Texas Instruments CY74FCT157CTSOCT, CY74FCT157CTSOC, CY74FCT157CTQCT, CY74FCT157CTQC, CY74FCT157ATSOCT Datasheet

Quad 2-Input Multiplexe

r

CY54/74FCT157T

SCCS014 - May 1994 - Revised February 2000

Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.

Copyright © 2000, Texas Instruments Incorporated

Features

• Function, pinout, and drive compatible with FCT and

F logic

• FCT-C speed at 4.3 ns max. (Com’l),

FCT-A speed at 5.0 ns max. (Com’l)

• Reduced V

OH

(typically = 3.3V) versions of equivalent

FCT functions

• Edge-rate control circuitry for significantly improved

noise characteristics

• Power-off disable feature

• Matched rise and fall times

• Fully compatible with TTL input and output logic levels

• ESD > 2000V

• Extended commercial range of −40˚C to +85˚C

• Sink current 64 mA (Com’l),
32 mA (Mil)

Source current 32 mA (Com’l),

12 mA (Mil)

Functional Description

The FCT157T is a quad two-input multiplexer that selects four
bits of data from two sources under the control of a common
data Select input (S). The Enable input (

E) is Active LOW.

When (

E) is HIGH, all of the outputs (Y) are forced LOW

regardless of all other input conditions.
Moving data from two groups of registers to four common

output buses is a common use of the FCT157T. The state of
the Select input determines the particular register from which
the data comes. It can also be used as a function generator.
The device is useful for implementing highly irregular logic by
generating any four of the sixteen different functions of two
variables with one variable common.

The FCT157T is a logic implementation of a four-pole,
two-position switch where the position of the switch is
determined by the logic levels supplied to the Select input.

The outputs are designed with a power-off disable feature to
allow for liv e insertion of boards.

LogicBlock Diagram, FCT157T Pin Configurations

1
2
3
4
5
6
7
8

V

CC

GND

Top View

FCT157T

4

8
9
10
11
12

765

1516 17 18

3
2
1

20

13

14

19

I1bI

0b

Y

a

I

1d

I

0c

I

0d

NC

NC

NC

V

CC

E

GND

Y

d

Top View

SOIC/QSOP

I

1a

LCC

NC

16
15
14
13
12
11

10

9

Y

a

S

I

1a

I

0a

I

1d

I

0d

E

I

0a

SI

1a

I

0b

I

1b

I

0c

I

1c

I

0dI1d

Y

a

Y

b

Y

c

Y

d

Y

b

I

1b

I

0b

I

1c

I

0c

Y

d

Y

c

S

I

0a

Y

b

I

1c

Y

c

E

FCT157T

–1

Y

a

S

I

1a

I

0a

I1dI

0d

Y

b

I1bI

0b

I1cI

0c

Y

c

Y

d

E

FCT157T

FCT157T

Logic Symbol

CY54/74FCT157T

2

Maximum Ratings

[2,3]

(Above which the useful life may be impaired. For user guide­lines, not tested.)

Storage Temperature .....................................−65°C to +150°C

Ambient Temperature with

Power Applied..................................................−65°C to +135°C

Supply Voltage to Ground Potential..................−0.5V to +7.0V

DC Input Voltage .................................................−0.5V to +7.0V

DC Output Voltage ..............................................−0.5V to +7.0V

DC Output Current (Maximum Sink Current/Pin) ......120 mA

Power Dissipation..........................................................0.5W

Static Discharge Voltage............................................>2001V

(per MIL-STD-883, Method 3015)

Pin Description

Name Description

S Common Select Input
E Enable Inputs (Active LOW)
I

0

Data Inputs from Source 0

I

1

Data Inputs from Source 1

Y Non-Inverted Output

Function Table

[1]

Inputs Outputs

E S I

0

I

1

Y

H X X X L
L H X L L
L H X H H
L L L X L
L L H X H

Operating Range

Range Range

Ambient

Temperature V

CC

Commercial All −40°C to +85°C 5V ± 5%
Military

[4]

All −55°C to +125°C 5V ± 10%

Electrical Characteristics Over the Operating Range

Parameter Description Test Conditions Min. Typ.

[5]

Max. Unit

V

OH

Output HIGH Voltage VCC=Min., IOH=−32 mA Com’l 2.0 V

VCC=Min., IOH=−15 mA Com’l 2.4 3.3 V
VCC=Min., IOH=−12 mA Mil 2.4 3.3 V

V

OL

Output LOW Voltage VCC=Min., IOL=64 mA Com’l 0.3 0.55 V

VCC=Min., IOL=32 mA Mil 0.3 0.55 V

V

IH

Input HIGH Voltage 2.0 V

V

IL

Input LOW Voltage 0.8 V

V

H

Hysteresis

[6]

All inputs 0.2 V

V

IK

Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V

I

I

Input HIGH Current VCC=Max., VIN=V

CC

5 µA

I

IH

Input HIGH Current VCC=Max., VIN=2.7V ±1 µA

I

IL

Input LOW Current VCC=Max., VIN=0.5V ±1 µA

I

OZH

Off State HIGH-Level Output
Current

VCC= Max., V

OUT

= 2.7V 10 µA

I

OZL

Off State LOW-Level
Output Current

VCC = Max., V

OUT

= 0.5V −10 µA

I

OS

Output Short Circuit Current

[7]

VCC=Max., V

OUT

=0.0V −60 −120 −225 mA

I

OFF

Power-Off Disable VCC=0V, V

OUT

=4.5V ±1 µA

Note:

1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care

2. Unless otherwise noted, these limits are over the operating free-air temperature range.

3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V

CC

or ground.

4. TA is the “instant on” case temperature.

5. Typical values are at VCC=5.0V, TA=+25˚C ambient.

6. This parameter is specified but not tested.

7. Not morethanone output should beshortedata time. Duration ofshort should notexceed one second. Theuse of high-speed test apparatusand/or sample
and holdtechniques are preferablein order to minimizeinternalchip heating and more accuratelyreflect operational values.Otherwise prolonged shorting of
a high output mayraise the chip temperature well above normal and therebycause invalid readings in other parametric tests. In anysequence of parameter
tests, IOS tests should be performed last.