•Serial Onboard Programming, No External
Programming Voltage Needed, Programmable
Code Protection by Security Fuse
•Bootstrap Loader
•On-Chip Emulation Module
•Family Members Include:
– MSP430F2232
– 8KB + 256B Flash Memory
– 16KB + 256B Flash Memory
– 512B RAM
– MSP430F2272
– 32KB + 256B Flash Memory
– 1KB RAM
– MSP430F2234
– 8KB + 256B Flash Memory
– 512B RAM
– MSP430F2254
– 16KB + 256B Flash Memory
– 512B RAM
– MSP430F2274
– 32KB + 256B Flash Memory
– 1KB RAM
•Available in a 38-Pin Thin Shrink Small-Outline
Package (TSSOP) (DA), 40-Pin QFN Package
(RHA), and 49-Pin Ball Grid Array Package
(YFF) (See Table 1)
•For Complete Module Descriptions, See the
MSP430x2xx Family User's Guide (SLAU144)
SLAS504G –JULY 2006–REVISED AUGUST 2012
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2MSP430 is a trademark of Texas Instruments.
3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
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DESCRIPTION
The Texas Instruments MSP430™ family of ultra-low-power microcontrollers consist of several devices featuring
different sets of peripherals targeted for various applications. The architecture, combined with five low-power
modes is optimized to achieve extended battery life in portable measurement applications. The device features a
powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to maximum code efficiency.
The digitally controlled oscillator (DCO) allows wake-up from low-power modes to active mode in less than 1 µs.
The MSP430F22x4/MSP430F22x2 series is an ultra-low-power mixed signal microcontroller with two built-in 16bit timers, a universal serial communication interface, 10-bit A/D converter with integrated reference and data
transfer controller (DTC), two general-purpose operational amplifiers in the MSP430F22x4 devices, and 32 I/O
pins.
Typical applications include sensor systems that capture analog signals, convert them to digital values, and then
process the data for display or for transmission to a host system. Stand-alone radio-frequency (RF) sensor front
ends are another area of application.
Table 1. Available Options
PACKAGED DEVICES
T
A
-40°C to 85°C
-40°C to 105°C
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
All MSP430™ microcontrollers include an Embedded Emulation Module (EEM) that allows advanced debugging
and programming through easy-to-use development tools. Recommended hardware options include:
ADC10, conversion clock
General-purpose digital I/O pin
BSL transmit
General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: OUT1 output
General-purpose digital I/O pin
Timer_A, capture: CCI2A input, compare: OUT2 output
General-purpose digital I/O pin
Test Clock input for device programming and test
General-purpose digital I/O pin
Test Mode Select input for device programming and test
General-purpose digital I/O pin
Test Data Input or Test Clock Input for programming and test
General-purpose digital I/O pin
D23836I/OTimer_A, compare: OUT2 output
Test Data Output or Test Data Input for programming and test
General-purpose digital I/O pin
ADC10, analog input A0
General-purpose digital I/O pin
Timer_A, clock signal at INCLK
SMCLK signal output
ADC10, analog input A1
General-purpose digital I/O pin
ADC10, analog input A2
General-purpose digital I/O pin
F32927I/O
G33028I/O
C2340I/O
Timer_A, capture CCI1B input, compare: OUT1 output
ADC10, analog input A3
Negative reference voltage input
General-purpose digital I/O pin
Timer_A, compare: OUT2 output
ADC10, analog input A4
Positive reference voltage output or input
General-purpose digital I/O pin
Input for external DCO resistor to define DCO frequency
Input terminal of crystal oscillator
General-purpose digital I/O pin
QFN PadNANAPadNAQFN package pad; connection to DVSSrecommended.
YFFDARHA
E4, E5
NO.I/ODESCRIPTION
General-purpose digital I/O pin
Timer_B, clock signal TBCLK input
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is
connected to TEST.
Spy-Bi-Wire test clock input during programming and test
ADC10, conversion clock
General-purpose digital I/O pin
BSL transmit
General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: OUT1 output
General-purpose digital I/O pin
Timer_A, capture: CCI2A input, compare: OUT2 output
General-purpose digital I/O pin
Test Clock input for device programming and test
General-purpose digital I/O pin
Test Mode Select input for device programming and test
General-purpose digital I/O pin
Test Data Input or Test Clock Input for programming and test
General-purpose digital I/O pin
D23836I/OTimer_A, compare: OUT2 output
Test Data Output or Test Data Input for programming and test
General-purpose digital I/O pin
ACLK output
ADC10, analog input A0
OA0, analog input IO
General-purpose digital I/O pin
Timer_A, clock signal at INCLK
B497I/OSMCLK signal output
ADC10, analog input A1
OA0, analog output
General-purpose digital I/O pin
Timer_A, capture: CCI0B input/BSL receive, compare: OUT0 output
ADC10, analog input A2
OA0, analog input I1
General-purpose digital I/O pin
Timer_A, capture CCI1B input, compare: OUT1 output
F32927I/O
ADC10, analog input A3
Negative reference voltage input
OA1, analog input I1
OA1, analog output
General-purpose digital I/O pin
Timer_A, compare: OUT2 output
G33028I/OADC10, analog input A4
Positive reference voltage output or input
OA1, analog input I/O
C2340I/O
B5119I/O
A61210I/OUSCI_B0 SPI mode: slave in/master out
G62523I/OUSCI_A0 UART mode: transmit data output
G52624I/OUSCI_A0 UART mode: receive data input
General-purpose digital I/O pin
Input for external DCO resistor to define DCO frequency
Input terminal of crystal oscillator
General-purpose digital I/O pin
Output terminal of crystal oscillator
General-purpose digital I/O pin
General-purpose digital I/O pin
USCI_B0 slave transmit enable
USCI_A0 clock input/output
ADC10, analog input A5
General-purpose digital I/O pin
USCI_B0 I2C mode: SDA I2C data
General-purpose digital I/O pin
USCI_B0 I2C mode: SCL I2C clock
General-purpose digital I/O pin
USCI_A0 slave transmit enable
General-purpose digital I/O pin
USCI_A0 SPI mode: slave in/master out
General-purpose digital I/O pin
USCI_A0 SPI mode: slave out/master in
General-purpose digital I/O pin
OA0 analog input I2
General-purpose digital I/O pin
OA1 analog input I2
General-purpose digital I/O pin
Timer_B, capture: CCI0A input, compare: OUT0 output
General-purpose digital I/O pin
Timer_B, capture: CCI1A input, compare: OUT1 output
General-purpose digital I/O pin
Timer_B, capture: CCI2A input, compare: OUT2 output
(2)
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(2) If XOUT/P2.7 is used as an input, excess current flows until P2SEL.7 is cleared. This is due to the oscillator output driver connection to
QFN PadNANAPadNAQFN package pad; connection to DVSSrecommended.
