Texas Instruments TCAN4550-Q1 Reference Manual

Technical Reference Manual
SLLU312–July 2019

TCAN4550-Q1 Functional Safety-Manual

Contents
1 Introduction ................................................................................................................... 2
2 Product Functional Safety-Capability...................................................................................... 2
3 Product Overview............................................................................................................ 2
4 Development Process for Management of Systematic Faults........................................................ 21
List of Figures
1 CAN Bus States.............................................................................................................. 3
2 TCAN4550-Q1 Mixed Signal Functional Block Diagram ............................................................... 4
3 Digital Core Block Diagram and Clock Tree ............................................................................. 5
4 General Purpose Application............................................................................................... 6
5 Potential Failure Points ..................................................................................................... 6
6 State Diagram................................................................................................................ 8
7 Fail-safe Feature State Diagram ......................................................................................... 10
8 SPI and M_CAN Test Modes............................................................................................. 12
9 CAN Transceiver Test Mode ............................................................................................. 13
10 Timing for RST Pin in Normal and Standby Modes ................................................................... 17
11 Timing for RST Pin in Sleep Mode....................................................................................... 18
12 TI New-Product Development Process.................................................................................. 21
1 Potential Failure Points and Section ..................................................................................... 7
2 Safety-Mechanisms.......................................................................................................... 7
3 Mode Overview .............................................................................................................. 9
4 Under Voltage Lockout ................................................................................................... 11
5 Driver Function Table...................................................................................................... 11
6 Receiver Function Table Normal and Standby Modes................................................................ 12
7 Watchdog Registers and Descriptions .................................................................................. 16
8 Terminal Bias ............................................................................................................... 16
9 Internal SPI Status Field Descriptions (Address h000C) ............................................................. 18
10 Interrupts Field Descriptions (Address h0820) ......................................................................... 19
11 MCAN Interrupts Field Descriptions (Address h0824)................................................................. 20
SLLU312–July 2019
Submit Documentation Feedback
List of Tables
Copyright © 2019, Texas Instruments Incorporated
TCAN4550-Q1 Functional Safety-Manual
1
Introduction
Trademarks
All trademarks are the property of their respective owners.

1 Introduction

The system and equipment manufacturer or designer (as a user of this document) is responsible to ensure that their systems (and any TI hardware or software components incorporated in the systems) meet all applicable safety, regulatory and system-level performance requirements. All application and safety­related information in this document (including application descriptions, suggested safety-measures, suggested TI products, and other materials) is provided for reference only. Users understand and agree that their use of TI components in safety-critical applications is entirely at their risk, and that user (as a buyer) agrees to defend, indemnify, and hold harmless TI from any and all damages, claims, suits, or expense resulting from such use.
This document is a safety-manual for the Texas Instruments TCAN4550-Q1 aCAN FD controller with integrated transceiver for safety-critical applications. The safety-manual provides information to help system developers create safety-related systems using a supported TCAN4550-Q1. This document contains:
An overview of the product architecture
An overview of the development process used to reduce systematic failures
An overview of the safety architecture for management of random failures
The details of architecture partitions, implemented safety mechanisms, and recommended usage The Safety Analysis Report documents the following information, which is not covered in this document:
Failure rates estimation
Qualitative failure analysis (design FMEA and pin-FMEA)
Quantitative failure analysis (quantitative FMEDA)
Safety metrics calculated per targeted standards per system example implementation TI expects that the user of this document has a general familiarity with the TCAN4550-Q1 device. This
document is intended to be used in conjunction with the pertinent data sheets and other documentation. This partition of technical content is intended to simplify development, reduce duplication of content, and avoid confusion as compared to the definition of safety-manual as seen in IEC 61508:2010.
www.ti.com

2 Product Functional Safety-Capability

The TCAN4550-Q1 safety-capability is QM, Quality Managed, per ISO 26262:2018. The TCAN4550-Q1 was developed with Quality Managed product development process and qualified according to AEC Q100 Grade 1.

