
P-Channel 30-V (D-S) MOSFET
Si4435BDY
Vishay Siliconix
PRODUCT SUMMARY
VDS (V) R
0.020 at V
- 30
Ordering Information: Si4435BDY-T1-E3 (Lead (Pb)-free)
Si4435BDY-T1-GE3 (Lead (Pb)-free and Halogen-free
S
S
S
G
0.035 at V
1
2
3
4
(Ω)I
DS(on)
= - 10 V
GS
= - 4.5 V
GS
(A)
D
- 9.1
- 6.9
SO-8
D
8
D
7
D
6
D
5
Top Vi ew
FEATURES
• Halogen-free According to IEC 61249-2-21
Definition
• TrenchFET
®
Power MOSFET
• Advanced High Cell Density Process
• Compliant to RoHS Directive 2002/95/EC
APPLICATIONS
• Load Switches
• Battery Switch
S
G
D
P-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter Symbol 10 s Steady State Unit
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (T
= 150 °C)
J
a
Pulsed Drain Current
Continuous Diode Current (Diode Conduction)
Maximum Power Dissipation
a
a
Operating Junction and Storage Temperature Range
TA = 25 °C
T
= 70 °C
A
TA = 25 °C
T
= 70 °C
A
V
DS
V
GS
I
D
I
DM
I
S
P
D
T
, T
J
stg
- 9.1 - 7
- 7.3 - 5.6
- 2.1 - 1.25
- 30
± 20
- 50
2.5 1.5
1.6 0.9
- 55 to 150 °C
V
A
W
THERMAL RESISTANCE RATINGS
Parameter Symbol Typical Maximum Unit
Maximum Junction-to-Ambient
a
t ≤ 10 s
Steady State 70 85
Maximum Junction-to-Foot (Drain) Steady State
Notes:
a. Surface Mounted on 1" x 1" FR4 board.
Document Number: 72123
S09-0767-Rev. D, 04-May-09
R
thJA
R
thJF
40 50
°C/W
18 22
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1

Si4435BDY
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Static
V
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
a
Drain-Source On-State Resistance
Forward Transconductance
Diode Forward Voltage
Dynamic
b
a
a
Total Gate Charge
Gate-Drain Charge
Tur n -O n De l ay T i m e
Rise Time
Tur n -O f f D e lay T im e
Fall Time
Source-Drain Reverse Recovery Time
V
GS(th)
I
GSS
I
DSS
I
D(on)
a
R
DS(on)
g
fs
V
SD
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
t
rr
V
V
V
DS
I
D
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the de vice. These are stress rating s only, and functiona l operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
= VGS, ID = - 250 µA
DS
VDS = 0 V, VGS = ± 20 V
V
= - 30 V, V
DS
= - 30 V, V
DS
= - 5 V, V
DS
V
= - 10 V, ID = - 9.1 A
GS
V
= - 4.5 V, ID = - 6.9 A
GS
GS
= 0 V
GS
= 0 V, TJ = 55 °C
= - 10 V
GS
VDS = - 10 V, ID = - 9.1 A
IS = - 2.1 A, V
= - 15 V, V
≅ - 1 A, V
GS
V
= - 15 V, RL = 15 Ω
DD
GEN
= 0 V
GS
= - 10 V, ID = - 9.1 A
= - 10 V, Rg = 6 Ω
IF = - 2.1 A, dI/dt = 100 A/µs
- 1 - 3 V
± 100 nA
- 1
- 5
µA
- 40 A
0.015 0.020
0.025 0.035
24 S
- 0.8 - 1.2 V
33 70
5.8
nCGate-Source Charge
8.6
10 15
15 25
110 170
70 110
60 90
Ω
ns
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
50
40
30
20
- Drain Current (A)I
D
10
0
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2
012345
V
= 10 V thru 6 V
GS
5 V
4 V
- Drain-to-Source Voltage (V)
V
DS
Output Characteristics
- Drain Current (A)I
3 V
50
TC = - 55 °C
40
30
20
D
10
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
V
- Gate-to-Source Voltage (V)
GS
25 °C
Transfer Characteristics
Document Number: 72123
S09-0767-Rev. D, 04-May-09
125 °C