Agilent 4291B Data Sheet

Agilent 4291B

RF Impedance/Material Analyzer

Data Sheet

Overview

Specifications describe the instrument’s warranted
performance over the temperature range of 0°C to
40°C (except as noted). Supplemental characteris­tics are intended to provide information that is
useful in applying the instrument by giving non­warranted performance parameters.

These are denoted as “typical,” “nominal,” or
“approximate.” Warm-up time must be greater than
or equal to 30 minutes after power on for all speci­fications. Specifications of the stimulus character­istics and measurement accuracy are defined at
the tip of APC-7 connector on the test head con­nected to the instrument.

Figure 1-1

Agilent 4291B RF Impedance/Material Analyzer

Measurement Parameters

Impedance parameters

|Z|, θ

, |Y|, θ

z

Stimulus Characteristics

Frequency Characteristics

Operating frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 MHz to 1.8 GHz

Frequency resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 mHz

Frequency reference

Accuracy

@ 23±5°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . < ±10 ppm

Precision frequency reference (Option 1D5)

Accuracy

@ 0°C to 40°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . < ±1 ppm

Source Characteristics

OSC level

Voltage range

@ 1 MHz ≤ Frequency ≤ 1 GHz (When terminal is open) . . . . . . . . . . . . . . . . . . . . . 0.2 mV

@ 1 GHz < Frequency ≤ 1.8 GHz (When terminal is open) . . . . . . . . . . . . . . . . . . . 0.2 mV

, R, X, G, B, Cp, Cs, Lp, Ls, Rp, R

y

, D, Q, |Γ|, θy, Γx, Γ

s

y

to 1 V

rms

rms

to 0.5 V

rms

rms

Current range

@ 1 MHz ≤ Frequency ≤ 1 GHz (When terminal is shorted). . . . . . . . . . . . . . . . . . . 4

@ 1 GHz < Frequency ≤ 1.8 GHz (When terminal is shorted). . . . . . . . . . . . . . . . . . 4

µ

A

rms

µ

A

rms

Power range

@ 1 MHz ≤ Frequency ≤ 1 GHz (When terminating with 50 Ω). . . . . . . . . . . . . . . . . –67 dBm to 7 dBm

@ 1 GHz < Frequency ≤ 1.8 GHz (When terminating with 50 Ω) . . . . . . . . . . . . . . . –67 dBm to 1 dBm

OSC level resolution

AC voltage resolution

0.22 V
70 mV
22 mV
7 mV

2.2 mV

0.7 mV

0.2 mV

rms

rms

rms

rms

rms

rms

rms

< V

< V
< V

< V

< V

< V

≤ V

OSC

OSC

OSC

OSC

OSC

OSC

OSC

≤ 1 V

rms

≤ 220 mV

≤ 70 mV

≤ 22 mV

≤ 7 mV
≤ 2.2 mV
≤ 0.7 mV

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 mV

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.05 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.02 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.005 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.002 mV

rms

to 20 mA
to 10 mA

rms

rms

2

Agilent 4291B RF Impedance/Material Analyzer

AC current resolution

4.4 mA

1.4 mA

0.44 mA
140
44

µ

14

µ

4

µ

A

AC power resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.1 dBm

OSC level accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A + B +

where,

A depends on temperature conditions as follows:

@ within referenced to 23±5°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 dB

@ other environmental temperature conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 dB

B depends on OSC level as follows:

@ V
(I
(P

rms

rms

rms

µ

A

rms

A

rms

A

rms

≤ I

rms

OSC

≥ 5 mA

OSC

≥ –5 dBm)

OSC

< I

OSC

< I

OSC

< I

OSC

< I

OSC

< I

≤ 140

OSC

< I

≤ 44

OSC

≤ 14

OSC

≥ 250 mV

rms

≤ 20 mA
≤ 4.4 mA

≤ 1.4 mA

≤ 440

µ

µ

A

µ

A

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 µA

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 µA

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 µA

rms

µ

yA

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 µA

rms

A

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.4 µA

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.1 µA

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.04 µA

6

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 dB

rms

)

[dB]

 f

1800

[MHz]

dB

@ 250 mV
(5 mA

rms

(–5 dBm > P

rms

> I

OSC

OSC

> V

OSC

≥ 2.5 mV

≥ 50

≥ –45 dBm)

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 dB

rms

µ

A

)

rms

@ other OSC level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 dB

Definition of OSC level

• Voltage level: 2  voltage level across the 50 Ω which is connected to the output terminal (This level is

approximately equal to the level when a terminal is open.)

• Current level: 2  current level through the 50 Ω which is connected to the output terminal (This level is

approximately equal to the level when a terminal is shorted.)

• Power level: when terminating with 50 Ω

OSC level accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1

/2 of specification value (typical)

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . APC-7

Output impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Ω (Nominal value)

DC bias (Option 001)

DC voltage level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to ±40V

DC current level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

DC level resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 mV, 20

µ

A to 100 mA and –20 µA to –100 mA

µ

A

DC level accuracy

@ 23±5°C

Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.1 % + 4 mV + (I

Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 % + 30

µ

A + (V

dc [mA]

dc [V]

 5

/10

[Ω]

[kΩ]

) mV

) mA
@ 8 to 18°C and 28 to 38°C

Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 % + 8 mV + (I

Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 % + 60

µ

A + (V

dc [mA]

dc [v]

 10

/5

[Ω]

[kΩ]

) mV

) mA
@ 0 to 8°0C and 38 to 40°C

Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 % + 12 mV + (I

Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5 % + 90

µ

A + (V

dc [V]

dc [mA]

 3/10

 15

[Ω]

[kΩ]

) mV

) mA

3

Agilent 4291B RF Impedance/Material Analyzer

Level monitor

Monitor parameters . . . . . . . . . . . . . . . . . . . . . . . . . OSC level (voltage, current), DC bias (voltage, current)

Monitor accuracy

OSC level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Same as OSC level accuracy (typical)

DC bias . . . . . . . . . . . . . . . . . . . . . . . . . . Twice as bad as specifications of dc level accuracy (typical)

Sweep Characteristics

Figure 1-2. DC Voltage and Current Level Range (Typical)

Sweep parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . Frequency, OSC level (voltage), DC bias voltage/current

Sweep setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Start Stop, or Center Span

Sweep type

Frequency sweep . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Linear, Log, Zero-span, List

Other sweep parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Linear, Log, Zero-span

Sweep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Continuous, Single, Manual, Number of groups

Sweep direction

AC level, DC bias (voltage and current) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Up sweep, Down sweep

Other sweep parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Up sweep

Number of measurement points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 to 801 points

Averaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Sweep average, Point average

Delay time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Point delay time, Sweep delay time

Measurement circuit mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Series circuit mode, parallel circuit mode

Calibration/Compensation

Calibration function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Open/Short/50 Ω calibration, Low loss calibration

Compensation function . . . . . . . . . . . . . . . . . .Open/Short/Load compensation, Port extension, Electric length

4

Agilent 4291B RF Impedance/Material Analyzer

Measurement Accuracy

Conditions of accuracy specifications

• Open/Short/50 Ω calibration must be done. Calibration ON.