3 Product Overview

The TCAN4550-Q1 is a CAN FD controller with an integrated CAN FD transceiver supporting data rates up to 8 Mbps. The CAN FD controller meets the specifications of the ISO 11898-1:2015 high speed Controller Area Network (CAN) data link layer and meets the physical layer requirements of the ISO 11898-2:2016 High Speed Controller Area Network (CAN) specification providing an interface between the CAN bus and the host system supporting both classical CAN and CAN FD up to 8 megabits per second (Mbps). The TCAN4550-Q1 provides CAN FD transceiver functionality: differential transmit capability to the bus and differential receive capability from the bus. The device includes many protection features providing device and CAN bus robustness. The device can also wake up via remote wake up using the CAN bus implementing the ISO 11898-2:2016 Wake Up Pattern (WUP). Input/Output support for 3.3 V and 5 V microprocessors using the VIOpin for a seamless interface. The TCAN4550-Q1 has a Serial Peripheral Interface (SPI) that connects to a local microprocessor for the device configuration, transmission and reception of CAN frames. The SPI interface supports clock rates up to 18 MHz.
The CAN bus has two logical states during operation: recessive and dominant. See Figure 1
2
TCAN4550-Q1 Functional Safety-Manual
Copyright © 2019, Texas Instruments Incorporated
Submit Documentation Feedback
SLLU312–July 2019
Recessive Dominant Recessive
Time, t
Typical Bus Voltage
Normal Mode
Standby Mode (Low
Power)
CANL
CANH
V
diff
V
diff
www.ti.com
In the recessive bus state, the bus is biased to a common mode of about 2.5 V via the high resistance internal input resistors of the receiver of each node. Recessive is equivalent to logic high and is typically a differential voltage on the bus of almost 0 V. The recessive state is also the idle state.
In the dominant bus state, the bus is driven differentially by one or more drivers. Current flows through the termination resistors and generates a differential voltage on the bus. Dominant is equivalent to logic low and is a differential voltage on the bus greater than the minimum threshold for a CAN dominant. A dominant state overwrites the recessive state.
During arbitration, multiple CAN nodes may transmit a dominant bit at the same time. In this case the differential voltage of the bus may be greater than the differential voltage of a single driver.
Transceivers with low power Standby Mode have a third bus state where the bus terminals are weakly biased to ground via the high resistance internal resistors of the receiver. See Figure 1 and Figure 2.
Many of the pins can be configured for multiple purposes. Much of the parametric data is based on internal links like the TXD/RXD_INT which represent the TXD and RXD of a standalone CAN transceiver. The TCAN4550-Q1 has a test mode that maps these signals to an external pin in order to perform compliance testing on the transceiver (TXD/RXD_INT_PHY) and CAN controller (TXD/RXD_INT_CAN) independently.
Product Overview
Figure 1. CAN Bus States
SLLU312–July 2019
Submit Documentation Feedback
Copyright © 2019, Texas Instruments Incorporated
TCAN4550-Q1 Functional Safety-Manual
3
VSUP
VCCOUT
WAKEINH
RST
Crystal Osc
OSCIN
OSCOUT
INH
CTRL
CANH
CANL
RCVR
DRIVER
WUP RCVR
WUP/LUP
LOGIC
+ 32-Bit register
Comparator + analog
filter
WU
Clock from crystal osc/oscin
VCCOUT
Powerup
V3P6INT_SLEEP
V1P5INT_SLEEP
BG_1P25
ISRC_10U
V5INT
1.5V LDO
FLTR
WAKE
ISRC_10U
BG_1P25
V1P5INT
V1P5INT
V1P5INT_SLEEP
VCCOUT
VCCOUT
V3P6INT_SLEEP
VIO1
V1P5INT
WKRQ_nINT
CLKOUT/GPO1
SCLK
NCS
MOSI MISO
NINT
Digital CORE
+
SRAM
GPO2
GND
VIO1
V5INT
Power and Control
CAN Transceiver and ControlSPI, M_CAN and Memory
Product Overview

