The W3EG6433S is a 2x16Mx64 Double Data Rate
SDRAM memory module based on 256Mb DDR SDRAM
component. The module consists of sixteen 16Mx8 DDR
SDRAMs in 66 pin TSOP packages mounted on a 184
pin FR4 substrate.
Synchronous design allows precise cycle control with the
use of system clock. Data I/O transactions are possible on
both edges and Burst Lengths allow the same device to be
useful for a variety of high bandwidth, high performance
memory system applications.
* This product is under development, is not qualifi ed or characterized and is subject to
change without notice.
November 2005
Rev. 2
1
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
W3EG6433S-D3
White Electronic Designs
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS
ParameterSymbolValueUnits
Voltage on any pin relative to V
Voltage on VCC supply relative to V
SS
SS
Storage TemperatureT
Power DissipationP
Short Circuit CurrentI
Note: Permanent device damage may occur if ‘ABSOLUTE MAXIMUM RATINGS’ are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability
VIN, V
VCC, V
STG
OS
OUT
CCQ
-0.5 to 3.6V
-1.0 to 3.6V
-55 to +150°C
D
24W
50mA
-JD3
Recommended perating conditions (Voltage referenced to VSS=0V, TA=0 to 70°C)
DC OPERATING CONDITIONS
ParameterSymbolMinMaxUnitNote
Supply Voltage (for device with a nominal V
I/O Supply VoltageV
I/O Reference VoltageV
I/OTermination VoltageV
Input Logic High VoltageV
Input Logic Low VoltageV
Input Voltage Level, CK and CK# InputsV
Input Differential Voltage, CK and CK# InputsV
of 2.5V)V
CC
CC
CCQ
REF
TT
IH
IL
IN(DC)
ID(DC)
V-I Matching: Pullup to Pulldown Current RatioVI(Ratio)0.711.4-4
Input leakage currentI
Output leakage currentI
Output High Current(Normal strengh driver); V
Output High Current(Normal strengh driver); V
Output High Current(Half strengh driver); V
Output High Current(Half strengh driver); V
NOTES:
1. V
is expected to be equal to 0.5*V
REF
value.
2. V
is not applied directly to the device. V
TT
V
REF.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK#.
4. The ratio of the pullup current to the pulldown current is specifi ed for the same temperature and voltage, over the entire temperature and voltage range, for device drain to source
voltages from 0.25V to 1.0V. For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation. The full variation in the ratio
of the maximum to minimum pullup and pulldown current will not exceed 1/7 for device drain to source voltages from 0.1 to 1.0.
CCQ
= V
= 0.84VI
OUT
TT
= V
= 0.84VI
OUT
TT
= V
= 0.45VV
OUT
TT
= V
= 0.45VV
OUT
TT
of the transmitting device, and to track variations in the dc level of same. Peak-to peak noise on V
is a system supply for signal termination resistors, is expected to be set equal to V
TT
I
OZ
OH
OL
OH
OL
2.32.7V
2.32.7V
0.49*V
CCQ
V
-0.04V
REF
V
+ 0.15V
REF
-0.3V
-0.3V
0.36V
0.51*V
CCQ
+0.04V2
REF
+ 0.3V
CCQ
-0.15V
REF
+ 0.3V
CCQ
+ 0.6V3
CCQ
V1
-22uA
-55uA
-16.8uA
16.8uA
-9uA
9uA
may not exceed +/-2% of the dc
REF
, and must track variations in the DC level of
REF
November 2005
Rev. 2
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
W3EG6433S-D3
White Electronic Designs
PRELIMINARY
CAPACITANCE
TA = 25°C. f = 1MHz, VCC = 2.5V
ParameterSymbolMaxUnit
Input Capacitance (A0-A11)C
Input Capacitance (RAS#,CAS#,WE#)C
Input Capacitance (CKE0, CKE1, CKE2)C
Input Capacitance (CLK0, CLK1, CLK2)C
Input Capacitance (CS0#, CS1#)C
Input Capacitance (DMO ~ DM7)C
Input Capacitance (BA0-BA1)C
Data input/output capacitance (DQ0-DQ63)(DQS)C
Data input/output capacitance (CB0-CB7)C
IN1
IN2
IN3
IN4
IN5
IN6
IN7
OUT
OUT
81pF
81pF
50pF
34pF
50pF
12pF
81pF
12pF
-pF
-JD3
November 2005
Rev. 2
5
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
White Electronic Designs
IDD SPECIFICATIONS AND TEST CONDITIONS
0°C ≤ TA ≤ 70°C, V
Includes DDR SDRAM component only
= 2.5V ± 0.2V, VCC = 2.5V ± 0.2V
CCQ
W3EG6433S-D3
-JD3
PRELIMINARY
ParameterSymbol Conditions
Operating CurrentI
Operating CurrentI
Precharge PowerDown Standby
Current
Idle Standby CurrentI
Active Power-Down
Standby Current
Active Standby
Current
Operating CurrentI
Operating CurrentI
Auto Refresh
Current
Self Refresh CurrentI
Operating CurrentI
NOTES:
• Module I
• I
was calculated on the basis of component IDD and can be different measured according to dq hearing cap.