YFFDARHA
E4, E5
NO.I/ODESCRIPTION
General-purpose digital I/O pin
Timer_B, capture: CCI0B input, compare: OUT0 output
ADC10 analog input A12
OA0 analog output
General-purpose digital I/O pin
Timer_B, capture: CCI1B input, compare: OUT1 output
ADC10 analog input A13
OA1 analog output
General-purpose digital I/O pin
Timer_B, compare: OUT2 output
ADC10 analog input A14
OA0 analog input I3
General-purpose digital I/O pin
Timer_B, switch all TB0 to TB3 outputs to high impedance
ADC10 analog input A15
OA1 analog input I3
General-purpose digital I/O pin
Timer_B, clock signal TBCLK input
Reset or nonmaskable interrupt input
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is
connected to TEST.
Spy-Bi-Wire test clock input during programming and test
The MSP430™ CPU has a 16-bit RISC architecture
that is highly transparent to the application. All
operations, other than program-flow instructions, are
performed as register operations in conjunction with
seven addressing modes for source operand and four
addressing modes for destination operand.
The CPU is integrated with 16 registers that provide
reduced instruction execution time. The register-toregister operation execution time is one cycle of the
CPU clock.
Four of the registers, R0 to R3, are dedicated as
program counter, stack pointer, status register, and
constantgeneratorrespectively.Theremaining
registers are general-purpose registers.
Peripherals are connected to the CPU using data,
address, and control buses and can be handled with
all instructions.
Instruction Set
The instruction set consists of 51 instructions with
three formats and seven address modes. Each
instruction can operate on word and byte data.
Table 5 shows examples of the three types of
instruction formats; Table 6 shows the address
modes.
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Dual operands, source-destinationADD R4,R5R4 + R5 → R5
Single operands, destination onlyCALL R8PC → (TOS), R8 → PC
Relative jump, unconditional/conditionalJNEJump-on-equal bit = 0
The MSP430 microcontrollers have one active mode and five software-selectable low-power modes of operation.
An interrupt event can wake up the device from any of the five low-power modes, service the request, and
restore back to the low-power mode on return from the interrupt program.
The following six operating modes can be configured by software:
•Active mode (AM)
– All clocks are active.
•Low-power mode 0 (LPM0)
– CPU is disabled.
– ACLK and SMCLK remain active. MCLK is disabled.
•Low-power mode 1 (LPM1)
– CPU is disabled ACLK and SMCLK remain active. MCLK is disabled.
– DCO dc-generator is disabled if DCO not used in active mode.
•Low-power mode 2 (LPM2)
– CPU is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator remains enabled.
– ACLK remains active.
•Low-power mode 3 (LPM3)
– CPU is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator is disabled.
– ACLK remains active.
•Low-power mode 4 (LPM4)
– CPU is disabled.
– ACLK is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator is disabled.
– Crystal oscillator is stopped.
The interrupt vectors and the power-up starting address are located in the address range of 0FFFFh to 0FFC0h.
The vector contains the 16-bit address of the appropriate interrupt handler instruction sequence.
If the reset vector (located at address 0FFFEh) contains 0FFFFh (for example, if flash is not programmed), the
CPU goes into LPM4 immediately after power up.
(1) A reset is generated if the CPU tries to fetch instructions from within the module register memory address range (0h to 01FFh) or from
within unused address range.
(2) Multiple source flags
(3) (non)-maskable: the individual interrupt-enable bit can disable an interrupt event, but the general interrupt enable cannot.
Nonmaskable: neither the individual nor the general interrupt-enable bit will disable an interrupt event.
(4) Interrupt flags are located in the module.
(5) This location is used as bootstrap loader security key (BSLSKEY).
A 0AA55h at this location disables the BSL completely.
A zero (0h) disables the erasure of the flash if an invalid password is supplied.
(6) The interrupt vectors at addresses 0FFDCh to 0FFC0h are not used in this device and can be used for regular program code if
Most interrupt and module enable bits are collected into the lowest address space. Special function register bits
not allocated to a functional purpose are not physically present in the device. Simple software access is provided
with this arrangement.
Legend
rwBit can be read and written.
rw-0, 1Bit can be read and written. It is Reset or Set by PUC.
rw-(0), (1)Bit can be read and written. It is Reset or Set by POR.
SFR bit is not present in device.
Table 8. Interrupt Enable 1
Address76543210
00hACCVIENMIIEOFIEWDTIE
rw-0rw-0rw-0rw-0
WDTIEWatchdog timer interrupt enable. Inactive if watchdog mode is selected. Active if watchdog timer is configured in interval
WDTIFGSet on watchdog timer overflow (in watchdog mode) or security key violation.
Reset on VCCpower-up or a reset condition at RST/NMI pin in reset mode.
