SFH615A / SFH6156
Vishay Semiconductors
Optocoupler, High Reliability, 5300 V
Features
• Excellent CTR Linearity Depending on
Forward Current
• Isolation Test Voltage, 5300 V
• Fast Switching Times
• Low CTR Degradation
• Low Coupling Capacitance
• Lead (Pb)-free component
• Component in accordance to RoHS 2002/95/EC
and WEEE 2002/96/EC
Agency Approvals
• UL1577, File No. E52744 System Code H or J,
Double Protection
• DIN EN 60747-5-2 (VDE0884)
DIN EN 60747-5-5 pending
Available with Option 1
Applications
Switchmode power supply
Telecom
Battery powered equipment
Description
The SFH615A (DIP) and SFH6156 (SMD) feature a
variety of transfer ratios, low coupling capacitance
and high isolation voltage. These couplers have a
GaAs infrared diode emitter, which is optically coupled to a silicon planar phototransistor detector, and
is incorporated in a plastic DIP-4 or SMD package.
The coupling devices are designed for signal transmission between two electrically separated circuits.
The couplers are end-stackable with 2.54 mm lead
spacing.
Creepage and clearance distances of > 8.0 mm are
achieved with option 6. This version complies with
IEC 60950 (DIN VDE 0805) for reinforced insulation
up to an operation voltage of 400 V
Specifications subject to change.
RMS
RMS
or DC.
e3
Order Information
SFH615A-1 CTR 40 - 80 %, DIP-4
SFH615A-2 CTR 63 - 125 %, DIP-4
SFH615A-3 CTR 100 - 200 %, DIP-4
SFH615A-4 CTR 160 - 320 %, DIP-4
SFH6156-1 CTR 40 - 80 %, SMD-4
SFH6156-2 CTR 63 - 125 %, SMD-4
SFH6156-3 CTR 100 - 200 %, SMD-4
SFH6156-4 CTR 160 - 320 %, SMD-4
SFH615A-1X006 CTR 40 - 80 %, DIP-4 400 mil (option 6)
SFH615A-1X007 CTR 40 - 80 %, SMD-4 (option 7)
SFH615A-2X006 CTR 63 - 125 %, DIP-4 400 mil (option 6)
SFH615A-2X007 CTR 63 - 125 %, SMD-4 (option 7)
SFH615A-2X009 CTR 63 - 125 %, SMD-4 (option 9)
SFH615A-3X006 CTR 100 - 200 %, DIP-4 400 mil (option 6)
SFH615A-3X007 CTR 100 - 200 %, SMD-4 (option 7)
SFH615A-3X008 CTR 100 - 200 %, SMD-4 (option 8)
SFH615A-3X009 CTR 100 - 200 %, SMD-4 (option 9)
SFH615A-4X006 CTR 160 - 320 %, DIP-4 400 mil (option 6)
SFH615A-4X007 CTR 160 - 320 %, SMD-4 (option 7)
SFH615A-4X008 CTR 160 - 320 %, SMD-4 (option 8)
SFH615A-4X009 CTR 160 - 320 %, SMD-4 (option 9)
For additional information on the available options refer to
Option Information.
See TAPE AND REEL Section for 4-pin optocouplers T0 with 90 °
rotation.
RMS
1
A
1
C
2
17448
Part Remarks
C
4
3
E
1
Document Number 83671
Rev. 1.9, 11-May-05
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1
SFH615A / SFH6156
Vishay Semiconductors
Absolute Maximum Ratings
T
= 25 °C, unless otherwise specified
amb
Stresses in excess of the absolute Maximum Ratings can cause permanent damage to the device. Functional operation of the device is
not implied at these or any other conditions in excess of those given in the operational sections of this document. Exposure to absolute
Maximum Rating for extended periods of the time can adversely affect reliability.
Input
Parameter Test condition Symbol Val ue Unit
Reverse voltage V
DC Forward current I
Surge forward current t
≤ 10 µsI
p
Power dissipation P
Output
Parameter Test condition Symbol Val ue Unit
Collector-emitter voltage V
Emitter-collector voltage V
Collector current I
t
≤ 1.0 ms I
p
Power dissipation P
R
F
FSM
diss
CE
CEO
C
C
diss
6.0 V
60 mA
2.5 A
100 mW
70 V
7.0 V
50 mA
100 mA
150 mW
Coupler
Parameter Test condition Symbol Val ue Unit
Isolation test voltage (between
emitter and detector, refered to
t = 1.0 s V
ISO
climate DIN 40046, part 2,
Nov. 74
Creepage ≥ 7.0 mm
Clearance ≥ 7.0 mm
Insulation thickness between
emitter and detector
Comparative tracking index per
DIN IEC 112/VDE 0303, part 1
Isolation resistance V
= 500 V, T
IO
V
= 500 V, T
IO
Storage temperature range T
Ambient temperature range T
Soldering temperature max. 10 s, Dip soldering
distance to seating plane
= 25 °C R
amb
= 100 °C R
amb
T
IO
IO
stg
amb
sld
≥ 1.5 mm
5300 V
≥ 0.4 mm
≥ 175
12
≥ 10
11
≥ 10
- 55 to + 150 °C
- 55 to + 100 °C
260 °C
RMS
Ω
Ω
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Document Number 83671
Rev. 1.9, 11-May-05
200
150
SFH615A / SFH6156
Vishay Semiconductors
100
50
tot
P –Power Dissipation (mW)
18483
Diode
0
0 25 50 75 100 125 150
T
– Ambient Temperature ( qC )
amb
Phototransistor
Figure 1. Permissible Power Dissipation vs. Ambient Temperature
Electrical Characteristics
T
= 25 °C, unless otherwise specified
amb
Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering
evaluation. Typical values are for information only and are not part of the testing requirements.
Input
Parameter Test condition Symbol Min Ty p. Max Unit
Forward voltage I
Reverse current V
Capacitance V
= 60mA V
F
= 6.0 V I
R
= 0 V, f = 1.0 MHz C
R
Thermal resistance R
F
R
O
thja
1.25 1.65 V
0.01 10 µA
13 pF
750 K/W
Output
Parameter Test condition Part Symbol Min Ty p. Max Unit
Collector-emitter capacitance V
= 5.0 V, f = 1.0 MHz C
CE
Thermal resistance R
Collector-emitter leakage
current
V
= 10 V SFH615A-1
CE
SFH6156-1
SFH615A-2
SFH6156-2
SFH615A-3
SFH6156-3
SFH615A-4
SFH6156-4
Coupler
Parameter Test condition Symbol Min Ty p. Max Unit
Collector-emitter saturation
voltage
Coupling capacitance C
Document Number 83671
Rev. 1.9, 11-May-05
= 10 mA, IC = 2.5 mA V
I
F
CEsat
C
I
CEO
I
CEO
I
CEO
I
CEO
CE
thja
5.2 pF
500 K/W
2.0 50 nA
2.0 50 nA
5.0 100 nA
5.0 100 nA
0.25 0.4 V
0.4 pF
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