DD
specifi cation is based on SAMSUNG components. Other DRAM manufactures specifi cation may be different.
DD
One device bank; Active - Precharge;
DD0
tRC=t
RC
and DQS inputs changing once per
clock cycle; Address and control
inputs changing once every two
cycles.
One device bank; Active-Read-
DD1
Precharge Burst = 2; tRC=t
tCK=tCK (MIN); l
and control inputs changing once per
clock cycle.
I
All device banks idle; Power-down
DD2P
mode; tCK=t
CS# = High; All device banks idle;
DD2F
tCK=t
CK
and other control inputs changing
once per clock cycle. VIN = V
DQ, DQS and DM.
I
One device bank active; Power-Down
DD3P
mode; t
I
CS# = High; CKE = High; One device
DD3N
bank; Active-Precharge; tRC=t
(MAX); tCK=t
DQS inputs changing twice per clock
cycle; Address and other control
inputs changing once per clock cycle.
Burst = 2; Reads; Continuous burst;
DD4R
One device bank active; Address
and control inputs changing once
per clock cycle; TCK= T
= 0mA.
Burst = 2; Writes; Continuous burst;
DD4W
One device bank active; Address
and control inputs changing once per
clock cycle; tCK=t
and DQS inputs changing once per
clock cycle.
I
DD5tRC
DD6
DD7A
= t
RC
CKE ≤ 0.2V
Four bank interleaving Reads (BL=4)
with auto precharge with tRC=tRC
(MIN); tCK=t
control inputs change only during
Active Read or Write commands.
(MIN); tCK=tCK (MIN); DQ,DM
(MIN);
RC
= 0mA; Address
OUT
(MIN); CKE=(low)
CK
(MIN); CKE = high; Address
for
REF
(MIN); CKE=(low)
CK
(MIN); DQ, DM and
CK
RAS
DDR333@CL=2.5
Max
680640640mA
880800800mA
242424rnA
200180180mA
240200200mA
360320320mA
DDR266@CL=2
Max
DDR266@CL=2/2.5
MaxUnits
1,120960960mA
CK
(MIN); l
OUT
1,1601,0001,000rnA
(MIN); DQ,DM
CK
(MIN)1,3201,2401,240mA
161616mA
2,4002,0002,000mA
(MIN); Address and
CK
November 2005
Rev. 2
6
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
W3EG6433S-D3
White Electronic Designs
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND
RECOMMENDED AC OPERATING CONDITIONS
AC Characteristics335
(DDR333@CL=2.5)
ParameterSymbolMinMaxMinMaxMinMaxMinMaxUnitsNotes
Row cycle timet
Refresh row cycle timet
Row active timet
RAS to CAS delayt
Row precharge timet
Row active to Row active delayt
Write recovery timet
Last data in to Read commandt
Col. address to Col. address delayt
Clock cycle timeCL=2.0t
RFC
RAS
RCD
RRD
WTD
CCD
60 60 65 65ns
RC
72757575ns
4270K45120K45120K45120Kns
18152020ns
18152020ns
RP
12151515ns
15151515ns
WR
1111t
1111t
7.5127.5127.5121012ns
CK
CL=2.56127.5127.5127.512ns
Clock high level widtht
Clock low level widtht
DQS-out access time from CK/CKt
Output data access time from CK/CKt
Data strobe edge to output data edget
Read Preamblet
Read Postamblet
CK to valid DQS-int
DQS-in setup timet
DQS-in hold timet
DQS falling edge to CK rising-setup timet
DQS falling edge from Ck rising-hold timet
DQS-in high level widtht
DQS-in low level widtht
DQS-in cycle timet
Address and Control Input setup time (fast)t
