ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Package Options Include Plastic Shrink
Small-Outline (DL), Thin Shrink
Small-Outline (DGG), and Thin Very
Small-Outline (DGV) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
description
The ’AHC16244 devices are 16-bit buffers and
line drivers designed specifically to improve the
performance and density of 3-state memory
address drivers, clock drivers, and bus-oriented
receivers and transmitters.
SN54AHC16244 . . . WD PACKAGE
SN74AHC16244 . . . DGG, DGV, OR DL PACKAGE
1OE
1Y1
1Y2
GND
1Y3
1Y4
V
CC
2Y1
2Y2
GND
2Y3
2Y4
3Y1
3Y2
GND
3Y3
3Y4
V
CC
4Y1
4Y2
GND
4Y3
4Y4
4OE
(TOP VIEW)
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17
32
18
31
19
30
20
29
21
28
22
27
23
26
24
25
2OE
1A1
1A2
GND
1A3
1A4
V
CC
2A1
2A2
GND
2A3
2A4
3A1
3A2
GND
3A3
3A4
V
CC
4A1
4A2
GND
4A3
4A4
3OE
These devices can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer . They provide true outputs
and symmetrical active-low output-enable (OE) inputs.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The SN54AHC16244 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHC16244 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each 4-bit buffer/driver)
INPUTS
OE
LHH
LLL
HXZ
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
OUTPUT
A
Y
Copyright 2000, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54AHC16244, SN74AHC16244
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.
VI = VCC or GND0 V to 5.5 V±0.1±1*±1
VO = VCC or GND,
VI (OE
) = VIL or V
VI = VCC or GND,IO = 05.5 V44040
VI = VCC or GND5 V21010pF
VO = VCC or GND5 V3.5pF
IH
3 V2.932.92.9
4.5 V4.44.54.44.4
2 V0.10.10.1
3 V0.10.10.1
4.5 V0.10.10.1
5.5 V±0.25±2.5±2.5
TA = 25°CSN54AHC16244 SN74AHC16244
MINTYPMAXMINMAXMINMAX
V
V
m
A
m
A
m
A
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
UNIT
AYC
15 pF
ns
OE
Y
C
15 pF
ns
OE
Y
C
pF
ns
AYC
50 pF
ns
OE
Y
C
50 pF
ns
OE
Y
C
pF
ns
PARAMETER
UNIT
AYC
pF
ns
OE
Y
C
15 pF
ns
OE
Y
C
pF
ns
AYC
pF
ns
OE
Y
C
50 pF
ns
OE
Y
C
pF
ns
SN54AHC16244, SN74AHC16244
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCLS327G – MARCH 1996 – REVISED JANUARY 2000
switching characteristics over recommended operating free-air temperature range,
V
= 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 1)
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
switching characteristics over recommended operating free-air temperature range,
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54AHC16244, SN74AHC16244
PARAMETER
UNIT
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCLS327G – MARCH 1996 – REVISED JANUARY 2000
noise characteristics, V
V
OL(P)
V
OL(V)
V
OH(V)
V
IH(D)
V
IL(D)
NOTE 4: Characteristics are for surface-mount packages only.
Quiet output, maximum dynamic V
Quiet output, minimum dynamic V
Quiet output, minimum dynamic V
High-level dynamic input voltage3.5V
Low-level dynamic input voltage1.5V
operating characteristics, V
C
Power dissipation capacitanceNo load,f = 1 MHz10.5pF
pd
= 5 V, CL = 50 pF, TA = 25°C (see Note 4)
CC
OL
OL
OH
= 5 V, TA = 25°C
CC
PARAMETERTEST CONDITIONSTYPUNIT
SN74AHC16244
MINTYPMAX
0.5V
–0.2V
4.8V
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN54AHC16244, SN74AHC16244
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCLS327G – MARCH 1996 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
V
Test
Point
C
L
From Output
Under Test
(see Note A)
C
L
RL = 1 kΩ
S1
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open Drain
Open
V
CC
GND
V
CC
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
Input
VOLTAGE WAVEFORMS
Input
t
PLH
In-Phase
Output
t
PHL
Out-of-Phase
Output
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
t
w
50% V
CC
PULSE DURATION
50% V
CC
50% V
50% V
3-STATE AND OPEN-DRAIN OUTPUTS
50% V
50% V
CC
CC
LOAD CIRCUIT FOR
V
CC
CC
0 V
V
CC
CC
0 V
t
PHL
V
t
PLH
CC
V
V
CC
V
OH
OL
OH
OL
50% V
50% V
Timing Input
(see Note B)
(see Note B)
Data Input
Output
Control
Output
Waveform 1
S1 at V
CC
Output
Waveform 2
S1 at GND
50% V
CC
t
CC
CC
h
50% V
50% V
VOL + 0.3 V
VOH – 0.3 V
CC
t
t
CC
PLZ
PHZ
t
su
50% V
CC
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
50% V
CC
t
PZL
50% V
t
PZH
50% V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
V
CC
0 V
V
CC
0 V
V
CC
0 V
≈V
V
OL
V
OH
≈0 V
CC
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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