• Averaging (on point) factor is larger than 32 at which calibration is done if Cal points is set to
USER DEF.

• Measurement points are same as the calibration points.

• Environmental temperature is within ±5°C of temperature at which calibration is done, and within l3°C
to 33°C. Beyond this environmental temperature condition, accuracy is twice as bad as specified.

|Z|, |Y| Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

The illustrations of |Z| and |Y| accuracy are shown in Figures l-3 to 1-6.

θ Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±

L, C, X, B Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

R, G Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

a

a

D Accuracy (∆D)

Ea+ E

@ |D

tan ( )| < 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± .

x

Especially, @ D

Q Accuracy (∆Q)

@ |Q

tan ( )| < 1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± .

x

Especially, @ ≥ Q

(E

b

100

≤ 0.1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±

x

Ea + E

b

100

10

+ Eb)

a

≥ 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±Q

x

+ Eb) [%]

a

(E

+ Eb)

a

100

+ Eb)  (1 + D
+ Eb)  (1 + Q

(1 + D

2

)tan ( )

x

1  Dxtan ( )

E

(E

[rad]

2

x

2

x

E

a

100

+ E

a

100

+ Eb)

a

) [%]
) [%]

+ E

b

100

+ E

E

(1 + Q

2

)tan ( )

x

(1  Qx)tan ( )

a

100

+ E

E

a

100

(Ea + Eb)

2

x

100

b

b

b

±

Where,

D

: Measured vaulue of D

x

E

: depends on measurement frequency as follows:

a

@ 1 MHz ≤ Frequency ≤ 100 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6

@ 100 MHz < Frequency ≤ 500 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.8

@ 500 MHz < Frequency ≤ 1000 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.2

@ 1000 MHz < Frequency ≤ 1800 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.0

E

= (Zs/|Zx| + Yo|Zx|  100

b

Q

: Measured value of Q

x

Z

: impedance measurement value [Ω]

x

Z

and Yodepend on number of point averaging (Nav), OSC level (V

s

value (Z

) and the test head used as follows:

x

), impedance measurement

OSC

5

Agilent 4291B RF Impedance/Material Analyzer

Table 1-1. Zsand YoWhen High Impedance Test Head Is Used

Measurement Conditions

Number
of Point Meas.
Averaging OSC Signal Level Impedance
(Nav)(V

1 ≤ N

≤ 7 0.02V ≤ V

av

)(Z

osc

V

< 0.02V – x (0.2 + 0.001 x f

osc

< 0.12V – 0.2 + 0.001 x f

osc

)Z

x

[Ω]Y

S

0.02

V

osc

[MHz]

[S]

o

0.02

) x (5 x 10–5+ 2 x 10–7x f

[MHz]

V

osc

5 x 10–5+ 2 x 10–7x f

[MHz]

[MHz]

)

N

≥ 8 0.02V ≤ V

av

0.12V ≤ V

0.12V ≤ V

osc

V

< 0.02V – x (0.1 + 5 x 10–4x f

osc

< 0.12V – 0.1 + 5 x 10–4x f

osc

osc

Z

≥ 500 Ω 0.2 + 0.001 x f

x

Z

< 500 Ω 0.2 + 0.001 x f

x

Z

≥ 500 Ω 0.1 + 5 x 10

x

Z

< 500 Ω 0.1 + 5 x 10

x

Table 1-2. Zsand YoWhen Low Impedance Test Head Is Used

Measurement Conditions

Number
of Point Meas.
Averaging OSC Signal Level Impedance
(Nav)(V

1 ≤ N

≤ 7 0.02V ≤ V

av

)(Z

osc

V

< 0.02V – x (0.1 + 0.001 x f

osc

< 0.12V – 0.1 + 0.001 x f

osc

0.12V ≤ V

osc

)Z

x

Z

≤ 5 Ω 0.01 + 0.001 x f

x

[MHz]

[MHz]

0.02

V

osc

[MHz]

–4

x f

[MHz]

–4

x f

[MHz]

[Ω] Y

S

0.02

V

osc

[MHz]

[MHz]

5 x 10–6+ 2 x 10–7x f

2 x 10–5+ 2 x 10–7x f

0.02

) x (2 x 10

[MHz]

V

osc

2 x 10

2 x 10

7 x 10

o

0.02

) x (1 x 10–4+ 2 x 10–7x f

[MHz]

V

osc

[S]

–5

+ 1 x 10

–6

+ 1 x 10

–6

+ 1 x 10

–5

+ 1 x 10

1 x 10–4+ 2 x 10-7x f

1 x 10–4+ 2 x 10–7x f

[MHz]

[MHz]

–7

x f

)

[MHz]

–7

x f

[MHz]

–7

x f

[MHz]

–7

x f

[MHz]

)

[MHz]

[MHz]

[MHz]

Z

N

≥ 8 0.02V ≤ V

av

0.12V ≤ V

> 5 Ω 0.05 + 0.001 x f

x

V

< 0.02V – x (0.05 + 5 x 10

osc

< 0.12V – 0.05 + 5 x 10–4x f

osc

Z

osc

≤ 5 Ω 0.01 + 5 x 10

x

Z

> 5 Ω 0.02 + 5 x 10

x

0.02

V

osc

[MHz]

–4

x f

[MHz]

[MHz]

–4

x f

[MHz]

–4

x f

[MHz]

1 x 10–4+ 2 x 10–7x f

0.02

) x (3 x 10–5+ 1 x 10–7x f

V

osc

3 x 10–5+ 1 x 10–7x f

3 x 10–5+ 1 x 10–7x f

3 x 10–5+ 1 x 10–7x f

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

At the following frequency points, instrument spurious characteristics could occasionally cause measure­ment errors to exceed specified value because of instrument spurious characteristics.

