SST3958NL/U3958NL
New Product
Vishay Siliconix
Monolithic N-Channel JFET Dual
PRODUCT SUMMARY
V
FEATURES BENEFITS APPLICATIONS
D Anti Latchup Capability
D Monolithic Design
D High Slew Rate
D Low Offset/Drift Voltage
D Low Gate Leakage: 5 pA
D Low Noise: 9
D High CMRR: 100 dB
(V) V
GS(off)
-1.0 to -4.5 -50 1 -50 25
(BR)GSS
Min (V) gfs Min (mS) IG Max (pA) jV
GS1
- V
GS2
D External Substrate Bias—Avoids Latchup
D Tight Differential Match vs. Current
D Improved Op Amp Speed, Settling Time
Accuracy
D Minimum Input Error/Trimming Requirement
nV⁄√Hz
D Insignificant Signal Loss/Error Voltage
D High System Sensitivity
D Minimum Error with Large Input Signal
j Max (mV)
D Wideband Differential Amps
D High-Speed,
Temp-Compensated,
Single-Ended Input Amps
D High Speed Comparators
D Impedance Converters
DESCRIPTION
The low cost SST3958NL and U3958NL JFET duals are
designed for high-performance differential amplification for a
wide range of precision test instrumentation applications. This
series features tightly matched specs, low gate leakage for
accuracy, and wide dynamic range with IG guaranteed at
VDG = 20 V.
Pins 4 and 8 on the SST3958NL and pin 4 on the U3958NL part
numbers enable the substrate to be connected to a positive,
external bias (V
SUBSTRATE S
) to avoid latchup.
DD
Narrow Body SOIC
S
1
1
D
2
1
G
3
1
4
Top View
Marking Codes:
SST3958NL - 3958NL
8
7
6
5
SUBSTRATE
G
2
D
2
2
The U3958NL in the hermetically-sealed TO-78 package is
available with full military processing.
The SST3958NL in the SO-8 package provides ease of
manufacturing. The symmetrical pinout prevents improper
orientation. The SST3958NL is available with tape-and-reel
options for compatibility with automatic assembly methods.
TO-78
TO-78
S
S
1
1
1
1
D
D
1
1
2
2
3
3
G
G
1
1
4
4
CASE, SUBSTRATE
CASE, SUBSTRATE
Top View
U3958NL
G
G
2
2
7
7
D
D
2
2
6
6
5
5
S
S
2
2
ABSOLUTE MAXIMUM RATINGS
Gate-Drain, Gate-Source Voltage -50 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gate Current 50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead Temperature (1/16” from case for 10 sec.) 300 _C. . . . . . . . . . . . . . . . . .
Storage Temperature -65 to 200_C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating Junction Temperature -55 to 150_C. . . . . . . . . . . . . . . . . . . . . . . . . .
Document Number: 72157
S-22527—Rev. A, 17-Feb-03
Power Dissipation : Per Side
Notes
a. Derate 2 mW/_C above 85_C
b. Derate 4 mW/_C above 85_C
Total
b
a
250 mW. . . . . . . . . . . . . . . . . . . . . . . .
500 mW. . . . . . . . . . . . . . . . . . . . . . . . . . .
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7-1
SST3958NL/U3958NL
Vishay Siliconix
New Product
SPECIFICATIONS (TA = 25_C UNLESS OTHERWISE NOTED)
Parameter Symbol Test Conditions Min Typ
Static
Gate-Source Breakdown Voltage V
Gate-Source Cutoff Voltage V
Saturation Drain Current
Gate Reverse Current I
Gate Operating Current I
Gate-Source Voltage V
Gate-Source Forward Voltage V
b
(BR)GSS
GS(off)
I
DSS
GSS
GS(F)
Dynamic
Common-Source
Forward Transconductance
Common-Source Output Conductance g
Common-Source Input Capacitance C
Common-Source
Reverse Transfer Capacitance
Drain-Gate Capacitance C
Equivalent Input Noise Voltage e
Noise Figure NF
g
C
Matching
G
GS
fs
os
iss
rss
dg
n
IG = -1 mA, VDS = 0 V
VDS = 20 V, ID = 1 nA -1.0 -3 -4.5
VDS = 20 V, VGS = 0 V 0.5 5 8 mA
VGS = -30 V, VDS = 0 V -10 -100 pA
VDG = 20 V, ID = 200 mA
VDG = 20 V, ID = 200 mA
IG = 1 mA, VDS = 0 V 2
VDS = 20 V, VGS = 0 V
VDS = 20 V, VGS = 0 V
VDG = 10 V, IS = 0 , f = 1 MHz 1.5
VDS = 20 V, VGS = 0 V, f = 1 kHz 11
VDS = 20 V, VGS = 0 V
f = 100 Hz, R
f = 1 MHz
G
z
= 10 MW
TA = 150_C
TA =125_C
ID = 50 mA
Limits
a
Max Unit
-50 -57
-20 -500 nA
-5 -50 pA
-0.8 -250 nA
-0.5 -2.5 -4
-4.2
1 3.0 3.6 mS
8 35
3 4
1 1.2
0.5 dB
V
mS
pF
nV⁄
√Hz
Differential Gate-Source Voltage
Gate-Source Voltage Differential Change with
Temperature
Saturation Drain Current Ratio
Transconductance Ratio
Differential Output Conductance
Differential Gate Current
Common Mode Rejection Ratio CMRR
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing. NQP
b. Pulse test: PW v300 ms duty cycle v3%.
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7-2
|
V
GS1–VGS2
|
D
V
GS1–VGS2
|
g
os1–gos2
|
I
G1–IG2
DT
I
DSS1
I
DSS2
g
g
fs1
fs2
|
|
|
|
VDG = 20 V, ID = 200 mA
VDG = 20 V, ID = 200 mA
T
= -55 to 125_C
A
VDS = 20 V, VGS = 0 V 0.85 0.97 1
0.85 0.97 1
V
= 20 V, ID = 200 mA
D
f = 1 kHz
VDG = 20 V, ID = 200 mA
T
= 125_C
A
VDG = 10 to 20 V, ID = 200 mA
15 25 mV
20 100
0.1
0.1 10 nA
100 dB
Document Number: 72157
S-22527—Rev. A, 17-Feb-03
mV/_C
mS