Texas Instruments DAC5571IDBVTG4, DAC5571 Datasheet

www.ti.com
V
DD
SCLA0
Output
Buffer
Power-Down
Control Logic
Resistor Network
Ref (+) Ref(−)
I2C
Control
Logic
DAC
Register
Power-On
Reset
V
OUT
SDA
+2.7 V to +5.5 V, I2C INTERFACE, VOLTAGE OUTPUT,
8-BIT DIGITAL-TO-ANALOG CONVERTER

FEATURES DESCRIPTION

Micropower Operation: 125 µA @ 3 V
Fast Update Rate: 188 KSPS
Power-On Reset to Zero
+2.7-V to +5.5-V Power Supply
Specified Monotonic by Design
I2C™ Interface up to 3.4 Mbps
On-Chip Output Buffer Amplifier, Rail-to-Rail
Operation
Double-Buffered Input Register
Address Support for up to Two DAC5571s
Small 6 Lead SOT 23 Package
Operation From –40 °C to 105 °C

APPLICATIONS

Process Control
Data Acquistion Systems
Closed-Loop Servo Control
PC Peripherals power-down mode.
Portable Instrumentation
The DAC5571 is a low-power, single-channel, 8-bit buffered voltage output DAC. Its on-chip precision output amplifier allows rail-to-rail output swing to be achieved. The DAC5571 utilizes an I2C-compatible, two-wire serial interface that operates at clock rates up to 3.4 Mbps with address support of up to two DAC5571s on the same data bus.
The output voltage range of the DAC is 0 V to V The DAC5571 incorporates a power-on-reset circuit that ensures that the DAC output powers up at zero volts and remains there until a valid write to the device takes place. The DAC5571 contains a power-down feature, accessed via the internal control register, that reduces the current consumption of the device to 50 nA at 5 V.
The low-power consumption of this part in normal operation makes it ideally suited for portable battery operated equipment. The power consumption is less than 0.7 mW at V
DAC7571/6571/5571 are 12/10/8-bit, single-channel I2C DACs from the same family. DAC7574/6574/5574 and DAC7573/6573/5573 are 12/10/8-bit quad-channel I2C DACs. Also see DAC8571/8574 for single/quad-channel, 16-bit I2C DACs.
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
= 5 V reducing to 1 µW in
DD
.
DD
I2C is a trademark of Philips Corporation.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright © 2003–2005, Texas Instruments Incorporated
www.ti.com
A0 SCL SDA
6 5 4
1 2 3
V
OUT
GND
V
DD
D571
1 2 3
6 5 4
YMLL
(TOP VIEW)
(BOTTOM VIEW)
Lot Trace Code
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
PRODUCT PACKAGE DESIG- TRANSPORT MEDIA
PACKAGE
NATOR
DAC5571 SOT23-6 DBV –40°C to +105°C D571
SPECIFIED TEM- PACKAGE ORDERING NUM-
PERATURE RANGE MARKING BER
DAC5571IDBVT 250-Piece Small Tape and Reel DAC5571IDBVR 3000-Piece Tape and Reel

PIN CONFIGURATIONS

PIN NAME DESCRIPTION
1 V 2 GND 3 V
4 SDA Serial Data Input 5 SCL Serial Clock Input 6 A0 Device Address Select
LOT Year (3 = 2003); M onth (1–9 = JAN–SEP; A=OCT,
TRACE B=NOV, C=DEC); LL Random code generated
CODE: when assembly is requested
PIN DESCRIPTION (SOT23-6)
OUT
DD
Analog output voltage from DAC Ground reference point for all
circuitry Analog Voltage Supply Input

ABSOLUTE MAXIMUM RATINGS

V
to GND 0.3 V to +6 V
DD
Digital input voltage to GND –0.3 V to +V V
to GND 0.3 V to +V
OUT
Operating temperature range –40 °C to +105 °C Storage temperature range –65 °C to +150 °C Junction temperature range (T Power dissipation (TJmax - TA)R Thermal impedance, R Lead temperature, soldering Vapor phase (60s) 215 °C
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
ΘJA
max) +150 °C
J
(1)
UNITS
Infrared (15s) 220 °C
+0.3 V
DD
+0.3 V
DD
ΘJA
240 °C/W
www.ti.com
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005