OFIFGFlag set on oscillator fault
RSTIFGExternal reset interrupt flag. Set on a reset condition at RST/NMI pin in reset mode. Reset on VCCpower up.
PORIFGPower-on reset interrupt flag. Set on VCCpower up.
NMIIFGSet via RST/NMI pin
Table 11. Interrupt Flag Register 2
Address76543210
03hUCB0TXIFG UCB0RXIFG UCA0TXIFG UCA0RXIFG
rw-1rw-0rw-1rw-0
UCA0RXIFGUSCI_A0 receive-interrupt flag
UCA0TXIFGUSCI_A0 transmit-interrupt flag
UCB0RXIFGUSCI_B0 receive-interrupt flag
UCB0TXIFGUSCI_B0 transmit-interrupt flag
The MSP430 bootstrap loader (BSL) enables users to program the flash memory or RAM using a UART serial
interface. Access to the MSP430 memory via the BSL is protected by user-defined password. For complete
description of the features of the BSL and its implementation, see the MSP430 Programming Via the BootstrapLoader User’s Guide (SLAU319).
The flash memory can be programmed via the JTAG port, the bootstrap loader, or in-system by the CPU. The
CPU can perform single-byte and single-word writes to the flash memory. Features of the flash memory include:
•Flash memory has n segments of main memory and four segments of information memory (A to D) of
64 bytes each. Each segment in main memory is 512 bytes in size.
•Segments 0 to n may be erased in one step, or each segment may be individually erased.
•Segments A to D can be erased individually, or as a group with segments 0 to n.
Segments A to D are also called information memory.
•Segment A contains calibration data. After reset, segment A is protected against programming and erasing. It
can be unlocked, but care should be taken not to erase this segment if the device-specific calibration data is
required.
Peripherals are connected to the CPU through data, address, and control buses and can be handled using all
instructions. For complete module descriptions, see the MSP430x2xx Family User's Guide (SLAU144).
Oscillator and System Clock
The clock system is supported by the basic clock module that includes support for a 32768-Hz watch crystal
oscillator, an internal very-low-power low-frequency oscillator, an internal digitally-controlled oscillator (DCO), and
a high-frequency crystal oscillator. The basic clock module is designed to meet the requirements of both low
system cost and low power consumption. The internal DCO provides a fast turn-on clock source and stabilizes in
less than 1 µs. The basic clock module provides the following clock signals:
•Auxiliary clock (ACLK), sourced from a 32768-Hz watch crystal, a high-frequency crystal, or the internal verylow-power LF oscillator.
•Main clock (MCLK), the system clock used by the CPU.
•Sub-Main clock (SMCLK), the sub-system clock used by the peripheral modules.
Table 14. DCO Calibration Data
(Provided From Factory in Flash Information Memory Segment A)
DCO FREQUENCYCALIBRATION REGISTERSIZEADDRESS
1 MHz
8 MHz
12 MHz
16 MHz
CALBC1_1MHZbyte010FFh
CALDCO_1MHZbyte010FEh
CALBC1_8MHZbyte010FDh
CALDCO_8MHZbyte010FCh
CALBC1_12MHZbyte010FBh
CALDCO_12MHZbyte010FAh
CALBC1_16MHZbyte010F9h
CALDCO_16MHZbyte010F8h
Brownout
The brownout circuit is implemented to provide the proper internal reset signal to the device during power on and
power off.
Digital I/O
There are four 8-bit I/O ports implemented—ports P1, P2, P3, and P4:
•All individual I/O bits are independently programmable.
•Any combination of input, output, and interrupt condition is possible.
•Edge-selectable interrupt input capability for all eight bits of port P1 and P2.
•Read/write access to port-control registers is supported by all instructions.
•Each I/O has an individually programmable pullup/pulldown resistor.
Because there are only three I/O pins implemented from port P2, bits [5:1] of all port P2 registers read as 0, and
write data is ignored.
Watchdog Timer (WDT+)
The primary function of the WDT+ module is to perform a controlled system restart after a software problem
occurs. If the selected time interval expires, a system reset is generated. If the watchdog function is not needed
in an application, the module can be disabled or configured as an interval timer and can generate interrupts at
selected time intervals.
Timer_A3 is a 16-bit timer/counter with three capture/compare registers. Timer_A3 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_A3 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
Table 15. Timer_A3 Signal Connections
INPUT PIN NUMBERDEVICEMODULEMODULEOUTPUT PIN NUMBER
Timer_B3 is a 16-bit timer/counter with three capture/compare registers. Timer_B3 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_B3 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
Table 16. Timer_B3 Signal Connections
INPUT PIN NUMBERDEVICEMODULEMODULEOUTPUT PIN NUMBER
The USCI module is used for serial data communication. The USCI module supports synchronous
communication protocols like SPI (3 or 4 pin), I2C and asynchronous communication protocols such as UART,
enhanced UART with automatic baudrate detection (LIN), and IrDA.
USCI_A0 provides support for SPI (3 or 4 pin), UART, enhanced UART, and IrDA.
USCI_B0 provides support for SPI (3 or 4 pin) and I2C.
ADC10
The ADC10 module supports fast, 10-bit analog-to-digital conversions. The module implements a 10-bit SAR
core, sample select control, reference generator and data transfer controller, or DTC, for automatic conversion
result handling allowing ADC samples to be converted and stored without any CPU intervention.
The MSP430F22x4 has two configurable low-current general-purpose operational amplifiers. Each OA input and
output terminal is software-selectable and offer a flexible choice of connections for various applications. The OA
op amps primarily support front-end analog signal conditioning prior to analog-to-digital conversion.
