Vishay SST308, SST309, SST310, U309, U310 Schematics

...
N-Channel JFETs
PRODUCT SUMMARY
Part Number V
J308 1 to 6.5 25 8 12
J309 1 to 4 25 10
J310 2 to 6.5 25 8
SST308 1 to 6.5 25 8 12
SST309 1 to 4 25
SST310 2 to 6.5 25 8
U309 1 to 4 25
U310 2.5 to 6 25
GS(off)
(V) V
Min (V) g
(BR)GSS
Min (mS) I
fs
10 12
10 12
10 24
J/SST/U308 Series
Vishay Siliconix
J308 SST308 U309 J309 SST309 U310 J310 SST310
Min (mA)
DSS
12
24
24
FEATURES BENEFITS APPLICATIONS
D Excellent High Frequency Gain:
Gps 11.5 dB @ 450 MHz
D Very Low Noise: 2.7 dB @ 450 MHz D Very Low Distortion D High ac/dc Switch Off-Isolation
D Wideband High Gain D Very High System Sensitivity D High Quality of Amplification D High-Speed Switching Capability D High Low-Level Signal Amplification
D High-Frequency Amplifier/Mixer D Oscillator D Sample-and-Hold D Very Low Capacitance Switches
DESCRIPTION
The J/SST/U308 series offers superb amplification characteristics. Of special interest is its high-frequency performance. Even at 450 MHz, this series offers high power gain at low noise.
Low-cost J series TO-226AA (TO-92) packaging supports automated assembly with tape-and-reel options. The SST series TO-236 (SOT-23) package provides surface-mount capabilities
D
S
TO-226AA
(TO-92)
1
2
D
S
TO-236
(SOT-23)
1
2
and is available with tape-and-reel options. The U series hermetically-sealed TO-206AC (TO-52) package supports full military processing. (See Military and Packaging Information for further details.)
For similar dual products packaged in the TO-78, see the U430/431 data sheet.
TO-206AC
(TO-52)
S
3
G
1
G
3
Top View
J308 J309 J310
For applications information see AN104.
Document Number: 70237 S-50149—Rev. H, 24-Jan-05
Top View SST308 (Z8)* SST309 (Z9)* SST310 (Z0)*
*Marking Code for TO-236
23
D
Top View
U309 U310
G and Case
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J/SST/U308 Series
VDS = 10 V, ID = 10 mA
Common-Source
DS
Common Source
C
f = 1 MHz
Common-Gate
Common-Gate
VDS = 10 V
dB
Noise Fi
NF
Vishay Siliconix
ABSOLUTE MAXIMUM RATINGS
Gate-Drain, Gate-Source Voltage −25 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gate Current : (J/SST Prefixes) 10 mA. . . . . . . . . . . . . . . . . . . .
Lead Temperature (
Storage Temperature : (J/SST Prefixes) −55 to 150_C. . . . . . . . . . . . . .
(U Prefix) 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . .
1
/16” from case for 10 sec.) 300_C. . . . . . . . . . . . . . . . . . .
(U Prefix) −65 to 175_C. . . . . . . . . . . . . . . . . . . .
SPECIFICATIONS FOR J/SST308, J/SST309 AND J/SST310 (TA = 25_C UNLESS NOTED)
Parameter Symbol Test Conditions TypaMin Max Min Max Min Max Unit
Static
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage V
Saturation Drain Current
Gate Reverse Current I
Gate Operating Current I
Drain-Source On-Resistance r
Gate-Source Forward Voltage V
b
Dynamic
Common-Source Forward Transconductance
Common-Source Output Conductance
Common-Source Input Capacitance
Common-Source Reverse Transfer Capacitance
Equivalent Input Noise Voltage
High Frequency
Common-Gate Forward Transconductance
Common-Gate Output Conductance
Common-Gate Power Gain
gure
Notes a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing. NZB b. Pulse test: PW v300 ms duty cycle v3%. c. Gain (G
) measured at optimum input noise match.
pg
c
V
(BR)GSS
GS(off)
I
DSS
GSS
DS(on)
GS(F)
g
g
C
e
g
g
G
IG = 1 mA , VDS = 0 V
VDS = 10 V, ID = 1 nA −1
VDS = 10 V, VGS = 0 V
VGS = 15 V, VDS = 0 V −0.002 −1 −1 −1 nA
G
fs
os
iss
rss
n
fg
og
pg
VDG = 9 V, ID = 10 mA
VGS = 0 V, ID = 1 mA 35
IG = 10 mA
V
= 0 V
DS
VDS = 10 V, ID = 10 mA
f = 1 kHz
VDS = 10 V
VGS = 10 V
f = 1 MHz
VDS = 10 V, ID = 10 mA
f = 100 Hz
VDS = 10 V
ID = 10 mA
Operating Junction Temperature 55 to 150_C. . . . . . . . . . . . . . . . . . . . . . . . . .
