• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High NoiseImmunity: N
V
= 5V
CC
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH= 30%of VCCat
IL
≤ 1µA at VOL, V
l
o
C to 125oC
OH
CD74HCT85
High Speed CMOS Logic
4-Bit Magnitude Comparator
Description
The CD74HC85 and CD74HCT85 are high speed
magnitude comparators that use silicon-gate CMOS
technology to achieve operating speeds similar to LSTTL
with the low power consumption of standard CMOS
integrated circuits.
These 4-bit devices compare two binary, BCD, or other
monotonic codes and present the three possible magnitude
results at the outputs (A > B, A < B, and A = B). The 4-bit
input words are weighted (A0 to A3 and B0 to B3), where A3
and B
are the most significant bits.
3
The devices are expandable without external gating, in both
serial and parallel fashion. The upper part of the truth table
indicates operation using a single device or devices in a
serially expanded application. The parallel expansion
scheme is described by the last three entries in the truth
table.
Ordering Information
PKG.
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC85E-55 to 12516 Ld PDIPE16.3
CD74HCT85E-55 to 12516 Ld PDIPE16.3
CD74HC85M-55 to 12516 Ld SOICM16.15
NO.
Pinout
CD74HC85, CD74HCT85
B3
(A < B) IN
(A = B) IN
(A > B) IN
(A > B) OUT
(A = B) OUT
(A < B) OUT
GND
(PDIP, SOIC)
TOP VIEW
1
2
3
4
5
6
7
8
CD74HCT85M-55 to 12516 Ld SOICM16.15
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Die for this part number is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
16
V
CC
15
A3
14
B2
13
A2
12
A1
B1
11
10
A0
9
B0
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Propagation Delay,
An, Bn to (A > B) OUT,
(A < B) OUT
An, Bn to (A = B) OUTt
t
PLH,tPHLCL
PLH,tPHLCL
= 50pF4.5--37-46-56ns
CL= 15pF5-15-----ns
= 50pF4.5--40-50-60ns
CL= 15pF5-17-----ns
(A > B) IN, (A < B) IN, (A = B) IN
to (A > B) OUT, (A < B) OUT
(A > B) IN to (A = B) OUTt
t
PLH,tPHLCL
PLH,tPHLCL
= 50pF4.5--30-38-45ns
CL= 15pF5-12-----ns
= 50pF4.5--31-39-47ns
CL= 15pF5-13-----ns
Output Transition Times
t
TLH
, t
THLCL
= 50pF4.5--15-19-22ns
(Figure 1)
Power Dissipation Capacitance
C
-5-26-----pF
PD
(Notes 4, 5)
Input CapacitanceC
IN
----10-10-10pF
NOTES:
4. CPD is used to determine the dynamic power consumption, per gate/package.
5. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
25oC
-40oC TO
85oC
-55oC TO
125oC
UNITSMINTYPMAXMINMAXMINMAX
Test Circuits and Waveforms
tr = 6nstf = 6ns
V
t
CC
GND
TLH
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
INPUT
t
INVERTING
OUTPUT
THL
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
2.7V
1.3V
0.3V
PHL
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
3V
GND
Test Circuits and Waveforms
CD74HC85, CD74HCT85
LEAST SIGNIFICANT
4-BITS OF EACH WORD
MOST SIGNIFICANT
4-BITS OF EACH WORD
FIGURE 3. SERIES CASCADING - COMPARING 12-BIT WORDS
GND
V
CC
GND
A0
A1
A2
A3
B0
B1
B2
B3
A4
A5
A6
A7
B4
B5
B6
B7
A0
A1
A2
A3
B0
B1
B2
B3
(A > B) IN
(A = B) IN
(A < B) IN
A0
A1
CD74HC85
A2
CD74HCT85
A3
B0
B1
B2
B3
(A > B) IN
(A = B) IN
(A < B) IN
A4
A5
CD74HC85
A6
CD74HCT85
A7
B4
(A > B) OUT
B5
(A = B) OUT
B6
(A < B) OUT
B7
(A > B) IN
(A = B) IN
(A < B) IN
A0
A1
CD74HC85
A2
CD74HCT85
A3
B0
(A > B) OUT
B1
(A = B) OUT
B2
(A < B) OUT
B3
OUTPUTS
6
Test Circuits and Waveforms
GND
B1
A1
B0
A0
VCC
GND
CD74HC85
B3
CD74HCT85
A3
B2
A2
(A < B) OUT
B1
(A = B) OUT
A1
(A > B) OUT
B0
A0
(A < B) IN
(A = B) IN
(A > B) IN
CD74HC85
B3
CD74HCT85
A3
B2
A2
(A < B) OUT
B1
(A = B) OUT
A1
(A > B) OUT
B0
A0
(A < B) IN
(A = B) IN
(A > B) IN
NC
OUTPUTS
B6
A6
B5
A5
B4
A4
B3
A3
B2
GND
A2
CD74HC85
B3
CD74HCT85
A3
B2
(A < B) OUT
A2
(A = B) OUT
B1
A1
(A > B) OUT
B0
A0
(A < B) IN
(A = B) IN
(A > B) IN
B11
A11
B10
A10
B9
A9
B8
A8
B7
GND
A7
NC
FIGURE 4. PARALLEL CASCADING - COMPARING 12-BIT WORDS
CD74HC85
B3
CD74HCT85
A3
B2
A2
(A > B) OUT
B1
(A = B) OUT
A1
(A < B) OUT
B0
A0
(A < B) IN
(A = B) IN
(A > B) IN
OUTPUTS
7
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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