The TRF7610 is a silicon MOSFET power amplifier IC for 900-MHz applications, tailored specifically for global
systems for mobile communications (GSM). It uses Texas Instruments RFMOS process and consists of a
three-stage amplifier with output power control. Few external components are required for operation.
The TRF7610 amplifies the RF signal from a preceding modulator and the upconverter stages in an RF section
of a transmitter to a level that is sufficient for connection to the antenna. The RF input port, RFIN, and the RF
output port, RFOUT, require simple external matching networks.
A control signal applied to the VPC input can ramp the RF output power up or down to meet ramp and spurious
emission specifications for time-division multiple-access (TDMA) systems. The power control signal causes a
change in output power as the voltage applied to VPC varies between 0 V and 3 V. With the RF input power
applied to RFIN at 5 dBm, adjusting VPC from 0 V to 3 V increases the output power from a typical value of
–43 dBm at VPC = 0 V to a typical value of 35 dBm at VPC = 3 V. Forward isolation with the RF input power
applied to RFIN at 5 dBm, VPC = 0 V, is typically 48 dB.
The TRF7610 is available in a thermally enhanced, surface-mount, 24-pin PowerPAD (PWP) thin-shrink
small-outline package (TSSOP). It is characterized for operation from –40°C to 85°C operating free-air
temperature. In order to maintain acceptable thermal operating conditions, the device should be operated in
pulse applications such as the GSM standard 1/8 duty cycle. The package has a solderable pad that improves
the package thermal performance by bonding the pad to an external thermal plane. The pad also acts as a
low-inductance electrical path to ground and must be electrically connected to the printed circuit-board (PCB)
ground plane as a continuation of the regular package terminals that are designated GND.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
RFMOS and PowerPAD are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
TRF7610
I/O
DESCRIPTION
SILICON MOSFET POWER AMPLIFIER IC FOR GSM
SLWS059B – MAY 1997 – REVISED AUGUST 1998
schematic
RFIN
VPC
13, 24
6, 7
3 or 10
4 or 9
VG1
1, 12
VG2
15 – 22
2 or 11
RFOUT/VD3
VG3
VD1/VD2
Terminal Functions
TERMINAL
NAMENO.
GND14, 23Analog ground for all internal circuits. All signals are referenced to the ground terminals.
NC5, 8No internal connection. It is recommended that all NC terminals be connected to ground.
RFIN6, 7IRF input. RFIN accepts signals between 800 MHz and 1000 MHz.
RFOUT/VD315, 16, 17,
18, 19, 20,
21, 22
VG14, 9IFirst-stage gate bias set by resistor. Either terminal may be used or both may be connected externally.
VG21, 12ISecond-stage gate bias set by resistor. These terminals must be connected externally.
VG32, 11IThird-stage gate bias set by resistor. Either terminal may be used or both may be connected externally.
VPC3, 10IVoltage power control. VPC is a signal between 0 V and 3 V that adjusts the output power from a typical
VD1/VD213, 24IFirst- and second-stage drain bias. These terminals must be connected externally.
I/ORF output and third-stage drain bias. RFOUT requires an external matching network.
value of –43 dBm to 35 dBm. Either terminal may be used, or both may be connected externally.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Thermal resistance, junction to case, R
Junction temperature, T
Operating free-air temperature range, T
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Supply voltage VDD (see Note 1 and Note 3)3.54.86V
Operating free-air temperature, T
Operating frequency range (see Note 4)8001000MHz
NOTES: 1. Voltage values are with respect to GND.
3 .Performance varies with drain voltage, see Figure 8.
4. External matching network dependent.
A
electrical characteristics over full range of recommended operating conditions
supply current, VDD = 4.8 V
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
pp
Su
DD
†
Typical values are at TA = 25°C
Operating at maximum output powerVPC = 3 V2A
Operating with no RF input powerVPC = 0 V<10µA
–4085°C
GSM operation, VDD = 4.8 V, VPC = 3 V, PI = 5 dBm, T
PARAMETER
Operating frequency range870925MHz
p
p
Input return loss (externally matched, small signal)PI = –20 dBm10dB
2f
0
3f
0
p
Ruggedness test
‡
Specific applications circuit
§
No degradation in output power after test.
