ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), and
Thin Shrink Small-Outline (PW) Packages
description
DB, DGV, DW, OR PW PACKAGE
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
(TOP VIEW)
20
1
19
2
18
3
17
4
16
5
15
6
14
7
13
8
12
9
11
10
V
CC
2OE
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
This octal buffer/driver is designed for 1.65-V to 3.6-V VCC operation.
The SN74L VC240A is designed specifically to improve the performance and density of 3-state memory address
drivers, clock drivers, and bus-oriented receivers and transmitters.
This device is organized as two 4-bit buffers/drivers with separate output-enable (OE
) inputs. When OE is low,
the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the
high-impedance state.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
This device is fully specified for partial-power-down applications using I
off
. The I
circuitry disables the outputs,
off
preventing damaging current backflow through the device when it is powered down.
The SN74LVC240A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each 4-bit buffer)
INPUTS
OEA
LHL
LLH
HXZ
OUTPUT
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
SN74LVC240A
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCAS293G – JANUARY 1993 – REVISED MARCH 2000
1
2
4
6
8
19
11
13
15
17
†
EN
18
16
14
12
EN
9
7
5
3
logic symbol
1OE
1A1
1A2
1A3
1A4
2OE
2A1
2A2
2A3
2A4
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
logic diagram (positive logic)
1Y1
1Y2
1Y3
1Y4
2Y1
2Y2
2Y3
2Y4
1OE
2OE
1A1
1A2
1A3
1A4
2A1
2A2
1
2
4
6
8
19
11
13
18
16
14
12
1Y1
1Y2
1Y3
1Y4
9
2Y1
7
2Y2
2A3
2A4
15
17
5
2Y3
3
2Y4
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
VCCSuppl
oltage
V
VOOutput voltage
V
IOHHigh-level output current
mA
IOLLow-level output current
mA
SN74LVC240A
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCAS293G – JANUARY 1993 – REVISED MARCH 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The value of VCC is provided in the recommended operating conditions table.
3. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
High-level input voltage
IH
Low-level input voltage
IL
Input voltage05.5V
I
p
p
p
Operating free-air temperature–4085°C
A
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
Operating1.653.6
Data retention only1.5
VCC = 1.65 V to 1.95 V0.65 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V2
VCC = 1.65 V to 1.95 V0.35 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V0.8
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONS
IOH = –100 µA1.65 V to 3.6 V VCC–0.2
IOH = –4 mA1.65 V1.2
OH
V
OL
I
I
I
off
I
OZ
CC
∆I
CC
C
i
C
o
†
All typical values are at VCC = 3.3 V, TA = 25°C.
‡
This applies in the disabled state only.
IOH = –8 mA2.3 V1.7
= –12
OH
IOH = –24 mA3 V2.2
IOL = 100 µA1.65 V to 3.6 V0.2
IOL = 4 mA1.65 V0.45
IOL = 8 mA2.3 V0.7
IOL = 12 mA2.7 V0.4
IOL = 24 mA3 V0.55
VI = 0 to 5.5 V3.6 V±5µA
VI or VO = 5.5 V0±10µA
VO = 0 to 5.5 V3.6 V±10µA
VI = VCC or GND
3.6 V ≤ VI ≤ 5.5 V
One input at VCC – 0.6 V,Other inputs at VCC or GND2.7 V to 3.6 V500µA
VI = VCC or GND3.3 V4pF
VO = VCC or GND3.3 V5.5pF
‡
V
CC
2.7 V2.2
3 V2.4
=
O
MINTYP†MAXUNIT
V
10
µ
10
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
VCC = 1.8 V
± 0.15 V
MINMAXMINMAXMINMAXMINMAX
§§§§
§§§§
§§§§
= 10 MHz
p
FROM
AY
OE
OE
= 25°C
A
PARAMETER
p
PARAMETER
t
pd
t
en
t
dis
¶
t
sk(o)
§
This information was not available at the time of publication.
¶
Skew between any two outputs of the same package switching in the same direction
operating characteristics, T
p
§
This information was not available at the time of publication.
TO
Y
Y
Outputs enabled
Outputs disabled
TEST
VCC = 2.5 V
± 0.2 V
VCC = 1.8 V
± 0.15 V
TYPTYPTYP
VCC = 2.7 V
VCC = 2.5 V
± 0.2 V
§§
§§
VCC = 3.3 V
± 0.3 V
7.51.36.5ns
91.18ns
81.47ns
VCC = 3.3 V
± 0.3 V
32
3
UNIT
1ns
UNIT
p
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 30 pF
(see Note A)
SCAS293G – JANUARY 1993 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
= 1.8 V ± 0.15 V
V
CC
2 × V
Open
GND
CC
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
1k Ω
1k Ω
S1
SN74LVC240A
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
Open
2 × V
CC
GND
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN74LVC240A
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCAS293G – JANUARY 1993 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 30 pF
(see Note A)
500 Ω
500 Ω
S1
= 2.5 V ± 0.2 V
V
CC
2 × V
CC
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
SCAS293G – JANUARY 1993 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
= 2.7 V AND 3.3 V ± 0.3 V
V
CC
6 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
SN74LVC240A
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
Open
6 V
GND
Timing
Input
Input
Input
Output
Data
t
PLH
LOAD CIRCUIT
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
h
t
1.5 V
PHL
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
OH
V
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
.
Figure 3. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
Customers are responsible for their applications using TI components.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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