The TPIC5401 is a monolithic gate-protected power DMOS array that consists of four N-channel
enhancement-mode DMOS transistors, two of which are configured with a common source. Each transistor
features integrated high-current zener diodes (Z
overstress condition occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using
the human-body model of a 100-pF capacitor in series with a 1.5-kΩ resistor.
The TPIC5401 is offered in a 16-pin thermally enhanced dual-in-line (NE) package and a 20-pin wide-body
surface-mount (DW) package and is characterized for operation over the case temperature range of –40°C to
125°C.
. . . 0.3 Ω Typ
NE PACKAGE
(TOP VIEW)
CXa
DD
and Z
Pulsed Current...10 A Per Channel
Fast Commutation Speed
) to prevent gate damage in the event that an
CXb
DW PACKAGE
(TOP VIEW)
TPIC5401
SOURCE2/GND
SOURCE4/GND
schematic
DRAIN2
GATE2
GND
GND
GATE4
DRAIN4
DRAIN1
GATE1
SOURCE1
DRAIN2
Z
Z
C1b
C1a
16
15
14
13
12
11
10
9
Q1
Q2
SOURCE1
DRAIN1
GATE1
GND
GND
GATE3
DRAIN3
SOURCE3
D1
D2Z1Z3
SOURCE4/GND
NC – No internal connection
1
2
3
4
5
6
7
8
GND
GATE4
NC
DRAIN4
SOURCE3
DRAIN3
GATE3
NC
NC
1
2
3
4
5
6
7
8
9
10
SOURCE2/GND
20
GATE2
19
NC
18
NC
17
DRAIN2
16
SOURCE1
15
14
DRAIN1
13
GATE1
12
NC
11
NC
Q3
Z
C3b
Z
C3a
Q4
DRAIN3
GATE3
SOURCE3
DRAIN4
GATE2
Z
C2b
Z
C2a
NOTE: For correct operation, no terminal pin may be taken below GND.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Z2Z4
GND, SOURCE2, SOURCE4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
GATE4
Z
C4b
Z
C4a
Copyright 1994, Texas Instruments Incorporated
1
TPIC5401
H-BRIDGE GATE-PROTECTED
POWER DMOS ARRAY
SLIS024A – DECEMBER 1993 – REVISED MARCH 1994
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.