ADC memoryADC10MEM1B4h
ADC control register 1ADC10CTL11B2h
ADC control register 0ADC10CTL01B0h
ADC analog enable 0ADC10AE004Ah
ADC analog enable 1ADC10AE104Bh
ADC data transfer control register 1ADC10DTC1049h
ADC data transfer control register 0ADC10DTC0048h
OA1 (MSP430F22x4 only)Operational Amplifier 1 control register 1OA1CTL10C3h
Operational Amplifier 1 control register 1OA1CTL00C2h
OA0 (MSP430F22x4 only)Operational Amplifier 0 control register 1OA0CTL10C1h
Operational Amplifier 0 control register 1OA0CTL00C0h
USCI_B0USCI_B0 transmit bufferUCB0TXBUF06Fh
USCI_B0 receive bufferUCB0RXBUF06Eh
USCI_B0 statusUCB0STAT06Dh
USCI_B0 bit rate control 1UCB0BR106Bh
USCI_B0 bit rate control 0UCB0BR006Ah
USCI_B0 control 1UCB0CTL1069h
USCI_B0 control 0UCB0CTL0068h
USCI_B0 I2C slave addressUCB0SA011Ah
USCI_B0 I2C own addressUCB0OA0118h
USCI_A0USCI_A0 transmit bufferUCA0TXBUF067h
USCI_A0 receive bufferUCA0RXBUF066h
USCI_A0 statusUCA0STAT065h
USCI_A0 modulation controlUCA0MCTL064h
USCI_A0 baud rate control 1UCA0BR1063h
USCI_A0 baud rate control 0UCA0BR0062h
USCI_A0 control 1UCA0CTL1061h
USCI_A0 control 0UCA0CTL0060h
USCI_A0 IrDA receive controlUCA0IRRCTL05Fh
USCI_A0 IrDA transmit controlUCA0IRTCTL05Eh
USCI_A0 auto baud rate controlUCA0ABCTL05Dh
Basic Clock System+Basic clock system control 3BCSCTL3053h
Basic clock system control 2BCSCTL2058h
Basic clock system control 1BCSCTL1057h
DCO clock frequency controlDCOCTL056h
Port P4Port P4 resistor enableP4REN011h
Port P4 selectionP4SEL01Fh
Port P4 directionP4DIR01Eh
Port P4 outputP4OUT01Dh
Port P4 inputP4IN01Ch
Port P3Port P3 resistor enableP3REN010h
Port P3 selectionP3SEL01Bh
Port P3 directionP3DIR01Ah
Port P3 outputP3OUT019h
Port P3 inputP3IN018h
Port P2Port P2 resistor enableP2REN02Fh
Port P2 selectionP2SEL02Eh
Port P2 interrupt enableP2IE02Dh
Port P2 interrupt edge selectP2IES02Ch
Port P2 interrupt flagP2IFG02Bh
Port P2 directionP2DIR02Ah
Port P2 outputP2OUT029h
Port P2 inputP2IN028h
Table 20. Peripherals With Byte Access (continued)
MODULEREGISTER NAMESHORT NAMEADDRESS
Port P1Port P1 resistor enableP1REN027h
Port P1 selectionP1SEL026h
Port P1 interrupt enableP1IE025h
Port P1 interrupt edge selectP1IES024h
Port P1 interrupt flagP1IFG023h
Port P1 directionP1DIR022h
Port P1 outputP1OUT021h
Port P1 inputP1IN020h
Supply voltage range,
during flash memory
programming
Supply voltage range,
during program execution
Legend:
7.5 MHz
MSP430F22x2
MSP430F22x4
SLAS504G –JULY 2006–REVISED AUGUST 2012
Absolute Maximum Ratings
Voltage applied at VCCto V
Voltage applied to any pin
SS
(2)
(1)
-0.3 V to 4.1 V
-0.3 V to VCC+ 0.3 V
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Diode current at any device terminal±2 mA
Storage temperature, T
stg
(3)
Unprogrammed device-55°C to 150°C
Programmed device-55°C to 150°C
(1) Stresses beyond those listed under absolute maximum ratingsmay cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operatingconditionsis not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS. The JTAG fuse-blow voltage, VFB, is allowed to exceed the absolute maximum rating. The voltage is
applied to the TEST pin when blowing the JTAG fuse.
(3) Higher temperature may be applied during board soldering process according to the current JEDEC J-STD-020 specification with peak
reflow temperatures not higher than classified on the device label on the shipping boxes or reels.
Recommended Operating Conditions
(1)(2)
MINNOMMAX UNIT
V
CC
V
SS
T
A
f
SYSTEM
During program
Supply voltageAVCC= DVCC= V
CC
execution
During program/erase
flash memory
Supply voltageAVSS= DVSS= V
Operating free-air temperature°C
Processor frequency
(maximum MCLK frequency)
(see Figure 1)
(1) All inputs are tied to 0 V or VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
(1) All inputs are tied to 0 V or VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
(3) Current for brownout and WDT clocked by SMCLK included.
(4) Current for brownout and WDT clocked by ACLK included.
(5) Current for brownout included.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
t
External interrupt timing2.2 V, 3 V20ns
(int)
Port P1, P2: P1.x to P2.x, External trigger
pulse width to set interrupt flag
(1)
(1) An external signal sets the interrupt flag every time the minimum interrupt pulse width t
shorter than t
(int)
.
CC
is met. It may be set even with trigger signals
(int)
MINTYPMAX UNIT
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0.75 V
CC
0.55 V
CC
5pF
Leakage Current (Ports P1, P2, P3, and P4)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
lkg(Px.y)
PARAMETERTEST CONDITIONSV
High-impedance leakage current
(1) (2)
CC
2.2 V, 3 V±50nA
(1) The leakage current is measured with VSSor VCCapplied to the corresponding pin(s), unless otherwise noted.
(2) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
V
High-level output voltageV
OH
Low-level output voltageV
OL
(1) The maximum total current, I
specified.
(2) The maximum total current, I
specified.