20 MHz above f
10 MHz above f
0
0
= 25°C (unless otherwise noted)
A
TEST CONDITIONSMINTYPMAXUNIT
VPC = 3 V343536
VPC = 0 V–43
PI = 8 dBm45%
With external matching–28
With external matching–40
Frequency = 900 MHz,
Load VSWR = 20:1,
All phase angles
‡
40%
–88
–88
§
stability, GSM operation
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
No parasitic
oscillations (all
spurious < –70 dBc)
Stability
¶
VSWR = voltage standing wave ratio
Output VSWR¶ < 6:1 all phases, VDD < 6 V, PI = 5 dBm,
PO ≤ 35 dBm, Output frequency band: 200 MHz – 1200 MHz
switching characteristics
GSM operation
t
Switching time, RF output OFF to ONVPC stepped from 0 V to 3 V2µs
on
t
Switching time, RF output ON to OFFVPC stepped from 3 V to 0 V2µs
off
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
TRF7610
SILICON MOSFET POWER AMPLIFIER IC FOR GSM
SLWS059B – MAY 1997 – REVISED AUGUST 1998
APPLICATION INFORMATION
In all cases, a capacitor must be connected from the positive power supply to ground as close to the terminals as
possible for power-supply bypassing. The dc-blocking capacitors are required on the RF input and RF output. A list
of components and their functions is shown in Table 1.
The TRF7610 is a three-stage integrated power amplifier for use in cellular phone handsets. The device and
applications board are optimized to operate under 900-MHz, 4.8-V GSM conditions. External matching
networks provide design flexibility in centering the frequency response from 800 to 1000 MHz. Typical
performance at 900 MHz, driven by a 5-dBm GSM signal, is 30 dB of power gain, 35 dBm output power, and
40 percent PAE.
Discrete component selection was made to optimize output power, gain, pulse flatness in the GSM pulse
window, and PAE. Where possible, size and cost goals were considered: the smallest, least expensive
components available were included in the applications board design. Some of the components, however, were
chosen for their ability to increase performance. The following sections explain the design options and
compromises to consider when substituting parts of differents types and values.
output matching network
The output matching network provides the majority of the design flexibility . First, the shunt capacitors, C5, C6,
and C8 are American T echnical Ceramics high-Q capacitors, which increase performance. The A TC capacitors
achieve a 0.4-dB increase in output power and a 3-percent increase in PAE compared to the performance
achieved using 0402-sized capacitors. However, if size and cost are more important, 0402-sized capacitors can
be used, while sacrificing the performance gains achieved using the high-Q capacitors.
Second, the dc bias network on the amplifier output stage, designed using a Coilcraft 18.5 nH high-current
inductor (L2), minimizes the board layout area. An alternative to this high-current inductor is a quarter-wave stub
with a bias decoupling capacitor to ground (C10, C3). On the FR4 board with ∈
900 MHz is 40 mm in length. One advantage that the quarter-wave stub offers over the inductor is improved
second harmonic suppression. The inductor offers a much smaller footprint; however, it does sacrifice 10 dB
= 4.3, a quarter-wave stub at
r
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
TRF7610
SILICON MOSFET POWER AMPLIFIER IC FOR GSM
SLWS059B – MAY 1997 – REVISED AUGUST 1998
of second harmonic suppression. The PAE is only slightly affected: it is reduced by approximately 1 percent
compared to the quarter-wave stub. The system designer must decide if size or performance is of greatest
concern.
The 330 µF bias decoupling capacitors, C3 and C11, provide pulse flatness in the GSM application. These
surface mount capacitors provide a gain slope of –0.4 dB over the duration of the GSM duty cycle. If that is not
acceptable, the performance can be improved by adding a larger value capacitor in parallel with the two existing
capacitors. Measured results, using a standard 4700 µF electrolytic taken from a cellular phone, is –0.1 dB of
gain slope for the duration of the GSM duty cycle. Capacitor size considerations must be decided by the system
designer.
dc bias network
The dc bias network consists of resistors R1, R2, R3, and R5, which set the gate bias voltage of the device. R1,
R2, and R3 are used as voltage divider resistors which set the gate voltages at approximately 1.7 V. Resistor
R5 is a 51 Ω termination resistor that is needed only for a 50 Ω pulse generator. When a high-impedance pulse
generator is used, the 51 Ω resistor can be omitted as it is not necessary for device function.
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. The package thermal performance may be enhanced by bonding the thermal pad to an external thermal plane. This solderable pad
is electrically and thermally connected to the backside of the die.
14
5,10
16
5,10
4,904,90
20
6,60
6,40
24
7,90
28
9,80
9,607,70
4073225/E 03/97
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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