Agilent 4288A Data Sheet

Agilent
4288A Capacitance Meter
1 kHz/1 MHz

Data Sheet

This document contains specifications
and supplemental information about
Agilent’s 4288A capacitance meter.

2

Definitions

All specifications apply over a 0°C to 45°C range and
10 minutes after the instrument has been turned on,
unless otherwise stated.

Specification (spec.): Warranted performance.

Specifications include guardbands
to account for the expected
statistical performance
distribution, measurement
uncertainties, and changes
in performance due to
environomental conditions.

Supplemental information is intended to provide useful
information about the instrument, but is not covered by
the product warranty. The information is denoted as
typical, or nominal.

Typical (typ.): Expected performance of an

average unit which does not
incude guardbands.

Nominal (nom.): A general, descriptive term

that does not imply a level of
performance.

Basic specifications

Measurement parameters

• Cp-D, Cp-Q, Cp-Rp, Cp-G

• Cs-D, Cs-Q, Cs-Rs

Where,

Cp: Capacitance value measured using the parallel

equivalent circuit model

Cs: Capacitance value measured using the series

equivalent circuit model

D: Dissipation factor
Q: Quality factor (inverse of D)
G: Equivalent parallel conductance measured

using the parallel equivalent circuit model

Rp: Equivalent parallel resistance measured using

the parallel equivalent circuit model

Rs: Equivalent series resistance measured using the

series equivalent circuit model

Measurement signals

Table 1. Specifications of measurement signals

1 kHz

1 MHz

Frequency Allowable frequencies 0.99 MHz (1 MHz -1%)

1.01 MHz (1 MHz +1%)

1.02 MHz (1 MHz +2%)

Accuracy ± 0.02%

Range 0.1 V - 1.0 V

Level Resolution 0.1 V

Accuracy ± 5%

Measurement range:

20Ω (nominal)

Output Frequency: 100 pF - 100 nF

impedance 1 kHz Measurement range:

1Ω (nominal)

220 nF - 10µ F

Frequency: 1 MHz 20Ω (nominal)

Measurement cable length

0m, 1m, 2m

Measurement time modes

Short mode, long mode

For information on the measurement time in each mode,
refer to “Measurement time” on page 7.

Measurement range selection

Auto (auto range mode), manual (hold range mode)

Measurement range

Table 2. 1 kHz and 1 MHz measurement range

Measurement Measurement

signal frequency: 1 kHz signal frequency: 1 MHz

100 pF 220 pF 470 pF 1 pF 2.2 pF 4.7 pF

1 nF 2.2 nF 4.7 nF 10 pF 22 pF 47 pF

10 nF 22 nF 47 nF 100 pF 220 pF 470 pF

100 nF 220 nF 470 nF 1 nF

1 µF 2.2 µF 4.7 µF

10 µF

For information on measurable range in each
measurement mode, refer to “Available measurement
ranges” on this page and Tables 6 and 7 on page 4.

Averaging

Table 3. Averaging range and resolution

Range 1 - 256 measurements

Resolution 1

Trigger mode

Internal trigger (Int), manual trigger (Man),
external trigger (Ext), GPIB trigger (Bus)

Trigger delay time

Table 4. Range and resolution of trigger delay time

Range 0 - 1.000 s

Resolution 1 ms

3

Measurement display ranges

Table 5 shows the range of the measured value that can
be displayed on the screen.

Table 5. Allowable measured value display range

Parameter Measurement display range

Cs, Cp

- 99.9999 µF to - 0.00001 pF, 0,

0.00001 pF to 99.9999 µF

D

- 9.99999 to - 0.00001, 0,

0.00001 to 9.99999

Q

- 99999.9 to - 0.1, 0,

0.1 to 99999.9

Rs, Rp

- 999.999 MΩ to - 0.001 mΩ, 0,

0.001 mΩ to 999.999 MΩ

G

- 9.99999 kS to - 0.00001 µS, 0,

0.00001 µS to 9.99999 kS

∆%

- 999.999% to - 0.001%, 0,

0.001% to 999.999%

Available measurement ranges

Table 6 and 7 on page 4 show recommended measurement
ranges (recommendation for accurate measurement) and
significant measurement ranges (range that does not
cause overload) for each measurement range under the
condition D (dissipation factor) ≤ 0.5.