OH(max)
OH(max)
I
OH(max)
I
OH(max)
I
OH(max)
I
OH(max)
I
OL(max)
I
OL(max)
I
OL(max)
I
OL(max)
and I
and I
= -1.5 mA
= -6 mA
= -1.5 mA
= -6 mA
= 1.5 mA
= 6 mA
= 1.5 mA
= 6 mA
OL(max)
OL(max)
(1)
(2)
(1)
(2)
(1)
(2)
(1)
(2)
, for all outputs combined, should not exceed ±12 mA to hold the maximum voltage drop
, for all outputs combined, should not exceed ±48 mA to hold the maximum voltage drop
CC
2.2 V
3 V
2.2 V
3 V
MINMAXUNIT
VCC- 0.25V
VCC- 0.6V
VCC- 0.25V
VCC- 0.6V
V
SSVSS
V
SS
V
SSVSS
V
SS
Output Frequency (Ports P1, P2, P3, and P4)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(1) To improve EMI on the XT1 oscillator, the following guidelines should be observed.
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
(d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This
signal is no longer required for the serial programming adapter.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin).
Because the PCB adds additional capacitance, it is recommended to verify the correct load by measuring the ACLK frequency. For a
correct setup, the effective load capacitance should always match the specification of the crystal that is used.
(3) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies in between might set the flag.
(4) Measured with logic-level input frequency but also applies to operation with crystals.
LFXT1 oscillator logic-level
square-wave input frequency, HF XTS = 1, LFXT1Sx = 32.2 V to 3.6 V0.412MHz
mode
XTS = 1, LFXT1Sx = 0,
f
LFXT1,HF
C
= 1 MHz,2700
= 15 pF
L,eff
Oscillation allowance for HFXTS = 1, LFXT1Sx = 1,
crystals (see Figure 18 andf
Figure 19)C
LFXT1,HF
= 4 MHz,800Ω
= 15 pF
L,eff
XTS = 1, LFXT1Sx = 2,
Integrated effective load
capacitance, HF mode
f
LFXT1,HF
C
(2)
XTS = 1
= 16 MHz,300
= 15 pF
L,eff
(3)
XTS = 1,
Measured at P2.0/ACLK,405060
f
Duty cycle, HF mode2.2 V, 3 V%
LFXT1,HF
XTS = 1,
= 10 MHz
Measured at P2.0/ACLK,405060
Oscillator fault frequency
f
(4)
LFXT1,HF
XTS = 1, LFXT1Sx = 3
= 16 MHz
(1)
www.ti.com
CC
MINTYPMAX UNIT
1.8 V to 3.6 V210
3 V to 3.6 V216
1.8 V to 3.6 V0.410
3 V to 3.6 V0.416
1pF
(5)
2.2 V, 3 V30300kHz
(1) To improve EMI on the XT1 oscillator the following guidelines should be observed:
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
(d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This
signal is no longer required for the serial programming adapter.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is
recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should
always match the specification of the used crystal.
(3) Requires external capacitors at both terminals. Values are specified by crystal manufacturers.
(4) Frequencies below the MIN specification set the fault flag, frequencies above the MAX specification do not set the fault flag, and
frequencies in between might set the flag.
(5) Measured with logic-level input frequency, but also applies to operation with crystals.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERCONDITIONSV
CC
Internal: SMCLK, ACLK
f
USCI
f
BITCLK
t
τ
USCI input clock frequencyExternal: UCLKf
Duty cycle = 50% ± 10%
BITCLK clock frequency
(equals baud rate in MBaud)
UART receive deglitch time
(1)
2.2 V, 3 V1 MHz
2.2 V50150600
3 V50100600
(1) Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed. To ensure that pulses are
correctly recognized their width should exceed the maximum specification of the deglitch time.
USCI (SPI Master Mode)
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 20 and Figure 21)
PARAMETERTEST CONDITIONSV
f
USCI
t
SU,MI
t
HD,MI
t
VALID,MO
(1) f
For the slave's parameters t
USCI input clock frequencyf
SOMI input data setup timens
SOMI input data hold timens
SIMO output data valid timens
UCxCLK
= 1/2t
LO/HI
with t
LO/HI
USCI (SPI Slave Mode)
≥ max(t
SU,SI(Slave)
(1)
VALID,MO(USCI)
and t
VALID,SO(Slave)
SMCLK, ACLK
Duty cycle = 50% ± 10%
UCLK edge to SIMO valid,
CL= 20 pF
+ t
SU,SI(Slave)
, t
SU,MI(USCI)
, see the SPI parameters of the attached slave.
+ t
VALID,SO(Slave)
CC
2.2 V110
3 V75
2.2 V0
3 V0
2.2 V30
3 V20
).
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 22 and Figure 23)
t
STE,LEAD
t
STE,LAG
t
STE,ACC
t
STE,DIS
t
SU,SI
t
HD,SI
t
VALID,SO
(1) f
For the master's parameters t
STE lead time, STE low to clock2.2 V, 3 V50ns
STE lag time, Last clock to STE high2.2 V, 3 V10ns
STE access time, STE low to SOMI data out2.2 V, 3 V50ns
STE disable time, STE high to SOMI high
impedance
SIMO input data setup timens
SIMO input data hold timens
SOMI output data valid timens
= 1/2t
UCxCLK
LO/HI
PARAMETERTEST CONDITIONSV
UCLK edge to SOMI valid,
CL= 20 pF
with t
LO/HI
≥ max(t
VALID,MO(Master)
SU,MI(Master)
and t
VALID,MO(Master)
+ t
SU,SI(USCI)
, t
SU,MI(Master)
refer to the SPI parameters of the attached slave.
