Agilent 4140B Specifications Sheet

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Introduction
HP’s 4140B pA Meter/DC Voltage Source pro­vides a stable picoampere meter with maximum resolution of 10-15A and two programmable dc voltage sources. This, along with the program­mable hold and step delay function, enables you to make synchronized measurements on a device or material.
0
Reliable, efficient pA current measurements need-
ed in R&D labs, production, and QA can now be made with just one instrument, the 4140B. Measurements on electronic components, insula-
tion materials, and especially semiconductor
devices are fast, convenient and accomplished with ease.
Stable
Current
Measurements
The 41409 makes very stable, high resolu­tion current measurements to + 1.000 x
10.‘*A (1 x 10-15A maximum resolution) that were previously very difficult to make. The Zero offset cancels up to leakage current of test leads or fixtures in the Current (I, I-V) modes, and up to pF stray capacitance in the C-V mode. The zero capability, along with low noise test leads (16053A) and electrostatic/light shielded test fixture (16055A), lets you measure low pA currents with confidence.
100 x 10-15A
100
Synchronized pA Measurements
Two internal programmable dc sources provide staircase, ramp,
dc
level outputs. The start, stop, and step
voltages can be set from -
V
with
10 mV
resolution and the hold/step delay times can be set depending on the characteristics of the device or material being tested. These features, together with
100 V
the pA measurement section, provide an
automatically synchronized measurement.
voltage
and stable
to +
100
HP-IB’ Operation
Systems integration is easily accomplished with the HP-IB interface, allowing remote programming of all front panel controls. Measurement data can be taken into the controller, processed, and then displayed in a variety of formats. This is especially effective in the manufacturing process where rapid feedback is essential.
*HP-IB (Hewlett-Packard Interface Bus) is Hewlett-Packard’s implementation of IEEE 488-l 975, ANSI Standard #MC1 .l
Selectable Function / Integration Times /Line Filter
The synchronized measurement capability allows current-voltage (I-V) and
capacitance-voltage (C-V) measurements in addition to the normal pA current (I)
measurements. Ranging is automatic or manual (up/down).
A
significant feature is the selectable
integration time (short, medium, or long).
This allows a trade-off of speed vs. ac­curacy in current measurements.
The filter function enables accurate 1 pA
measurements even when noise is times greater than the DC current being measured.
2
1000
Self Test/Analog Output
The automatic self test functionally verifies proper operation of the digital and analog circuitry.
The Analog Output supplies X-Y recorder outputs necessary for plotting I-V and C-V data. This includes measurement data, pen control, and upper voltages.
and lower limit
in Picoampere Current
Source Current Limit
To protect the material or device under test, the 4140B has a programmable cur­rent limit capability on both internal dc sources. Current limits of 10-4, lo-“, 10’2A are selected either manually or under HP­IB control.
Voltage Sweep Functions
Flexible voltage sweep control capability allows operator to optimize any current
voltage measurement. Controls are AUTO/START, MAN (PAUSE) for changing step voltage/sweep direction during a measurement, STEP (I. t), and ABORT.
Measurements
PARAMETER MEASURED
DISPLAY

Key Features

I, I-V & c-v
Can also be used as a programmable source/function generator (DC, ramp
1 & staircase).
O.lpF - 1999 pF
Quasi-Static C-V Measurements
A capacitance measurement utilizing a ramp voltage (quasi-static or dc C-V measurement) is employed as one method of evaluating semiconductors. In the
4140B. capacitance is calculated from the
measured current I that is synchronized
with a ramp voltage dV/dt (C = I/dV/dt). Capacitance change can also be displayed as a percent of Cox (the capacitance of the oxide layer).
Parameter Selection / Data Entry
Parameter selection and data entry is accomplished either manually from- the front panel or via the HP-IB. Select the parameter (START V, STOP V, HOLD TIME...), enter the appropriate data
(voltage, time, or ramp rate) and press the ENTER key. Each data entry is stored in memory. The measurement is then made
automatically by pushing. the START key,
SWEEP MODE
AUTO/Manual (Pause)
I
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