Compatible With High-Side and Low-Side
Current Sense Resistors
. . . 0.25 Ω Typ
description
The TPIC1310 is a monolithic gate-protected
power DMOS array that consists of six electrically
isolated N-channel enhancement-mode DMOS
transistors configured as a three-half H-bridge.
When suitably heat sunk, the TPIC1310 can drive
motors requiring 2.5 A of phase current. The
DMOS transistors are immune to second breakdown effects and current crowding, problems
often associated with bipolar transistors.
The TPIC1310 is offered in 15-pin through-hole
(KTS) and surface-mount (KTR) PowerFLEX
packages and is characterized for operation over
the case temperature range of –40°C to 125°C.
KTR or KTS PACKAGE
(TOP VIEW)
V
DD
OUTA
UGA
LGA
UGB
SUB/GND
SOURCE
OUTB
SOURCE
SUB/GND
LGB
LGC
UGC
OUTC
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Tab is SUB/GND
schematic
V
DD
1, 15
Q1
UGA
3
2
OUTA
Q4
NOTES: A. Terminals 1 and 15 must be externally connected.
B. Terminals 6 and 10 must be connected to GND.
C. Terminals 7 and 9 must be connected to the sense resistor or GND.
D. No terminal may be taken greater than 0.5 V below GND.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LGA
4
13 k13 k13 k
8
7, 9
SOURCE
Q2
Q5
OUTB
UGB
LGB
KTR PACKAGEKTS PACKAGE
Q3
OUTC
UG
13
C
LGC
12
SUB/TAB/GND
6, 10
5
14
Q6
11
PowerFLEX is a trademark of Texas Instruments Inc.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
absolute maximum ratings over operating case temperature range (unless otherwise noted)
Gate-to-source voltage range, V
Continuous output current, each output, all outputs on, T
Continuous source-to-drain diode current, T
Pulsed output current, each output, I
Continuous V
Pulsed V
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions is not implied. Exposure to absolute-maximum-rated conditions for extended
periods may affect device reliability.
NOTES: 1. Pulse duration = 10 µs, duty cycle ≤ 2%
2. Package is mounted in intimate contact with an infinite heat sink.
Junction-to-case thermal resistance, one output onSee Note 57.59°C/W
θJC
Junction-to-case thermal resistance, two outputs onSee Notes 5 and 64.55.5°C/W
θJC
6. Two outputs with equal power
VDD = 28 V,
=
en
Figure 2
VDS = 12 V,
ID = 3 A,
V
= 10 V
= 10 V,
See Figure 3 and Figure 12
ns,
RL = 9.3 Ω,
dis
=
ns,
200
140
55
1.62
0.50.62
0.250.31
nC
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
PARAMETER MEASUREMENT INFORMATION
4
3
2
trr
(SD)
1
Reverse di/dt = 100 A/µs
Pulse Generator
R
gen
50 Ω
0
– 1
– 2
– Source-to-Drain Diode Current – AI
S
– 3
– 4
0255075100125150175200225250
†
IRM = maximum recovery current
I
RM
25% of I
Shaded Area = Q
†
Time – ns
RM
†
RR
Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode
VDD = 28 V
t
V
GS
t
d(on)
V
DS
en
t
f
R
L
V
DS
V
GS
DUT
CL 30 pF
50 Ω
(see Note A)
t
dis
14 V
0 V
t
d(off)
t
r
V
V
DD
DS(on)
TEST CIRCUIT
NOTE A: CL includes probe and jig capacitance.
