3-State Inverting Outputs Drive Bus Lines
Directly
D
Full Parallel Access for Loading
D
EPIC
(Enhanced-Performance Implanted
CMOS) 1-µm Process
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW),
Ceramic Chip Carriers (FK) and
Flatpacks (W), and Standard Plastic (N) and
Ceramic (J) DIPs
description
The ’AC533 are octal transparent D-type latches
with 3-state outputs. When the latch-enable (LE)
input is high, the Q outputs follow the
complements of the data (D) inputs. When LE is
taken low, the Q
logic levels set up at the D inputs.
A buffered output-enable (OE) input can be used
to place the eight outputs in either a normal logic
state (high or low logic levels) or a highimpedance state. In the high-impedance state,
the outputs neither load nor drive the bus lines
significantly. The high-impedance state and
increased drive provide the capability to drive bus
lines without need for interface or pullup
components.
outputs are latched at the inverse
SN54AC533 ...J OR W PACKAGE
SN74AC533 . . . DB, DW, N, OR PW P ACKAGE
SN54AC533 ...FK PACKAGE
2D
2Q
3Q
3D
4D
(TOP VIEW)
OE
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
(TOP VIEW)
1D1QOE
3212019
4
5
6
7
8
9
1
20
2
19
3
18
4
17
5
16
6
15
7
14
8
13
9
12
10
11
V
10 11 12 13
LE
4Q
CC
5Q
V
8Q
8D
7D
7Q
6Q
6D
5D
5Q
LE
8Q
18
17
16
15
14
5D
CC
8D
7D
7Q
6Q
6D
GND
OE
does not affect the internal operations of the latches. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
The SN54AC533 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74AC533 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each latch)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
INPUTS
OELED
LHHL
LHL H
LLX Q
HXXZ
OUTPUT
Q
0
Copyright 1996, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54AC533, SN74AC533
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCAS555A – NOVEMBER 1995 – REVISED MA Y 1996
1
11
3
4
7
8
13
14
17
18
†
EN
C1
12
15
16
19
2
1Q
5
2Q
6
3Q
9
4Q
5Q
6Q
7Q
8Q
1D
1
logic diagram (positive logic)
1
OE
11
LE
C1
1D
3
To Seven Other Channels
1D
2
1Q
logic symbol
OE
LE
1D
2D
3D
4D
5D
6D
7D
8D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Maximum power dissipation at TA = 55°C (in still air) (see Note 2): DB package 0.6 W. . . . . . . . . . . . . . . . . . .
Storage temperature range, T
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils,
except for the N package, which has a trace length of zero.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
TA = 25°CSN54AC533SN74AC533
MINTYPMAXMINMAXMINMAX
I
I
I
C
OH
OL
OZ
I
CC
i
CC
3 V2.92.92.9
IOH = –50 µA
IOH = –12 mA3 V2.562.42.46
= –24
OH
IOL = 50 µA
IOL = 12 mA3 V0.360.50.44
= 24
OL
VO = VCC or GND5.5 V±0.25±5±2.5µA
VI = VCC or GND5.5 V±0.1±1±1µA
VI = VCC or GND,IO = 05.5 V48040µA
VI = VCC or GND5 V4.5pF
4.5 V4.44.44.4
5.5 V5.45.45.4
4.5 V3.863.73.76
5.5 V4.864.74.76
3 V0.10.10.1
4.5 V0.10.10.1
5.5 V0.10.10.1
4.5 V0.360.50.44
5.5 V0.360.50.44
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54AC533, SN74AC533
UNIT
UNIT
PARAMETER
UNIT
D
Q
ns
LE
Q
ns
OE
Q
ns
OE
Q
ns
PARAMETER
UNIT
D
Q
ns
LE
Q
ns
OE
Q
ns
OE
Q
ns
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCAS555A – NOVEMBER 1995 – REVISED MA Y 1996
timing requirements over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54AC533SN74AC533
MINMAXMINMAXMINMAX
t
Pulse duration, LE high686.5ns
w
t
Setup time, data before LE↓5.57.56ns
su
t
Hold time, data after LE↓1.52.51ns
h
timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54AC533SN74AC533
MINMAXMINMAXMINMAX
t
Pulse duration, LE high4.56.55ns
w
t
Setup time, data before LE↓464.5ns
su
t
Hold time, data after LE↓1.52.51ns
h
switching characteristics over recommended operating free-air temperature range,
= 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 1)
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
Power dissipation capacitanceCL = 50 pF, f = 1 MHz40pF
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
Input
PARAMETER MEASUREMENT INFORMATION
500 Ω
500 Ω
LOAD CIRCUIT
t
w
50% V
CC
VOLTAGE WAVEFORMS
S1
50% V
CC
2 × V
V
CC
0 V
CC
Open
SN54AC533, SN74AC533
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCAS555A – NOVEMBER 1995 – REVISED MA Y 1996
TESTS1
Timing Input
Data Input
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
t
su
50% V
VOLTAGE WAVEFORMS
50% V
CC
Open
2 × V
Open
CC
CC
t
h
50% V
CC
V
0 V
V
0 V
CC
CC
50% V
Input
t
PLH
In-Phase
Output
t
Out-of-Phase
Output
NOTES: A. CL includes probe and jig capacitance.
PHL
VOLTAGE WAVEFORMS
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one input transition per measurement.
CC
50% V
50% V
50% V
CC
CC
Figure 1. Load Circuit and Voltage Waveforms
CC
t
PHL
50% V
t
PLH
50% V
CC
CC
V
0 V
V
V
V
V
CC
OH
OL
OH
OL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
CC
t
PZL
t
50% V
50% V
PZH
50% V
VOLTAGE WAVEFORMS
CC
t
PLZ
t
PHZ
CC
CC
50% V
CC
VOL + 0.3 V
VOH – 0.3 V
V
0 V
[
V
V
[
CC
V
OL
OH
0 V
CC
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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