10.71 MHz 17.24 MHz 21.42 MHz 42.84 MHz

514.645 MHz 686.19333 MHz 1029.29 MHz 1327.38666 MHz

See “EMC” under “Others” in “General Characteristics.”

6

Agilent 4291B RF Impedance/Material Analyzer

Figure 1-3. Impedance Measurement Accuracy Using High Impedance Test Head (@ Low OSC Level)

Figure 1-4. Impedance Measurement Accuracy Using High Impedance Test Head (@ High OSC Level)

7

Agilent 4291B RF Impedance/Material Analyzer

Figure 1-5. Impedance Measurement Accuracy Using Low Impedance Test Head (@ Low OSC Level)

Figure 1-6. Impedance Measurement Accuracy Using Low Impedance Test Head (@ High OSC Level)

8

Agilent 4291B RF Impedance/Material Analyzer

Typical measurement accuracy when open/short/50 Ω/low-loss-capaciter calibration is done

Conditions

• Averaging on point factor is larger than 32 at which calibration is done.

• Cal Points is set to USER DEF.

• Environmental temperature is within ±5°C of temperature at which calibration is done, and within 13°C
to 33°C. Beyond this environmental temperature condition, accuracy is twice as bad as specified.

|Z|, |Y| Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

θ Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± [rad]

L, C, X, B Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± (E

R, G Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± (E

+ Eb)2+ (EcDx)2[%]

a

+ Eb)2+ (EcQx)2[%]

a

+ Eb) [%]

a

E

c

100

D Accuracy

2

@ |D

Especially, D

tan(Ec/100)| < 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± ±

x

x

Q Accuracy

@ |Q

tan(Ec/100)| < 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± .

x

Especially, ≥ Q

10
E

≤ 0.1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± ±

≥ 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± Q

c

x

(1 + Dx) tan(Ec/100)
1D

tan(Ec/100)

x

E

c

100

2

(1 + Qx)tan(Ec/100)
1  Q

tan(Ec/100)

x

2

x .

E

100

Where,

D

: Actual D value of DUT

X

E

, Eb: are as same as Eaand E

a

is done.

E

= 0.06 + 0.14  (Typical)

c

F

1800

of the measurement accuracy when OPEN/SHORT/50 Ω calbration

b

F : measurement frequency [MHz]
Q

: Actual Q value of DUT

x

c

9

Agilent 4291B RF Impedance/Material Analyzer

Figure 1-7. Typical measurement accuracy when open/short/50 Ω/low-loss-capaciter calibration is done

10

Options 013 and 014 High Temperature Test Heads

Specification for Option 013 and 014 High Temperature Test Heads

Frequency Characteristics

Operating frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 MHz to 1.8 GHz

Source Characteristics

OSC level

Voltage Range

@ 1 MHz ≤ Frequency < 1 GHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 mV

@ 1 GHz ≤ Frequency ≤ 1.8 GHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 mV

OSC level resolution

AC voltage resolution

@ 110 mV
@ 11 mV
@ 1.1 mV
@ 0.2 mV

rms

rms

rms

rms

< V

< V

< V

≤ V

OSC

≤ 110 mV

OSC

OSC

OSC

≤ 500 mV

≤ 11 mV
≤ 1.1 mV

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 mV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 µV

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 µV

rms

AC current resolution

@ 2.75 mA
@ 0.275 mA
@ 27.5
@ 5

µ

A ≤ I

µ

< I

OSC

< I

OSC

OSC

≤ 27.5

≤12.5 mA

≤ 2.75 mA

≤ 275

µ

µ

A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.05 µA

rms

rms

A

< I

rms

OSC

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 µA

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 µA

rms

A

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 µA

rms

AC power resolution

@ –66.1 dBm ≤ P

≤ 1.9 dBm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.2 dBm max

OSC

OSC level accuracy

@ 1 MHz ≤ Frequency ≤ 1 GHz, V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A + B + dB

OSC

≤ 0.25 V

rms(IOSC

≤ 6.3 mA, P

≤ –4.1 dBm)

OSC

8[dB]  frequency[

Where,

to 500 mV

rms

rms

1800

250 mV

MHz

rms

rms

]

A depends on temperature conditions as follows:

within referenced to 23±5°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 dB

@ 0°C to 18°C, 28°C to 40°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 dB

B depends on OSC level as follows:

@ 0.5 V
(12.5 mA

(1.9 dBm ≥ P

@ 120 mV
(3 mA
(–10 dBm > P

@ 1.2 mV
(30
(–50 dBm > P

≥ V

rms

rms

rms

> I

rms

rms

µ

A

> I

rms

≥ 120 mV

OSC

≥ I

≥ 3mA

OSC

≥ –10 dBm)

OSC

> V

OSC

≥ 30

OSC

≥ –50 dBm)

OSC

> V

OSC

≥ 5

OSC

≥ –66.1 dBm)

OSC

rms

≥ 1.2 mV

µ

A

)

rms

≥ 0.2 mV

µ

A

)

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 dB

rms

)

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 dB

rms

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 dB

rms

Output impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Ω (Nominal value)

Level Monitor

Monitor accuracy

OSC level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Same as OSC level accuracy (typical)

DC bias . . . . . . . . . . . . . . . . . . . . . . . . . . . Twice as bad as specifications of dc level accuracy (typical)

11

Options 013 and 014 High Temperature Test Heads

Basic Measurement Accuracy

Conditions of accuracy specifications

• OPEN/SHORT/50 Ω calibration must be done. Calibration ON.

• Averaging (on point) factor must be larger than 32 at which calibration is done.

• Measurement points are same as the calibration points.

• Environmental temperature is within ±5°C of temperature at which calibration is done, and within 13°C
to 33°C. Beyond this environmental temperature condition, and within 0°C to 40°C, accuracy is twice as
bad as specified.

• Bending cable should be smooth and the bending angle is less than 30°.

• Cable position should be kept in the same position after calibration measurement.

• OSC level must be same as level at which calibration is done.

