Agilent 4294A Data Sheet

H

New Generation Precision Impedance Analyzer
for functionality and efficiency in engineering

1

profile

HP

Precision Impedance Analyzer

4294A

40 Hz to 110 MHz

2

The HP 4294A Precision Impedance Analyzer greatly supports accurate impedance measurement
and analysis of a wide variety of electronic devices (components and circuits) as well as electronic
and non-electronic material.

· Accurate measurement over wide impedance range and wide frequency range.

· Powerful impedance analysis functions.

· Ease of use and versatile PC connectivity.

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Based on HP's widely
accepted user-interface.

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Automatic
setup, measurement and
computation as well as
remote instrument control
is possible.

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Data or
setup files can be quickly
saved or recalled.

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Screen images,
data and setup files can be easily saved,
recalled, and shared (1.44Mbyte).

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Four-Terminal-pair measurement configuration
and the newest auto-balancing bridge technique
enable high accuracy and wide impedance range.

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Provides
highly repeatable and
reliable measurements.

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Powerful analysis tools available. 801 sweep
points, 4 traces (2 data traces and 2 memory traces), 8 markers, marker
analysis functions, and equivalent circuit analysis function.

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Another instrument control
method or simplified file sharing.

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Connects PCL3 printers directly
to the instrument.

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Display measurements on a
large VGA monitor. Reduces
eyestrain, improves team
work and communication.

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Automatic
measurement system is easily
configured with an external
instrument or computer.

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Control
other instrument(s) or use an
external controller (instrument
or computer) via 8bit or 24bit
programmable I/O port.

HP 4294A Precision Impedance Analyzer, NEW FEATURES

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Makes HP IBASIC program
development easier (mini
DIN keyboard).

Other components:

· Impedance evaluation of

printed circuit boards, relays,
switches, cables, batteries,
etc.

Materials:

Dielectric material:

· Permittivity and loss tangent

evaluation of plastics, ceram­ics, printed circuit boards and
other dielectric materials.

Magnetic material:

· Permeability and loss tan-

gent evaluation of ferrite,
amorphous and other magnet­ic materials.

Semiconductor material:

· Permittivity, conductivity

and C-V characterization of
semiconductor materials.

The following are applica­tion examples:

Electronic Devices:

Passive component:

· Impedance measurement of

two terminal components
such as capacitors, inductors,
ferrite beads, resistors, trans­formers, crystal/ceramic res­onators, multi-chip modules
or array/network components.

Semiconductor components:

· C-V characteristic analysis of

Varactor Diodes

· Parasitic analysis of a diode,

transistor, or IC package
terminal/leads.

· Amplifier input/output

impedance measurement.

The HP 4294A is a powerful
tool for design, qualification,
quality control, and produc­tion testing of electronic com­ponents. Circuit designers and
developers can also benefit
from the performance/func­tionality offered.

Moreover, the HP 4294A's
high measurement perform­ance and capable functionality
delivers a powerful tool to cir­cuit design and development
as well as materials research
and development (both elec­tronic and non-electronic
materials) environments.

40 Hz to 110 MHz

3

HP 4294A Key Specifications

(*1) 30% typical accuracy range: 3mΩ (100 Hz to 110MHz), 500MΩ(100Hz to 200kHz)

Operating Frequency: 40Hz to 110MHz, 1mHz resolution

Basic Impedance Accuracy:

±

0.08%

Q Accuracy:

±

3% (typical) @ Q=100, ≤10MHz

Impedance Range: 3mΩ to 500MΩ (∗1)

Measurement Time: 3 m sec / point @ f ≥ 500kHz, BW = 1 (Fast)

Number of points per sweep: 2 to 801 points

Measurement Type: 4 terminal pair measurement (Standard)

APC-7 One port measurement with HP 42942A (Measurable grounded devices )

Impedance probe measurement with HP 42941A (Measurable grounded devices )

Impedance Parameters: |Z|, |Y|, θ, R, X, G, B, L, C, D, Q

DC Bias: 0 to±40 V / 100 mA , 1mV / 40 µA resolution

Constant voltage / constant current mode, DC bias V/I monitor function

OSC Level: 5 mV to 1 Vrms / 200 µA to 20 mArms OSC level V/I monitor function

Sweep Parameter: Frequency, OSC level (V/I), DC bias (V/I)

Sweep Type: Linear, Log, List : Manual sweep mode : Up/Down sweep

Other Function: Equivalent circuit analysis function , Limit line function

Trace accumulate mode

Marker: 8 markers (one main marker and 7 sub markers)

Delta marker function, Marker search function (Max, Min, Peak, Next peak etc.)

