• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
= 30%, NIH = 30% of V
IL
o
Pinout
C to 125oC
CC
CD74HCT75
Dual 2-Bit Bistable
Transparent Latch
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
Description
The Harris CD74HC75 and CD74HCT75 are dual 2-bit
bistable transparent latches. Each one of the 2-bit latches is
controlled by separate Enable inputs (
active LOW. When the Enable input is HIGH data enters the
latch and appears at the Q output. When the Enable input
(
1E and 2E) is LOW the output is not affected.
Ordering Information
≤ 1µA at VOL, V
l
1E and 2E) which are
OH
CD74HC75, CD74HCT75
(PDIP, SOIC)
TOP VIEW
1
1Q0
2
1D0
3
1D1
4
2E
5
V
CC
6
2D0
2D1
7
8
2Q1
1Q0
16
15
1Q1
14
1Q1
13
1E
12
GND
11
2Q0
10
2Q0
9
2Q1
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Output Transition Timet
Input CapacitanceC
Power Dissipation Capacitance
, tf = 6ns (Continued)
r
CONDITIONS
t
, t
PLH
PHLCL
CL= 15pF5-12-----ns
, t
TLH
THLCL
I
C
PD
TEST
V
CC
(V)
= 50pF4.5--30-38-45ns
= 50pF4.5--15-19-22ns
----10-10-10pF
- 5-46-----pF
(Notes 5, 6)
NOTES:
5. CPD is used to determine the dynamic power consumption, per latch.
6. PD = V
2
fi (CPD + CL) where fi = input frequency, CL = output load capacitance, VCC = supply voltage.
CC
Test Circuits and Waveforms
trC
L
CLOCK
10%
90%
50%
10%
tfC
t
WL
L
tWL+ tWH=
50%
t
WH
f
CL
50%
I
V
CC
GND
25oC-40oC TO 85oC -55oC TO 125oC
trCL= 6ns
CLOCK
2.7V
0.3V
1.3V
0.3V
t
t
fCL
WL
= 6ns
1.3V
t
WH
t
WL
+ tWH=
1.3V
UNITSMIN TYP MAXMINMAXMINMAX
I
fC
L
3V
GND
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 3. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
V
t
CC
GND
TLH
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
FIGURE 5. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 4. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
t
PLH
t
f
10%
90%
1.3V
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
2.7V
1.3V
0.3V
FIGURE 6. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
6
CD74HC75, CD74HCT75
Test Circuits and Waveforms
90%
t
PLH
IC
t
TLH
tfC
L
50%
C
50pF
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
trC
L
90%
10%
t
H(H)
50%
(Continued)
t
H(L)
t
SU(L)
t
THL
90%
50%
10%
t
PHL
L
V
CC
GND
V
CC
50%
GND
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
OUTPUT
t
REM
3V
SET, RESET
OR PRESET
trC
90%
t
PLH
IC
1.3V
t
TLH
tfC
L
1.3V
t
H(L)
1.3V
t
SU(L)
t
THL
90%
1.3V
10%
t
PHL
C
L
50pF
3V
GND
3V
GND
GND
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
1.3V
FIGURE 7. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
FIGURE 8. HCT SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
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Copyright 1998, Texas Instruments Incorporated
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