Accuracy of Cp, Cs, D, G, and Rs

Tables 10 and 11 on page 5, show the measurement
accuracy of Cp, Cs, D, G, and Rs when D ≤ 0.1. Note the
following when you calculate accuracy with these tables.

• The equation to calculate the accuracy varies
depending on the measurement time mode. In tables
10 and 11 on page 5, the upper equation is for the
short mode; the lower equation corresponds to the
long mode.

• Interpret your calculated accuracy as ± (percentage
of the measured value of an error) for Cp and Cs,
± (absolute value of an error) for D, G, and Rs.

When 0.1 < D ≤ 0.5, multiply the accuracy obtained from
Table 10 or Table 11 by the coefficient in Table 8 below.

Table 8. Coefficient caused by D value @ > 0.1, ≤ 0.5

Parameter Coefficient

Cp, Cs, G, Rs*

1

1 + D

2

D 1 + D

Accuracy of Q

The following equation is used to calculate the accuracy
of Q from the accuracy of D.

Equation 1. Equation to calculate Q

Qe =

±Qx

2

x

De

1 Qx xDe

Where, Qe is the accuracy of Q, De is the accuracy of D,
and Qx is the measured Q value.

Accuracy of Rp

The following equation is used to calculate the accuracy
of Rp from the accuracy of G.

Equation 2. Equation to calculate Rp

Rpe =

±Rpx

2

x

Ge

1 Rpx xGe

Where, Rpe is the accuracy of Rp, Ge is the accuracy of G,
and Rpx is the measured Rp value.

Accuracy when ambient temperature exceeds
the range between 18°C and 28°C (typical)

When the ambient temperature exceeds the range
between 18°C and 28°C, multiply the accuracy obtained
above by the coefficient shown in Table 9 below.

Table 9. Coefficient caused by ambient temparature

Coefficient

0°C ≤ ambient temperature < 8°C 3
8°C ≤ ambient temperature < 18°C 2
18°C ≤ ambient temperature ≤ 28°C 1
28°C < ambient temperature ≤ 38°C 2
38°C < ambient temperature ≤ 45°C 3