• OSC level is less than or equal to 0.25 V, or OSC level is greater than 0.25 V and frequency range is
within 1 MHz to 1 GHz.

|Z| Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

θ Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± [rad]

+ Eb) [%]

a

(Ea+ Eb)

100

Where,

E

: depends on measurement frequency as follows:

a

@ 1 MHz ≤ frequency ≤ 100 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 [%]

@ 100 MHz < frequency ≤ 500 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.8 [%]

@ 500 MHz < frequency ≤ 1 GHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5 [%]

@ 1 GHz < frequency ≤ 1.8 GHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.0 [%]

E

= (Zs/Zx+ YoZx)  100 [%]

b

Z

and Yodepend on number of point averaging (Nav) and OSC level (V

s

Z

: Impedance measurement value [Ω]

x

) as follows:

osc

12

Options 013 and 014 High Temperature Test Heads

Table 1-3. Zsand YoWhen High Impedance Test Head Is Used

Measurement Conditions

Number
of Point
Averaging OSC Signal Level
(Nav)(V

1 ≤ N

≤ 7 0.02V ≤ V

av

8 < N

av

1

)

osc

0.12V ≤ V

0.02V ≤ V

Z

[Ω]Y

S

V

< 0.02 x (0.2 + 0.001 x f

osc

< 0.12 0.2 + 0.001 x f

osc

osc

V

< 0.02 x (0.1 + 0.001 x f

osc

< 0.12 0.1 + 0.001 x f

osc

0.02

V

osc

0.2 + 0.001 x f

0.02

V

osc

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

[S]

o

0.02

) x (5 x 10–5+ 2 x 10–7x f

V

osc

–5

5 x 10

+ 2 x 10–7x f

–6

3 x 10

+ 2 x 10–7x f

) x (2 x 10–5+ 2 x 10–7x f

0.02

V

osc

2 x 10–5+ 2 x 10–7x f

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

)

)

1. V

= 0.12V  l

osc

= 3 mA  P

osc

0.12V ≤ V

= –10 dBm, V

OSC

osc

= 0.02V  l

osc

= 0.5 mA  P

osc

= –26 dBm

osc

Table 1-4. Zsand YoWhen Low Impedance Test Head Is Used

Measurement Conditions

Number
of Point
Averaging OSC Signal Level
(Nav)(V

1 ≤ Nav≤ 7 0.02V ≤ V

8 < N

av

1. V

= 0.12V  l

osc

= 3 mA  P

osc

1

)

osc

0.12V ≤ V

0. 02V ≤ V

0.12V ≤ V

= –10 dBm, V

OSC

V

< 0.02 x (0.1 + 0.001 x f

osc

< 0.12 0.1 + 0.001 x f

osc

osc

V

< 0.02 x (0.05 + 0.001 x f

osc

< 0.12 0.05 + 0.001 x f

osc

osc

= 0.02V  l

osc

= 0.5 mA  P

osc

= –26 dBm

osc

0.1 + 0.001 x f

Z

[Ω] Y

S

0.02

V

osc

[MHz]

[MHz]

0.05 + 0.001 x f

0.02

V

osc

0.03 + 0.001 x f

2 x 10–5+ 2 x 10–7x f

[S]

o

0.02

) x (1 x 10–4+ 2 x 10–7x f

[MHz]

V

osc

1 x 10–4+ 2 x 10–7x f

[MHz]

[MHz]

[MHz]

[MHz]

1 x 10–4+ 2 x 10–7x f

0.02

) x (3 x 10–5+ 2 x 10–7x f

V

osc

3 x 10–5+ 2 x 10–7x f

3 x 10–5+ 2 x 10–7x f

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

[MHz]

)

)

At the following frequency points, instrument spurious characteristics could occasionally cause measure­ment errors to exceed specified value because of instrument spurious characteristics.

10.71 MHz 17.24 MHz 21.42 MHz 42.84 MHz

514.645 MHz 686.19333 MHz 1029.29 MHz 1327.38666 MHz

See “EMC” under “Others” in “General Characteristics.”
The excessive vibration and shock could occasionally cause measurement errors to exceed specified values.

13

Options 013 and 014 High Temperature Test Heads

Figure 1-8. Impedance Measurement Accuracy Using High Temperature High Impedance Test Head (@ Low OSC Level)

Figure 1-9. Impedance Measurement Accuracy Using High Temperature High Impedance Test Head (@ High OSC Level)

14

Options 013 and 014 High Temperature Test Heads

Figure 1-10. Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head (@ Low OSC Level)

Figure 1-11. Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head (@ High OSC Level)

15

Options 013 and 014 High Temperature Test Heads

Typical Effects of Temperature Drift on Measurement Accuracy

When environmental temperature exceeds ±5°C of temperature at which calibration is done, add the
following measurement error.

Conditions of typical effects of temperature drift

• Environment temperature of a test head is within –55°C to 0°C or 40°C to 200°C.

• Environment temperature of the mainframe is within ±5°C of temperature at which calibration is done,
and within 0°C to 40°C.

• Other conditions are as same as the conditions of the basic measurement accuracy of Option 013/014.

|Z| Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±(E

θ Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± [rad]

+ Eb2) [%]

a2

(Ea2+ Eb2)

100

Where,

E

= (∆A1∆T + ∆A

a2

2

)  10

8

Eb2= (Zs2/Zx+ Yo2Zx)  100

∆A

is the effect of temperature drift on the impedance measurement value as follows:

1

(50 + 300  f ) [ppm/°C] (typical)

∆A

is the hysterisiss of the effect of temperature drift on the impedance measurement value as follows:

2

∆A1∆T

[ppm] (typical)

3

f : Measurement Frequency [GHz]

∆T: Difference of temperature between measurement condition and calibration measurement condition. [°C]

Y

= (∆Yo1∆T + ∆Y

o2

Z

= (∆Zs1∆T + ∆Z

s2

Z

: Impedance measurement value [Ω]

x

Y

is the temperature coefficient for OPEN residual as follows:

o1

@ High Temperature High Impedance Test Head is used . . . . . . . . . (0.2 + 8  f

@ High Temperature Low Impedance Test Head is used . . . . . . . . . . (1 + 30  f ) [

