Vishay Si4804BDY Datasheet

Dual N-Channel 30 V (D-S) MOSFET
Si4804BDY
Vishay Siliconix
PRODUCT SUMMARY
VDS (V) R
30
DS(on)
0.022 at V
0.030 at V
GS
GS
(Ω)I
= 10 V
= 4.5 V
D
(A)
7.5
6.5
FEATURES
• TrenchFET
• PWM Optimized
• 100 % R
®
Power MOSFET
Tested
g
• Compliant to RoHS Directive 2002/95/EC
APPLICATIONS
• Symmetrical Buck-Boost DC/DC Converter
SO-8
S
1
1
G
2
1
S
3
2
G
4
2
Top View
Ordering Information: Si4804BDY-T1-E3 (Lead (Pb)-free)
Si4804BDY-T1-GE3 (Lead (Pb)-free and Halogen-free)
D
8
1
D
7
1
D
6
2
D
5
2
G
1
N-Channel MOSFET
D
1
G
2
S
1
D
2
S
2
N-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter Symbol 10 s Steady State Unit
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (T
= 150 °C)
J
a
Pulsed Drain Current
Continuous Source Current (Diode Conduction)
a
Single Pulse Avalanche Current
Single Pulse Avalanche Energy
Maximum Power Dissipation
a
Operating Junction and Storage Temperature Range
TA = 25 °C
= 70 °C
T
A
L = 0.1 mH
TA = 25 °C
T
= 70 °C
A
V
DS
V
GS
I
D
I
DM
I
S
I
AS
E
AS
P
D
T
, T
J
stg
7.5 5.7
6.0 4.6
1.7 0.9
2.0 1.1
1.3 0.7
30
± 20
30
10
5mJ
- 55 to 150 °C
V
A
W
THERMAL RESISTANCE RATINGS
Limits
Parameter Symbol
Maximum Junction-to-Ambient
a
Maximum Junction-to-Foot (Drain) Steady State
t 10 s
Steady State 93 110
R
thJA
R
thJF
Typ. Max.
52 62.5
35 40
Notes: a. Surface Mounted on 1" x 1" FR4 board.
Document Number: 72061 S10-0461-Rev. G, 22-Feb-10
Unit
°C/W
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Si4804BDY
Vishay Siliconix
MOSFET SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min.
Static
V
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
Drain-Source On-State Resistance
Forward Transconductance
Diode Forward Voltage
Dynamic
a
b
b
b
b
Total Gate Charge
Gate-Drain Charge
Gate Resistance
Tur n - O n D e la y T i m e
Rise Time
Turn-Off Delay Time
Fall Time
Source-Drain Reverse Recovery Time
V
GS(th)
I
GSS
I
DSS
I
D(on)
R
DS(on)
g
V
Q
Q
Q
R
t
d(on)
t
d(off)
fs
SD
g
gs
gd
g
t
r
t
f
t
rr
V
V
VDS = 15 V, V
= VGS, ID = 250 µA
DS
VDS = 0 V, VGS = ± 20 V
V
= 30 V, V
DS
V
= 30 V, V
DS
GS
= 5 V, V
DS
V
= 10 V, ID = 7.5 A
GS
= 4.5 V, ID = 6.5 A
GS
= 0 V
GS
= 0 V, TJ = 85 °C
= 10 V
GS
VDS = 15 V, ID = 7.5 A
IS = 1 A, V
V
= 15 V, RL = 15 Ω
DD
1 A, V
I
D
GEN
= 0 V
GS
= 4.5 V, ID = 7.5 A
GS
= 10 V, Rg = 6 Ω
IF = 1.7 A, dI/dt = 100 A/µs
0.8 3.0 V
± 100 nA
20 A
0.5 1.5 2.6 Ω
Notes: a. Guaranteed by design, not subject to production testing. b. Pulse test; pulse width 300 µs, duty cycle 2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
a
Typ.
Max. Unit
1
15
0.017 0.022
0.024 0.030
19 S
0.75 1.2 V
711
2.9
2.5
915
10 17
19 30
915
35 55
µA
Ω
nCGate-Source Charge
ns
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Document Number: 72061
S10-0461-Rev. G, 22-Feb-10
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Si4804BDY
Vishay Siliconix
- Drain Current (A)I
D
- On Resistance (Ω)R
DS(on)
30
25
20
15
10
VGS = 10 V thru 5 V
5
0
0246810
- Drain-to-Source Voltage (V)
V
DS
4 V
3 V
Output Characteristics
0.040
0.030
VGS = 4.5 V
0.020
0.010
VGS = 10 V
30
25
20
15
- Drain Current (A)I
10
D
5
0
012345
1200
960
720
480
Capacitance (pF)
-
C
240
TC = 125 °C
25 °C
- Gate-to-Source Voltage (V)
V
GS
- 55 °C
Transfer Characteristics
C
iss
C
oss
0.000 0 5 10 15 20 25 30
On-Resistance vs. Drain Current
10
VDS = 15 V
= 7.5 A
I
D
8
6
4
- Gate-to-Source Voltage (V)
GS
2
V
0
0 3 6 9 12 15
Document Number: 72061 S10-0461-Rev. G, 22-Feb-10
ID - Drain Current (A)
Qg - Total Gate Charge (nC)
Gate Charge
C
rss
0
0 5 10 15 20 25 30
VDS - Drain-to-Source Voltage (V)
Capacitance
1.8 VGS = 10 V
= 7.5 A
I
D
- 50 - 25 0 25 50 75 100 125 150
- Junction Temperature (°C)
T
J
- On-Resistance R
DS(on)
(Normalized)
1.6
1.4
1.2
1.0
0.8
0.6
On-Resistance vs. Junction Temperature
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