VIS VG26V17400FJ-5, VG26V17400FJ-6, VG26S17400FJ-6, VG26S17400FJ-5 Datasheet

VG26(V)(S)17400FJ
10
±
4,194,304 x 4 - Bit
VIS
Description
The device is CMOS Dynamic RAM organized as 4,194,304 words x 4 bits. It is fabricated with an advanced submicron CMOS technology and designed to operate from a single 5V only or 3.3V only power supply. Low voltage operation is more suitable to be used on battery backup, portable electronic application. A new refresh feature called “ self-refresh “ is supported and very slow CBR cycles are being performed. It is packaged in JEDEC standard 26/24 - pin plastic SOJ or TSOP (II).
Features
• Single 5V (%) or 3.3V (+10%,-5%) only power supply
• High speed t
• Low power dissipation
- Active mode : 5V version 605/550 mW (Max.)
3.3V version 396/360 mW (Max.)
- Standby mode : 5V version 1.375 mW (Max.)
3.3V version 0.54 mW (Max.)
• Fast Page Mode access
• I/O level : TTL compatible (Vcc = 5V) LVTTL compatible (Vcc = 3.3V)
• 2048 refresh cycles in 32 ms (Std) or 128ms (S - version)
• 4 refresh mode :
- RAS only refresh
- CAS-before-RAS refresh
- Hidden refresh
- Self - refresh (S - version)
access time : 50/60 ns
RAC
CMOS Dynamic RAM
Document : Rev. Page 1
VG26(V)(S)17400FJ
VIS
Pin configuration
26/24 - PIN 300mil Plastic SOJ
4,194,304 x 4 - Bit
CMOS Dynamic RAM
V DQ1 DQ2
WE
RAS
NC
A
V
CC
A A A A
CC
1
2
3
4
5 6
10
8
9
0
10
1
11
2
12
3
13
VG26(V) (S)17400EJ
26
25
23
22 21
19
18
16
15 14
V
SS
DQ4 DQ3
24
CAS OE
A
9
A
8
A
7
A
17
6
A
5
A
4
V
SS
Pin Description
Pin Name Function A0 - A10 Address inputs
- Row address A0 - A10
- Column address A0 - A10
- Refresh address A0 - A10 DQ1 ~ DQ4 Data - in/data - out RAS Row address strobe CAS Column address strobe WE Write enable OE Output enable V
cc
V
ss
Power (+ 5V or + 3.3V) Ground
Document : Rev. Page 2
VIS
DQ1
DQ4
Block Diagram
VG26(V)(S)17400FJ
4,194,304 x 4 - Bit
CMOS Dynamic RAM
WE
A0 A1 A2
A3 A4 A5
A6 A7 A8
A9
A10
CAS
NO. 2 CLOCK
GENERATOR
COLUMN-
ADDRESS
BUFFERS (11)
REFRESH
CONTROLLER
REFRESH COUNTER
ROW
ADDRESS
BUFFERS (11)
CONTROL
LOGIC
DATA - IN BUFFER
DATA - OUT
BUFFER
COLUMN
DECODER
2048
SENSE AMPLIFIERS
I/O GATING 2048 x 4
2048 x 2048 x 4
MEMORY
ROW
DECODER
2048
ARRAY
RAS
NO. 1 CLOCK
GENERATOR
Vcc
Vss
Document : Rev. Page 3
VG26(V)(S)17400FJ
HX
HL
LH
HL
HL
HL
HL
HL
HL
LH
HL
HL
LH
LHL→→
LHL→→
HL
4,194,304 x 4 - Bit
VIS
Truth Table
ADDRESSES
FUNCTION RAS CAS WE OE
STANDBY H X X X X High - Z READ L L H L ROW COL Data - Out
WRITE : (EARLY WRITE)
READ WRITE L L ROW COL Data - Out, Data - In
L L L X ROW COL Data - In
ROW COL
CMOS Dynamic RAM
DQ
S
Notes
PAGE - MODE READ
PAGE - MODE WRITE
PAGE - MODE READ - WRITE
HIDDEN REFRESH
RAS - ONLY REFRESH L H X X ROW n/a High - Z CBR REFRESH L H X X X High - Z Notes : 1. EARLY WRITE only.
1st Cycle L H L ROW COL Data - Out
2st
Cycle
1st Cycle L L X ROW COL Data - In
2st
Cycle
1st Cycle L ROW COL Data - Out, Data - In
2st
Cycle
READ L H L ROW COL Data - Out WRITE L L X ROW COL Data - In 1
L H L n/a COL Data - Out
L L X n/a COL Data - In
L n/a COL Data - Out, Data - In
Document : Rev. Page 4
VG26(V)(S)17400FJ
±
VIS
Absolute Maximum Rating
Parameter Symbol Value Unit
Voltage on any pin relative to Vss 5V
3.3V
Supply voltage relative to Vss 5V
3.3V
Short circuit output current I Power dissipation P Operating temperature T Storage temperature T
Recommended DC Operating Conditions
Parameter/Condition Symbol 5 Volt Version 3.3 Volt Version Unit
Min Typ Max Min Typ Max
Supply Voltage V Input High Voltage, all inputs V Input Low Voltage, all inputs V
cc IH
IL
4.5 5.0 5.5 3.15 3.3 3.6 V
2.4 - V
-1.0 - 0.8 -0.3 - 0.8 V
4,194,304 x 4 - Bit
CMOS Dynamic RAM
V
T
V
cc
OUT
D OPT STG
+ 1.0 2.0 - V
CC
-1.0 to + 7.0
-0.5 to + 4.6
-1.0 to + 7.0
-0.5 to + 4.6 50 mA
1.0 W
0 to + 70 °C
-55 to + 125 °C
+ 0.3 V
CC
V
V
Capacitance
Ta = 25°C, V
Input capacitance (Address) C Input capacitance
(RAS, CAS, OE, WE) Output capacitance
(Data - in, Data - out) Note : 1. Capacitance measured with effective capacitance measuring method.