Table 6. Measurable capacitance range when measurement
frequency is 1 kHz

Measurement Recommended Significant

range measurement range measurement range

100 pF 68 pF - 150 pF 0 F - 150 pF

220 pF 150 pF - 330 pF 0 F - 330 pF

470 pF 330 pF - 680 pF 0 F - 680 pF

1 nF 680 pF - 1.5 nF 0 F - 1.5 nF

2.2 nF 1.5 nF - 3.3 nF 0 F - 3.3 nF

4.7 nF 3.3 nF - 6.8 nF 0 F - 6.8 nF

10 nF 6.8 nF - 15 nF 0 F - 15 nF

22 nF 15 nF - 33 nF 0 F - 33 nF

47 nF 33 nF - 68 nF 0 F - 68 nF

100 nF 68 nF - 150 nF 0 F - 150 nF

220 nF 150 nF - 330 nF 0 F - 330 nF

470 nF 330 nF - 680 nF 0 F - 680 nF

1 µF 680 nF - 1.5 µF 0 F - 1.5 µF

2.2 µF 1.5 µF - 3.3 µF 0 F - 3.3 µF

4.7 µF 3.3 µF - 6.8 µF 0 F - 6.8 µF

10 µF 6.8 µF - 20 µF 0 F - 20 µF

Table 7. Measurable capacitance range when measurement
frequency is 1 MHz

Measurement Recommended Significant

range measurement range measurement range

1 pF 680 fF - 1.5 pF 0 F - 1.5 pF

2.2 pF 1.5 pF - 3.3 pF 0 F - 3.3 pF

4.7 pF 3.3 pF - 6.8 pF 0 F - 6.8 pF

10 pF 6.8 pF - 15 pF 0 F - 15 pF

22 pF 15 pF - 33 pF 0 F - 33 pF

47 pF 33 pF - 68 pF 0 F - 68 pF

100 pF 68 pF - 150 pF 0 F - 150 pF

220 pF 150 pF - 330 pF 0 F - 330 pF

470 pF 330 pF - 680 pF 0 F - 680 pF

1 nF 680 pF - 1.5 nF 0 F - 1.5 nF

Measurement accuracy

Measurement accuracy is defined when all the following
conditions are met.

• Warm-up time: 10 minutes or longer

• Ambient temperature: 18°C - 28°C

• Execution of the OPEN compensation

• Measurement cable length: 0 m, 1m, or 2m (16048A/B/D)

• D (dissipation factor) ≤ 0.5

4

±

±

*1. If you select a secondary measurement parameter other than
D, calculate D.

5

Table 10. Measurement accuracy of Cp, Cs, D, G, and Rs (measurement frequency: 1 kHz)

Measurement

Measurement parameter

range

Cp, Cs [%] D G [nS] Rs [Ω]

100 pF

0.055 + 0.070 xK 0.00035 + 0.00070 xK (3.5 + 4.5 xK) xCx (90 + 120 xK) / Cx

0.055 + 0.030 xK 0.00035 + 0.00030 xK (3.5 + 2.0 xK) xCx (90 + 50 xK) / Cx

220 pF

0.055 + 0.045 xK 0.00035 + 0.00045 xK (3.5 + 3.0 xK) xCx (90 + 75 xK) / Cx

0.055 + 0.020 xK 0.00035 + 0.00020 xK (3.5 + 1.5 xK) xCx (90 + 35 xK) / Cx

470 pF

1 nF

2.2 nF

4.7 nF

10 nF

22 nF

47 nF 0.055 + 0.030 xK 0.00035 + 0.00030 xK (3.5 + 2.0 xK) xCx (90 + 50 xK) / Cx

100 nF 0.055 + 0.015 xK 0.00035 + 0.00015 xK (3.5 + 1.0 xK) xCx (90 + 25 xK) / Cx

220 nF

470 nF

1 µF

2.2 µF

4.7 µF

10 µF

Table 11. Measurement accuracy of Cp, Cs, D, G, and Rs (measurement frequency: 1 MHz)

Measurement

Measurement parameter

range

Cp, Cs [%] D G [nS] Rs [Ω]

1 pF

0.055 + 0.070 xK 0.00035 + 0.00070 xK (3.5 + 4.5 x K) x Cx (90 + 120 x K) / Cx

0.055 + 0.030 xK 0.00035 + 0.00030 x K (3.5 + 2.0 x K) x Cx (90 + 50 x K) / Cx

2.2 pF

0.055 + 0.045 x K 0.00035 + 0.00045 x K (3.5 + 3.0 x K) x Cx (90 + 75 x K) / Cx

0.055 + 0.020 x K 0.00035 + 0.00020 x K (3.5 + 1.5 x K) x Cx (90 + 35 x K) / Cx

4.7 pF

10 pF

22 pF 0.055 + 0.030 x K 0.00035 + 0.00030 x K (3.5 + 2.0 x K) x Cx (90 + 50 x K) / Cx

47 pF 0.055 + 0.015 x K 0.00035 + 0.00015 x K (3.5 + 1.0 x K) x Cx (90 + 25 x K) / Cx

100 pF

220 pF

470 pF

1 nF

In Tables 10 and 11, Cx is a measured value of the
capacitance (Cp or Cs) [nF (for 1 kHz)/pF (for 1 MHz)]
and K is defined as follows:

When Cx ≤ Cr: K = (1/Vs) x (Cr/Cx)
When Cx > Cr: K = 1/Vs
Where, Cr is a measurement range

[nF (for 1 kHz)/pF (for 1 MHz)] and
Vs is a measurement signal level [V].