Marker analysis function

4

This is due to the fact that
there are both capacitive and
inductive elements present in
real world components.
Component characteristics
cannot be expressed correctly
with a two-element model
when the model contains only
one single reactive element.
The HP 4294A equivalent cir­cuit function enables model­ing of the impedance vs. fre­quency characteristics with
three or four elements. This
function helps you design
quality circuits and effective
components.

Equivalent Circuit Analysis:

The equivalent circuit func­tion is used to fit a circuit
model to measured data, or to
simulate device performance
based on the value of each cir­cuit model element.

There is no ideal inductor (L),
capacitor(C), or resistor(R).
In reality, operating conditions
such as signal level and fre­quency determine the real­world performance of a device
based on the electronic char­acteristics of the device. An
ideal component of high quali­ty could be considered to
posses a single, perfect circuit
element over some frequency
range. However, in reality,
most components will resonate
as shown in these figures as
the frequency increases.

Accurate, real-world characterization of electronic components

The HP 4294A has been pro­grammed with five equivalent
circuit models to choose from.
This function automatically
extracts equivalent circuit
parameters from actual meas­urement data. The character­istics of the device under test
(DUT) or the material under

test (MUT) can be analyzed
with extracted model element
values.

NOTE: The simulation result
and the actual measurement
data can be displayed on the
same screen.

After taking a measurement,

11

select an appropriate circuit
model

22

44

Then compare the simulation
to the actual measurement
data. If the data does not
match, select a different
equivalent circuit model and
try again.

and extract the circuit model
parameters.

33

The HP 4294A employs a
state-of-the-art auto-balanc­ing-bridge technique in a four­terminal-pair (4TP) measure­ment configuration.
Meticulous circuit design
against distortion and instabil­ity resulted in a highly accu­rate and stable measurement
system for a wide impedance
range.

5

For evaluation of low-loss
devices:

With the trend toward lower
power consumption and com­pact equipment, inductors
and capacitors are becoming
smaller with lower loss. The
efficiency improvement in

For evaluating devices with
wide impedance range

A wide impedance range is
required to accurately meas­ure both resonant impedance
and anti-resonant impedance
of crystal/ceramic resonators.

The HP 4294A covering sever-

al decades (m Ω to hundreds
of M Ω) of impedance can

measure resonator character­istics accurately.

The dynamic range of the HP
4294A in terms of impedance
is more than 200dB. When
compared to that of a general
network analyzer with a direc­tional bridge, at 80dB, it is
clear, the HP 4294A has an
extremely broad impedance­measurement range.

0%

10%

20%

30%

40%

50%

60%

70%

80%

90%

100%

100 1k 10k 100k 1M 10M 110M

Q accuracy %

Frequency (Hz)

Q=100

Q=300

Q=500

HP 4294A Q accuracy (typical)
OSC level = 250mV

Low-loss capacitor ESR
(Equivalent Series Resistance)

measurement (100µF ceramic C)

1m Ω

Q ≥ 200

High Q inductor measurement
(Low-loss)

100 1k 10k 100k 1M 10M 110M

Impedance Ω

Frequency (Hz)

30%

10%

1m

10m

100m

1

10

100

1k

10k

100k

1M

10M

100M

1G

30%

10%

Crystal resonator impedance
measurement

SMD capacitor impedance
measurement (using the HP
42942A)

3.3pF

56pF

470pF

4700pF

0.047µF

10m Ω

Impedance measurement
range (typical)

1 Ω

1G Ω

3M Ω

6 Ω

State-of-the-art technology for improved measurement performance

power conversion for switch­ing power supply applications
is an example. These applica­tions require low-loss induc­tors and capacitors.

6

Signal level dependency: Efficient analysis with the

list sweep function

Signal level dependency of a
ceramic capacitor with high
permittivity (signal-level

swept from 5mV to 1V, 0.1 µF

capacitor at 1kHz)

The impedance characteristics
of some devices change dras­tically as a function of the sig­nal level. The HP 4294A can
sweep test signal voltage,
5mVrms to 1Vrms(1mV reso­lution), or test signal current

200µArms to 20µArms(20µA

resolution) to evaluate signal
level dependency.

