TEXAS INSTRUMENTS TPIC5203 Technical data

TPIC5203
2-CHANNEL INDEPENDENT GATE-PROTECTED
POWER DMOS ARRAY
SLIS040 – SEPTEMBER 1994
Low r
High Voltage Output...60 V
Extended ESD Capability...4000 V
Pulsed Current...8 A Per Channel
Fast Commutation Speed
. . . 0.26 Typ
GND
SOURCE1
GATE2
DRAIN2
D PACKAGE
(TOP VIEW)
1 2 3 4
8 7 6 5
DRAIN1 GATE1 SOURCE2 NC
description
NC – No internal connection
The TPIC5203 is a monolithic gate-protected power DMOS array that consists of two independent electrically isolated N-channel enhancement-mode DMOS transistors. Each transistor features integrated high-current zener diodes (Z
CXa
and Z
) to prevent gate damage in the event that an overstress
CXb
condition occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using the human-body model of a 100-pF capacitor in series with a 1.5-k resistor.
The TPIC5203 is offered in a standard eight-pin small-outline surface-mount (D) package and is characterized for operation over the case temperature range of –40°C to 125°C.
schematic
GATE1
Z Z
7
C1b C1a
DRAIN1
Q1
8
D1
Z1
GATE2
Z Z
3
C2b C2a
DRAIN2
Q2
4
D2
Z2
2
SOURCE1
NOTE: For correct operation, no terminal pin may be taken below GND.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
1 6
GND
SOURCE2
Copyright 1994, Texas Instruments Incorporated
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
2–1
TPIC5203 2-CHANNEL INDEPENDENT GATE-PROTECTED POWER DMOS ARRAY
SLIS040 – SEPTEMBER 1994
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Drain-to-source voltage, V
60 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DS
Source-to-GND voltage (Q1, Q2) 100 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Drain-to-GND voltage (Q1, Q2) 100 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gate-to-source voltage range, V Continuous drain current, each output, T Continuous source-to-drain diode current, T Pulsed drain current, each output, I Continuous gate-to-source zener diode current, T Pulsed gate-to-source zener-diode current, T Single-pulse avalanche energy, E Continuous total dissipation, T Operating virtual junction temperature range, T Operating case temperature range, T Storage temperature range, T
–9 V to 18 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
GS
max
AS
= 25°C (see Figure 15) 962 mW. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
= 25°C 1.6 A. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
= 25°C 1.6 A. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
, TC = 25°C (see Note 1 and Figure 15) 8 A. . . . . . . . . . . . . . . . . . . . .
= 25°C ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
= 25°C ±500 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
, TC = 25°C (see Figures 4, 15, and 16) 21.6 mJ. . . . . . . . . . . . . . . . . . .
–40°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
C
J
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: Pulse duration = 10 ms, duty cycle = 2%
2–2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
2-CHANNEL INDEPENDENT GATE-PROTECTED
I
Zero-gate-voltage drain current
DS
,
A
I
Leakage current, drain-to-GND
V
V
A
r
Static drain-to-source on-state resistance
D
,
F
trrReverse-recovery time
ns
V
g
di/dt
100 A/
QRRTotal diode charge
See Figures 1 and 14
nC
electrical characteristics, TC = 25°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
(BR)DSX
V
GS(th)
V
(BR)GS
V
(BR)SG
V
(BR)
V
DS(on)
V
F(SD)
V
F
DSS
I
GSSF
I
GSSR
lkg
DS(on)
g
fs
C
iss
C
oss
C
rss
NOTES: 2. Technique should limit TJ – TC to 10°C maximum.
