Specifications describe the instrument’s warranted
performance over the temperature range of 0°C to
40°C (except as noted). Supplemental characteristics are intended to provide information that is
useful in applying the instrument by giving nonwarranted performance parameters.
These are denoted as “typical,” “nominal,” or
“approximate.” Warm-up time must be greater than
or equal to 30 minutes after power on for all specifications. Specifications of the stimulus characteristics and measurement accuracy are defined at
the tip of APC-7 connector on the test head connected to the instrument.
Compensation function . . . . . . . . . . . . . . . . . .Open/Short/Load compensation, Port extension, Electric length
4
Agilent 4291B RF Impedance/Material Analyzer
Measurement Accuracy
Conditions of accuracy specifications
• Open/Short/50 Ω calibration must be done. Calibration ON.
• Averaging (on point) factor is larger than 32 at which calibration is done if Cal points is set to
USER DEF.
• Measurement points are same as the calibration points.
• Environmental temperature is within ±5°C of temperature at which calibration is done, and within l3°C
to 33°C. Beyond this environmental temperature condition, accuracy is twice as bad as specified.
and Yodepend on number of point averaging (Nav), OSC level (V
s
value (Z
) and the test head used as follows:
x
), impedance measurement
OSC
5
Agilent 4291B RF Impedance/Material Analyzer
Table 1-1. Zsand YoWhen High Impedance Test Head Is Used
Measurement Conditions
Number
of PointMeas.
AveragingOSC Signal Level Impedance
(Nav)(V
1 ≤ N
≤ 70.02V ≤ V
av
)(Z
osc
V
< 0.02V–x (0.2 + 0.001 x f
osc
< 0.12V–0.2 + 0.001 x f
osc
)Z
x
[Ω]Y
S
0.02
V
osc
[MHz]
[S]
o
0.02
)x (5 x 10–5+ 2 x 10–7x f
[MHz]
V
osc
5 x 10–5+ 2 x 10–7x f
[MHz]
[MHz]
)
N
≥ 80.02V ≤ V
av
0.12V ≤ V
0.12V ≤ V
osc
V
< 0.02V–x (0.1 + 5 x 10–4x f
osc
< 0.12V–0.1 + 5 x 10–4x f
osc
osc
Z
≥ 500 Ω0.2 + 0.001 x f
x
Z
< 500 Ω0.2 + 0.001 x f
x
Z
≥ 500 Ω0.1 + 5 x 10
x
Z
< 500 Ω0.1 + 5 x 10
x
Table 1-2. Zsand YoWhen Low Impedance Test Head Is Used
Measurement Conditions
Number
of PointMeas.
AveragingOSC Signal Level Impedance
(Nav)(V
1 ≤ N
≤ 70.02V ≤ V
av
)(Z
osc
V
< 0.02V–x (0.1 + 0.001 x f
osc
< 0.12V–0.1 + 0.001 x f
osc
0.12V ≤ V
osc
)Z
x
Z
≤ 5 Ω0.01 + 0.001 x f
x
[MHz]
[MHz]
0.02
V
osc
[MHz]
–4
x f
[MHz]
–4
x f
[MHz]
[Ω] Y
S
0.02
V
osc
[MHz]
[MHz]
5 x 10–6+ 2 x 10–7x f
2 x 10–5+ 2 x 10–7x f
0.02
)x (2 x 10
[MHz]
V
osc
2 x 10
2 x 10
7 x 10
o
0.02
)x (1 x 10–4+ 2 x 10–7x f
[MHz]
V
osc
[S]
–5
+ 1 x 10
–6
+ 1 x 10
–6
+ 1 x 10
–5
+ 1 x 10
1 x 10–4+ 2 x 10-7x f
1 x 10–4+ 2 x 10–7x f
[MHz]
[MHz]
–7
x f
)
[MHz]
–7
x f
[MHz]
–7
x f
[MHz]
–7
x f
[MHz]
)
[MHz]
[MHz]
[MHz]
Z
N
≥ 80.02V ≤ V
av
0.12V ≤ V
> 5 Ω0.05 + 0.001 x f
x
V
< 0.02V–x (0.05 + 5 x 10
osc
< 0.12V–0.05 + 5 x 10–4x f
osc
Z
osc
≤ 5 Ω0.01 + 5 x 10
x
Z
> 5 Ω0.02 + 5 x 10
x
0.02
V
osc
[MHz]
–4
x f
[MHz]
[MHz]
–4
x f
[MHz]
–4
x f
[MHz]
1 x 10–4+ 2 x 10–7x f
0.02
)x (3 x 10–5+ 1 x 10–7x f
V
osc
3 x 10–5+ 1 x 10–7x f
3 x 10–5+ 1 x 10–7x f
3 x 10–5+ 1 x 10–7x f
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
At the following frequency points, instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics.
See “EMC” under “Others” in “General Characteristics.”