DC level dependency:

Varactor diode capacitance vs.
DC voltage characteristic.
DC bias sweep from 0V DC to
5V DC. f=1MHz

The DC component of an
applied signal often affects
device impedance. The HP
4294A can sweep either the
DC voltage bias from -40V to
+40V (with 1mV resolution)
or the DC current bias from

-100mA to +100mA (with

40µA resolution) to evaluate

DC signal dependency. This
capability also empowers
analysis of the DC-voltage bias
dependency for C-V charac­terization of varactor diodes
or other DC-voltage bias
dependent devices. The DC
level dependency figure shows
an example of varactor diode
measurement.

The DC Bias Auto Level
Control (ALC) function, based
on a feedback loop technique,
accurately maintains the
applied DC voltage bias or
current bias. While the imped­ance of a device might change
during a sweep, this ALC
function insures that the sig­nal level setting is the actual
signal level applied to the
DUT.

The list sweep function
enables different measure­ment setups in a single sweep
by dividing the sweep range
into segments. The measure­ment setup, including the fre­quency range, averaging time,
measurment bandwidth, test
signal level (V or A), and DC
bias can be different for each
segment. The frequency range
of each segment can be con­tinuous, separated or over­lapped.

Evaluation of a crystal res­onator requires that the nomi­nal resonant frequency, the
nominal anti-resonant fre­quency and some spurious
frequencies be determined.
These parameters can be effi­ciently measured by setting an
appropriate frequency range
for each segment.

Impedance Analysis under Various Operating Conditions

Sweep, Display and Markers

7

Accumulation of resonance vs.
temperature data for a ceram­ic capacitor

Marker functions

Peak search, Next
Peak search, Max/
Min search, band­width search, and
other marker

Data/Memory trace

A data trace and a memory
trace are available at each
channel. The underlying data
can be saved as the memory
trace. Some simple calcula­tions are possible with Data
Math functions.

List Sweep mode

Superimpose and compare
measurement data on the same
display by setting the list sweep
segments to the same frequency
range with different DC Bias or
test signal levels. Markers can be
used on each trace.

Superimpose Trace
(Accumulate) mode

This mode is used to observe
an intermittent event or a
change in the characteristic
performance of a device over
time.

Up Sweep / Down Sweep

Control the sweep direc­tion. Sweep frequency,
test signal level, or DC
bias from lower to higher
or higher to lower value.

DC Bias / Test Signal Level Monitor

Accurate reading of the DC Bias or
test signal level.

Manual Sweep function

Iterative measurements
at a user designated
point. After measuring
the overall perform­ance of a device within
a wide range, you can
evaluate the character­istic at a specific point.

Trace Statistics

Average, standard deviation
and peak of each trace.

Capacitance variations of
ceramic capacitor (2.2µF) with
high permittivity measured by
stepping the test signal level
from 0.1V to 0.9V in 0.2V step
(five list sweep segments).

Inductor DC dependency

characteristics (100µH induc-

tor at 100kHz) UP and DOWN
DC current bias sweep from

-100mA to +100mA Hysteresis
is observed.

7 sub markers

Measurement and frequency
data are displayed as sub
marker softkey labels.

Ceramic resonator
measurement

Scale

Log or Linear

Sweep type

Log, Linear or List

Powerful functions for Efficient Evaluation

3 multi-trace modes for comparison evaluation

8

HP IBASIC programming
function

HP Instrument BASIC (HP
IBASIC) is a programming
language developed from HP
BASIC programming language.
The keystroke recording func­tion helps to easily develop
automatic measurement pro­gram with front panel keys.
When a key is pressed, the
HP-IB command correspon­ding to the key is automatical­ly recorded in the program.
Writing or editing programs
the old fashioned way is made
easier with the mini-DIN key­board.

One touch HP IBASIC pro­gram execution

When you press the softkey
with the file name of an IBA­SIC program saved in either
internal memory or floppy
disk, the program is automati­cally downloaded and execut­ed. Once customized IBASIC
programs are developed,
quick measurement and data
analysis is possible because
each program works as if it is
a built-in function.

Limit Test

Limit test of PIN diode imped­ance.
4 segment list sweep with dif­ferent DC bias voltages and
different frequency ranges
using constant DC bias volt­age (ALC) mode.

