse polarity.

Set Pulse Width

After instrument preset, the pulse width is set to 10 microseconds. To set a dierent pulse

width:

Press

4

SYSTEM

NNNNNNNNNNNNNN

5

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

PULSE CONFIG

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE WIDTH

.

Use the knob, step keys, or numeric entry to set the desired pulse width.

Set Duty Cycle Limit

After instrument preset, the duty cycle limit is set to 10%. This means that the maximum

duty cycle will never be allowed to be greater than 10 p ercent regardless of the pulse width.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

To set the duty cycle limit, press

step k

knob,

actual dut

eys, or

cycle

y

numeric

y

ma

less.

e

b

entry

DUTY CYCLE

the

set

to

on the Pulse Conguration menu. Use the

desired

maxim

um

dut

y

cycle

limit.

Note

that

the

time

minim

4

ter

Span

ho

c

time

larger

whic

um

press

STOP

time span,

oses

et

b

h

sample

4

5

0

w

of

5

the

een

dep

the

4

x1

the

minim

samples,

pulse

ends

resolution

ey

k

9

This

).

5

increase

up

un

um

and th

width

the

on

til

also

possible

us

time

curren

erio

p

time

the

sets

stop

the

d

(giv

the

or

t

and

v

start

time

the

alue

the

en

measuremen

stop

um

n

us

th

at

time

to

Measurement

Set

8510

HP

The

w

rm

and

dep

d,

erio

p

um

minim

es

terest.

4

STOP

not

the

c

o view

T

press

do

the pulse

If

of in

automatically

capabilities)

are

ending up

ossible

p

pulse

then

,

5

hange

(or

is longer

Time

on

span

with

eatedly

rep

en

than this

Set Measurement Resolution Period

To nd the resolution period, press

e

Activ

the

for

in

measuremen

your

the

alue

v

oin

p

time

required

ts.

hange

c

Connect the Device under T

En

try

est

4

MARKER

area.

c

y

b

t

5

, then move the marker one data point and see

time,

the

pulse

If necessary

hanging

the

adjust

,

stop

With the pulse width set, connect the device under test. Figure 7-4

device to the pulsed-RF stimulus at the curren

t frequency

.

8510

HP

time.

oin

p

of

er

b

est

b

the

ottom of

the b

to the

the

view

resolution

width,

hardw

resolution

t

This

ts.

time

minimum

tire

en

erio

p

and n

are

results

resolution,

grid

the

value.

time

the

to

d

er

b

um

shows the response of the

p

in

erio

of

a

d

Pulse

Profile

Domain

Measurements

7-5

Figure

7-4.

Minimum

Time

Span,

Resolution

eriod

P

ns

100

=

measure

o

T

ending

dep

Figure

input

7-5

imp

another

on

up

ws

sho

edance

frequency

calibration

the

S

the

during

11

resp

the

recall

,

pro

using

onse

On time

the

cedure

the

of

appropriate

used.

Smith

the

pulsed-RF

hart

c

cal

stim

or

set

format.

ulus.

frequency

mark

The

list

er

segmen

showing

is

t,

the

7-6

Pulse

Profile

Domain

Figure

Measurements

7-5.

S

,

11

Smith

Chart

Switching Between Frequency Domain and Pulse Profile Domain

The domain in which the measurement calibration was p erformed is not part of the cal set

limited instrument state. This means that, for example, a cal set created in the frequency

domain could be turned on for a pulse prole domain measurement with no message to the

operator. Except for the pulse prole calibration procedure in the frequency domain using

Frequency List, a cal set should only b e used in the domain in whichitwas created.

Press the following keys to switchbetween the frequency domain and the pulse prole domain.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

4

5

CORRECTION OFF

CAL

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

4

5

CORRECTION ON

CAL

4

DOMAIN

NNNNNNNNNNNNNNNNNNNNNNNNNNNNN

CAL SET n

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

5

FREQUENCY or PULSE PROFILE

This sequence makes certain that the cal set applies to the domain in whichit was created.

Another method is to saveanumber of instrument states, each with the appropriate domain

and cal set, then simply recall the desired instrument state.

If a cal set created in the pulse prole domain is turned On while in the frequency domain, it

is treated as if the calibration were performed using step sweep with the minimum frequency

ts,

oin

prole

set and

pulse

the

p

the

prole

The pulse

span.

resulting

a

if

Also,

domain,

frequency

domain.

trace

in

cal

frequency

the

domain

This

prole domain

errors.

created

set

error

also results

is

co

the

in

set

ecien

in

error

frequency

the

to

ts

trace

co

start

are

errors.

ecien

domain

frequency

applied

ts

to

are

is

each

applied

turned

the

of

corresp

dieren

to

while

On

frequency

onding

frequency

t

the

in

domain

oin

p

pulse

in

t

cal

Pulse

Profile

Domain

Measurements

7-7

8

General Timing Information

Previous examples have used the internal measurement trigger and the internal pulse

generator to demonstrate basic operation of the network analyzer. This setup is suitable for

many applications in which the internal PRP and maximum duty cycle limitations are not

critical to measurement results. If your device is sensitive to pulse rep etition p eriod or duty

cycle you will need to learn more ab out how these are aected by the instrument state. The

following paragraphs provide information that can be used to predict the internal PRP for

dierent instrument states.

Netw

Figure

cycle.

ork

8-1

or

F

measuremen

for

Analyzer

the

ws

sho

frequency

the

the HP

t,

measuremen

Measurement

general

measuremen

domain

p

oin

8510 measuremen

aiting

w

then

t,

pro

t

t-in-pulse

cycle

t

the

for

Cycle

w

o

cess

measurement

consists

trigger.

of

making

of

ork analyzer

w

net

and the

the

prole

pulse

measuremen

measurement

domain

setting

t,

up

General

Timing

Information

8-1

measuremen

h

Eac

external

Trigger

Figure

cycle is

t

Input, or

Netw

8-1.

initiated b

ternal

in

the

ork

ythe

8510

Analyzer

falling edge

dep

logic,

Measurement

the

of

ending

TTL

up

Cycle

whether

on

signal

the

at

external

rear

panel

or

ternal

in

triggering is selected. At the appropriate time after the trigger, the measurement is made.