3.1 Block Diagram

The TCAN4550-Q1 is a mixed signal device containing both analog and digital cores. The device integrates the Bosch M_CAN revision 3.2.1.1 controller which is not covered in this document. Figure 2 and Figure 3 are the high level mixed signal and digital core functional block diagrams. CCLK is internally connected to the crystal/CLKIN.
www.ti.com
4
Figure 2. TCAN4550-Q1 Mixed Signal Functional Block Diagram
TCAN4550-Q1 Functional Safety-Manual
Copyright © 2019, Texas Instruments Incorporated
Submit Documentation Feedback
SLLU312–July 2019
Main_core
mcan_core
supporting
blocks (arbiter, time stamp, driver
etc)
SPI
ECC
Controller
core
MCAN controller
Crystal
CCLK
Message
RAM
Watchdog
Register Map/
Interrupt
Logic
INH, Device Modes
FSM
Internal
Osc
SPI
High Power
(Standby/
Normal)
CAN transceiver logic, DTO
timer, bus
biasing
DFT
clock
WAKE
logic
Bus
biasing,
t
SILENT
timer
Sleep_core
DFT
www.ti.com
Product Overview
Figure 3. Digital Core Block Diagram and Clock Tree

3.2 Target Applications

The TCAN4550-Q1 is targeted at general-purpose automotive applications. Examples of these types of applications include but are not limited to the applications that follow:
General purpose applications where processor does not support CAN FD. See Figure 4
CAN FD port expander
Figure 5 provides potential failure points that have diagnostic or test ability mechanisms. See Table 1 for
each potential failure point and subsection discussing this failure point.
SLLU312–July 2019
Submit Documentation Feedback
Copyright © 2019, Texas Instruments Incorporated
TCAN4550-Q1 Functional Safety-Manual
5
LM53635
Buck
3.3V, 3A
TPS57140
Buck
5V, 1.5A
TPS65917
PMIC
Processor
Without
CAN-FD Controller
Load SW
TPS22965
DDR3 Mem
TCAN4550
V
BAT
SPI
GPIO
3.3 V
12 V to 18 V
V
SUP
V
IO
INH
EN
EN
3.3 V
OSC1
WD
M_CAN
CAN-FD
Controller
Filters
100
WAKE
33k
3.3 V
2-wire
CAN
bus
Optional:
Terminating
Node
Filtering,
Transient and
ESD
5 V
3k
CANH
CANL
10 µF
300 nF
GND
GND
22
nF
GND
V
CCOUT
FLTR
Add Decoupling Caps for All
Power
Connections
10
11
12
15 17
18
16
1
40 MHz
OSC2
20
1
4
3
2
5
6
RST
7
8
9
LM53635
Buck
3.3V, 3A
TPS57140
Buck
5V, 1.5A
TPS65917
PMIC
Processor
Without
CAN-FD Controller
Load SW
TPS22965
DDR3 Mem
TCAN4550RGY-Q1
V
BAT
SPI
GPIO
3.3 V
12 V to 18 V
V
SUP
V
IO
INH
EN
EN
3.3 V
Many V
OSC1
WD
CAN-FD
Controller
Filters
100
WAKE
33k
3.3 V
2-wire
CAN
bus
Optional:
Terminating
Node
Filtering,
Transient and
ESD
5 V
3k
CANH
CANL
10 µF
300 nF
GND
GND
22
nF
GND
V
CCOUT
FLTR
Add Decoupling Caps for All
Power
Connections
10
11
12
15 17
18
16
1
40 MHz
OSC2
20
RST
Product Overview
www.ti.com
6
TCAN4550-Q1 Functional Safety-Manual
Figure 4. General Purpose Application
Figure 5. Potential Failure Points