ELECTRICAL CHARACTERISTICS

V
= +2.7 V to +5.5 V; RL= 2 k to GND; CL= 200 pF to GND; all specifications –40°C to +105°C unless otherwise noted.
DD
PARAMETER CONDITIONS UNITS
STATIC PERFORMANCE
(1)
Resolution 8 Bits Relative accuracy ±0.5 LSB Differential nonlinearity Assured monotonic by design ±0.25 LSB Zero code error 5 20 mV Full-scale error All ones loaded to DAC register -0.15 -1.25 % of FSR Gain error ±1.25 % of FSR Zero code error drift ± 7 µV/°C Gain temperature coefficient ± 3 ppm of FSR/ °C
OUTPUT CHARACTERISTICS
(2)
Output voltage range 0 V Output voltage settling time 6 8 µs
1/4 Scale to 3/4 scale change (400
RL=
to C00
H
) ;
H
Slew rate 1 V/µs
Capacitive load stability
RL= 470 pF
RL= 2 k 1000 pF Code change glitch impulse 1 LSB Change around major carry 20 nV-s Digital feedthrough 0.5 nV-s DC output impedance 1
V
= +5 V 50 mA
Short-circuit current
Power-up time
LOGIC INPUTS
Coming out of power-down mode, V Coming out of power-down mode, V
(3)
DD
V
= +3 V 20 mA
DD
= +5 V 2.5 µs
DD
= +3 V 5 µs
DD
Input current ±1 µA VINL, Input low voltage V VINH, Input high voltage V
= +3 V 0.3×V
DD
= +5 V 0.7×V
DD
Pin capacitance 3 pF
POWER REQUIREMENTS
V
DD
IDD(normal operation) DAC active and excluding load current
V
= +3.6 V to +5.5 V VIH= V
DD
V
= +2.7 V to +3.6 V VIH= V
DD
and VIL= GND 155 200 µA
DD
and VIL= GND 125 160 µA
DD
IDD(all power-down modes)
V
= +3.6 V to +5.5 V VIH= V
DD
V
= +2.7 V to +3.6 V VIH= V
DD
and VIL= GND 0.2 1 µA
DD
and VIL= GND 0.05 1 µA
DD
POWER EFFICIENCY
I
/I
OUT
DD
I
= 2 mA, V
LOAD
= +5 V 93 %
DD
(1) Linearity calculated using a reduced code range of 3 to 253; output unloaded. (2) Specified by design and characterization, not production tested. (3) Specified by design and characterization, not production tested.
DAC5571
MIN TYP MAX
DD
DD
DD
2.7 5.5 V
V
V V
3
www.ti.com
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005