Only one terminal Ax selected atI: -40°C to 85°C
a timeT: -40°C to 105°C
0 V ≤ VAx≤ V
= 5 MHz-40°C to 85°C2.2 V, 3 V1.11.4
105°C2.2 V, 3 V1.8
= 5 MHz,-40°C to 85°C2.2 V, 3 V0.50.7
105°C2.2 V, 3 V0.8
CC
2.2 V, 3 V2000Ω
(1) The leakage current is defined in the leakage current table with Px.x/Ax parameter.
(2) The analog input voltage range must be within the selected reference voltage range VR+to VR-for valid conversion results.
(3) The internal reference supply current is not included in current consumption parameter I
(4) The internal reference current is supplied via terminal VCC. Consumption is independent of the ADC10ON control bit, unless a
ADC10
.
conversion is active. The REFON bit enables the built-in reference to settle before starting an A/D conversion.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V
CC,REF+
V
REF+
I
LD,VREF+
PARAMETERTEST CONDITIONSV
I
≤ 1 mA, REF2_5V = 02.2
Positive built-in
reference analogI
supply voltage range
Positive built-in
reference voltage
Maximum V
load current
V
REF+
regulation
REF+
load
VREF+
≤ 0.5 mA, REF2_5V = 12.8V
VREF+
I
≤ 1 mA, REF2_5V = 12.9
VREF+
I
≤ I
VREF+
I
VREF+
I
VREF+
Analog input voltage VAx≈ 0.75 V,2.2 V, 3 V±2
max, REF2_5V = 02.2 V, 3 V1.411.51.59
VREF+
≤ I
max, REF2_5V = 13 V2.352.52.65
VREF+
= 500 µA ± 100 µA,
REF2_5V = 0
I
= 500 µA ± 100 µA,
VREF+
Analog input voltage VAx≈ 1.25 V,3 V±2
CC
2.2 V±0.5
3 V±1
REF2_5V = 1
I
= 100 µA to 900 µA,ADC10SR = 0400
VREF+
VAx≈ 0.5 x V
Error of conversion result
≤1 LSB
I
≤ ±1 mA,
VREF+
REFON = 1, REFOUT = 1
= constant with
VREF+
0 mA ≤ I
VREF+
I
= 0.5 mA, REF2_5V = 0,
VREF+
REFON = 0 to 1
I
= 0.5 mA,ADC10SR = 01
VREF+
REF2_5V = 0,
REFON = 1,
REFBURST = 1
(3)
I
= 0.5 mA,ADC10SR = 02
VREF+
REF2_5V = 1,
REFON = 1,
REFBURST = 1
REF+
≤ 1 mA
,
ADC10SR = 12000
2.2 V, 3 V±100ppm/°C
ADC10SR = 12.5
ADC10SR = 14.5
2.2 V
3 V
C
VREF+
T
CREF+
t
REFON
t
REFBURST
V
load
REF+
regulation response3 Vns
time
Maximum
capacitance at pin2.2 V, 3 V100pF
(1)
V
REF+
TemperatureI
coefficient
(2)
Settling time of
internal reference3.6 V30µs
(3)
voltage
Settling time of
reference buffer
(1) The capacitance applied to the internal buffer operational amplifier, if switched to terminal P2.4/TA 2/A4/V
must be limited; the reference buffer may become unstable otherwise.
(2) Calculated using the box method:
I temperature: (MAX(-40 to 85°C) – MIN(-40 to 85°C)) / MIN(-40 to 85°C) / (85°C – (–40°C))
T temperature: (MAX(-40 to 105°C) – MIN(-40 to 105°C)) / MIN(-40 to 105°C) / (105°C – (–40°C))
(3) The condition is that the error in a conversion started after t
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V
eREF+
V
eREF-
ΔV
eREF
I
VeREF+
I
VeREF-
PARAMETERTEST CONDITIONSV
V
> V
,
eREF-
≤ VCC- 0.15 V,
eREF+
> V
eREF-
> V
eREF-
(5)
eREF-
≤ VCC,
eREF+
≤ VCC- 0.15 V ≤ 3 V,
eREF+
≤ V
CC
(3)
(3)
Positive external reference input
voltage range
Negative external reference input
voltage range
(2)
(4)
Differential external reference
input voltage rangeV
ΔV
= V
eREF
Static input current into V
Static input current into V
eREF+
- V
eREF-
eREF+
eREF-
eREF+
SREF1 = 1, SREF0 = 0
V
≤ V
eREF-
SREF1 = 1, SREF0 = 1
V
eREF+
eREF+
0 V ≤ V
SREF1 = 1, SREF0 = 0
0 V ≤ V
SREF1 = 1, SREF0 = 1
0 V ≤ V
CC
2.2 V, 3 VµA
2.2 V, 3 V±1µA
(1) The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, CI, is also the
dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the
recommendations on analog-source impedance to allow the charge to settle for 10-bit accuracy.
(2) The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced
accuracy requirements.
(3) Under this condition, the external reference is internally buffered. The reference buffer is active and requires the reference buffer supply
current I
(4) The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced
. The current consumption can be limited to the sample and conversion period with REBURST = 1.
REFB
accuracy requirements.
(5) The accuracy limits the minimum external differential reference voltage. Lower differential reference voltage levels may be applied with
reduced accuracy requirements.