6
Agilent 4291B RF Impedance/Material Analyzer
Figure 1-3. Impedance Measurement Accuracy Using High Impedance Test Head (@ Low OSC Level)
Figure 1-4. Impedance Measurement Accuracy Using High Impedance Test Head (@ High OSC Level)
7
Agilent 4291B RF Impedance/Material Analyzer
Figure 1-5. Impedance Measurement Accuracy Using Low Impedance Test Head (@ Low OSC Level)
Figure 1-6. Impedance Measurement Accuracy Using Low Impedance Test Head (@ High OSC Level)
8
Agilent 4291B RF Impedance/Material Analyzer
Typical measurement accuracy when open/short/50 Ω/low-loss-capaciter calibration is done
Conditions
• Averaging on point factor is larger than 32 at which calibration is done.
• Cal Points is set to USER DEF.
• Environmental temperature is within ±5°C of temperature at which calibration is done, and within 13°C
to 33°C. Beyond this environmental temperature condition, accuracy is twice as bad as specified.
DC bias . . . . . . . . . . . . . . . . . . . . . . . . . . . Twice as bad as specifications of dc level accuracy (typical)
11
Options 013 and 014 High Temperature Test Heads
Basic Measurement Accuracy
Conditions of accuracy specifications
• OPEN/SHORT/50 Ω calibration must be done. Calibration ON.
• Averaging (on point) factor must be larger than 32 at which calibration is done.
• Measurement points are same as the calibration points.
• Environmental temperature is within ±5°C of temperature at which calibration is done, and within 13°C
to 33°C. Beyond this environmental temperature condition, and within 0°C to 40°C, accuracy is twice as
bad as specified.
• Bending cable should be smooth and the bending angle is less than 30°.
• Cable position should be kept in the same position after calibration measurement.
• OSC level must be same as level at which calibration is done.
• OSC level is less than or equal to 0.25 V, or OSC level is greater than 0.25 V and frequency range is
within 1 MHz to 1 GHz.
and Yodepend on number of point averaging (Nav) and OSC level (V
s
Z
: Impedance measurement value [Ω]
x
) as follows:
osc
12
Options 013 and 014 High Temperature Test Heads
Table 1-3. Zsand YoWhen High Impedance Test Head Is Used
Measurement Conditions
Number
of Point
AveragingOSC Signal Level
(Nav)(V
1 ≤ N
≤ 70.02V ≤ V
av
8 < N
av
1
)
osc
0.12V ≤ V
0.02V ≤ V
Z
[Ω]Y
S
V
< 0.02x (0.2 + 0.001 x f
osc
< 0.120.2 + 0.001 x f
osc
osc
V
< 0.02x (0.1 + 0.001 x f
osc
< 0.120.1 + 0.001 x f
osc
0.02
V
osc
0.2 + 0.001 x f
0.02
V
osc
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
[S]
o
0.02
)x (5 x 10–5+ 2 x 10–7x f
V
osc
–5
5 x 10
+ 2 x 10–7x f
–6
3 x 10
+ 2 x 10–7x f
)x (2 x 10–5+ 2 x 10–7x f
0.02
V
osc
2 x 10–5+ 2 x 10–7x f
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
)
)
1. V
= 0.12V l
osc
= 3 mA P
osc
0.12V ≤ V
= –10 dBm, V
OSC
osc
= 0.02V l
osc
= 0.5 mA P
osc
= –26 dBm
osc
Table 1-4. Zsand YoWhen Low Impedance Test Head Is Used
Measurement Conditions
Number
of Point
AveragingOSC Signal Level
(Nav)(V
1 ≤ Nav≤ 70.02V ≤ V
8 < N
av
1. V
= 0.12V l
osc
= 3 mA P
osc
1
)
osc
0.12V ≤ V
0. 02V ≤ V
0.12V ≤ V
= –10 dBm, V
OSC
V
< 0.02x (0.1 + 0.001 x f
osc
< 0.120.1 + 0.001 x f
osc
osc
V
< 0.02x (0.05 + 0.001 x f
osc
< 0.120.05 + 0.001 x f
osc
osc
= 0.02V l
osc
= 0.5 mA P
osc
= –26 dBm
osc
0.1 + 0.001 x f
Z
[Ω] Y
S
0.02
V
osc
[MHz]
[MHz]
0.05 + 0.001 x f
0.02
V
osc
0.03 + 0.001 x f
2 x 10–5+ 2 x 10–7x f
[S]
o
0.02
)x (1 x 10–4+ 2 x 10–7x f
[MHz]
V
osc
1 x 10–4+ 2 x 10–7x f
[MHz]
[MHz]
[MHz]
[MHz]
1 x 10–4+ 2 x 10–7x f
0.02
)x (3 x 10–5+ 2 x 10–7x f
V
osc
3 x 10–5+ 2 x 10–7x f
3 x 10–5+ 2 x 10–7x f
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
[MHz]
)
)
At the following frequency points, instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics.
See “EMC” under “Others” in “General Characteristics.”
The excessive vibration and shock could occasionally cause measurement errors to exceed specified values.
13
Options 013 and 014 High Temperature Test Heads
Figure 1-8. Impedance Measurement Accuracy Using High Temperature High Impedance Test Head (@ Low OSC Level)
Figure 1-9. Impedance Measurement Accuracy Using High Temperature High Impedance Test Head (@ High OSC Level)
14
Options 013 and 014 High Temperature Test Heads
Figure 1-10. Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head (@ Low OSC Level)
Figure 1-11. Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head (@ High OSC Level)
15
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