Distributed VCC and Ground Pins Reduce
Switching Noise
D
Packaged in Plastic 28-Pin Shrink
Small-Outline Package
description
AV
CC
AGND
CLKIN
SEL
OE
GND
1Y1
V
CC
GND
1Y2
V
CC
GND
1Y3
V
CC
DB PACKAGE
(TOP VIEW)
1
28
2
27
3
26
4
25
5
24
6
23
7
22
8
21
9
20
10
19
11
18
12
17
13
16
14
15
AV
CC
AGND
FBIN
TEST
CLR
V
CC
2Y1
GND
V
CC
2Y2
GND
V
CC
2Y3
GND
The CDC2536 is a high-performance, low-skew, low-jitter clock driver. It uses a phase-lock loop (PLL) to
precisely align, in both frequency and phase, the clock output signals to the clock input (CLKIN) signal. It is
specifically designed for use with synchronous DRAMs and popular microprocessors operating at speeds from
50 MHz to 100 MHz or down to 25 MHz on outputs configured as half-frequency outputs. The CDC2536
operates at 3.3-V V
and is designed to drive a 50-W transmission line. The CDC2536 also provides on-chip
CC
series-damping resistors, eliminating the need for external termination components.
The feedback (FBIN) input is used to synchronize the output clocks in frequency and phase to the input clock
(CLKIN). One of the six output clocks must be fed back to FBIN for the PLL to maintain synchronization between
CLKIN and the outputs. The output used as the feedback pin is synchronized to the same frequency as CLKIN.
The Y outputs can be configured to switch in phase and at the same frequency as CLKIN. The select (SEL)
input configures three Y outputs to operate at one-half or double the CLKIN frequency , depending on which pin
is fed back to FBIN (see Tables 1 and 2). All output signal duty cycles are adjusted to 50% independent of the
duty cycle at the input clock.
Output-enable (OE
When OE
is low, the outputs are active. TEST is used for factory testing of the device and can be use to bypass
) is provided for output control. When OE is high, the outputs are in the high-impedance state.
the PLL. TEST should be strapped to GND for normal operation.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙB is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
description (continued)
Unlike many products containing PLLs, the CDC2536 does not require external RC networks. The loop filter
for the PLL is included on-chip, minimizing component count, board space, and cost.
Because it is based on PLL circuitry, the CDC2536 requires a stabilization time to achieve phase lock of the
feedback signal to the reference signal. This stabilization time is required following power up and application
of a fixed-frequency, fixed-phase signal at CLKIN, as well as following any changes to the PLL reference or
feedback signals. Such changes occur upon change of SEL, enabling the PLL via TEST, and upon enable of
all outputs via OE
The CDC2536 is characterized for operation from 0°C to 70°C.
detailed description of output configurations
The voltage-controlled oscillator (VCO) used in the CDC2536 has a frequency range of 100 MHz to 200 MHz,
twice the operating frequency of the CDC2536 outputs. The output of the VCO is divided by two and by four
to provide reference frequencies with a 50% duty cycle of one-half and one-fourth the VCO frequency. SEL
determines which of the two signals is buffered to each bank of device outputs.
One device output must be externally wired to FBIN to complete the PLL. The VCO operates such that the
frequency of the output matches that of CLKIN. In the case that a VCO/2 output is wired to FBIN, the VCO must
operate at twice the CLKIN frequency resulting in device outputs that operate at either the same or one-half the
CLKIN frequency . If a VCO/4 output is wired to FBIN, the device outputs operate at the same or twice the CLKIN
frequency .
.
output configuration A
Output configuration A is valid when any output configured as a 1× frequency output in Table 1 is fed back to
FBIN. The input frequency range for CLKIN is 50 MHz to 100 MHz when using output configuration A. Outputs
configured as 1/2× outputs operate at half the CLKIN frequency , while outputs configured as 1× outputs operate
at the same frequency as CLKIN.