Y

is the hysterisis of the OPEN residual as follows: . . . . . . . . . . . . . . . . . . . [µS/°C](typical)

o2

)  10–6[S]

o2

s2

)  10

–3

[Ω]

2

) [µS/°C] (typical)

µ

S/°C] (typical)

∆Y01∆T

3

16

∆Z

is the temperature coefficient for SHORT residual as follows:

s1

@ High Temperature High Impedance Test Head is used . . . . . . . . . . (4 + 50  f ) [mΩ°C] (typical)

∆Zs1∆T

3

2

) [mΩ°C] (typical)

@ High Temperature Low Impedance Test Head is used . . . . . . . . . . (1 + 10  f

∆Z

is the hysterisis of the SHORT residual as follows: . . . . . . . . . . . . . . . . [mΩ/°C](typical)

s2

Options 013 and 014 High Temperature Test Heads

Figure 1-12. Typical Frequency Characteristics of Temperature Coefficient Using High Temperature High Impedance Test Head

Figure 1-13. Typical Frequency Characteristics of Temperature Coefficient Using High Temperature Low Impedance Test Head

17

Options 013 and 014 High Temperature Test Heads

Operation Conditions of the Test Head

• The cable must be at the same temperature as the main frame at least 15 cm from the test station.

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55°C to +200°C

Figure 1-14. Dimensions of High Temperature Test Head

18

Options 013 and 014 High Temperature Test Heads

Display

LCD

Type/size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Color TFT, 8.4 inch

Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 640  480

Effective Display Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 160 mm  115 mm (600  430 dots)

Number of display channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . single, dual split or overwrite, graphic, and tabular

Number of traces

For measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 trace/channel

For memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 traces/channel (maximum)

Data math functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . gain  data-offset

gain  memory – offset
gain  (data – memory) – offset
gain  (data + memory) – offset

gain  (data/memory) – offset

gain  (data  memory) – offset

Marker

Number of markers

Main marker . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1 for each channel

Sub-marker . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 for each channel

∆Marker . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1 for each channel

Data Storage

Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . floppy disk drive, Volatile memory disk

Capacity

floppy disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 720 kB/1.44 MB

Volatile memory disk, can be backed up by flash memory . . . . . . . . . . . . . . . . . . . 448 kB (maximum)

Disk format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . LIF, DOS

GPIB

Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IEEE 488.1-1987, IEC625

Interface function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PPO,

DC1, DT1, C1, C2, C3, C4, C11, E2

Numeric Data Transfer formats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ASCII

32 and 64 bit IEEE 754 Floating point format,

DOS PC format (32 bit IEEE with byte order reversed)

Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IEEE 488.2-1987

19

Options 013 and 014 High Temperature Test Heads

Printer Parallel Port

Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IEEE 1284 Centronics standard compliant

Printer control language. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP PCL3 Printer Control Language

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D-sub (25-pin)

General Characteristics

Input and Output Characteristics

External reference input

Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 MHz ±100 Hz (typically)

Level. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . > –6 dBm (typically)

Input impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Ω (nominal)

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BNC female

Internal Reference Output

Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 MHz (nominal)

Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 dBm (typically)

Output impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Ω (nominal)

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BNC female

External trigger input

Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TTL Level

Pulse width (Tp) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . > 2

Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . positive/negative selective

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BNC female

µ

s (typically)

Figure 1-15. Trigger Signal

External monitor output

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . D-sub (15-pin HD)

Display resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 640  480 VGA

20

Options 013 and 014 High Temperature Test Heads

Operation Conditions

Temperature

Disk drive non-operating condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 40°C

Disk drive operating condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10°C to 40°C

Humidity

@ wet bulb temperature <29°C, without condensation

Disk drive non-operating condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 % to 95 % RH

Disk drive operating condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 % to 80 % RH

Altitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to 2,000 meters

Warm-up time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 minutes

Non-operation conditions

Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20°C to 60°C

Humidity

@ wet bulb temperature <45°C, without condensation . . . . . . . . . . . . . . . . . . . . . . . . . 15 % to 95 % RH

Altitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to 4,572 meters

Others

EMC . . . . . . . . . . . . . . . . . . . . . . . Complies with CISPR 11 (1990) / EN 55011 (1991) : Group 1, Class A

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Complies with IEC 1000-3-2 (1995) / EN 61000-3-2 (1995)

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Complies with IEC 1000-3-3 (1994) / EN 61000-3-3 (1995)

. . . . . . . . . . . . . . . . . . Complies with IEC 1000-4-2 (1995) / EN 50082-1 (1992) : 4 kV CD, 8 kV AD

. . . . . . . . . . . . . . . . . . . . . . . . . . . . Complies with IEC 1000-4-2 (1995) / EN 50082-1 (1992) : 3 V/m

. . . . . . Complies with IEC 1000-4-4 (1995) / EN 50082-1 (1992) : 1 kV / Main, 0.5k V / Signal Line

Note: When tested at 3 V/m according to IEC 1000-4-3 (1995), the measurement accuracy will be within specifications over the full immunity test frequency range of 27 to
1000 MHz except when the analyzer frequency is identical to the transmitted interference signal test frequency.

Safety . . . . . . . . . . . . Complies with IEC 1010-1 (1990), Amendment 1 (1992) and Amendment 2 (1995).

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Complies with CSA-C22.2 No. 1010.1-92.

Power requirements . . . . . 90V to 132V, or 198V to 264V (automatically switched), 47 to 63 Hz, 300VA max

Weight

Mainframe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21.5 kg (SPC)

Test Station . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.7 kg

Dimensions

Mainframe . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 425 (W)  235 (H)  553 (D) mm

Test Station . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 275 (W)  95 (H)  205 (D) mm

21

Options 013 and 014 High Temperature Test Heads

External Program Run/Cont Input

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BNC female

Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TTL

Keyboard connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . mini-DIN

I/O port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 bit in/ 8 bit out port, TTL Level

Figure 1-16. I/O Port Pin Assignment

Specifications for Option 1D5 High Stability Frequency Reference

Reference Oven Output

Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 MHz (nominal)

Level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 dBm (typically)

Output Impedance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Ω (nominal)

Connector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BNC female

22

Option 002 Material Measurement

Supplemental Characteristics for Option 002 Material Measurement

Measurement Frequency Range

Using the Agilent 16453A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 MHz to 1.0 GHz (Typical)

Using the Agilent 16454A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 MHz to 1.0 GHz (Typical)

Measurement Parameters

Permittivity parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |ε

Permeability parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |

Typical Measurement Accuracy

Conditions of accuracy characteristics

• Use the High Z Test Head for permittivity measurement

• Use the Low Z Test Head for permeability measurement

• OPEN/SHORT/50 Ω calibration must be done. Calibration ON.