If averaging is turned On but not completed, the process waits for the next trigger to make

the next measurement for that data point. If averaging is complete but another parameter is

required (2-Port correction is On), the next parameter is selected and the pro cess waits for the

to

es

v

mo

cess

pro

the

trigger.

oin

p

domain,

When

changing

then

w

aits

the

for

data

all

frequency

for

that

in

if

trigger.

oin

p

frequency

the

is acquired,

t

then

domain,

or

the

time

if

in the

pulse

prole

These times are represen

analyzer con

General

8-2

trols.

Timing

Information

tative t

ypical measuremen

t cycle times using preset v

alues for the

Measurement Cycle Time

Measurement Cycle Times

1ms Next Average

4to 8ms Next Parameter

30 to 40 ms Next Frequency Point

(Frequency Domain)

3-4 ms Next Time Point

(Pulse Prole Domain)

that

trols

Con

Time.

eep

Sw

Width.

Cycle

cycle

Profile

for

Limit.

ercen

p

limit is

triggering

Pulse

Duty

y

dut

y

dut

Pulse

determines the

eect

can

terv

in

pulse

the

When

an

The

When

maxim

t

satised.

Domain

Stop

measuremen

measurement

the

analyzer

equal

al

ys

a

alw

analyzer

the

um

Time.

t

is

to

remains

limit

The time

cycle

otherwise

eep

(Sw

On

otherwise

is

ould b

w

time

cycle time

ready

Time

for

exceeded,

e

alue

v

it

when

are:

the

for

(ms)/Numb

user-sp

the

for

ready

the

curren

the

of

greater

is

ecied

the

cess

pro

t

than

measuremen

ts).

oin

P

time.

measuremen

prole

pulse

PRP

the

cycle,

t

triggering

data

y

b

set

t

p

the

cycle,

oin

limit.

Frequency

cycle

y

dut

Domain

limit,

Trigger

trigger

dela

Dela

y

will

.

If

con

the

trol the

frequency

minimum

domain

trigger

frequency domain

dela

greater

is

y

measurement

than

time.

Additional considerations are:

Pulse Output is set to the active level during measurementofany calibration standard.

eep retrace.

sw

less

the

than

microseconds

30

immediately

prior

to

Pulse

Output is

Output

set

to

set

is

the beginning of the sw

the

inactiv

active

e

lev

for

el

during

el

lev

eep for the automatic perio dic IF calibration sequence.

it

un

t

dut

ignores

the

if

the

til

cycle

y

the

cycle

to

Pulse Output remains at the inactiv

el under all conditions when External T

e lev

riggering is

selected.

The automatic perio dic IF calibration sequence is transparen

t to the operator except for the

less than 30 microsecond pulse output immediately prior to the b eginning of a sweep. Tothe

operator, the IF calibration sequence will app ear to occur at random times, more frequently

just

after

the

HP

8510

turned

is

on, then

less

often

as

the

system

General

temp

erature

Timing

stabilizes.

Information

8-3

Pulse Repetition Period and Duty Cycle Considerations

From this information it can be seen that the pulse rep etition period and thus the duty cycle

of the pulsed-RF signal applied to the DUT can vary depending upon the instrument state.

For measurements in which the PRP or duty cycle is not imp ortant, simply set the pulse

width and the duty cycle controls to an appropriate value and make the measurement. The

specied duty cycle limit will not b e exceeded, but the actual duty cycle maybe lessthan

expected.

For example, Figure 8-2 shows the pulse output waveform for various conditions. Figure 8-2a

shows the pulse output when the pulse width is 500 microseconds, the duty cycle limit is 50

percent, and averaging is o. Under these conditions the measurement cycle time is about 3

milliseconds per trace data point in the pulse prole domain, or ab out 30 milliseconds in the

frequency domain. Figure 8-2 b shows the same conditions with averaging on and an averaging

factor of four. Now four measurements are taken for each data point with the measurement

cycle time alternating between 1 millisecond for each of the measurements required for the

averaging, and the time to move to the next data point. Figure 8-2c shows the measurement

when 2-Port correction is On. Here, the parameter switching time also aects the overall PRP

cycle.

y

dut

and

Figure 8-2. Example Internal Pulse Output PRP and

Duty Cycle

In Figure 8-2, the pulse width is greater than the measurement cycle time, so the duty

function

cycle

y

dut

com

cycle

the

bination

time, the

limit.

the

of

pulse

o

part

width

of

cycle could

v

the

um

dut

maxim

and

measuremen

General

8-4

approac

allo

alue

cycle

y

cycle

t

Timing

p

100

h

in

ed

w

approac

limit

is

time

Information

This

t.

ercen

measuremen

the

hes

increased to

oided

v

a

is

When

t.

measuremen

satisfy

the

y

b

dut

setting

the

cycle

t

y

to

the

If you are viewing this with an oscilloscop e, notice how the measurement cycle time varies

according to the pulse prole stop time. If the stop time is greater than the pulse width, the

measurement cycle time will extend past the end of the pulse dep ending up on the time value

of the data point being measured. Depending upon the pulse width, this can result in a lower

percent duty cycle toward the end of the time span.

External Trigger and Stop Sweep Signals

Figure 8-3 shows the relationship between the external Trigger Input and the HP 8510 Stop

Sweep output for frequency domain point-in-pulse measurements and for pulse prole domain

measurements. For external triggering, Stop Sweep remains Busy (low) until the measurement

cycle is complete. This information is important for synchronizing the pulse mo dulation to the

external trigger.