Table 1. Output Configuration A
INPUT
SEL
LNoneAll
H1Yn2Yn
NOTE: n = 1, 2, 3
FREQUENCY1×FREQUENCY
OUTPUTS
1/2×
output configuration B
Output configuration B is valid when any output configured as a 1× frequency output in Table 2 is fed back to
FBIN. The input frequency range for CLKIN is 25 MHz to 50 MHz when using output configuration B. Outputs
configured as 1× outputs operate at the CLKIN frequency, while outputs configured as 2× outputs operate at
double the frequency of CLKIN.
Table 2. Output Configuration B
INPUT
SEL
H1Yn2Yn
LAllNone
NOTE: n = 1, 2, 3
FREQUENCY2×FREQUENCY
OUTPUTS
1×
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
functional block diagram
5
OE
24
CLR
26
FBIN
CLKIN
3
Phase-Lock Loop
CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
B
2
B
2
TEST
SEL
25
4
10
13
22
19
7
1Y1
1Y2
1Y3
2Y1
2Y2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
16
2Y3
3
CDC2536
I/O
DESCRIPTION
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
Terminal Functions
TERMINAL
NAMENO.
Clock input. CLKIN provides the clock signal to be distributed by the CDC2536 clock-driver circuit. CLKIN
provides the reference signal to the integrated PLL that generates the clock output signals. CLKIN must have
CLKIN3I
CLR24ICLR is used for testing purposes only.
FBIN26I
OE5I
SEL4I
TEST25I
1Y1–1Y37, 10, 13O
2Y1–2Y3 22, 19, 16O
a fixed frequency and fixed phase for the phase-lock loop to obtain phase lock. Once the circuit is powered up
and a valid CLKIN signal is applied, a stabilization time is required for the PLL to phase lock the feedback signal
to its reference signal.
Feedback input. FBIN provides the feedback signal to the internal PLL. FBIN must be hardwired to one of the
six clock outputs to provide frequency and phase lock. The internal PLL adjusts the output clocks to obtain zero
phase delay between the FBIN and differential CLKIN inputs.
Output enable. OE is the output enable for all outputs. When OE is low, all outputs are enabled. When OE is
high, all outputs are in the high-impedance state. Since the feedback signal for the PLL is taken directly from
an output, placing the outputs in the high-impedance state interrupts the feedback loop; therefore, when a
high-to-low transition occurs at OE
obtains phase lock.
Output configuration select. SEL selects the output configuration for each output bank (e.g. 1×, 1/2×, or 2×).
(see Tables 1 and 2).
TEST is used to bypass the PLL circuitry for factory testing of the device. When TEST is low, all outputs operate
using the PLL circuitry. When TEST is high, the outputs are placed in a test mode that bypasses the PLL
circuitry. TEST should be grounded for normal operation.
These outputs are configured by SEL to transmit one-half or one-fourth the frequency of the VCO. The
relationship between the CLKIN frequency and the output frequency is dependent on SEL. The duty cycle of
the Y output signals is nominally 50%, independent of the duty cycle of the CLKIN signal. Each output has an
internal series resistor to dampen transmission-line effects and improve the signal integrity at the load.
These outputs transmit one-half the frequency of the VCO. The relationship between the CLKIN frequency and
the output frequency is dependent on the frequency of the output being fed back to FBIN. The duty cycle of the
Y output signals is nominally 50%, independent of the duty cycle of the CLKIN signal. Each output has an
internal series resistor to dampen transmission-line effects and improve the signal integrity at the load.
, enabling the output buffers, a stabilization time is required before the PLL
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
I
A
V
I
V
CC
GND
CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high state or power-off state, V
Current into any output in the low state, I
Input clamp current, I
Output clamp current, I
Maximum power dissipation at T
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 75 mils.