Drain-to-source breakdown voltage ID = 250 µA, VGS = 0 60 V Gate-to-source threshold voltage Gate-to-source breakdown voltage IGS = 250 µA 18 V
Source-to-gate breakdown voltage ISG = 250 µA 9 V Reverse drain-to-GND breakdown voltage (across
D1, D2) Drain-to-source on-state voltage
Forward on-state voltage, source-to-drain
Forward on-state voltage, GND-to-drain
Forward-gate current, drain short circuited to source
Reverse-gate current, drain short circuited to source
Forward transconductance Short-circuit input capacitance, common source 150 275
Short-circuit output capacitance, common source Short-circuit reverse transfer capacitance, common
source
3. These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts.
ID = 1 mA, See Figure 5
Drain-to-GND current = 250 µA 100 V ID = 1.6 A,
See Notes 2 and 3 IS = 1.6 A,
VGS = 0 (Z1, Z2), See Notes 2 and 3 and Figure 12
ID = 1.6 A (D1, D2), See Notes 2 and 3
V
= 48 V,
VGS = 0
VGS = 15 V, VDS = 0 20 200 nA
VSG = 5 V, VDS = 0 10 100 nA
= 48
DGND
VGS = 10 V, I
= 1.6 A, See Notes 2 and 3 and Figures 6 and 7
VDS = 15 V, ID = 800 mA, See Notes 2 and 3 and Figure 9
VDS = 25 V, VGS = 0, f = 1 MHz, See Figure 11
TPIC5203
POWER DMOS ARRAY
SLIS040 – SEPTEMBER 1994
VDS = V
VGS = 10 V,
TC = 25°C 0.05 1 TC = 125°C 0.5 10
TC = 25°C 0.05 1 TC = 125°C 0.5 10
TC = 25°C 0.26 0.31
TC = 125°C 0.41 0.45
GS,
1.5 2.05 2.2 V
0.42 0.5 V
1 1.2 V
5 V
1.5 1.83 S
100 150
40 125
µ
µ
p
source-to-drain and GND-to-drain diode characteristics, TC = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IS = 800 mA,
= 0,
GS
See Fi
ures 1 and 14
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
VDS = 48 V,
=
µs,
Z1 and Z2 50 D1 and D2 265 Z1 and Z2 D1 and D2 1240
63
2–3
TPIC5203
DD
,
L
,
en
,
ns
See Figure 3
nH
2-CHANNEL INDEPENDENT GATE-PROTECTED POWER DMOS ARRAY
SLIS040 – SEPTEMBER 1994
resistive-load switching characteristics, TC = 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
d(on)
t
d(off)
t
r
t
f
Q Q Q L
D
L
S
R
g
thermal resistance
R
θJA
R
θJB
R
θJP
NOTES: 4. Package mounted on an FR4 printed-circuit board with no heatsink
Turn-on delay time 25 50 Turn-off delay time Rise time Fall time 7 15 Total gate charge
g
Threshold gate-to-source charge
gs(th)
Gate-to-drain charge
gd
Internal drain inductance 5 Internal source inductance 5 Internal gate resistance 0.25
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Junction-to-ambient thermal resistance See Notes 4 and 7 130 Junction-to-board thermal resistance See Notes 5 and 7 79 Junction-to-pin thermal resistance See Notes 6 and 7 34
5. Package mounted on a 24 inch2, 4-layer FR4 printed-circuit board
6. Package mounted in intimate contact with infinite heatsink
7. All outputs with equal power
V
= 25 V, R
t
= 10 ns,
dis
VDS = 48 V,
= 30 ,t
See Figure 2
ID = 0.8 A, VGS = 10 V,
= 10 ns,
27 50 15 30
4.7 5.9
0.5 0.6
1.9 2.4
nC
°C/W
PARAMETER MEASUREMENT INFORMATION
1.5
1
Reverse di/dt = 100 A/µs
0.5
0
– 0.5
– 1
– 1.5
– Source-to-Drain Diode Current – AI
S
– 2
I
RM
– 2.5
0 50 100 150 200 250 300 350 400 450 500
IRM = maximum recovery current
The above waveform is representative of D1 and D2 in shape only.
Shaded Area = QRR
t
rr(SD)
Time – ns
25% of I
VDS = 48 V VGS = 0 TJ = 25°C Z1 and Z2
RM
Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode
2–4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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