The TPIC5323L is a monolithic gate-protected
logic-level power DMOS array that consists of
DRAIN2
DRAIN2
SOURCE2
SOURCE2
GATE2
DRAIN3
DRAIN3
three electrically isolated independent N-channel
enhancement-mode DMOS transistors. Each transistor features integrated high-current zener diodes (Z
and Z
) to prevent gate damage in the event that an overstress condition occurs. These zener diodes also
CXb
provide up to 4000 V of ESD protection when tested using the human-body model of a 100-pF capacitor in series
with a 1.5-kΩ resistor.
The TPIC5323L is offered in a standard 16-pin small-outline surface-mount (D) package and is characterized
for operation over the case temperature of –40°C to 125°C.
schematic
DRAIN1
DRAIN2DRAIN3GATE2GATE3
95
6, 71, 212, 13
CXa
Q1Q2Q3
Z
Z
16
C1b
C1a
14, 15
SOURCE1
GATE1
NOTE A: For correct operation, no terminal can be taken below GND.
D1
Z1Z2
Z
C2b
Z
C2a
83, 410, 11
GND
SOURCE2
D2
Z
Z
D3
Z3
C3b
C3a
SOURCE3
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
TPIC5323L
3-CHANNEL INDEPENDENT GATE-PROTECTED
SLIS044A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Gate-to-source voltage range, V
Continuous drain current, each output, T
Continuous source-to-drain diode current, T
Pulsed drain current, each output, I
Continuous gate-to-source zener diode current, T
Pulsed gate-to-source zener diode current, T
Single-pulse avalanche energy, E
Continuous total power dissipation, T
Operating virtual junction temperature range, T
Operating case temperature range, T
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.