Figure 3. Accuracy of Cp and Cs when measurement frequency
is 1 MHz (measurement signal level: 1V)

Figure 4 Accuracy of D when measurement frequency is 1 MHz
(measurement signal level: 1V)

6

Figure 1, Figure 2, Figure 3, and Figure 4 show the
accuracy of Cp, Cs, and D measured within the recom­mended measurement range for each measurement
range (refer to Table 6 and Table 7) when D ≤ 0.1 and
the ambient temperature is between 18°C and 28°C.

Figure 1. Accuracy of Cp and Cs when measurement
frequency is 1 kHz (measurement signal level: 1V)

Figure 2. Accuracy of D when measurement frequency is 1 kHz
(measurement signal level: 1V)

7

Measurement time

Table 12 shows the measurement time for each
measurement time mode.

Table 12. Measurement time

Measurement Measurement time
time mode (T3 + T4 + T5 of Figure 5)

Short 6.5 ± 0.5 ms

Long 16.5 ± 1.0 ms

Figure 5. Timing chart and measurement time

Table 13 shows the values of T1 - T7 when the following
conditions are met.

Display: OFF
Measurement range mode: Hold range mode (Hold)
Trigger delay time: 0 ms
Averaging factor: 1

(The ON/OFF of the compensation and comparator
function does not affect the values of T1 - T7)

Table 13. Values of T1 - T7 (Typical)

Measurement Minimum Typical Maximum
time mode value value value

T1 Trigger pulse width Independent 1 µs

*2

--

T2 Trigger response time of /READY_FOR_TRIG Independent - 200 µs 350 µs

Trigger response

T3 time of /INDEX Independent - 250 µs 400 µs

and /EOM

T4

Measurement time Analog measurement Short - 4.25 ms ­(T3 + T4 + T5) time (/INDEX) Long - 14.25 ms -

T5

Measurement

Independent - 2.0 ms -

computation time

T6 READY_FOR_TRIG setup time Independent - 15 µs 30 µs

T7 Trigger wait time Independent 0 µs - -

*2. When trigger signal is input through the handler interface.

Display renewal timing

The display is renewed immediately after the measure­ment completes (the /EOM signal goes low level).
However, the display is renewed after transferring the
measurement data if the external controller transmits
a request to read measurement data before end of
measurement. (The measurement data is transferred
after the display renewal completes if the external
controller transmits a request to read the measurement
data after the display renewal starts.)

Measurement time (T4)
when averaging function is used

When the averaging factor is set to more than 1, T4 is
calculated as follows. (See Table 15.)

Measurement data transfer time
through GPIB

Table 16 shows the measurement data transfer time
when the following conditions are met.

Host computer: HP9000 Series,

Model C200
Display: ON
Measurement range mode: Hold range mode (Hold)
OPEN/SHORT/LOAD compensation: ON
Measurement signal monitor: OFF
BIN count function: OFF

Display time

When the display is ON, the instrument needs the time
(display time) to renew the displayed items. The display
time shown in Table 14 depends on the display page of
the instrument setup display area (use the [Show
Setting] key in the front panel to select the item you
want to display). The ON/OFF of the deviation
measurement mode does not affect the display time.

Table 14. Display time

Display page of the instrument Typical
setup display area value
Page number Display item

1

Frequency and level

of measurement signal

2.5 ms

2

Averaging factor and

measurement cable length

3

Measurement range and

trigger delay time

4

Measurement signal

level monitor values 4.0 ms

5 Multi compensation settings

6

Handler output

(comparator sorting result)

7 to 18 Limit range settings of comparator

19 to 24 BIN count results

8

Table 16. Measurement Data Transfer Time (Typical)

Data transfer format

Comparator

On Off

Required time for data readout of a measurement using :FETC? command

ASCII 2.3 ms 2.1 ms

(Total time of command transmission and data transfer)