Figure 2. Resistive-Switching Test Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
VOLTAGE WAVEFORMS
5
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
TYPICAL CHARACTERISTICS
Current
Regulator
12-V
Battery
0.2 µF
50 kΩ
0.3 µF
V
DS
Same Type
as DUT
V
DD
10 V
V
GS
Q
gs(th)
Q
g
Q
gd
1.6
1.4
1.2
1.0
0.8
0.6
– Gate-to-Source Threshold Voltage – V
0
IG = 100 µA
IG Current-
Sampling Resistor
TEST CIRCUIT
Sampling Resistor
Figure 3. Gate-Charge Test Circuit and Voltage Waveform
GATE-TO-SOURCE THRESHOLD VOLTAGE
vs
JUNCTION TEMPERATURE
VDS = V
ID = 10 mA
ID = 1 mA
GS
DUT
ID Current-
Gate Voltage
Time
VOLTAGE WAVEFORM
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
JUNCTION TEMPERATURE
0.45
ID = 3 A
0.4
VGS = 10 V
VGS = 15 V
VGS = 12 V
– Static Drain-to-Sourcer
On-State Resistance – Ω
DS(on)
0.35
0.3
0.25
0.2
0.15
0.1
6
0.4
GS(th)
V
0.2
– 40 – 20020406080 100 120 140 160
TJ – Junction Temperature – °C
Figure 4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0.05
0
–40 –2002040
TJ – Junction Temperature – °C
60 80 100 120 140 160
Figure 5
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
TYPICAL CHARACTERISTICS
STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE
vs
DRAIN CURRENT
1
0.9
TJ = 25°C
0.8
0.7
0.6
Ω
0.5
0.4
0.3
– Static Drain-to-Source
0.2
On-State Resistance –
DS(on)
r
0.1
0.1110
VGS = 10 V
VGS = 15 V
VGS = 12 V
ID – Drain Current – A
Figure 6
DISTRIBUTION OF
FORWARD TRANSCONDUCTANCE
25
Total
Number of
Units = 300
20
VDS = 10 V
ID = 3 A
TJ = 25°C
15
10
Percentage of Units – %
5
DRAIN CURRENT
vs
DRAIN-TO-SOURCE VOLTAGE
12
VGS = 15 VVGS = 12 V
10
8
VGS = 7 V
6
– Drain Current – A
4
D
I
2
0
012 345 6
VDS – Drain-to-Source Voltage – V
VGS = 10 V
∆VGS = 1 V
TJ = 25°C
VGS = 3 V
78910
Figure 7
DRAIN CURRENT
vs
GATE-TO-SOURCE VOLTAGE (FOR LOW SIDE)
12
TJ = –40°C
10
TJ = 25°C
8
TJ = 150°C
6
– Drain Current – A
4
D
I
2
0
0.7
0.73
0.76
0.79
0.82
0.85
0.88
0.91
0.94
gfs – Forward Transconductance – S
1
0.97
Figure 8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0
02 4 6 810
VGS – Gate-to-Source Voltage – V
Figure 9
121416
7
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
TYPICAL CHARACTERISTICS
CAPACITANCE
vs
DRAIN-TO-SOURCE VOLTAGE
400
VGS = 0
f = 1 MHz
360
TJ = 25°C
320
280
240
160
Capacitance – pF
C
120
80
40
0
0246810
C
oss
iss
C
rss
VDS – Drain-to-Source Voltage – V
121416
Figure 10
DRAIN-TO-SOURCE VOLTAGE AND
GATE-TO-SOURCE VOLTAGE
vs
GATE CHARGE
16
14
12
10
8
6
– Drain-to-Source Voltage – V
4
DS
V
2
0
0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 2.25 2.5
VDD = 14 V
VDD = 12 V
VDD = 10 V
ID = 3A
TJ = 25°C
See Figure 3
Qg – Gate Charge – nC
26
16
14
12
10
8
6
4
2
0
– Source-to-Drain Diode Current – A
SD
I
– Reverse Recovery Time – ns
– Gate-to-Source Voltage – V
t
GS
V
SOURCE-TO-DRAIN DIODE CURRENT
vs
SOURCE-TO-DRAIN VOLTAGE
100
VGS = 0
10
1
.01
0.1110
TJ = 25°C
TJ = –40°C
TJ = 150°C
VSD – Source-to-Drain Voltage – V
Figure 11
REVERSE RECOVERY TIME
vs
REVERSE di/dt
120
110
100
90
80
70
60
50
rr
40
30
20
02040 6080 100 120
Q4, Q5, Q6
Reverse di/dt – A/µs
VDS = 28 V
VGS = 0
IS = 3 A
TJ = 25°C
See Figure 1
Q1, Q2, Q3
140 160 180 200
Figure 12
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Figure 13
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
THERMAL INFORMATION
MAXIMUM DRAIN CURRENT
vs
DRAIN-TO-SOURCE VOLTAGE
100
TC = 25°C
†
1 µs
10
‡
θJC
†
10 ms
1
– Maximum Drain Current – A
D
I
1 ms
500 µs
†
†
10 µs
†
0.1
0.1110100
VDS – Drain-to-Source Voltage – V
†
Less than 2% duty cycle
‡
Device mounted in intimate contact with infinite heatsink.
Figure 14
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
TPIC1310
3-HALF H-BRIDGE GATE PROTECTED
POWER DMOS ARRAY
SLIS071 – DECEMBER 1997
THERMAL INFORMATION
JUNCTION-TO-CASE THERMAL RESISTANCE
1
DC Conditions
vs
PULSE DURATION
TC = 25°C
C/W
°
– Junction-to-Case Thermal Resistance –
JCθ
R
†
Package mounted in intimate contact with infinite heat sink.
NOTE E: Z
d = 0.5
d = 0.2
d = 0.1
d = 0.05
Single Pulse
0.1
0.00010.001
(t) = r(t) R
θJC
tw = pulse duration
tc = cycle time
d = duty cycle = tw/t
θJC
c
t
c
t
w
0.010.1110
tw – Pulse Duration – s
I
D
0
Figure 15
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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