Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input
positive-NOR gates. They perform the Boolean
functions Y = A + B
The SN54ALS02A and SN54AS02 are
characterized for operation over the full military
temperature range of –55°C to 125°C. The
SN74ALS02A and SN74AS02 are characterized
for operation from 0°C to 70°C.
or Y = A • B in positive logic.
FUNCTION TABLE
(each gate)
INPUTS
AB
HXL
XHL
LLH
OUTPUT
Y
SN54ALS02A, SN54AS02 ...J PACKAGE
SN74ALS02A, SN74AS02 ...D OR N PACKAGE
SN54ALS02A, SN54AS02 . . . FK PACKAGE
1B
NC
2Y
NC
2A
NC – No internal connection
(TOP VIEW)
1Y
1
1A
2
1B
3
2Y
4
2A
5
2B
6
GND
7
(TOP VIEW)
1A1YNC
3212019
4
5
6
7
8
910111213
2B
NC
GND
14
13
12
11
10
V
CC
4Y
4B
4A
3Y
3B
9
3A
8
CC
V
4Y
4B
18
NC
17
4A
16
NC
15
3Y
14
3A
3B
2
3
5
6
8
9
11
12
†
≥1
1
4
10
13
logic symbol
1A
1B
2A
2B
3A
3B
4A
4B
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
logic diagram (positive logic)
2
1Y
2Y
3Y
4Y
1A
1B
2A
2B
3A
3B
4A
4B
3
5
6
8
9
11
12
10
13
1
1Y
4
2Y
3Y
4Y
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1994, Texas Instruments Incorporated
1
SN54ALS02A, SN54AS02, SN74ALS02A, SN74AS02
UNIT
VILLow-level input voltage
V
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SDAS111B – APRIL 1982 – REVISED DECEMBER 1994
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage, V
Operating free-air temperature range, T
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.