Address and Control Input hold time (fast)t
Address and Control Input setup time (slow)t
Address and Control Input setup time (slow)t
Data-out high impedence time from CK/CKt
Data-out high impedence time from CK/CKt
Input Slew Rate (for input only pins)t
Input Slew Rate (for I/O pins)t
DQSCK
WPRES
0.450.550.450.550.450.550.450.55t
CH
0.450.550.450.550.450.550.450.55t
CL
-0.6+0.6-0.75+0.75-0.75+0.75-0.75+0.75ns
-0.7+0.7-0.75+0.75-0.75+0.75-0.75+0.75ns
AC
DQSQ
RPRE
RPST
DQSS
-0.45-0.5-0.5-0.5ns12
0.91.10.91.10.91.10.91.1t
0.40.60.40.60.40.60.40.6t
0.751.250.751.250.751.250.751.25t
0000ns3
0.250.250.250.25t
WPRE
0.20.20.20.2t
DSS
0.20.20.20.2t
DSH
0.350.350.350.35t
DQSH
0.350.350.350.35t
DQSL
0.91.10.91.10.91.10.91.1t
DSC
0.750.90.90.9nsi,5.7~9
IS
0.750.90.90.9nsi,5.7~9
IH
0.81.01.01.0nsi,6~9
IS
0.81.01.01.0nsi,6~9
IH
HZ
LZ
SL(I)
SL(IO)
+0.7+0.75+0.75+0.75ns1
-0.7+0.7-0.75+0.75-0.75+0.75-0.75+0.75ns1
0.50.50.50.5V/ns
0.50.50.50.5V/ns
262
(DDR266@CL=2.0)
263
(DDR266@CL=2.0)
265
(DDR266@CL=2.5)
-JD3
PRELIMINARY
CK
CK
CK
CK
CK
CK
CK
CK
CK
CK
CK
CK
CK
November 2005
Rev. 2
7
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
W3EG6433S-D3
White Electronic Designs
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND
RECOMMENDED AC OPERATING CONDITIONS (continued)
AC Characteristics335
(DDR333@CL=2.5)
ParameterSymbolMinMaxMinMaxMinMaxMinMaxUnitsNotes
Output Slew Rate (x4,x8)t
Output Slew Rate Matching Ratio (rise
SL(O)
t
SLMR
1.04.51.04.51.04.51.04.5V/ns
0.671.50.671.50.671.50.671.5ns
to fall)
Mode register set cycle timet
DQ & DM setup time to DQSt
DQ & DM hold time to DQSt
Control & Address input pulse widtht
DQ & DM input pulse widtht
Power down exit timet
Exit self refresh to non-Read commandt
Exit self refresh to read commandt
Refreash interval timet
Output DQS valid windowt
Clock half periodt
Data hold skew factort
DQS write postamble timet
Active to Read with Auto precharge
MRD
IPW
DIPW
RDEX
XSRD
XSRD
REFI
QHS
WPST
t
RAP
12151515nsj, k
0.50.50.50.5nsj, k
DS
0.450.50.50.5ns8
DH
2.22.22.22.2ns8
1.751.751.751.75ns
67.57.57.5ns
75757575ns
200200200200t
15.615.615.615.6us4
QHtHP-tQHS
QHtCLmin or
t
chmin
-tHP-t
-
0.550.750.750.75ns11
0.40.60.40.60.40.60.40.6t
18202020
command
Autoprecharge write recovery &
Precharge time
t
XSNRtWR/tCK
tRP/tCK)
+
262
(DDR266@CL=2.0)
-tHP-t
QHS
t
CLmin or
t
chmin
-
tWR/tCK
+
tRP/tCK)
263
(DDR266@CL=2.0)
-tHP-t
QHS
t
CLmin or
t
chmin
-
tWR/tCK
+
tRP/tCK)
265
(DDR266@CL=2.5)
QHS
t
CLmin or
t
chmin
tWR/tCK
+
tRP/tCK)
-JD3
PRELIMINARY
CK
ns11
ns10, 11
CK
t
CK
2
13
November 2005
Rev. 2
8
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
White Electronic Designs
W3EG6433S-D3
-JD3
PRELIMINARY
Notes
1. t
and t
HZ
valid data transitions. These parameters are not referenced to
a specifi c voltage level but specify when the device output in no
longer driving (HZ), or begins driving (LZ).