It is easy to learn the timing by using an oscilloscope to view Stop Sweep when the external

trigger is applied.

4

Press

train

for at

ignored.

STIMULUS

the

to

least

The

measuremen

MENU

HP 8510

nanoseconds.

100

t

NNNNNNNNNNNNNN

5

rear panel

external

and

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

TRIGGER

Excess

trigger

retrace

MODE

TRIGGERING

EXTERNAL TRIGGER

ccur

o

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

edge

that

after

stop

triggers

falling

automatic.

is

EXTERNAL

INPUT. The

stop

while

ready

is

eep

sw

and

trigger

eep

will

apply a

should

busy

is

initiate

TTL pulse

y

sta

are

w)

(lo

lo

w

Figure

8-3.

External

Trigger and

Stop

Sw

eep

Timing

General

Diagram

Timing

Information

8-5

When

not operate (always in the ready state). Timing diagrams for the pulse output signal and

development of the internal measurement trigger are shown in Figure 4-1 and Figure 4-2.

When

trigger input denes time equals zero seconds for each measurement cycle. Stop sweep falls

immediately and stays lowuntil the HP 8510 completes the measurement cycle and is ready to

accept the next trigger. The time perio d that stop sweep remains busy depends upon the next

measurement function to b e performed. Pulse output is turned O for external triggering. As

for internal triggering, the pulse prole measurement resolution perio d is set by the larger of

pulse width and pulse prole domain stop time.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGER MODE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGER MODE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGERING INTERNAL

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGERING EXTERNAL

is selected, the stop sweep output does

is selected, the falling edge of the external

8-6

General

Timing

Information

Using External Triggering and Pulse Modulation

In applications where it is necessary to maintain close control over the PRP and duty

cycle of the pulsed-RF stimulus, you can use external equipment to provide the TTL pulse

modulation and external trigger signals. When using an external pulse mo dulation signal,

it is necessary to synchronize the network analyzer with the pulse mo dulation signal so

that the measurement is always made at the same time with resp ect to the stimulus. This

synchronization is accomplished using the HP 8510 external trigger input.

9

Connect

simple metho

A

external

an

Figure

mo

How

net

Please

9-1

dulation

er,

ev

analyzer

ork

w

note

in

connector.

SWEEP

the

to

triggering.

the

pulse

ws

sho

input

our

y

that

When

Pulse

control

dto

generator

simple

a

the

to

application

TRIGGER

ternal

in

for

pulse

the

to

0

IN

Generator

PRP

the

vide

pro

to

this

it

IN

ma

and

In

and to

y

b

setup.

RF source

triggering,

generator

10V connector.

cycle

y

dut

and

mo

pulse

the

HP

pulse

the

to

mo

short

example

desireable

e

the

to

BNC

a

connected

is

the

Otherwise, signals

the

of

dulation

same

rear

8510

dieren

use

dulator.

circuit

TRIGGER

to

pulsed-RF

input

TTL pulse

panel

sync

t

connected

is

IN,

sw

the

on

ulus

stim

RF

the

to

train pro

TRIGGER

hronized

to

the BNC

e

v

mo

line

in

eep

is

source.

vides

IN

inputs

TRIGGER

the

could

use

to

pulse

the

connector.

the

to

short

aect

IN

Using

External

Triggering

and

Pulse

Modulation

9-1

Figure 9-1. External Control of PRP and Duty Cycle

Synchronization is assured because time equals zero seconds for each measurementcycle

(high).

ready

is

eep

sw

stop

after

dened

is

Figure 9-1

RF

the

in

the

as

sho

b

source.

rst

connection

ws

falling

edge

of

of the

an

trigger

external

input

pulse

mo

dulator

instead

of the

ternal

in

mo

dulator

Figure 9-2 sho

pulse mo

percen

dulation input to the RF source is a con

y cycle pulses. The same input is applied to TRIGGER

t dut

EXTERNAL is

9-2

Using

External

ws results using this pulse mo dulation and triggering method

tinuous train of 10 microseconds PRP

IN, and TRIGGERING

selected.

Modulation

Pulse

Triggering

and

when the

,50

Using

Figure

time

en

Ev

prole

stop

and

External

is

9-2a

greater

is

out

ab

is

though

the

measuremen

time.

the

than

ositiv

p

Trigger

pulse

in

and External

prole

ulus

stim

the

measuremen

3

e

ternal pulse

resolution

t

domain

PRP

t

output

d

erio

p

Figure 9-2.

Modulation PRP

Multiple

onse.

resp

for

not

set

that

used

algorithm

y

b

eriods

in

Notice

.

resolution p

is

=10

external

with

this

microseconds, Duty

visible

pulses

are

triggering

the

to

ect

resp

particular

using

conguration,

greater

the

ecause

b

minim

the

external

the

of

Cycle

the

pulse

50%

=

stop

the

start

um

trigger.

pulse

width

Figure

time

On

One

1.

Press

2. Press

9-2

of

metho

4

the

is

b

the

used

d

DOMAIN

MARKER

frequency

domain

pulse.

trigger

the

set

to

NN

N

NN

N

5

PULSE

5

, then move the marker to the p oint on the pulse you want the frequency

PROFILE

resp

appropriate

an

to

y

dela

N

NN

then

,

appropriate

set

value

Start

trigger

the

with

onse

domain measurement to be made.

3. Press

4

STIMULUS MENU

NNNNNNNNNNNNNN

5

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MORE

TRIGGER MODE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

TRIGGER DELAY

The currentvalue of the trigger delay will be displayed. Now press

function.

y

will

N

NN

N

FREQUENCY

N

NN

The

.