Binary 2.5 ms 2.3 ms

Command transmission

ASCII

1.9 ms 1.9 ms

Required time for data readout of Data transfer 1.7 ms 1.5 ms

a measurement using :READ? command Command transmission

Binary

1.9 ms 1.9 ms

Data transfer 1.4 ms 1.2 ms

Required time for data readout of 1000 measurements using

ASCII 1.40 s 1.15 s

:DATA? BUF3 command (Total time of command transmission and data transfer)

Binary 0.65 s 0.49 s

Table 15. Measurement time @ averaging ≥ 2(typical)

Measurement frequency Measurement time mode Equation to calculate T4*3[ms] (typical)

1 kHz

Short T4 = 4.85 x Ave - 0.6

Long T4 = 14.85 x Ave - 0.6

1 MHz

Short T4 = (4

x

100 +Fshift

+ 0.85) xAve -0.6

Long T4 = (14

x

100 +Fshift

+ 0.85) xAve -0.6

100

100

*3. Ave: Averaging factor, F Shift: Frequency Shift setting
(-1, 0, 1 or 2)

9

Measurement assistance functions

Compensation function

OPEN compensation, SHORT compensation, LOAD
compensation, and OFFSET compensation are all available.

MULTI compensation function

• OPEN/SHORT/LOAD compensation for 64 channels

• The LOAD compensation standard value can be

defined for each channel.

Display

Meter has a 40-column x2-row LCD display.

Deviation measurement function

Deviation from reference value and percentage of
deviation from the reference value can be output as
the result.

Comparator function

BIN sort The primary parameter can be sorted into 9 BINS,

OUT_OF_BINS, AUX_BIN, and LOW_C_REJECT.
The secondary parameter can be sorted into High, In, and Low.

Limit setup An absolute value, deviation value, and %

deviation value are available for setup.

Bin count Countable from 0 to 999999.

Low C reject function

Extremely low measured capacitance values can be
automatically detected as a measurement error.

Measurement signal level monitor function

• Measurement voltage and measurement current can
be monitored.

• Level monitor accuracy (typical): ±(3% + 1 mV)

Data buffer function

Up to 1000 measurement results can be read out in a
batch.

Save/recall function

Up to 10 setup conditions can be written to and read
from the built-in non-volatile memory.

Resume function

• Recovers the instrument setup automatically saved
at power-down at the next power-on.

• Memory retention time (typical):
72 hours (23°C ±5°C)

Key lock function

The front panel keys can be locked.

GPIB interface

Complies with IEEE488.1, 2 and SCPI.

Handler interface

The input and output signals are negative logic and
optically-isolated open collector signals.

Output signal Bin1 - Bin9, Out of Bins, Aux Bin, P-Hi,

P-Lo, S-Reject, INDEX, EOM, Alarm, OVLD, Low C Reject

Input signal Keylock, Ext-Trigger

Scanner interface

The input and output signals are negative logic and
optically-isolated open collector signals.

Output signal INDEX, EOM

Input signal Ch0 - Ch5, Ch valid, Ext-Trigger

Measurement circuit protection

See Table 17 for the maximum discharge withstand
voltage that the internal circuit can be protected if a
charged capacitor is connected to the UNKNOWN
terminal is as follows.

NOTE: Discharge capacitors before connecting them to the

UNKNOWN terminal (or a test fixture).

