SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
• Low r
DS(on)
• High Voltage Output...60 V
•Extended ESD Capability...4000 V
• Pulsed Current...11.25 A Per Channel
• Fast Commutation Speed
description
The TPIC5403 is a monolithic gate-protected
power DMOS array that consists of four
independent electrically isolated N-channel
enhancement-mode DMOS transistors. Each
transistor features integrated high-current zener
diodes (Z
in the event that an overstress condition occurs.
These zener diodes also provide up to 4000 V of
ESD protection when tested using the
human-body model of a 100-pF capacitor in series
with a 1.5-kΩ resistor.
The TPIC5403 is offered in a 24-pin wide-body surface-mount (DW) package and is characterized for operation
over the case temperature range of –40°C to 125°C.
schematic
GATE1
GATE2
1, 2
3
5, 6
11, 12
10
7, 8
Z
Z
C1b
C1a
Q2
Z
Z
C2b
C2a
Q1
D1
D3
Z1
D2D4
Z2Z4
4, 9, 16, 21
GND
Z3
DRAIN1
SOURCE1
DRAIN2
SOURCE2
NOTE A: For correct operation, no terminal may be taken below GND.
Q3
Z
Z
Z
C3b
Z
C3a
C4b
C4a
Q4
23, 24
22
19, 20
13, 14
15
17, 18
DRAIN3
GATE3
SOURCE3
DRAIN4
GATE4
SOURCE4
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
TPIC5403
4-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Gate-to-source voltage range, V
Continuous drain current, each output, T
Continuous source-to-drain diode current, T
Pulsed drain current, each output, I
Continuous gate-to-source zener diode current, T
Pulsed gate-to-source zener diode current, T
Single-pulse avalanche energy, E
Continuous total power dissipation, T
Operating virtual junction temperature range, T
Operating case temperature range, T
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: Pulse duration = 10 ms, duty cycle = 2%
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
4-CHANNEL INDEPENDENT GATE-PROTECTED
I
Zero-gate-voltage drain current
DS
,
A
I
Leakage current, drain-to-GND
V
V
A
r
Static drain-to-source on-state resistance
D
,
Ω
F
trrReverse-recovery time
ns
V
See
di/dt
100 A/
QRRTotal diode charge
See Figures 1 and 14
C
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
Junction-to-ambient thermal resistanceSee Notes 4 and 790°C/W
Junction-to-board thermal resistanceSee Notes 5 and 749°C/W
Junction-to-pin thermal resistanceSee Notes 6 and 728°C/W
5. Package mounted on a 24 inch2, 4-layer FR4 printed-circuit board
6. Package mounted in intimate contact with infinite heatsink
7. All outputs with equal power
V
= 25 V,R
tf1 = 10 ns,
VDS = 48 V,
= 20 Ω,t
See Figure 2
ID = 1.125 A,VGS = 10 V,
= 10 ns,
2750
1430
6.68
0.60.7
2.83.2
nC
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
4-CHANNEL INDEPENDENT GATE-PROTECTED
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
PARAMETER MEASUREMENT INFORMATION
1.5
TPIC5403
POWER DMOS ARRAY
0.75
0
– 0.75
– 1.5
– 2.25
– 3
– Source-to-Drain Diode Current – AI
S
– 3.75
– 4.25
†
IRM = maximum recovery current
‡
The above waveform is representative of D1, D2, D3, and D4 in shape only.
Shaded Area = QRR
†
I
RM
t
rr(SD)
050100150200 250 300
Reverse di/dt = 100 A/µs
Time – ns
25% of I
VDS = 48 V
VGS = 0
TJ = 25°C
Z1 – Z4
350 400 450 500
†
RM
‡
Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode
VDD = 25 V
Pulse Generator
R
gen
NOTE A: CL includes probe and jig capacitance.