MINMAX UNIT
1.4V
CC
V
1.43
01.2V
1.4V
CC
V
±1
0
10-Bit ADC, Timing Parameters
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
f
ADC10CLK
f
ADC10OSC
ADC10 input clockFor specified performance of
frequencyADC10 linearity parameters
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
I/P
Input voltage range-0.1VCC- 1.2V
CC
TA= -40 to +55°C-5±0.55
I
lkg
Input leakage
(1) (2)
current
TA= +55 to +85°C2.2 V, 3 V-20±520nA
TA= +85 to +105°C-5050
Fast Mode50
Medium Modef
V
n
Voltage noise
density, I/P
Slow Mode140
Fast Mode30
Medium Modef
= 1 kHz80
V(I/P)
= 10 kHz50
V(I/P)
Slow Mode65
V
IO
V
OH
V
OL
R
O/P(OAx)
CMRRNoninverting2.2 V, 3 V70dB
Offset voltage, I/P2.2 V, 3 V±10mV
Offset temperature
(3)
drift, I/P
Offset voltage drift0.3 V ≤ VIN≤ VCC- 1.0 V
with supply, I/PΔVCC≤ ±10%, TA= 25°C
High-level output
voltage, O/P
Low-level output
voltage, O/P
Output resistance
(4)
(see Figure 25)V
Fast Mode, I
Slow Mode, I
Fast Mode, I
Slow Mode, I
R
= 3 kΩ, C
Load
V
R
R
0.2 V ≤ V
O/P(OAx)
= 3 kΩ, C
Load
O/P(OAx)
= 3 kΩ, C
Load
< 0.2 V
> VCC- 1.2 V
O/P(OAx)
≤ -500 µAVCC- 0.2V
SOURCE
≤ -150 µAVCC- 0.1V
SOURCE
≤ 500 µAV
SOURCE
≤ 150 µAV
SOURCE
= 50 pF,
Load
= 50 pF,
Load
= 50 pF,
Load
≤ VCC- 0.2 V
2.2 V, 3 V±10µV/°C
2.2 V, 3 V±1.5mV/V
2.2 V, 3 VV
2.2 V, 3 VV
2.2 V, 3 V150250Ω
Common-mode
rejection ratio
(1) ESD damage can degrade input current leakage.
(2) The input bias current is overridden by the input leakage current.
(3) Calculated using the box method
(4) Specification valid for voltage-follower OAx configuration
Operational Amplifier OA Feedback Network, Resistor Network (MSP430F22x4 Only)
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(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
R
R
(1) A single resistor string is composed of 4 R
(2) For the matching (that is, the relative accuracy) of the unit resistors on a device, see the gain and level specifications of the respective
(1) This includes the 2 OA configuration "inverting amplifier with input buffer". Both OA needs to be set to the same power mode OAPMx.
(2) The settling time specifies the time until an ADC result is stable. This includes the minimum required sampling time of the ADC. The
settling time of the amplifier itself might be faster.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V
CC (PGM/ERASE)
f
FTG
I
PGM
I
ERASE
t
CPT
t
CMErase
PARAMETERTEST CONDITIONSV
Program and erase supply voltage2.23.6V
Flash timing generator frequency257476kHz
Supply current from VCCduring program2.2 V, 3.6 V15mA
Supply current from VCCduring erase2.2 V, 3.6 V17mA
Cumulative program time
(1)
Cumulative mass erase time2.2 V, 3.6 V20ms
CC
2.2 V, 3.6 V10ms
Program/Erase endurance10
t
Retention
t
Word
t
Block, 0
t
Block, 1-63
t
Block, End
t
Mass Erase
t
Seg Erase
Data retention durationTJ= 25°C100years
Word or byte program time
Block program time for first byte or word
Block program time for each additional
byte or word
Block program end-sequence wait time
Mass erase time
Segment erase time
(2)
(2)
(2)
(2)
(2)
(2)
(1) The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
(2) These values are hardwired into the flash controller's state machine (t
FTG
= 1/f
FTG
).
MINTYPMAXUNIT
4
5
10
30t
25t
18t
6t
10593t
4819t
cycles
FTG
FTG
FTG
FTG
FTG
FTG
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAX UNIT
V
(RAMh)
RAM retention supply voltage
(1) This parameter defines the minimum supply voltage VCCwhen the data in RAM remains unchanged. No program execution should
Spy-Bi-Wire return to normal operation time2.2 V, 3 V15100µs
TCK input frequency
(2)
Internal pulldown resistance on TEST2.2 V, 3 V256090kΩ
(1) Tools accessing the Spy-Bi-Wire interface need to wait for the maximum t
applying the first SBWCLK clock edge.
(2) f
JTAG Fuse
may be restricted to meet the timing requirements of the module selected.
TCK
(1)
time after pulling the TEST/SBWCLK pin high before
SBW,En
CC
2.2 V, 3 V1µs
2.2 V05MHz
3 V010MHz
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAX UNIT
V
CC(FB)
V
FB
I
FB
t
FB
Supply voltage during fuse-blow conditionTA= 25°C2.5V
Voltage level on TEST for fuse blow67V
Supply current into TEST during fuse blow100mA
Time to blow fuse1ms
MINTYPMAX UNIT
(1) Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to
Port P2 Pin Schematic: P2.0, P2.2, Input/Output With Schmitt Trigger
Pin Name (P2.x)xyFUNCTION
P2.0/ACLK/A0/OA0I000 ACLK110
P2.2/TA0/A2/OA0I122
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P2 Pin Schematic: P2.1, Input/Output With Schmitt Trigger
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PIN NAME (P2.x)xyFUNCTION
P2.1/TAINCLK/SMCLK/
A1/OA0O
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P2 Pin Schematic: P2.4, Input/Output With Schmitt Trigger
SLAS504G –JULY 2006–REVISED AUGUST 2012
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P2 Pin Schematic: P2.7, Input/Output With Schmitt Trigger and Crystal Oscillator Output
PIN NAME (P2.x)xFUNCTION
XOUT/P2.77
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) If the pin XOUT/P2.7 is used as an input a current can flow until P2SEL.7 is cleared due to the oscillator output driver connection to this
Port P3 Pin Schematic: P3.0, Input/Output With Schmitt Trigger
SLAS504G –JULY 2006–REVISED AUGUST 2012
Table 31. Port P3 (P3.0) Pin Functions
PIN NAME (P1.x)xyFUNCTION
(2)
P3.0
P3.0/UCB0STE/
UCA0CLK/A5
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) The pin direction is controlled by the USCI module.