4.

alue

v

Press

the

at

4

DOMAIN

marker

5

assigned

e

b

Trigger In signal falling edge as set b

y b e desirable to complemen

our application

In y

it ma

trigger

the

to

ws

sho

trace

y the trigger dela

dela

at

onse

resp

the

alue.

yv

t the pulse mo dulation and the external

trigger signals.

dela

and

.

the

set

y

is:

Stop

4

=MARKER

time after

measure

to

times.

during

5

. The time

TTL

the

Using

External

Triggering

and

Pulse

Modulation

9-3

10

High Power Measurements

Signal Level Characteristics

Use Figure 10-1 to examine the maximum power ratings and normal signal levels present

in the test set. The signal levels are approximate, with signal path loss increasing with

frequency. Note the following characteristics:

Typically, the RF input is about 9 dBm and the loss to the selected test p ort is ab out 9 dB.

With the step attenuators set to zero dB, the loss from the RF input to the a1 or the a2

mixer, and the loss from Port 1 or Port 2 to the b1 or the b2 mixer, are approximately

equal at about 26 dB.

Since

the User

of

signal

the

sp

or

F

10

0

is

duce

pro

Caution

eac

mixer

h

includes

Parameters

the

at

el

lev

erformance,

dBm.

p

Higher

ecied

greater uncertain

Comp

oid

v

a

Use the

protect

Install

the

at any input or output. This means that if the device output is greater than

+20 dBm, the switch can be damaged by +20 dBm present at either LOW

POWER OUT connector.

If the device output is greater than +43 dBm, use appropriate components

protect

to

damage

HP 85110A, and +47 dBm (50 w

a

will sho

test

signal

y

t

ts

onen

damage,

POR

the

appropriate

set

test

the

lev

20

ort.

p

the

lev

due

the

in

observ

T

mixer

orw

F

el is

MHz

wthe

maxim

cause

els

to

test

and

1

input

ard/Rev

set

test

+43

preamplier to

to

el

lev

IF

signal

IF

um

errors due

noise.

b

will

set

wing

follo

ethe

2

T

POR

mixer

the

0

ts

onen

comp

switc

erse

(and

orts

p

w

(20

dBm

oset its

22

out

ab

e

b

as

el

lev

compression,

to

damaged at

e

b

e

erating

op

uators

atten

damage

rear

the

in

the damage

0

h

ard/Rev

Forw

the

applied

atts)

atts) for the HP

ersion loss,

conv

less

dB

measured b

and

certain

precautions:

ulus

(Stim

is

el

lev

extension

panel

level

erse

POR

at

85110L.

than

ythe

o

P

+20

T

the

er

w

lo

signal

er

w

dBm.

is +20

switc

or POR

1

measuremen

input

RF

parameters

user

signal

els.

lev

to

u)

men

protect

to

links

dBm

the

0

h)

2

T

els

lev

o

T

applied

for

t

or

the

High

Measurements

er

w

o

P

10-1

Figure

10-1.

T

est

Set

Maximum

Signal

Lev

els

Connecting

rear

set

test

The

the P

equipmen

OUT eac

tin

connect

h

external

links

panel

and P

ort 1

output

an

to

signal

lab

ort

conditioning

POR

eled

signal

2

forw

the

of

1and

T

paths.

ard/rev

PORT

The

erse

b

can

2

connectors

h.

switc

e

lab

The

used

install

to

W

LO

eled

connectors

external

WER

PO

eled

lab

HIGH

POWER IN connect to the front panel measurementPORT 1 or PORT2.

Note the damage levels indicated in Figure 10-1. The maximum power rating of the

forward/reverse switch is +20 dBm applied at the RF input, or applied to the forward/reverse

poles via either LOWPOWER OUT connector. The maximum signal level applied at either

connectors

2

HIGH

+43

is

PO

dBm

WER

for

connector, or

IN

HP

the

85110A,

to

and

either

+47

the

of

dBm for

fron

the

panel

t

HP

POR

85110L.

1

T

and POR

T

10-2

High

Measurements

er

w

o

P

Example High Power Measurements

The best pro cedure for setting signal levels in the test set b egins with estimating the input

and output power levels of the device under test. When the test set is congured to handle

these levels, the operating device is connected and the power estimates are veried by

measuring the user parameters. If the estimates were inaccurate, the test set conguration

is changed so that power levels at all points in the system are within limits. When this is

accomplished, the device is removed, measurement calibration is performed, then the device is

installed and its S-parameters are measured. Following are two examples of measurements on

high power devices.

Measure a 30 dB Amplifier

Figure 10-2 shows the setup for measurement of an amplier having about 30 dB of gain.

Using the standard RF source power setting of +9 dBm, the signal level at Port 1 is about +0

dBm, the level at the b2 mixer is about +5 dBm, and the signal level at the reverse pole of

the forward/reverse switch is about +30 dBm. In order to avoid damage:

The ATTENUATOR PORT 2: step attenuator must be set to at least 20 dB to protect the

b2

mixer;

and,

atten

An

signal

isolator,

An

hoice

c

est

b

erformance

p

insertion

the

lev

uator

at

el

pro

ecause

b

for the

loss

isolator

or

the rev

viding

it

from

rev

erse p

out

ab

can

erse

the

preserv

rev

added in

e

b

ust

m

the

of

ole

30 dB

of isolation

ethe

measuremen

ole

p

erse

the rear

h

switc

dynamic

will

ts

switc

the

of

to

b

range

e

b

et

panel POR

+20

w

elo

P

een

w

for

obtained

ort

P

to

h

ort

rev

dBm.

2

erse

ecause

b

2,

and

to

links

T2

switc

the

measuremen

isolator

the

a2.

to

reduce

is

h,

ts.

will

the

Better

minimize

Figure

10-2.

