TEXAS INSTRUMENTS TPIC5223L Technical data

TPIC5223L
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
GND
D PACKAGE
(TOP VIEW)
1 2 3 4
8 7 6 5
DRAIN1 GATE1 SOURCE2 NC
D
DS(on)
D
Voltage Output...60 V
D
Input Protection Circuitry...18 V
D
Pulsed Current...3 A Per Channel
D
Extended ESD Capability...4000 V
D
Direct Logic-Level Interface
. . . 0.38 Typ
description
SOURCE1
GATE2
DRAIN2
NC – No internal connection
The TPIC5223L is a monolithic gate-protected logic-level power DMOS array that consists of two electrically isolated independent N-channel enhancement-mode DMOS transistors. Each transistor features integrated high-current zener diodes (Z
CXa
and Z
) to prevent gate damage in the event that an overstress condition
CXb
occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using the human-body model of a 100-pF capacitor in series with a 1.5-k resistor.
The TPIC5223L is offered in a standard eight-pin small-outline surface-mount (D) package and is characterized for operation over the case temperature of –40°C to 125°C.
schematic
GATE1
Z
Z
7
C1b
C1a
DRAIN1
Q1
8
D1
Z1
GATE2
3
Z Z
C2b C2a
DRAIN2
Q2
4
D2
Z2
2
SOURCE1
NOTE A: For correct operation, no terminal may be taken below GND.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
1 6
GND
SOURCE2
Copyright 1995, Texas Instruments Incorporated
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
1
TPIC5223L 2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Drain-to-source voltage, V
60 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DS
Source-to-GND voltage 100 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Drain-to-GND voltage 100 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gate-to-source voltage range, V Continuous drain current, each output, T Continuous source-to-drain diode current, T Pulsed drain current, each output, I Continuous gate-to-source zener diode current, T Pulsed gate-to-source zener-diode current, T Single-pulse avalanche energy, E Continuous total power dissipation, T Operating virtual junction temperature range, T Operating case temperature range, T Storage temperature range, T
–9 V to 18 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GS
max
AS
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
= 25°C 1 A. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
= 25°C 1 A. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
, TC = 25°C (see Note 1 and Figure 15) 3 A. . . . . . . . . . . . . . . . . . . . .
= 25°C ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
= 25°C ±500 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
, TC = 25°C (see Figures 4 and 16) 108 mJ. . . . . . . . . . . . . . . . . . . . . . .
= 25°C (see Figure 15) 0.95 W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
–40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
–40°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
J
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: Pulse duration = 10 ms, duty cycle = 2%
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
I
Zero-gate-voltage drain current
DS
,
A
I
Leakage current, drain-to-GND
V
V
A
r
Static drain-to-source on-state resistance
D
,
F
trrReverse-recovery time
ns
V
GS
g
di/dt
100 A/µs
QRRTotal diode charge
See Figures 1 and 14
nC
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
electrical characteristics, TC = 25°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
(BR)DSX
V
GS(th)
V
(BR)GS
V
(BR)SG
V
(BR)
V
DS(on)
V
F(SD)
V
F
DSS
I
GSSF
I
GSSR
lkg
DS(on)
g
fs
C
iss
C
oss
C
rss
NOTES: 2. Technique should limit TJ – TC to 10°C maximum.
Drain-to-source breakdown voltage ID = 250 µA, VGS = 0 60 V Gate-to-source threshold voltage Gate-to-source breakdown voltage IGS = 250 µA 18 V
Source-to-gate breakdown voltage ISG = 250 µA 9 V Reverse drain-to-GND breakdown voltage
(across D1, D2) Drain-to-source on-state voltage
Forward on-state voltage, source-to-drain
Forward on-state voltage, GND-to-drain
Forward-gate current, drain short circuited to source VGS = 15 V, VDS = 0 20 200 nA Reverse-gate current, drain short circuited to source VSG = 5 V, VDS = 0 10 100 nA
Forward transconductance Short-circuit input capacitance, common source 150 190
Short-circuit output capacitance, common source Short-circuit reverse transfer capacitance,
common source
3. These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts.
ID = 1 mA, See Figure 5
Drain-to-GND current = 250 µA 100 V ID = 1 A,
See Notes 2 and 3 IS = 1 A,
VGS = 0 (Z1, Z2), See Notes 2 and 3 and Figure 12
ID = 1 A (D1, D2), See Notes 2 and 3
V
= 48 V,
VGS = 0
= 48
DGND
VGS = 5 V, I
= 1 A, See Notes 2 and 3 and Figures 6 and 7
VDS = 15 V, ID = 500 mA, See Notes 2 and 3 and Figure 9
VDS = 25 V, VGS = 0, f = 1 MHz, See Figure 11
TPIC5223L
POWER DMOS ARRAY
VDS = V
VGS = 5 V,
TC = 25°C 0.05 1 TC = 125°C 0.5 10
TC = 25°C 0.05 1 TC = 125°C 0.5 10
TC = 25°C 0.38 0.43
TC = 125°C 0.61 0.65
GS,
1.5 2.05 2.2 V
0.375 0.425 V
0.85 1.2 V
3 V
1.2 1.49 S
100 125
40 50
µ
µ
p
source-to-drain and GND-to-drain diode characteristics, TC = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IS = 500 mA,
= 0,
See Fi
ures 1 and 14
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
VDS = 48 V,
=
Z1 and Z2 50 D1 and D2 210
,
Z1 and Z2 D1 and D2 800
50
3
TPIC5223L
DD
,
L
,
r1
,
ns
See Figure 3
nH
2-CHANNEL INDEPENDENT GATE-PROTECTED LOGIC-LEVEL POWER DMOS ARRAY
SLIS043A – NOVEMBER 1994 – REVISED SEPTEMBER 1995
resistive-load switching characteristics, TC = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
d(on)
t
d(off)
t
r1
t
f2
Q Q Q L
D
L
S
R
thermal resistance
R R R
NOTES: 4. Package mounted on an FR4 printed-circuit board with no heatsink.
Turn-on delay time 34 70 Turn-off delay time Rise time Fall time 15 30 Total gate charge
g
Threshold gate-to-source charge
gs(th)
Gate-to-drain charge
gd
Internal drain inductance 5 Internal source inductance 5 Internal gate resistance 0.25
g
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Junction-to-ambient thermal resistance See Notes 4 and 7 130
θJA
Junction-to-board thermal resistance See Notes 5 and 7 78.6
θJB
Junction-to-pin thermal resistance See Notes 6 and 7 34
θJP
5. Package mounted on a 24 in2, 4-layer FR4 printed-circuit board.
6. Package mounted in intimate contact with infinite heatsink.
7. All outputs with equal power
V
= 25 V, R
tf1 = 10 ns,
VDS = 48 V,
= 50 ,t
See Figure 2
ID = 500 mA, VGS = 5 V,
= 10 ns,
20 40 28 55
3.1 3.8
0.5 0.6
1.9 2.3
nC
°C/W
PARAMETER MEASUREMENT INFORMATION
1.5 VDS = 48 V VGS = 0
1
TJ = 25°C Z1, and Z2
0.5
0
– 0.5
– 1
– 1.5
– Source-to-Drain Diode Current – AI
S
– 2
– 2.5
0 50 100 150 200 250 300 350 400 450 500
IRM = maximum recovery current
The above waveform is representative of D1 and D2 in shape only.
Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode
Reverse di/dt = 100 A/µs
Shaded Area = Q
I
t
rr(SD)
RM
Time – ns
25% of I
RR
RM
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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