(4) UCA0CLK function takes precedence over UCB0STE function. If the pin is required as UCA0CLK input or output, USCI_B0 is forced to
3-wire SPI mode if 4-wire SPI mode is selected.
(5) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P3 Pin Schematic: P3.1 to P3.5, Input/Output With Schmitt Trigger
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Table 32. Port P3 (P3.1 to P3.5) Pin Functions
PIN NAME (P3.x)xFUNCTION
P3.1/UCB0SIMO/UCB0SDA1
P3.2/UCB0SOMI/UCB0SCL2
P3.3/UCB0CLK/UCA0STE3
P3.4/UCA0TXD/UCA0SIMO4
P3.5/UCA0RXD/UCA0SOMI5
(2)
P3.1
(I/O)I: 0; O: 10
UCB0SIMO/UCB0SDA
(2)
P3.2
(I/O)I: 0; O: 10
UCB0SOMI/UCB0SCL
(2)
P3.3
(I/O)I: 0; O: 10
UCB0CLK/UCA0STE
(2)
P3.4
(I/O)I: 0; O: 10
UCA0TXD/UCA0SIMO
(2)
P3.5
(I/O)I: 0; O: 10
UCA0RXD/UCA0SOMI
(3)
(3)
(3) (4)
(3)
(3)
CONTROL BITS/SIGNALS
P3DIR.xP3SEL.x
X1
X1
X1
X1
X1
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) The pin direction is controlled by the USCI module.
(4) UCB0CLK function takes precedence over UCA0STE function. If the pin is required as UCB0CLK input or output, USCI_A0 is forced to
3-wire SPI mode even if 4-wire SPI mode is selected.
Port P3 Pin Schematic: P3.6 to P3.7, Input/Output With Schmitt Trigger
Table 33. Port P3 (P3.6, P3.7) Pin Functions
PIN NAME (P3.x)xyFUNCTION
P3.6/A6/OA0I266
P3.7/A7/OA1I277
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE0.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P4 Pin Schematic: P4.5, Input/Output With Schmitt Trigger
SLAS504G –JULY 2006–REVISED AUGUST 2012
PIN NAME (P4.x)xyFUNCTION
P4.5/TB3/A14/OA0I356 Timer_B3.TB2110
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
Port P4 Pin Schematic: P4.6, Input/Output With Schmitt Trigger
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Table 37. Port P4 (P4.6) Pin Functions
PIN NAME (P4.x)xyFUNCTION
P4.6/TBOUTH/A15/OA1I367
(1) X = Don't care
(2) Default after reset (PUC/POR)
(3) Setting the ADC10AE1.y bit disables the output driver as well as the input Schmitt trigger to prevent parasitic cross currents when
MSP430 devices that have the fuse on the TEST terminal have a fuse check mode that tests the continuity of the
fuse the first time the JTAG port is accessed after a power-on reset (POR). When activated, a fuse check
current, ITF, of 1 mA at 3 V, 2.5 mA at 5 V can flow from the TEST pin to ground if the fuse is not burned. Care
must be taken to avoid accidentally activating the fuse check mode and increasing overall system power
consumption.
When the TEST pin is again taken low after a test or programming session, the fuse check mode and sense
currents are terminated.
Activation of the fuse check mode occurs with the first negative edge on the TMS pin after power up or if TMS is
being held low during power up. The second positive edge on the TMS pin deactivates the fuse check mode.
After deactivation, the fuse check mode remains inactive until another POR occurs. After each POR the fuse
check mode has the potential to be activated.
The fuse check current flows only when the fuse check mode is active and the TMS pin is in a low state (see
Figure 28). Therefore, the additional current flow can be prevented by holding the TMS pin high (default
condition).
Figure 28. Fuse Check Mode Current
NOTE
The CODE and RAM data protection is ensured if the JTAG fuse is blown and the 256-bit
bootloader access key is used. Also, see the Bootstrap Loader section for more
information.
SLAS504EAdded information for YFF package
SLAS504F
SLAS504G
Production data sheet release
Updated specification and added characterization graphs
Updated/corrected port pin schematics
Maximum low-power mode supply current limits decreased
Added note concerning f
Added Development Tool Support section (page 2)
Changed T
Corrected pin names in "Port P3 pin schematic: P3.0" and "Port P3 (P3.0) pin functions" (page 68)
Corrected pin names in "Port P3 pin schematic: P3.1 to P3.5" and "Port P3 (P3.1 to P3.5) pin functions" (page 69)
Corrected signal names in "Port P2 pin schematic: P2.5, input/output" (page 65) (D1)
Corrected values in "x" column in "Port P3 (P3.1 to P3.5) pin functions" (page 69) (D2)
Correct signal names for P3.6 and P3.7 in MSP430F22x2 pinouts – DA package, RHA package
Changed Storage temperature range limit in Absolute Maximum Ratings
Corrected Test Conditions in Crystal Oscillator LFXT1, High-Frequency Mode
Corrected signal names in Port P1 (P1.0 to P1.3) Pin Functions
Corrected typo in note 1 on Crystal Oscillator LFXT1, High-Frequency Mode table
Terminal Functions tables, Corrected description of V
Added note on TC
for programmed devices from "-40°C to 105°C" to "-55°C to 105°C" (page 23)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
PACKAGE OPTION ADDENDUM
www.ti.com
9-Sep-2014
Addendum-Page 5
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF MSP430F2252, MSP430F2272, MSP430F2274 :
•
Automotive: MSP430F2252-Q1, MSP430F2272-Q1
•
Enhanced Product: MSP430F2274-EP
NOTE: Qualified Version Definitions:
•
Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
•
Enhanced Product - Supports Defense, Aerospace and Medical Applications
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