Measuring

Amplifier

gain

dB

30

a

High

Measurements

er

w

o

P

10-3

Measure an Amplifier with High Input Levels

Figure 10-3 shows the setup for measurement of an amplier with ab out 20 dB of gain that

needs an input level of about 40 dBm. A 40 dB gain amplier is installed in the rear panel

PORT 1 links to bo ost the signal level to the desired value without exceeding +43 dBm (20

watts). The signal level at the test port is about +60 dBm, making the signal levels at the a1

mixer and the b1 mixer over +30 dBm. In order to avoid damage:

The ATTENUATOR PORT 1: attenuator must be set to 30 dB in order to reduce the a1

and b1 signal levels to below010 dBm;

On the transmission return side, the amplier output is ab out 60 dBm, making it necessary

to add 20 dB of loss b etween it and Port 2 in order to reduce the signal level incidentat

Port 2 to less than +43 dBm for the HP 85110A, and +47 dBm for the HP 85110L;

The ATTENUATOR PORT 2: step attenuator must be set to 30 dB in order to protect the

b2 mixer; and

The reverse p ole of the forward/reverse switchmust be protected by installing an attenuator

or isolator in the rear panel PORT 2 links to reduce the signal level at the reverse pole of

dBm.

+20

w

elo

b

to

h

switc

the

necessary

the

vides

pro

a

high

it

w

o

p

terminate

to

er atten

uator that

through

the

The

loss

ould

w

arm

coupler is

will

and

otherwise

coupler.

the

of

used in

probably

required.

e

b

transmission

the

vide

pro

A

a

more

high

return

stable

wer

o

p

signal

path

termination is

ecause

b

than

required

Use

these

examples

as

a

guide

considerations that

for

are

sp

ecial

to

y

our

test

setup.

10-4

High

Amplifier

Measuring

Figure

Measurements

er

w

o

P

10-3.

an

with

els

Lev

Input

High

Using the Port 1 and Port 2 Attenuators

The Port 1 and Port 2 step attenuators are used to adjust the signal level into the mixers and

thus protect the mixers from excessively high signal levels. Note that the attenuators do not

change the Port 1 or Port 2 signal levels.

Controlling the Attenuators

Set the step attenuators as follows.

Press

4

STIMULUS MENU

Use the knob, STEP keys, or numeric entry to set the attenuator from 0 dB to 90 dB in 10

dB steps. Familiarize yourself with op eration of the step attenuators by measuring the user

parameters.

Measure User Parameters and Set Attenuators

In order to maintain specied performance, the IF signal levels are less than010 dBm as

user

the

y

N

b

4

ARAMETER

P

N

USER

at

N

NN

N

USER

N

NN

N

turn

t,

IF signal

N

NN

N

an

N

b1

4

oin

p

y

N

a2

3

NN

N

measured

measuremen

erify the

v

Press

format.

Press

dBm

Press

N

REDEFINE PARAMETER

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

5

POWER MENU

parameters.

measuremen

a

on

levels

5

MENU

N

observ

and

the

in

t

N

.

N

DRIVE

as follo

NN

N

USER

trace,

NN

N

NN

e

N

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

ATTENUATOR PORT: 1

appropriate

mark

N

and

signal

N

NN

er, then

observ

the

N

an

N

lev

A

N

Connect

t

ws.

N

a1

1

IF

the

increase

NN

N

DRIVE: PORT

measure the

the

e

either

If

el.

TTENUA

N

NN

.

2

IF

TOR

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

or

ATTENUATOR PORT: 2

ort

P

device

signal

at

user parameters

in

el

lev

is

b1

or

a1

1

T:

POR

the

greater

v

or

1

LOG

alue.

Port

in order

than

2for

MA

0

.

each

to

G

10

el.

Observ

Press

applied to Port 1. If either a2 or b2 is greater than010 dBm at anypoint in the trace,

increase the

In some applications it may be necessary to measure the signal at b2 with the signal applied

to Port 2. For this measurement:

Press

N

REDEFINE PARAMETER

Observe the IF signal lev

Before calibration, measure these user parameters with the calibration standards, then with

the device under test connected and op

Generally, set the attenuators to obtain the maximum possible mixer input signal level

(less than010 dBm) with the device connected and operating. This will provide the best

signal-to-noise

calibration.

measuremen

e

N

NN

N

2b2

USER

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

ATTENUATOR PORT: 2

N

NN

N

NN

N

USER

N

NN

N

b2

2

N

NN

N

NN

ratio

best

or

F

t.

signal

IF

the

lev

N

and observ

N

.

N

NN

N

el.

the

for

accuracy

e the

N

NN

N

DRIVE

measuremen

N

DRIVE: PORT 2

do

,

IF signal

value.

N

NN

N

c

not

N

NN

N

erating.

Then

t.

hange

lev

N

NN

N

remo

either

N

el.

.

This

the device

e

v

atten

ws

sho

uator

the

b

High

et

and

w

P

lev

een

w

o

the

with

el

erform

p

calibration

Measurements

er

measuremen

signal

and

t

10-5

Changing Signal Path After Calibration

If any attenuator or other external equipmentischanged after calibration, the measurement

results cannot be specied except byyour own estimation of the error contribution of

the change. For example, when the p ort attenuation is changed with correction On, the

CAUTION: CORRECTION MAY BE INVALID is displayed. The op erator must judge

whether the error is tolerable in the particular application and how to comp ensate for the

change.