2. The maximum limit for this parameter is not a device limit. The
device will operate with a greater value for this parameter, but
system performance (bus turnaround) will degrade accordingly.
3. The specifi c requirement is that DQS be valid (HIGH, LOW, or at
some point on a valid transition) on or before this CK edge. A valid
transition is defi ned as monotonic and meeting the input slew rate
specifi cations of the device. When no writes were previously in
progress on the bus, DQS will be transitioning from High- Z to logic
LOW. If a previous write was in progress, DQS could be HIGH,
LOW, or transitioning from HIGH to LOW at this time, depending
on t
4. A maximum of eight AUTO REFRESH commands can be posted
to any given DDR SDRAM device.
5. For command/address input slew rate ≥ 1.0 V/ns.
6. For command/address input slew rate ≥ 0.5 V/ns and > 1.0 V/ns
7. For CK & CK# slew rate ≥ 1.0 V/ns.
8. These parameters guarantee device timing, but they are not
necessarily tested on each device. They may be guaranteed by
device design or tester correlation.
transitions occur in the same access time windows as
LZ
DQSS.
9. Slew Rate is measured between VOH(ac) and VOL(ac).
10. Min (tCL, tCH) refers to the smaller of the actual clock low time and
the actual clock high time as provided to the device (i.e. this value
can be greater than the minimum specifi cation limits for t
t
. For example, tCL and tCH are = 50% of the period, less the half
CH
period jitter (t
jitter due to crosstalk (t
11. tQH = tHP - t
t
minimum half clock period for any given cycle and is defi ned
HP =
by clock high or clock low t
(HP)) of the clock source, and less the half period
QHS
JIT
, where:
(crosstalk)) into the clock traces.
JIT
CH
, tCL). t
accounts for 1) The pulse
QHS
CL
and
duration distortion of on-chip clock circuits; and 2) The worst case
push-out of DQS on one transition followed by the worst case
pull-in of DQ on the next transition, both of which are, separately,
due to data pin skew and output pattern effects, and p-channel to
n-channel variation of the output drivers.
12. t
DQSQ
Consists of data pin skew and output pattern effects and p-channel
to n-channel variation of the output
13. t
= (tWR/tCK) + (tRP/tCK)
DAL
drivers for any given cycle.
