32-pin 450 mil SOP
32-pin 8mmx20mm TSOP-1
32-pin 8mmx13.4mm STSOP
FUNCTIONAL BLOCK DIAGRAM
A16
A15
A13
A14
A12
7
A6
A5
A4
A8
I/O1
.
.
.
I/O8
CE2
WE
OE
1CE
.
.
.
DECODER
CONTROL
CONTROL
ROW
I/O
LOGI C
.
MEMORY ARRAY
.
1024 ROWS × 1024 COLUMNS
.
.
.
.
.
COLUMN I/ O
COLUMN DECODER
10
11
. .
9
3
VCC
VSS
2 A1 A0
PIN DESCRIPTION
SYMBOL DESCRIPTION
A0 - A16 Address Inputs
I/O1 - I/O8 Data Inputs/Outputs
Chip enable 1,2 Inputs
Write Enable Input
Output Enable Input
WE
OE
,CE2
1CE
VCC Power Supply
VSS Ground
NC No Connection
UT621024
GENERAL DESCRIPTION
The UT621024 is a 1,048,576-bit low power
CMOS static random access memory
organized as 131,072 words by 8 bits. It is
fabricated using high performance, high
reliability CMOS technology.
The UT621024 is designed for low power
application. It is particularly well suited for
battery back-up nonvolatile memory
application.
The UT621024 operates from a single 5V
power supply and all inputs and outputs are
fully TTL compatible.
UTRON TECHNOLOGY INC. P80036
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
1
t
Rev. 1.5
UTRON
128K X 8 BIT LOW POWER CMOS SRAM
UT621024
ABSOLUTE MAXIMUM RATINGS
PARAMETER SYMBOL RATING UNIT
Terminal Voltage with Respect to Vss V
Operating Temperature TA 0 to +70
Storage Temperature T
Power Dissipation PD 1 W
DC Output Current I
Soldering Temperature (under 10 sec) T
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only and functional operation of the device or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to the absolute maximum rating conditions for extended
period may affect device reliability.
TRUTH TABLE
MODE
1CE
CE2
Standby H X X X High - Z
Standby X L X X High -Z
Output Disable L H H H High - Z
Read L H L H
Write L H X L
Note: H = VIH, L=VIL, X = Don't care.
DC ELECTRICAL CHARACTERISTICS
PARAMETER SYMBOL TEST CONDITION
Input High Voltage
Input Low Voltage
Input Leakage Current
Output Leakage Curren
Output High Voltage
Output Low Voltage
Average Operating
I
V
I
V
V
V
I
CC
IL
OL
OH
OL
IH
IL
Power Supply Courrent
I
CC1
Standby Power
Supply Current
*Those parameters are for reference only under 50℃
I
SB
I
SB1
*
-0.5 to +7.0 V
TERM
℃
OE
-65 to +150
STG
50 mA
OUT
260
solder
I/O OPERATION SUPPLY CURRENT
WE
D
OUT
D
IN
,
I
I
SB
SB1
,
I
I
SB
SB1
I
CC
I
CC
I
CC
℃
℃
(VCC = 5V±10%, TA = 0℃ to 70℃)
MIN. TYP. MAX.
VSS ≦VIN ≦VCC
≦
VSS ≦V
=V
1CE
= V
OE
V
I/O
CC
or CE2 = VIL or
IH
or
WE
IH
= V
2.2 - V
- 0.5 - 0.8 V
- 1 - 1
- 1 - 1
IL
CC
IOH = - 1mA 2.4 - - V
IOL= 4mA - - 0.4 V
Cycle time=min, 100% duty,
UTRON TECHNOLOGY INC. P80036
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
2
Rev. 1.5
UTRON
128K X 8 BIT LOW POWER CMOS SRAM
UT621024
CAPACITANCE
PARAMETER SYMBOL MIN. MAX. UNIT
Input Capacitance
Input/Output Capacitance
Note : These parameters are guaranteed by device characterization, but not production tested.
(TA=25℃, f=1.0MHz)
C
C
IN
I/O
-
-
8 pF
10 pF
AC TEST CONDITIONS
Input Pulse Levels 0V to 3.0V
Input Rise and Fall Times 5ns
Input and Output Timing Reference Levels 1.5V
Output Load CL=100pF, IOH/IOL=-1mA/4mA
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER
Read Cycle Time tRC 35 - 55 - 70 - ns
Address Access Time tAA - 35 - 55 - 70 ns
Chip Enable Access Time t
Output Enable Access Time tOE - 25 - 30 - 35 ns
Chip Enable to Output in Low-Z t
Output Enable to Output in Low-Z t
Chip Disable to Output in High-Z t
Output Disable to Output in High-Z t
Output Hold from Address Change tOH 5 - 5 - 5 - ns
(2) WRITE CYCLE
PARAMETER SYMBOL UT621024-
Write Cycle Time tWC 35 - 55 - 70 - ns
Address Valid to End of Write tAW 30 - 50 - 60 - ns
Chip Enable to End of Write t
Address Set-up Time tAS 0 - 0 - 0 - ns
Write Pulse Width tWP 25 - 40 - 45 - ns
Write Recovery Time tWR 0 - 0 - 0 - ns
Data to Write Time Overlap tDW 20 - 25 - 30 - ns
Data Hold from End of Write-Time tDH 0 - 0 - 0 - ns
Output Active from End of Write tOW* 5 - 5 - 5 - ns
Write to Output in High-Z t
*These parameters are guaranteed by device characterization, but not production tested.