The only reason to change the internal attenuators or external equipmentbetween calibration

and measurement is to maximize the levels under both conditions, thus minimizing

uncertainty due to noise. Many factors will enter into the decision of whether it is more

accurate to calibrate at a low signal level without changing the setup, or change the setup

to optimize levels for both calibration and measurement. Changing the Port 1 or the

Port 2 attenuator does not seriously change the test set mismatch, directivity, or isolation

characteristics, but will change the frequency resp onse magnitude and phase. This dierence

in the frequency response between calibration and measurement can be normalized using the

HP 8510 trace memories.

the

e

v

the

impro

setup?

application

The

question

calibration enough

ttenuators

A

the

Set

to

risk

Do

is:

greater

increasing

es

error

tributions

con

the

signal

lev

ossible

p

els

during

c

y

b

calibration

hanging

minimize

If

only

the

hanged,

c

attenuators

2

ort

P

or

1

ort

P

are

the

cedure

pro

wing

follo

can

errors.

signal

IF

est

b

P

2

ort

for

atten

1

uators

atten

to

uators

the

Connect

1.

lev

P

2.

With

3.

setting

ou

y

If

during

els

erform

an

view the

or a

short

a

calibration.

appropriate

the

appropriate

required for

response

and

thru

measuremen

standard

operating

short

of a

the

set

t

connected,

the test

circuit,

and

1

ort

P

calibration.

the

set

device.

notice

that

ort

P

Port

c

atten

2

1and

hanging

uators

ort

P

the

has negligible eect on the S11marker reading, and that changing Port 2 attenuators has

negligible eect on the S22marker reading. This is due to the way that the attenuators are

paired. Both the reference and the test signal are changed an approximately equal amount.

However, when viewing S21or S12,changing the Port 1 or Port 2 attenuators osets the

mark

reading

er

dierence

the

y

b

in

alues.

v

2

ort

P

1and

ort

P

the

Store Trace Memories

The main frequency response eects of c

hanging the atten

using the HP 8510 trace memories and trace mathematics as follo

1. Connect the thru used for calibration. Set the port atten

measurement of the device. Recheck the user parameter levels then press

2.

Press

trace

measuremen

4

DISPLA

the

is

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

DATA

!

resp

5

Y

frequency

t.

MEMORY

onse

store

to

dierence

the

of

S

the

21

trace

S

uators can be comp ensated for b

ws.

alue used for

memory

calibration

een

w

4

S

21

uators to the v

default

in

signal

path

trace

et

b

21

5

.

This

1.

and

the

y

10-6

High

Measurements

er

w

o

P

3. Press

4

S

12

54

DISPLAY

5

DATA

!

MEMORY

to store the S12trace in trace memory 2. This

trace is the frequency response dierence of the S12signal path between calibration and

measurement.

Now that these traces are stored, they can b e used to normalize the corrected data.

View the Normalized Parameters

Use these traces to normalize the corrected data to the new levels after the attenuation is

changed. This example uses normalization only for S21and S12. Press the following keys to

view the corrected parameters.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

1.

2.

Press

4

DISPLAY

4

S

11

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

5

DISPLAY: DATA

5

and view the S11measurement.

.

3. Press

4. Press

4

5

and view the S22measurement.

S

22

4

5

and view the S21measurement. If the thru is connected, the transmission

S

21

coecient should be 160.

Press

5.

View

the

4

and

5

S

12

S

measuremen

12

view

the

12

the

If

t.

measuremen

connected,

is

thru

t.

e

transmission

the

ecien

co

should

t

b

S

160.

Normalization

selected

Since

and

these

are

application.

connected

require

to

additional

turned

is

o

normalization

accurate,

is necessary

it

If

ports

test

the

to

steps

for

turned

is

eatable

rep

c

to

connected

or

adequately

11

on

atten

hange

and

to

uators,

other

b

comp

S

measuremen

22

view

parts

een

w

et

ensate

S

this

21

the

and

sequence

the

of

rear

the

for

ts,

S

.

12

test

panel

hanges.

c

then

may

setup,

links,

appropriate

the

eectiv

e

b

ecially

esp

this

pro

in

e

comp

cedure

memory

our

y

onen

ma

ts

y

S

the

Selecting the Appropriate Measurement Calibration

The HP 8510 pulsed-RF network analyzer system allows you to calibrate in the same

environmentasyour measurement. For example, if you are making a high p ower, pulsed-RF

measurement, you can calibrate in the same high p ower, pulsed-RF mode. Calibration data is

calibration

only

en

tak

standards

while

that

w

the

ould

pulse is

damaged

e

b

on.

This

in

yp

t

high

calibration

of

e

wer,

o

p

calibrations.

CW

ma

y

en

to

is

y also inuence the decision of

Signal lev

els available for calibration and for measuremen

which error mo del to use for the measuremen

If appropriate signal lev

measurement, the HP

2-Port or TRL 2-P

ort, pro

els can be ac

8510 2-Port accuracy enhancemen

vides best accuracy b

hieved for all parameters during calibration

t.

ypro

tma

and

t error mo del, either the HP 8510 F

viding best c

haracterization and remo

ull

val

of the systematic errors in the test setup. If the device is noninsertable, the HP 8510 Adapter

Removal calibration pro cedure can be implemented using the Full 2-Port and/or the TRL

calibration.

ort

2-P

High

Measurements

er

w

o

P

10-7

However, there are applications in which the 2-Port error model cannot be used. There are

others in which better results are produced using other calibration techniques described later.

These are the reasons that 2-Port correction cannot be used eectively:

1. Very low signal levels of the S22and S12measurement will probably reduce the accuracy of

the S11and S21measurements.

Using 2-Port correction, the values of all four parameters are used to nd the corrected

value for the displayed parameter. If, for example, the reverse parameters are not

representative of their actual values due to insucient signal levels, then their

contribution to the accuracy enhancement algorithm will cause errors. This leads to noisy,

nonrepeatable data for the other parameters, even if their measured data is representative.

2. Equipment external to the HP test set must be switched depending up on the parameter

being measured.

There is no means of automatically switching equipment external to the test set dep ending

upon the S-parameter b eing measured.

