The TPIC5223L is a monolithic gate-protected logic-level power DMOS array that consists of two electrically
isolated independent N-channel enhancement-mode DMOS transistors. Each transistor features integrated
high-current zener diodes (Z
CXa
and Z
) to prevent gate damage in the event that an overstress condition
CXb
occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using the human-body
model of a 100-pF capacitor in series with a 1.5-kΩ resistor.
The TPIC5223L is offered in a standard eight-pin small-outline surface-mount (D) package and is characterized
for operation over the case temperature of –40°C to 125°C.
schematic
GATE1
Z
Z
7
C1b
C1a
DRAIN1
Q1
8
D1
Z1
GATE2
3
Z
Z
C2b
C2a
DRAIN2
Q2
4
D2
Z2
2
SOURCE1
NOTE A: For correct operation, no terminal may be taken below GND.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
16
GND
SOURCE2
Copyright 1995, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Gate-to-source voltage range, V
Continuous drain current, each output, T
Continuous source-to-drain diode current, T
Pulsed drain current, each output, I
Continuous gate-to-source zener diode current, T
Pulsed gate-to-source zener-diode current, T
Single-pulse avalanche energy, E
Continuous total power dissipation, T
Operating virtual junction temperature range, T
Operating case temperature range, T
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.