Copyright © 2019, Texas Instruments Incorporated
Submit Documentation Feedback
SLLU312–July 2019
www.ti.com
Table 1. Potential Failure Points and Section Figure 5
Potential
Failure
Point
from
Potential
Failure Point
Description
Section
Figure 5
Loss of clock
1
input
See Section 3.2.1.2 and Section 3.2.1.3
2 CAN bus See Section 3.2.1.3, Section 3.2.1.4, Section 3.2.1.5 and Section 3.2.1.6.5 3 Watchdog See Section 3.2.1.6.2
SPI/Processor
4
communication 5 Loss of V 6 Loss of V
See Section 3.2.1.6.1, Section 3.2.1.2, Section 3.2.1.3, Section 3.2.1.6.2, Section 3.2.1.6.3 and
Section 3.2.1.6.5
See Section 3.2.1.2, Section 3.2.1.3 and Section 3.2.1.6.5
SUP
See Section 3.2.1.2, Section 3.2.1.3 and Section 3.2.1.6.5
IO
7 RST pin failure See Section 3.2.1.6.3 and Section 3.2.1.6.4
M_CAN
8
Controller 9 Loss of V
See Section 3.2.1.5 and Section 3.2.1.6.5 See Section 3.2.1.3, Section 3.2.1.4 and Section 3.2.1.6.5
CCOUT
Table 2. Safety-Mechanisms
Product Overview
Safety-Mechanism
#
SM-01
SM-02 UV
SM-03 UV
SM-04 UV
Sleep Wake Error Timer (SWE)t
Name Description Safety-Manual Section
Timer used for inactivity of expected functions.
INACTIVE
SUP
IO
CCOUT
Puts the device into Sleep mode V
undervoltage detection and Interrupt
SUP
16'h0820[22] VIOundervoltage detection and Interrupt
16'h820[21] V
undervoltage detection and Interrupt
CCOUT
16'h0820[22] SM-05 TSD Thermal Shutdown and Interrupt 16'h0820[19] 3.2.1.4 SM-06 IOS CAN bus short circuit current limiter 3.2.1.5 SM-07 SPI & M_CAN Test Mode Test Mode 3.2.1.5
SM-08
SM-09
SM-10
SPI & M_CAN Loop Back Test Mode 1
SPI & M_CAN Loop Back Test Mode 2
CAN Transceiver Test Mode
Test Mode 3.2.1.5
Test Mode 3.2.1.5
Test Mode 3.2.1.5
Protocol Error in Data Phase; 16'h1050[28] points SM-11 PED interrupt
to 16'h1044[10:8] DLEC[2:0]; Data Phase Last
Error Code SM-12 PEA interrupt
SM-13 BEU interrupt
Protocol Error in Arbitration Phase; 16'h1050[27]
points to 16'h1044[2:0] LEC[2:0]; Last Error Code
Bit Error Uncorrected; 16'h1050[21] Message
RAM bit error detected, uncorrected SM-14 Scratchpad write/read 3.2.1.6.1.1 SM-15 SPIERR flag SPI error detection and Interrupt 16'h0820[3] 3.2.1.6.1.2
SM-16
M_CAN forced dominant
and recessive SM-17 SPI and FIFO TX and RX event FIFO 3.2.1.6.1.4 SM-18 ECC for Memory ECCERR detection and Interrupt 16'h0820[16] 3.2.1.6.1.5 SM-19 Timeout Watchdog WDTO detection and Interrupt 16'h0820[18] 3.2.1.6.2 SM-20 SCLK internal pull-up Floating pins 3.2.1.6.3 SM-21 SDI internal pull-up Floating pins 3.2.1.6.3
3.2.1.2
3.2.1.3
3.2.1.3
3.2.1.3
3.2.1.5 .1
3.2.1.5 .1
3.2.1.5 .1
3.2.1.6.1.3
SLLU312–July 2019
Submit Documentation Feedback
Copyright © 2019, Texas Instruments Incorporated
TCAN4550-Q1 Functional Safety-Manual
7
Loading...
+ 15 hidden pages