Using 2-Port correction, all four S-parameters are automatically selected in sequence,

and there is no signal available to indicate which parameter is being measured. If

dynamic

measuremen

del

mo

est

T

3.

calibration

range

t

cannot

conguration

set

and

considerations

dieren

of

e used.

b

t

hanges

c

measuremen

e

mak

parameters,

error

t.

necessary

it

the

terms

to

automatic

than

other

hange

c

switc

frequency

test

the

hing used

resp

conguration

set

onse

2-Port

et

b

in the

een

w

for

error

hange

c

hanges to

c

If

directivit

the

measured

frequency

the displa

using

Calibration

these

of

all

In

parameter.

the

,

y

during

onse

resp

section

situations

or

F

set

test

isolation,

calibration,

the

haracteristics

c

memory

y

this

in

example,

w

et

b

source

features

hapter.)

c

b

the

use

een

est

the

or

then

c

Resp

calibration

matc

load

corrected

the

the test

of

HP

the

of

will

hoice

onse

and

h,

set c

8510B.

e

b

the

or

measuremen

frequency

or

data

hange,

(See

a

use

to

onse

Resp

t

resp

e

b

will

ensation

comp

Changing

the

separate

& Isolation

signican

onse

in

error mo

tly

co

error

error.

If only

can

Signal

del for

calibration for

ecien

pro

e

b

P

the

vided

ath

each

ts

After

the

S21and S12parameters, and 1-Port calibrations for the S11and S22parameters. Combining

error models like this allows setup, calibration, and measurement for each parameter

to be accomplished independently. After separate calibration for each parameter, the

forward/reverse switch in the test set will resp ond to front panel parameter selections, and

set

cal

the

Combining

Basic Net

selected

the

for

is

dels

mo

error

work Measuremen

parameter

describ

ts portion,

will

HP

the

in

ed

with the Cal men

8510

erating and

Op

u in the S-P

Programming

arameter T

est Set

man

ual,

recalled.

e

b

Calibration Error Models section.

10-8

High

Measurements

er

w

o

P

General Calibration and Measurement Sequence

Specify device input/output requirements.

Congure test set for these levels, plus guardband.

Connect operating device and verify levels.

Adjust levels for best dynamic range.

Perform measurement calibration.

Measure operating device S-parameters.

General Calibration and Measurement Sequence Using Display Math

Specify device input/output requirements.

Congure test set for these levels, plus guardband.

els.

lev

erify

v

Connect

erating

op

device

and

Congure

Connect

Change

erform

P

standards

setup for

measuremen

device.)

Connect

appropriate

Connect op

normalization

Use

setup

erating

for

b

to

and

est

device.

dynamic

est

b

erify

v

dynamic

calibration.

t

standards

device

view

range.

els.

lev

range

(Before

j

store

and

parameters.

during

calibration.

ving

sa

reference traces.

cal

set,

congure

setup

for

erating

op

High

Measurements

er

w

o

P

10-9

Reference Data

Creating Pulse Hardware State and Instrument State Files

If the HP pulsed-RF system tap e is not available, create the necessary les as follows.

11

Press

1.

2. Set

4

PRESET

system bus

N

4

SYSTEM

N

5

HP-IB ADDRESSES

NNNNNNNNNNNNNNNNNNNNNNNNNNNNN

SOURCE #1

NNNNNNNNNNNNNNNNNNNNNNNNNNNNN

SOURCE #2

the

set

to

5

HP-IB addresses

N

NN

N

NNNNN1NNNNN9NNNNNNNN

x1

NNNNN1NNNNN8NNNNNNNN

x1

.

Network Analyzer

HP-IB Addresses

System Bus

8510 16

System Bus 17

Source #1 19 (RF)

Set

est

T

Plotter

ter

Prin

Disc

Source

P

RF

instrumen

N

NN

#2

ASS-THR

Switc

t

sources:

of

N

h

to

U

akno

wn state.

18

20

05

01

00

(LO)

31

de.

sweep

Set

3.

Press

4. Multiple

mo

4

STIMULUS MENU

source con

trol.

5

N

STEP

N

NN

N

.

Edit the Multiple Source conguration to set the

and tune the receiv

NNNNNNNNNNNNNN

4

SYSTEM

5

MORE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

N

SOURCE

N

NN

N

FREQUENCY

DEFINE

N

OFFSET

er to 20 MHz as follows:

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

EDIT MULT. SRC.

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

1

MULTIPLIER

N

0

x1

N

DONE

N

NUMER

N

LO source 20 MHz abo

NNNNNNNNx1NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MULTIPLIER

DENOM.

ve the test source

NNNNNNNN

x1

Reference

Data

11-1

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

DEFINE SOURCE 2

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

OFFSET FREQUENCY

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

DEFINE RECEIVER

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MULT. SRC. ON/SAVE

M

annotation appears.

Other settings for pulsed-RF operation are as follo ws:

4

SYSTEM

W

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE OUT: HIGH

test signal source)

4

SYSTEM

4

SYSTEM

4

STIMULUS

5.

Finally

NNNNNNNNNNNNNN

5

MORE

annotation appears.

NNNNNNNNNNNNNN

5

MORE

NN

N

5

MORE

N

5

MORE

NN

SA

VE

N

5

INST.

4

,

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

MULTIPLIER NUMER.

NNNNN2NNNNN0NNNNNNNNNNN

M/



NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

CONSTANT FREQUENCY

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

PULSE CONFIG

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

or

PULSE OUT: LOW

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

SYSTEM PHASELOCK

NN

N

NN

N

POWER

N

POWER

N

STATE

N

NN

LEVELING

NN

N

MENU

N

NN

N

(POWER

NN

N

NN

NNNNNNNNx1NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

NNNNNNNNNNNNNN

DONE

NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN

DETECTOR: WIDE BW

(depending on pulse modulator; HIGH for 834x

NNNNNNNNNNNNNN

NONE

N

NN

N

POWER

NN

N

SOURCE

N

NN

N

UP)

N

NN

N

NN

SOURCE

N

8

MULTIPLIER DENOM.