2. CAS = VIH to disable Dout.
= % or 3.3V(+10%,-5%), f = 1MHz
CC
Parameter Symbol Typ Max Unit Note
l1
C
l2
C
I/O
- 5 pF 1
- 7 pF 1
- 7 pF 1,2
Document : Rev. Page 5
VG26(V)(S)17400FJ
±
CC
CC
t
RASS
100µS≥µA
0.2V
0VVIL0.2V
≤≤
0.2VV
IHVIH
≤≤
t
RAS
300ns
µA
VIS
DC Characteristics; 5 - Volt verion
(Ta= 0 to 70°C, VCC = + 5V10%, V
Parameter Symbol Test Conditions
Operating current I
CC1
= 0V)
ss
RAS cycling CAS cycling tRC = min.
4,194,304 x 4 - Bit
CMOS Dynamic RAM
VG26 (V) (S) 17400E
-5 -6
Min Max Min Max
- 145 - 135 mA 1, 2
Unit Notes
Low power S - version
Standby Current
RAS - only refresh current
Fast page mode current
CAS - before - RAS refresh current
Self - refresh currant (S - Version)
CAS - before - RAS long refresh current (S - Version)
Standard power version
TTL interface RAS, CAS = V
Dout = high - Z CMOS interface
RASCAS,V
Dout = high - Z
I
CC2
TTL interface RAS, CAS = V
Dout = high - Z CMOS interface
RASCAS,V
Dout = high - Z
I
I
I
I
I
RAS cycling, CAS = V
CC3
t
CC4
t
CC5tRC
RAS, CAS cycling
CC8
CC9
Standby : VCC ­CAS before RAS refresh :
2048 cycles/128ms RAS, RAS :
VCC - (Max) Dout = high - Z,
RC
PC
= min.
= min.
= min.
- 2 - 2
IH
- 0.25 - 0.25
- 0.2V
- 2 - 2
IH
- 1 - 1
- 0.2V
IH
RAS
- 145 - 135
- 100 - 90
- 145 - 135
- 350 - 350
- 500 - 500
mA
mA
mA
mA
1, 2
mA
1,3
mA
1, 2
mA
Document : Rev. Page 6
VG26(V)(S)17400FJ
±
0VVinV
≤≤
µA
0VVoutV
≤≤
µA
VIS
DC Characteristics ; 5 - Volt Version (cont.)
(Ta = 0 to 70°C, V
Parameter Symbol Test Conditions
lnput leakage current
Output leakage current
Output high voltage
Output low voltage
Notes :
1. lCC is specified as an average current. It depends on output loading condition and cycle rate when the device is selected. lCC max is specified at the output open condition.
2. Address can be changed once or less while RAS = VIL.
3. For l
= + 5V10%, V
CC
I
I
V
V
, address can be changed once or less within one Fast page mode cycle time.
CC4
= 0V)
ss
LI
LO
Dout = Disable
OH lOH
OL lOL
4,194,304 x 4 - Bit
CMOS Dynamic RAM
VG26 (V) (S) 17400E
-5 -6
Min Max Min Max
+ 0.5V
CC
+ 0.5V
CC
= -5mA 2.4 - 2.4 - V
= + 4.2mA - 0.4 - 0.4 V
-5 5 -5 5
-5 5 -5 5
Unit Notes
Document : Rev. Page 7
VG26(V)(S)17400FJ
CC
CC
t
100µS≥µA
0.2V
0VV
0.2V
≤≤
0.2VV
IHVIH
≤≤
t
300ns
µA
VIS
DC Characteristics ; 3.3 - Volt Verion
(Ta = 0 to 70°C, V
Parameter Symbol Test Conditions
Operating current I
= + 3.3V(+10%,-5%), V
CC
CC1
RAS cycling CAS cycling tRC = min.
ss
= 0V)
4,194,304 x 4 - Bit
CMOS Dynamic RAM
VG26 (V) (S) 17400E
-5 -6
Min Max Min Max
- 145 - 135 mA 1, 2
Unit Notes
Low power S - version
Standby Current
RAS - only refresh current
Fast page mode current
CAS - before - RAS refresh current
Self - refresh currant (S - Version)
CAS - before - RAS long refresh current (S - Version)
Standard power version
LVTTL interface RAS, CAS = V
Dout = high - Z
CMOS interface
RASCAS,V
Dout = high - Z
I
I
I
I
I
I
LVTTL interface
CC2
RAS, CAS = V Dout = high - Z
CMOS interface
RASCAS,V
Dout = high - Z
CC3
CC4
CC5 tRC
CC8
CC9
RAS cycling, CAS = V t
t
RAS, CAS cycling
Standby : VCC ­ CAS before RAS refresh :
2048 cycles/128ms RAS, RAS : VCC - (Max)
Dout = high - Z,
= min.
RC
= min.
PC
= min.
RASS
IH
IH
- 0.2V
- 0.2V
IL
RAS
IH
RAS
- 0.5 - 0.5
- 0.15 - 0.15
- 2 - 2
- 0.5 - 0.5
- 145 - 135
- 100 - 90
- 145 - 135
- 250 - 250
- 300 - 300
mA
mA
mA
mA
1, 2
mA
1,3
mA
1, 2
mA
Document : Rev. Page 8
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