• Averaging (on point) factor is larger than 32 at which calibration is done if Cal points is set to
USER DEF.

• Measurement points are same as the calibration points if Cal point is set to USER DEF.

• Environment temperature is within ±5°C of temperature at which calibration is done, and within 13°C to
33°C. Beyond this environmental temperature condition, accuracy is twice as bad as specified.

|, εr', εr", tanδ

r

µ

|,

µ

',

µ

r

r

r

", tanδ

∆ε'

ε

' Accuracy ( )

r

@ tanδ < 0.1. . . . . . . . . . . . . . . . . . . . . . . 5 + (10 + ) + 0.25 + [%] (Typical)

Loss Tangent Accuracy of (∆tanδ)

@ tanδ < 0.1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E

rm

ε'

rm

0.04

A

ε

r

t

ε'

f

rm

ε'

rm

t

100

|1 – (13/ ε'

2

/f)

|

rm

+ Eb(Typical)

a

Where,

@ frequency ≤ 1 GHz

E

= 0.002 + + 0.004f + (Typical)

a

0.0004

f

t

ε'

m

|1 – (13/ ε'

0.1

rm

/f)

2

|

@ frequency > 1 GHz

∆ε'
ε'

rm

rm

0.0004

f

1

100

E

= 0.002 + + 0.004f + (Typical)

a

E

= ( + ε'

b

rm

t

ε'

m

0.002

) tanδ (Typical)

t

0.1

|1 – (13/ ε'

rm

/f)

2

|

f is measurement frequency [GHz]
t is thickness of MUT [mm]

ε'

is measured value of ε'

rm

r

tanδ is measured value of dielectric loss tangent

23

Option 002 Material Measurement

∆µ'

µ

' Accuracy

r

@ tanδ < 0.1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 + + Fµ'

Loss Tangent Accuracy of

@ tanδ < 0.1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E

rm

µ'

rm

A

µ

(∆tanδ)

r

Fµ'

25

rm

(1 + )2f2[%] (Typical)

rm

Fµ'

15

rm

+ Eb(Typical)

a

Where,

E

= 0.002 + + 0.004 f (Typical)

a

∆µ'

E

= (Typical)

b

µ'

rm

rm

0.001

Fµ'

tanδ

100

rm

f

f is measurement frequency [GHz]

F = hln [mm]

c
b

h is the height of MUT [mm]
b is the inner diameter of MUT
c is the outer diameter of MUT

tanδ is the measured value of loss tangent

µ'

is the measured value of permeability

rm

At the following frequency points, instrument spurious characteristics could occasionally cause measure­ment errors to exceed specified value.

10.71 MHz 17.24 MHz 21.42 MHz 42.84 MHz

514.645 MHz 686.19333 MHz 1029.29 MHz 1327.38666 MHz

See “EMC” under “Others” in “General Characteristics.”

24

Option 002 Material Measurement

Figure 1-17. Typical Permittivity Measurement Accuracy (@ thickness = 0.3 mm)

Figure 1-18. Typical Permittivity Measurement Accuracy (@ thickness = 1 mm)

25

Option 002 Material Measurement

Figure 1-19. Typical Permittivity Measurement Accuracy (@ thickness = 3 mm)

Figure 1-20. Typical Dielectric Loss Tangent (tanδ) Measurement Accuracy (@ thickness = 0.3 mm)

26

Option 002 Material Measurement

Figure 1-21. Typical Dielectric Loss Tangent (tanδ) Measurement Accuracy (@ thickness = 1 mm)

Figure 1-22. Typical Dielectric Loss Tangent (tanδ) Measurement Accuracy (@ thickness = 3 mm)

27

Option 002 Material Measurement

Figure 1-23. Typical Permittivity Measurement Accuracy (ε

vs. Frequency, @ thickness = 0.3 mm)

r

Figure 1-24. Typical Permittivity Measurement Accuracy (ε

28

vs. Frequency, @ thickness = 1 mm)

r

Option 002 Material Measurement

Figure 1-25. Typical Permittivity Measurement Accuracy (ε

vs. Frequency, @ thickness = 3 mm)

r

29

Option 002 Material Measurement

Figure 1-26. Typical Permeability Measurement Accuracy (@ F* = 0.5)

Figure 1-27. Typical Permeability Measurement Accuracy (@ F* = 3) *F = hln

30

c
b

Option 002 Material Measurement

Figure 1-28. Typical Permeability Measurement Accuracy (@ F* = 10)

Figure 1-29. Typical Permeability Loss Tangent (tanδ) Measurement Accuracy (@ F* = 0.5) *F = hln

c
b

31

Option 002 Material Measurement

Figure 1-30. Typical Permeability Loss Tangent (tanδ) Measurement Accuracy (@ F* = 3)

Figure 1-31. Typical Permeability Loss Tangent (tanδ) Measurement Accuracy (@ F* = 10) *F = hln

32

c
b

Option 002 Material Measurement

Figure 1-32. Typical Permeability Measurement Accuracy (

µ

vs. Frequency, @ F* = 0.5)

r

Figure 1-33. Typical Permeability Measurement Accuracy (

µ

vs. Frequency, @ F* = 3) *F = hln

r

c
b

33

Option 002 Material Measurement

Figure 1-34. Typical Permeability Measurement Accuracy (

µ

vs. Frequency, @ F* = 10) *F = hln

r

c
b

34

Option 002 Material Measurement

Applicable MUT (Material Under Test) Size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Tables 1-5 and 1-6

Maximum DC Bias Voltage / Current

Using the Agilent 16453A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±40 V

Using the Agilent 16454A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±500 mA

Operating Temperature

Using the Agilent 16453A or 16454A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to +200°C

Operating Humidity

Wet bulb temperature < 40°C

Using the Agilent 16453A or 16454A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . up to 95% RH

Table 1-5. Applicable Dielectric Material Size Using with the Agilent 16453A

t ≤ 3 mm

d ≥

φ

15 mm

Table 1-6. Applicable Magnetic Material Size Using the Agilent 16454A

Fixture Small Large

Holder A B C D

c ≤φ8 mm ≤φ6 mm ≤φ20 mm ≤

b ≥φ 3.1 mm ≥φ 3.1 mm ≥φ6 mm ≥

h ≤ 3 mm ≤3 mm ≤ 10 mm ≤ 10 mm

φ

20 mm

φ

5 mm

35

Material Measurement Accuracy with High Temperature Test Head

Option 002 Material Measurement Accuracy with Options 013 and 014 High Temperature
Test Head (Typical)

Dielectric Material Measurement Accuracy with High Temperature Test Head (Typical)

Conditions of Dielectric Material Measurement Accuracy with High Temperature Test Head

• Environment temperature is within ±5°C of temperature at which calibration is done, and within
0°C to 40°C.