Table 17. Maximum discharge withstand voltage (typical)

Maximum discharge Range of the capacitance

withstand voltage value C of DUT

1000 V C < 2 µF

√2/C V C ≥ 2 µF

Figure 6. Maximum discharge withstand voltage (typical)

EMC

European Council Directive 89/336/EEC
IEC 61326-1:1997+A1

CISPR 11:1990 / EN 55011:1991 Group 1, Class A
IEC 61000-4-2:1995 / EN 61000-4-2:1995

4 kV CD / 4 kV AD

IEC 61000-4-3:1995 / EN 61000-4-3:1996

3 V/m, 80-1000 MHz, 80% AM

IEC 61000-4-4:1995 / EN 61000-4-4:1995

1 kV power / 0.5 kV Signal

IEC 61000-4-5:1995 / EN 61000-4-5:1995

0.5 kV Normal / 1 kV Common

IEC 61000-4-6:1996 / EN 61000-4-6:1996

3 V, 0.15-80 MHz, 80% AM

IEC 61000-4-11:1994 / EN 61000-4-11:1994

100% 1 cycle

Note: When tested at 3 V/m according to IEC 61000-4-3:1995 /
EN 61000-4-3:1996, the measurement accuracy is double the
accuracy of basic specification when the test frequency is 1 kHz
and the instrument measurement range is 100 pF.

AS / NZS 2064.1/2 Group 1, Class A

Safety

European Council Directive 73/23/EEC
IEC 61010-1:1990+A1+A2 / EN 61010-1:1993+A2

INSTALLATION CATEGORY II, POLLUTION DEGREE 2
INDOOR USE

IEC60825-1:1994 CLASS 1 LED PRODUCT

CAN / CSA C22.2 No. 1010.1-92

General specifications

Power source

Voltage 90 VAC - 132 VAC, 198 VAC - 264 VAC

Frequency 47 Hz - 66 Hz

Power consumption Max. 35 W /Max. 100 VA

Operating environment

Temperature 0°C - 45°C
Humidity ( ≤ 40°C, no condensation) 15% - 95% RH

Altitude 0 m - 2000 m

Storage environment

Temperature -40°C - 70°C
Humidity ( ≤ 65°C, no condensation) 0% - 90% RH

Altitude 0 m - 4572 m

Weight

3 kg (nominal), 6.6 lbs

Outer dimensions

320 (width) x 100 (height) x 300 (depth) mm (nominal)

12.6(W) x 3.9(H) x 11.8(D) inches (nominal)

Figure 7. 4288A Front view

Figure 8. 4288A Rear view

Figure 9. 4288A Side view

10

11

When measurement parameter is Cp-G

The following is an example of calculating accuracy of
Cp and G, assuming that measured result of Cp is

8.00000 nF and measured result of G is 1.00000 µ S.

The accuracy of Cp is the same as that in the example
of Cp-D.

From Table 10, the equation to calculate the accuracy of
G is (3.5 + 2.0 xK) xCx. Substitute K = 2.5 (same as
Cp-D) and 8.00000 nF of the measured Cp result into
this equation. The accuracy of G is (3.5 + 2.0 x2.5)

x

8.00000 = 68 nS(0.068 µS).

Therefore, the true G value exists within 1.00000 ± 0.068
µS, that is, 0.932 µS to 1.068 µS.

When measurement parameter is Cp-Rp

The following is an example of calculating accuracy of
Cp and Rp, assuming that measured result of Cp is

8.00000 nF and measured result of Rp is 2.00000 MΩ.

The accuracy of Cp is the same as that in the example
of Cp-D.

From Table 10, the equation to calculate the accuracy of
G is (3.5 + 2.0 xK) xCx. Substitute K = 2.5 (same as
Cp-D) and 8.00000 nF of the measured Cp result into
this equation. The accuracy of G is (3.5 + 2.0 x2.5)

x

8.00000 = 68 nS. Then, substitute the obtained G
accuracy into Equation 2. The accuracy of Rp is
± (2

x 10

6)2

x

68 x10

-9

/(1 2 x10

6

x

68 x10

-9

) = ± 0.272

x

10

6

/(1 0.136) , that is, -0.23944 MΩ to 0.31481 MΩ.

Therefore, the true Rp value exists within 1.76056 MΩ to

2.31481 MΩ.

When measurement parameter is Cs-Rs

The following is an example of calculating accuracy of
Cp and Rs, assuming that measured result of Cs is

8.00000 nF and measured result of Rs is 4.00000 kΩ.