NNNNN2NNNNN0NNNNNNNNNNN

NN

N

1: INTERNAL

N

1

N

.

NNNNNNNNNNNNNN

M/



DONE

N

NN

N

4

5

9

x1

N

SOURCE

N

POWER

NN

N

NN

2: EXT.

N

NN

N

SOURCE

NNNNNNNN

x1

NN

N

NN

N

LEVEL

N

4

2

0

.

4

5

1

.

5

0

x1

instrumen

the

Store

pulse

the

Store

4

APE/DISC

T

pulse

Store

N

4

STORE

In order to restore a known instrument state, you can

Pulse Menus

eral

Sev

DOMAIN, STIMULUS, and SYSTEM men

Pulse Configuration Menu

The new Pulse Conguration men

DETECTOR: WIDE BW

N

5

INST. STATE

new men

t

hardware

N

NN

N

5

STORAGE

instrument

N

NN

N

v

ha

us

state.

N

IS

state from

N

NN

N

1-8

een

b

e

N

NN

N

TAPE

N

created

N

STORE

Inst.

N

NN

N

INST. STATE

uisreac

N

NN

N

NN

to

N

MORE

State

NN

N

ort

supp

u structures.

hed by pressing

N

NN

N

HARDWARE

8.

N

NN

(POWER

the

N

NN

N

le on

state

are

hardw

and

le

state

e/disc

tap

N

NN

N

NN

pulse applications.

N

NN

UP)

4

RECALL

4

STATE

N

8

SYSTEM

as

N

NN

N

5

N

NN

N

FILE 8

N

NN

N

INST. STATE 8

NNNNNNNN

5

follo

N

FILE

N

.

N

MORE

ws:

N

NN

N

.

8

N

NN

N

These

NNNNNN

.

app

NNNNNNNNNNNNNNNNNNNNNNNNN

NNNNNNNN

PULSE CONFIG

ear

in

the

NNNNN

.

Selects

requency

F

domain.

11-2

wide

the

domain

Reference

bandwidth

(Preset

Data

path

IF

selects

and

Normal

detectors.

alw

BW);

Must

ys

a

rst

selected

e

b

automatically

man

ually

for

Pulse

Prole

DETECTOR: NORMAL BW

Selects the precision 10 kHz IF path and detectors (Preset).

PULSE WIDTH

Sets the width of the pulse from the HP 8510 rear panel. PULSE OUTPUT connector.

Range:06 res. periods to 40.88 ms; Preset 10s.

DUTY CYCLE

For internal triggering, sets the maximum allowed duty cycle. Range: 0 to 100 percent. Preset

10 percent.

PULSE OUT: HIGH

Selects the polarity of the TTL Pulse Output to High for the On p eriod of the pulse (Preset).

PULSE OUT: LOW

Selects the polarity of the TTL Pulse Output to Low for the On p eriod of the pulse.

rigger

T

MORE,

TRIGGER

Activ

measuremen

TRIG

Selects

TRIG

Selects

Mo

TRIGGER

DELAY

only

e

MODE:

in

the

MODE:

falling

the

MODE.

requency

in the

t

F

trigger

INTERNAL

ternal

measuremen

EXTERNAL

edge of

and

The

u.

Men

de

the measurement trigger.

T

new

domain,

actual

the

t

the TTL

rigger

Mo

used

measuremen

trigger

signal input

men

de

set

to

(Preset).

is

u

the

Range:

t.

at the

reac

dela

HP

hed

y

0

8510

b

y pressing

b

een

w

et

40.88

to

s

rear

STIMULUS,

in

the

ms;

panel

Preset

or

5

ternal

TRIGGER

external

s.



as

IN

Reference

Data

11-3

HP 8510 Option 008 Added Programming Codes

Following is the list of programming co des added for Option 008.

HP 8510 Option 008 Added Programming Codes

Programming Co de Description

DETENORB; DETEWIDB; Select Precision Detector (10 kHz

bandwidth) Select Wide Bandwidth Detector (1.5 MHz). Selected

automatically for PULP;.

DUTC

4

5

; Set duty cycle limit percentmaximum.

value

(Actual duty cycle can be less.)

EXTTOFF; EXTTPOIN; Select Internal measurement trigger.

Select External measurement trigger.

Select

high.

e

activ

or

s,

start

pulse

trigger

activ

w.

lo

e

Select Pulse

pulse

sets

pulse

s;



10

time.

Prole domain.

prole

PULOHIGH;

PULP;

alue(time

[v

W

PUL

alue(time

[v

TRID

PULOLO

sux)];

sux)]; Set

W;

Pulse

Select

Output

Pulse

PULSE

Pulse

Set

width.

200

ns,

minim

and

measurement

.

y

dela

Output

OFILE.

PR

Output

Automatically



1

ns,

um

sample

minim

resolution

span,

um

to

100

HP 8510 Option 008 Added Query Commands

F

ollo

wing

are

the

Query

commands

8510

HP

added

Option

for option

Added

008

008.

Query

Commands

DETE?; Detector Bandwidth

PULO?; Pulse Output

EXTT?; MeasurementTrigger mo de

Domain

11-4

Reference

DOMA?;

Data

Figure

11-1.

Option

008

Domain,

Stimulus,

and

System

Menus

Reference

Data

11-5

Agilent 8510B User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

Contents

Introduction

System Description

Principles of Pulsed-RF Network Measurements

Pulse Measurements Overview

Operating the HP 8510 for Pulsed-RF Measurements

Frequency Domain Point-in-Pulse Measurements

Pulse Profile Domain Measurements

General Timing Information

Using External Triggering and Pulse Modulation

High Power Measurements

Reference Data