• High Temperature High Impedance Test Head must be used.

• Bending cable should be smooth and the bending angle less than 30°.

• Cable position should be kept in the same position after calibration measurement.

• OPEN/SHORT/50 Ω calibration must be done. Calibration ON.

• Measurement points are same as the calibration points.

• Averaging (on point) factor must be larger than 32 at which calibration is done.

• OSC level must be same as level at which calibration is done.

• OSC level is less than or equal to 0.25 V
to 1 GHz.

• Environment temperature of the main frame is within ±5°C of temperature at which calibration is done,
and within 0°C to 40°C.

, or greater than 0.25 V

rms

and frequency range is within 1 MHz

rms

∆ε'

ε

' Accuracy ( ). . . . . . . . . . . . . . . . . . . . . . . . . . Same as accuracy at which a normal test head is used

r

Loss Tangent Accuracy of ε

rm

ε'

rm

A

(∆tanδ) . . . . . . . . . . . . . . . Same as accuracy at which a normal test head is used

r

At the following frequency points, instrument spurious characteristics could occasionally cause measure­ment errors to exceed specified value.

10.71 MHz 17.24 MHz 21.42 MHz 42.84 MHz

514.645 MHz 686.19333 MHz 1029.29 MHz 1327.38666 MHz

See “EMC” under “Others” in “General Characteristics.”
The excessive vibration and shock could occasionally cause measurement errors to exceed specified value.

36

Material Measurement Accuracy with High Temperature Test Head

Typical Effects of Temperature Drift on Dielectric Material Measurement Accuracy

When environment temperature is without ±5°C of temperature at which calibration is done, add the
following measurement error.

∆ε'

ε

’ Accuracy ( ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Eε+ Ea3+ E

r

Loss Tangent Accuracy of ε

Where,

E

is ε

ε

E

tanδε

E

a3

E

E

b3

E

rm

ε'

rm

A

(∆tanδ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E

r

' accuracy when a normal test head is used.

r

is loss tangent accuracy when a normal test head is used.

is the effect of temperature drift on the accuracy as follows:

= T

∆T

a3

c

is the hysterisis of the effect of temperature drift on the accuracy as follows:

= T

∆T

b3

c

3

tanδε

(E

a3 + Eb3

b3

100

[%]

+

)

Where,

T

is temperature coefficient as follows:

c

T

= K1 + K2 + K

c

K1 = 1  10

K

= 3  10

2

K

= 5  10

3

3

–6

 (50 + 300f)

ε'

–6

 (4 + 50f) ( + 10) f

–3

 (0.2 + 8f2)

rm

t

ε'

rm

(

t

1

|1 – (f/f

1

|1 – (f/f

)2|

0

1

)2|

0

+ 10) f

f : Measurement Frequency [GHz]

13

f

= [GHz]

0

ε'

rm

t : Thickness of MUT [mm]

ε'

: measured value of ε'

rm

r

The illustrations of temperature coefficient Tcare shown in Figures 1-35 to 1-37.

∆T is difference of temperature between measurement condition and calibration measurement condition

as follows:

∆T = |T

T

meas

T

cal

– T

meas

cal

|

: Temperature of Test Head at measurement condition

: Temperature of Test Head at calibration measurement condition

37

Material Measurement Accuracy with High Temperature Test Head

Figure 1-35. Typical Frequency Characteristics of Temperature Coefficient of ε

(Thickness = 0.3 mm)

’ and Loss Tangent Accuracy

r

38

Material Measurement Accuracy with High Temperature Test Head

Figure 1-36. Typical Frequency Characteristics of Temperature Coefficient of ε

(Thickness = 1 mm)

’ and Loss Tangent Accuracy

r

39

Material Measurement Accuracy with High Temperature Test Head

Figure 1-37. Typical Frequency Characteristics of Temperature Coefficient of ε

(Thickness = 3 mm)

’ and Loss Tangent Accuracy

r

40

Material Measurement Accuracy with High Temperature Test Head

Material Measurement Accuracy with High Temperature Test Head (Typical)

Conditions of Dielectric Material Measurement Accuracy with High Temperature Test Head

• Environment temperature is within ±5°C of temperature at which calibration is done, and within 0°C to
40°C.

• High Temperature Low Impedance Test Head must be used.

• Bending cable should be smooth and the bending angle less than 30°.

• Cable position should be kept in the same position after calibration measurement.

• OPEN/SHORT/50 Ω calibration must be done. Calibration ON.

• Measurement points are same as the calibration points.

• Averaging (on point) factor must be larger than 32 at which calibration is done.

• OSC level must be same as level at which calibration is done.

• OSC level is less than or equal to 0.25 V
1 MHz to 1 GHz.

• Environment temperature of the main frame is within ±5°C of temperature at which calibration is done,
and within 0°C to 40°C.

∆

µ

'

µ

' Accuracy ( ) . . . . . . . . . . . . . . . . . . . . . . . . . . Same as accuracy at which a normal test head is used

r

Loss Tangent Accuracy of

rm

µ

'

rm

µ

'(∆tanδ) . . . . . . . . . . . . . . . Same as accuracy at which a normal test head is used

r

At the following frequency points, instrument spurious characteristics could occasionally cause measure­ment errors to exceed specified value.