For more information, refer to the
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
timing requirements over recommended ranges of supply voltage and operating free-air
temperature
MINMAXUNIT
clock
Duty cycle, CLKIN40%60%
†
Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. For phase lock to be obtained, a
fixed-frequency , fixed-phase reference signal must be present at CLKIN. Until phase lock is obtained, the specifications for propagation delay
and skew parameters given in the switching characteristics table are not applicable.
y
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
PARAMETER
f
max
Duty cycleY45%55%
t
phase error
t
jitter (RMS)
t
sk(o)
t
sk(pr)
t
r
t
‡
The propagation delay, t
are only valid for equal loading of all outputs.
NOTE 4: The specifications for parameters in this table are applicable only after any appropriate stabilization time has elapsed.
f
= 15 pF (see Note 4 and Figures 1, 2 and 3)
L
‡
‡
‡
phase error
, is dependent on the feedback path from any output to FBIN. The t
When VCO is operating at four times the CLKIN frequency2550
When VCO is operating at double the CLKIN frequency
After SEL50
After OE↓50
After power up50
After CLKIN50
FROM
(INPUT)
CLKIN↑Y↑–500+500ps
CLKIN↑Y↑200ps
TO
(OUTPUT)
phase error
, t
50100
MINMAXUNIT
100MHz
, and t
sk(o)
sk(pr)
0.5ns
1ns
1.4ns
1.4ns
specfications
z
µ
NOTES: A. CL includes probe and jig capacitance.
6
PARAMETER MEASUREMENT INFORMATION
3 V
Input
t
phase error
From Output
Under Test
500
CL = 15pF
(see Note A)
LOAD CIRCUIT FOR OUTPUTS
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 100 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
C. The outputs are measured one at a time with one transition per measurement.
W
Output
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1.5 V1.5 V
2 V
0.8 V
t
r
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
2 V
t
f
0.8 V
0 V
V
V
OH
OL
Outputs
Operating
at 1/2 CLKIN
Frequency
CLKIN
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
t
phase error 1
t
phase error 2
t
phase error 3
CDC2536
WITH 3-STATE OUTPUTS
Outputs
Operating
at CLKIN
Frequency
NOTES: A. Output skew, t
– The difference between the fastest and slowest of t
– The difference between the fastest and slowest of t
B. Process skew, t
– The difference between the maximum and minimum t
operating conditions
– The difference between the maximum and minimum t
operating conditions
t
phase error 4
t
phase error 5
t
phase error 6
, is calculated as the greater of:
sk(o)
, is calculated as the greater of:
sk(pr)
phase error n
phase error n
phase error n
phase error n
Figure 2. Waveforms for Calculations of t
t
phase error 7
t
phase error 8
t
phase error 9
(n = 1, 2,...6)
(n = 7, 8, 9)
(n = 1, 2,...6) across multiple devices under identical
(n = 7, 8, 9) across multiple devices under identical
and t
sk(o)
sk(pr)
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
CLKIN
t
phase error 10
Outputs
Operating
at CLKIN
Frequency
t
phase error 11
t
phase error 12
Outputs
Operating
at 2X CLKIN
Frequency
NOTES: A. Output skew, t
– The difference between the fastest and slowest of t
B. Process skew, t
– The difference between the maximum and minimum t
operating conditions.
t
phase error 13
t
phase error 14
t
phase error 15
, is calculated as the greater of:
sk(o)
, is calculated as the greater of:
sk(pr)
.
phase error n
phase error n
Figure 3. Waveforms for Calculation of t
(n = 10, 11,...15)
(n = 10, 11,. . . 15) across multiple devices under identical
and t
sk(o)
sk(pr)
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
MECHANICAL INFORMATION
DB (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
28 PIN SHOWN
0,65
28
1
2,00 MAX
0,38
0,22
15
14
A
0,05 MIN
0,15
M
5,60
5,00
Seating Plane
8,20
7,40
0,10
0,15 NOM
Gage Plane
0°–8°
0,25
1,03
0,63
PINS **
DIM
A MAX
A MIN
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.
D. Falls within JEDEC MO-150
8
3,30
2,70
14
6,50
6,50
5,905,90
2016
7,50
6,90
24
8,50
28
10,50
9,907,90
30
10,50
9,90
38
12,90
12,30
4040065 /C 10/95
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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