50 Ω
V
GS
50 Ω
TEST CIRCUIT
Figure 2. Resistive-Switching Test Circuit and Voltage Waveforms
t
r1
R
L
V
DS
DUT
CL 30 pF
(see Note A)
V
GS
t
d(on)
V
DS
t
f2
VOLTAGE WAVEFORMS
t
f1
10 V
0 V
t
d(off)
t
r2
V
V
DD
DS(on)
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
TPIC5403
4-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
PARAMETER MEASUREMENT INFORMATION
Current
Regulator
12-V
Battery
0
0.2 µF
50 kΩ
IG = 100 µA
V
0.3 µF
DS
Same Type
as DUT
V
DD
DUT
10 V
V
GS
Q
gs(th)
Q
g
Q
gd
Gate Voltage
Time
VOLTAGE WAVEFORM
IG Current-
Sampling Resistor
TEST CIRCUIT
ID Current-
Sampling Resistor
Figure 3. Gate-Charge Test Circuit and Voltage Waveform
VDD = 25 V
t
159 µH
V
V
Pulse Generator
(see Note A)
50 Ω
R
gen
TEST CIRCUIT
NOTES: A. The pulse generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, ZO = 50 Ω.
B. Input pulse duration (tw) is increased until peak current IAS = 11.25 A.
Energy test level is defined as EAS+
V
GS
50 Ω
I
D
DS
DUT
IAS
GS
I
D
V
DS
V
(BR)DSX
2
w
VOLTAGE AND CURRENT WAVEFORMS
t
av
+
17.2 mJ.
t
av
15 V
0 V
I
AS
(see Note B)
0 V
V
(BR)DSX
0 V
= 60 V Min
Figure 4. Single-Pulse Avalanche-Energy Test Circuit and Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
4-CHANNEL INDEPENDENT GATE-PROTECTED
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
TYPICAL CHARACTERISTICS
TPIC5403
POWER DMOS ARRAY
GATE-TO-SOURCE THRESHOLD VOLTAGE
vs
JUNCTION TEMPERATURE
2.5
VDS = V
2
1.5
1
0.5
– Gate-to-Source Threshold Voltage – V
GS(th)
V
0
–40 –20 020 40 6080 100 120 140 160
GS
ID = 1 mA
ID = 100 µA
TJ – Junction Temperature – °C
Figure 5Figure 6
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
JUNCTION TEMPERATURE
0.6
ID = 2.25 A
Ω
0.4
VGS = 10 V
– Static Drain-to-Source
0.2
On-State Resistance –
DS(on)
r
0
–40 –20 020 40 6080 100 120 140 160
TJ – Junction Temperature – °C
VGS = 15 V
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
DRAIN CURRENT
0.5
TJ = 25°C
0.4
Ω
0.3
VGS = 10 V
0.2
– Static Drain-to-Source
On-State Resistance –
DS(on)
r
0.1
0.1110100
VGS = 15 V
ID – Drain Current – A
Figure 7Figure 8
DRAIN CURRENT
DRAIN-TO-SOURCE VOLTAGE
10
VGS = 15 VVGS = 10 V
9
8
7
6
5
4
– Drain Current – A
D
3
I
2
1
0
0123456
VDS – Drain-to-Source Voltage – V
vs
∆VGS = 0.4 V
TJ = 25°C
(unless otherwise
noted)
VGS = 4 V
VGS = 6 V
PRODUCT PREVIEW
78910
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
TPIC5403
4-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
TYPICAL CHARACTERISTICS
DISTRIBUTION OF
FORWARD TRANSCONDUCTANCE
50
Total Number of Units = 688
VDS = 15 V
45
ID = 1.125 A
40
TJ = 25°C
35
10
9
8
7
DRAIN CURRENT
vs
GATE-TO-SOURCE VOLTAGE
TJ = 40°C
TJ = 25°C
TJ = 75°C
TJ = 125°C
TJ = 150°C
30
25
20
15
Percentage of Units – %
10
5
0
1.97522.025
gfs – Forward Transconductance – S
DRAIN-TO-SOURCE VOLTAGE
400
VGS = 0
f = 1MHz
360
TJ = 25°C