TIMING CHARACTERISTICS

SYMBOL PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
tHD; t
tSU; t
tSU; t
tHD; t
f
SCL
t
BUF
STA
t
LOW
t
HIGH
STA
DAT
DAT
t
RCL
t
RCL1
t
FCL
t
RDA
t
FDA
SCL Clock Frequency Standard mode 100 kHz
Fast mode 400 kHz High-speed mode, CB- 100 pF max 3.4 MHz High-Speed mode, CB- 400 pF max 1.7 MHz
Bus Free Time Between a STOP Standard mode 4.7 µs
and START Condition
Fast mode 1.3 µs
Hold Time (Repeated) START Standard mode 4.0 µs
Condition
Fast mode 600 ns
High-speed mode 160 ns
LOW Period of the SCL Clock Standard mode 4.7 µs
Fast mode 1.3 µs High-speed mode, CB- 100 pF max 160 ns High-speed mode, CB- 400 pF max 320 ns
HIGH Period of the SCL Clock Standard mode 4.0 µs
Fast mode 600 ns High-speed mode, CB- 100 pF max 60 ns High-speed mode, CB- 400 pF max 120 ns
Setup Time for a Repeated Standard mode 4.7 µs
START Condition
Fast mode 600 ns
High-speed mode 160 ns
Data Setup Time Standard mode 250 ns
Fast mode 100 ns
High-speed mode 10 ns
Data Hold Time Standard mode 0 3.45 µs
Fast mode 0 0.9 µs High-speed mode, CB- 100 pF max 0 70 ns High-speed mode, CB- 400 pF max 0 150 ns
Rise Time of SCL Signal Standard mode 1000 ns
Fast mode 20 + 0.1C
B
High-speed mode, CB- 100 pF max 10 40 ns High-speed mode, CB- 400 pF max 20 80 ns
Rise Time of SCL Signal After a Standard mode 1000 ns
Repeated START Condition and
After an Acknowledge BIT
Fast mode 20 + 0.1C
B
High-speed mode, CB- 100 pF max 10 80 ns High-speed mode, CB- 400 pF max 20 160 ns
Fall Time of SCL Signal Standard mode 300 ns
Fast mode 20 + 0.1C
B
High-speed mode, CB- 100 pF max 10 40 ns High-speed mode, CB- 400 pF max 20 80 ns
Rise Time of SDA Signal Standard mode 1000 ns
Fast mode 20 + 0.1C
B
High-speed mode, CB- 100 pF max 10 80 ns High-speed mode, CB- 400 pF max 20 160 ns
Fall Time of SDA Signal Standard mode 300 ns
Fast mode 20 + 0.1C
B
High-speed mode, CB- 100 pF max 10 80 ns High-speed mode, CB- 400 pF max 20 160 ns
300 ns
300 ns
300 ns
300 ns
300 ns
4
www.ti.com
−0.5
−0.4
−0.3
−0.2
−0.1
0
0.1
0.2
0.3
0.4
0.5
−0.25
−0.2
−0.15
−0.1
−0.05
0
0.05
0.1
0.15
0.2
0.25
0 32 64 96 128 160 192 224 256
Digital Input Code
VDD = 5 V at 25°C
LE − LSBDLE − LSB
−0.5
−0.4
−0.3
−0.2
−0.1
0
0.1
0.2
0.3
0.4
0.5
−0.25
−0.2
−0.15
−0.1
−0.05
0
0.05
0.1
0.15
0.2
0.25
0 32 64 96 128 160 192 224 256
VDD = 5 V at −40°C
Digital Input Code
LE − LSBDLE − LSB
−0.5
−0.4
−0.3
−0.2
−0.1
0
0.1
0.2
0.3
0.4
0.5
−0.25
−0.2
−0.15
−0.1
−0.05
0
0.05
0.1
0.15
0.2
0.25
0 32 64 96 128 160 192 224 256
Digital Input Code
VDD = 5 V at 105°C
LE − LSB
DLE − LSB
−16
−8
0
8
16
0 32 64 96 128 160 192 224 256
Digital Input Code
VDD = 5 V, T
A
= 25°C
Output Error − mV
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
TIMING CHARACTERISTICS (continued)
SYMBOL PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
tSU; t
C
B
t
SP
V
NH
V
NL
Setup Time for STOP Condition Standard mode 4.0 µs
STO
Fast mode 600 ns
High-speed mode 160 ns
Capacitive Load for SDA and SCL 400 pF
Pulse Width of Spike Suppressed Fast mode 50 ns
High-speed mode 10 ns
Noise Margin at the HIGH Level Standard mode 0.2V
for Each Connected Device
(Including Hysteresis)
Fast mode
DD
High-speed mode
Noise Margin at the LOW Level for Standard mode 0.1V
Each Connected Device
(Including Hysteresis)
Fast mode
DD
High-speed mode
DAC5571
V
V
TYPICAL CHARACTERISTICS: V
At TA= +25°C, +V
= +5 V, unless otherwise noted.
DD
= +5 V
DD
LINEARITY ERROR AND LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR DIFFERENTIAL LINEARITY ERROR
vs vs
CODE (-40°C) CODE (+25°C )
Figure 1. Figure 2.
LINEARITY ERROR AND ABSOLUTE ERROR
DIFFERENTIAL LINEARITY ERROR
vs
CODE (+105°C)
Figure 3. Figure 4.
5
www.ti.com
−30
−20
−10
0
10
20
30
−50−40−30−20 −10 0 10 20 30 40 50 60 70 80 90 100 110
VDD = 5 V
T − Temperature − C
Zero-Scale Error
−30
−20
−10
0
10
20
30
−50 −40 −30 −20 −10 0 10 20 30 40 50 60 70 80 90 100 110
VDD = 5 V
Full-Scale Error − mV
T − Temperature − C
500
1000
1500
2000
2500
80
90
100
110
120
130
140
150
160
170
180
190
200
0
VDD = 5 V
I
DD
− Supply Current − A
f − Frequency − Hz
0
V
OUT
(V)
I
SOURCE/SINK
(mA)
5 10 15
5
4
3
2
1
0
DAC Loaded with FF
H
DAC Loaded with 00
H
0
100
200
300
400
500
0 2 32 64 96 128 160 192 224 252 255
Code
VDD = 5 V
I
DD
Aµ − Supply Current −
0
50
100
150
200
250
300
−50 −40−30 −20−10 0 10 20 30 40 50 60 70 80 90 100 110
VDD = 5 V
− Supply Current − I
DD
Aµ
T − Temperature − C
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
TYPICAL CHARACTERISTICS: V
At TA= +25°C, +V
= +5 V, unless otherwise noted.
DD
ZERO-SCALE ERROR FULL-SCALE ERROR
vs vs
TEMPERATURE TEMPERATURE
Figure 5. Figure 6.
IDDHISTOGRAM SOURCE AND SINK CURRENT CAPABILITY
= +5 V (continued)
DD
SUPPLY CURRENT SUPPLY CURRENT
6
Figure 7. Figure 8.
vs vs
CODE TEMPERATURE
Figure 9. Figure 10.
www.ti.com
0
50
100
150
200
250
300
2.7 3.2 3.7 4.2 4.7 5.2 5.7
− Supply Current − I
DD
Aµ
VDD − Supply Voltage − V
2.7
I
DD
(nA)
VDD (V)
3.2 3.7 4.2 4.7 5.2 5.7
100
90 80 70 60 50 40 30 20 10
0
+25°C
–40°C
+105°C
CLK (5V/div)
V
OUT
(1V/div)
Time (1µs/div)
Full−Scale Code Change
00Hto FF
H
Output Loaded with
2k and200pF to GND
0
I
DD
(µA)
V
LOGIC
(V)
1 2 3 4 5
2500
2000
1500
1000
500
0
DAC5571
SLAS405A – DECEMBER 2003 – REVISED AUGUST 2005
TYPICAL CHARACTERISTICS: V
At TA= +25°C, +V
= +5 V, unless otherwise noted.
DD
SUPPLY CURRENT POWER-DOWN CURRENT
vs vs
SUPPLY VOLTAGE SUPPLY VOLTAGE
Figure 11. Figure 12.
SUPPLY CURRENT FULL-SCALE SETTLING TIME
vs
LOGIC INPUT VOLTAGE
= +5 V (continued)
DD
Figure 13. Figure 14.
7
Loading...
+ 14 hidden pages