10.71 MHz 17.24 MHz 21.42 MHz 42.84 MHz

514.645 MHz 686.19333 MHz 1029.29 MHz 1327.38666 MHz

, or greater than 0.25 V

rms

and frequency range is within

rms

See “EMC” under “Others” in “General Characteristics.”
The excessive vibration and shock could occasionally cause measurement errors to exceed specified value.

41

Material Measurement Accuracy with High Temperature Test Head

Typical Effects of Temperature Drift on Magnetic Material Measurement Accuracy

When environment temperature exceeds ±5°C of temperature at which calibration is done, add the
following measurement error.

∆

µ

'

µ

' Accuracy ( ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Eµ+ Ea3+ E

r

Loss Tangent Accuracy of

Where,

E

is µ'

µ

E

tanδµ

E

is the effect of temperature drift on the accuracy as follows:

a3

E

a3

*E

b3

E

b3

Where,

T

is temperature coefficient as follows:

c

rm

µ

'

rm

accuracy when a normal test head is used.

r

A

µ

'(∆tanδ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E

r

is loss tangent accuracy when a normal test head is used.

= T

∆T

c

is the hysterisis of the effect of temperature drift on the accuracy as follows:

= T

∆T

c

3

(Ea3+ Eb3)

+ =

tanδµ

b3

100

T

= K1 + K2 + K

c

K1 = 1  10

K

= 1  10–2 (1 + 10f2) + 10)f

2

K

= 2  10–6 (1 + 30f )

3

3

–6

 (50 + 300f )

|1 – 0.01{F(

{F(

µ

{F(

µ

'rm– 1) + 20}f

|1 – 0.01{F(

µ

'rm– 1) + 10}f2|

'rm– 1) + 20}f

µ

'rm– 1) + 10}f2|

f : Measurement Frequency [GHz]

F = hln c [mm]

b

h is the height of MUT [mm]
b is the inner diameter of MUT
c is the outer diameter of MUT

µ

'rmis the measured value of permeability

The illustrations of temperature coefficient T

are shown in Figures 1-38 to 1-40.

c

∆T is difference of temperature between measurement condition and calibration measurement condition

as follows:

∆ T = |T

meas

– T

cal

|

T

: Temperature of Test Head at measurement condition

meas

T

: Temperature of Test Head at calibration measurement condition

cal

42

Material Measurement Accuracy with High Temperature Test Head

Figure 1-38. Typical Frequency Characteristics of Temperature Coefficient of µ

' and Loss Tangent Accuracy (F* = 0.5)

r

*F = hln

c
b

43

Material Measurement Accuracy with High Temperature Test Head

Figure 1-39. Typical Frequency Characteristics of Temperature Coefficient of µ

' and Loss Tangent Accuracy (F* = 3)

r

*F = hln

c
b

44

Material Measurement Accuracy with High Temperature Test Head

Figure 1-40. Typical Frequency Characteristics of Temperature Coefficient of µ

' I and Loss Tangent Accuracy (F* = 10)

r

*F = hln

c
b

45

Furnished Accessories

Accessory Agilent part number

Operating Manual 04291-90020

Programming Manual 04291-90027

Service Manual

1

04291-90111

Program Disk Set 04291-18000

Power Cable

2

50 Ω Termination 04291-65006

0 Ω Termination 04191-85300

0 S Termination 04191-85302

Low-Loss Capacitor 04291-60042

Calibration Kit Carrying Case 04291-60041

APC-7 End Cap 16190-25011

Fixture Stand

3

04291-60121

Pad 04291-09001

BNC Adapter

4

1250-1859

Mini-DIN Keyboard C3757-60401

Instrument BASIC User’s Handbook E2083-90000

Handle Kit

5

5062-3991

Rack Mount Kit

Rack Mount and Handle Kit

1. Option OBW only

2. The power cable depends on where the instrument is used;

see User’s Guide.

3. Option 013 and 014 only

4. Option 1D5 only

5. Option 1CN only

6. Option 1CM only

7. Option 1CP only

6

7

5062-3979

5062-3985

46

Agilent Technologies’ Test and Measurement
Support, Services, and Assistance

Agilent Technologies aims to maximize the value you receive,
while minimizing your risk and problems. We strive to ensure
that you get the test and measurement capabilities you paid
for and obtain the support you need. Our extensive support
resources and services can help you choose the right Agilent
products for your applications and apply them successfully.
Every instrument and system we sell has a global warranty.
Support is available for at least five years beyond the produc­tion life of the product. Two concepts underlie Agilent’s
overall support policy: “Our Promise” and “Your Advantage.”

Our Promise

“Our Promise” means your Agilent test and measurement equip­ment will meet its advertised performance and functionality.
When you are choosing new equipment, we will help you with
product information, including realistic performance specifica­tions and practical recommendations from experienced test
engineers. When you use Agilent equipment, we can verify that
it works properly, help with product operation, and provide
basic measurement assistance for the use of specified capabili­ties, at no extra cost upon request. Many self-help tools are
available.

Your Advantage

“Your Advantage” means that Agilent offers a wide range of
additional expert test and measurement services, which you
can purchase according to your unique technical and business
needs. Solve problems efficiently and gain a competitive edge
by contracting with us for calibration, extra-cost upgrades, out­of-warranty repairs, and on-site education and training, as well
as design, system integration, project management, and other
professional services. Experienced Agilent engineers and tech­nicians worldwide can help you maximize your productivity,
optimize the return on investment of your Agilent instruments
and systems, and obtain dependable measurement accuracy
for the life of those products.

By internet, phone, or fax, get assistance with all your
test and measurement needs.

Online Assistance

www.agilent.com/find/assist

Phone or Fax

United States:
(tel) 1 800 452 4844

Canada:
(tel) 1 877 894 4414
(fax) [phone]

Europe:
(tel) (31 20) 547 2323
(fax) (31 20) 547 2390

Japan:
(tel) (81) 426 56 7832
(fax) (81) 426 56 7840

Latin America:
(tel) [phone]
(fax) [phone]

Australia:
(tel) 1 800 629 485
(fax) (61 3) 9210 5947

New Zealand:
(tel) 0 800 738 378
(fax) (64 4) 495 8950

Asia Pacific:
(tel) (852) 3197 7777
(fax) (852) 2506 9284

Product specifications and descriptions in this
document subject to change without notice.

Copyright © 1997, 2000 Agilent Technologies
Printed in U.S.A. 12/00
5966-1543E