C
320
280
240
200
@ 0 V = 301 pF
iss
C
@ 0 V = 384 pF
oss
C
@ 10 V = 144 pF
rss
C
iss
6
5
4
– Drain Current – A
D
3
I
2
1
0
0123456
VGS – Gate-to-Source Voltage – V
2.050
2.075
2.1
2.125
2.150
2.175
2.2
2.225
Figure 9Figure 10
CAPACITANCE
vs
SOURCE-TO-DRAIN DIODE CURRENT
vs
SOURCE-TO-DRAIN VOLTAGE
10
VGS = 0
TJ = 125°C
1
78910
TJ = 40°C
TJ = 25°C
160
120
C – Capacitance – pF
80
40
0
0 4 8 12162024
8
C
oss
C
rss
28 32 36 40
VDS – Drain-to-Source Voltage – V
– Source-to-Drain Diode Current – A
SD
I
TJ = 150°C
0.1
0.11
VSD – Source-to-Drain Voltage – V
Figure 11Figure 12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TJ = 75°C
10
60
ID = 1.125 A
TJ = 25°C
See Figure 3
50
TPIC5403
4-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
TYPICAL CHARACTERISTICS
DRAIN-TO-SOURCE VOLTAGE AND
GATE-TO-SOURCE VOLTAGE
vs
GATE CHARGE
12
10
VDD = 20 V
40
30
20
– Drain-to-Source Voltage – V
DS
V
10
0
012
175
150
125
100
VDD = 30 V
VDD = 48 V
VDD = 20 V
346
Qg – Gate Charge – nC
Figure 13
REVERSE-RECOVERY TIME
vs
REVERSE di/dt
VDS = 48 V
VGS = 0
IS = 1.125 A
TJ = 25°C
See Figure 1
D1, D2, D3, and D4
8
6
4
2
0
75
– Gate-to-Source Voltage – V
GS
V
75
50
– Reverse-Recovery Time – ns
rr
t
25
Z1, Z2, Z3, and Z4
0
0100200300
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
400500600
Reverse di/dt – A/µs
Figure 14
9
TPIC5403
4-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
THERMAL INFORMATION
MAXIMUM DRAIN CURRENT
vs
DRAIN-TO-SOURCE VOLTAGE
100
TC = 25°C
10
10 ms
1
– Maximum Drain Current – A
D
I
R
θJA
§
†
1 ms
1 µs
†
500 µs
†
†
‡
R
θJP
DC Conditions
0.1
0.1110100
VDS – Drain-to-Source Voltage – V
†
Less than 2% duty cycle
‡
Device mounted in intimate contact with infinite heatsink.
§
Device mounted on FR4 printed circuit board with no heatsink.
Figure 15
MAXIMUM PEAK AVALANCHE CURRENT
vs
TIME DURATION OF AVALANCHE
100
See Figure 4
10
TC = 25°C
TC = 125°C
10
– Maximum Peak Avalanche Current – A
AS
I
1
0.010.1
1.010
tav – Time Duration of Avalanche – ms
Figure 16
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
100
4-CHANNEL INDEPENDENT GATE-PROTECTED
SLIS038A – SEPTEMBER 1994 – REVISED SEPTEMBER 1995
THERMAL INFORMATION
TPIC5403
POWER DMOS ARRAY
JUNCTION-TO-BOARD THERMAL RESISTANCE
100
DC Conditions
C/W
°
– Junction-to-Board Thermal Resistance –
JBθ
R
d = 0.5
d = 0.2
10
d = 0.1
d = 0.05
d = 0.02
1
d = 0.01
DW PACKAGE
†
vs
PULSE DURATION
Single Pulse
0.1
0.00010.001
†
Device mounted on 24in2, 4-layer FR4 printed-circuit board with no heatsink.
NOTE A: Z
(t) = r(t) R
θJB
tw = pulse duration
tc = cycle time
d = duty cycle = tw/t
θJB
c
0.01
tw – Pulse Duration – s
0.11100
Figure 17
t
c
t
w
10
I
D
0
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
11
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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