Because the Cs accuracy is D = 2 xπxFreq xCs xRp =
2 xπx10

3

x8 x

10

-9

x4x

10

3

= 0.2> 0.1, multiply 0.13%

(the result obtained for Cs-D) by 1 + D

2

. The result is

0.13 x (1 + 0.2

2

) = 0.1352%.

From Table 10, the equation to calculate the accuracy of
Rs is (90 + 50 xK)/Cx. Substitute K = 2.5 (same as Cs-D)
and 8.00000 nF of the measured Cs result into this
equation. The accuracy of G is (90 + 50 x2.5)/8.00000 =

26.875 Ω. Because D>0.1, multiply the result by 1 + D

2

as in the case of Cs. The final result is 27.95 Ω.

Therefore, the true Cs value exists within

8.00000 ± (8.00000 x0.1352/100) = 8.00000 ± 0.01082 nF,
that is, 7.98918 nF to 8.01082 nF, and the true Rs value
exists within 4.00000 ± 0.02795 kΩ, that is, 3.97205 to

4.02795 kΩ.

Sample calculations
of measurement accuracy

This section describes an example of calculating the
measurement accuracy for each measurement parame­ter, assuming the following measurement conditions:

Measurement signal frequency 1 kHz
Measurement signal level 0.5 V
Measurement range 10 nF
Measurement time mode Short mode
Ambient temperature 28°C

When measurement parameter

is Cp-D (or Cs-D)

The following is an example of calculating accuracy
of Cp (or Cs) and D, assuming that measured result of
Cp (or Cs) is 8.00000 nF and measured result of D
is 0.01000.

From Table 10, the equation to calculate the accuracy
of Cp (or Cs) is 0.055+0.030 xK and the equation to
calculate the accuracy of D is 0.00035 + 0.00030 xK. The
measurement signal level is 0.5, the measurement range
is 10 nF, and the measured result of Cp (or Cs) is

8.00000 nF. Therefore, K = (1/0.5) x(10/8.00000) = 2.5.
Substitute this result into the equation. The result is: the
accuracy of Cp (or Cs) is 0.055 + 0.030 x2.5 = 0.13% and
the accuracy of D is 0.00035 + 0.00030 x2.5 = 0.0011.

Therefore, the true Cp (or Cs) value exists within

8.00000 ± (8.00000 x0.13/100) = 8.00000 ± 0.0104 nF,
that is, 7.9896 nF to 8.0104 nF, and the true D value
exists within 0.01000 ± 0.0011, that is, 0.0089 to 0.0111.

When measurement parameter
is Cp-Q (or Cs-Q)

The following is an example of calculating accuracy of
Cp (or Cs) and Q, assuming that measured result of Cp
(or Cs) is 8.00000 nF and measured result of Q is 20.0.

The accuracy of Cp (or Cs) is the same as that in the
example of Cp-D.

From Table 10, the equation to calculate the accuracy
of D is 0.00035 + 0.00030 xK. Substitute K = 2.5 (same
as Cp-D) into this equation. The accuracy of D is 0.00035
+ 0.00030 x2.5 = 0.0011. Then, substitute the obtained D
accuracy into Equation 1. The accuracy of Q is ± (20.0)

2

x

0.0011/(1 20.0 x0.0011) = ±0.44/(1 0.022), that is,

-0.43 to 0.45.

Therefore, the true Q value exists within 19.57 to 20.45.

±

±

±

±

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and technicians worldwide can help you maximize your productivity,
optimize the return on investment of your Agilent instruments and
systems, and obtain dependable measurement accuracy for the
life of those products.

Key literature

Agilent 4288A Capacitance Meter product overview,
publication number 5980-2861EN.

Web resources

Please visit our component manufacturer industry
area at:

www.agilent.com/find/component_test

By internet, phone, or fax, get assistance with all your test and
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Product specifications and descriptions
in this document subject to change
without notice.

Copyright ©2000 Agilent Technologies
Printed in USA December 28, 2000
5988-0362E