Labs today often require sys­tem configurations in which
test instruments interact with
other instruments or hand­shake with external computers.

HP 4294A functions that sup­port efficient systems:

· HP Instrument BASIC pro-

gramming function for auto­matic measurement or external
measurement instrument con­trol without an external com­puter.

· List Sweep function for meas-

uring only at desired points.

· Limit line function for Go/No-

Go testing.

· Built-in 10Mbyte non-volatile

memory for quickly save/recall
data/setup.

· Two types programmable dig-

ital I/O port (24bit and 8 bit)
for data transfer with external
device such as sensor, and for
external device control.

· LAN interface for networking

with computers.

The LAN I/F dramatically
expands the ability to share
files, data, or instrument con­trol. Measurement setup,
result, and graphics files can
be transferred via FTP (File
Transfer Protocol) to or from
the instrument.

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HP 4294A Interfaces

The HP 4294A has VGA out­put on the rear panel.
Automatic test or component
adjustment in production line
or QA test can easily be per­formed with a large external
monitor.

A Feature with high visibility

Easy, automatic measurement system configurations

The HP 42942A Terminal Adapter
converts the four-terminal-pair
port configuration to an APC-7
port. This adapter permits the
use of familiar APC-7 (7mm) test
fixtures.

Again, grounded measurement is
available.

Key specification:
Frequency: 40Hz - 110 MHz
DC Bias: 0 to ± 40 V
Operation temperature range:
0° to 40° C
Basic Impedance accuracy: ±0.6%

HP 42942A Terminal Adapter:

Material Test Fixtures:

The HP 42941A Impedance Probe enables

in-circuit impedance measurement of elec­tronic circuits or components. Grounded
devices can also be measured.

Key specification:
Frequency: 40Hz - 110 MHz
DC BIAS: 0 to ± 40 V
Operation temperature range: -20° to 75° C
Basic Impedance Accuracy: ±0.8%

9

Use of a dielectric material fix-

ture such as the HP 16451B or

the HP 16452A allows accurate

dielectric material measure-

ment. Permeability of magnetic

materials can also be evaluated

with the HP 42942A and HP

16454A magnetic material test

fixture. Automatic measurement

and permittivity/permeability

analysis can easily be performed

by using built-in IBASIC or by

I/O to a computer where the

analysis can be performed.

DUT. These HP extension acces­sories operate over the entire
frequency and temperature
range (40 Hz to 110 MHz, -20° C
to +150° C) of the HP 4294A.

HP 42941A Impedance probe

Other accessories:

When a DUT cannot be posi-

tioned near the instrument, a

4TP extension (HP 16048G: 1m

or HP 16048H: 2m) can be used

to extend the test station to the

Accessories for various measurement needs

10

HP 42942A Terminal Adapter

Converts four-terminal-pair port
configuration to an APC-7 port.

Items Included:

· APC-7 Open reference

· APC-7 Short reference

· APC-7 50Ω reference

· Operation manual/Specification

sheet

Option:

001 Delete Open/Short/50Ω ref-

erences

Accessories Available:

HP 42941A Impedance

Probe kit

Convert four-terminal-pairs

port configuration to a one

port probe.

Furnished items:

· Impedance Probe with 1.5m

cable

· Short reference

· 50Ω reference

· BNC Adapter

· Ground lead

· Clip lead

· Three spare pins

· Operation manual and spec

ification sheet

HP 4294A Precision
Impedance Analyzer

Accessories Included:

· 100Ω Load Resistor for Four-

Terminal-Pair Extension

· Mini DIN Keyboard for HP

IBASIC

· Sample Program Disk

· Operation Manual

· Power Cable

Options:

· 1A2 Delete Mini DIN Keyboard

· 1D5 High-stability Frequency

Reference

· ABA English Localization

· UK6 Commercial Calibration

Certificate with test data

· 1CM Rack Mount Kit

· 1CN Front Handle Kit

· 1CP Rack Mount and Front

Handle Kit

Accessories Available:

Four-terminal-pair test leads
(HP 16048G / HP 16048H):

1m/2m four-terminal-pair port
extension cable with BNC con­nectors.
Frequency: 40Hz - 110 MHz
DC Bias: 0 ± 40 V
Operation Temperature range:

-20° to 150° C
Cable length: 1m (HP 16048G)

2m (HP 16048H)

Ordering Information:

HP 16192A (DC - 2GHz)

This fixture uses side elec­trode contacts 0603 (1608) or
larger size components.
Notes: The HP 42942A
adapter is required.