Power Dissipation : (J/SST Prefixes)
Notes a. Derate 2.8 mW/_C above 25_C b. Derate 4 mW/_C above 25_C
(U Prefix)
b
Limits
J/SST308 J/SST309 J/SST310
35 25 25 25 V
6.5
1
TA = 125_C
f = 105 MHz 14
f = 450 MHz 13
f = 105 MHz 0.16
f = 450 MHz 0.55
f = 105 MHz 16
f = 450 MHz 11.5
f = 105 MHz 1.5
f = 450 MHz 2.7
0.001 1 1 1
15 pA
J 0.7 1 1 1 V
14
110
J 4 5 5 5
SST 4
J 1.9
SST 1.9
6
12 60
8 10 8
12
250 250 250
2.5 2.5 2.5
a
4 2 6.5 V
30
24
350 mW. . . . . . . . . . . . . . . . .
500 mW. . . . . . . . . . . . . . . . . . . . . . .
60 mA
mA
W
mS
mS
pF
nV
Hz
mS
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Document Number: 70237
S-50149—Rev. H, 24-Jan-05
SPECIFICATIONS FOR U309 AND U310 (TA = 25_C UNLESS NOTED)
VDS = 10 V, ID = 10 mA
VDS = 10 V, VGS = 10 V
Common-Gate
Common-Gate
VDS = 10 V
d
dB
Noise Fi
d
NF
Parameter Symbol Test Conditions TypaMin Max Min Max Unit
Static
J/SST/U308 Series
Vishay Siliconix
Limits
U309 U310
Gate-Source Breakdown Voltage V
Gate-Source Cutoff Voltage V
Saturation Drain Current
Gate Reverse Current I
Gate Operating Current I
Drain-Source On-Resistance r
Gate-Source Forward Voltage V
b
(BR)GSS
GS(off)
I
DSS
GSS
G
DS(on)
GS(F)
IG = 1 mA , VDS = 0 V
VDS = 10 V, ID = 1 nA −1
VDS = 10 V, VGS = 0 V 12 30 24
VGS = 15 V, VDS = 0 V −0.002
TA = 125_C
VDG = 9 V, ID = 10 mA
VGS = 0 V, ID = 1 mA 35
IG = 10 mA , VDS = 0 V 0.7
35 25 25 V
4 2.5 6 V
60 mA
0.15 0.15
0.001
15 pA
0.15 0.15
1 1
nA
mA
W
V
Dynamic
Common-Source Forward Transconductance
Common-Source Output Conductance
Common-Source Input Capacitance
Common-Source Reverse Transfer Capacitance
Equivalent Input Noise Voltage e
g
fs
g
os
C
iss
C
rss
n
VDS = 10 V, ID = 10 mA
f = 1 kHz
VDS = 10 V, VGS = 10 V
f = 1 MHz
VDS = 10 V, ID = 10 mA
f = 100 Hz
14
110
4 5 5
1.9
6
10 10
250 250
2.5 2.5
mS
mS
pF
nV
Hz
High Frequency
Common-Gate Forward Transconductance
Common-Gate Output Conductance
Common-Gate Power Gain
d
gure
Notes a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing. NZB b. Pulse test: PW v300 ms duty cycle v3%. c. Gain (G d. Not a production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only , and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability .
) measured at optimum input noise match.
pg
c,
g
fg
g
og
G
pg
V
= 10 V
ID = 10 mA
f = 105 MHz 14
f = 450 MHz 13
f = 105 MHz 0.16
f = 450 MHz 0.55
f = 105 MHz 16
f = 450 MHz 11.5
f = 105 MHz 1.5
f = 450 MHz 2.7
mS
14 14
10 10
2 2
3.5 3.5
Document Number: 70237 S-50149—Rev. H, 24-Jan-05
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