Functionally Equivalent, but Faster Than
PAL16L8A, PAL16R4A, PAL16R6A, and
PAL16R8A
D
Power-Up Clear on Registered Devices (All
Register Outputs Are Set High, but Voltage
Levels at the Output Pins Go Low)
D
Package Options Include Both Plastic and
Ceramic Chip Carriers in Addition to
Plastic and Ceramic DIPs
D
Dependable Texas Instruments Quality and
Reliability
3-STATE
DEVICE
PAL16L810206
PAL16R480
PAL16R680
PAL16R880
I
INPUTS
O
OUTPUTS
REGISTERED
Q
OUTPUTS
4 (3-state
buffers)
6 (3-state
buffers)
8 (3-state
buffers)
description
These programmable array logic devices feature
high speed and functional equivalency when
compared with currently available devices. These
IMP ACT circuits combine the latest Advanced
Low-Power Schottky technology with proven
titanium-tungsten fuses to provide reliable,
high-performance substitutes for conventional
TTL logic. Their easy programmability allows for
quick design of custom functions and typically
results in a more compact circuit board. In
addition, chip carriers are available for further
reduction in board space.
I/O
PORTS
4
2
0
C SUFFIX ...J OR N PACKAGE
M SUFFIX ...J OR W PACKAGE
TIBPAL16L8’
(TOP VIEW)
I
1
I
2
I
3
I
4
5
I
6
I
7
I
8
I
9
I
GND
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
I
I
I
I
I
10
TIBPAL16L8’
(TOP VIEW)
I
I
3212019
4
5
6
7
8
910111213
I
V
20
CC
O
19
I/O
18
I/O
17
16
I/O
15
I/O
14
I/O
13
I/O
12
O
11
I
CC
I
O
V
18
17
16
15
14
I
O
I/O
I/O
I/O
I/O
I/O
I/O
GND
The TIBP AL16’ C series is characterized from 0°C
to 75°C. The TIBP AL16’ M series is characterized
for operation over the full military temperature
range of –55°C to 125°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
These devices are covered by U.S. Patent 4,410,987.
IMPACT is a trademark of Texas Instruments.
PAL is a registered trademark of Advanced Micro Devices Inc.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
electrical characteristics over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
V
IK
V
OH
V
OL
OZH
OZL
I
I
IH
IL
I
OS
I
CC
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
Not more than one output should be shorted at a time and the duration of the short circuit should not exceed one second. Set VO at 0.5 V to avoid
test-equipment degradation.
Outputs
I/O ports
Outputs
I/O ports
Pin 1, 11
All others
Pin 1, 1150
I/O ports
All others20
I/O ports
All others
Texas Instruments programmable logic devices can be programmed using widely available software and
inexpensive device programmers.
Complete programming specifications, algorithms, and the latest information on hardware, software, and
firmware are available upon request. Information on programmers capable of programming T exas Instruments
programmable logic also is available, upon request, from the nearest TI field sales office or local authorized TI
distributor, by calling Texas Instruments at +1 (972) 644–5580, or by visiting the TI Semiconductor Home Page
at www.ti.com/sc.
preload procedure for registered outputs (see Figure 1 and Note 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below.
Step 1.With V
Step 2.Apply either V
at 5 V and Pin 1 at VIL, raise Pin 11 to V
CC
or VIH to the output corresponding to the register to be preloaded.
IL
IHH
.
Step 3.Pulse Pin 1, clocking in preload data.
Step 4.Remove output voltage, then lower Pin 11 to VIL. Preload can be verified by observing the
Following power up, all registers are set high. This feature provides extra flexibility to the system designer and
is especially valuable in simplifying state-machine initialization. T o ensure a valid power-up reset, it is important
that the rise of VCC be monotonic. Following power-up reset, a low-to-high clock transition must not occur until
all applicable input and feedback setup times are met.
V
CC
Active-Low
Registered Output
CLK
†
This is the power-up reset time and applies to registered outputs only. The values shown are from characterization data.
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform
2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf ≤ 2 ns, duty cycle = 50%
D. When measuring propagation delay times of 3-state outputs from low to high, switch S1 is closed.
When measuring propagation delay times of 3-state outputs from high to low, switch S1 is open.
E. Equivalent loads may be used for testing.
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform
2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses have the following characteristics: PRR ≤ 10 MHz, tr = tf ≤ 2 ns, duty cycle = 50%
D. When measuring propagation delay times of 3-state outputs, switch S1 is closed.
E. Equivalent loads may be used for testing.
1.5 V
1.5 V1.5 V
1.5 V1.5 V
1.5 V
1.5 V
3 V
0
t
h
3 V
0
3 V
0
t
pd
V
OH
1.5 V
V
OL
t
pd
V
OH
1.5 V
V
OL
High-Level
Pulse
Low-Level
Pulse
Output
Control
(low-level
enabling)
t
en
Waveform 1
S1 Closed
(see Note B)
t
en
Waveform 2
S1 Open
(see Note B)
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
1.5 V1.5 V
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.5 V1.5 V
t
dis
1.5 V
t
dis
1.5 V
VOLTAGE WAVEFORMS
.
dis
3 V
0
3 V
0
3 V
0
≈3.3 V
VOL + 0.5 V
V
OL
V
OH
VOH – 0.5 V
≈0 V
16
Figure 4. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
Customers are responsible for their applications using TI components.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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