Fixtures for SMD components

HP 16034G

0201 (0603) to 1206 (3216) size

components. Maximum dimen-

sions: 5mm(L) x 1.6mm (W) x1.6mm(H)

HP 16047A/D (DC - 3MHz/40MHz)

For leaded components. These
fixtures use spring actuated
clamps to hold device leads.

HP 16092A (DC - 500MHz)

For leaded or surface mount
(SMD) components.
Attachments for leaded or SMD
components are provided.
Notes: The HP 42942A adapter
is required.

HP 16093A/B (DC-250MHz)

This is a binding post type

fixture. Notes: The HP

42942A adapter is required.

Fixtures for leaded compo­nents

HP 16047E (DC - 110 MHz)

For leaded components. This
fixture features the capability
to clamp the leads between
the electrodes and adjust the
pressure. A guard terminal is
provided for three port device
measurements.

Accessories Provided:

Shorting Plate
HP 4294A Mounting Tool

11

HP 16092A (DC - 500MHz)

For leaded or surface mount
(SMD) components.
Attachments for leaded or SMD
components are provided.
Notes: The HP 42942A adapter
is required.

HP 16044A (DC - 10MHz)

Features a Kelvin Connection

suitable for low impedance

measurement of 0603 (1608)

size components or larger.

Maximum dimensions:

8mm(L) x 8mm(W) x 3mm(H)

HP 16034E (DC - 40MHz)

0603 (1608) or larger size com-

ponents can be measured.

Maximum dimensions:

8mm(L) x 10mm(W) x 8mm(H)

HP 16191A/16193A (DC - 2GHz)

These fixtures use surface elec­trode contacts, where the
HP16191A is for 0805 (2012)
size components or larger, and
the HP16193 is for 0603 (1608)
to 1206 (3216) size components.
Notes: The HP 42942A adapter
is required.

Fixtures

H

12

Material Test Fixtures:

HP 16451B

A dielectric material test fixture,
with parallel plate electrodes.

For more information about
Hewlett-Packard Test and Measurement
products, applications, services, and for a
current sales office listing, visit our web
site, http://www.hp.com/go/tmdir. You can
also contact one of the following centers
and ask for a test and measurement sales
representative.

UUnniitteedd SSttaatteess::
Hewlett-Packard Company
Test and Measurement Call Center
P.O. Box 4026
Englewood, CO 80155-4026
1 800 452 4844

CCaannaaddaa::
Hewlett-Packard Canada Ltd.
5150 Spectrum Way
Mississauga, Ontario
L4W 5G1
[phone]

EEuurrooppee::
Hewlett-Packard
European Marketing Centre
P.O. Box 999
1180 AZ Amstelveen
The Netherlands
(31 20) 547 9900

JJaappaann::
Hewlett-Packard Japan Ltd.
Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi,
Tokyo 192, Japan
Tel: [phone]
Fax: [phone]

LLaattiinn AAmmeerriiccaa::
Hewlett-Packard
Latin American Region Headquarters
5200 Blue Lagoon Drive, 9th Floor
Miami, Florida 33126, U.S.A.
Tel: [phone]

[phone]

Fax: [phone]

AAuussttrraalliiaa//NNeeww ZZeeaallaanndd::
Hewlett-Packard Australia Ltd.
31-41 Joseph Street
Blackburn, Victoria 3130, Australia
1 800 629 485

AAssiiaa PPaacciiffiicc::
Hewlett-Packard Asia Pacific Ltd.
17-21/F Shell Tower, Times Square,
1 Matheson Street, Causeway Bay,
Hong Kong
Tel: [phone]
Fax: [phone]

Data subject to change
Copyright © 1999
Hewlett-Packard Company
Printed in U.S.A. 03/99
55996688--33880088EE

HP 16454A (1MHz-1.8GHz)

Fixture for troidal magnetic
material. Notes: The HP 42942A
adapter is required.

(Please refer to the accessories
selection guide for more details
of fixtures and accessories.)

Special Purpose Accessories:

HP 16065A

(50Hz - 2MHz)

External DC bias adapter to +/- 200V.
Notes: For leaded components.

40 Hz to 110 Mhz

HP 16452A (20Hz - 30MHz)

Liquid test fixture.