For each of the terms above, if not already an integer, round to
the next highest integer. Example: For DDR266 at CL=2.5 and
t
=7.5ns t
CK
= (15 ns / 7.5 ns) + (20 ns/ 7.5ns) = (2) + (3) t
DAL
DAL
=
5 clocks
November 2005
Rev. 2
9
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
White Electronic Designs
ORDERING INFORMATION FOR JD3
W3EG6433S-D3
-JD3
PRELIMINARY
Part NumberSpeedCAS Latencyt
RCD
t
RP
Height*
W3EG6433S335JD3166MHz/333Mb/s2.53330.48 (1.20")
W3EG6433S263JD3133MHz/266Mb/s22230.48 (1.20")
W3EG6433S263JD3133MHz/266Mb/s23330.48 (1.20")
W3EG6433S265JD3133MHz/266Mb/s2.53330.48 (1.20")
NOTES:
• Consult Factory for availability of RoHS compliant products. (G = RoHS Compliant)
• Vendor specifi c part numbers are used to provide memory components source control. The place holder for this is shown as lower case “x” in the part numbers above and is to
be replaced with the respective vendors code. Consult factory for qualifi ed sourcing options. (M = Micron, S = Samsung & consult factory for others)
• Consult factory for availability of industrial temperature (-40°C to 85°C) option
PACKAGE DIMENSIONS FOR JD3
133.48
(5.255" MAX.)
131.34
(5.171")
128.95
(5.077")
3.99
(0.157 (2x))
2.54
(0.100)
17.78
(0.700)
10.01
(0.394)
November 2005
Rev. 2
6.35
(0.250)
6.35
64.77
(2.550)
(0.250)
1.78
(0.070)
* ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES)
10
30.48
(1.20)
MAX
1.27
(0.050 TYP.)
49.53
(1.950)
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
2.31
(0.091)
(2x)
3.00
(0.118)
(4x)
3.99
(0.157)
(MIN)
1.27 ± 0.10
(0.050 ± 0.004)
White Electronic Designs
ORDERING INFORMATION FOR D3
W3EG6433S-D3
-JD3
PRELIMINARY
Part NumberSpeedCAS Latencyt
RCD
t
RP
Height*
W3EG6433S335D3166MHz/333Mb/s2.53330.48 (1.20")
W3EG6433S262D3133MHz/266Mb/s22230.48 (1.20")
W3EG6433S263D3133MHz/266Mb/s23330.48 (1.20")
W3EG6433S265D3133MHz/266Mb/s2.53330.48 (1.20")
NOTES:
• Consult Factory for availability of RoHS compliant products. (G = RoHS Compliant)
• Vendor specifi c part numbers are used to provide memory components source control. The place holder for this is shown as lower case “x” in the part numbers above and is to
be replaced with the respective vendors code. Consult factory for qualifi ed sourcing options. (M = Micron, S = Samsung & consult factory for others)
• Consult factory for availability of industrial temperature (-40°C to 85°C) option
PACKAGE DIMENSIONS FOR D3
133.48
(5.255" MAX.)
131.34
(5.171")
128.95
(5.077")
3.99
(0.157 (2x))
2.54
(0.100)
17.78
(0.700)
10.01
(0.394)
November 2005
Rev. 2
6.35
(0.250)
6.35
64.77
(2.550)
(0.250)
1.78
(0.070)
* ALL DIMENSIONS ARE IN MILLIMETERS AND (INCHES)
11
30.48
(1.20)
MAX
1.27
(0.050 TYP.)
49.53
(1.950)
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
2.31
(0.091)
(2x)
3.00
(0.118)
(4x)
3.99
(0.157)
(MIN)
1.27 ± 0.10
(0.050 ± 0.004)
W3EG6433S-D3
White Electronic Designs
PRELIMINARY
Document Title
256MB – 2x16Mx64 DDR SDRAM UNBUFFERED
Revision History
Rev #HistoryRelease DateStatus
-JD3
Rev 11.1 Created Datasheet
1.2 Added lead-free and RoHS notes
1.3 Added AC specs
1.4 Moved from Advanced to Preliminary
Rev 22.1 Added JEDEC standard PCB
2.2 D3 option is "NOT RECOMMENDED FOR NEW
DESIGNS"
2.3 Added lead-free and RoHS notes
2.4 Added source control notes
2.5 Added industrial temperature options
Rev 33.1 Update AC, I
3.2 Add 333MH speed
and cap specs
DD
12-04Preliminary
5-05Preliminary
11-05Preliminary
November 2005
Rev. 2
12
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
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